JPH0718788B2 - Optical particle measuring device - Google Patents
Optical particle measuring deviceInfo
- Publication number
- JPH0718788B2 JPH0718788B2 JP63281572A JP28157288A JPH0718788B2 JP H0718788 B2 JPH0718788 B2 JP H0718788B2 JP 63281572 A JP63281572 A JP 63281572A JP 28157288 A JP28157288 A JP 28157288A JP H0718788 B2 JPH0718788 B2 JP H0718788B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- signal
- particle size
- fine particles
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analysing Biological Materials (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、微粒子を含む流体に光を投射した時に発生す
る光学的現象を検出して前記微粒子の個数や粒径分布を
測定する微粒子測定装置、特に、測定可能な微粒子の最
小粒径が小さく、かつ微粒子の広い粒径範囲にわたって
高い粒径分解能で測定を行うことができる装置に関す
る。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to fine particle measurement for measuring the number and particle size distribution of fine particles by detecting an optical phenomenon that occurs when light is projected onto a fluid containing fine particles. The present invention relates to an apparatus, in particular, an apparatus having a small minimum particle size that can be measured and capable of performing measurement with high particle size resolution over a wide particle size range of particles.
流動する流体中の微粒子の個数や粒径分布に対する測定
(以後、この測定を単に微粒子の測定ということがあ
る。)を行うに当っては、従来、光遮断法を採用した微
粒子測定装置と光散乱法を採用した微粒子測定装置とが
よく用いられている。In the measurement of the number and particle size distribution of fine particles in a flowing fluid (hereinafter, this measurement may be simply referred to as measurement of fine particles), conventionally, a fine particle measuring device that uses a light blocking method and an optical A fine particle measuring device employing a scattering method is often used.
そうして、前者の装置は、微粒子を含む流動する被測定
流体に測定光を投射し、この測定光が被測定流体を透過
して出てきた透過光を受光して、この受光光量に現れ
る。前記微粒子が測定光を遮断することにもとづくパル
ス状の光量減少の程度とこの光量減少の回数とから微粒
子の粒径と個数とを測定するようにしたもので、後者の
装置は、微粒子を含む流動する被測定流体に測定光を投
射した時に発生する該微粒子による測定光の散乱光を受
光して、この受光光量におけるパルス状の光量増加の程
度とこの光量増加の回数とから微粒子の粒径と個数とを
測定するようにしたものである。Then, the former device projects the measurement light onto the flowing fluid to be measured containing fine particles, receives the transmitted light emitted from the fluid to be measured, and appears in this received light amount. . The particle size and the number of the fine particles are measured based on the degree of the pulse-like light amount decrease due to the fine particles blocking the measurement light and the number of times of the light amount decrease.The latter device includes the fine particles. The scattered light of the measuring light generated by the fine particles generated when the measuring light is projected onto the flowing fluid to be measured is received, and the particle size of the fine particles is determined based on the degree of the pulse-like increase in the amount of the received light and the number of times of increasing the light amount. And the number of pieces are measured.
流動する被測定流体中の微粒子の測定を行う場合、従
来、上述した二種類の測定装置がよく用いられている
が、光遮断法を採用した測定装置には、微粒子の粒径が
大きい場合、パルス状の光量減少の大きさが微粒子の測
定光に対する投影面積にほぼ比例するなどの理由で、微
粒子の粒径に対する分解能(以後、この分解能を単に粒
径分解能ということがある。)の高い、換言すればばら
つきの少ない測定結果が得られる利点があるのに反し
て、微粒子の粒径が1μm程度以下になると光の回折等
の影響が大きくなるので、測定感度すなわち所定の粒径
分解能で測定することのできる最小の微粒子粒径があま
り小さくならないという欠点がある。そうして、また、
光散乱法を採用した測定装置には、He・Neレーザ、半導
レーザ、発光ダイオード等が出射する600〜800nm程度の
波長の光を測定光として用いた場合、0.3〜0.5μm程度
の微細な粒径の微粒子にまで測定感度を有していて光遮
断法を採用した測定装置によるよりも小さい粒径の微粒
子を測定し得る利点があるのに反して、微粒子の粒径が
1μm程度以上になると光のミー散乱現象のために微粒
子の粒径に対する分解能が低下するという欠点がある。When measuring fine particles in a fluid to be measured, conventionally, the above-mentioned two types of measuring devices are often used, but the measuring device adopting the light blocking method has a large particle size, The resolution with respect to the particle diameter of the fine particles (hereinafter, this resolution may be simply referred to as the particle size resolution) is high because the magnitude of the decrease in the amount of pulsed light is approximately proportional to the projected area of the fine particles on the measurement light. In other words, in spite of the advantage that the measurement result with less variation can be obtained, when the particle size of the fine particles is about 1 μm or less, the influence of light diffraction and the like becomes large, so that the measurement sensitivity, that is, the predetermined particle size resolution is measured. There is a drawback in that the smallest particle size that can be achieved does not become too small. And then again
The measuring device adopting the light scattering method uses a He / Ne laser, a semiconducting laser, a light emitting diode or the like that emits light with a wavelength of about 600 to 800 nm as a measuring light. Although it has an advantage of being capable of measuring fine particles having a smaller particle diameter than that of a measuring device adopting a light-blocking method even though it has a measurement sensitivity even for fine particles having a small particle diameter, the particle diameter of the fine particles is about 1 μm or more. In that case, there is a drawback that the resolution with respect to the particle size of the fine particles is lowered due to the Mie scattering phenomenon of light.
本発明の目的は、光遮断法を用いた微粒子測定装置と光
散乱法を用いた微粒子測定装置とのそれぞれにおける上
述の欠点を互いに他の測定装置における利点で補うよう
にして、0.3〜0.5μmの下限粒径まで感度を有しかつこ
の下限粒径を下限値とする広い粒径範囲にわたって高い
粒径分解能を有する微粒子測定装置を得ることにある。An object of the present invention is to make up the above-mentioned drawbacks in the fine particle measuring device using the light blocking method and the fine particle measuring device using the light scattering method, by compensating each other with the advantages of other measuring devices. The object is to obtain a fine particle measuring device which has a sensitivity up to the lower limit particle size of and has a high particle size resolution over a wide particle size range having the lower limit particle size as the lower limit value.
上記目的を達成するため、本発明による装置は、 被測定流体中の微粒子を光学的に個々に検出する微粒子
測定装置であって、 被測定流体が貫流する透明材料製フローセルと、前記フ
ローセルに測定光を投射する投光部と、前記フローセル
を透過した前記測定光の透過光を受光してこの受光結果
に応じた第1受光信号を出力する第1受光部と、前記フ
ローセルにおける前記被測定流体中の微粒子が前記測定
光により照射されることによって前記微粒子で前記測定
光が進行する向きのほぼ前方に向って散乱される前方散
乱光を受光してこの受光結果に応じた第2受光信号を出
力する第2受光部と、前記第1,第2の受光信号を微粒子
の個数に対応したパルス数と個々の微粒子の粒径に対応
した波高値を表すパルス波形にそれぞれ変換する第1,第
2の信号変換部と、前記第1,第2信号変換部から出力さ
れるパルス波形信号に基づいて所定時間の間に前記第1,
第2受光部にて検出される微粒子の個数に対応する個数
信号と粒径分布に対応する粒径分布信号をそれぞれ出力
する第1,第2計数部と、前記波高値が所定範囲内の粒径
に対応している場合には前記第1計数部からの出力を有
効とする条件信号を、また、前記波高値が所定範囲を越
える粒径に対応している場合には前記第2計数部からの
出力を有効とする条件信号を選択的に出力する測定条件
設定部からなる信号処理部とを備えてなり、粒径の大き
な微粒子に対しては前記透過光に基づく測定結果を、ま
た、粒径の小さな微粒子に対しては前記散乱光に基づく
測定結果を出力するようにして前記被測定流体における
微粒子の個数と粒径分布とを測定することを特徴とす
る。In order to achieve the above object, the device according to the present invention is a fine particle measuring device for optically and individually detecting fine particles in a fluid to be measured, in which a flow cell made of a transparent material through which the fluid to be measured flows, and the flow cell A light projecting unit that projects light, a first light receiving unit that receives the transmitted light of the measurement light that has passed through the flow cell and outputs a first light reception signal according to the light reception result, and the fluid to be measured in the flow cell. When the fine particles therein are irradiated with the measurement light, the fine scattered light is scattered by the fine particles in the substantially forward direction of the traveling direction of the measurement light, and the second scattered light signal corresponding to the light reception result is received. A second light receiving section for outputting, and first and second converting the first and second light receiving signals into a pulse waveform representing a pulse number corresponding to the number of particles and a peak value corresponding to the particle size of each particle. 2's No. converting portion and the first, the first for a predetermined time based on the pulse waveform signal outputted from the second signal converter,
The first and second counting units which respectively output a number signal corresponding to the number of fine particles detected by the second light receiving unit and a particle size distribution signal corresponding to the particle size distribution, and particles having a peak value within a predetermined range. If it corresponds to a diameter, a condition signal for validating the output from the first counting section is given, and if the peak value corresponds to a particle size exceeding a predetermined range, the second counting section is given. And a signal processing unit comprising a measurement condition setting unit that selectively outputs a condition signal to validate the output from the measurement result based on the transmitted light for fine particles having a large particle size, For fine particles having a small particle diameter, the number of fine particles and the particle diameter distribution in the fluid to be measured are measured by outputting the measurement result based on the scattered light.
上記のように構成すると、第1受光信号が上述した光遮
断法にもとづく信号で、このため粒径1μm以上の微粒
子に対して高い粒径分解能の測定結果を得ることができ
る信号であり、また、第2受光信号が上述した光散乱法
にもとづく信号で、このため0.3〜0.5μm程度の下限粒
径から1μm程度の粒径までの微粒子粒径の範囲で高い
粒径分解能の測定結果を得ることができる信号であるの
で、データ信号を0.3〜0.5μmの粒径を下限値として1
μmをはるかにこえる広い粒径の範囲内で高い粒径分解
能を有する微粒子測定結果を表す信号とすることができ
て、この結果、0.3〜0.5μmの下限粒径まで感度を有し
かつこの下限粒径を下限値とする広い粒径範囲にわたっ
て粒径分解能の低下を招くことなく微粒子の測定を行う
ことができる微粒子測定装置が得られることになる。With the above configuration, the first received light signal is a signal based on the above-mentioned light blocking method, and therefore, a signal capable of obtaining a high particle size resolution measurement result for fine particles having a particle size of 1 μm or more. The second received light signal is a signal based on the above-mentioned light scattering method, and therefore, a high particle size resolution measurement result is obtained in the range of the particle size from the lower limit particle size of about 0.3 to 0.5 μm to the particle size of about 1 μm. Since it is a signal that can be generated, the data signal is set to 1 with the particle size of 0.3 to 0.5 μm as the lower limit value.
It can be used as a signal representing the measurement result of fine particles having a high particle size resolution in a wide particle size range far exceeding μm, and as a result, it has sensitivity up to the lower limit particle size of 0.3 to 0.5 μm and this lower limit. It is possible to obtain a fine particle measuring device capable of measuring fine particles over a wide range of particle diameters having the particle diameter as the lower limit value without deteriorating the particle diameter resolution.
第1図は本発明の一実施例の構成図、第2図は第1図に
おける要部の拡大図である。第1図及び第2図におい
て、1は微粒子2を含む被測定流体3が第1図の紙面に
垂直に貫流する断面正方形の試料流路4が設けられた透
明材料製のフローセルで、このフローセル1は流路4の
軸心に垂直な断面が流路4の軸心と同軸である図示した
正方形をなすように四角柱状に形成されている。5はフ
ローセル1の一側面1aに垂直に平行光束である測定光6
投射するようにした。光7aを出射する発光ダイオードの
ような光源7と、光7aを集束して測定光6にする集束レ
ンズ8と、光7aの強さを所定値に制御する光源駆動回路
9とからなる投光部、10はフローセル1を透過した測定
光6の透過光11を受光するようにした第1受光部で、こ
の受光部10は試料流路4を透過した透過光11のみを通過
させ他の透過光11を遮光するようにしたアパーチャ12
と、このアパーチャ12を通過した透過光11を受光してこ
の受光量に応じた電流信号としての第1受光信号13aを
出力するようにしたホトダイオードのような第1受光素
子13とで構成されている。この場合、被測定流体3を測
定光6における一様な光強度分布の部分で照射するため
に、投光部5の光軸が試料流路4の軸心またはその近傍
を通るように投光部5とフローセル1とが配設されてい
て、また、アパーチャ12は上記のように構成されている
ので受光信号13aにおけるSN比の向上に効果的である。FIG. 1 is a configuration diagram of an embodiment of the present invention, and FIG. 2 is an enlarged view of a main part in FIG. In FIGS. 1 and 2, reference numeral 1 denotes a flow cell made of a transparent material, which is provided with a sample channel 4 having a square cross section through which a fluid to be measured 3 containing fine particles 2 flows perpendicularly to the paper surface of FIG. Reference numeral 1 is formed in a quadrangular prism shape so that a cross section perpendicular to the axis of the flow path 4 forms the illustrated square whose axis is coaxial with the axis of the flow path 4. Reference numeral 5 is a measuring light beam 6 which is a parallel light beam perpendicular to one side surface 1a of the flow cell
I tried to project it. Projection of a light source 7 such as a light emitting diode that emits light 7a, a focusing lens 8 that focuses the light 7a into the measurement light 6, and a light source drive circuit 9 that controls the intensity of the light 7a to a predetermined value. Reference numeral 10 denotes a first light receiving portion for receiving the transmitted light 11 of the measurement light 6 transmitted through the flow cell 1, and this light receiving portion 10 allows only the transmitted light 11 transmitted through the sample flow path 4 to pass therethrough. Aperture 12 designed to block light 11
And a first light receiving element 13 such as a photodiode which receives the transmitted light 11 that has passed through the aperture 12 and outputs a first light receiving signal 13a as a current signal according to the amount of received light. There is. In this case, in order to irradiate the fluid 3 to be measured with the portion of the measurement light 6 having a uniform light intensity distribution, light is projected so that the optical axis of the light projecting section 5 passes through the axis of the sample flow path 4 or its vicinity. Since the portion 5 and the flow cell 1 are arranged and the aperture 12 is configured as described above, it is effective for improving the SN ratio in the light reception signal 13a.
14は第1受光信号13aを電圧信号に変換してさらにこの
電圧信号を増幅し、しかる後、この増幅した電圧信号に
おける直流成分に応じた第1信号14aと、増幅した電圧
信号から前記の直流成分を除いた信号、つまり、微粒子
2が測定光6を遮断することによって生じたパルス波形
を含む経時信号に対応した経時波形を有する第2信号14
bとを出力するようにした第1信号変換部で、前述した
光源駆動回路9は第1信号14aが入力されることによっ
てしかるべき操作量9aを光源7に与えて、信号14aが表
す光7aの強さを定値制御するように構成されている。こ
こに、信号14bが呈する一個のパルス波形が一個の微粒
子2に対応しており、また該パルス波形の波高値が微粒
子2の粒径に対応していることは、上述した所から明ら
かである。15は第2信号14bと第1測定条件信号25aとが
入力され、条件信号25aによって指定された測定時間T
の間に入力される信号14bにおけるパルス波形の個数を
計数して、時間Tの間に第1受光部10が検出する微粒子
2の個数に応じた第1個数信号15aを出力すると共に、
時間Tの間に信号14bに現れる前記パルス波形の波高値
が条件信号25aによって設定された複数個のレベル帯域
のうちのいずれのレベル帯域に属するかを判別しては同
一のレベル帯域に属する上記パルスの個数を計数するこ
とによって、時間Tの間に第1受光部10が検出する微粒
子2の粒径分布を測定して、この測定結果に応じた第1
粒径分布信号15bを出力する第1計数部で、この場合、
計数部15は、信号14bに現れるパルスの波高値が微粒子
2の1〜30μmの範囲内の粒径に対応している場合にの
み上述の信号15a,15bを出力する動作を行うように構成
されている。The reference numeral 14 converts the first received light signal 13a into a voltage signal and further amplifies this voltage signal. Thereafter, the first signal 14a corresponding to the direct current component in the amplified voltage signal and the direct current signal The second signal 14 having a signal excluding the component, that is, a time-dependent waveform corresponding to a time-dependent signal including a pulse waveform generated by the particles 2 blocking the measurement light 6.
In the first signal converter that outputs b and b, the light source drive circuit 9 described above gives the light source 7 an appropriate manipulated variable 9a when the first signal 14a is input, and the light 7a represented by the signal 14a is output. Is configured to control the strength of the constant value. It is clear from the above that one pulse waveform presented by the signal 14b corresponds to one particle 2 and the peak value of the pulse waveform corresponds to the particle diameter of the particle 2. . The second signal 14b and the first measurement condition signal 25a are input to 15 and the measurement time T designated by the condition signal 25a
While counting the number of pulse waveforms in the signal 14b input during, the first number signal 15a corresponding to the number of the fine particles 2 detected by the first light receiving unit 10 during the time T is output,
It is determined that the peak value of the pulse waveform appearing in the signal 14b during the time T belongs to the same level band among the plurality of level bands set by the condition signal 25a. By counting the number of pulses, the particle size distribution of the fine particles 2 detected by the first light receiving unit 10 is measured during the time T, and the first particle size distribution according to the measurement result is measured.
In the first counting unit that outputs the particle size distribution signal 15b, in this case,
The counting unit 15 is configured to perform the operation of outputting the above-mentioned signals 15a and 15b only when the crest value of the pulse appearing in the signal 14b corresponds to the particle size of the particles 2 within the range of 1 to 30 μm. ing.
16は、フローセル1における被測定流体3中の微粒子2
が測定光6により照射されることによってこの微粒子2
で測定光6が進行する向きのほぼ前方に向って散乱され
る前方散乱光17を受光して、この受光結果に応じた電流
信号である第2受光信号19aを出力する第2受光部で、
この受光部16は、散乱光17のみを集光して透過光11を集
光しないように中央部に貫通孔18aを設けた集光レンズ1
8と、レンズ18が集光した散乱光17を集束してホトダイ
オードのような第2受光素子19に入射させるようにした
集束レンズ20と、入射光量に応じた前述の第2受光信号
19aを出力する第2受光素子19と、アパーチャ21とで構
成されている。そうして、レンズ18の貫通孔18a内に第
1受光部10が配置されており、また、アパーチャ21は第
2受光部16が光を受光し得る領域(以後、この領域を受
光領域ということがある。)を限定するために設けられ
ている。16 is the fine particles 2 in the fluid 3 to be measured in the flow cell 1.
The fine particles 2 are irradiated by the measuring light 6
In the second light receiving section that receives the forward scattered light 17 scattered in the substantially forward direction in which the measurement light 6 travels at, and outputs the second light receiving signal 19a that is a current signal according to the light receiving result,
The light receiving unit 16 has a through hole 18a at the center thereof so that only the scattered light 17 is collected and the transmitted light 11 is not collected.
8, a converging lens 20 for condensing the scattered light 17 condensed by the lens 18 to be incident on a second light receiving element 19 such as a photodiode, and the above second light receiving signal according to the amount of incident light.
It is composed of a second light receiving element 19 for outputting 19a and an aperture 21. Then, the first light receiving portion 10 is disposed in the through hole 18a of the lens 18, and the aperture 21 has a region where the second light receiving portion 16 can receive light (hereinafter, this region is referred to as a light receiving region). It is provided for the purpose of limiting.
第2受光部16は上述のように構成されているので、その
受光領域がレンズ18,20とアパーチャ21と受光素子19の
受光面19bとで紡錘状に形成されて第2図に示した領域2
2のようになっている。第2図における30は受光領域22
の境界を形成する光線の光路である。そうして、この場
合、測定光6で照射された試料流路4のすべてが受光領
域22に含まれるように各部が構成されているので、測定
光6によって微粒子2が照射されると、この微粒子2か
ら出射される散乱光のうちの第1図に示したレンズ18に
向う前方散乱光17がすべて受光素子19に入射することに
なる。つまり、第1図においては、第2受光部16が形成
する散乱光17の出射領域が測定光6によって照射される
試料流路4の部分に一致している。そうして、また、第
1図においては第1受光部10が上述したように構成され
ている。したがって、この場合、第1受光部10が検出す
る透過光11の出射領域と第2受光部16が検出する散乱光
17の出射領域とが一致していることになる。Since the second light receiving portion 16 is configured as described above, the light receiving area is formed by the lenses 18, 20, the aperture 21, and the light receiving surface 19b of the light receiving element 19 in a spindle shape, and the area shown in FIG. 2
It looks like 2. In FIG. 2, 30 is a light receiving area 22.
Is the optical path of the light rays that form the boundary of. Then, in this case, since each part is configured such that all of the sample flow path 4 irradiated with the measurement light 6 is included in the light receiving region 22, when the measurement light 6 irradiates the fine particles 2, Of the scattered light emitted from the fine particles 2, all of the forward scattered light 17 toward the lens 18 shown in FIG. 1 is incident on the light receiving element 19. That is, in FIG. 1, the emission region of the scattered light 17 formed by the second light receiving unit 16 coincides with the portion of the sample flow path 4 irradiated with the measurement light 6. Then, in addition, in FIG. 1, the first light receiving unit 10 is configured as described above. Therefore, in this case, the emission region of the transmitted light 11 detected by the first light receiving unit 10 and the scattered light detected by the second light receiving unit 16 are detected.
This means that the exit areas of 17 coincide with each other.
23は第2受光信号19aが入力され、この信号19aを電圧信
号に変換した後増幅して、しかる後この増幅した電圧信
号における直流成分を除去した信号に応じた経時信号23
aを出力する第2信号変換部、24は経時信号23aと第2測
定条件信号25bとが入力され、条件信号25bによって指定
された測定時間Tの間に入力される信号23aにおける、
微粒子2による前方散乱光17にもとづくパルス波形の個
数を計数して、時間Tの間に第2受光部16が検出する微
粒子2の個数に応じた第2個数信号24aを出力すると共
に、時間Tの間に信号23aに現れる前記パルス波形の波
高値が条件信号25bによって設定された複数個のレベル
帯域のうちのいずれのレベル帯域に属するかを判別して
は同一のレベル帯域に属する上記パルスの個数を計数す
ることによって、時間Tの間に第2受光部16が検出する
微粒子2の粒径分布を測定して、この測定結果に応じた
第2粒径分布信号24bを出力する第2計数部で、この計
数部24は、信号23aに現れるパルスの波高値が0.3〜1μ
mの範囲内の粒径に対応している場合にのみ上記の信号
24a,24bを出力する動作を行うように構成されている。The second light reception signal 19a is input to the signal 23, which is converted into a voltage signal and then amplified, and then the time-dependent signal 23 corresponding to the signal obtained by removing the DC component from the amplified voltage signal.
The second signal conversion unit 24 that outputs a receives the time-dependent signal 23a and the second measurement condition signal 25b, and in the signal 23a that is input during the measurement time T designated by the condition signal 25b,
The number of pulse waveforms based on the forward scattered light 17 by the fine particles 2 is counted, and a second number signal 24a corresponding to the number of the fine particles 2 detected by the second light receiving unit 16 is output during the time T and at the same time T The peak value of the pulse waveform appearing in the signal 23a during is determined to which one of the plurality of level bands set by the condition signal 25b belongs, and the pulse of the pulse belonging to the same level band is determined. By counting the number of particles, the particle size distribution of the fine particles 2 detected by the second light receiving unit 16 is measured during the time T, and the second count that outputs the second particle size distribution signal 24b according to the measurement result. In the counting section 24, the crest value of the pulse appearing in the signal 23a is 0.3 to 1 μm.
Signal above only if it corresponds to a particle size in the range of m
It is configured to perform an operation of outputting 24a and 24b.
25はキー操作等のしかるべき設定操作が加えられること
によってこの設定操作に応じた上述の第1測定条件信号
25aと第2測定条件信号25bとを出力するようにした測定
条件設定部で、この設定部25は、信号25aと25bとを出力
することによって、第1及び第2計数部15,24に同時に
上述したそれぞれの計数動作を開始させかつ同時にこれ
らの計数動作を停止させるように構成されている。26は
第1及び第2信号変換部14,23と第1及び第2計数部15,
24と測定条件設定部25とからなる信号処理部、27は第1
及び第2個数信号15a,24aと第1及び第2粒径分布信号1
5b,24bとからなるデータ信号で、信号処理部26において
は各部が上述のように構成されているので、処理部26は
第1及び第2受光部信号13a,19aが入力されこれらの入
力信号について所定の信号処理を行ってその結果に応じ
たデータ信号27を出力するものであるということができ
る。そうして、この場合、データ信号27にもとづいて被
測定流体3における微粒子2の個数と粒径分布とを測定
し得ることが上述した所から明らかである。28は第1図
図示の各部からなる光学的微粒子測定装置である。25 is the above-mentioned first measurement condition signal in response to the setting operation by the appropriate setting operation such as key operation.
25a and a second measurement condition signal 25b are output as a measurement condition setting unit, and the setting unit 25 outputs the signals 25a and 25b to the first and second counting units 15 and 24 at the same time. It is configured to start each of the above counting operations and simultaneously stop these counting operations. 26 is a first and second signal converter 14, 23 and a first and second counter 15,
A signal processing unit consisting of 24 and a measurement condition setting unit 25, 27 is the first
And the second number signals 15a, 24a and the first and second particle size distribution signals 1
5b and 24b are data signals. Since each part of the signal processing unit 26 is configured as described above, the processing unit 26 receives the first and second light receiving unit signals 13a and 19a and inputs these signals. Can be said to be one which performs a predetermined signal processing and outputs a data signal 27 according to the result. Then, in this case, it is apparent from the above that the number and the particle size distribution of the fine particles 2 in the fluid to be measured 3 can be measured based on the data signal 27. Reference numeral 28 is an optical fine particle measuring device comprising the respective parts shown in FIG.
第1図においては微粒子測定装置28が上述のように構成
されていて、かつ第1受光信号13aが光遮断法による信
号でまた第2受光信号19aが光散乱法による信号である
ことは明らかであるから、信号15a,15bにより1〜30μ
mの粒径の微粒子2に対して高い粒径分解能で個数及び
粒径分布を測定することができ、また、信号24a,24bに
より0.3〜1μmの粒径の微粒子2に対して高い粒径分
解能で個数及び粒径分布を測定することができる。そう
して、また、前述したように、受光部10が検出する透過
光11の出射領域と受光部16が検出する散乱光17の出射領
域とは同じである。したがって、測定装置28は、試料流
路4中の被測定流体3に対して、0.3μmというような
微細な下限粒径まで感度を有し、かつこの0.3μmとい
う下限粒径から30μmという上限粒径に至る非常に広い
粒径範囲にわたって粒径分解能の低下を招くことなく微
粒子2の測定を行うことができる光学的微粒子測定装置
である。In FIG. 1, it is apparent that the particle measuring device 28 is constructed as described above, and that the first light receiving signal 13a is a signal by the light blocking method and the second light receiving signal 19a is a signal by the light scattering method. 1 to 30μ depending on the signals 15a and 15b
The number and the particle size distribution can be measured with high particle size resolution for the fine particles 2 having a particle size of m, and the high particle size resolution can be obtained for the fine particles 2 having a particle size of 0.3 to 1 μm by the signals 24a and 24b. The number and particle size distribution can be measured with. Then, as described above, the emission area of the transmitted light 11 detected by the light receiving section 10 and the emission area of the scattered light 17 detected by the light receiving section 16 are the same. Therefore, the measuring device 28 has sensitivity to the fluid 3 to be measured in the sample flow path 4 up to a fine lower limit particle size of 0.3 μm, and the lower limit particle size of 0.3 μm to the upper limit particle size of 30 μm. The optical particle measuring device is capable of measuring the particles 2 over a very wide particle size range up to the diameter without degrading the particle size resolution.
そうして、さらに、測定装置28においては、光散乱法に
よる第2受光信号19aが前方散乱光17によって得られた
信号となっていて、前方散乱光を用いると測定光6の光
軸に対してほぼ垂直な方向に出射される側方散乱光を用
いるよりも粒径分解能のよい微粒子測定結果が得られる
のが通例である。故に、このような散乱光の種類の面で
も、測定装置28には、第2受光信号19aにもとづく微粒
子測定における粒径分解能が向上する利点がある。Then, in the measuring device 28, the second received light signal 19a by the light scattering method is a signal obtained by the forward scattered light 17, and if the forward scattered light is used, the second scattered light signal 19a is generated with respect to the optical axis of the measuring light 6. It is customary to obtain fine particle measurement results with a better particle size resolution than using side scattered light emitted in a substantially vertical direction. Therefore, also in terms of the kind of scattered light, the measuring device 28 has an advantage that the particle size resolution in the particle measurement based on the second received light signal 19a is improved.
本発明によれば、第1受光信号が上述した光遮断法にも
とづく信号で、このため粒径1μm以上の微粒子に対し
て高い粒径分解能の測定結果を得ることができる信号で
あり、また、第2受光信号が上述した光散乱法、特に前
方散乱光を用いる方法にもとづく信号で、このため0.3
〜0.5μm程度の下限粒径から1μm程度の粒径までの
微粒子粒径の範囲で高い粒径分解能の測定結果を得るこ
とができる信号であるので、データ信号を0.3〜0.5μm
の粒径を下限値として1μmをはるかにこえる広い粒径
の範囲内で高い粒径分解能を有する微粒子測定結果を表
す信号とすることができて、この結果、本発明には0.3
〜0.5μmの下限粒径まで感度を有しかつこの下限粒径
を下限値とする広い粒径範囲にわたって粒径分解能の低
下を招くことなく微粒子の測定を行うことができる微粒
子測定装置が得られる効果がある。According to the present invention, the first received light signal is a signal based on the above-mentioned light blocking method, and is therefore a signal capable of obtaining a measurement result with high particle size resolution for fine particles having a particle size of 1 μm or more. The second received light signal is a signal based on the above-mentioned light scattering method, in particular, a method using forward scattered light.
Since it is a signal that can obtain a high particle size resolution measurement result in the range of the particle size from the lower limit particle size of about 0.5 μm to the particle size of about 1 μm, the data signal is 0.3 to 0.5 μm.
Can be used as a signal representing the measurement result of fine particles having a high particle size resolution in a wide particle size range far exceeding 1 μm with the particle size of 0.1 μm as the lower limit value.
A fine particle measuring device is obtained which has a sensitivity up to a lower limit particle size of up to 0.5 μm and is capable of measuring fine particles over a wide particle size range having the lower limit particle size as the lower limit value without degrading the particle size resolution. effective.
また、本発明では、第1受光信号が光遮断法にもとづく
信号でありかつ第2受光信号が光散乱法にもとづく信号
であるから、両受光信号を用いて同時に同じ微粒子に対
する測定を行うように信号処理部を構成すると、同時に
二種類の測定原理にもとづく微粒子測定結果が得られる
ので、本発明には、信号処理部をこのように構成するこ
とによって被測定流体の調整が困難な場合や被測定流体
における微粒子濃度が希薄な場合に信頼度の高い測定結
果が得られる効果がある。Further, in the present invention, since the first light receiving signal is a signal based on the light blocking method and the second light receiving signal is a signal based on the light scattering method, it is possible to simultaneously measure the same fine particles by using both light receiving signals. When the signal processing unit is configured, the particle measurement result based on two types of measurement principles can be obtained at the same time.Therefore, in the present invention, when the signal processing unit is configured in this way, it is difficult to adjust the fluid to be measured or This is effective in obtaining highly reliable measurement results when the concentration of fine particles in the measurement fluid is low.
第1図は本発明の一実施例の構成図、第2図は第1図に
おける要部の拡大図である。 1……フローセル、2……微粒子、3……被測定流体、
5……投光部、6……測定光、10……第1受光部、11…
…透過光、13a……第1受光信号、16……第2受光部、1
7……前方散乱光、19a……第2受光信号、26……信号処
理部、27……データ信号、28……光学的微粒子測定装
置。FIG. 1 is a configuration diagram of an embodiment of the present invention, and FIG. 2 is an enlarged view of a main part in FIG. 1 ... Flow cell, 2 ... Fine particles, 3 ... Fluid to be measured,
5 ... Projector, 6 ... Measuring light, 10 ... First light receiver, 11 ...
… Transmitted light, 13a …… First light receiving signal, 16 …… Second light receiving section, 1
7: Forward scattered light, 19a: Second received light signal, 26: Signal processing unit, 27: Data signal, 28: Optical particle measuring device.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 星川 寛 神奈川県川崎市川崎区田辺新田1番1号 富士電機株式会社内 (72)発明者 田中 猛夫 神奈川県川崎市川崎区田辺新田1番1号 富士電機株式会社内 (56)参考文献 特開 昭63−49207(JP,A) 特開 昭60−161548(JP,A) 特開 昭53−86298(JP,A) 特開 昭51−1187(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Hiroshi Hoshikawa 1-1, Tanabe Nitta, Kawasaki-ku, Kawasaki-shi, Kanagawa Fuji Electric Co., Ltd. No. 1 within Fuji Electric Co., Ltd. (56) Reference JP-A 63-49207 (JP, A) JP-A 60-161548 (JP, A) JP-A 53-86298 (JP, A) JP-A 51- 1187 (JP, A)
Claims (1)
出する微粒子測定装置であって、 被測定流体が貫流する透明材料製フローセルと、 前記フローセルに測定光を投射する投光部と、 前記フローセルを透過した前記測定光の透過光を受光し
てこの受光結果に応じた第1受光信号を出力する第1受
光部と、 前記フローセルにおける前記被測定流体中の微粒子が前
記測定光により照射されることによって前記微粒子で前
記測定光が進行する向きのほぼ前方に向って散乱される
前方散乱光を受光してこの受光結果に応じた第2受光信
号を出力する第2受光部と、 前記第1,第2の受光信号を微粒子の個数に対応したパル
ス数と個々の微粒子の粒径に対応した波高値を表すパル
ス波形にそれぞれ変換する第1,第2の信号変換部と、前
記第1,第2信号変換部から出力されるパルス波形信号に
基づいて所定時間の間に前記第1,第2受光部にて検出さ
れる微粒子の個数に対応する個数信号と粒径分布に対応
する粒径分布信号をそれぞれ出力する第1,第2計数部
と、前記波高値が所定範囲内の粒径に対応している場合
には前記第1計数部からの出力を有効とする条件信号
を、また、前記波高値が所定範囲を越える粒径に対応し
ている場合には前記第2計数部からの出力を有効とする
条件信号を選択的に出力する測定条件設定部からなる信
号処理部、とを備え、 粒径の大きな微粒子に対しては前記透過光に基づく測定
結果を、また、粒径の小さな微粒子に対しては前記散乱
光に基づく測定結果を出力するようにして前記被測定流
体における微粒子の個数と粒径分布とを測定することを
特徴とする光学的微粒子測定装置。1. A fine particle measuring apparatus for optically individually detecting fine particles in a fluid to be measured, comprising: a flow cell made of a transparent material through which the fluid to be measured flows, and a light projecting section for projecting measurement light to the flow cell. A first light receiving portion that receives the transmitted light of the measurement light that has passed through the flow cell and outputs a first light reception signal according to the light reception result; and fine particles in the fluid to be measured in the flow cell that are generated by the measurement light. A second light receiving unit that receives the forward scattered light that is scattered by the fine particles toward the front in the direction in which the measurement light travels by being irradiated, and outputs a second light receiving signal according to the light receiving result; First and second signal converters for respectively converting the first and second received light signals into pulse waveforms representing a pulse number corresponding to the number of fine particles and a peak value corresponding to the particle size of each fine particle, First and second signals Based on the pulse waveform signal output from the conversion unit, a number signal corresponding to the number of fine particles detected by the first and second light receiving units and a particle size distribution signal corresponding to the particle size distribution are generated during a predetermined time. Outputting first and second counting units, and a condition signal for validating the output from the first counting unit when the crest value corresponds to a particle size within a predetermined range. A signal processing unit including a measurement condition setting unit that selectively outputs a condition signal that validates the output from the second counting unit when the high value corresponds to a particle size exceeding a predetermined range, The number of fine particles in the fluid to be measured is set to output the measurement result based on the transmitted light for fine particles having a large particle size, and output the measurement result based on the scattered light for fine particles having a small particle size. And an optical characteristic characterized by measuring the particle size distribution Particle measuring apparatus.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63281572A JPH0718788B2 (en) | 1988-11-08 | 1988-11-08 | Optical particle measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63281572A JPH0718788B2 (en) | 1988-11-08 | 1988-11-08 | Optical particle measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02128142A JPH02128142A (en) | 1990-05-16 |
| JPH0718788B2 true JPH0718788B2 (en) | 1995-03-06 |
Family
ID=17641052
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63281572A Expired - Lifetime JPH0718788B2 (en) | 1988-11-08 | 1988-11-08 | Optical particle measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0718788B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20190023789A (en) * | 2017-08-30 | 2019-03-08 | 한국광기술원 | Apparatus and method for Measuring and Reducing Fine Dust |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3951577B2 (en) * | 2000-09-20 | 2007-08-01 | 富士電機システムズ株式会社 | Method and apparatus for measuring turbidity and fine particles |
| US11187661B2 (en) * | 2017-07-05 | 2021-11-30 | Saudi Arabian Oil Company | Detecting black powder levels in flow-lines |
| KR102321560B1 (en) * | 2018-02-27 | 2021-11-03 | 파나소닉 아이피 매니지먼트 가부시키가이샤 | particle detection sensor |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS511182A (en) * | 1974-06-21 | 1976-01-07 | Yamatake Honeywell Co Ltd | KONDAKUEKINONODOSOKUTEISOCHI |
| US4134679A (en) * | 1976-11-05 | 1979-01-16 | Leeds & Northrup Company | Determining the volume and the volume distribution of suspended small particles |
| JPS60161548A (en) * | 1984-01-31 | 1985-08-23 | Canon Inc | Apparatus for measuring scattered light of flowing fine particulate material |
| DE3627199A1 (en) * | 1986-08-11 | 1988-02-25 | Henkel Kgaa | METHOD FOR CONTROLLING THE CLEAVING OF OIL / WATER EMULSIONS |
-
1988
- 1988-11-08 JP JP63281572A patent/JPH0718788B2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20190023789A (en) * | 2017-08-30 | 2019-03-08 | 한국광기술원 | Apparatus and method for Measuring and Reducing Fine Dust |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02128142A (en) | 1990-05-16 |
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