JPH0726811B2 - Optical precision measuring method - Google Patents
Optical precision measuring methodInfo
- Publication number
- JPH0726811B2 JPH0726811B2 JP12532687A JP12532687A JPH0726811B2 JP H0726811 B2 JPH0726811 B2 JP H0726811B2 JP 12532687 A JP12532687 A JP 12532687A JP 12532687 A JP12532687 A JP 12532687A JP H0726811 B2 JPH0726811 B2 JP H0726811B2
- Authority
- JP
- Japan
- Prior art keywords
- measured
- surface roughness
- reflected light
- light
- intensity detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000000034 method Methods 0.000 title claims description 8
- 230000003287 optical effect Effects 0.000 title claims description 7
- 230000003746 surface roughness Effects 0.000 claims description 24
- 238000005259 measurement Methods 0.000 claims description 13
- 238000000691 measurement method Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 9
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明はエンジン部品,タービンローター等の寸法測定
に適用される光学式精密測長法に関する。TECHNICAL FIELD The present invention relates to an optical precision length measuring method applied to dimension measurement of engine parts, turbine rotors and the like.
機械部品の高精度加工を必要とする分野では、精密測長
つまりサブミクロンオーダーの測長が要求されており、
その方法としては二波長干渉レーザー測長法が知られて
いる。In fields that require high-precision machining of machine parts, precision length measurement, that is, sub-micron length measurement, is required.
A two-wavelength interference laser length measurement method is known as such a method.
その基本構成は、第6図系統図に示すように、二波長レ
ーザー光源1,スキャニング反射鏡2,半透明鏡3,センター
ミラー4,全反射鏡5,基準ワーク6,被測定物7,光強度検出
器8,信号処理部9から成っており、二波長レーザー光源
1の干渉によって第7図に示すように干渉信号を生成さ
せ、信号処理部9で基準ワーク6及び被測定物7の2点
からの反射光の位相差から光路差を求めるのである。The basic configuration is, as shown in the system diagram of FIG. 6, a two-wavelength laser light source 1, a scanning reflecting mirror 2, a semitransparent mirror 3, a center mirror 4, a total reflecting mirror 5, a reference work 6, an object to be measured 7, a light. The intensity detector 8 and the signal processing unit 9 generate interference signals as shown in FIG. 7 by the interference of the two-wavelength laser light source 1, and the signal processing unit 9 generates the interference signal 2 of the reference work 6 and the DUT 7. The optical path difference is obtained from the phase difference of the reflected light from the point.
ところが被測定物7の面は完全なフラット面ではなく粗
さを持っており、第8図に示すように、表面粗さの形状
に対して光の反射位置が明確でないために表面粗さの山
部あるいは谷部で反射した場合、山部と谷部との寸法差
が常に誤差となって測長されるから、従来、前もって接
触式表面粗さ計で粗さを測定して補正を行っている。However, the surface of the DUT 7 is not a completely flat surface but has roughness, and as shown in FIG. 8, the light reflection position is not clear with respect to the shape of the surface roughness. When reflected at the peaks or valleys, the dimensional difference between the peaks and the valleys always causes an error, and the length is always measured.Therefore, conventionally, the contact type surface roughness meter was used to measure the roughness in advance for correction. ing.
しかしながら、このような手段では、下記のような欠点
がある。However, such means have the following drawbacks.
(1) 表面粗さに対して、光の反射位置が不明であ
る。(1) The light reflection position is unknown with respect to the surface roughness.
(2) 表面粗さと光の反射光量との関係が定量的に把
握されていない。(2) The relationship between the surface roughness and the amount of reflected light is not quantitatively understood.
(3) 前もって接触式表面粗さ計で測定しているので
時間がかゝる。(3) It takes time because it is measured with a contact type surface roughness meter in advance.
(4) 粗さピッチの小さいものは接触式では正確な値
がわからない。(4) The contact type does not know the exact value for those with a small roughness pitch.
本発明はこのような事情に鑑みて提案されたもので、非
接触的に高精度で被測定物を精密測長することのできる
光学式精密測定法を提案することを目的とする。The present invention has been proposed in view of the above circumstances, and an object thereof is to propose an optical precision measurement method capable of accurately measuring an object to be measured with high accuracy in a non-contact manner.
そのために本発明は、二波長レーザー光源を使用して基
準ワーク,被測定物よりの反射光をそれぞれ第1の光強
度検出器,第2の光強度検出器を介して検出し、上記両
反射光の位相差に基づいて上記被測定物を精密測長する
方法において、上記被測定物の反射光を検出する光強度
検出器の出力に基づいて関数発生器を介して表面粗さを
求め、上記位相差により求めた測長値と上記関数発生器
を介して求めた上記被測定物の表面粗さとの差を求めて
表面粗さを補正することにより上記被測定物の真の測長
値を求めることを特徴とする。Therefore, the present invention uses a two-wavelength laser light source to detect reflected light from a reference work and an object to be measured through a first light intensity detector and a second light intensity detector, respectively, and to detect both reflections. In the method for precisely measuring the object to be measured based on the phase difference of light, the surface roughness is obtained through a function generator based on the output of the light intensity detector that detects the reflected light of the object to be measured, The true measured value of the measured object by correcting the surface roughness by obtaining the difference between the measured value obtained by the phase difference and the surface roughness of the measured object obtained through the function generator. It is characterized by seeking.
このような構成により、位相差により基準ワークと被測
定物との光での測長値の差(前者)が検出され、一方、
光強度検出器8−2の出力に基づいて関数発生器9a−2
を介して補正量(後者)が出力され、両者を減算するこ
とにより、真の測長値が求められるのである。With such a configuration, the difference in the length measurement value by light between the reference work and the object to be measured (the former) is detected by the phase difference.
Function generator 9a-2 based on the output of the light intensity detector 8-2
The correction amount (the latter) is output via, and the true length measurement value is obtained by subtracting both.
本発明の一実施例を図面について説明すると、第1図は
その全体系統図、第2図は第1図における被測定物の反
射面の部分拡大図、第3図は被測定物反射面におけるビ
ーム径及び反射光の関係を示す説明図、第4図は第3図
における表面粗さと反射光量との関係を示す線図、第5
図は表面粗さと反射光量との関係を示す線図である。An embodiment of the present invention will be described with reference to the drawings. FIG. 1 is an overall system diagram thereof, FIG. 2 is a partially enlarged view of a reflection surface of an object to be measured in FIG. 1, and FIG. 3 is a reflection surface of the object to be measured. Explanatory drawing showing the relationship between beam diameter and reflected light, FIG. 4 is a diagram showing the relationship between surface roughness and reflected light quantity in FIG. 3, and FIG.
The figure is a diagram showing the relationship between the surface roughness and the amount of reflected light.
まず、第1図において、第6図と同一の記号はそれぞれ
第6図と同一の部材,機器を示し、本装置が第6図と異
なるところは、第6図の信号処理部9の代わりに位相検
出器9a−1,関数発生器9a−2及び減算器9a−3よりなる
信号処理部9aを設けたことである。First, in FIG. 1, the same symbols as in FIG. 6 indicate the same members and equipments as in FIG. 6, respectively. The difference from this device in FIG. 6 is that instead of the signal processing unit 9 in FIG. That is, the signal processing unit 9a including the phase detector 9a-1, the function generator 9a-2, and the subtractor 9a-3 is provided.
このような装置において、被測定物7からの干渉信号を
光強度検出器8−2で検出し、信号処理9a内の関数発生
器9a−2と位相検出器9a−1に入力する。In such a device, the interference signal from the DUT 7 is detected by the light intensity detector 8-2 and input to the function generator 9a-2 and the phase detector 9a-1 in the signal processing 9a.
位相検出器9a−1では光強度検出器8−1の出力との位
相差が検出され、この位相差と関数発生器9a−2で求め
た出力(粗さ)とが減算器9a−3で減算されて、真の測
長値が求められる。The phase detector 9a-1 detects a phase difference from the output of the light intensity detector 8-1, and the subtractor 9a-3 detects the phase difference and the output (roughness) obtained by the function generator 9a-2. Subtracted to find the true length measurement.
その理由は下記の通りである。すなわち、第2図におい
て、レーザービーム径は被測定物の表面の粗さピッチよ
りも大であるから、第3図に示すように、その反射光は
表面の山による反射光aと谷による反射光bとのベクト
ル和c=a+bとなり、従来は、第2図に示すように、
cの平均値すなわち同図で「光での測長値」を求め、こ
れに基づいて被測定物の測長を行っていたので、「真の
測長値」との間には1/2×表面粗さの差が発生した。The reason is as follows. That is, in FIG. 2, since the laser beam diameter is larger than the roughness pitch of the surface of the object to be measured, the reflected light is reflected by the peaks of the surface and reflected by the valleys as shown in FIG. The vector sum with the light b is c = a + b, and conventionally, as shown in FIG.
Since the average value of c, that is, the "length measurement value with light" in the figure was obtained and the length of the object to be measured was measured based on this, it is 1/2 between the "true length measurement value". × A difference in surface roughness occurred.
このことは、第4図に示すように、三角波状標準粗さを
有する基準ワークにその表面粗さピッチよりも小さいビ
ーム径を有するレーザー光を投射すると、その反射光は
表面粗さの山による反射光と谷による反射光のみである
ことから判明するのである。This means that, as shown in FIG. 4, when a laser beam having a beam diameter smaller than the surface roughness pitch is projected on a reference work having a triangular wave-shaped standard roughness, the reflected light is caused by the peaks of the surface roughness. It becomes clear from the fact that it is only the reflected light and the reflected light from the valley.
一方、表面粗さと反射光量との間には、統計的に第5図
に示すように表面粗さが反射光量に反比例する関係が認
められる。On the other hand, a relationship between the surface roughness and the reflected light amount is statistically shown to be inversely proportional to the reflected light amount as shown in FIG.
そこで、本発明では、第2図に示すように、「光での測
長値」から「補正値=1/2表面粗さ」を減ずることによ
り真の測長値を求めるもので、この演算が、第1図の信
号処理9aにて行われるのである。Therefore, in the present invention, as shown in FIG. 2, a true length measurement value is obtained by subtracting "correction value = 1/2 surface roughness" from "length measurement value with light". Is performed in the signal processing 9a of FIG.
このような方法によれば、前もって、接触式粗さ計で表
面粗さを測定する必要がないので、測長時間の短縮がで
き、制度よく補正ができる。According to such a method, since it is not necessary to measure the surface roughness with a contact type roughness meter in advance, the measuring time can be shortened and the correction can be performed accurately.
要するに本発明によれば、二波長レーザー光源を使用し
て基準ワーク,被測定物よりの反射光をそれぞれ第1の
光強度検出器,第2の光強度検出器を介して検出し、上
記両反射光の位相差に基づいて上記被測定物を精密測長
する方法において、上記被測定物の反射光を検出する光
強度検出器の出力に基づいて関数発生器を介して表面粗
さを求め、上記位相差により求めた測長値と上記関数発
生器を介して求めた上記被測定物の表面の粗さとの差を
求めて表面粗さを補正することにより上記被測定物の真
の測長値を求めることにより、非接触的に高精度で被測
定物を精密測長することのできる光学式精密測定法を得
るから、本発明は産業上極めて有益なものである。In short, according to the present invention, the two-wavelength laser light source is used to detect the reflected light from the reference work and the object to be measured through the first light intensity detector and the second light intensity detector, respectively. In the method for precisely measuring the measured object based on the phase difference of the reflected light, the surface roughness is obtained through the function generator based on the output of the light intensity detector that detects the reflected light of the measured object. , The true measurement of the object to be measured by correcting the surface roughness by obtaining the difference between the length measurement value obtained from the phase difference and the surface roughness of the object to be measured obtained through the function generator. The present invention is extremely useful industrially because an optical precision measuring method capable of accurately measuring an object to be measured with high accuracy in a non-contact manner can be obtained by obtaining a long value.
第1図は本発明の一実施例を示す全体系統図、第2図は
第1図における被測定物の反射面の部分拡大図、第3図
は被測定物反射面におけるビーム径及び反射光の関係を
示す説明図、第4図は第3図における表面粗さと反射光
量との関係を示す線図、第5図は表面粗さと反射光量と
の関係を示す線図である。 第6図は従来の光学式精密測定装置を示す全体系統図、
第7図は第6図における光強度検出器の出力を示す波形
図、第8図は第6図における被測定物反射面の部分拡大
図である。 1……二波長レーザー光源、2……スキャニング反射
鏡、3……半透明鏡、4……センターミラー、5……全
反射鏡、6……基準ワーク、7……被測定物、8……光
強度検出器、9a……信号処理部、9a−1……位相検出
器、9a−2……関数発生器、9a−3……減算器FIG. 1 is an overall system diagram showing an embodiment of the present invention, FIG. 2 is a partially enlarged view of the reflection surface of the object to be measured in FIG. 1, and FIG. 3 is a beam diameter and reflected light on the reflection surface of the object to be measured. FIG. 4 is a diagram showing the relationship between the surface roughness and the amount of reflected light in FIG. 3, and FIG. 5 is a diagram showing the relationship between the surface roughness and the amount of reflected light. FIG. 6 is an overall system diagram showing a conventional optical precision measuring device,
FIG. 7 is a waveform diagram showing the output of the light intensity detector in FIG. 6, and FIG. 8 is a partially enlarged view of the reflection surface of the DUT in FIG. 1 ... Dual wavelength laser light source, 2 ... Scanning reflecting mirror, 3 ... Semi-transparent mirror, 4 ... Center mirror, 5 ... Total reflecting mirror, 6 ... Reference work, 7 ... DUT, 8 ... ... Light intensity detector, 9a ... Signal processing unit, 9a-1 ... Phase detector, 9a-2 ... Function generator, 9a-3 ... Subtractor
Claims (1)
ク,被測定物よりの反射光をそれぞれ第1の光強度検出
器,第2の光強度検出器を介して検出し、上記両反射光
の位相差に基づいて上記被測定物を精密測長する方法に
おいて、上記測定物の反射光を検出する光強度検出器の
出力に基づいて関数発生器を介して表面粗さを求め、上
記位相差により求めた測長値と上記関数発生器を介して
求めた上記被測定物の表面粗さとの差を求めて表面粗さ
を補正することにより上記被測定物の真の測長値を求め
ることを特徴とする光学式精密測長法。1. A two-wavelength laser light source is used to detect reflected light from a reference work and an object to be measured through a first light intensity detector and a second light intensity detector, respectively, and the both reflected light is detected. In the method for precisely measuring the object to be measured based on the phase difference of, the surface roughness is obtained through the function generator based on the output of the light intensity detector that detects the reflected light of the object to be measured, The true measurement value of the measured object is obtained by correcting the surface roughness by obtaining the difference between the measured value obtained by the phase difference and the surface roughness of the measured object obtained through the function generator. An optical precision length measurement method characterized by that.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12532687A JPH0726811B2 (en) | 1987-05-22 | 1987-05-22 | Optical precision measuring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12532687A JPH0726811B2 (en) | 1987-05-22 | 1987-05-22 | Optical precision measuring method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63290902A JPS63290902A (en) | 1988-11-28 |
| JPH0726811B2 true JPH0726811B2 (en) | 1995-03-29 |
Family
ID=14907348
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12532687A Expired - Lifetime JPH0726811B2 (en) | 1987-05-22 | 1987-05-22 | Optical precision measuring method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0726811B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4947301B2 (en) * | 2007-06-14 | 2012-06-06 | 独立行政法人産業技術総合研究所 | Dimension measuring apparatus and dimension measuring method |
| JP2008309652A (en) * | 2007-06-14 | 2008-12-25 | National Institute Of Advanced Industrial & Technology | Dimension measuring apparatus and dimension measuring method |
-
1987
- 1987-05-22 JP JP12532687A patent/JPH0726811B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63290902A (en) | 1988-11-28 |
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