JPH0726824B2 - Surface shape measuring device - Google Patents
Surface shape measuring deviceInfo
- Publication number
- JPH0726824B2 JPH0726824B2 JP63246450A JP24645088A JPH0726824B2 JP H0726824 B2 JPH0726824 B2 JP H0726824B2 JP 63246450 A JP63246450 A JP 63246450A JP 24645088 A JP24645088 A JP 24645088A JP H0726824 B2 JPH0726824 B2 JP H0726824B2
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- Japan
- Prior art keywords
- movement
- amount
- optical sensor
- measured
- moving
- Prior art date
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- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】 〈本発明の産業上の利用分野〉 本発明は、光センサを用いて被測定物の表面形状(即ち
表面の凹凸)を広い面積にわたって、極めて高精度に且
つ高速で測定できるようにした表面形状測定装置に関す
る。DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field of the Present Invention> The present invention uses an optical sensor to measure the surface shape (that is, surface irregularities) of an object to be measured over a large area with extremely high accuracy and at high speed. The present invention relates to a surface shape measuring device capable of measuring.
〈従来の技術〉 従来より、非接触式に被測定物の表面形状(表面の凹
凸、即ち、高さの変化)を測定する方法として、特開昭
51−124944号公報において、光センサを用いて、光束ビ
ームを被測定物の表面に直交するX−Y方向に移動させ
つつ照射し、その放射した光点像の位置によって測定す
る方法が提案されている。<Prior Art> Conventionally, as a method for non-contact measurement of the surface shape (concavity and convexity of the surface, that is, change in height) of an object to be measured, there has been disclosed
Japanese Patent Laid-Open No. 51-124944 proposes a method of irradiating a light flux beam while moving it in an XY direction orthogonal to the surface of an object to be measured using an optical sensor, and measuring the position of the emitted light point image. ing.
また、同公報には、この凹凸の高さを測定する光センサ
を被測定物の表面の凹凸に合わせて高さ方向に進退させ
て光センサの出力をゼロにし、この光センサの進退量を
測定して凹凸の量として検出する技術も提案されてい
る。Further, in the publication, an optical sensor for measuring the height of the unevenness is advanced and retracted in the height direction in accordance with the unevenness of the surface of the object to be measured to make the output of the optical sensor zero, and the amount of advance / retreat of the optical sensor is set. A technique of measuring and detecting the amount of unevenness has also been proposed.
また、特開昭50−98864号公報において、センサが検出
する被測定物表面からセンサまでの高さ信号と、予め記
憶された一定値との差が零に近づく方向にセンサを高さ
方向に進退させてセンサの出力を一定値にし、このセン
サの進退量を被測定物表面の凹凸の量として検出する技
術も提案されている。Further, in JP-A-50-98864, the sensor is moved in the height direction in a direction in which the difference between the height signal from the surface of the object to be measured detected by the sensor and the constant value stored in advance approaches zero. A technique has also been proposed in which the output of the sensor is advanced and retracted to a constant value, and the amount of advance / retreat of the sensor is detected as the amount of unevenness on the surface of the object to be measured.
〈本発明が解決しようとする問題点〉 しかしながら、このような従来の方法では、センサの出
力がゼロまたは一定値となるように、センサを物品表面
の高さ方向に進退させ、この進退量を物品表面の高さの
測定値としているが、被測定物をX−Yテーブルで移動
させながら被測定物表面の高さに合わせてセンサを進退
させつつ連続測定しようとしても、被測定物の移動が高
速な場合や、物品表面の凹凸の変化が急な場合には、完
全に表面の凹凸に一致させて正確な量だけ進退するよう
に制御することは極めて困難で、被測定物の移動が高速
となるほどセンサ進退の追随遅れが不可能であった。こ
のため、センサの進退の制御誤差がそのまま測定誤差と
して表われ、極めて微小なオーダーで測定したい場合に
は重大な欠陥となっていた。このため、この制御誤差を
小さくするには、被測定物の移動速度を充分に遅くする
か、あるいは連続測定の代わりに、被測定物の移動を停
止して間欠測定にするしかなく、微小なオーダーでの高
速な連続測定及び高精度な測定が困難であった。<Problems to be Solved by the Present Invention> However, in such a conventional method, the sensor is advanced and retracted in the height direction of the article surface so that the output of the sensor becomes zero or a constant value, and this advance / retreat amount is adjusted. Although the measured value of the height of the article surface is used, even if the sensor is moved forward and backward according to the height of the surface of the object to be measured while moving the object to be measured on the XY table, the movement of the object to be measured is moved. When the speed is high or when the unevenness of the surface of the article changes suddenly, it is extremely difficult to control it so that it moves exactly back and forth by exactly matching the unevenness of the surface, and the movement of the measured object It was impossible to keep up with the progress of the sensor as the speed increased. For this reason, the control error of advancing and retracting the sensor is directly expressed as a measurement error, which is a serious defect when it is desired to perform measurement in an extremely minute order. Therefore, in order to reduce this control error, the moving speed of the object to be measured must be sufficiently slowed, or the movement of the object to be measured must be stopped for intermittent measurement instead of continuous measurement. It was difficult to perform high-speed continuous measurement and high-precision measurement on the order.
また、微小なオーダーではX−Yテーブル上の移動にお
ける真直度誤差のため高精度な測定が不可能であった。Further, in a minute order, it is impossible to perform highly accurate measurement due to the straightness error in the movement on the XY table.
本発明はこのような問題点を解決し、X−Y平面の真直
度誤差があっても微小なオーダーでの高速な連続測定及
び高精度な測定を可能にした表面形状測定装置を提供す
ることを目的としている。The present invention solves such a problem, and provides a surface profile measuring apparatus that enables high-speed continuous measurement of a minute order and highly accurate measurement even if there is a straightness error in the XY plane. It is an object.
〈前記問題点を解決するための手段〉 前記問題点を解決するために本発明の表面形状測定装置
では 被測定物をX方向に移動させるX方向移動テーブルと、 前記X方向移動テーブルの移動量を検出するX方向移動
量検出器と、 被測定物を前記X方向と直交するY方向に移動させるX
方向移動テーブルと、 前記Y方向移動テーブルの移動量を検出するY方向移動
量検出器と、 被測定物表面に光ビームを照射し、その反射光点の位置
を検出することによって、被測定物表面の高さ信号を出
力する光センサと、 前記光センサを前記X−Y平面に垂直なZ方向に移動さ
せるZ方向移動テーブルと、 前記Z方向移動テーブルの移動量を検出するZ方向移動
量検出器と、 被測定物をオプティカルフラットとした場合において、
前記X方向移動量検出器及びY方向移動量検出器から出
力される移動量に対応づけて、前記光センサから出力さ
れる高さ信号が予め記憶設定された移動テーブルずれ量
設定装置と、 前記光センサからのある時点での高さ信号出力値を記憶
する記憶装置と、 前記記憶装置に記憶されたこの値と、前記光センサから
の高さ信号とを比較して、両者の差が零に近づく方向
に、前記Z方向移動テーブルを移動させる制御信号を出
力するZ方向移動制御装置と、 前記記憶装置に記憶された値と前記光センサからの高さ
信号との差が零に近づいたときの前記光センサからの高
さ信号と前記Z方向移動量検出器からの移動量とを加算
する加算装置と、 前記加算装置の加算結果から前記移動テーブルずれ量設
定装置に設定されたずれ量を、前記X方向移動量検出器
及びY方向移動量検出器から出力される移動量に対応づ
けて減算した値を表面高さ測定値として出力する減算装
置と を備えている。<Means for Solving the Problems> In order to solve the problems, in the surface profile measuring apparatus of the present invention, an X-direction moving table that moves an object to be measured in the X direction, and a movement amount of the X-direction moving table. X-direction movement amount detector for detecting X, and X for moving the DUT in the Y-direction orthogonal to the X-direction.
Direction moving table, Y direction moving amount detector for detecting the moving amount of the Y direction moving table, and the object to be measured by irradiating the surface of the object to be measured with a light beam and detecting the position of its reflected light point. An optical sensor that outputs a surface height signal, a Z-direction moving table that moves the optical sensor in the Z direction perpendicular to the XY plane, and a Z-direction moving amount that detects a moving amount of the Z-direction moving table. When the detector and the object to be measured are optical flat,
A movement table displacement amount setting device in which a height signal output from the optical sensor is stored in advance in association with a movement amount output from the X direction movement amount detector and the Y direction movement amount detector; A storage device that stores the height signal output value from the optical sensor at a certain point of time, this value stored in the storage device, and the height signal from the optical sensor are compared, and the difference between the two is zero. And a Z-direction movement control device that outputs a control signal for moving the Z-direction movement table in a direction approaching to, the difference between the value stored in the storage device and the height signal from the optical sensor approaches zero. When the height signal from the optical sensor and the movement amount from the Z-direction movement amount detector at the time are added, a deviation amount set in the movement table deviation amount setting device from the addition result of the addition device Is the amount of movement in the X direction And a subtraction device that outputs a value obtained by subtracting the movement amount output from the detector and the Y-direction movement amount detector as a surface height measurement value.
〈作用〉 このようにしたため、本発明の表面形状測定装置では被
測定物をX−Y平面で移動させつつ、光センサの高さ信
号と記憶装置の一定値との差が零に近づくようにZ方向
に光センサを移動制御すると共にZ方向移動量と光セン
サ出力とを加算する。従って、光センサの追随移動が被
測定物表面の凹凸に完全に一致しない場合でも、その不
一致分がZ方向移動量と光センサ出力との加算によって
相殺され、X、Y方向移動テーブルの移動に起因するZ
方向のずれは、オプティカルフラットを基準としてずれ
を予め測定し記憶し、前記加算した値から、その記憶値
を補正量として減算される。<Operation> Therefore, in the surface profile measuring apparatus of the present invention, the difference between the height signal of the optical sensor and the constant value of the storage device approaches zero while moving the object to be measured on the XY plane. The optical sensor is controlled to move in the Z direction, and the Z direction movement amount and the optical sensor output are added. Therefore, even if the follow-up movement of the optical sensor does not completely match the unevenness of the surface of the object to be measured, the mismatch is canceled by the addition of the Z-direction movement amount and the optical sensor output, and the movement of the X- and Y-direction moving table is canceled. Due to Z
The displacement in the direction is measured and stored in advance with the optical flat as a reference, and the stored value is subtracted from the added value as a correction amount.
〈本発明の実施例〉 以下、図面に基づいて本発明の一実施例を説明する。<Embodiment of the present invention> An embodiment of the present invention will be described below with reference to the drawings.
第1〜5図は本発明の実施例を示している。1 to 5 show an embodiment of the present invention.
図において、1は被測定物wを据え付ける平板状の基台
であって、この基台1はX方向移動テーブル2上を水平
方向(X軸方向)にパルスモータ3によって移動可能に
なっており、このX方向移動テーブル2はX方向の直交
するY方向移動テーブル4上を鉛直方向(Y軸方向)に
パルスモータ5によって移動可能になっている。In the figure, 1 is a flat plate-shaped base on which the object to be measured w is mounted, and this base 1 can be moved on the X-direction moving table 2 in the horizontal direction (X-axis direction) by a pulse motor 3. The X-direction moving table 2 is movable in the vertical direction (Y-axis direction) by a pulse motor 5 on a Y-direction moving table 4 which is orthogonal to the X direction.
これらの基台1、X方向移動テーブル2、Y方向移動テ
ーブル4は鉛直に設定されているため、被測定物Wは基
台1の表面に鉛直状態で据え付けられる。Since the base 1, the X-direction moving table 2, and the Y-direction moving table 4 are set vertically, the object to be measured W is vertically installed on the surface of the base 1.
被測定物を鉛直に据え付けるのは、薄板のように水平に
置くと自重によるたわみ変形が生じて、その支持の方法
により表面形状が微妙に変化する場合があるためであ
る。変形の心配がない被測定物の場合には、基台1、テ
ーブル2、4を水平にすることもできる。The object to be measured is installed vertically because when it is placed horizontally like a thin plate, it is flexibly deformed by its own weight, and the surface shape may change delicately depending on the method of supporting it. In the case of the object to be measured which is not likely to be deformed, the base 1, the tables 2 and 4 may be horizontal.
基台1の前方には、光センサ6がZ方向移動テーブル13
上をモータ14によってX−Y平面と直交するZ軸方向に
移動可能に設置されている。In front of the base 1, the optical sensor 6 has a Z-direction moving table 13
The motor 14 is installed so as to be movable in the Z-axis direction orthogonal to the XY plane.
光センサ6は、第2図に示すように、 指向性の良い光束ビームを発する光源61と、 この光束を絞って被測定物Wの表面に照射する照射レン
ズ62と、 光軸がレンズ62の光軸からある角度をなして、被測定物
wの表面の光点からの反射光束を絞って受光素子64の受
光面64aに反射光点の像を結像させる結像レンズ63と、 反射光点が被測定物Wの表面の2方向(X−Y平面に直
交する方向)の変位によって変化する場合の軌跡に受光
面64a(第4図参照)が一致するように配置され、受光
面64aにおける反射光点の像の位置に応じた二つの信号i
1、i2を出力する受光素子64と、 受光素子64の二つの出力i1、i2から被測定物Wの表面の
高さの変化Z1を として演算する演算器65と によって構成されている。As shown in FIG. 2, the optical sensor 6 includes a light source 61 that emits a light beam having good directivity, an irradiation lens 62 that narrows this light beam and irradiates the surface of the object to be measured W, and an optical axis of the lens 62. An image forming lens 63 that forms an image of the reflected light spot on the light receiving surface 64a of the light receiving element 64 by forming an angle with the optical axis and focusing the reflected light flux from the light spot on the surface of the object w to be measured; The light receiving surface 64a (see FIG. 4) is arranged so that the light receiving surface 64a (see FIG. 4) coincides with the locus when the point changes due to the displacement of the surface of the object to be measured W in two directions (directions orthogonal to the XY plane). Two signals i depending on the position of the image of the reflected light spot at
The light receiving element 64 that outputs 1 , i 2 and the two changes i 1 and i 2 of the light receiving element 64 are used to change the height Z 1 of the surface of the object to be measured W. And a computing unit 65 that computes as.
第3図に示すように、被測定物Wの表面形状がZ方向
(X−Y平面に直交する方向)に変位すると、照射レン
ズ62からの光束が表面で反射され、結像レンズ63によっ
て結像される反射光点の像QはZ方向の変位に対応して
Z′方向に変位する。As shown in FIG. 3, when the surface shape of the object to be measured W is displaced in the Z direction (direction orthogonal to the XY plane), the light flux from the irradiation lens 62 is reflected on the surface and is formed by the imaging lens 63. The image Q of the reflected light spot to be imaged is displaced in the Z'direction corresponding to the displacement in the Z direction.
このZ′方向の反射光点の像Qの変位を検出するため
に、前記したように、受光素子64の受光面64aはZ′方
向に即ち、反射光点の像Qの軸跡に一致させてある。In order to detect the displacement of the image Q of the reflected light spot in the Z'direction, the light receiving surface 64a of the light receiving element 64 is made to coincide with the axis trace of the image Q of the reflected light spot in the Z'direction, as described above. There is.
受光素子64としては、例えば第4図に示すように、Z′
方向の変位を電気信号に変換する一次元の拡散型PINダ
イオードが用いられる。As the light receiving element 64, for example, as shown in FIG.
A one-dimensional diffused PIN diode is used that converts directional displacement into an electrical signal.
なお、第3図に示された光センサ6は、被測定物Wが散
乱面である場合の測定に用いられるタイプの光学系を示
したものであり、被測定物Wが鏡面の場合には、鏡面反
射をするので、照射光束と反射光束が、被測定物Wの表
面の法線に対して対称になるようなタイプの光センサが
用いられる。The optical sensor 6 shown in FIG. 3 shows an optical system of a type used for measurement when the object to be measured W is a scattering surface, and when the object to be measured W is a mirror surface. Since the light is reflected specularly, an optical sensor of the type in which the irradiation light flux and the reflected light flux are symmetrical with respect to the normal line of the surface of the object to be measured W is used.
X方向移動テーブル2、Y方向移動テーブル4によるX
方向、Y方向の各移動量X、Yは、それぞれパルスモー
タ3、5を駆動するXドライバ8、Yドライバ9の駆動
出力を受領するX方向移動量検出器10、Y方向移動量検
出器11によって検出される。X by moving table 2 in X direction and moving table 4 in Y direction
The movement amounts X and Y in the Y and Y directions are the X direction movement amount detector 10 and the Y direction movement amount detector 11 that receive the drive outputs of the X driver 8 and the Y driver 9 that drive the pulse motors 3 and 5, respectively. Detected by.
Z方向移動テーブル13による光センサ6のZ方向移動量
Zは、周波数安定化されていないHe−Neレーザを使用し
た干渉測長器から成るZ方向移動量検出器15によって行
なわれる。The Z-direction movement amount Z of the optical sensor 6 by the Z-direction movement table 13 is performed by the Z-direction movement amount detector 15 which is an interferometer and uses an He-Ne laser whose frequency is not stabilized.
信号処理器12は、第5図の如く構成されている。The signal processor 12 is constructed as shown in FIG.
第5図において、124は、光センサ6からのある時点で
の高さ信号出力値を記憶する記憶装置である。In FIG. 5, reference numeral 124 is a storage device for storing the height signal output value from the optical sensor 6 at a certain time.
125は、記憶装置124に記憶されたこの値と、光センサ6
からの高さ信号とを比較して、両者の差が零に近づく方
向に、前記Z方向移動テーブル13を移動させる制御信号
をZドライバー16へ出力するZ方向移動制御装置であ
る。125 is the value stored in the storage device 124 and the optical sensor 6
The Z-direction movement control device outputs a control signal for moving the Z-direction movement table 13 to the Z driver 16 in the direction in which the difference between the height signal from the Z direction is close to zero.
126は、記憶装置124に記憶された値と光センサ6からの
高さ信号との差が零に近づいたときの、光センサ6から
の高さ信号とZ方向移動検出器15からの移動量とを加算
する加算装置である。Reference numeral 126 denotes a height signal from the optical sensor 6 and a movement amount from the Z-direction movement detector 15 when the difference between the value stored in the storage device 124 and the height signal from the optical sensor 6 approaches zero. It is an adding device for adding and.
128は、被測定物をオプティカルフラットとした場合に
おいて、前記X方向移動量検出器及びY方向移動量検出
器から出力される移動量に対応づけて、前記光センサか
ら出力される高さ信号が予め記憶設定された移動テーブ
ルずれ量設定装置である。Reference numeral 128 denotes a height signal output from the optical sensor in association with the movement amount output from the X-direction movement amount detector and the Y-direction movement amount detector when the measured object is an optical flat. It is a moving table deviation amount setting device stored and set in advance.
129は、前記加算装置の加算結果から前記移動テーブル
ずれ量設定装置に設定されたずれ量を、前記X方向移動
量検出器及びY方向移動量検出器から出力される移動量
に対応づけて減算した値を表面高さ測定値として出力す
る減算装置である。129 subtracts the displacement amount set in the displacement table displacement amount setting device from the addition result of the addition device in association with the displacement amount output from the X direction displacement amount detector and the Y direction displacement amount detector. This is a subtraction device that outputs the calculated value as a surface height measurement value.
127はこれらの各動作を制御する制御装置である。A control device 127 controls each of these operations.
従って、被測定物Wを基台1上に据え付け、X方向移動
テーブル2及びY方向移動テーブル4によって、基台1
をX−Y平面で移動しつつ、光センサ6の光源61の光ビ
ームを被測定物Wの表面に照射する。Therefore, the object to be measured W is installed on the base 1, and the X-direction moving table 2 and the Y-direction moving table 4 are used to fix the base 1
While moving on the XY plane, the light beam of the light source 61 of the optical sensor 6 is applied to the surface of the object to be measured W.
受光素子64からは信号i1、i2が出力され、演算器65は信
号i1、i2を受領して被測定物Wの表面のZ方向の高さZ1
を演算する。The signals i 1 and i 2 are output from the light receiving element 64, and the calculator 65 receives the signals i 1 and i 2 and receives the height Z 1 of the surface of the object to be measured W in the Z direction.
Is calculated.
被測定物WのX−Y方向への移動によって被測定物Wの
表面の高さが変化すると、光センサ6と高さ信号Z1は変
化しようとするが、常に記憶装置124の出力(一定値)
と等しくなるように、光センサ6の高さZがZ方向移動
制御装置125によって制御される。この結果、光センサ
6は表面の凹凸に追随する方向へZテーブル13によって
移動される(このため、第4図の受光素子64の受光面64
aの中心線l0近傍に常に反射光点の像Qが近づくように
される)。When the height of the surface of the object to be measured W changes due to the movement of the object to be measured W in the X-Y directions, the optical sensor 6 and the height signal Z 1 try to change, but the output of the storage device 124 is always constant (constant). value)
The height Z of the optical sensor 6 is controlled by the Z-direction movement control device 125 so as to be equal to. As a result, the optical sensor 6 is moved by the Z table 13 in the direction following the unevenness of the surface (for this reason, the light receiving surface 64 of the light receiving element 64 in FIG.
The image Q of the reflected light spot is always made to be close to the center line l 0 of a).
この時のZ方向移動量検出器15からのZ方向移動量と光
センサ6からの高さとが加算装置126で加算される。At this time, the Z-direction movement amount from the Z-direction movement amount detector 15 and the height from the optical sensor 6 are added by the adding device 126.
被測定物Wの凹凸に対する光センサ6のZ方向への追随
が完全に一致するならば光センサ6のZ方向移動制御量
そのものを被測定物Wの表面の高さを表わす測定値とす
るこのができるが、実際には、X−Y方向の移動速度が
極めて遅いか、あるいは停止させない限り、被測定物表
面の凹凸の変化に光センサ6の移動量を完全に一致させ
ることは不可能であり、また被測定物Wの表面の凹凸の
変化が急な場合にも、被測定物表面の凹凸の変化に光セ
ンサ6の移動量を完全に一致させることは不可能であ
る。If the tracking of the optical sensor 6 in the Z direction with respect to the unevenness of the object to be measured W is completely the same, the Z direction movement control amount of the optical sensor 6 itself is taken as the measured value representing the height of the surface of the object to be measured W. However, in reality, unless the moving speed in the X-Y directions is extremely slow or it is not stopped, it is impossible to perfectly match the moving amount of the optical sensor 6 with the change in the unevenness of the surface of the object to be measured. Even if the irregularities on the surface of the object to be measured W change rapidly, it is impossible to perfectly match the movement amount of the optical sensor 6 with the irregularities on the surface of the object to be measured.
しかるには、この凹凸に対する追随の誤差分だけ、光セ
ンサ6の高さ信号は偏位し、同一量だけZ方向移動量検
出器15の出力は光センサ6の偏位と逆向きに偏位してい
るから、両者の加算装置126による加算によって、追随
誤差は相殺される。この結果、被測定物の表面の凹凸に
対する光センサ6のZ方向への追随が不完全でも常に極
めて高精度に測定でき、また、このように加算で補なう
からX−Yテーブルを高速に動かしながら測定が可能と
なる。Therefore, the height signal of the optical sensor 6 is deviated by the error due to the unevenness, and the output of the Z-direction movement amount detector 15 is deviated by the same amount in the direction opposite to the deviation of the optical sensor 6. Therefore, the follow-up error is canceled by the addition by the adding device 126 of both. As a result, even if the unevenness of the surface of the object to be measured in the Z direction of the optical sensor 6 is imperfect, the measurement can always be performed with extremely high accuracy, and since the compensation is made by addition in this way, the XY table is moved at high speed. While it is possible to measure.
しかも、光センサ6は被測定物Wの表面の凹凸に追随し
てZ方向に移動して、光センサ6の記憶装置124に記憶
されたある時点での出力との差が零に近づくようにされ
ているので、被測定物Wの表面の凹凸の変化量が大きく
ても、常にPINダイオードの中央l0近くへ光像を近づけ
るように制御しているから、測定範囲からはみだすこと
がなく、常に高精度の測定がなされる。Moreover, the optical sensor 6 moves in the Z direction following the unevenness of the surface of the object to be measured W so that the difference between the output of the optical sensor 6 and the output at a certain time stored in the storage device 124 approaches zero. Therefore, even if the amount of change in the unevenness of the surface of the object to be measured W is large, the light image is controlled so as to always come close to the center l 0 of the PIN diode. Highly accurate measurements are always made.
この測定において、第1図に示したX、Yテーブル2、
4のX方向、Y方向の移動そのものによってZ方向の高
さのずれが問題となる。このため、被測定物をオプティ
カルフラットとした場合において、前記X方向移動量検
出器10及びY方向移動量検出器11から出力される移動量
X、Yに対応づけて、前記光センサ6から出力される高
さ信号Z1を予め移動テーブルずれ量設定装置128に記憶
させる。In this measurement, the X, Y table 2 shown in FIG.
The displacement of the height in the Z direction becomes a problem due to the movement itself of 4 in the X and Y directions. Therefore, when the object to be measured is an optical flat, it is output from the optical sensor 6 in association with the movement amounts X and Y output from the X-direction movement amount detector 10 and the Y-direction movement amount detector 11. The height signal Z 1 to be stored is previously stored in the moving table displacement amount setting device 128.
即ち、オプティカルフラットを測定した場合の光センサ
6の出力はX、Yテーブル移動における各移動位置ごと
のZ方向のずれ量を示している。このずれ量がX−Y平
面の全体について、移動テーブルずれ量設定装置128に
予め設定してある。That is, the output of the optical sensor 6 when the optical flat is measured indicates the amount of deviation in the Z direction for each movement position in the X and Y table movement. This displacement amount is preset in the moving table displacement amount setting device 128 for the entire XY plane.
そして、前記移動テーブルずれ量設定装置12に設定され
たずれ量を、前記X方向移動量及びY方向移動量に対応
づけて、前記加算装置126の加算結果から減算装置129で
減算する。この結果、X−Y方向移動テーブルが理想的
なX−Y平面内運動からずれても測定誤差が生じず、こ
の結果、X、および、Y方向移動テーブルの真直度誤差
がキャンセルされ、超高精度の移動テーブルを用いたの
と同じく、高精度の形状測定ができる。Then, the shift amount set in the movement table shift amount setting device 12 is associated with the X-direction movement amount and the Y-direction movement amount, and subtracted by the subtraction device 129 from the addition result of the addition device 126. As a result, even if the X-Y direction moving table deviates from the ideal movement in the X-Y plane, a measurement error does not occur, and as a result, the straightness error of the X and Y direction moving tables is canceled and the ultra-high movement is achieved. High-precision shape measurement can be performed as well as using a precision moving table.
なお、被測定物を基台1に固定した場合、その鉛直固定
位置から、ずれる場合がある。When the object to be measured is fixed to the base 1, it may deviate from the vertically fixed position.
このため、信号処理器12で被測定物Wの表面の三点のZ
方向の高さを光センサ6の出力によって記憶し、この三
点のZ方向の高さが等しい値となるように被測定物Wを
仮想的に置き変えた場合の、他の任意の点のZ方向高さ
を出力するように構成すれば、被測定物の固定のしかた
に依存せず形状を求めることができる。Therefore, the signal processor 12 uses three Z points on the surface of the object to be measured W.
The height in the direction is memorized by the output of the optical sensor 6, and the object W to be measured is virtually replaced so that the heights in the Z direction of these three points have the same value. If the height is output in the Z direction, the shape can be obtained without depending on how the object to be measured is fixed.
なお、Z方向の高さからZ方向の等高線の位置を出力す
るように構成することもできる。It is also possible to output the position of the contour line in the Z direction from the height in the Z direction.
〈本発明の効果〉 以上説明したように本発明では、 X−Yテーブル移動に起因するZ方向のずれを予め設定
して測定結果から減算するため、X−Y平面移動誤差の
影響をなくすことができ、極めて高精度の測定が可能と
なる。<Effects of the Present Invention> As described above, according to the present invention, since the deviation in the Z direction due to the movement of the XY table is preset and subtracted from the measurement result, the influence of the XY plane movement error is eliminated. Therefore, extremely high precision measurement is possible.
第1図は本発明の一実施例の表面形状測定装置の機構部
を示す斜視図、第2図はその回路部のブロック図、第3
図は光センサによる測定原理を示す図、第4図は受光素
子の一例を示す説明図、第5図は第2図の信号処理器の
具体的構成を示すブロック図である。 W……被測定物、1……基台、2……X方向移動テーブ
ル、4……Y方向移動テーブル、6……光センサ、10…
…X方向移動量検出器、11……Y方向移動量検出器、12
……信号処理器、13……Z方向移動テーブル、15……Z
方向移動量検出器、124……記憶装置、128……ずれ量設
定装置。FIG. 1 is a perspective view showing a mechanical portion of a surface profile measuring apparatus according to an embodiment of the present invention, FIG. 2 is a block diagram of a circuit portion thereof, and FIG.
FIG. 4 is a diagram showing the principle of measurement by an optical sensor, FIG. 4 is an explanatory diagram showing an example of a light receiving element, and FIG. 5 is a block diagram showing a concrete configuration of the signal processor of FIG. W ... DUT, 1 ... Base, 2 ... X-direction moving table, 4 ... Y-direction moving table, 6 ... Optical sensor, 10 ...
… X direction movement amount detector, 11 …… Y direction movement amount detector, 12
...... Signal processor, 13 …… Z direction moving table, 15 …… Z
Directional movement amount detector, 124 ... storage device, 128 ... deviation amount setting device.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭58−47209(JP,A) 特開 昭50−98864(JP,A) 特開 昭51−124944(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-58-47209 (JP, A) JP-A-50-98864 (JP, A) JP-A-51-124944 (JP, A)
Claims (1)
テーブルと、 前記X方向移動テーブルの移動量を検出するX方向移動
量検出器と、 被測定物を前記X方向の直交するY方向に移動させるY
方向移動テーブルと、 前記Y方向移動テーブルの移動量を検出するY方向移動
量検出器と、 被測定物表面に光ビームを照射し、その反射光点の位置
を検出することによって、被測定物表面の高さ信号を出
力する光センサと、 前記光センサを前記X−Y平面に垂直なZ方向に移動さ
せるZ方向移動テーブルと、 前記Z方向移動テーブルの移動量を検出するZ方向移動
量検出器と、 被測定物をオプティカルフラットとした場合において、
前記X方向移動量検出器及びY方向移動量検出器から出
力される移動量に対応づけて、前記光センサから出力さ
れる高さ信号が予め記憶設定された移動テーブルずれ量
設定装置と、 前記光センサからのある時点での高さ信号出力値を記憶
する記憶装置と、 前記記憶装置に記憶されたこの値と、前記光センサから
の高さ信号とを比較して、両者の差が零に近づく方向
に、前記Z方向移動テーブルを移動させる制御信号を出
力するZ方向移動制御装置と、 前記記憶装置に記憶された値と前記光センサからの高さ
信号との差が零に近づいたときの前記光センサからの高
さ信号と前記Z方向移動量検出器からの移動量とを加算
する加算装置と、 前記加算装置の加算結果から前記移動テーブルずれ量設
定装置に設定されたずれ量を、前記X方向移動量検出器
及びY方向移動量検出器から出力される移動量に対応づ
けて減算した値を表面高さ測定値として出力する減算装
置と を備えた表面形状測定装置。1. An X-direction movement table for moving an object to be measured in the X direction, an X-direction movement amount detector for detecting an amount of movement of the X-direction movement table, and a Y-direction orthogonal to the object to be measured. Y to move in the direction
Direction moving table, Y direction moving amount detector for detecting the moving amount of the Y direction moving table, and the object to be measured by irradiating the surface of the object to be measured with a light beam and detecting the position of its reflected light point. An optical sensor that outputs a surface height signal, a Z-direction moving table that moves the optical sensor in the Z direction perpendicular to the XY plane, and a Z-direction moving amount that detects a moving amount of the Z-direction moving table. When the detector and the object to be measured are optical flat,
A movement table displacement amount setting device in which a height signal output from the optical sensor is stored in advance in association with a movement amount output from the X direction movement amount detector and the Y direction movement amount detector; A storage device that stores the height signal output value from the optical sensor at a certain point of time, this value stored in the storage device, and the height signal from the optical sensor are compared, and the difference between the two is zero. And a Z-direction movement control device that outputs a control signal for moving the Z-direction movement table in a direction approaching to, the difference between the value stored in the storage device and the height signal from the optical sensor approaches zero. When the height signal from the optical sensor and the movement amount from the Z-direction movement amount detector at the time are added, a deviation amount set in the movement table deviation amount setting device from the addition result of the addition device Is the amount of movement in the X direction A surface shape measuring device comprising: a detector and a subtracting device that outputs a value subtracted in correspondence with the movement amount output from the Y-direction movement amount detector as a surface height measurement value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63246450A JPH0726824B2 (en) | 1988-09-30 | 1988-09-30 | Surface shape measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63246450A JPH0726824B2 (en) | 1988-09-30 | 1988-09-30 | Surface shape measuring device |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14489181A Division JPS5847209A (en) | 1981-09-15 | 1981-09-15 | Device for measuring surface configuration |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP28426094A Division JP2511809B2 (en) | 1994-10-25 | 1994-10-25 | Surface shape measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH028706A JPH028706A (en) | 1990-01-12 |
| JPH0726824B2 true JPH0726824B2 (en) | 1995-03-29 |
Family
ID=17148619
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63246450A Expired - Lifetime JPH0726824B2 (en) | 1988-09-30 | 1988-09-30 | Surface shape measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0726824B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002250618A (en) * | 2001-02-26 | 2002-09-06 | Fotonikusu:Kk | Exercise table control method and device, and three-dimensional surface shape measurement method and device |
| CN113805529A (en) * | 2021-08-05 | 2021-12-17 | 傲深实验室科技(杭州)有限公司 | A height measuring method and system based on numerical control equipment height measuring components |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5098864A (en) * | 1973-12-27 | 1975-08-06 | ||
| JPS51124944A (en) * | 1975-04-25 | 1976-10-30 | Nippon Kogaku Kk <Nikon> | Device to detect a tangent line of contour line on a three dimentional object |
-
1988
- 1988-09-30 JP JP63246450A patent/JPH0726824B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH028706A (en) | 1990-01-12 |
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