JPH0731053B2 - Inspection method for taped parts - Google Patents

Description

TECHNICAL FIELD The present invention relates to a method for inspecting a large number of parts that are aligned and held in a line by taping.

[Prior Art] Image processing has been conventionally used as a means for determining quality of various parts.
After information acquisition and processing such as quantization of the captured image and feature extraction, the quality of the target component is determined by comparison with the reference data. In such an inspection method using image processing, it is general to remove an unnecessary portion from the captured image, and for that reason, an area (window) to be processed is set. A method of inspecting a component by this window setting method is disclosed in, for example, Japanese Patent Laid-Open No. 60-27084, and a window in which an entire shape image of a component captured by a camera installed in the vicinity of a component transfer path is preset. And the quality of the target component is determined by comparing the result of this overlay with the reference data.

[Problems to be Solved by the Invention] When the number of inspection items for a part is small and the quality of the part can be determined only by extracting an image of the entire shape, the entire shape of the target part can be measured by one camera as in the conventional example. It's enough to take out. However, for example, when loading an electronic component into a device that automatically inserts the electronic component into a printed circuit board, a large number of electronic components of the same type are aligned and held in a row with a tape, and therefore the presence of the tape and the inspection of the electronic component itself are performed. Due to the large number of items, it is not possible to obtain the images required for all inspection items by only capturing the entire shape with one camera.
Therefore, the images of the target parts have to be taken out from a plurality of directions by a plurality of cameras, which poses a problem regarding the installation space and cost of the cameras. Moreover, if the arrangement direction of the parts to be inspected is reversed, a troublesome switching operation such as changing the installation position of the irradiation light source or the camera according to this change in direction is required.

[Means for Solving the Problems] Therefore, in the present invention, an inspection station is set on a running path of a holding tape for aligning and holding a large number of parts in a line, and the holding tape is sequentially transferred to the inspection station by running. A pair of light sources for illuminating a pair of adjacent parts from different directions are arranged in parallel in the running direction of the holding tape in the reflective area near the inspection station, and the part to be inspected is on the running direction side of the holding tape. In this case, the lighting illumination of either one of the two light sources is made to correspond to only one of the adjacent components, and the transmission lighting is made to correspond to the other component. When the window for reflected light image processing is set and the inspection target area of the component is on the side opposite to the running direction of the holding tape, the lighting of the other of both light sources is set to the other of the adjacent components. In addition to the above, one of the adjacent parts is made to correspond to the transmission illumination, and the second reflected light image processing window is set to correspond to the extraction path of the reflected light of the other lighting illumination. A single inspection image is taken out and set through the reflected light and transmitted light takeout paths, and the image processing window preset corresponding to each takeout path and the taken out set inspection image are superposed. Based on the above, information is collected and processed for the quality judgment.

The pair of adjacent parts transferred to the inspection station receives the irradiation light from the irradiation light source, and the reflected light from the part for one irradiation light and the transmitted light from the other part for the transmitted illumination pass through different paths from each other. And a single inspection image is extracted and set. The path of the reflected light can be set by using, for example, a mirror other than the direct reflection path from the target component, and a single inspection image can be set by such various path settings. This makes it possible to easily extract a plurality of images related to each inspection item of a component as a single image regardless of the presence of the holding tape. In addition, when the arrangement direction of the inspection target parts is reversed, the image corresponding to the lighting of the other irradiation light source may be set as the inspection target, and by switching the target, the image for inspection is moved in the tape running direction. An inverted inspection image is obtained. Therefore, 1
Efficient inspection can be achieved without changing the light source or the installation position of the cameras with only one camera, and cost reduction can also be achieved.

[Embodiment] An embodiment in which the present invention is embodied in an inspection method for an electrolytic capacitor will be described below with reference to the drawings.

As shown in FIGS. 1 and 2, a pair of long and short polar lead wires 2 and 3 of a large number of electrolytic capacitors 1 are attached and held on a strip-shaped mount 4 with a tape 5 perpendicular to the longitudinal direction thereof. The main body 6 of 1, 1A, 1B extends laterally orthogonal to the longitudinal direction of the tape 5 and is aligned and held in a line.
The electrolytic capacitors 1, 1A, 1B are held spaced apart at a predetermined pitch p, and the electrolytic strips 1, 1A, 1B are provided with a positioning hole 7 in the strip mount 4 and the tape 5 at a predetermined pitch p for each electrolytic capacitor. Capacitors 1, 1A and 1B are transparently provided between them.

The strip-shaped backing sheet 4 and the tape 5 for aligning and holding a large number of electrolytic capacitors 1, 1A, 1B in a line form a pair of adjacent transfer rollers 8,
Positioning pins 8a and 9a that fit into the positioning holes 7 are formed on the peripheral surfaces of both rollers 8 and 9 at a pitch p, respectively. One of the transfer rollers 8 is a driving roller for intermittently feeding the pitch p, and the strip-shaped backing sheet 4 and the tape 5 are intermittently transferred by the pitch p based on the fitting of the positioning pins 8a, 9a and the positioning holes 7.

A pair of lamps 10, 10 is provided above the one side of the strip-shaped mount 4 (on the side of the main body 6 of the electrolytic capacitors 1, 1A, 1B) between the transfer rollers 8, 9.
11 lamps are installed so that they can be illuminated downward, and both lamps 10, 11
A shielding plate 12 is interposed between the column and the electrolytic capacitors 1, 1A, 1B row, and a slit 12a is provided in the lower portion of the shielding plate 12. The slit 12a is set between the two lamps 10 and 11, and the irradiation light from one lamp 10 passes through the slit 12a from the front side (the tape 5 is directed in the front direction) to the electrolytic capacitor 1, While being incident on the 1A and 1B columns, the irradiation light from the other lamp 11 is incident on the electrolytic capacitors 1, 1A and 1B columns from the rear side through the slit 12a.

A third lamp 17 is installed directly below the capacitors 1, 1A, 1B column so as to face both lamps 10, 11, and the light is dispersed between the lamp 17 and the capacitors 1, 1A, 1B column. There is a screen 18 for this. The irradiation light from the lamp 17 passes through the screen 18 and goes upward.

Corresponding to both lamps 10 and 11, first and second mirrors 13 and 14 are installed on the columns of capacitors 1, 1A and 1B so as to face each other, and above the middle portion of both mirrors 13 and 14. The third mirror 15 is tape 5
The image pickup camera 16 is arranged rearward of the third mirror 15 and is substantially parallel to the traveling direction of the tape 5.
The first mirror 13 is an electrolytic capacitor that receives the light emitted from the lamp 10.
The reflected light from 1B is sent to the third mirror 15 and the second mirror 14
Sends the reflected light from the electrolytic capacitor 1A receiving the irradiation light of the lamp 11 to the third mirror 15, and the third mirror 15 reflects the reflected light from the first and second mirrors 13 and 14 and the irradiation from the lamp 17. The light is reflected toward the camera 16. That is, the first and second mirrors 13, 14
Is set as an inspection station S for the electrolytic capacitors 1, 1A, 1B, and the interval between the two mirrors 13, 14 is set larger than the interval between the pair of adjacent electrolytic capacitors 1A, 1B.

Inspection station S by intermittent feed drive of transfer roller 8
In the case where the electrolytic capacitors 1, 1A, 1B sequentially sent to the wiring are arranged in a state where the negative short polarity lead wire 3 is arranged on the traveling side as shown in FIGS. 1 and 2 (a) and (b), the inspection station The electrolytic capacitor 1B fed into S is irradiated with light from the first lamp 10 at the inspection station S.

Light emitted from the first lamp 10 is incident on the electrolytic capacitor 1B from the slit 12a along the path represented by the arrow Zb, and directs the negative polarity lead wire 3 to direct the negative polarity lead wire 3 of the electrolytic capacitor 1B. Negative mark darkened on one side
The reflected light from the area 6a is taken into the camera 16 via the first mirror 13 and the third mirror 15 along the path represented by the arrow Yb.

The light emitted from the third lamp 17 passes through the screen 18 along the path represented by the arrow Xa ₁ , and this transmitted light Xa ₁ is reflected from the mirror 15 to the path represented by the arrow Xa ₂ and is reflected by the camera. 1
Incorporated into 6.

FIG. 2 (c) is an image of the one-dot chain line area of FIG. 2 (b) captured by the camera 16. Area D1 is the dark part of the main body 6 of the electrolytic capacitor 1 formed by the transmitted light Xa, and area D2 is A dark portion of one polar lead wire 2 formed by the transmitted light Xa and a region D3 represent a dark portion obtained by inverting the reflected bright portion of the other polar lead wire 3 formed by the transmitted light Xa. Also, the area D4 on the right side of the area D1
Represents a reflection image near the negative mark 6a captured by reflection from the first mirror 13, and the peripheral surface of the main body 6 excluding the negative mark 6a and the bipolar leads 2 and 3 are displayed as bright parts. The negative mark 6a is displayed as a dark area.

The image processing target area (window) for shape recognition is shown in FIG. 2 (c) corresponding to the single bright / dark image extracted through the incident paths Xa ₁ and Zb and the extraction paths Xa ₂ and Yb. )
A plurality of items are set as indicated by a broken line. Well-known means such as the setting method disclosed in JP-A-60-27084 is used for setting the window. The window is set according to the inspection items of the electrolytic capacitors 1, 1A, 1B. The inspection items include inclination and height with respect to the strip-shaped mount 4 and the tape 5, pitch deviation between parts, abnormal molding of the polar lead wires 2, 3. There are abnormal positions of the negative mark 6a, product type determination, presence / absence of parts, and the like. The inclination is determined based on the overlap between the window W1 and the area D1, and the height is determined based on the overlap between the window W2 and the area D1. The pitch deviation is judged based on the respective overlaps of the window W1 and the area D1, the window W3 and the areas D2, D3, the windows W4, W6 and the area D2, and the windows W5, W7 and the area D3. Molding abnormalities are window W3 and areas D2, D3, window
Judgment is made based on the respective superpositions of W4, W6 and area D2 and windows W5, W7 and area D3.

Product type determination is performed based on the overlap of windows W1, W2 and area D1, windows W3, W4 and area D2, windows W3, W4, W5 and area D1, and windows W3, W5 and area D3. It is performed based on the overlapping of the windows W1 and W2 and the area D1, the window W6 and the area D2, and the window W7 and the area D3.
Further, the abnormal position of the negative mark 6a is judged based on the superposition of the first reflected light image processing window W8 and the inspection area D4.

These judgments are made based on the comparison between the processing data of the information obtained by superposition in the image processing system and the preset reference data, and the control system that performs this comparison outputs the quality judgment result for the inspection target component. To be done. If the parts to be inspected are non-defective, the superimposition of a single image for inspection obtained through the takeout paths Xa ₂ and Yb and the windows W1 to W8 has the relationship shown in FIG. 2 (c).

The window W1 for making a pass / fail judgment of such parts
Of the W8, the first reflected light image processing window W8 is the first mirror
It is set in correspondence with the inspection of the negative polarity mark 6a taken out by the installation of 13, and the position inspection of the negative polarity 6a is performed in the electrolytic capacitor 1B at the position shown in FIGS. 2 (a) and 2 (b). . Further, the molding abnormality of the main body portion 6 and the bipolar lead wires 2 and 3 is performed in the electrolytic capacitor 1A at the positions shown in FIGS. 2 (a) and 2 (b). That is, the position inspection of the negative mark 6a, which cannot be performed on a single image with a single irradiation light for a single electrolytic capacitor, the inclination and height inspection of the main body 6, the abnormal formation of the polar lead wires 2 and 3 Such various inspections can be performed by illuminating the electrolytic capacitor 1A out of a pair of adjacent electrolytic capacitors 1A and 1B by transmitting illumination and by illuminating the electrolytic capacitor 1B by reflecting illumination. That is, in the contour inspection, a clear image can be obtained by making the silhouette by the transmission illumination, and the negative mark inspection can be performed by the reflection illumination through the slit 12a without breaking the silhouette for the contour inspection. Therefore, despite the large number of inspection items, it is possible to easily take out the images of the respective parts required for the inspection items of the inspection target component with one camera 16 and perform a stable inspection. The problems of conventional inspection methods such as installation space and cost are eliminated.

3 (a), (b) and (c) show electrolytic capacitors 1, 1A, 1
This is a case where the arrangement direction of B is opposite to that of FIGS. 2 (a), (b), and (c), and the short polar lead wire 3 and the negative mark
6a is located on the side opposite to the traveling side. In this arrangement, the lamp 11 is turned on and the light emitted from the lamp 11 is indicated by the arrow.
The slit 12 of the blocking plate 12 along the incident path represented by Za
The light incident from a and reflected from the electrolytic capacitor 1A is indicated by the arrow Ya.
Is taken into the camera 16 along the take-out path represented by. The arrows Xb ₁ and Xb ₂ represent the irradiation light from the third lamp 17, whereby the silhouette of the electrolytic capacitor 1B is obtained. As shown in FIG. 3 (c), the taken-out image is substantially left-right inverted with respect to the image in FIG. 2 (c), and each region D1 ', D2', D3 ', D4. ′ Is the area D1, D
It corresponds to 2, D3, D4. Then, the windows W1 ′, W2 ′, W3 ′, W4 ′, W5 ′, W6 ′, W7 ′, W corresponding to the windows W1 to W8.
8'is set similarly. The position abnormality of the negative mark 6a is judged based on the superposition of the second reflected light image processing window W8 'and the inspection target area D4'. That is, it is possible to deal with the change of the arrangement direction of the electrolytic capacitors 1, 1A and 1B simply by switching the lighting of the lamps 10 and 11 and the setting of the window, such as the rearrangement of the mirrors 13, 14, 15 or the rearrangement of the camera 16. There is no need to perform troublesome operations.

The present invention is of course not limited to the above-mentioned embodiment, for example, it is also possible to adopt a concave mirror as a reflecting mirror, the adoption of a concave mirror enables the setting of an enlarged image of a specific site necessary for the inspection, The accuracy can be increased. Alternatively, an optical fiber can be used to set the extraction path of the reflected light, which makes it easier to set the extraction path.

The present invention can also be applied to inspection of electronic components other than the electrolytic capacitor, and further inspection of components other than the electronic component.

[Effects of the Invention] As described in detail above, according to the present invention, the pair of adjacent components transferred to the inspection station by the running of the holding tape are adjacent to each other so that either one of the pair of light sources is turned on. Corresponding to only one of the parts, and corresponding to the other side of the transmitted illumination, picking up and setting a single inspection image via the extraction path of reflected light and transmitted light from both parts,
Information is collected and processed for the quality judgment based on the overlay of the preset window corresponding to each extraction path and the inspection image set for extraction, so that regardless of the existence of the holding tape. It is said that multiple images related to each inspection item of a part can be retrieved as a single image without difficulty, and moreover, it is possible to easily deal with the change of the arrangement direction of the inspection parts and achieve stable inspection and cost reduction. It has an excellent effect.

[Brief description of drawings]

The drawings show an embodiment embodying the present invention. FIG. 1 is a perspective view showing the vicinity of an inspection station, FIG. 2 (a) is a front view of essential parts, FIG. 2 (b) is a plan view, and FIG. FIG. 3 (c) is a region diagram showing the superposition relationship between the extracted image and the set window, and FIGS. 3 (a), 3 (b) and 3 (c) show the arrangement direction of the electrolytic capacitors in FIG. 2 (a). FIG. 3 (a) is a front view of the main part, FIG. 3 (b) is a plan view, and FIG. 3 (c) is an overlay of the extracted image and the setting window. It is an area | region figure which shows a matching relationship. Electrolytic capacitors as taped parts 1,1A, 1
B, strip mount 4 and tape 5 for taping parts, lamps 10 and 11 as light sources, inspection station S,
Extraction path Xa, Xb, Ya, Yb, window W1, W2, W3, W4, W5, W
6, W7, first reflected light image processing window W8, window W
1 ', W2', W3 ', W4', W5 ', W6', W7 ', second reflected light image processing window W8', inspection target areas D4, D4 '.

Claims (1)

[Claims] 1. An inspection station (S) is set on a running path of a holding tape (4,5) for holding and holding a large number of parts (1, 1A, 1B) in a line, and the holding tape (4,5) is set. ), A pair of light sources (10, 11) for irradiating a pair of adjacent parts (1A, 1B) sequentially transferred to the inspection station (S) from different directions are provided with a reflective area near the inspection station (S). When the inspection target area (D4) of the parts (1A, 1B) is on the holding tape (4,5) running direction side, both light sources ( Either one of the lighting illuminations (10, 11) corresponds to only one of the adjacent components (1A, 1B) and the other one corresponds to the transmission illumination, and the extraction path (Ya ), The first reflected light image processing window (W8) is set, and the inspection target area (D4 ') of the parts (1A, 1B) is the holding tape. 4, 5)
Both light sources (10,11) if they are on the opposite side of the running direction
The other lighting of the above is made to correspond only to the other of the adjacent parts (1A, 1B), and the one of the adjacent parts (1A, 1B) is made to correspond to the transmissive lighting, and the reflected light of the other lighting is reflected. The second reflected light image processing window (W8 ′) is set in correspondence with the extraction path (Yb) of the above, and the extraction paths (Ya, Xb ₂ or of the reflected light and the transmitted light from both parts (1A, 1B) are set. Yb, X
a ₂ ) A single inspection image is extracted and set, and the image processing windows (W1 to W8, W1 ′) preset corresponding to each extraction path (Ya, Xb ₂ or Yb, Xa ₂ ) are set. ~ W8 ') and the inspection method of the taped parts, which collects and processes information for the quality judgment based on the superposition of the inspection image set to be taken out.