JPH073410B2 - Ultrasonic bevel flaw detection method - Google Patents
Ultrasonic bevel flaw detection methodInfo
- Publication number
- JPH073410B2 JPH073410B2 JP60252278A JP25227885A JPH073410B2 JP H073410 B2 JPH073410 B2 JP H073410B2 JP 60252278 A JP60252278 A JP 60252278A JP 25227885 A JP25227885 A JP 25227885A JP H073410 B2 JPH073410 B2 JP H073410B2
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- Prior art keywords
- probe
- test body
- echo
- transmitting
- transmitter
- Prior art date
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- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 この発明は丸棒状又は管状の試験体の超音波による斜角
探傷方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of use] The present invention relates to a method for oblique angle flaw detection of a round rod-shaped or tubular test body by ultrasonic waves.
周知のように金属材料中の探傷に用いられる超音波の代
表的波動には縦波と横波があるが,従来丸棒状試験体の
表面及び表層部の探傷方式としてはJISのZ-2344などに
定められた横波による超音波斜角探傷方法が多用されて
いることは良く知られている。As is well known, typical waves of ultrasonic waves used for flaw detection in metal materials include longitudinal waves and transverse waves. Conventionally, as a flaw detection method for the surface and surface layer of a round rod-shaped test body, JIS Z-2344 is used. It is well known that the ultrasonic oblique angle flaw detection method using a predetermined transverse wave is widely used.
しかしながら,丸棒状試験体(以下試験体と略す)中に
放射された超音波ビームは,試験体中を回転し,試験体
軸に垂直な同一円周上に配置された超音波斜角探触子や
超音波を放射した探触子自身にも妨害エコーとして入射
されることは「超音波試験技術」1980年2月25日(社団
法人日本能率協会)発行〔364〜367ページ〕などにより
良く知られた事実である。However, the ultrasonic beam radiated into the round bar test body (hereinafter referred to as the test body) rotates in the test body, and the ultrasonic bevel probe is arranged on the same circumference perpendicular to the test body axis. It is better that the probe itself that radiates ultrasonic waves and ultrasonic waves is also incident as an interfering echo by issuing "Ultrasonic test technology" on February 25, 1980 (Japan Management Association) [pp.364-367]. This is a known fact.
そのため,検査効率を高めるためにパイプ探傷などに良
く用いられる同一円周上に複数の探触子を配置し,探触
子または試験体を回転させ試験体の全周に渡つて探傷す
る方式を丸棒状試験体に適用することは試験体中を伝搬
する妨害エコーのため困難であつた。以下この妨害エコ
ーについての発生原因と,従来実施されていた方法につ
いて説明する。Therefore, in order to improve inspection efficiency, multiple probes are arranged on the same circumference that is often used for pipe flaw detection, etc., and the probe or test piece is rotated to perform flaw detection over the entire circumference of the test piece. It is difficult to apply it to a round bar specimen because of the disturbing echo propagating in the specimen. The cause of this disturbing echo and the conventional method will be described below.
第4図は試験体の同一円周上に複数の探触子を配置とそ
の場合の試験体中の超音波ビームの伝搬状況を示す説明
図,第5図は第4図で説明された超音波ビームを探傷装
置のAスコープ上での試験体中を伝搬する超音波ビーム
による妨害エコーの発生状況を示す図である。FIG. 4 is an explanatory view showing a plurality of transducers arranged on the same circumference of the test body and the propagation state of the ultrasonic beam in the test body in that case, and FIG. 5 is the explanatory view shown in FIG. It is a figure which shows the generation condition of the interference echo by the ultrasonic beam which propagates a sound wave beam in the test body on the A scope of a flaw detector.
第4図において,(1)は試験体の表面及び表層部の欠
陥を検出するための試験体中の屈折角度が45°の送・受
信用探触子,(3)は送・受信用探触子(1)の同一円
周上の対向する位置に配置された試験体の表面及び表層
部の欠陥を検出するための試験体中の屈折角度が45°の
送・受信用探触子,(5)は試験体,(6)は試験体表
面にある欠陥,(7)は送・受信用探触子(1)から放
射された超音波ビーム,(9)は送・受信用探触子
(3)から放射された超音波ビームである。第5図にお
いて,(a)は送・受信用探触子(1)の単独送・受信
の場合のAスコープ波形,(b)は送・受信用探触子
(3)のみが送信した場合の送・受信用探触子(1)が
受信する送・受信用探触子(3)からの妨害エコーのA
スコープ波形,(c)は送・受信用探触子(3)の単独
送・受信の場合のAスコープ波形,(d)は送・受信用
探触子(1)のみが送信した場合の送・受信用探触子
(3)が受信する送・受信用探触子(1)からのAスコ
ープ波形,(e)は送・受信探触子(1),(3)に設
定される欠陥検出用ゲートのタイミングである。In Fig. 4, (1) is a transmitter / receiver probe with a refraction angle of 45 ° in the specimen for detecting defects on the surface and surface layer of the specimen, and (3) is a transmitter / receiver probe. Transmitter / receiver probe with a refraction angle of 45 ° in the test body for detecting defects on the surface and surface layer of the test body, which are arranged at opposite positions on the same circumference of the probe (1), (5) is the test body, (6) is a defect on the surface of the test body, (7) is the ultrasonic beam emitted from the transmitter / receiver probe (1), and (9) is the transmitter / receiver probe. The ultrasonic beam emitted from the child (3). In FIG. 5, (a) is an A-scope waveform when the transmitter / receiver probe (1) is individually sent and received, and (b) is a case where only the transmitter / receiver probe (3) is transmitted. A of the disturbing echo from the transmitting / receiving probe (3) received by the transmitting / receiving probe (1) of
Scope waveform, (c) A scope waveform when the transmitter / receiver probe (3) is individually transmitted / received, (d) is transmission when only the transmitter / receiver probe (1) is transmitted. -A scope waveform from the transmitting / receiving probe (1) received by the receiving probe (3), (e) is a defect set in the transmitting / receiving probe (1), (3) This is the timing of the detection gate.
送・受信用探触子(1)から試験体(5)内に放射され
た超音波ビーム(7)は試験体の外壁に反射し,試験体
中を伝搬し試験体を1周した後,送・受信用探触子
(1)へ戻つてくる。その場合のAスコープ波形が第5
図の(a)である。Aスコープには超音波ビームの伝搬
に伴い,送信タイミングの波形Tと超音波ビームが表面
に入射した時に反射してきた表面エコー(sエコーと略
す),超音波ビームが試験体中を1周したエコー(以下
R1エコーと略す),及び伝搬過程で表面欠陥(6)によ
り3/4周反射された欠陥エコー(以下f3エコーと略す)
が観測される。The ultrasonic beam (7) emitted from the transmitting / receiving probe (1) into the test body (5) is reflected on the outer wall of the test body, propagates in the test body, and travels once around the test body. It returns to the transmitting / receiving probe (1). The A-scope waveform in that case is the fifth
It is (a) of a figure. Along with the propagation of the ultrasonic beam in the A scope, the waveform T of the transmission timing, the surface echo (abbreviated as s echo) reflected when the ultrasonic beam was incident on the surface, and the ultrasonic beam made one round in the test body. Echo (below
R1 echo) and a defect echo reflected 3/4 rounds by the surface defect (6) during the propagation process (hereinafter abbreviated as f3 echo)
Is observed.
送・受信用探触子(3)から試験体(5)内に放射され
た超音波ビーム(9)は第5図の(c)に示す送・受信
用探触子(1)と同様なAスコープ波形が得られる。こ
の場合表面欠陥(6)により1/4周反射された欠陥エコ
ー(以下f1エコーと略す)が観測できる。The ultrasonic beam (9) emitted from the transmitter / receiver probe (3) into the test body (5) is the same as that of the transmitter / receiver probe (1) shown in FIG. 5 (c). An A-scope waveform is obtained. In this case, a defect echo (hereinafter abbreviated as f1 echo) reflected by a quarter of the surface defect (6) can be observed.
さらに,送・受信用探触子(1),(3)を同時に送信
した場合には,送・受信用探触子(1)から試験体中に
放射された超音波ビーム(7)は試験体を1/2周した時
点で送・受信用探触子(3)へ妨害エコー(以下RB1/2
と略す)として入射する。第5図(d)はその状態を示
したAスコープ波形である。送・受信用探触子(3)か
ら試験体中に放射された超音波ビーム(9)も同様に第
5図(b)に示すような妨害エコーとして送・受信用探
触子(1)へ現われる。妨害エコーRB1/2の発生するタ
イミングは欠陥エコーf1と重なつてしまうことが観察さ
れる。Furthermore, when the transmitter / receiver probes (1) and (3) are simultaneously transmitted, the ultrasonic beam (7) emitted from the transmitter / receiver probe (1) into the test body is tested. Interfering echo (hereinafter RB1 / 2) to the transmitting / receiving probe (3) at the time of 1/2 turn around the body
Abbreviated). FIG. 5D is an A scope waveform showing the state. The ultrasonic beam (9) radiated into the test body from the transmitting / receiving probe (3) also similarly produces a disturbing echo as shown in FIG. 5 (b), and the transmitting / receiving probe (1). Appears in. It is observed that the timing of generation of the disturbing echo RB1 / 2 overlaps with the defect echo f1.
ところで丸棒状試験体を探傷する場合,欠陥検出用ゲー
トは試験体中の超音波ビームの拡散を考慮し,超音波ビ
ームが最初に外壁に入射する付近に設定することが検出
感度が1番良いとされ,一般的に用いられている。第5
図の(e)は一般的な場合のゲート設定方法を示してい
る。そのため本例のように欠陥エコーf1と妨害エコーRB
1/2が重なる場合には微細な欠陥検出が不可能となつて
しまう。By the way, when detecting flaws on a round rod-shaped test body, the defect detection gate has the best detection sensitivity, considering the diffusion of the ultrasonic beam in the test body and setting it near the first incidence of the ultrasonic beam on the outer wall. And is commonly used. Fifth
(E) of the figure shows a gate setting method in a general case. Therefore, as in this example, the defect echo f1 and the disturbing echo RB
When 1/2 overlaps, it becomes impossible to detect fine defects.
上記のような探触子間の妨害エコーが発生する場合に
は,事実上超音波探傷が不可能になつてしまい,パイプ
探傷に用いられるような同一円周上に複数の探触子を配
置し,探触子または試験体を回転させ試験体の全周に渡
つて探傷する効率的な探触子配置は不可能であつた。仮
に探触子の取り付けスペースの問題から複数の探触子を
同一円周上に配置した場合でも,同時送信は不可能なた
め,1つの探触子から放射された超音波ビームが試験体中
で十分減衰したのち次の探触子から送信するという一般
的に「時分割法」とよばれる送信方法をとつていた。
「時分割法」では送信繰り返し周波数が必然的に低下
し,検査速度を高く設定できないため,一般的に用いら
れることはきわめてまれである。さらに,試験体中の超
音波ビームはかなり広がる性質があるため,試験体外壁
へのビーム入射点をずらした位置に探触子を配置しても
妨害エコーから逃れることは困難であり,効率的な丸棒
状試験体の探傷方法の開発が望まれていた。When the interfering echoes between the probes as described above occur, ultrasonic flaw detection becomes virtually impossible, and multiple transducers are arranged on the same circumference as used for pipe flaw detection. However, it has been impossible to arrange an efficient probe that rotates the probe or the test body and inspects the entire circumference of the test body. Even if multiple probes are placed on the same circumference due to the problem of the probe mounting space, simultaneous transmission is not possible, so the ultrasonic beam emitted from one probe is The transmission method generally called "time-division method" was adopted, in which the signal was sufficiently attenuated by the transmitter and then transmitted from the next probe.
In the “time division method”, the transmission repetition frequency is inevitably lowered and the inspection speed cannot be set high, so it is extremely rarely used in general. Furthermore, since the ultrasonic beam in the test body has a property of spreading considerably, it is difficult to escape from the interfering echo even if the probe is placed at a position where the beam incident point on the outer wall of the test body is shifted. It has been desired to develop a flaw detection method for a round rod-shaped test body.
この発明は,かかる問題点を解決するためになされたも
ので,同一円周上に複数の探触子を配置しても,妨害エ
コーと欠陥エコーを分離し,かつ高い繰り返し周波数を
維持し効率的な丸棒状試験体の探傷方法を得ることを目
的とする。The present invention has been made to solve such a problem. Even if a plurality of probes are arranged on the same circumference, the disturbing echo and the defective echo are separated, and a high repetition frequency is maintained and the efficiency is improved. The purpose of the present invention is to obtain a flaw detection method for a typical rod-shaped test body.
この発明に係わる超音波斜角探傷方法は,試験体軸に垂
直な同一円周上に超音波斜角探触子を等間隔に配置し,
探触子または試験体を回転させて試験体中の欠陥を探傷
する丸棒状試験体の超音波探傷方法において,探触子か
ら試験体中に放射されたビームが試験体の外面に入射す
る位置に探触子を配置し,かつ妨害エコーの試験体中の
伝搬時間分だけ妨害を受ける送・受信用探触子の送信タ
イミングをずらして試験体を探傷する方式である。The ultrasonic bevel flaw detection method according to the present invention is such that the ultrasonic bevel transducers are arranged at equal intervals on the same circumference perpendicular to the test body axis.
The position at which the beam emitted from the probe into the test body is incident on the outer surface of the test body in the ultrasonic flaw detection method for a round rod-shaped test body in which the probe or the test body is rotated to detect defects in the test body. This is a method in which the probe is placed on the test piece and the test piece is flawed by shifting the transmission timing of the transmitting / receiving probe that is disturbed by the propagation time of the disturbing echo in the test piece.
この発明においては,妨害エコーの発生する位置を確定
する目的で探触子から試験体中に放射されたビームが試
験体の外面に入射する位置に探触子を配置し,妨害エコ
ーの試験体中の伝搬時間分だけ妨害を受ける送・受信用
探触子の送信タイミングをずらすことにより,妨害エコ
ーRB1と欠陥エコーf1を時間的に分離できる。In the present invention, the probe is placed at a position where the beam emitted from the probe into the test body is incident on the outer surface of the test body for the purpose of determining the position where the disturbing echo is generated. The interference echo RB1 and the defective echo f1 can be temporally separated by shifting the transmission timing of the transmitting / receiving probe that is disturbed by the propagation time.
第1図はこの発明の一実施例を示す試験体の同一円周上
に複数の探触子を配置とその場合の試験体中の超音波ビ
ームの伝搬状況を示す説明図,第2図は送信タイミング
を妨害エコーRB1の試験体中の伝搬時間分だけずらした
場合の超音波ビームを探傷装置のAスコープ波形を示す
図,第3図は送信タイミングをずらすための探傷装置の
送信部の構成を示す図である。FIG. 1 is an explanatory view showing a plurality of probes arranged on the same circumference of a test body showing an embodiment of the present invention and a propagation state of an ultrasonic beam in the test body in that case, and FIG. The figure shows the A-scope waveform of the ultrasonic beam when the transmission timing is shifted by the propagation time of the interfering echo RB1 in the test body. Fig. 3 shows the structure of the transmission unit of the flaw detection device for shifting the transmission timing. FIG.
第1図において,(1),(3),(5)〜(7),
(9)は上記の従来例と全く同一のものである。(2)
は1番目の送・受信用探触子(1)の同一円周上の90°
の位置に配置され,試験体の表面及び表層部の欠陥を検
出するための試験体中の屈折角度が45°の2番目の送・
受信用探触子,(4)は送・受信用探触子(1)の同一
円周上の270°の位置に配置され,試験体の表面及び表
層部の欠陥を検出するための試験体中の屈折角度が45°
の4番目の送・受信用探触子,(8)は送・受信用探触
子(2)から放射された超音波ビーム,(10)は送・受
信用探触子(4)から放射された超音波ビームである。
第2図において,(a)は送・受信用探触子(1)が単
独送・受信をした場合のAスコープ波形と探傷用ゲー
ト,(b)は送・受信用探触子(2)のみが所定の時間
送信タイミングをずらした場合に送・受信用探触子
(1)が受信する妨害エコーのAスコープ波形,(c)
は送・受信用探触子(3)のみが所定の時間送信タイミ
ングをずらした場合に送・受信用探触子(1)が受信す
る妨害エコーのAスコープ波形,(d)は送・受信用探
触子(4)のみが所定の時間送信タイミングをずらした
場合に送・受信用探触子(1)が受信する妨害エコーの
Aスコープ波形,(e)は送・受信用探触子(2)が所
定の時間送信タイミングをずらした単独送・受信をした
場合のAスコープ波形と探傷用ゲート,(f)は送・受
信用探触子(1)のみが送信した場合に送・受信用探触
子(2)が受信する妨害エコーのAスコープ波形,
(g)は送・受信用探触子(3)のみが所定の時間送信
タイミングをずらした場合に送・受信用探触子(2)が
受信する妨害エコーのAスコープ波形,(h)は送・受
信用探触子(4)のみが所定の時間送信タイミングをず
らした場合に送・受信用探触子(2)が受信する妨害エ
コーのAスコープ波形,(i)は3番目の送・受信用探
触子(3)が所定の時間送信タイミングをずらした単独
送・受信をした場合のAスコープ波形と探傷用ゲート,
(j)は送・受信用探触子(1)のみが送信した場合に
送・受信用探触子(3)が受信する妨害エコーのAスコ
ープ波形,(k)は送・受信用探触子(2)のみが所定
の時間送信タイミングをずらした場合に送・受信用探触
子(3)が受信する妨害エコーのAスコープ波形,
(1)は送・受信用探触子(4)のみが所定の時間送信
タイミングをずらした場合に送・受信用探触子(3)が
受信する妨害エコーのAスコープ波形,(m)は送・受
信用探触子(4)が所定の時間送信タイミングをずらし
た単独送・受信をした場合のAスコープ波形と探傷用ゲ
ート,(n)は送・受信用探触子(1)のみが送信した
場合に送・受信用探触子(4)が受信する妨害エコーの
Aスコープ波形,(o)は送・受信用探触子(2)のみ
が所定の時間送信タイミングをずらした場合に送・受信
用探触子(4)が受信する妨害エコーのAスコープ波
形,(p)は送・受信用探触子(3)のみが所定の時間
送信タイミングをずらした場合に送・受信用探触子
(4)が受信する妨害エコーのAスコープ波形である。In FIG. 1, (1), (3), (5) to (7),
(9) is exactly the same as the above conventional example. (2)
Is 90 ° on the same circumference of the first transmitting / receiving probe (1)
The second feed with the refraction angle of 45 ° in the test piece, which is placed at the position of, for detecting defects on the surface and surface layer of the test piece.
Receiving probe, (4) is placed at a position of 270 ° on the same circumference of sending and receiving probe (1), and is a test piece for detecting defects on the surface and surface layer of the test piece. The inside refraction angle is 45 °
4th transmitter / receiver probe, (8) is an ultrasonic beam emitted from the transmitter / receiver probe (2), and (10) is emitted from the transmitter / receiver probe (4). It is a generated ultrasonic beam.
In FIG. 2, (a) is the A-scope waveform and flaw detection gate when the transmitter / receiver probe (1) independently transmits / receives, and (b) is the transmitter / receiver probe (2). A-scope waveform of the disturbing echo received by the transmitting / receiving probe (1) when only the transmission timing is shifted for a predetermined time, (c)
Is the A-scope waveform of the interfering echo received by the transmitting / receiving probe (1) when only the transmitting / receiving probe (3) shifts the transmission timing for a predetermined time, and (d) is the transmitting / receiving A scope waveform of the interference echo received by the transmitting / receiving probe (1) when only the transmitting probe (4) shifts the transmission timing for a predetermined time, (e) shows the transmitting / receiving probe (2) A scope waveform and flaw detection gate in the case of independent transmission / reception in which the transmission timing is shifted by a predetermined time, and (f) is transmitted when only the transmission / reception probe (1) transmits. A-scope waveform of the disturbing echo received by the receiving probe (2),
(G) is the A-scope waveform of the disturbing echo received by the transmitting / receiving probe (2) when only the transmitting / receiving probe (3) shifts the transmission timing for a predetermined time, and (h) is A scope waveform of the disturbing echo received by the transmitting / receiving probe (2) when only the transmitting / receiving probe (4) shifts the transmission timing for a predetermined time, (i) is the third transmission・ A scope waveform and flaw detection gate when the receiving probe (3) performs single transmission / reception with the transmission timing shifted for a predetermined time,
(J) is an A-scope waveform of an interference echo received by the transmitting / receiving probe (3) when only the transmitting / receiving probe (1) transmits, (k) is a transmitting / receiving probe A scope waveform of the interference echo received by the transmitting / receiving probe (3) when only the child (2) shifts the transmission timing for a predetermined time,
(1) is the A-scope waveform of the disturbing echo received by the transmitting / receiving probe (3) when only the transmitting / receiving probe (4) shifts the transmission timing for a predetermined time, and (m) is A scope waveform and flaw detection gate when the transmission / reception probe (4) performs independent transmission / reception with the transmission timing shifted for a predetermined time, (n) is only the transmission / reception probe (1) When the transmitter / receiver probe (4) receives the A-scope waveform of the disturbing echo, (o) is the case where only the transmitter / receiver probe (2) shifts the transmission timing for a predetermined time. The A scope waveform of the interfering echo received by the transmitter / receiver probe (4), (p) indicates the transmitter / receiver when only the transmitter / receiver probe (3) shifts the transmission timing for a predetermined time. 3 is an A-scope waveform of an interference echo received by the probe (4).
上記のように構成された超音波による斜角探傷方法で
は,送・受信用探触子(1)から試験体中へ放射された
超音波ビーム(7)は妨害エコーとして送・受信用探触
子(2),(3),(4)へ下式で示される試験体中の
伝搬時間後に入力する。In the oblique angle flaw detection method using ultrasonic waves configured as described above, the ultrasonic beam (7) emitted from the transmitter / receiver probe (1) into the test body is used as a disturbing echo. Input to the child (2), (3), (4) after the propagation time in the test body represented by the following formula.
この場合,試験体中の屈折角度が45°としてあるので試
験体の外径をDとすると,送・受信用探触子(1)から
送・受信用探触子(2)へ超音波ビームが到達する試験
体のビーム路程1は(1)式にて求められる。In this case, since the refraction angle in the test body is 45 °, assuming that the outer diameter of the test body is D, the ultrasonic beam is transmitted from the transmitting / receiving probe (1) to the transmitting / receiving probe (2). The beam path length 1 of the test body reached by is calculated by the equation (1).
1=sin(45°)・D …(1) 同様に送・受信用探触子(1)から送・受信用探触子
(3),(4)への超音波ビーム路程l2及びl3は
(2),(3)式にて求められる。1 = sin (45 °) · D (1) Similarly, the ultrasonic beam path lengths l2 and l3 from the transmitting / receiving probe (1) to the transmitting / receiving probe (3), (4) are It is calculated by the equations (2) and (3).
l2=2・1 …(2) l3=3・1 …(3) 1〜l3までの伝搬時間t1〜t3は試験体中の横波音速を
vsとすると,(4)〜(6)式にて求められる。l2 = 2.1 (2) l3 = 3.1 (3) The propagation time t1 to t3 from 1 to l3 is the transverse wave sound velocity in the test body.
If it is vs, it can be obtained by the expressions (4) to (6).
t1=1/vs …(4) t2=l2/vs=2・t1 …(5) t3=l3/vs=3・t1 …(6) 送・受信用探触子(2),(3)の送信タイミングを送
・受信用探触子(1)に対してt1〜t3だけ後にずらした
場合のAスコープ波形が第2図の(e),(i),
(m)である。なお,欠陥検出用ゲートは超音波ビーム
が最初に外壁に入射する付近に設するが,その場合のゲ
ートの中心は超音波ビームが外壁の欠陥に反射して探触
子までもどつてくる時間と等しい。その時間tfは(7)
式にて求められる。t1 = 1 / vs… (4) t2 = l2 / vs = 2 ・ t1… (5) t3 = l3 / vs = 3 ・ t1… (6) Transmitting / receiving probes (2), (3) The A scope waveforms when the transmission timing is shifted by t1 to t3 after the transmitting / receiving probe (1) are (e), (i), and
(M). The defect detection gate is installed near the point where the ultrasonic beam first enters the outer wall. In that case, the center of the gate is the time when the ultrasonic beam is reflected by the outer wall defect and returns to the probe. equal. The time tf is (7)
Calculated by the formula.
tf=2・1/vs=2・t1 …(7) 送・受信用探触子(1)に妨害エコーとして侵入するエ
コーは送・受信用探触子(2)から試験体に入射された
超音波ビームが試験体を3/4周した場所にあらわれ,そ
の時間は試験体中のビーム路程からt3に等しい。さらに
送・受信用探触子(2)の送信がt1ずれているためt3+
t1=4・t1となり送・受信用探触子(1)の試験体を一
周してきた妨害エコーR1と重なり欠陥検出用ゲートには
侵入しない。この場合の妨害エコーのみのAスコープを
第2図の(b)に示す。tf = 2 · 1 / vs = 2 · t1 (7) The echo that enters the transmitting / receiving probe (1) as a disturbing echo is incident on the test body from the transmitting / receiving probe (2). The ultrasonic beam appears at a position around 3/4 round the test body, and the time is equal to t3 from the beam path in the test body. Furthermore, since the transmission of the transmitting / receiving probe (2) is deviated by t1, t3 +
Since t1 = 4 · t1, it overlaps with the disturbing echo R1 that goes around the test body of the transmitter / receiver probe (1), and does not enter the defect detection gate. FIG. 2B shows the A scope having only the disturbing echo in this case.
送・受信用探触子(3)からの妨害エコーも同様に2/4
周した場所に現われるが,送信タイミングがt2分ずらし
てあるため送・受信用探触子(2)と同様に妨害エコー
は送・受信用探触子(1)の試験体を一周してきた妨害
エコーRB1と重なり欠陥検出用ゲートには侵入しない。
この場合の妨害エコーのみのAスコープを第2図の
(c)に示す。The interference echo from the transmitting / receiving probe (3) is also 2/4
Although it appears at the place where the transmitter and receiver went around, because the transmission timing is shifted by t2, the disturbing echo is the same as the transmitter / receiver probe (2), and the disturbance echoes around the test body of the transmitter / receiver probe (1). The echo RB1 overlaps and does not enter the defect detection gate.
FIG. 2 (c) shows an A scope having only disturbing echoes in this case.
送・受信用探触子(4)からの妨害エコーも同様に1/4
周した場所に現われるが,送信タイミングがt3分ずらし
てあるため送・受信用探触子(2)と同様に妨害エコー
は送・受信用探触子(1)の試験体を一周してきた妨害
エコーR1と重なり欠陥検出用ゲートには侵入しない。こ
の場合の妨害エコーのみのAスコープを第2図の(d)
に示す。The interference echo from the transmitting / receiving probe (4) is also 1/4.
Although it appears in the place where the transmitter and receiver went around, because the transmission timing is shifted by t3, the disturbing echo is the same as the transmitter / receiver probe (2) and the disturbance echoed around the test body of the transmitter / receiver probe (1). It overlaps with echo R1 and does not enter the defect detection gate. In this case, the A scope with only the disturbing echo is shown in FIG.
Shown in.
次に送・受信用探触子(2)に妨害エコーとして侵入す
るエコーは送・受信用探触子(1)から試験体に入射さ
れた超音波ビームが試験体を1/4周した場所にあらわ
れ,その時間は試験体中のビーム路程からt1に等しい。
さらに送・受信用探触子(2)の送信がt1分遅れている
ためt1−t1=0となり送・受信用探触子(2)の超音波
ビームが試験体表面に入射した場合の表面エコーと重な
り欠陥検出用ゲートには侵入しない。この場合の妨害エ
コーのみのAスコープを第2図の(f)に示す。Next, the echo that enters the transmitting / receiving probe (2) as an interfering echo is the place where the ultrasonic beam incident on the test body from the transmitting / receiving probe (1) makes a quarter turn around the test body. The time is equal to t1 from the beam path in the specimen.
Furthermore, since the transmission of the transmitting / receiving probe (2) is delayed by t1, t1−t1 = 0 and the surface when the ultrasonic beam of the transmitting / receiving probe (2) is incident on the surface of the test body. It does not enter the defect detection gate because it overlaps with the echo. FIG. 2 (f) shows an A scope having only disturbing echoes in this case.
送・受信用探触子(3)からの妨害エコーは試験体を3/
4周した場所にあらわれ,その時間は試験体中のビーム
路程からt3に等しい。しかし送・受信用探触子(3)の
送信タイミングがt2分遅れかつ送・受信用探触子(2)
の送信もt1分遅れていることで,t3+t2−t1=4・t1と
なるため、妨害エコーは送・受信用探触子(2)の試験
体を一周してきた妨害エコーR1と重なり欠陥検出用ゲー
トには侵入しない。この場合の妨害エコーのみのAスコ
ープを第2図の(g)に示す。The disturbing echo from the transmitter / receiver probe (3) is 3 /
It appears at four laps, and the time is equal to t3 from the beam path in the specimen. However, the transmission timing of the transmitting / receiving probe (3) is delayed by t2 and the transmitting / receiving probe (2)
Since the transmission of the signal is also delayed by t1, t3 + t2-t1 = 4 · t1. Therefore, the interference echo overlaps with the interference echo R1 that has gone around the test body of the transmitter / receiver probe (2) for defect detection. Do not enter the gate. The A scope having only the disturbing echo in this case is shown in FIG.
送・受信用探触子(4)からの妨害エコーも同様に試験
体を2/4周した場所に現われるが,送信タイミングがt3
分ずらしかつ送・受信用探触子(2)の送信もt1分遅れ
ていることで,送・受信用探触子(3)と同様に妨害エ
コーは送・受信用探触子(2)の試験体を一周してきた
妨害エコーR1と重なり欠陥検出用ゲートには侵入しな
い。この場合の妨害エコーのみのAスコープを第2図の
(h)に示す。Interfering echoes from the transmitter / receiver probe (4) also appear in a place that makes 2/4 rounds of the test body, but the transmission timing is t3.
The transmission of the transmitter / receiver probe (2) is delayed by t1 as well, so that the interference echo is the same as the transmitter / receiver probe (3). It does not enter the defect detection gate because it overlaps with the interfering echo R1 that has traveled around the test body. FIG. 2 (h) shows the A scope having only the disturbing echo in this case.
送・受信用探触子(3)に妨害エコーとして侵入するエ
コーは送・受信用探触子(1)から試験体に入射された
超音波ビームが試験体を2/4周した場所にあらわれ,そ
の時間は試験体中のビーム路程からt2に等しい。さらに
送・受信用探触子(3)の送信がt2分遅れているためt2
−t2=0となり送・受信用探触子(3)の超音波ビーム
が試験体表面に入射した場合の表面エコーと重なり欠陥
検出用ゲートには侵入しない。この場合の妨害エコーの
みのAスコープを第2図の(j)に示す。The echo that enters the transmitter / receiver probe (3) as an interfering echo appears at the location where the ultrasonic beam incident on the test body from the transmitter / receiver probe (1) makes 2/4 turns around the test body. , The time is equal to t2 from the beam path in the specimen. Further, the transmission of the transmitting / receiving probe (3) is delayed by t2, so t2
Since -t2 = 0, the ultrasonic beam of the transmitting / receiving probe (3) overlaps with the surface echo when incident on the surface of the test body and does not enter the defect detection gate. The A scope with only the disturbing echo in this case is shown in (j) of FIG.
送・受信用探触子(2)からの妨害エコーは試験体を1/
4周した場所にあらわれ,その時間は試験体中のビーム
路程からt1に等しい。さらに送・受信用探触子(3)の
送信がt2分遅れかつ送・受信探接子(2)の送信もt1分
遅れているためt2−t1−t1=0となり送・受信用探触子
(3)の超音波ビームが試験体表面に入射した場合の表
面エコーと重なり欠陥検出用ゲートには侵入しない。こ
の場合の妨害エコーのみのAスコープを第2図の(k)
に示す。The disturbing echo from the transmitting / receiving probe (2) is 1 /
It appears at four laps, and the time is equal to t1 from the beam path in the test body. Further, the transmission of the transmitting / receiving probe (3) is delayed by t2 and the transmission of the transmitting / receiving probe (2) is also delayed by t1. Therefore, t2-t1-t1 = 0 and the transmitting / receiving probe is When the ultrasonic beam of the child (3) is incident on the surface of the specimen, it overlaps with the surface echo and does not enter the defect detection gate. The A scope with only the disturbing echo in this case is shown in (k) of FIG.
Shown in.
送・受信用探触子(4)からの妨害エコーは試験体を3/
4周した場所にあらわれ,その時間は試験体中のビーム
路程からt3に等しい。しかし送・受信用探触子(3)の
送信タイミングがt2分遅れかつ送・受信用探触子(4)
の送信もt3分遅れていることで,t3+t3−t2=4・t1と
なるため妨害エコーは送・受信用探触子(3)の試験体
を一周してきた妨害エコーRB1と重なり欠陥検出用ゲー
トには侵入しない。この場合の妨害エコーのみのAスコ
ープを第2図の(1)に示す。The disturbing echo from the transmitter / receiver probe (4) is 3 /
It appears at four laps, and the time is equal to t3 from the beam path in the specimen. However, the transmission timing of the transmitting / receiving probe (3) is delayed by t2 and the transmitting / receiving probe (4)
Is also delayed by t3, resulting in t3 + t3−t2 = 4 · t1, so the interfering echo overlaps with the interfering echo RB1 that has traveled around the test body of the transmitting / receiving probe (3) and the defect detection gate. Does not break into The A scope having only the disturbing echo in this case is shown in (1) of FIG.
送・受信用探触子(4)に妨害エコーとして侵入するエ
コーは送・受信用探触子(1)から試験体に入射された
超音波ビームが試験体を3/4周した場所にあらわれ,そ
の時間は試験体中のビーム路程からt3に等しい。さらに
送・受信用探触子(4)の送信がt3分遅れているためt3
−t3=0となり送・受信用探触子(4)の超音波ビーム
が試験体表面に入射した場合の表面エコーと重なり欠陥
検出用ゲートには侵入しない。この場合の妨害エコーの
みのAスコープを第2図の(n)に示す。The echo that enters the transmitter / receiver probe (4) as an interfering echo appears at the place where the ultrasonic beam incident on the test body from the transmitter / receiver probe (1) makes 3/4 rounds around the test body. , The time is equal to t3 from the beam path in the test body. Furthermore, since the transmission of the transmitting / receiving probe (4) is delayed by t3, t3
Since -t3 = 0, the ultrasonic beam of the transmitting / receiving probe (4) overlaps with the surface echo when it enters the surface of the test body and does not enter the defect detection gate. The A scope having only the disturbing echo in this case is shown in (n) of FIG.
送・受信用探触子(2)からの妨害エコーは試験体を2/
4周した場所にあらわれ,その時間は試験体中のビーム
路程からt2に等しい。さらに送・受信用探触子(4)の
送信がt3分遅れかつ送・受信用探触子(2)の送信もt1
分遅れているためt2+t1−t3=0となり送・受信用探触
子(4)の超音波ビームが試験体表面に入射した場合の
表面エコーと重なり欠陥検出用ゲートには侵入しない。
この場合の妨害エコーのみのAスコープを第2図の
(o)に示す。Interfering echoes from the transmitter / receiver probe (2) are 2 /
It appears at four laps, and the time is equal to t2 from the beam path in the test body. Further, the transmission of the transmission / reception probe (4) is delayed by t3 and the transmission of the transmission / reception probe (2) is also t1.
Because of the delay, t2 + t1-t3 = 0 and the ultrasonic beam of the transmitting / receiving probe (4) overlaps with the surface echo when it enters the surface of the test body and does not enter the defect detection gate.
The A scope having only the disturbing echo in this case is shown in (o) of FIG.
送・受信用探触子(3)からの妨害エコーは試験体を1/
4周した場所にあらわれ,その時間は試験体中のビーム
路程からt1に等しい。さらに送・受信用探触子(4)の
送信がt3分遅れかつ送・受信用探触子(3)の送信もt2
分遅れているためt1+t2−t3=0となり送・受信用探触
子(4)の超音波ビームが試験体表面に入射した場合の
表面エコーと重なり欠陥検出用ゲートには侵入しない。
この場合の妨害エコーのみのAスコープを第1の(p)
に示す。The disturbing echo from the transmitting / receiving probe (3) is 1 /
It appears at four laps, and the time is equal to t1 from the beam path in the test body. Furthermore, the transmission of the transmitting / receiving probe (4) is delayed by t3 and the transmission of the transmitting / receiving probe (3) is also t2.
Because of the delay, t1 + t2-t3 = 0 and the ultrasonic beam of the transmitting / receiving probe (4) overlaps with the surface echo when it enters the surface of the test body and does not enter the defect detection gate.
In this case, the A scope with only the disturbing echo is set to the first (p)
Shown in.
以上のことから本構成の丸棒状試験体の探傷は妨害エコ
ーを無視して実施することが可能なことが証明できる。From the above, it can be proved that the flaw detection of the round rod-shaped test body of this configuration can be performed by ignoring the interference echo.
本例では屈折角度を45°にした場合を説明したが,屈折
角度を変化させても探触子が円周上に等間隔に配置さ
れ,かつ超音波ビームの外壁への入射点に配置されてい
る場合には本方式は有効である。In this example, the case where the refraction angle was set to 45 ° was explained, but even if the refraction angle was changed, the probes were arranged at equal intervals on the circumference and at the incident points on the outer wall of the ultrasonic beam. If this is the case, this method is effective.
第3図は実際に送信タイミングをずらすための探傷装置
の送信部分の構成を示したものである。FIG. 3 shows the structure of the transmission part of the flaw detector for actually shifting the transmission timing.
(1)〜(4)は第1図と全く同一のものである。(1
1)は探傷装置の送信パルス同期タイミング発生部,(1
2)は例えばデイジタル・スイツチなどの試験体の外径
入力手段,(13)は例えばマイクロ・コンピユータなど
を利用した送信タイミングずらし量計算手段,(14)〜
(17)は例えばカウンタなどを利用した送信タイミング
発生部(ただしそれぞれの設定値は異なる),(18)〜
(21)は入力された送信タイミングに応じて送信パルス
を発生する送信パルス発生部を示す。(1) to (4) are exactly the same as in FIG. (1
1) is the transmission pulse synchronization timing generator of the flaw detector, (1
2) is a means for inputting the outer diameter of the test body such as a digital switch, (13) is a means for calculating the transmission timing shift amount using a micro computer, (14)-
(17) is a transmission timing generator using, for example, a counter (however, each set value is different), (18)-
Reference numeral (21) denotes a transmission pulse generator that generates a transmission pulse according to the input transmission timing.
デイジタル・スイツチやキーボードなどから構成される
外径入力手段(12)から入力された外径値Dは(4)〜
(6)式の計算をマイクロ・コンピユータなどを利用し
た送信タイミングずらし量計算手段(13)にて計算し,
カウンタなどで構成される送信タイミングずらし手段
(14)〜(17)に設定される。送信タイミングずらし手
段(14)〜(17)は送信パルス発生部(18)〜(20)に
送信タイミング信号として設定された時間分を送信同期
タイミングに対しずらして供給する。送信パルス発生部
(18)〜(21)は入力された送信タイミング信号により
送信パルスを送・受信用探触子(1)〜(4)へ供給す
る。The outer diameter value D input from the outer diameter input means (12) including a digital switch and a keyboard is (4)-
The formula (6) is calculated by the transmission timing shift amount calculating means (13) using a micro computer or the like,
It is set in transmission timing shifting means (14) to (17) composed of a counter or the like. The transmission timing shifting means (14) to (17) shifts the time set as the transmission timing signal to the transmission pulse generators (18) to (20) with respect to the transmission synchronization timing and supplies it. The transmission pulse generators (18) to (21) supply transmission pulses to the transmission / reception probes (1) to (4) according to the input transmission timing signal.
ところで上記説明では丸棒状試験体の探傷方法について
述べたが,肉厚外径比が18%をこえたパイプ探傷におい
て,超音波ビームを内面に入射させないで外表面と表層
部の探傷を行なう場合にも利用できることはいうまでも
ない。By the way, in the above description, the flaw detection method for round bar specimens was described, but in the case of pipe flaw detection where the wall thickness outer diameter ratio exceeds 18%, when the flaw detection of the outer surface and the surface layer part is performed without making the ultrasonic beam incident on the inner surface It goes without saying that it can also be used for.
この発明は以上説明したとおり,探触子から試験体中に
放射されたビームが試験体の外面に入射する位置にそれ
ぞれ探触子を配置し、その探触子の2番目の探触子から
N番目の探触子の送信タイミング位置をそれぞれ1番目
の探触子に対してt1,2t1,3t1,…(t1は1番目の探触子
から2番目の探触子までの超音波ビーム路程に対する伝
搬時間)ずらすことにより妨害エコーと欠陥エコーを分
離でき、従来に比べて高い繰り返し周波数を維持しつつ
効率的な探傷が可能となる。As described above, according to the present invention, the probes are arranged at the positions where the beams emitted from the probe into the test body are incident on the outer surface of the test body. The transmission timing position of the Nth probe is t 1 , 2t 1 , 3t 1 , ... (t 1 is from the 1st probe to the 2nd probe) with respect to the 1st probe. The interference echo and the defective echo can be separated by shifting the propagation time (with respect to the ultrasonic beam path), and efficient flaw detection can be performed while maintaining a higher repetition frequency than in the past.
第1図はこの発明の一実施例を示す探触子の配置と試験
体中の超音波ビームの伝搬状況を示す説明図,第2図は
第1図のAスコープ波形を示した図,第3図はこの発明
の送信タイミングをずらすための送信部の構成図,第4
図は従来例の探触子配置と試験体中の超音波ビームの伝
搬状況を示す説明図,第5図は第4図の従来例のAスコ
ープ波形を示した図である。 図において,(1)〜(4)は送・受信用探触子であ
る。 なお,各図中同一符号は同一または相当部分を示す。FIG. 1 is an explanatory view showing an arrangement of a probe and a propagation state of an ultrasonic beam in a test body showing an embodiment of the present invention, and FIG. 2 is a view showing an A-scope waveform of FIG. FIG. 3 is a block diagram of a transmission unit for shifting the transmission timing of the present invention, and FIG.
FIG. 5 is an explanatory view showing the probe arrangement of the conventional example and the propagation state of the ultrasonic beam in the test body, and FIG. 5 is a diagram showing the A scope waveform of the conventional example of FIG. In the figure, (1) to (4) are transmitting / receiving probes. The same reference numerals in each figure indicate the same or corresponding parts.
Claims (1)
周上に超音波斜角探触子を等間隔にN個(Nは4以上)
配置し、探触子または試験体を回転させて試験体中の欠
陥を探傷する丸棒状又は管状の試験体の超音波斜角探傷
方法において、探触子から試験体中に放射されたビーム
が試験体の外面に入射する位置にそれぞれ探触子を配置
し、その探触子の2番目の探触子からN番目の探触子の
送信タイミング位置をそれぞれ1番目の探触子に対して
t1,2t1,3t1,…(t1は1番目の探触子から2番目の探触
子までの超音波ビーム路程に対する伝搬時間)ずらすこ
とを特徴とする超音波斜角探傷方法。1. N number of ultrasonic bevel probes at equal intervals (N is 4 or more) on the same circumference perpendicular to the axis of a rod-shaped or tubular test body.
In the ultrasonic bevel flaw detection method for a round rod-shaped or tubular test body, which is arranged and rotates the probe or the test body to detect defects in the test body, the beam emitted from the probe into the test body is detected. The probes are arranged at positions where they are incident on the outer surface of the test body, and the transmission timing positions of the second to the Nth probes of the probe are set to the first probe, respectively.
An ultrasonic oblique-angle flaw detection method characterized in that t 1 , 2t 1 , 3t 1 , ... (T 1 is a propagation time with respect to an ultrasonic beam path from the first probe to the second probe) are shifted.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60252278A JPH073410B2 (en) | 1985-11-11 | 1985-11-11 | Ultrasonic bevel flaw detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60252278A JPH073410B2 (en) | 1985-11-11 | 1985-11-11 | Ultrasonic bevel flaw detection method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62112057A JPS62112057A (en) | 1987-05-23 |
| JPH073410B2 true JPH073410B2 (en) | 1995-01-18 |
Family
ID=17235019
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60252278A Expired - Lifetime JPH073410B2 (en) | 1985-11-11 | 1985-11-11 | Ultrasonic bevel flaw detection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH073410B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5721615B2 (en) * | 2011-12-26 | 2015-05-20 | 三菱重工業株式会社 | Ultrasonic flaw detector for pipe welds |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS576356A (en) * | 1980-06-13 | 1982-01-13 | Nippon Steel Corp | Ultrasonic flaw detection method for pipe |
| JPS5880563U (en) * | 1981-11-27 | 1983-05-31 | 三菱電機株式会社 | Ultrasonic flaw detection equipment |
-
1985
- 1985-11-11 JP JP60252278A patent/JPH073410B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62112057A (en) | 1987-05-23 |
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