JPH0736395B2 - Aluminum film growth method - Google Patents
Aluminum film growth methodInfo
- Publication number
- JPH0736395B2 JPH0736395B2 JP60087885A JP8788585A JPH0736395B2 JP H0736395 B2 JPH0736395 B2 JP H0736395B2 JP 60087885 A JP60087885 A JP 60087885A JP 8788585 A JP8788585 A JP 8788585A JP H0736395 B2 JPH0736395 B2 JP H0736395B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- substrate
- reaction
- aluminum film
- large number
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/40—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials
- H10P14/42—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a gas or vapour
Landscapes
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Description
【発明の詳細な説明】 〔概要〕 アルミニウムは半導体装置の配線層として、広く用いら
れているが、その積層の方法は、物理的な蒸着法(PVD
法)が専ら用いられている。本発明ではアルミニウムの
気相成長法(CVD法)で、且つ光励起反応を利用せる成
長法の改善を目的とする。DETAILED DESCRIPTION [Outline] Aluminum is widely used as a wiring layer of a semiconductor device, and the stacking method is a physical vapor deposition method (PVD).
Law) is used exclusively. An object of the present invention is to improve a vapor phase growth method (CVD method) of aluminum and a growth method utilizing a photoexcitation reaction.
本発明は、アルミニウムの配線層の形成に通常広く使用
されているPVD法に代わり、TIBAを反応ガスとして用い
た気相成長法によるアルミニウム膜の成長法の改良に関
する。The present invention relates to an improvement of an aluminum film growth method by a vapor phase growth method using TIBA as a reaction gas instead of the PVD method which is generally widely used for forming an aluminum wiring layer.
アルミニウムは、通常、気相成長法で成長させるとその
膜質に問題があるので、一般には真空蒸着法によって成
長させる。Since aluminum has a problem in its film quality when grown by a vapor phase growth method, it is generally grown by a vacuum deposition method.
アルミニウム薄膜を集積回路で用いるのは殆どが配線層
の形成であり、この時点では半導体の素子部分の形成は
殆ど終わっているので、アルミニウム膜の形成プロセス
においては基板の温度は出来るだけ低くすることが望ま
しい。Almost all aluminum thin films are used in integrated circuits for the formation of wiring layers, and at this point the formation of semiconductor element parts is almost complete. Therefore, in the aluminum film formation process, the substrate temperature should be kept as low as possible. Is desirable.
従って、常温でも成長可能なる真空蒸着法が専らアルミ
ニウムの成長に用いられている。このため真空蒸着の基
本的な問題点としての、電極窓の段差部におけるカバレ
ージ不良の問題がある。Therefore, the vacuum vapor deposition method, which enables growth even at room temperature, is exclusively used for growing aluminum. For this reason, there is a problem of poor coverage at the stepped portion of the electrode window, which is a fundamental problem of vacuum deposition.
また、気相成長でアルミニウムの成長が可能となれば、
成長時にアルミニウム以外の金属との合金膜の成長も可
能であり、その出現が要望されている。Also, if it becomes possible to grow aluminum by vapor phase growth,
At the time of growth, it is possible to grow an alloy film with a metal other than aluminum, and its appearance is desired.
アルミニウムを気相成長させる方法として、トリイソブ
チール・アルミニウム、略称TIBAを用いる方法は既に知
られている。As a vapor growth method for aluminum, a method using triisobutyryl aluminum, which is abbreviated as TIBA, is already known.
TIBAはAl(C4H9)3なる分子式で表され、250〜300℃で熱
分解して、下記のごとくAlを析出する。TIBA is represented by a molecular formula of Al (C 4 H 9 ) 3 and thermally decomposes at 250 to 300 ° C. to precipitate Al as shown below.
Al(C4H9)3→Al+3/2H2+3C4H8 TIBAは常温では液体であるが、反応を促進するため約50
℃に加熱して、He、あるいはArガスをバブリングさせ
て、約300℃に加熱された基板を設置せる反応槽に導入
される。Al (C 4 H 9 ) 3 → Al + 3 / 2H 2 + 3C 4 H 8 TIBA is a liquid at room temperature, but about 50% to accelerate the reaction.
After heating to ℃, bubbling He or Ar gas, it is introduced into the reaction tank where the substrate heated to about 300 ℃ is installed.
上記のTIBAの熱分解は、通常の半導体の製造プロセスと
しては充分耐えうる温度であるが、更に、低温における
成長を目的とせる、TIBAガスの光反応を利用せる気相成
長法がある。The thermal decomposition of TIBA described above is a temperature that can be sufficiently endured as an ordinary semiconductor manufacturing process, and there is a vapor phase growth method utilizing the photoreaction of TIBA gas for the purpose of growth at a low temperature.
光を利用する方法には、紫外線を用いる方法と赤外線を
用いる場合があるが、紫外線法の方がより低温であり、
光エネルギーによる分子の励起反応を主としているが、
赤外線法は熱エネルギーによる分解反応が相当含まれ
る。As a method of utilizing light, there are cases where an ultraviolet ray method and an infrared ray are used, but the ultraviolet ray method has a lower temperature,
Mainly the excitation reaction of molecules by light energy,
The infrared method considerably includes a decomposition reaction by heat energy.
赤外線の利用の方が光源が遥かに安価であり、装置も構
造が簡単であるので、気相成長ではより多く利用されて
いる。The use of infrared light is much more popular in vapor phase growth because the light source is much cheaper and the device is simpler in structure.
上記に述べた、従来の技術による方法では、赤外線照射
法によるTIBA分解法では、半導体基板に対する成長が必
ずしも一様でないという問題を生ずる。In the above-described conventional method, the TIBA decomposition method by the infrared irradiation method causes a problem that the growth on the semiconductor substrate is not always uniform.
反応槽の構造にもよるが、半導体基板を槽内に水平なる
位置に設置して、TIBAガスを反応槽に導入し、赤外光は
上方より照射される構造をとる。Depending on the structure of the reaction tank, the semiconductor substrate is installed in a horizontal position in the tank, TIBA gas is introduced into the reaction tank, and infrared light is irradiated from above.
然しながらソースガスの流入孔は通常一個所であり、反
応槽内部でのガスの流れは一様でなく、ガスの濃度にも
ムラを生ずる。However, the source gas inflow hole is usually at one location, the gas flow in the reaction vessel is not uniform, and the gas concentration is uneven.
このような理由で、アルミニウム膜を成長させたとき、
基板面に一様に薄膜が成長せず、特に段差部でのカバレ
ージが悪くなるという問題点を生ずる。For this reason, when an aluminum film is grown,
There is a problem that the thin film does not grow uniformly on the surface of the substrate, and the coverage particularly at the step portion deteriorates.
上記問題点は、本発明の反応槽の内部の支持台に基板を
載置し、該基板に対向するように設置された多数のガス
噴出孔を有する隔離板から反応ガスを供給してアルミニ
ウム膜を成長する方法において、前記隔離板の前記基板
に対向する面に、多数の光ファイバの端面を前記多数の
ガス噴出孔と混在させるように配置し、前記多数のガス
噴出孔から反応ガスを供給するとともに、前記多数の光
ファイバの端面から該反応ガスの流れと平行して赤外線
を前記基板に向けて照射することを特徴とするアルミニ
ウム膜の成長方法によって解決される。The above-mentioned problem is that the substrate is placed on the support table inside the reaction tank of the present invention, and the reaction gas is supplied from the separator having a large number of gas ejection holes installed so as to face the substrate to supply the aluminum film. In the method of growing a., The end faces of a large number of optical fibers are arranged on the surface of the separator facing the substrate so as to be mixed with the large number of gas ejection holes, and the reaction gas is supplied from the large number of gas ejection holes. In addition, the method for growing an aluminum film is characterized by irradiating infrared rays toward the substrate from the end faces of the plurality of optical fibers in parallel with the flow of the reaction gas.
ガス供給室を反応槽と分離して設け、このガス供給室の
底部に多数のガス噴出孔を設けた隔離板を設置する。そ
してこのガス噴出孔の間に単芯、或いは束ねた光ファイ
バを端部が基板の方向に向くように植設して設け、反応
槽を排気することで、ガス供給室と反応槽の間に圧力差
を生じるので、ガス供給室に導入された反応ガスは多数
のガス噴出口より一様なシャワー状の流れと成って基板
上に供給される。A gas supply chamber is provided separately from the reaction tank, and a separator having a large number of gas ejection holes is installed at the bottom of the gas supply chamber. A single core or a bundled optical fiber is installed between the gas ejection holes so that the end faces the direction of the substrate, and the reaction tank is evacuated so that the gas is supplied between the gas supply chamber and the reaction tank. Since a pressure difference is generated, the reaction gas introduced into the gas supply chamber is supplied onto the substrate in a uniform shower-like flow form a large number of gas ejection ports.
また赤外線も、前記ガス噴出口の間に多数設けられた光
ファイバより基板の方向に向かって均一にガスの流れと
平行に基板に照射されるので、反応槽内、および基板上
で赤外線による光化学反応と加熱分解反応が進み、大面
積の基板でも均一な厚さでアルミニウム膜が形成でき
る。In addition, since infrared rays are also irradiated onto the substrate evenly in the direction of the substrate in parallel with the gas flow from the optical fibers provided between the gas ejection ports, photochemical reaction by infrared rays in the reaction chamber and on the substrate. The reaction and thermal decomposition reaction proceed, and an aluminum film can be formed with a uniform thickness even on a large-area substrate.
本発明のアルミニウム膜の成長方法に使用される装置の
構造を第1図により説明する。The structure of an apparatus used in the method for growing an aluminum film of the present invention will be described with reference to FIG.
反応槽1の内部には、支持台2に搭載された基板3が設
置される。反応槽の下部には排気孔が設けられ排気装置
4に接続されている。Inside the reaction tank 1, a substrate 3 mounted on a support base 2 is installed. An exhaust hole is provided in the lower part of the reaction tank and is connected to the exhaust device 4.
反応槽の上部にはガス供給室5が設けられ、ガス導入孔
6より反応ガスが供給される。ガス導入孔はガスソース
7に接続されている。A gas supply chamber 5 is provided above the reaction tank, and a reaction gas is supplied from a gas introduction hole 6. The gas introduction hole is connected to the gas source 7.
ガス供給室には第2図に示すごとく、反応槽に面した隔
離板8には多数のガス噴出孔9が開口されている。In the gas supply chamber, as shown in FIG. 2, a large number of gas ejection holes 9 are opened in the separator plate 8 facing the reaction tank.
赤外線光源10よりの赤外光は、レンズを通して光マルチ
フアイバー11に投射され、更に光マルチフアイバーはガ
ス供給室に導かれる。ここで多数の単芯のフアイバー、
あるいは複数のフアイバー群に分割される。Infrared light from the infrared light source 10 is projected onto the optical fiber 11 through the lens, and the optical fiber is guided to the gas supply chamber. Where a lot of single-core fibers,
Alternatively, it is divided into a plurality of fiber groups.
分割されたフアイバー12は、前記ガス供給室の隔離板8
にて、フアイバーの端面を反応槽に向けて固定される。The divided fiber 12 is a separator plate 8 of the gas supply chamber.
Then, the end face of the fiber is fixed toward the reaction tank.
アルミニウム膜を成長させるには、基板3を支持台2に
設置した後、排気装置4により反応槽1を減圧する。次
いで、TIBAガスをガス供給室5に導入する。In order to grow the aluminum film, the substrate 3 is placed on the support 2 and then the pressure in the reaction tank 1 is reduced by the exhaust device 4. Next, TIBA gas is introduced into the gas supply chamber 5.
反応槽との間には隔離板8があるので、ガス供給室は圧
力差を生じ、ガス噴出孔9より一様なる流れとなってTI
BAガスが噴出される。Since there is a separating plate 8 between the reaction tank and the reaction tank, a pressure difference is generated in the gas supply chamber, and a uniform flow from the gas ejection holes 9 is obtained.
BA gas is ejected.
一方赤外線は、光フアイバーを通ってその端面より反応
槽に照射され、TIBAガスの分解反応を起こす。また、エ
ネルギーの一部は基板の加熱も行い、一様なるアルミニ
ウム膜の成長に寄与する。On the other hand, infrared rays pass through the optical fiber and irradiate the reaction tank from its end face, causing decomposition reaction of TIBA gas. Further, a part of the energy also heats the substrate and contributes to uniform growth of the aluminum film.
以上に説明せるごとく本発明の方法により反応ガスの導
入が均一化され、赤外線の照射も分割して一様化されて
いるので、反応にムラがなくなり、均一なるアルミニウ
ム膜の成長と、成長速度の促進が図れる。As explained above, the introduction of the reaction gas is made uniform by the method of the present invention, and the irradiation of infrared rays is also made uniform, so that the reaction is uniform and the growth of the aluminum film is uniform and the growth rate is uniform. Can be promoted.
第1図は本発明にかかわる成長方法に用いる装置の断面
図、 第2図は隔離板の平面図、 を示す。 図面において、 1は反応槽、2は支持台、3は基板、4は排気装置、5
はガス供給室、6はガス導入孔、7はガスソース、8は
隔離板、9はガス噴出孔、10は赤外線光源、11は光マル
チフアイバー、12は分割された光フアイバー、 をそれぞれ示す。FIG. 1 is a sectional view of an apparatus used in the growth method according to the present invention, and FIG. 2 is a plan view of a separator. In the drawings, 1 is a reaction tank, 2 is a support base, 3 is a substrate, 4 is an exhaust device, 5
Is a gas supply chamber, 6 is a gas introduction hole, 7 is a gas source, 8 is a separator, 9 is a gas ejection hole, 10 is an infrared light source, 11 is an optical multi-fiber, and 12 is a divided optical fiber.
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/3205 ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 6 Identification code Office reference number FI technical display location H01L 21/3205
Claims (1)
基板に対向するように設置された多数のガス噴出孔を有
する隔離板から反応ガスを供給してアルミニウム膜を成
長する方法において、 前記隔離板の前記基板に対向する面に、多数の光ファイ
バの端面を前記多数のガス噴出孔と混在させるように配
置し、 前記多数のガス噴出孔から反応ガスを供給するととも
に、前記多数の光ファイバの端面から該反応ガスの流れ
と平行して赤外線を前記基板に向けて照射することを特
徴とするアルミニウム膜の成長方法。1. An aluminum film is grown by mounting a substrate on a support inside a reaction tank, and supplying a reaction gas from a separator having a large number of gas ejection holes installed so as to face the substrate. In the method, the surface of the separator facing the substrate is arranged so that the end faces of a large number of optical fibers are mixed with the large number of gas ejection holes, and a reaction gas is supplied from the large number of gas ejection holes, A method for growing an aluminum film, which comprises irradiating infrared rays toward the substrate from the end faces of the plurality of optical fibers in parallel with the flow of the reaction gas.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60087885A JPH0736395B2 (en) | 1985-04-23 | 1985-04-23 | Aluminum film growth method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60087885A JPH0736395B2 (en) | 1985-04-23 | 1985-04-23 | Aluminum film growth method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61245521A JPS61245521A (en) | 1986-10-31 |
| JPH0736395B2 true JPH0736395B2 (en) | 1995-04-19 |
Family
ID=13927325
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60087885A Expired - Lifetime JPH0736395B2 (en) | 1985-04-23 | 1985-04-23 | Aluminum film growth method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0736395B2 (en) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57161057A (en) * | 1981-03-30 | 1982-10-04 | Mitsubishi Electric Corp | Chemical vapor phase growth device using plasma |
| JPS5840608U (en) * | 1981-09-14 | 1983-03-17 | 武康商事株式会社 | Corrugated steel plate assembly vault |
| JPS595621A (en) * | 1982-07-01 | 1984-01-12 | Nec Corp | Forming method for thin-film |
| JPS5961920A (en) * | 1982-10-01 | 1984-04-09 | Agency Of Ind Science & Technol | Manufacture of thin film and equipment for the same |
| JPS59208065A (en) * | 1983-05-13 | 1984-11-26 | Nec Corp | Depositing method of metal by laser |
| JPS6067665A (en) * | 1983-09-22 | 1985-04-18 | Matsushita Electric Ind Co Ltd | Laser heating apparatus of vapor deposition source in vacuum vapor deposition |
-
1985
- 1985-04-23 JP JP60087885A patent/JPH0736395B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61245521A (en) | 1986-10-31 |
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