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JPH0740521B2 - Method for forming glass layer for resistor protection - Google Patents
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JPH0740521B2 - Method for forming glass layer for resistor protection - Google Patents

Method for forming glass layer for resistor protection

Info

Publication number
JPH0740521B2
JPH0740521B2 JP61263940A JP26394086A JPH0740521B2 JP H0740521 B2 JPH0740521 B2 JP H0740521B2 JP 61263940 A JP61263940 A JP 61263940A JP 26394086 A JP26394086 A JP 26394086A JP H0740521 B2 JPH0740521 B2 JP H0740521B2
Authority
JP
Japan
Prior art keywords
resistor
glass
glass layer
weight
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61263940A
Other languages
Japanese (ja)
Other versions
JPS63119201A (en
Inventor
次郎 千葉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP61263940A priority Critical patent/JPH0740521B2/en
Publication of JPS63119201A publication Critical patent/JPS63119201A/en
Publication of JPH0740521B2 publication Critical patent/JPH0740521B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Inorganic Insulating Materials (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、抵抗体保護用ガラス層の形成方法に関する。TECHNICAL FIELD The present invention relates to a method for forming a glass layer for protecting a resistor.

[従来の技術] 厚膜回路に実装するチップ部品としてのチップ抵抗体は
製造上Niメッキ工程があり、抵抗体の保護を目的として
設けられるガラス層もNiメッキ工程を通る。ニッケルメ
ッキ液は強酸(pH=1以下)であり且つ通常50〜70℃の
温度で処理される。従来のチップ抵抗体用ガラスはこの
処理により変質が起こりあるいは離脱され、保護層とし
ての役目が十分ではなかった。
[Prior Art] A chip resistor as a chip component to be mounted on a thick film circuit has a Ni plating process in manufacturing, and a glass layer provided for the purpose of protecting the resistor also passes the Ni plating process. The nickel plating solution is a strong acid (pH = 1 or less) and is usually processed at a temperature of 50 to 70 ° C. The conventional glass for a chip resistor is altered or removed by this treatment, and its role as a protective layer is not sufficient.

一方、抵抗体の上に設けるガラス層は通常600℃の焼成
にて形成され、この焼成時における抵抗体の抵抗値変化
率はガラス組成によっても大きく変化することも知られ
ており、さらに抵抗値変化率が小さいガラス層の提供が
要請されていた。
On the other hand, the glass layer provided on the resistor is usually formed by firing at 600 ° C., and it is also known that the rate of change in the resistance value of the resistor during this firing varies greatly depending on the glass composition. It has been required to provide a glass layer having a small rate of change.

即ち、耐酸性が高く、抵抗値変化率が小さく且つ反応に
よる発泡等がなく、さらにアルミナ基板と熱膨張率の整
合するガラス層として従来は満足すべきものがなかっ
た。
That is, conventionally, there has been no satisfactory glass layer having a high acid resistance, a small rate of change in resistance value, no foaming due to a reaction, and a thermal expansion coefficient matching that of an alumina substrate.

[発明の解決しようとする問題点] 本発明は、チップ抵抗体の機械的、化学的な保護を目的
としたガラス層の形成方法に関し、600℃焼成でき且つ
抵抗体の抵抗値変化率を低減し、しかも化学的、耐久
性、特に耐酸性に優れたガラス層の形成方法の提供を目
的とする。
[Problems to be Solved by the Invention] The present invention relates to a method of forming a glass layer for the purpose of mechanical and chemical protection of a chip resistor, which can be fired at 600 ° C. and has a reduced resistance change rate. Moreover, it is an object of the present invention to provide a method for forming a glass layer which is excellent in chemical resistance, durability, and particularly acid resistance.

[問題点を解決するための手段] 本発明は前述の問題点を解決すべくなされたものであ
り、低融点ガラス粉末70〜100重量%と、650〜800℃の
範囲に軟化点を有する高融点ガラス粉末0〜30重量%
と、耐火物フィラー0〜30%と、耐火性顔料0〜5重量
%とからなる組成物の層を抵抗体上に設け、焼成して抵
抗体保護用ガラス層を形成する方法であって、前記低融
点ガラス粉末は重量%表示で本質的に PbO 55〜65 SiO2 25〜40 Al2O3 1〜5 R2O 0.1〜5 (但しR2OはLi2O,Na2O,K2O及びCs2Oから選ばれた少な
くとも1者) B2O3 0〜3 ZnO 0〜3 P2O5 0〜5 からなる抵抗体保護用ガラス層の形成方法を提供するも
のである。
[Means for Solving the Problems] The present invention has been made to solve the above-mentioned problems, and has a high melting point in the range of 650 to 800 ° C. and 70 to 100% by weight of low-melting glass powder. Melting point glass powder 0-30% by weight
And a layer of a composition comprising 0 to 30% by weight of a refractory filler and 0 to 5% by weight of a refractory pigment on the resistor, followed by firing to form a glass layer for protecting the resistor. wherein the low melting point glass frit is essentially PbO 55~65 SiO 2 25~40 Al 2 O 3 1~5 R 2 O 0.1~5 ( where R 2 O in weight percentages are Li 2 O, Na 2 O, K At least one selected from 2 O and Cs 2 O) B 2 O 3 0 to 3 ZnO 0 to 3 P 2 O 5 to 5 is provided to provide a method for forming a resistor protecting glass layer.

本発明においては特定組成の低融点ガラス粉末を70重量
%含有するが、その理由は次のとおりである。
In the present invention, 70 wt% of low melting point glass powder having a specific composition is contained, and the reason is as follows.

低融点ガラス粉末が70重量%未満では組成物の焼成温度
が高くなり、焼成による抵抗体の抵抗値変化率が大きく
なるので好ましくない。
If the low-melting glass powder is less than 70% by weight, the firing temperature of the composition becomes high and the rate of change in resistance value of the resistor due to firing increases, which is not preferable.

かゝる低融点ガラス粉末は耐酸性に優れ、軟化点がほゞ
550〜600℃の範囲にあるため耐火物フィラー等の含有量
が30重量%以下の場合600℃程度の温度で焼成すること
ができる。
Such low-melting glass powder has excellent acid resistance and has a softening point of approximately
Since it is in the range of 550 to 600 ° C, when the content of the refractory filler or the like is 30% by weight or less, the firing can be performed at a temperature of about 600 ° C.

以下に低融点ガラス粉末について組成の限定理由を述べ
る。
The reasons for limiting the composition of the low melting point glass powder will be described below.

PbO:55%より少ないと軟化温度が高くなりすぎ所望の焼
成条件にて十分軟化流動せず未焼結となるため好ましく
ない。65%より多いとガラス軟化点が低くなり過ぎると
共に熱膨張率が大きくなり過ぎアルミナ基板とのマッチ
ングがとれなくなるので好ましくない。望ましくは56〜
64%範囲である。
If the PbO content is less than 55%, the softening temperature becomes too high, and under the desired firing conditions, it is not softened and fluidized sufficiently to cause unsintering, which is not preferable. If it exceeds 65%, the glass softening point becomes too low and the coefficient of thermal expansion becomes too large, so that matching with the alumina substrate cannot be achieved, which is not preferable. Desirably 56 ~
64% range.

SiO2:25%より少ないとガラス軟化点が低くなり過ぎる
と共に耐酸性が著しく低下する。一方40%より多いとガ
ラス軟化点が高くなりすぎ好ましくない。望ましくは26
〜39%範囲である。
If the SiO 2 content is less than 25%, the glass softening point will be too low and the acid resistance will be significantly reduced. On the other hand, if it exceeds 40%, the glass softening point becomes too high, which is not preferable. Preferably 26
~ 39% range.

Al2O3:1%より少ないと溶融・成形過程で失透化する恐
れがあり好ましくない。5%より多いと軟化点が高くな
りすぎ好ましくない。望ましくは1.5〜4.5%の範囲であ
る。
Al 2 O 3 : If it is less than 1%, devitrification may occur in the melting / molding process, which is not preferable. If it exceeds 5%, the softening point becomes too high, which is not preferable. It is preferably in the range of 1.5 to 4.5%.

R2O:ガラスの耐酸性を向上する効果があり必須成分で
ある。0.1%より少ないとその効果は少ない。一方5%
を越えると、軟化点が低くなり過ぎると共に熱膨張が大
きくなり好ましくない。望ましくは0.5〜4.5%の範囲で
ある。
R 2 O: An essential component that has the effect of improving the acid resistance of glass. If it is less than 0.1%, the effect is small. On the other hand, 5%
If it exceeds, the softening point becomes too low and the thermal expansion becomes large, which is not preferable. It is preferably in the range of 0.5 to 4.5%.

その他B2O3,ZnOあるいはP2O5はガラスの溶解性改善の目
的でそれぞれ3%未満(P2O5未満)含有することができ
る。かゝる成分の含有量が上記範囲を越えると耐酸性の
低下あるいは抵抗値変化率の増大を生じるので好ましく
ない。
In addition, B 2 O 3 , ZnO or P 2 O 5 may be contained in an amount of less than 3% (less than P 2 O 5 ) for the purpose of improving the glass solubility. If the content of such a component exceeds the above range, the acid resistance is lowered or the rate of change in resistance value is increased, which is not preferable.

低融点ガラス粉末としては以上の成分が総量で99%以上
であればよく、残部1%はSb2O3,As2O3,F等を含有する
ことができる。
As the low melting point glass powder, the total amount of the above components may be 99% or more, and the remaining 1% may contain Sb 2 O 3 , As 2 O 3 , F and the like.

本発明の組成物は以上の低融点ガラス粉末に対し650〜8
00℃の範囲に軟化点を有する高融点ガラス粉末を0〜30
重量%含有させることにより耐酸性を向上することがで
きる。
The composition of the present invention is 650 to 8 with respect to the above low melting point glass powder.
High melting point glass powder with a softening point in the range of 00 ℃ 0-30
Acid resistance can be improved by making it contain by weight%.

この高融点ガラス粉末は含有量が30重量%を越えた場合
又はその軟化点が800℃を越えた場合には組成物の焼成
物の焼結温度が高くなり過ぎるので好ましくない。一
方、高融点ガラス粉末の軟化点が650℃より低い場合は
耐酸性向上の効果が少ないので好ましくない。
If the content of this high melting point glass powder exceeds 30% by weight or if the softening point thereof exceeds 800 ° C., the sintering temperature of the fired product of the composition becomes too high, which is not preferable. On the other hand, when the softening point of the high melting point glass powder is lower than 650 ° C., the effect of improving the acid resistance is small, which is not preferable.

かゝる高融点ガラス粉末としては重量%表示でPbO 35〜
50、SiO2 35〜50、Al2O3 1〜5、B2O3 0〜15、R2O 0〜
5、RO 0〜10、ZnO 0〜5、ZrO2+TiO2 0〜10、から本質
的になるものが好ましい。
As such high melting point glass powder, PbO 35-
50, SiO 2 35-50, Al 2 O 3 1-5, B 2 O 3 0-15, R 2 O 0-
5, RO 0~10, ZnO 0~5, ZrO 2 + TiO 2 0~10, those consisting essentially of is preferred.

その理由は次の通りである。The reason is as follows.

SiO2:35%より少ないガラス軟化点が低くすぎ且つ耐酸
性の向上効果が少なく、50%より多いとガラス軟化点が
高くなりすぎ好ましくない。望ましくは、36〜49%の範
囲である。
SiO 2 : less than 35%, the glass softening point is too low and the effect of improving acid resistance is small, and if it is more than 50%, the glass softening point is too high, which is not preferable. Desirably, it is in the range of 36 to 49%.

PbO:35%より少ないとガラス軟化点が高くなり過ぎる。
一方50%より多いと軟化点が低くなり過ぎ好ましくな
い。望ましくは36〜49%の範囲である。
If it is less than 35%, the glass softening point becomes too high.
On the other hand, if it exceeds 50%, the softening point becomes too low, which is not preferable. It is preferably in the range of 36 to 49%.

Al2O3:1%より少ないとガラス溶解時に失透を生じガラ
ス化が困難となる。5%より多いと軟化点が高くなり過
ぎる。望ましくは2〜4%の範囲である。
Al 2 O 3: vitrification becomes difficult to occur a devitrification small that during glass melting than 1%. If it exceeds 5%, the softening point becomes too high. It is preferably in the range of 2 to 4%.

その他:R2O(Li2O,Na2O,K2O,Cs2O),RO(MgO,CaO,Sr
O,BaO,ZnO)およびZrO2,TiO2成分は溶解性および耐酸
性向上の目的でそれぞれの限定範囲で含有することがで
きる。
Others: R 2 O (Li 2 O, Na 2 O, K 2 O, Cs 2 O), RO (MgO, CaO, Sr
O, BaO, ZnO) and ZrO 2 and TiO 2 components can be contained in their respective limited ranges for the purpose of improving solubility and acid resistance.

一方、必須成分ではないがAl2O3,ZrSiO4,ZrO2等の耐
火物フィラーを添加することにより焼成時の抵抗体の抵
抗値変化率を小さくすることができる。しかしながらそ
の添加量が30%より多いと焼結不足のおそれがあるので
好ましくない。
On the other hand, although not an essential component, by adding a refractory filler such as Al 2 O 3 , ZrSiO 4 , or ZrO 2 , the resistance change rate of the resistor during firing can be reduced. However, if the addition amount is more than 30%, sintering may be insufficient, which is not preferable.

耐火性顔料は、着色し識別する目的で添加することがで
きるがその添加量が5%を越えると焼結不足等を生じる
恐れがあるので好ましくない。かゝる顔料としてはFe-M
n系,Fe-Cr系の黒色顔料、CoO3-Al2O3系の青色顔料が例
示される。
The refractory pigment can be added for the purpose of coloring and identification, but if the addition amount exceeds 5%, sintering may be insufficient, which is not preferable. Fe-M as such a pigment
Examples include n-based and Fe-Cr-based black pigments and CoO 3 -Al 2 O 3 -based blue pigments.

通常上記成分より構成される組成物を1〜3μmの粉末
とし、これと有機ビヒクルとを混ぜペースト状としスク
リーン印刷法によりアルミナ基板上に設けられたRuO2
抗体にかぶせ600℃前後にて5〜10分焼成される。ここ
で有機ビヒクル成分は一般的に知られているエチルセル
ロース樹脂、アクリル樹脂等をα‐テルピネオールある
いはトリメチルペンタジオールモノイソブチレート系溶
剤を用いるが特に限定はしない。
Usually, a composition composed of the above components is made into a powder having a size of 1 to 3 μm, and this is mixed with an organic vehicle to form a paste, which is then covered with a RuO 2 resistor provided on an alumina substrate by a screen printing method at about 600 ° C. Bake for ~ 10 minutes. Here, as the organic vehicle component, generally known ethyl cellulose resin, acrylic resin and the like are used as α-terpineol or trimethylpentadiol monoisobutyrate type solvent, but are not particularly limited.

[実施例] 目標組成となるよう各原料を調合し、白金坩堝にて1300
〜1500℃で1〜3時間の攪拌溶解を行なう。次いで溶解
したガラスを水砕または薄片状とし粉砕装置により微粉
砕する。通常粉末粒度は1〜3μmとスクリーン印刷に
適する粒度とする。微粉砕化する時に、低融点ガラスを
ベースに高融点ガラス、耐火物フィラーあるいは耐熱顔
料等を必要に応じて同時に粉砕兼混合しても差し仕かえ
ない。
[Example] Each raw material was blended so as to obtain a target composition, and 1300 was prepared with a platinum crucible.
Dissolve with stirring at ~ 1500 ° C for 1 to 3 hours. Next, the molten glass is crushed into water or flakes and finely crushed by a crusher. Usually, the particle size of the powder is 1 to 3 μm, which is suitable for screen printing. When finely pulverizing, it is permissible to simultaneously pulverize and mix high melting point glass, refractory filler, heat resistant pigment, or the like with low melting point glass as a base, if necessary.

得られたガラス混合粉末はペーストとするため前記した
ようなビヒクルと混ぜる。ペーストは均質分散化のため
に乳鉢混練の後、3本ローラを数回通すことが通常行な
われる。ペースト粘度は20万±5万cps(25℃)とし
た。
The obtained glass mixed powder is mixed with the vehicle as described above to form a paste. The paste is usually kneaded in a mortar for homogenous dispersion and then passed through a triple roller several times. The paste viscosity was 200,000 ± 50,000 cps (25 ° C.).

一方、96%アルミナ基板をベースにAg-Pb系導体電極を
印刷し850℃、10分焼成し、その上にRuO2抵抗体をスク
リーン印刷し、同様に850℃、10分焼成を行なった。こ
のRuO2抵抗体の上に前記したガラスペーストをスクリー
ン印刷によりかぶせ600℃、10分の焼成を行ない、ガラ
ス層を形成した。特性評価は、ガラスをかぶせる前後の
RuO2抵抗体の抵抗値変化率および抵抗体上ガラスの外観
(発泡ピンホール等の有無)と耐酸性試験を行なった。
耐酸性評価は通常のNiメッキ工程よりも厳しい条件すな
わち20%HNO3溶液中(70℃)にて1時間後の変質をカミ
ソリの刃による引っかき試験により、外観検査と併せて
良否の判断を行なった。
On the other hand, an Ag-Pb-based conductor electrode was printed on a 96% alumina substrate as a base, baked at 850 ° C for 10 minutes, a RuO 2 resistor was screen-printed thereon, and baked at 850 ° C for 10 minutes in the same manner. The glass paste described above was covered by screen printing on the RuO 2 resistor and baked at 600 ° C. for 10 minutes to form a glass layer. Characteristic evaluation before and after covering with glass
The resistance change rate of the RuO 2 resistor, the appearance of the glass on the resistor (whether there were foamed pinholes, etc.) and the acid resistance test were conducted.
The acid resistance is judged to be good or bad in combination with the appearance inspection by a scratch test with a razor blade after 1 hour in a 20% HNO 3 solution (70 ° C) under stricter conditions than the usual Ni plating process. It was

本発明により形成されたガラス層7種類及び比較例2種
類について行なった上記試験結果を表・1に示した。同
表より明らかなように本発明により形成されたガラス層
は耐酸性に優れ抵抗体の抵抗値を変化させることが極め
て少ない。
Table 1 shows the results of the above-mentioned tests performed on seven types of glass layers formed according to the present invention and two types of Comparative Examples. As is clear from the table, the glass layer formed according to the present invention has excellent acid resistance and hardly changes the resistance value of the resistor.

なお、同表に記載した測定値は次のようにして求めたも
のである。
The measured values shown in the table are obtained as follows.

b)耐酸性=70℃、20%HNO3溶液中に浸漬1時間、水洗
乾燥後カミソリの刃にて引っかきテスト。
b) Acid resistance = 70 ° C, immersed in 20% HNO 3 solution for 1 hour, washed with water, dried, and then scratched with a razor blade.

評価 ×:簡単にはがれるもの △:ガラス一部がはがれるもの ○:全面が未処理状態と同様はがれないもの c)外観検査:RuO2上ガラスを80倍の実体顕微鏡により
発泡ピンホールの有無を評価 ×:全面に大きな発泡あるいはピンホールあり △:部分的に小さな発泡、ピンホールあり ○:発泡、ピンホールなし [発明の効果] 本発明によれば、抵抗体の抵抗値変化率が極めて少な
く、かつ耐酸性及び外観に優れたものが得られる。
Evaluation x: easily peeled off △: part of the glass peeled off ○: the whole surface did not peel off like the untreated state c) visual inspection: RuO 2 top glass was evaluated for the presence or absence of foam pinholes with a 80x stereoscopic microscope. ×: Large foam or pinholes on the entire surface Δ: Small foams or pinholes partially ○: Foaming, no pinholes [Effect of the invention] According to the present invention, the resistance value change rate of the resistor is extremely small, In addition, it has excellent acid resistance and excellent appearance.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】低融点ガラス粉末70〜100重量%と、650〜
800℃の範囲に軟化点を有する高融点ガラス粉末0〜30
重量%と、耐火物フィラー0〜30%と、耐火性顔料0〜
5重量%とからなる組成物の層を抵抗体上に設け、焼成
して抵抗体保護用ガラス層を形成する方法であって、前
記低融点ガラス粉末は重量%表示で本質的に PbO 55〜65 SiO2 25〜40 Al2O3 1〜5 R2O 0.1〜5 (但しR2OはLi2O,Na2O,K2O及びCs2Oから選ばれた少な
くとも1者) B2O3 0〜3 ZnO 0〜3 P2O5 0〜5 からなる抵抗体保護用ガラス層の形成方法。
1. Low melting glass powder 70 to 100% by weight, and 650 to
High melting point glass powder 0 to 30 having a softening point in the range of 800 ° C
% By weight, refractory filler 0-30%, refractory pigment 0
A method of forming a glass layer for protecting a resistor by forming a layer of a composition consisting of 5% by weight on a resistor and firing it to form a glass layer for protecting the resistor, wherein the low melting point glass powder is essentially PbO 55- 65 SiO 2 25~40 Al 2 O 3 1~5 R 2 O 0.1~5 ( where R 2 O is Li 2 O, Na 2 O, at least one person selected from K 2 O and Cs 2 O) B 2 A method for forming a resistor-protecting glass layer comprising O 3 0 to 3 ZnO 0 to 3 P 2 O 5 0 to 5 .
【請求項2】前記高融点ガラス粉末は重量%表示で本質
的に PbO 35〜50 SiO2 35〜50 Al2O3 1〜5 B2O3 0〜15 R2O 0〜5 RO 0〜10 (但しROはMgO,CaO,SrO及びBaOから選ばれた少なくとも
1者) ZnO 0〜5 ZrO2+TiO2 0〜10 からなる特許請求の範囲第1項記載の抵抗体保護用ガラ
ス層の形成方法。
2. The high melting point glass powder is essentially expressed in% by weight as PbO 35 to 50 SiO 2 35 to 50 Al 2 O 31 to 5 B 2 O 3 0 to 15 R 2 O 0 to 5 RO 0 to 10 (however, RO is at least one selected from MgO, CaO, SrO and BaO) ZnO 0-5 ZrO 2 + TiO 2 0-10 The glass layer for resistor protection according to claim 1 consisting of Forming method.
【請求項3】前記耐火物フィラーはアルミナ、ジルコニ
ア及びジルコンから選ばれた少なくとも1者である特許
請求の範囲第1項または第2項記載の抵抗体保護用ガラ
ス層の形成方法。
3. The method of forming a glass layer for protecting a resistor according to claim 1 or 2, wherein the refractory filler is at least one selected from alumina, zirconia and zircon.
JP61263940A 1986-11-07 1986-11-07 Method for forming glass layer for resistor protection Expired - Lifetime JPH0740521B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61263940A JPH0740521B2 (en) 1986-11-07 1986-11-07 Method for forming glass layer for resistor protection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61263940A JPH0740521B2 (en) 1986-11-07 1986-11-07 Method for forming glass layer for resistor protection

Publications (2)

Publication Number Publication Date
JPS63119201A JPS63119201A (en) 1988-05-23
JPH0740521B2 true JPH0740521B2 (en) 1995-05-01

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JP61263940A Expired - Lifetime JPH0740521B2 (en) 1986-11-07 1986-11-07 Method for forming glass layer for resistor protection

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Country Link
JP (1) JPH0740521B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2618019B2 (en) * 1988-09-22 1997-06-11 住友金属鉱山株式会社 Conductive paint for plating base and plating method using the same
JP5034660B2 (en) * 2007-05-01 2012-09-26 株式会社村田製作所 Method for manufacturing ceramic substrate, ceramic substrate, and electronic device
JP7777275B2 (en) * 2021-08-19 2025-11-28 日本電気硝子株式会社 Powder materials, powder material pastes and fired films

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5551322B2 (en) 2011-09-20 2014-07-16 シチズンホールディングス株式会社 LED module and LED lamp using the same

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5551322B2 (en) 2011-09-20 2014-07-16 シチズンホールディングス株式会社 LED module and LED lamp using the same

Also Published As

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JPS63119201A (en) 1988-05-23

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