JPH0743403B2 - Insulation resistance measurement method - Google Patents
Insulation resistance measurement methodInfo
- Publication number
- JPH0743403B2 JPH0743403B2 JP395590A JP395590A JPH0743403B2 JP H0743403 B2 JPH0743403 B2 JP H0743403B2 JP 395590 A JP395590 A JP 395590A JP 395590 A JP395590 A JP 395590A JP H0743403 B2 JPH0743403 B2 JP H0743403B2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- insulation resistance
- frequency
- filter
- low
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000009413 insulation Methods 0.000 title claims description 23
- 238000000691 measurement method Methods 0.000 title description 2
- 238000005259 measurement Methods 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 10
- 238000004364 calculation method Methods 0.000 claims description 9
- 238000002347 injection Methods 0.000 claims description 6
- 239000007924 injection Substances 0.000 claims description 6
- 238000013500 data storage Methods 0.000 claims description 2
- 238000007493 shaping process Methods 0.000 claims 1
- 238000006243 chemical reaction Methods 0.000 description 17
- 238000007796 conventional method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 238000001914 filtration Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001052 transient effect Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は活線状態で電路の絶縁抵抗を測定する方法、特
に大きな絶縁抵抗値を測定する場合無視できなくなる変
流器の過渡応答やろ波器で除去できない測定用低周波信
号周波数近傍の雑音周波数成分の影響を補償した絶縁抵
抗測定方法に関する。The present invention relates to a method for measuring the insulation resistance of an electric circuit in a hot line state, and in particular, a transient response and filtering of a current transformer that cannot be ignored when measuring a large insulation resistance value. The present invention relates to an insulation resistance measuring method that compensates for the influence of noise frequency components in the vicinity of the measurement low-frequency signal frequency that cannot be removed by a measuring instrument.
従来の絶縁抵抗測定方法を第2図(a)に示す。 A conventional insulation resistance measuring method is shown in FIG.
測定用低周波信号発生部で発生させた信号を注入用変圧
器を介して接地線に注入し、この信号電圧により絶縁抵
抗Rg及び対地静電容量Cgを流れ接地線に帰還する電流を
変流器で検出し、ろ波器で測定用低周波信号の漏洩電流
成分のみを取り出した後、同期整流部で絶縁抵抗成分の
みを検出することで電路の絶縁抵抗を測定する方法が用
いられる。又、同期整流を行うための同期信号は注入用
変圧器を介して接地線に注入した測定用低周波信号電圧
と位相を合わす必要があり、測定用低周波信号の漏洩電
流は変流器及び、ろ波器により注入した測定用低周波信
号電圧と位相がずれるため、ずれた位相差分を補正する
位相補正部を設ける方法が一般的である。The signal generated by the low-frequency signal generator for measurement is injected into the ground wire through the injection transformer, and this signal voltage causes the insulation resistance R g and the capacitance C g to ground to flow back to the ground wire. A method of measuring the insulation resistance of the circuit by detecting only the leakage current component of the low-frequency signal for measurement with a current transformer and then detecting only the insulation resistance component with a synchronous rectification unit is used. . Also, the synchronizing signal for performing synchronous rectification must be in phase with the measuring low-frequency signal voltage injected into the ground line through the injection transformer, and the leakage current of the measuring low-frequency signal is Since the measurement low-frequency signal voltage injected by the filter is out of phase with the measurement low-frequency signal voltage, it is common to provide a phase correction unit that corrects the phase difference.
従来の絶縁抵抗測定方法を用いた場合の測定可能絶縁抵
抗値は変流器に続く、ろ波器の入力換算雑音電圧と通過
帯域幅内に含まれる雑音電圧の大きさにより決まる。The measurable insulation resistance value when the conventional insulation resistance measuring method is used is determined by the noise equivalent voltage included in the pass band width and the input equivalent noise voltage of the filter following the current transformer.
まず、入力換算雑音電圧について絶縁抵抗Rgを含む電
路、注入用変圧器及び変流器を等価回路で示す第2図
(b)を用いて説明する。First, the input converted noise voltage will be described with reference to FIG. 2 (b) showing an equivalent circuit of the electric circuit including the insulation resistance R g , the injection transformer and the current transformer.
注入用変圧器により電路に注入する電圧は一般的に0.5V
程度であるため、絶縁抵抗Rgが100kΩ時の漏洩電流I1は
5μA(0.5V/100kΩ)となり変流器の2次巻線の巻数
は一般的に2000ターン位であるため変流器2次電流I2は
約2.5nA(5μA/2000ターン)となる。よって変流器終
端抵抗RLの両端の電圧はRL=100Ωとして約250nV(=10
0Ω×2.5nA)となる。終端抵抗RLを大きくするとRL両端
電圧を高くすることができるが、温度に対する変流器の
1次電流/2次電流位相特性が悪化するため一般的にはRL
は100Ω以下で使用される。The voltage injected by the injection transformer into the circuit is generally 0.5V.
Therefore, the leakage current I 1 when the insulation resistance R g is 100 kΩ is 5 μA (0.5 V / 100 kΩ), and the number of turns of the secondary winding of the current transformer is generally about 2000 turns. The next current I 2 is about 2.5 nA (5 μA / 2000 turns). Thus the voltage across the current transformer termination resistor R L about as R L = 100Ω 250nV (= 10
It becomes 0Ω × 2.5nA). Although it is possible to increase the R L voltage across the larger the terminating resistor R L, typically for primary current / secondary current phase characteristic of the current transformer for temperature deteriorates R L
Is used below 100Ω.
又、市販されている超低雑音演算増幅器の入力換算雑音
は良いものでも3〜5nVあり信号成分に対し、1/100〜1/
50の雑音成分があることになる。高精度、高安定性、高
絶縁抵抗検出を行う場合、雑音成分は信号成分に対し1/
1000以下であることが必要となり、従来方法では絶縁抵
抗Rg>100kΩの高精度、高安定な検出は不可能である。
次にろ波器の通過帯域幅内に含まれる雑音電圧について
説明する。Moreover, even if the input conversion noise of the commercially available ultra-low noise operational amplifier is good, it is 3 to 5 nV.
There will be 50 noise components. When performing high accuracy, high stability, and high insulation resistance detection, the noise component is 1 /
It needs to be 1000 or less, and the conventional method cannot detect the insulation resistance R g > 100 kΩ with high accuracy and high stability.
Next, the noise voltage included in the pass band width of the filter will be described.
一般に測定用低周波信号を通過させるため、ろ波器には
帯域通過ろ波器が用いられ、通過帯域は測定用低周波信
号周波数を中心として一定の周波数幅を設定する。この
ろ波器の通過帯域には前述入力換算雑音電圧に起因する
雑音成分が存在するため、ろ波器の出力の雑音成分を少
なくするためにはろ波器の通過帯域幅を狭くすれば良
い。Generally, a band pass filter is used as the filter in order to pass the low frequency signal for measurement, and the pass band has a constant frequency width centered on the low frequency signal frequency for measurement. Since a noise component due to the input-converted noise voltage is present in the pass band of this filter, the pass band width of the filter may be narrowed in order to reduce the noise component of the output of the filter.
しかし、通過帯域幅を狭くすると、ろ波器の遮断周波数
が測定用低周波信号周波数と近くなるため測定用低周波
信号周波数の温度に対するろ波器の入力電圧/出力電圧
位相特性が悪化する。However, if the pass band width is narrowed, the cutoff frequency of the filter becomes close to the measurement low-frequency signal frequency, so that the input voltage / output voltage phase characteristic of the filter with respect to the temperature of the measurement low-frequency signal frequency deteriorates.
このため通過帯域幅をむやみに狭くできず、ろ波器の出
力に入力換算雑音電圧に起因する雑音成分が発生し高絶
縁抵抗検出を行う際に、測定用低周波信号と雑音成分を
分離することが困難となる欠点があった。For this reason, the passband width cannot be narrowed unnecessarily, and a noise component due to the input-referred noise voltage is generated in the output of the filter, and when measuring high insulation resistance, the low-frequency signal for measurement and the noise component are separated. There was a drawback that made it difficult.
第1図(a)を用いて問題を解決するための手段を説明
する。Means for solving the problem will be described with reference to FIG.
変流器により検出した電路の漏洩電流成分をろ波器を介
してアナログ/デジタル変換部(以下A/D変換部)に入
力する。The leakage current component of the electric circuit detected by the current transformer is input to the analog / digital converter (hereinafter referred to as A / D converter) via the filter.
又、A/D変換部は制御部により制御し、測定用低周波信
号をトリガー信号としてアナログ入力を量子化したのち
波形記憶部に量子化した波形データを記憶する。The A / D conversion unit is controlled by the control unit, and quantizes the analog input using the low frequency signal for measurement as a trigger signal, and then stores the quantized waveform data in the waveform storage unit.
この関係を第1図(b)に示す。This relationship is shown in FIG.
制御部で測定用低周波信号の零電圧の点Aをトリガー点
として時間T1間隔で時間T2の間A/D変換制御信号を発生
し、A/D変換部に加える。A/D変換部はアナログ入力信号
をA/D変換制御信号が加わるたびにデジタル値に変換し
波形記憶部に送出する。波形記憶部は、制御部より発生
するA/D変換制御信号毎にあらかじめ設定した記憶番地
設定信号により定められる番地内にA/D変換部出力のデ
ジタル値を収納する。すなわち時間T2間に(T2/T1+
1)回アナログ/デジタル変換を行い、この回数分準備
された記憶個所に波形デジタル・データを記憶する。
又、回数は後の演算部で行う高速フーリェ変換の関係上
2n(nは自然数)回であることが好ましいが特に規定す
る必要はない。さらに、トリガー点を説明の関係上、零
電圧の点Aとしたが変流器及びろ波器によるアナログ信
号の位相遅れを補正するためにトリガー点を位相遅れ分
移動させて零電圧点以外としてもかまわない。波形記憶
部に記憶した波形デジタル・データは演算部により高速
フーリェ変換を行う。高速フーリェ変換は一連のデータ
が実数である時間領域のデータを周波数領域のデータに
変換する一般的な手法である。すなわち波形デジタル・
データを高速フーリェ変換することにより特定周波数の
信号成分を実数部と虚数部に分けて演算結果を得ること
ができる。The control unit generates an A / D conversion control signal at time T 1 intervals at time T 2 using the zero voltage point A of the measurement low frequency signal as a trigger point, and applies it to the A / D conversion unit. The A / D conversion unit converts the analog input signal into a digital value each time an A / D conversion control signal is applied and sends the digital value to the waveform storage unit. The waveform storage unit stores the digital value of the A / D conversion unit output in the address determined by the storage address setting signal preset for each A / D conversion control signal generated by the control unit. That is, during time T 2 , (T 2 / T 1 +
1) The analog / digital conversion is performed once, and the waveform digital data is stored in the prepared storage location for this number of times.
In addition, the number of times is related to the high-speed Fourier transform performed by the calculation unit later.
It is preferably 2 n (n is a natural number) times, but it is not particularly limited. Further, the trigger point is set to the zero voltage point A for the sake of explanation, but in order to correct the phase delay of the analog signal due to the current transformer and the filter, the trigger point is moved by the phase delay and set as a point other than the zero voltage point. I don't care. The waveform digital data stored in the waveform storage unit is subjected to high-speed Fourier transform by the calculation unit. The fast Fourier transform is a general method for converting time domain data in which a series of data is real numbers into frequency domain data. That is, waveform digital
By performing the fast Fourier transform on the data, the signal component of the specific frequency can be divided into the real number part and the imaginary number part to obtain the calculation result.
さらに、この特定周波数として低周波信号周波数を選別
し、演算結果中、実数部はトリガー信号として用いた測
定用低周波信号と同位相の成分となり、虚数部は同低周
波信号とπ/2位相が異なる成分となることより絶縁抵抗
Rgによる漏洩電流成分なのか、対地静電容量Cgによる漏
洩電流成分なのかを区別することができる。つまりトリ
ガー電圧点を零電圧とした場合、高速フーリエ変換後の
実数部は絶縁抵抗Rgによる漏洩電流成分となり、虚数部
は対地静電容量Cgによる漏洩電流成分となる。Furthermore, the low frequency signal frequency is selected as this specific frequency, and in the calculation result, the real part is the same phase component as the measurement low frequency signal used as the trigger signal, and the imaginary part is the same low frequency signal and π / 2 phase. Insulation resistance from
It is possible to distinguish between the leakage current component due to R g and the leakage current component due to the ground capacitance C g . That is, when the trigger voltage point is set to zero voltage, the real part after the fast Fourier transform becomes the leakage current component due to the insulation resistance R g , and the imaginary part becomes the leakage current component due to the ground capacitance C g .
但し変流器、ろ波器による位相遅れが無い場合に限る。
同位相遅れがある場合、ろ波器の後に位相遅れを補正す
る回路を設けるか、又はトリガー電圧点を変更すれば良
い。一般に高速フーリェ変換を行った場合の周波数分解
能はA/D変換制御信号T2時間及びA/D変換回数N(=1+
T2/T1)に依存し(2/(T2×N))で与えられる。高速
フーリェ変換は特定の周波数成分を検出する技術である
が別の実現をすると、特定の周波数成分のみを通す帯域
通過ろ波器であり、通過帯域幅は周波数分解能すなわち
A/D変換制御信号T2時間及びA/D変換回数Nによって定ま
る。However, only when there is no phase delay due to the current transformer and filter.
If there is the same phase delay, a circuit for correcting the phase delay may be provided after the filter or the trigger voltage point may be changed. Generally, the frequency resolution when high-speed Fourier transform is performed is A / D conversion control signal T 2 time and A / D conversion number N (= 1 +
It is given by (2 / (T 2 × N)) depending on T 2 / T 1 ). The Fast Fourier Transform is a technique for detecting a specific frequency component, but if it is realized differently, it is a band pass filter that passes only the specific frequency component, and the pass bandwidth is the frequency resolution, that is,
It is determined by the A / D conversion control signal T 2 time and the A / D conversion number N.
以上のように高速フーリェ変換を用いたろ波技術はデジ
タル・フィルタであり温度、温度等の環境変化に依存す
ることなく高精度、高安定に通過帯域幅の狭いろ波器を
容易に実現できる。さらに温度変化に対する位相特性が
無視でき、A/D変換部前段のアナログろ波器をより簡素
化し環境変化による安定性の高い装置とすることができ
る。As described above, the filtering technique using the high-speed Fourier transform is a digital filter, and a filter with a narrow pass band can be easily realized with high accuracy and high stability without depending on environmental changes such as temperature and temperature. Furthermore, the phase characteristics with respect to temperature changes can be ignored, and the analog filter in the preceding stage of the A / D conversion unit can be made simpler to provide a device with high stability due to environmental changes.
第1図(a)で注入用変圧器を通じて接地線に印加した
測定用低周波信号により絶縁抵抗Rg及び対地静電容量Cg
を通る漏洩電流が発生する。この漏洩電流を変流器で検
出し、ろ波器を通じてA/D変換部に入力する。In Fig. 1 (a), the insulation resistance R g and the capacitance to ground C g are measured by the low-frequency signal for measurement applied to the ground wire through the transformer for injection.
A leakage current passing through is generated. This leakage current is detected by the current transformer and input to the A / D converter through the filter.
又、制御部は低周波信号をトリガーとして前述のとおり
A/D変換部にA/D変換制御信号を送出する。波形記憶部は
A/D変換したデジタル・データを所定の番地に記憶す
る。この番地は制御部により決定する。一連のA/D変換
が終了し、波形記憶部にデジタル・データの記憶が終了
した時点で、制御部より演算部に向けて演算実施信号を
送出し、演算部は波形記憶部のデジタル・データを高速
フーリェ変換する。さらに高速フーリェ変換の結果中、
測定用低周波信号周波数と同じ周波数成分の中より実数
部のみを抽出し出力する。この出力は電路の絶縁抵抗Rg
の値に反比例する。又、より高精度とするためにこの出
力回数の平均値を演算する等の数値処理を行うことは容
易に実施できる。Also, the control unit triggers the low frequency signal as described above.
Sends an A / D conversion control signal to the A / D converter. The waveform storage section
The A / D converted digital data is stored in a predetermined address. This address is determined by the control unit. When a series of A / D conversion is completed and digital data storage in the waveform storage section is completed, the control section sends a calculation execution signal to the calculation section, and the calculation section outputs the digital data in the waveform storage section. Fast Fourier transform. In the result of the faster Fourier transform,
Only the real part is extracted and output from the same frequency components as the low-frequency signal frequency for measurement. This output is the insulation resistance of the circuit R g
Inversely proportional to the value of. Further, it is easy to carry out a numerical process such as calculating an average value of the number of outputs for higher precision.
〔発明の効果〕 従来の同期整流による手法に比べ、A/D変換後デジ
タル演算を行う本発明により調整個所が大幅に削減され
組立作業性の向上が計れる。[Advantages of the Invention] Compared with the conventional method using synchronous rectification, the present invention, which performs digital calculation after A / D conversion, significantly reduces the number of adjustment points and improves the assembly workability.
高速フーリェ変換の手法を用いることにより、ろ波
器で除去不可能であった測定用信号周波数近傍の雑音成
分を分離除去可能となる。By using the method of high-speed Fourier transform, it becomes possible to separate and remove the noise component in the vicinity of the measurement signal frequency that could not be removed by the filter.
高速フーリェ変換とデジタル処理を用いることによ
り、環境変化による位相特性変化を受けずに高絶縁抵抗
の高安定、高精度測定が可能となる。By using high-speed Fourier transform and digital processing, highly stable and highly accurate measurement of high insulation resistance is possible without being affected by changes in phase characteristics due to environmental changes.
第1図(a)は本発明の概念及び実施例を示す図、 第1図(b)は概念を説明するためのタイミングを示す
図、 第2図(a)は従来方法による絶縁抵抗測定装置の1例
を示したブロック図、 第2図(b)は、従来の測定方法の問題点を説明するた
めの等価回路図。1 (a) is a diagram showing a concept and an embodiment of the present invention, FIG. 1 (b) is a diagram showing a timing for explaining the concept, and FIG. 2 (a) is an insulation resistance measuring device by a conventional method. FIG. 2B is an equivalent circuit diagram for explaining the problems of the conventional measurement method.
Claims (1)
路に商用周波数と異なる測定用低周波信号電圧を加える
と共に、該測定用低周波信号の漏洩電流成分を検出し、
同時に検出した不要電流成分をろ波器により除去した
後、該測定用低周波信号より波形整形して得た同期信号
をトリガーとして一定周期、一定時間間隔でろ波器の出
力をデジタル値に変換し波形データ記憶部に記憶し、こ
の波形データを用いて演算部で高速フーリェ変換を行う
ことにより、測定信号周波数成分のうち絶縁抵抗成分を
分離検出したことを特徴とする絶縁抵抗測定方法。1. A low-frequency signal voltage for measurement different from a commercial frequency is applied to a circuit through an injection transformer to a ground wire of the transformer, and a leakage current component of the low-frequency signal for measurement is detected.
After removing the unnecessary current component detected at the same time with a filter, the output of the filter is converted into a digital value at a fixed period and at a fixed time interval with a synchronization signal obtained by waveform shaping from the low frequency signal for measurement as a trigger. An insulation resistance measuring method characterized in that an insulation resistance component of a measurement signal frequency component is separately detected by storing in a waveform data storage unit and performing a high-speed Fourier transform in a calculation unit using the waveform data.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP395590A JPH0743403B2 (en) | 1990-01-10 | 1990-01-10 | Insulation resistance measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP395590A JPH0743403B2 (en) | 1990-01-10 | 1990-01-10 | Insulation resistance measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03209177A JPH03209177A (en) | 1991-09-12 |
| JPH0743403B2 true JPH0743403B2 (en) | 1995-05-15 |
Family
ID=11571528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP395590A Expired - Fee Related JPH0743403B2 (en) | 1990-01-10 | 1990-01-10 | Insulation resistance measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0743403B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007333604A (en) * | 2006-06-16 | 2007-12-27 | Hikari Shoko Kk | Insulating state monitoring device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009198188A (en) * | 2008-02-19 | 2009-09-03 | Kyoritsu Electrical Instruments Works Ltd | Ground resistance meter |
| JP2010190645A (en) * | 2009-02-17 | 2010-09-02 | Fuji Electric Fa Components & Systems Co Ltd | Method for detecting leakage current, leakage current detector, and system monitor |
-
1990
- 1990-01-10 JP JP395590A patent/JPH0743403B2/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007333604A (en) * | 2006-06-16 | 2007-12-27 | Hikari Shoko Kk | Insulating state monitoring device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03209177A (en) | 1991-09-12 |
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