JPH0749101B2 - Growth method of semiconductor cubic boron nitride single crystal. - Google Patents
Growth method of semiconductor cubic boron nitride single crystal.Info
- Publication number
- JPH0749101B2 JPH0749101B2 JP62109523A JP10952387A JPH0749101B2 JP H0749101 B2 JPH0749101 B2 JP H0749101B2 JP 62109523 A JP62109523 A JP 62109523A JP 10952387 A JP10952387 A JP 10952387A JP H0749101 B2 JPH0749101 B2 JP H0749101B2
- Authority
- JP
- Japan
- Prior art keywords
- boron nitride
- solvent
- temperature
- raw material
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J3/00—Processes of utilising sub-atmospheric or super-atmospheric pressure to effect chemical or physical change of matter; Apparatus therefor
- B01J3/06—Processes using ultra-high pressure, e.g. for the formation of diamonds; Apparatus therefor, e.g. moulds or dies
- B01J3/062—Processes using ultra-high pressure, e.g. for the formation of diamonds; Apparatus therefor, e.g. moulds or dies characterised by the composition of the materials to be processed
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2203/00—Processes utilising sub- or super atmospheric pressure
- B01J2203/06—High pressure synthesis
- B01J2203/0605—Composition of the material to be processed
- B01J2203/0645—Boronitrides
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2203/00—Processes utilising sub- or super atmospheric pressure
- B01J2203/06—High pressure synthesis
- B01J2203/065—Composition of the material produced
- B01J2203/066—Boronitrides
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J2203/00—Processes utilising sub- or super atmospheric pressure
- B01J2203/06—High pressure synthesis
- B01J2203/0675—Structural or physico-chemical features of the materials processed
- B01J2203/068—Crystal growth
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- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は半導体立方晶窒化ほう素単結晶の育成法に関す
る。TECHNICAL FIELD The present invention relates to a method for growing a semiconductor cubic boron nitride single crystal.
従来技術 従来、半導体材料として、シリコンやガリウムひ素等が
多く使用されているが、これらは高温になると、例えば
シリコン半導体では150℃以上、ガリウムひ素半導体で
は250℃以上の高温では使用できない欠点がある。2. Description of the Related Art Conventionally, silicon, gallium arsenide, and the like have been widely used as semiconductor materials. However, at high temperatures, for example, silicon semiconductors have a drawback that they cannot be used at high temperatures of 150 ° C. or higher and gallium arsenide semiconductors at 250 ° C. or higher. .
一方、立方晶窒化ほう素は高温で使用できる半導体とし
て期待されているが、高圧高温下で合成される物質であ
るので、その製法は著しく制限を受ける。即ち、従来、
半導体立方晶窒化ほう素は、高温高圧下で半導体特性与
える物質(ドープ剤と言う)を含んだ溶媒と共に、六方
晶窒化ほう素を原料にして、両者の溶解度を駆動力とし
て作られてきた。この方法によると、結晶は原料の極近
傍に自然核発生によりできるため、その大きさは隣接す
る結晶に制限され、最大1mm、通常は0.5mm以下に限られ
ていた。このため半導体立方晶窒化ほう素は、高温半導
体として優れた特性を持つと期待されているにもかかわ
らず、未だ実用化されていない。On the other hand, cubic boron nitride is expected as a semiconductor that can be used at high temperatures, but since it is a substance synthesized under high pressure and high temperature, its manufacturing method is significantly limited. That is, conventionally
The semiconductor cubic boron nitride has been produced by using hexagonal boron nitride as a raw material together with a solvent containing a substance (referred to as a dopant) that gives semiconductor characteristics at high temperature and high pressure, and using the solubility of both as a driving force. According to this method, crystals are formed by natural nucleation in the immediate vicinity of the raw material, so that the size is limited to the adjacent crystals and is limited to 1 mm at maximum, usually 0.5 mm or less. For this reason, semiconductor cubic boron nitride has not yet been put into practical use, although it is expected to have excellent properties as a high temperature semiconductor.
発明の目的 本発明は従来法が持つ前記の欠点を除くべくなされたも
ので、その目的は実用可能な大きさで良質の半導体立方
晶窒化ほう素単結晶の育成法を提供するにある。OBJECT OF THE INVENTION The present invention has been made to eliminate the above-mentioned drawbacks of the conventional method, and an object thereof is to provide a method for growing a good-quality semiconductor cubic boron nitride single crystal having a practical size.
発明の構成 本発明者らは前記目的を達成すべく鋭意研究の結果、高
温高圧下で密封され、種結晶が配置されることのない育
成容器の下部に形成される高温部に、窒化ほう素原料を
配置するとともに、ドープ剤含有の窒化ほう素溶媒をそ
の原料の上に配置し、溶媒中に温度差を付けて低温部を
形成し、高温部に置いた窒化ほう素原料を温度差の付い
た溶媒中に溶かし、温度差による窒化ほう素の溶解度差
を利用して、溶媒中の低温部に結晶を析出成長させるこ
とにより、半導体特性を持つ良質で大型の立方晶窒化ほ
う素単結晶を育成し得ることを見出し、この知見に基づ
いて本発明を完成した。As a result of intensive studies to achieve the above object, the present inventors have found that boron nitride is formed in a high temperature portion which is sealed under high temperature and high pressure and which is formed in the lower part of a growth container in which a seed crystal is not placed. Place the raw material, place the boron nitride solvent containing the dopant on top of the raw material, form a low temperature part by making a temperature difference in the solvent, and place the boron nitride raw material placed in the high temperature part on the temperature difference. A large cubic boron nitride single crystal of good quality with semiconductor characteristics by dissolving in an attached solvent and utilizing the difference in solubility of boron nitride due to the temperature difference to deposit and grow crystals at low temperature in the solvent. The present invention has been completed based on this finding.
すなわち、本発明は、高温高圧下で密封され、種結晶が
配置されることのない育成容器の下部に形成される高温
部に、窒化ほう素原料を配置するとともに、ドープ剤含
有の窒化ほう素溶媒をその原料の上に配置し、溶媒中に
温度差を付けて低温部を形成し、高温部に置いた窒化ほ
う素原料を温度差の付いた溶媒中に溶かし、温度差によ
る窒化ほう素の溶解度差を利用して、溶媒中の低温部に
結晶を析出成長させることを特徴とする半導体窒化ほう
素単結晶の育成法をその要旨とするものである。That is, the present invention, the boron nitride raw material is placed in a high temperature part which is sealed under high temperature and high pressure and is formed in the lower part of the growth container in which the seed crystal is not placed, and the boron nitride containing the dopant is contained. The solvent is placed on the raw material, a low temperature portion is formed by making a temperature difference in the solvent, and the boron nitride raw material placed at the high temperature portion is dissolved in the solvent having a temperature difference, and the boron nitride is caused by the temperature difference. The gist is a method for growing a semiconductor boron nitride single crystal, which is characterized in that a crystal is deposited and grown at a low temperature portion in a solvent by utilizing the difference in solubility of.
本発明に用いる育成容器は高温高圧下で密封できる構造
のもので、その内部には溶媒と窒化ほう素間を分離し、
窒化ほう素の溶媒への溶解速度を制御するため、穴開き
仕切り板を設けることが好ましい。しかし、下記に示す
ように必ずしも必要としない場合もある。該育成容器の
材質は高い融点を有し、BN溶媒と反応しない金属例えば
モリブデン,タンタルが用いられる。The growth container used in the present invention has a structure that can be sealed under high temperature and high pressure, in which the solvent and boron nitride are separated,
A perforated partition plate is preferably provided in order to control the dissolution rate of boron nitride in the solvent. However, as shown below, it is not always necessary. As the material of the growth container, a metal having a high melting point and not reacting with the BN solvent, such as molybdenum or tantalum, is used.
この育成容器の例を第1図に示す。育成容器は密封性を
確保するため、入れ子にした例えばモリブデン製の内外
円筒2,3と上蓋1で構成され、内部に仕切り板4が設け
られる。上蓋1は溶融した溶媒6が内外円筒2,3巻の壁
面を伝わって容器外に流出するのを防ぐ役目をする。下
底と仕切り板4の間にBN原料5が、仕切り板4と上底と
の間にドープ剤含有BN溶媒6が充填される。つまり、育
成容器の下部にBN原料5が配置され、その上にBN溶媒6
が配置される。仕切り板4の中央部に開孔が設けられ、
開孔径rを適当に変化させることにより、BN原料5の溶
解速度を制御する。この場合開孔径rが増大して容器内
径と一致することも有り得る。この場合は仕切り板は不
用となる。An example of this growth container is shown in FIG. The growth container is composed of inner and outer cylinders 2 and 3 made of, for example, molybdenum and an upper lid 1 in order to ensure hermeticity, and a partition plate 4 is provided inside. The upper lid 1 serves to prevent the molten solvent 6 from flowing out of the container along the wall surfaces of the inner and outer cylinders 2 and 3. The BN raw material 5 is filled between the lower bottom and the partition plate 4, and the dopant-containing BN solvent 6 is filled between the partition plate 4 and the upper bottom. That is, the BN raw material 5 is placed in the lower part of the growth container, and the BN solvent 6 is placed thereon.
Are placed. An opening is provided in the center of the partition plate 4,
By appropriately changing the opening diameter r, the dissolution rate of the BN raw material 5 is controlled. In this case, the opening diameter r may increase and may coincide with the inner diameter of the container. In this case, the partition plate is unnecessary.
第2図は育成容器8を高温高圧発生装置反応室内の黒鉛
ヒーター9内の圧力媒体10内に装填した状態を示す。FIG. 2 shows a state in which the growth container 8 is loaded in the pressure medium 10 in the graphite heater 9 in the reaction chamber of the high temperature and high pressure generator.
育成容器中心位置a−a′をヒーター中心b−b′より
上方へずらす度合で、育成容器内の温度差を制御する。
即ち、ヒーター内の温度はb−b′が最も高く、a−
a′との差をhとすると、hが大きい程温度差即ち溶媒
中のBNの濃度差が大きくなり、成長速度が増大する。The temperature difference in the growth container is controlled by the degree to which the center position a-a 'of the growth container is displaced upward from the center b-b' of the heater.
That is, the temperature in the heater is highest at b-b 'and a-
Assuming that the difference from a ′ is h, the greater the h, the greater the temperature difference, that is, the difference in the concentration of BN in the solvent, and the growth rate increases.
このようにして、育成容器8の下部に高温部を形成す
る。BN原料5は、この高温部に配置されることとなる。
また、この第2図から明らかなように、ドープ剤含有BN
溶媒6中には温度差が形成され、ヒーター中心b−b′
から離れた育成容器8の上部に配置されるBN溶媒6中に
低温部が形成される。このBN溶媒6中の低温部で半導体
立方晶窒化ほう素単結晶の育成が行われる。良質の単結
晶を得るためには、このように、低温部を高温部の上方
に配置させることが欠かせない。In this way, the high temperature part is formed in the lower part of the growth container 8. The BN raw material 5 will be arranged in this high temperature part.
Also, as is clear from FIG. 2, the BN containing the doping agent
A temperature difference is formed in the solvent 6, and the center of the heater b-b '
A low temperature part is formed in the BN solvent 6 placed on the upper part of the growth container 8 away from the. A semiconductor cubic boron nitride single crystal is grown at a low temperature in the BN solvent 6. In order to obtain a good quality single crystal, it is essential to arrange the low temperature portion above the high temperature portion in this manner.
育成容器8内の溶媒の充填量は、温度、温度差、容器内
容積などの条件にも依るが、内容積の2/3程度が好まし
い。余り多すぎると、温度差がつき過ぎ、溶媒は低温部
で急冷回収後見掛けが透明状のものになり、そこでは結
晶の育成が困難となる。従って、BN原料の充填量は残り
の1/3となる。The filling amount of the solvent in the growth container 8 depends on conditions such as temperature, temperature difference, and internal volume of the container, but is preferably about 2/3 of the internal volume. If the amount is too large, the temperature difference becomes too large, and the solvent becomes transparent in appearance after being rapidly cooled and recovered in the low temperature part, and it becomes difficult to grow crystals there. Therefore, the filling amount of BN raw material becomes the remaining 1/3.
BN原料は、BNの化学組成を有し、溶媒に溶けて窒化ほう
素を供給するものであればよく、例えば立方晶窒化ほう
素または六方晶窒化ほう素の粉末,粒子もしくは焼結体
があげられる。ただ、溶解速度は焼結体よりは粉末の方
が、また立方晶窒化ほう素より六方晶窒化ほう素の方が
大きい。溶媒により最適の原料を選べばよい。The BN raw material has only to have a chemical composition of BN and to be dissolved in a solvent to supply boron nitride, for example, cubic boron nitride or hexagonal boron nitride powder, particles or a sintered body. To be However, the dissolution rate of the powder is higher than that of the sintered body, and that of hexagonal boron nitride is higher than that of cubic boron nitride. The optimum raw material may be selected depending on the solvent.
溶媒は窒化ほう素と共融関係にあるアルカリ金属,アル
カリ土類金属またはこれらの窒化物,ほう窒化物が使用
される。この内、リチウム,マグネシウム,カルシウム
のほう窒化物例えばLiCaBN2,Ca3B2N4,Mg3B2N4等の化合
物は特に効果的である。As the solvent, an alkali metal, an alkaline earth metal, or a nitride or boronitride having a eutectic relationship with boron nitride is used. Of these, boron nitrides of lithium, magnesium and calcium, for example, compounds such as LiCaBN 2 , Ca 3 B 2 N 4 and Mg 3 B 2 N 4 are particularly effective.
ドープ剤としては、p型立方晶窒化ほう素半導体を析出
成長させる場合にはベリリウムを、またn型立方晶窒化
ほう素半導体を析出成長させる場合にはシリコンが使用
される。しかし、これに限定されないが、半導体特性を
与える炭素,硫黄は金属の育成容器と反応し、炭化物,
硫化物を作り易いので好ましくない。As the doping agent, beryllium is used when depositing and growing a p-type cubic boron nitride semiconductor, and silicon is used when depositing and growing an n-type cubic boron nitride semiconductor. However, although not limited thereto, carbon and sulfur, which give semiconductor characteristics, react with a metal growth container to form a carbide,
It is not preferable because it easily forms sulfides.
ベリリウム,シリコンは高温下では溶けて溶媒と混ずる
ので、その形態,容器中への入れ場所,入れ方はどうで
もよい。ベリリウムの量は1重量%程度,シリコンの量
は5重量%程度を標準とする。Beryllium and silicon melt at high temperatures and mix with the solvent, so its form, place in the container, and method of putting them do not matter. As a standard, the amount of beryllium is about 1% by weight and the amount of silicon is about 5% by weight.
なお、育成容器には窒化ほう素の種結晶は配置されるこ
とはない。No seed crystal of boron nitride is placed in the growth container.
このような窒化ほう素原料およびドープ剤含有窒化ほう
素溶媒が充填された育成容器を、高温高圧を発生する装
置に入れて、例えば4〜7GPaの高圧力、1300〜2400℃の
高温度の条件に保持して単結晶育成を行う。圧力と温度
の範囲は原則として、立方晶窒化ほう素の安定領域で、
かつ窒化ほう素溶媒との共融点以上であれば良い。余り
温度が低いと回収後の溶媒は低温部で透明状となり、そ
こでは結晶の育成が困難なので、好ましくは育成容器の
低温部からこの透明状溶媒が消える温度まで、更に好ま
しくはその温度よりも100℃程度高い温度がよい。育成
温度は窒化ほう素溶媒の種類や育成容器内温度差により
一概に言えないが、例えばLiCaBN2溶媒では育成容器の
高温部で約1700℃である。A growth container filled with such a boron nitride raw material and a boron nitride solvent containing a dopant is placed in a device that generates high temperature and high pressure, and, for example, high pressure of 4 to 7 GPa and high temperature of 1300 to 2400 ° C. The single crystal is grown by holding at. As a general rule, the pressure and temperature ranges are in the stable region of cubic boron nitride,
Moreover, it is sufficient if it is at least the eutectic point with the boron nitride solvent. If the temperature is too low, the solvent after recovery becomes transparent in the low temperature part, where it is difficult to grow crystals, and therefore, preferably the temperature at which the transparent solvent disappears from the low temperature part of the growth container, more preferably more than that temperature. A temperature as high as 100 ° C is good. The growth temperature cannot be generally stated depending on the type of boron nitride solvent and the temperature difference in the growth container, but for example, in the case of LiCaBN 2 solvent, it is about 1700 ° C. at the high temperature part of the growth container.
窒化ほう素溶媒中の高温側と低温側の間の温度差は、0
に近ければ結晶の成長は起こらなく、大きければ成長が
早く進行し、不良の結晶になるから、最大でも200℃以
内で押さえるべきである。具体的に最適の温度差は次の
ようにして決めることができる。第2図に示すように、
育成容器位置を変化させ、ずれhが小さいと即ち温度差
が小さいと小さな多面体結晶が、hが大きいと即ち温度
差が大きいと結晶は大きいけれど壊れやすい結晶が得ら
れるので、両者の中間を選ぶと大型良質結晶が得られ
る。一般にドープ剤量が増すにつれて、半導体結晶の析
出と成長が起こりにくくなる。この場合、ずれhを大き
くして温度差を増大させるか、あるいは仕切り板の孔径
rを大きくして溶解速度を増大させる。The temperature difference between the high temperature side and the low temperature side in the boron nitride solvent is 0.
If it is close to, crystal growth does not occur, and if it is large, the growth progresses rapidly and becomes a defective crystal. Specifically, the optimum temperature difference can be determined as follows. As shown in FIG.
By changing the position of the growth container, a small polyhedral crystal is obtained when the displacement h is small, that is, the temperature difference is small, and a large polycrystal is obtained when h is large, that is, the temperature difference is large. And large quality crystals can be obtained. Generally, as the amount of the dopant increases, precipitation and growth of semiconductor crystals become less likely to occur. In this case, the deviation h is increased to increase the temperature difference, or the hole diameter r of the partition plate is increased to increase the dissolution rate.
大きな結晶を作るには、長時間、育成容器を一定の圧
力、温度に保持しなければならない。圧力,温度に変動
があると良質の結晶は得られない。結晶はおよそ10時間
で1mmのオーダーに成長する。To make a large crystal, the growth container must be kept at a constant pressure and temperature for a long time. If there are fluctuations in pressure and temperature, good quality crystals cannot be obtained. Crystals grow to the order of 1 mm in about 10 hours.
育成容器を急冷除圧後、中身を取り出せば、育成された
半導体立方晶窒化ほう素単結晶が溶媒から容易に分離し
て得られる。If the contents of the growth container are removed after quenching and depressurizing the growth container, the grown semiconductor cubic boron nitride single crystal can be easily separated from the solvent.
発明の効果 本発明の方法によると従来技術では得られなかった1mm
以上の大きさを持つ大型で良質の半導体立方晶窒化ほう
素単結晶を作ることができ、更に密封育成容器を使うの
で、容器外の不純物について気にすることなく、育成の
環境を制御し得られる。得られる単結晶の比抵抗は、通
常、p型結晶で1〜103Ω・cm、n型結晶で103〜105Ω
・cm程度で優れたものである等の優れた効果を有する。Advantageous Effects of Invention According to the method of the present invention, 1 mm which cannot be obtained by the conventional technique.
It is possible to make a large-sized and high-quality semiconductor cubic boron nitride single crystal with the above size, and since a sealed growth container is used, the growth environment can be controlled without worrying about impurities outside the container. To be The specific resistance of the obtained single crystal is usually 1 to 10 3 Ω · cm for the p-type crystal and 10 3 to 10 5 Ω for the n-type crystal.
-Has excellent effects such as being excellent in cm.
実施例1. 325〜400メッシュの立方晶窒化ほう素粉末とLiCaBN2粉
末を第1図に示す上蓋付のモリブデン製容器(内径4mm,
内高3mm,厚さ1mm)内に詰める。この時LiCaBN2のなかに
約0.1mgシリコンの小さな粒をいれておき、仕切り板は
厚さ0.2mmのモリブデン板で、中央部の開孔径を2.0mmと
した。Example 1. A 325-400 mesh cubic boron nitride powder and a LiCaBN 2 powder are shown in FIG. 1 and are made of a molybdenum container with an upper lid (inner diameter 4 mm,
Inner height 3mm, thickness 1mm) At this time, small particles of about 0.1 mg silicon were put in LiCaBN 2 , the partition plate was a molybdenum plate having a thickness of 0.2 mm, and the opening diameter of the central portion was 2.0 mm.
この育成容器を第2図に示すヒーター中心からのずれh
が0.5mmとなるようにヒーター内に装着し、高圧高温発
生容器に入れて、5.5GPa,1800℃の下で18時間保持し
た。急冷除圧後、回収したところ、山吹色の大きさ約1.
2mmのn型立方晶窒化ほう素単結晶が4個育成された。
比抵抗は約5×103Ω・cmであった。This growth container is displaced from the center of the heater shown in FIG.
Was placed in a heater so that the value was 0.5 mm, placed in a high-pressure and high-temperature generation container, and kept at 5.5 GPa and 1800 ° C. for 18 hours. After depressurizing by quenching and collecting, the size of the yellow color is about 1.
Four 2 mm n-type cubic boron nitride single crystals were grown.
The specific resistance was about 5 × 10 3 Ω · cm.
実施例2. 325〜400メッシュの立方晶窒化ほう素粉末とLiCaBN2粉
末を実施例1と同様な育成容器に詰める。このとき溶媒
LiCaBN2の中に約0.1mgの金属ベリリウム粉末を入れてお
き、仕切り板は実施例1と同様なものを使用した。Example 2. Cubic boron nitride powder of 325 to 400 mesh and LiCaBN 2 powder are packed in the same growth container as in Example 1. At this time the solvent
About 0.1 mg of metal beryllium powder was placed in LiCaBN 2 , and the partition plate used was the same as that in Example 1.
この容器を第2図に示すヒーター中心からのずれhが1m
mになるようにヒーター内に装着し、高圧高温発生装置
に入れて5.5GPa、1700℃で24時間保持した。急冷除圧後
回収したところ、濃青色の2.0〜2.5mm大のp型立方晶窒
化ほう素単結晶が容器内上方低温部に数個育成された。
比抵抗は約10Ω・cmであった。The displacement h from the center of the heater shown in Fig. 2 for this container is 1 m.
It was mounted in a heater so that the pressure became m, put in a high-pressure and high-temperature generator, and kept at 5.5 GPa and 1700 ° C. for 24 hours. When recovered after quenching and depressurization, several dark blue p-type cubic boron nitride single crystals having a size of 2.0 to 2.5 mm were grown in the upper low temperature portion of the container.
The specific resistance was about 10 Ω · cm.
図面は本発明の方法を実施するための1例を示すもの
で、第1図は育成容器、第2図は育成容器の高圧高温容
器内の配置図を示す。 1:上蓋、2:内円筒、 3:外円筒、4:仕切り板、 5:BN原料、6:BN溶媒、 7:育成結晶、8:育成容器、 9:ヒーター、10:圧力媒体、 r:仕切り板の開孔径、 a−a′:育成容器中心線、 b−b′:ヒーター中心線。The drawings show an example for carrying out the method of the present invention. FIG. 1 shows a layout of a growing vessel, and FIG. 1: Upper lid, 2: Inner cylinder, 3: Outer cylinder, 4: Partition plate, 5: BN raw material, 6: BN solvent, 7: Growth crystal, 8: Growth container, 9: Heater, 10: Pressure medium, r: Opening diameter of partition plate, aa ': center line of growth container, bb': heater center line.
Claims (5)
ることのない育成容器の下部に形成される高温部に、窒
化ほう素原料を配置するとともに、ドープ剤含有の窒化
ほう素溶媒をその原料の上に配置し、溶媒中に温度差を
付けて低温部を形成し、高温部に置いた窒化ほう素原料
を温度差の付いた溶媒中に溶かし、温度差による窒化ほ
う素の溶解度差を利用して、溶媒中の低温部に結晶を析
出成長させることを特徴とする半導体窒化ほう素単結晶
の育成法。1. A boron nitride raw material is placed in a high temperature portion which is hermetically sealed under high temperature and high pressure and which is formed in a lower portion of a growth container in which a seed crystal is not placed, and a boron nitride solvent containing a dopant. Is placed on the raw material, a low temperature portion is formed by making a temperature difference in the solvent, and the boron nitride raw material placed at the high temperature portion is dissolved in the solvent having a temperature difference, and the boron nitride A method for growing a semiconductor boron nitride single crystal, which comprises depositing and growing a crystal in a solvent at a low temperature by utilizing a difference in solubility.
は六方晶窒化ほう素の粉末,粒子もしくは焼結体である
特許請求の範囲第1項記載の育成法。2. The growing method according to claim 1, wherein the boron nitride raw material is powder, particles or a sintered body of cubic boron nitride or hexagonal boron nitride.
リ土類金属,及びそれらの窒化物またはほう窒化物から
選ばれたものである特許請求の範囲第1項記載の育成
法。3. The growing method according to claim 1, wherein the boron nitride solvent is selected from alkali metals, alkaline earth metals, and their nitrides or boronitrides.
〜2400℃であり、溶媒中の低温部の温度を透明状の溶媒
が消える温度からその温度より100℃高い温度までの範
囲とする特許請求の範囲第1項記載の育成法。4. The pressure in the growth container is 4 to 7 GPa and the temperature is 1300.
2. The growing method according to claim 1, wherein the temperature of the low temperature portion in the solvent is in the range from a temperature at which the transparent solvent disappears to a temperature 100 ° C. higher than that temperature.
とする場合はベリリウム、n型立方晶窒化ほう素半導体
とする場合はシリコンである特許請求の範囲第1項記載
の育成法。5. The growing method according to claim 1, wherein the dopant is beryllium when the p-type cubic boron nitride semiconductor is used and silicon when the n-type cubic boron nitride semiconductor is used.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62109523A JPH0749101B2 (en) | 1987-05-01 | 1987-05-01 | Growth method of semiconductor cubic boron nitride single crystal. |
| US07/164,898 US4875967A (en) | 1987-05-01 | 1988-03-07 | Method for growing a single crystal of cubic boron nitride semiconductor and method for forming a p-n junction thereof, and light emitting element |
| US07/388,809 US4980730A (en) | 1987-05-01 | 1989-08-03 | Light emitting element of cubic boron nitride |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62109523A JPH0749101B2 (en) | 1987-05-01 | 1987-05-01 | Growth method of semiconductor cubic boron nitride single crystal. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63274447A JPS63274447A (en) | 1988-11-11 |
| JPH0749101B2 true JPH0749101B2 (en) | 1995-05-31 |
Family
ID=14512415
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62109523A Expired - Lifetime JPH0749101B2 (en) | 1987-05-01 | 1987-05-01 | Growth method of semiconductor cubic boron nitride single crystal. |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0749101B2 (en) |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5210834A (en) * | 1975-06-02 | 1977-01-27 | Nippon Packaging Kk | Surface treatment of metal |
| JPS596808A (en) * | 1982-06-30 | 1984-01-13 | 加藤 幾次郎 | Hopper in combine |
| JPS60131811A (en) * | 1983-12-16 | 1985-07-13 | Sumitomo Electric Ind Ltd | Synthesis method of boron nitride |
| DE3770889D1 (en) * | 1986-07-30 | 1991-07-25 | De Beers Ind Diamond | MANUFACTURE OF CUBIC BORNITRIDE. |
-
1987
- 1987-05-01 JP JP62109523A patent/JPH0749101B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63274447A (en) | 1988-11-11 |
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