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JPH07510B2 - Compound semiconductor crystal manufacturing equipment - Google Patents
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JPH07510B2 - Compound semiconductor crystal manufacturing equipment - Google Patents

Compound semiconductor crystal manufacturing equipment

Info

Publication number
JPH07510B2
JPH07510B2 JP23630886A JP23630886A JPH07510B2 JP H07510 B2 JPH07510 B2 JP H07510B2 JP 23630886 A JP23630886 A JP 23630886A JP 23630886 A JP23630886 A JP 23630886A JP H07510 B2 JPH07510 B2 JP H07510B2
Authority
JP
Japan
Prior art keywords
crucible
ampoule
heat sink
temperature
raw material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP23630886A
Other languages
Japanese (ja)
Other versions
JPS6395192A (en
Inventor
英志 久保田
明憲 勝井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP23630886A priority Critical patent/JPH07510B2/en
Publication of JPS6395192A publication Critical patent/JPS6395192A/en
Publication of JPH07510B2 publication Critical patent/JPH07510B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、化合物半導体の溶液成長による単結晶製造装
置に関するものである。
TECHNICAL FIELD The present invention relates to an apparatus for producing a single crystal by solution growth of a compound semiconductor.

(従来技術および発明が解決しようとする問題点) 第4図は、従来の化合物半導体の溶液成長法の一種であ
る合成溶質拡散法に用いられる単結晶育成装置の断面概
略図の一例である。図において、1は高温炉、2は低温
炉、3は石英アンプル、4はルツボ筒、5はヒートシン
クを兼ねたルツボ底板、6は種結晶、7は化合物の第2
構成元素、8は化合物の第1構成元素を溶媒とした第1
元素と第2元素との溶液、9は溶液8から晶出した化合
物半導体の単結晶、10はドライビングユニツトを示す。
この種の装置は基本的に、高温炉1および低温炉2より
成り、これらの相対的位置を調節することにより第4図
(ロ)に示すような所望の温度分布を得ている。ルツボ
は、ルツボ筒4とルツボ底板5から成り、ルツボ底板上
部に種結晶6が固定できる構造になつている。この中に
第1構成元素を入れ、アンプル3の高温部側に収納す
る。また、第2構成元素7はアンプル3の低温側の底部
に収納する。通常、第1元素は蒸発しにくい成分であ
り、第2元素は蒸発し易い成分である。アンプル3は原
料収納後、真空封止してある。この種の装置を用いて単
結晶成長を行う方法は以下の通りである。まず、アンプ
ル3内の温度を上げて、第2元素7を蒸発させルツボ内
まで輸送する。これにより第1元素と第2元素は反応し
て化合物の溶液8を調製する。さらに、ドライビングユ
ニツト10によりアンプル3を徐々に下げると、溶液8の
底部は温度Tに達し過飽和状態となる。この結果、種
結晶6上に化合物の単結晶9が晶出する。後はこの過程
が連続的に進み、溶液8全体が単結晶9になる。以上で
は溶液成長について述べたが、融液成長の場合にはT
は融点、溶液8を融液とすれば単結晶育成は全く同一の
原理によつて行われる。ただし、融液の作成は上述のよ
うに構成元素の直接反応によるか、予め合成した化合物
の多結晶を用いる。従来、このような装置構成による単
結晶育成では次のような問題点があつた。
(Problems to be Solved by Prior Art and Invention) FIG. 4 is an example of a schematic cross-sectional view of a single crystal growth apparatus used in a synthetic solute diffusion method, which is a type of conventional solution growth method for compound semiconductors. In the figure, 1 is a high temperature furnace, 2 is a low temperature furnace, 3 is a quartz ampoule, 4 is a crucible bottom plate, 5 is a crucible bottom plate also serving as a heat sink, 6 is a seed crystal, and 7 is a second compound.
Constituent element, 8 is the first using the first constituent element of the compound as a solvent
A solution of the element and the second element, 9 is a single crystal of the compound semiconductor crystallized from the solution 8, and 10 is a driving unit.
This type of apparatus basically comprises a high temperature furnace 1 and a low temperature furnace 2, and a desired temperature distribution as shown in FIG. 4B is obtained by adjusting the relative positions of these. The crucible comprises a crucible cylinder 4 and a crucible bottom plate 5, and has a structure in which a seed crystal 6 can be fixed to the upper part of the crucible bottom plate. The first constituent element is put in this and stored in the high temperature part side of the ampoule 3. The second constituent element 7 is stored in the bottom of the ampoule 3 on the low temperature side. Usually, the first element is a component that is hard to evaporate, and the second element is a component that is easy to evaporate. After storing the raw material, the ampoule 3 is vacuum-sealed. The method for growing a single crystal using this type of apparatus is as follows. First, the temperature inside the ampoule 3 is raised to evaporate the second element 7 and transport it into the crucible. Thereby, the first element and the second element react with each other to prepare the compound solution 8. When the ampoule 3 is gradually lowered by the driving unit 10, the bottom of the solution 8 reaches the temperature T G and becomes supersaturated. As a result, a single crystal 9 of the compound crystallizes on the seed crystal 6. After that, this process proceeds continuously, and the whole solution 8 becomes the single crystal 9. Although the solution growth has been described above, in the case of melt growth, T G
Is a melting point, and if the solution 8 is a melt, single crystal growth is performed according to the same principle. However, the melt is prepared by the direct reaction of the constituent elements as described above, or the polycrystal of the compound synthesized in advance is used. Conventionally, the following problems have been encountered in growing a single crystal using such an apparatus configuration.

(イ) 構成元素が反応して溶液8を調製する場合に
は、溶液8が飽和液となるまでには、かなりの時間を要
する。この間、種結晶は未飽和液と接触しているので、
その未飽和液に溶出して種付けができなくなるという問
題があつた。
(A) When the constituent elements react to prepare the solution 8, it takes a considerable time until the solution 8 becomes a saturated solution. During this time, the seed crystal is in contact with the unsaturated liquid,
There was a problem that the seeds could not be seeded by eluting into the unsaturated liquid.

(ロ) 上記の問題点を改善するため、第1構成元素の
他に化合物の多結晶を同時に加え、飽和液の調製時間を
短縮させようとする方法がある。しかし、この方法は構
成元素の直接反応から単結晶を取得するというメリツト
を失うばかりでなく、多結晶の溶解が不完全であると、
この未溶解の多結晶が新たな種結晶として働き単結晶成
長をさまたげるという問題があつた。
(B) In order to improve the above problems, there is a method in which a polycrystal of a compound is added at the same time in addition to the first constituent element to shorten the preparation time of the saturated solution. However, this method not only loses the merit of obtaining a single crystal from the direct reaction of the constituent elements, but also when the dissolution of the polycrystal is incomplete,
There is a problem that this undissolved polycrystal acts as a new seed crystal and hinders single crystal growth.

(ハ) 種結晶6はルツボ筒4と接触しているが、この
部分は結晶核が発生し易い。そのめ、結晶の双晶化ある
いは多結晶化が起こり易く単結晶成長の歩留りを低下さ
せるという問題点があつた。
(C) The seed crystal 6 is in contact with the crucible cylinder 4, but crystal nuclei are easily generated in this portion. Therefore, there has been a problem that twinning or polycrystallization of crystals is likely to occur and the yield of single crystal growth is reduced.

このため、前記のような装置構成では、良質な単結晶が
得られず、工業的にはほとんど使用し得ないのが現状で
あつた。
For this reason, in the present situation, a single crystal of high quality cannot be obtained with the above-mentioned device configuration, and it is hardly industrially usable.

(発明の目的) 本発明はこれらの欠点を除去し、良質な化合物半導体を
工業的に得ることができる化合物半導体結晶製造装置を
提供することを目的とする。
(Object of the Invention) An object of the present invention is to provide a compound semiconductor crystal manufacturing apparatus capable of eliminating these defects and industrially obtaining a good quality compound semiconductor.

(問題点を解決するための手段) 上記の目的を達成するため、本発明はアンプルと、該ア
ンプル内に該アンプルとの間に間隙を有して配置される
ルツボと、該ルツボの開口側から挿入され、該ルツボと
の間に間隙を有して配置されるパイプ隔壁と、該パイプ
隔壁の中に配置される種結晶の上部を固定する固定治具
と、該種結晶の上部に配置され、熱を上部に逃がすため
のヒートシンクと、該ルツボ以外の原料収納部と、該ア
ンプルの外側周囲に配置され、該アンプルの管方向に温
度分布を生じせしめ、該原料収納部はこれに収納される
原料が蒸発するに足りる温度に、該ルツボ部はこれに収
納される原料が溶融するに足りる温度で、かつ、該ルツ
ボの下方から該ヒートシンク及び該ヒートシンクの上方
に向かつて次第に低温となるような温度に保持する炉
と、該アンプルの上下移動機構とを有することを特徴と
する化合物半導体結晶製造装置を発明の要旨とするもの
である。
(Means for Solving the Problems) In order to achieve the above object, the present invention provides an ampoule, a crucible arranged in the ampoule with a gap between the ampoule, and an opening side of the crucible. And a fixing jig for fixing the upper part of the seed crystal arranged in the pipe partition, and a pipe partition inserted in the crucible with a gap therebetween. The heat sink for releasing heat to the upper part, the raw material storage part other than the crucible, and the outer circumference of the ampoule are arranged to cause a temperature distribution in the tube direction of the ampoule, and the raw material storage part is stored in this. The temperature of the crucible part is sufficient to melt the raw material to be vaporized, and the temperature of the crucible portion is gradually lowered from below the crucible to above the heat sink and above the heat sink. Like temperature SUMMARY OF THE INVENTION A gist of the invention is a compound semiconductor crystal manufacturing apparatus characterized in that it has a furnace for holding the ampoule and a vertical moving mechanism for the ampoule.

さらに本発明はアンプルと、該アンプル内に該アンプル
との間に間隙を有して配置される熱伝導率の良い材料で
つくられたルツボと、該ルツボの開口側から挿入され、
該ルツボとの間に間隙を有して配置される最下部に折り
返しを有するパイプ隔壁と、該パイプ隔壁の中に配置さ
れる種結晶の上部を固定する固定治具と、該種結晶の上
部に配置され、熱を上部に逃がすためのヒートシンク
と、該ルツボ以外の原料収納部と、該アンプルの周囲に
配置され、該アンプルの管方向に温度分布を生じせし
め、該原料収納部はこれに収納される原料が蒸発するに
足りる温度に、該ルツボ部はこれに収納される原料が溶
融するに足りる温度で、かつ、該ルツボの下方から該ヒ
ートシンク及び該ヒートシンクの上方に向かつて次第に
低温となるような温度に保持する炉と、該アンプルの上
下移動機構とを有することを特徴とする化合物半導体結
晶製造装置を発明の要旨とするものである。
Furthermore, the present invention provides an ampoule, a crucible made of a material having a good thermal conductivity, which is arranged in the ampoule with a gap between the ampoule, and the crucible is inserted from the opening side of the crucible,
A pipe partition wall having a fold back at the bottom, which is arranged with a gap between the crucible, a fixing jig for fixing the upper part of the seed crystal arranged in the pipe partition wall, and an upper part of the seed crystal. The heat sink for releasing heat to the upper part, the raw material storage portion other than the crucible, and the raw material storage portion disposed around the ampoule and causing a temperature distribution in the tube direction of the ampoule. The temperature of the raw material to be stored is sufficient to evaporate, the temperature of the crucible portion is sufficient to melt the raw material to be stored therein, and the temperature gradually decreases from below the crucible to above the heat sink and above the heat sink. The gist of the invention is a compound semiconductor crystal manufacturing apparatus characterized by having a furnace for maintaining such a temperature and a vertical moving mechanism for the ampoule.

しかして、本発明は種結晶と未飽和溶液との接触をさ
せ、さらに結晶成長開始時に、種結晶と飽和液だけが接
触している状況を作り出すために、種結晶をルツボ底で
はなく溶液上部に置く点に特徴がある。
Therefore, in the present invention, the seed crystal is brought into contact with the unsaturated solution, and further, in order to create a situation in which only the seed crystal and the saturated solution are in contact with each other at the start of crystal growth, the seed crystal is not in the crucible bottom but in the solution top. It is characterized by being placed in.

次に本発明の実施例について説明する。Next, examples of the present invention will be described.

なお実施例は一つの例示であつて、本発明の精神を逸脱
しない範囲で種々の変更あるいは改良を行ないうること
は言うまでもない。
Needless to say, the embodiment is merely an example, and various modifications and improvements can be made without departing from the spirit of the present invention.

第1図は本発明の第1の実施例で、InP単結晶育成に応
用したものである。(イ)図において、1は高温炉、2
は低温炉、3は石英アンプル、6は種結晶、9は化合物
半導体の単結晶、11はリン(P)、12はインジウムとリ
ン(P)の溶液、13は石英パイプ隔壁、14は石英ルツ
ボ、15はAlNまたはBN製のブロツクで種結晶6の固定治
具および潜熱のヒートシンクとなる。石英パイプ隔壁13
は上部でアンプル3に溶接されており、突起16によつて
固定された石英ルツボ14中のIn−P溶液12を単結晶成長
領域と溶質供給領域とに分離している。
FIG. 1 is a first embodiment of the present invention, which is applied to the growth of InP single crystal. (A) In the figure, 1 is a high temperature furnace, 2
Is a low temperature furnace, 3 is a quartz ampoule, 6 is a seed crystal, 9 is a compound semiconductor single crystal, 11 is phosphorus (P), 12 is a solution of indium and phosphorus (P), 13 is a quartz pipe partition wall, and 14 is a quartz crucible. Blocks 15 made of AlN or BN serve as a jig for fixing the seed crystal 6 and a heat sink for latent heat. Quartz pipe bulkhead 13
Is welded to the ampoule 3 at the upper part and separates the In-P solution 12 in the quartz crucible 14 fixed by the protrusion 16 into a single crystal growth region and a solute supply region.

この装置による単結晶成長は以下のように行われる。ま
ず、原料Inは石英ルツボ14の中に収納しておく。温度を
上げるとリン(P)11は蒸発して石英パイプ隔壁13と石
英ルツボ14のすきまからIn融液の中へ供給される。最初
リン(P)ガスはIn融液中を通過しアンプル上部まで拡
散するが、やがてInと反応しIn−P溶液を形成する。こ
の溶液は飽和状態に近づくにつれて体積が増加し液面が
上げる。しかし、余分な溶液はルツボ上部から溢れるの
で液面の位置はルツボ上面以上にはならない。すなわ
ち、種付けの位置が自動的に決まる。結晶化の際の潜熱
は種結晶6,ヒートシンク15を通つて放出される。したが
つて、種付けの時点では種結晶6の周辺が最も温度が低
くなる。また、種結晶6は外壁と接触していないので種
結晶上以外での結晶核生成は起こらない。このようにし
て再現性良い種付けが可能になる。成長界面は図のよう
に高温部上側の温度勾配領域に置かれているので、ドラ
イビングユニツト10によりアンプル3を上部に引上げる
ことによつて、単結晶9が連続的に成長する。
Single crystal growth by this apparatus is performed as follows. First, the raw material In is stored in the quartz crucible 14. When the temperature is raised, phosphorus (P) 11 evaporates and is supplied into the In melt from the clearance between the quartz pipe partition wall 13 and the quartz crucible 14. First, phosphorus (P) gas passes through the In melt and diffuses to the upper part of the ampoule, but eventually reacts with In to form an In-P solution. The volume of this solution increases and the liquid level rises as it approaches saturation. However, since the excess solution overflows from the upper part of the crucible, the position of the liquid surface cannot be higher than the upper surface of the crucible. That is, the seeding position is automatically determined. The latent heat during crystallization is released through the seed crystal 6 and the heat sink 15. Therefore, the temperature around the seed crystal 6 becomes the lowest at the time of seeding. Further, since the seed crystal 6 is not in contact with the outer wall, crystal nucleation does not occur except on the seed crystal. In this way, reproducible seeding is possible. Since the growth interface is located in the temperature gradient region on the upper side of the high temperature portion as shown in the figure, the single crystal 9 is continuously grown by pulling the ampoule 3 upward by the driving unit 10.

次に実施例を詳細に述べる。用いた種結晶は4mm角で方
位は<111>である。これをAlNブロツク15にAlNピンに
よつて固定した。アンプル3にはリン(P)11約50g,In
100−200gを入れた石英ルツボ14,石英パイプ隔壁13,種
結晶6を固定したAlNブロツク15の順に入れた。続いて
真空装置に接続し2×10-6Torrの真空に引き、石英パイ
プ隔壁13上部をアンプル3に融着し、さらにアンプルを
真空封止した。温度の設定条件は種結晶と溶液との接触
面を1000℃とし、その前後の温度勾配を10〜30℃/cmと
した。また、アンプル底の温度はリン蒸気圧が約2気圧
となる430℃とした。アンプルは炉に装填後、4rpmで回
転しながら温度を上げた。さらに所定の温度に達した後
はIn−Pの飽和溶液を作るために約20時間、その状態に
保持した。その後、2〜8mm/日の速さでアンプルを引上
げた。この結果、約5cmの長さの単結晶が得られた。
Next, examples will be described in detail. The seed crystal used is 4 mm square and the orientation is <111>. This was fixed to the AlN block 15 with an AlN pin. Ampoule 3 has phosphorus (P) 11 about 50g, In
A quartz crucible 14 containing 100 to 200 g, a quartz pipe partition wall 13, and an AlN block 15 having the seed crystal 6 fixed thereon were placed in this order. Then, it was connected to a vacuum apparatus and a vacuum of 2 × 10 −6 Torr was drawn, the upper part of the quartz pipe partition wall 13 was fused to the ampoule 3, and the ampoule was vacuum sealed. The temperature was set so that the contact surface between the seed crystal and the solution was 1000 ° C, and the temperature gradient before and after that was 10 to 30 ° C / cm. The temperature of the bottom of the ampoule was 430 ° C at which the phosphorus vapor pressure was about 2 atm. After loading the ampoule in the furnace, the temperature was raised while rotating at 4 rpm. After reaching the predetermined temperature, the temperature was maintained for about 20 hours in order to prepare a saturated solution of In-P. After that, the ampoule was pulled up at a speed of 2 to 8 mm / day. As a result, a single crystal with a length of about 5 cm was obtained.

第2図は本発明の第2の実施例でInP単結晶育成に応用
したものである。(イ)図において、1は高温炉、2は
低温炉、6は種結晶、9は単結晶、11はリン、12はイン
ジウムとリンの溶液、14は石英ルツボ、15はヒートシン
ク、16は石英製の隔壁パイプとヒートシンク15の固定台
を兼ねた治具である。ヒートシンク15は17の突起によつ
て固定されている。18はリン(P)11を収納する石英容
器である。(ロ)図は温度分布を示す。
FIG. 2 is a second embodiment of the present invention applied to the growth of an InP single crystal. (A) In the figure, 1 is a high temperature furnace, 2 is a low temperature furnace, 6 is a seed crystal, 9 is a single crystal, 11 is phosphorus, 12 is a solution of indium and phosphorus, 14 is a quartz crucible, 15 is a heat sink, and 16 is quartz. This is a jig that also serves as a partition pipe made of metal and a fixing base for the heat sink 15. The heat sink 15 is fixed by the protrusions of 17. Reference numeral 18 is a quartz container for containing phosphorus (P) 11. (B) The figure shows the temperature distribution.

この実施例では低温炉2を高温炉1の上に置いた。これ
によりヒートシンク15に長尺のものが使用できるため、
結晶化の際の潜熱を効率良く放出させることができた。
これにより、さらに再現性の良い種付けが可能になつ
た。
In this example, the low temperature furnace 2 was placed on the high temperature furnace 1. This allows you to use a long heat sink 15,
The latent heat during crystallization could be released efficiently.
This enabled seeding with even better reproducibility.

第3図は本発明の第3の実施例で、InP単結晶育成に応
用したものである。ここでは、さらに長尺の単結晶を得
ることをねらいといている。(イ)図において、1は高
温炉、2は低温炉、6は種結晶、9は単結晶、10はドラ
イビングユニツト、11はリン、12はリンとインジウムの
溶液、15はヒートシンク、17は突起、18は石英容器、19
は石英製の隔壁パイプとヒートシンク15の固定台を兼ね
た治具で折返し19aがある。ヒートシンク15は17の突起
によつて固定されている。20は熱伝導率の良いBNまたは
AlN製のルツボである。18はリン(P)11を収納する石
英容器である。長尺の結晶を得るためには、ルツボ20と
石英治具19によつて囲まれたリン(P)供給のためのIn
−P溶液層21の温度の低下を防ぐことが必要である。こ
の溶液層の温度が急激に低下するとリン(P)のIn溶液
への溶解度が著しく減少し、結晶の成長速度を低下さ
せ、場合によつてはIn−P溶液層21が固化し単結晶成長
の持続が困難になる。
FIG. 3 shows a third embodiment of the present invention, which is applied to InP single crystal growth. Here, the aim is to obtain a longer single crystal. (A) In the figure, 1 is a high temperature furnace, 2 is a low temperature furnace, 6 is a seed crystal, 9 is a single crystal, 10 is a driving unit, 11 is phosphorus, 12 is a solution of phosphorus and indium, 15 is a heat sink, and 17 is a protrusion. , 18 is a quartz container, 19
Is a jig that doubles as a partition pipe made of quartz and a fixing base for the heat sink 15, and has a turnback 19a. The heat sink 15 is fixed by the protrusions of 17. 20 is BN with good thermal conductivity or
It is a crucible made of AlN. Reference numeral 18 is a quartz container for containing phosphorus (P) 11. In order to obtain a long crystal, In for supplying phosphorus (P) surrounded by the crucible 20 and the quartz jig 19 is used.
It is necessary to prevent the temperature of the -P solution layer 21 from decreasing. When the temperature of the solution layer is drastically lowered, the solubility of phosphorus (P) in the In solution is remarkably reduced, and the growth rate of the crystal is lowered. In some cases, the In-P solution layer 21 is solidified to grow a single crystal. Becomes difficult to maintain.

この実施例では次の3つの方法を併用することによつ
て、この問題を解決することができた。
In this embodiment, this problem could be solved by using the following three methods together.

(イ) 長尺のヒートシンクを使用すること、 (ロ) 石英治具19とルツボ20との間に空隙部分22を設
けて、溶液層のルツボの外側と内側を熱的に完全に分離
した、 (ハ) 熱伝導率の良いBN(またはAlN)ルツボを用い
た。これにより、ルツボ上部での溶液層21の温度の低下
を防いだ。
(A) Use of a long heat sink, (b) A void 22 is provided between the quartz jig 19 and the crucible 20, and the outside and inside of the crucible of the solution layer are completely thermally separated. (C) A BN (or AlN) crucible with good thermal conductivity was used. This prevented a decrease in the temperature of the solution layer 21 above the crucible.

(イ),(ロ),(ハ)の方法の併用により、(ロ)図
の温度分布に示すように、ルツボ中心部(実線)と溶液
層21(破線)とで十分な温度差をつけることができた。
この結果、長時間にわたる結晶育成においても溶液層21
を高温に維持しつつ、潜熱を速みやかに放出することが
でき、10cm以上の長尺のInP単結晶を再現良く得ること
ができた。
By combining the methods of (a), (b), and (c), a sufficient temperature difference is created between the center of the crucible (solid line) and the solution layer 21 (broken line), as shown in the temperature distribution in (b). I was able to.
As a result, even in the crystal growth for a long time, the solution layer 21
It was possible to quickly release latent heat while maintaining a high temperature, and to obtain a long InP single crystal of 10 cm or more with good reproducibility.

(発明の効果) 以上説明したように、本発明によれば化合物半導体の構
成元素から直接に単結晶を成長させることができるの
で、再現性の良い高純度単結晶育成が可能である。
(Effects of the Invention) As described above, according to the present invention, a single crystal can be grown directly from the constituent elements of the compound semiconductor, so that highly pure single crystal can be grown with good reproducibility.

また、結晶固化の際に、ルツボ壁等の応力を受けないの
で低転位密度の結晶を得ることができる利点がある。な
お本発明はInP,GaP,GaAsなどの化合物半導体単結晶育成
に最も適している。
Further, there is an advantage that a crystal with a low dislocation density can be obtained because the stress of the crucible wall or the like is not applied during the solidification of the crystal. The present invention is most suitable for growing a compound semiconductor single crystal such as InP, GaP, and GaAs.

【図面の簡単な説明】[Brief description of drawings]

第1図(イ),(ロ)は夫々本発明の化合物半導体単結
晶の溶液成長法に用いられている装置の一実施例の断面
概略図および温度分布、第2図(イ),(ロ)及び第3
図(イ),(ロ)は夫々本発明の他の実施例の装置の断
面概略図および温度分布、第4図は従来の装置の断面概
略図および温度分布を示す。 1……高温炉 2……低温炉 3……石英アンプル 4……ルツボ筒 5……ヒートシンク 6……種結晶 7……化合物の第2構成元素 8……化合物の第1元素を溶媒とした第1元素と第2元
素との溶液 9……化合物半導体の単結晶 10……ドライビングユニツト 11……リン 12……インジウムとリンの溶液 13……石英パイプ隔壁 14……石英ルツボ 15……AlNまたはBN製ブロツク(ヒートシンク) 16……石英治具 17……突起 18……リン収納石英容器 19……折返し付石英治具 20……BNまたはAlN製ルツボ 21……ルツボ18と石英治具16とに囲まれた外側のIn−P
溶液層 22……空隙
1 (a) and 1 (b) are schematic cross-sectional views and temperature distributions of one embodiment of the apparatus used in the solution growth method for a compound semiconductor single crystal of the present invention, and FIGS. 2 (a) and 2 (b), respectively. ) And the third
FIGS. 4 (a) and 4 (b) respectively show a schematic sectional view and temperature distribution of the apparatus of another embodiment of the present invention, and FIG. 4 shows a schematic sectional view and temperature distribution of the conventional apparatus. 1 ... High temperature furnace 2 ... Low temperature furnace 3 ... Quartz ampoule 4 ... Crucible cylinder 5 ... Heat sink 6 ... Seed crystal 7 ... Second constituent element of compound 8 ... First element of compound as solvent Solution of 1st element and 2nd element 9 …… Compound semiconductor single crystal 10 …… Driving unit 11 …… Phosphorus 12 …… Sodium of indium and phosphorus 13 …… Quartz pipe partition 14 …… Quartz crucible 15 …… AlN Or BN block (heat sink) 16 …… Quartz jig 17 …… Protrusion 18 …… Phosphorus storage quartz container 19 …… Folded quartz jig 20 …… BN or AlN crucible 21 …… Crucible 18 and quartz jig 16 Outer In-P surrounded by and
Solution layer 22 ... void

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】アンプルと、該アンプル内に該アンプルと
の間に間隙を有して配置されるルツボと、該ルツボの開
口側から挿入され、該ルツボとの間に間隙を有して配置
されるパイプ隔壁と、該パイプ隔壁の中に配置される種
結晶の上部を固定する固定治具と、該種結晶の上部に配
置され、熱を上部に逃がすためのヒートシンクと、該ル
ツボ以外の原料収納部と、該アンプルの外側周囲に配置
され、該アンプルの管方向に温度分布を生じせしめ、該
原料収納部はこれに収納される原料が蒸発するに足りる
温度に、該ルツボ部はこれに収納される原料が溶融する
に足りる温度で、かつ、該ルツボの下方から該ヒートシ
ンク及び該ヒートシンクの上方に向かつて次第に低温と
なるような温度に保持する炉と、該アンプルの上下移動
機構とを有することを特徴とする化合物半導体結晶製造
装置。
1. An ampoule, a crucible arranged in the ampoule with a gap between the ampoule, and an crucible inserted from the opening side of the crucible and arranged with a gap between the crucible. Pipe partition wall, a fixing jig for fixing the upper part of the seed crystal arranged in the pipe partition wall, a heat sink arranged on the upper part of the seed crystal for radiating heat to the upper part, and other than the crucible. The raw material storage unit and the outer periphery of the ampoule are arranged to generate a temperature distribution in the tube direction of the ampoule. The raw material storage unit has a temperature sufficient to evaporate the raw material stored therein, and the crucible part has A furnace for maintaining a temperature at which the raw material stored in the crucible melts, and a temperature that gradually decreases from the lower side of the crucible to the heat sink and the upper side of the heat sink; and a vertical movement mechanism for the ampoule. Having A compound semiconductor crystal manufacturing apparatus according to claim.
【請求項2】アンプルと、該アンプル内に該アンプルと
の間に間隙を有して配置される熱伝導率の良い材料でつ
くられたルツボと、該ルツボの開口側から挿入され、該
ルツボとの間に間隙を有して配置される最下部に折り返
しを有するパイプ隔壁と、該パイプ隔壁の中に配置され
る種結晶の上部を固定する固定治具と、該種結晶の上部
に配置され、熱を上部に逃がすためのヒートシンクと、
該ルツボ以外の原料収納部と、該アンプルの周囲に配置
され、該アンプルの管方向に温度分布を生じせしめ、該
原料収納部はこれに収納される原料が蒸発するに足りる
温度に、該ルツボ部はこれに収納される原料が溶融する
に足りる温度で、かつ、該ルツボの下方から該ヒートシ
ンク及び該ヒートシンクの上方に向かつて次第に低温と
なるような温度に保持する炉と、該アンプルの上下移動
機構とを有することを特徴とする化合物半導体結晶製造
装置。
2. An ampoule, a crucible made of a material having a high thermal conductivity, which is disposed in the ampoule with a gap between the ampoule, and the crucible inserted from the opening side of the crucible. And a pipe partition having a fold-back at the bottom arranged with a gap between the pipe partition, a fixing jig for fixing the upper part of the seed crystal arranged in the pipe partition, and a fixing jig arranged on the upper part of the seed crystal. And a heat sink to let the heat escape to the top,
The raw material storage section other than the crucible is arranged around the ampoule and causes a temperature distribution in the tube direction of the ampoule, and the raw material storage section has a temperature sufficient to evaporate the raw material stored in the crucible. The part is a temperature that is sufficient to melt the raw materials contained in the part, and the furnace that holds the heat sink from the bottom of the crucible to the heat sink and the heat sink is gradually lowered. A compound semiconductor crystal manufacturing apparatus having a moving mechanism.
JP23630886A 1986-10-06 1986-10-06 Compound semiconductor crystal manufacturing equipment Expired - Fee Related JPH07510B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23630886A JPH07510B2 (en) 1986-10-06 1986-10-06 Compound semiconductor crystal manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23630886A JPH07510B2 (en) 1986-10-06 1986-10-06 Compound semiconductor crystal manufacturing equipment

Publications (2)

Publication Number Publication Date
JPS6395192A JPS6395192A (en) 1988-04-26
JPH07510B2 true JPH07510B2 (en) 1995-01-11

Family

ID=16998872

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23630886A Expired - Fee Related JPH07510B2 (en) 1986-10-06 1986-10-06 Compound semiconductor crystal manufacturing equipment

Country Status (1)

Country Link
JP (1) JPH07510B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0234592A (en) * 1988-07-22 1990-02-05 Furukawa Electric Co Ltd:The Growing method for compound semiconductor single crystal
CN114318495B (en) * 2021-12-22 2025-02-18 云南中科鑫圆晶体材料有限公司 A large-size VGF method germanium single crystal growth device and method

Also Published As

Publication number Publication date
JPS6395192A (en) 1988-04-26

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