JPH0754384B2 - Conductive plate - Google Patents
Conductive plateInfo
- Publication number
- JPH0754384B2 JPH0754384B2 JP1074569A JP7456989A JPH0754384B2 JP H0754384 B2 JPH0754384 B2 JP H0754384B2 JP 1074569 A JP1074569 A JP 1074569A JP 7456989 A JP7456989 A JP 7456989A JP H0754384 B2 JPH0754384 B2 JP H0754384B2
- Authority
- JP
- Japan
- Prior art keywords
- conductive path
- inspection
- path portion
- conductive
- short
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、LCD(液晶表示装置)やPDP(プラズマ表示装
置)の透明電極などの線状の導電路部を複数本並設した
状態で備えているものとして使用される導電板に関する
ものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to a state in which a plurality of linear conductive path portions such as transparent electrodes of an LCD (liquid crystal display device) or a PDP (plasma display device) are arranged in parallel. The present invention relates to a conductive plate used as an equipped one.
従来、この種の電極として使用される導電板は、ドット
マトリックスパターンが形成できるように、電極となる
線状の導電路部を複数本並設した状態で備えているもの
で、例えば第2図に示すように、導電板1は、その表面
に、複数本の導電路部2を一定間隔で並設してなる導電
パターン3を有している。そして図に示すようにセンタ
ーギャップを有するものにあっては、複数本の導電路部
が対称的に配置されており、導電路部2の外端部20が端
子となるものであった。Conventionally, a conductive plate used as an electrode of this kind is provided with a plurality of linear conductive path portions to be electrodes arranged side by side so that a dot matrix pattern can be formed. As shown in FIG. 1, the conductive plate 1 has a conductive pattern 3 formed on the surface thereof by arranging a plurality of conductive path portions 2 in parallel at regular intervals. As shown in the figure, in the case of having a center gap, a plurality of conductive path portions are symmetrically arranged, and the outer end portion 20 of the conductive path portion 2 serves as a terminal.
ところで、この導電板を各種の方法で製造した後、導電
パターンが確実に形成されているかどうかを、すなわち
それぞれの導電路部が断線していないか、また隣設した
導電路部相互がショート状態になっていないか、検査し
て不良品を除くようにしている。この導電板の断線検査
およびショート検査は、検査機器によってつぎのように
して行われている。まず断線検査は、導電路部2ぞれぞ
れの端部側に設定された位置a,b,…,1それぞれに検査装
置の検査ピンが当てられ、例えば導電路部それぞれの一
端側の位置a,b,c,g,h,iに接した検査ピンに電流を入れ
て、他端側の位置d,e,f,j,k,lに接したピンで電流値を
検査して行われる。またショート検査においては、まず
並設方向の外側に位置する導電路部に対して行われ、位
置aに接した検査ピンに電流を入れ、隣設する導電路部
に接した検査ピン、例えば位置b,gの検査ピンで電流値
を検出して、位置aの導電路部とこれに隣設された導電
路部とのショートの有無を検出する。そして電流を入れ
る箇所を順に位置b,c,g,…と変えて、導電路部相互間全
てのショートを検査するように設けられている。By the way, after manufacturing this conductive plate by various methods, it is checked whether or not the conductive pattern is surely formed, that is, whether the conductive path portions are not broken, or the adjacent conductive path portions are short-circuited with each other. We inspect for defective products to check for defects. The disconnection inspection and the short-circuit inspection of the conductive plate are performed by inspection equipment as follows. First, in the disconnection inspection, the inspection pins of the inspection device are applied to the respective positions a, b, ..., 1 set on the end side of each of the conductive path portions 2, and for example, the position on one end side of each of the conductive path portions. Apply the current to the test pin that touches a, b, c, g, h, i, and check the current value with the pin that touches the position d, e, f, j, k, l on the other end. Be seen. Further, the short-circuit inspection is first performed on the conductive path portion located outside in the juxtaposed direction, a current is applied to the test pin in contact with the position a, and the test pin in contact with the adjacent conductive path portion, for example, the position. The current value is detected by the inspection pins b and g to detect whether or not there is a short circuit between the conductive path portion at the position a and the conductive path portion adjacent to the conductive path portion. Then, the places where the current is applied are sequentially changed to the positions b, c, g, ...
しかしながら、上記ショート検査は、上述したように複
数本の導電路部それぞれに対して順に行われることか
ら、特に導電路部が多いパターンであっては検査時間が
非常に長くなり、検査工程での作業効率が低いという問
題があった。However, since the short-circuit inspection is sequentially performed on each of the plurality of conductive path portions as described above, the inspection time becomes extremely long particularly in the case of a pattern having many conductive path portions. There was a problem that work efficiency was low.
そこで断線検査およびショート検査の時間を短くし、検
査工程での作業効率を向上させることが課題とされてい
た。Therefore, it has been a subject to shorten the time of the disconnection inspection and the short inspection to improve the work efficiency in the inspection process.
本発明は、上記した課題を考慮してなされたもので、セ
ンターギャップを介して対称的に配置され、かつ、一定
間隔で並設された複数本の導電路部と、センターギャッ
プの両側の導電路部の側端部に一本置きに接続された検
査導電路部とからなる導電パターンを有してなり、前記
検査導電路部に接続された導電路部が互い違いに配設さ
れていることを特徴とする導電板を提供して、上記課題
を解消するものである。The present invention has been made in consideration of the above-mentioned problems, and a plurality of conductive path portions that are symmetrically arranged through a center gap and are arranged in parallel at a constant interval, and a conductive material on both sides of the center gap. A conductive pattern having an inspection conductive path portion connected to every other side at the side end portion of the path portion, wherein the conductive path portions connected to the inspection conductive path portion are arranged alternately. A conductive plate characterized by the above is provided to solve the above problems.
本発明においては、一本置きの導電路部が検査導電路部
と連続しており、ショート検査で検査導電路部から電流
が入る導電路部間に、この導電路部とショートしてはな
らない導電路部(検査導電路部に連続していない導電路
部)が配置するようになる。In the present invention, every other conductive path portion is continuous with the inspection conductive path portion, and the conductive path portion must not be short-circuited with the conductive path portion where a current is input from the inspection conductive path portion in the short inspection. The conductive path portion (the conductive path portion that is not continuous with the inspection conductive path portion) is arranged.
そして断線検査に際しては、検査導電路部と連続してい
ない導電路部の両端部に検査ピンを当てるとともに、前
記検査導電路部中の少なくとも一点と検査導電路部に連
続している導電路部の他端部それぞれとに検査ピンを当
てると、検査導電路部と連続していない導電路部それぞ
れでの両端部間の電流値が検出され、また検査導電路部
とこれに連続している導電路部の他端部間それぞれの電
流値が検出されるようになる。一方、ショート検査に際
しては、検査導電路部と、この検査導電路部に間接的に
も連続してはならない導電路部とに検査ピンを当てる
と、導電路部間の少なくとも一箇所でショート状態であ
る場合、ショートとして検出されるようになる。In the disconnection inspection, the inspection pin is applied to both ends of the conductive path portion which is not continuous with the inspection conductive path portion, and at least one point in the inspection conductive path portion and the conductive path portion continuous with the inspection conductive path portion. When the inspection pin is applied to each of the other end portions of, the current value between both ends of each conductive path portion which is not continuous with the inspection conductive path portion is detected, and the inspection conductive path portion is continuous with this. The current value between the other ends of the conductive paths is detected. On the other hand, at the time of short-circuit inspection, if the inspection pin is applied to the inspection conductive path portion and the conductive path portion that should not be indirectly connected to this inspection conductive path portion, at least one place between the conductive path portions is short-circuited. If it is, it will be detected as a short circuit.
つぎに、本発明を第1図に示す一実施例に基づいて詳細
に説明する。なお、第2図に示す従来例と構成が重複す
る部分は同符号を付してその説明を省略する。Next, the present invention will be described in detail based on an embodiment shown in FIG. The parts having the same configurations as those of the conventional example shown in FIG.
導電板1は、センターギャップの導電パターン3を有す
るもので、この導電パターン3は、一定間隔で複数本の
導電路部2a,2bを2列に並設するとともに、導電板1の
周縁に沿うようにして検査導電路部4を設け、一本置き
の導電路部2aの外端部20側を前記検査導電路部4に連続
させ、センターギャップを介して対向する導電路部は一
方が前記検査導電路部4に連続する構成を有している。The conductive plate 1 has a conductive pattern 3 having a center gap. The conductive pattern 3 has a plurality of conductive path portions 2a and 2b arranged in two rows at regular intervals and extends along the periphery of the conductive plate 1. Thus, the inspection conductive path portion 4 is provided, the outer end portion 20 side of every other conductive path portion 2a is connected to the inspection conductive path portion 4, and one of the conductive path portions facing each other through the center gap is It has a structure continuous with the inspection conductive path portion 4.
この導電板1の導電パターン3を検査するにあたって
は、検査導電路部4の端部41の位置a、前記検査導電路
部4に連続する導電路部2aの他端部21の位置e,g,i,l,n,
p、前記導電路部2aには接続してはならない導電路部2b
の両端部の位置b,c,d,f,h,j,k,m,o,q,r,sそれぞれに検
査ピンが当てられ、断線検査およびショート検査が行わ
れる。When inspecting the conductive pattern 3 of the conductive plate 1, the position a of the end portion 41 of the inspection conductive path portion 4 and the positions e and g of the other end portion 21 of the conductive path portion 2a continuous with the inspection conductive path portion 4 are examined. , i, l, n,
p, the conductive path portion 2b which should not be connected to the conductive path portion 2a
Inspection pins are applied to the positions b, c, d, f, h, j, k, m, o, q, r, s of both ends of the wire, and a disconnection inspection and a short inspection are performed.
断線検査は、例えば位置a,b,c,d,k,m,oの検査ピンに電
流を入れ、位置e,f,g,h,i,j,l,n,p,q,r,sの検査ピンで
電流値を検出するようにすればよい。For the disconnection inspection, for example, current is applied to the inspection pins at the positions a, b, c, d, k, m, o, and the positions e, f, g, h, i, j, l, n, p, q, r, The current value should be detected by the inspection pin of s.
またショート検査は、検査導電路部4側から入れた電流
が導電路部2bに流れないとき、導電路部2aと導電路部2b
とが接触していないことを示し、逆に導電路部2bに流れ
ると、それはいずれかの箇所で導電路部2aと導電路部2b
とが接触していることを示しており、検査導電路部4の
位置aに電流を入れ、例えば導電路部2bの位置f,h,j,k,
m,oで検出されるかどうかを検査すればよく、容易に判
定がなされるようになる。In addition, the short-circuit inspection is conducted when the current input from the inspection conductive path portion 4 side does not flow to the conductive path portion 2b.
Indicates that they are not in contact with each other, and conversely, when they flow to the conductive path portion 2b, it is possible that the conductive path portion 2a and the conductive path portion 2b are not connected at any place.
Indicates that they are in contact with each other, and an electric current is applied to the position a of the inspection conductive path portion 4, for example, the positions f, h, j, k, of the conductive path portion 2b.
It suffices to check whether or not it is detected by m and o, and the judgment can be made easily.
なお、上記導電板はA−A線に沿って導電路部の外端部
を、パネル組付け時などにおいて断裁すればよい。The conductive plate may be formed by cutting the outer end portion of the conductive path portion along the line AA when the panel is assembled.
以上説明したように、本発明によれば、導電板は、セン
ターギャップを介して対称的に配置され、かつ、一定間
隔で並設された複数本の導電路部と、センターギャップ
の両側の導電路部の側端部に一本置きに接続された検査
導電路部とからなる導電パターンとを有してなり、前記
検査導電路部に接続された導電路部が互い違いに配設さ
れているので、断線検査やショート検査のときに立てる
検査ピンの数を従来の3/4に減少させることができると
ともに、前記ショート検査において、検査導電路部側か
ら入れた電流がこの検査導電路部に連続していない導電
路部で出力されるかどうかを調べるようにすることによ
って、ショート検査が一度に行え、検査工程の短縮化が
図れるようになるなど、実用性にすぐれた効果を奏する
ものである。As described above, according to the present invention, the conductive plate is arranged symmetrically across the center gap and has a plurality of conductive path portions arranged in parallel at a constant interval, and the conductive plates on both sides of the center gap. And a conductive pattern including an inspection conductive path portion connected to every other side of the path portion, and the conductive path portions connected to the inspection conductive path portion are arranged alternately. Therefore, it is possible to reduce the number of inspection pins to be set up at the time of disconnection inspection and short circuit inspection to 3/4 of the conventional one, and in the short circuit inspection, the current input from the inspection conductive path side is applied to this inspection conductive path part. By checking whether or not the current is output in the non-continuous conductive path part, short-circuit inspection can be performed at one time, and the inspection process can be shortened. is there.
第1図は本発明に係る導電板の一実施例を示す説明図、
第2図は従来例を示す説明図である。 1……導電板 2a,2b……導電路部 3……導電パターン 4……検査導電路部FIG. 1 is an explanatory view showing an embodiment of a conductive plate according to the present invention,
FIG. 2 is an explanatory view showing a conventional example. 1 ... Conductive plate 2a, 2b ... Conductive path part 3 ... Conductive pattern 4 ... Inspection conductive path part
Claims (1)
れ、かつ、一定間隔で並設された複数本の導電路部と、
センターギャップの両側の導電路部の側端部に一本置き
に接続された検査導電路部とからなる導電パターンを有
してなり、前記検査導電路部に接続された導電路部が互
い違いに配設されていることを特徴とする導電板。1. A plurality of conductive path portions which are symmetrically arranged via a center gap and are arranged in parallel at regular intervals,
It has a conductive pattern consisting of an inspection conductive path portion connected to every other side end portion of the conductive path portion on both sides of the center gap, and the conductive path portions connected to the inspection conductive path portion are staggered. A conductive plate that is provided.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1074569A JPH0754384B2 (en) | 1989-03-27 | 1989-03-27 | Conductive plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1074569A JPH0754384B2 (en) | 1989-03-27 | 1989-03-27 | Conductive plate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02251991A JPH02251991A (en) | 1990-10-09 |
| JPH0754384B2 true JPH0754384B2 (en) | 1995-06-07 |
Family
ID=13550971
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1074569A Expired - Lifetime JPH0754384B2 (en) | 1989-03-27 | 1989-03-27 | Conductive plate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0754384B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109669094A (en) * | 2018-12-19 | 2019-04-23 | 上海帆声图像科技有限公司 | The detection device and method of signal wire in a kind of display screen |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6057747B2 (en) * | 1977-12-08 | 1985-12-17 | セイコーエプソン株式会社 | liquid crystal display device |
| JPS60169828A (en) * | 1984-02-15 | 1985-09-03 | Hitachi Ltd | Electrode substrate for liquid crystal display elements |
| JPS62143025A (en) * | 1985-12-17 | 1987-06-26 | Casio Comput Co Ltd | Method for manufacturing electrode substrate for two-division multiple matrix type liquid crystal display element |
| JPS634589U (en) * | 1986-06-25 | 1988-01-13 | ||
| JPH01142594A (en) * | 1987-11-27 | 1989-06-05 | Matsushita Electric Ind Co Ltd | Manufacturing method of matrix type image display device |
-
1989
- 1989-03-27 JP JP1074569A patent/JPH0754384B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02251991A (en) | 1990-10-09 |
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