JPH0756901B2 - High pressure gas laser device - Google Patents
High pressure gas laser deviceInfo
- Publication number
- JPH0756901B2 JPH0756901B2 JP2134804A JP13480490A JPH0756901B2 JP H0756901 B2 JPH0756901 B2 JP H0756901B2 JP 2134804 A JP2134804 A JP 2134804A JP 13480490 A JP13480490 A JP 13480490A JP H0756901 B2 JPH0756901 B2 JP H0756901B2
- Authority
- JP
- Japan
- Prior art keywords
- laser
- container
- gas
- discharge
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Lasers (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、高気圧ガスレーザ装置に係り、特に、レーザ
媒質に希ガス、ハロゲン系ガスが使用されるのに好適な
エキシマレーザ装置に関する。TECHNICAL FIELD The present invention relates to a high pressure gas laser device, and more particularly to an excimer laser device suitable for using a rare gas or a halogen-based gas as a laser medium.
一般にハロゲン系ガスを使用する高気圧ガスレーザ装置
は、レーザ発振時間の経過とともに、レーザ出力が徐々
に低下することが知られている。レーザ出力低下の主要
因はレーザ媒質であるHClやF2などのハロゲン系ガスが
活性であることから、放電電極はガス容器などのレーザ
構成材料と反応し、消耗減少するものと考えられてい
る。これらのガス劣化に伴うレーザ出力の低下の対策と
して、従来、電源系で出力を補償する方法が知られてい
る。例えば、初期状態を、充電電圧を低い所に設定し、
ガス劣化に伴う出力低下を充電電圧の上昇で補償してい
る。さらに、レーザ出力低下をハロゲン濃度低下とみな
し、ハロゲンの注入制御を行い、レーザ出力が回復する
まで供給が行われる方法がとられている。一例として、
エス・ピー・アイ・イー オーイー/レーズ'89(SPIE
O−E/LASE'89,1989年)で発表された例がある。It is generally known that in a high-pressure gas laser device that uses a halogen-based gas, the laser output gradually decreases as the laser oscillation time elapses. It is considered that the main cause of the decrease in laser output is that the halogen-based gas such as HCl or F 2 that is the laser medium is active, and therefore the discharge electrode reacts with the laser constituent materials such as the gas container and wears out. . As a measure against the decrease in laser output due to these gas deteriorations, conventionally, a method of compensating the output with a power supply system is known. For example, set the initial state to a low charging voltage,
The decrease in output due to gas deterioration is compensated by the increase in charging voltage. Further, a method is adopted in which a decrease in laser output is regarded as a decrease in halogen concentration, halogen injection control is performed, and supply is performed until the laser output is recovered. As an example,
SP I OE / Raise '89 (SPIE
OE / LASE'89, 1989).
上記従来技術は、レーザ出力の変化はハロゲン濃度の減
少や電源電圧の変動、レーザ取出し窓の汚損などにより
影響を受ける。このため、ハロゲン濃度の変化とは直接
対応していないので、ハロゲンの注入を行うとハロゲン
濃度が過剰になる。ハロゲンガスの過剰注入は放電はま
すます不安定な方向へ進展する場合があり、制御系が発
散するという問題があった。In the above-mentioned prior art, the change in laser output is affected by a decrease in halogen concentration, a change in power supply voltage, and contamination of the laser extraction window. For this reason, since it does not directly correspond to the change in the halogen concentration, the halogen concentration becomes excessive when the halogen is injected. Excessive injection of halogen gas may cause the discharge to proceed in an increasingly unstable direction, which causes a problem that the control system diverges.
本発明の目的は、制御系自体の安定な運転を可能とする
制御量を検知してレーザ出力を安定的に維持できる高気
圧ガスレーザ装置を提供することである。An object of the present invention is to provide a high pressure gas laser device capable of detecting a control amount that enables stable operation of the control system itself and stably maintaining a laser output.
上記目的を達成するために、ハロゲン系ガスを含む高気
圧レーザガスを充填したレーザ容器を備えた高気圧ガス
レーザ装置において、前記レーザ容器と別体に設けられ
前記レーザ容器と連通された第2の容器を設置しこの容
器内の放電電極間に電圧を印加し、この時の放電電圧、
電流のレベル変化またはパターンを測定し、この結果か
らガス状態を判断して、ガス状態に対応するハロゲン濃
度を検知して、制御系の安定を図ることができる高気圧
ガスレーザ装置である。To achieve the above object, in a high-pressure gas laser device including a laser container filled with a high-pressure laser gas containing a halogen-based gas, a second container provided separately from the laser container and communicating with the laser container is installed. A voltage is applied between the discharge electrodes in the container, the discharge voltage at this time,
A high-pressure gas laser device capable of stabilizing a control system by measuring a level change or a pattern of a current, determining a gas state from the result, and detecting a halogen concentration corresponding to the gas state.
ハロゲンガスを含むレーザガス中の放電部は、一種のイ
ンピーダンスとしてとらえることができるので、第2の
容器内の放電電圧あるいは電流はインピーダンスが大き
いか小さいかによりそのレベルは異なってくる。インピ
ーダンスが小さいときはハロゲンは高濃度であり、電圧
波形の振動レベルは小さくなる。したがって、第2容器
内の放電電極間の放電電圧と電流のレベル変化、あるい
は、パターンとガス状態とが対応する量とを予め調べて
おくことにより、電圧、電流のレベル変化の測定あるい
はパターンとの比較からガス状態や放電形態が安定かな
どの判断ができる。それによって、制御系の発散やハロ
ゲンの注入量を適切に制御できる。Since the discharge part in the laser gas containing the halogen gas can be regarded as a kind of impedance, the level of the discharge voltage or current in the second container varies depending on whether the impedance is large or small. When the impedance is low, the halogen concentration is high and the vibration level of the voltage waveform is low. Therefore, by measuring in advance the change in the level of the discharge voltage and the current between the discharge electrodes in the second container, or the amount corresponding to the pattern and the gas state, the measurement or the pattern of the change in the level of the voltage and the current is obtained. It is possible to judge whether the gas state or the discharge form is stable, etc. Thereby, the divergence of the control system and the injection amount of halogen can be appropriately controlled.
以下、本発明の一実施例を第1図乃至第3図を用いて説
明する。An embodiment of the present invention will be described below with reference to FIGS. 1 to 3.
第1図において、レーザ容器1内には図示しない一対の
主放電電極が配置され、レーザ媒質となるハロゲン系ガ
スを含む混合レーザガス、例えばXeCl,KrFガスおよびH
e,Neが充填されて形成されている。前記レーザ容器1の
一端に配管2a、第2の容器3、循環ポンプ4、配管2bが
接続されてレーザ容器1の他端へ戻り閉回路となり、ガ
スは連通状態となっている。第2の容器3内には、一対
の放電電極5が絶縁されて設置されている。この放電電
極5の両端には電源装置6が接続されている。なお、第
2の容器3には図示しない観測窓が前記放電電極5間を
観測できる位置に取り付けられている。放電電極5の一
端はコンデンサ(C)8の一端と高抵抗(R)7の一端
に接続され高抵抗7の他端は図示しないスイッチを介し
て直流電源10の一端に接続されている。一方、放電電極
5の他端はコンデンサ8の一端と直流電源10の一端に接
続され、その間に変流器9が接続されている。その接続
点は接地点となり、電源装置10の回路を構成している。In FIG. 1, a pair of main discharge electrodes (not shown) are arranged in the laser vessel 1, and a mixed laser gas containing a halogen-based gas serving as a laser medium, such as XeCl, KrF gas and H 2 gas.
It is formed by filling e and Ne. A pipe 2a, a second container 3, a circulation pump 4, and a pipe 2b are connected to one end of the laser container 1 to return to the other end of the laser container 1 to form a closed circuit, and the gas is in a communicating state. In the second container 3, a pair of discharge electrodes 5 are installed insulated. A power supply device 6 is connected to both ends of the discharge electrode 5. An observation window (not shown) is attached to the second container 3 at a position where the space between the discharge electrodes 5 can be observed. One end of the discharge electrode 5 is connected to one end of a capacitor (C) 8 and one end of a high resistance (R) 7, and the other end of the high resistance 7 is connected to one end of a DC power supply 10 via a switch not shown. On the other hand, the other end of the discharge electrode 5 is connected to one end of a capacitor 8 and one end of a DC power supply 10, and a current transformer 9 is connected therebetween. The connection point serves as a ground point and constitutes a circuit of the power supply device 10.
また、第2の容器3の取付けられている図示しない観測
窓を通して放電電極5の極間の空間に紫外線発光ランプ
11の光12が照射できるように構成されている。このよう
な構成において、まず、循環ポンプ4を運転しレーザガ
スを矢印の如く配管2a,2b及び第2の容器3内を循環し
ておく。In addition, an ultraviolet light-emitting lamp is provided in the space between the discharge electrodes 5 through an observation window (not shown) attached to the second container 3.
It is configured so that 11 lights 12 can be emitted. In such a configuration, first, the circulation pump 4 is operated to circulate the laser gas in the pipes 2a and 2b and the second container 3 as indicated by arrows.
次に、直流電源10の電圧Vsを図示しないスイッチの投入
により高抵抗(R)7を介してコンデンサ8にRCの時定
数でVsの電圧が充電される。そして、その電圧Vsは放電
電極5間に印加されるが、印加電圧に対して放電電極5
間の間隙長を長くして耐圧するように予め調整してある
ため、自爆することはない。今、紫外線発光ランプ11の
光12を放電電極5間に照射することにより、この電極5
間の予備電離とトリガー作用として働くので、極間が放
電し、コンデンサ8の電荷が流れる。その時の極間電圧
Vpと電流ipの波形は、図示しない電圧計及び変流器9に
て測定される。これらの測定値は第2図に示す如く振動
波形となる。このVpとipは、ガス状態に対応して変化し
ており、放電部をインピーダンスとしてとらえることが
できる。この関連を整理すると第3図となる。すなわ
ち、ハロゲンガスが低濃度のときはVp1,Vp2は大きく、i
p1,ip2は小さくなる。逆に高濃度の場合はVp1,Vp2は小
さくなる。このように、放電電圧Vpと電流ipを観測する
ことにより、その値またはパターンを標準濃度と比較す
ることによりガス状態を判断できる。Then, the voltage of the high-resistance (R) 7 with a time constant of the RC to the capacitor 8 through the V s is charged by the introduction of a switch (not shown) a voltage V s of the DC power source 10. The voltage V s is applied between the discharge electrodes 5, but the discharge electrodes 5
Since the gap length between them has been adjusted in advance so as to withstand pressure, it does not self-destruct. Now, by irradiating the discharge electrode 5 with the light 12 of the ultraviolet light emitting lamp 11, this electrode 5
Since it acts as a preionization and a triggering action between them, the gap between the electrodes is discharged, and the charge of the capacitor 8 flows. Inter-electrode voltage at that time
The waveforms of V p and current i p are measured by a voltmeter and current transformer 9 not shown. These measured values have a vibration waveform as shown in FIG. The V p and i p change according to the gas state, and the discharge part can be regarded as impedance. Figure 3 summarizes this relationship. That is, when the halogen gas has a low concentration, V p1 and V p2 are large and i
p1 and i p2 become smaller. On the contrary, when the concentration is high, V p1 and V p2 are small. In this way, by observing the discharge voltage V p and the current i p , the gas state can be judged by comparing the value or pattern with the standard concentration.
またレーザ容器1とは別の容器内で放電電極5間の間隙
長を短く設定できるので電源電圧も低くでき、小形な測
定器となる。しかも、電源電圧が低いので、高価な分圧
器は必要とせず、直接測定信号として使用できるので、
ノイズによる誤測定は少ないという効果がある。このよ
うに、精密また微調整を必要とすることなく、ガス状態
によりハロゲン濃度との対応する量を把握することがで
きるので、本装置の手段とガス制御系との組合せによ
り、レーザ出力を安定に制御できるという効果がある。
その他の実施例としては、第2の容器をレーザ容器の一
端に取付けても作用は同じである。Further, since the gap length between the discharge electrodes 5 can be set to be short in a container different from the laser container 1, the power supply voltage can be lowered and the measuring instrument can be made compact. Moreover, since the power supply voltage is low, it does not require an expensive voltage divider and can be used directly as a measurement signal.
There is an effect that there are few erroneous measurements due to noise. In this way, the amount corresponding to the halogen concentration can be ascertained by the gas state without requiring precise or fine adjustment. Therefore, the laser output can be stabilized by combining the means of this device and the gas control system. There is an effect that can be controlled to.
In another embodiment, the same effect can be obtained even if the second container is attached to one end of the laser container.
他の実施例として図示しないが、第2の容器をガス再生
装置の上流側に接続して一体化して小形化を図ることも
できるという効果もある。Although not shown as another embodiment, there is also an effect that the second container can be connected to the upstream side of the gas regenerator to be integrated with the gas regenerator to reduce the size.
本発明によれば、レーザ容器とは別体の第2の容器の中
に一対の放電電極を収納し、その放電電極間の電圧、電
流波形よりガス状態を判断できるようにしたので、ハロ
ゲンガスの注入量を正確に制御できる。その結果、レー
ザ出力を安定に長時間運転できる。According to the present invention, the pair of discharge electrodes are housed in the second container, which is separate from the laser container, and the gas state can be determined from the voltage and current waveforms between the discharge electrodes. The injection amount of can be controlled accurately. As a result, the laser output can be stably operated for a long time.
更に、第2の容器内の放電電極間の間隙を小さくできる
ので、印加電圧も低くでき、かつその放電に伴い発生す
るノイズによる誤測定は少ない。また、電源装置は小型
で安価である。Further, since the gap between the discharge electrodes in the second container can be made small, the applied voltage can be made low, and erroneous measurement due to noise generated by the discharge is small. Further, the power supply device is small and inexpensive.
そして、紫外線発光ランプの紫外線照射による放電電極
間のトリガー作用によって、一定で安定した放電が得ら
れる。更に、測定以外は、第2の容器の窓より紫外線発
光ランプの光を常時照射することにより、塩化水素系の
塩化物系の微量な不純物だけを解離する作用、効果があ
る。Then, a constant and stable discharge can be obtained by the trigger action between the discharge electrodes due to the ultraviolet irradiation of the ultraviolet light emitting lamp. Further, except for the measurement, by constantly irradiating the light of the ultraviolet light emitting lamp through the window of the second container, there is an action and an effect of dissociating only a trace amount of hydrogen chloride type impurities.
第1図は本発明の一実施例を示す構成図、第2図は放電
電圧、電流波形例を示す図、第3図はハロゲン濃度と放
電電圧との対応を示す図である。 1……レーザ容器、2a,2b……配管、3……第2容器、
4……循環ポンプ、5……放電電極、7……高抵抗、8
……コンデンサ、9……変流器、10……直流電源、11…
…紫外線発光ランプ。FIG. 1 is a configuration diagram showing an embodiment of the present invention, FIG. 2 is a diagram showing discharge voltage and current waveform examples, and FIG. 3 is a diagram showing correspondence between halogen concentration and discharge voltage. 1 ... Laser container, 2a, 2b ... Piping, 3 ... Second container,
4 ... Circulation pump, 5 ... Discharge electrode, 7 ... High resistance, 8
…… Capacitor, 9 …… Current transformer, 10 …… DC power supply, 11…
… An ultraviolet light emitting lamp.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 小倉 聰 茨城県日立市久慈町4026番地 株式会社日 立製作所日立研究所内 (72)発明者 幹 淳 茨城県日立市久慈町4026番地 株式会社日 立製作所日立研究所内 (56)参考文献 特開 平2−36580(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Satoshi Ogura 4026 Kuji Town, Hitachi City, Hitachi, Ibaraki Prefecture, Hitachi Research Institute, Ltd. Inside Hitachi Research Laboratory (56) Reference JP-A-2-36580 (JP, A)
Claims (2)
充填したレーザ容器を備えた高気圧ガスレーザ装置にお
いて、前記レーザ容器と別体に設けられ前記レーザ容器
と連通された一対の放電電極を収納する第2の容器と、
前記一対の放電電極への電圧印加手段を具備した電源装
置と、前記一対の放電電極間の放電電圧および電流を測
定して前記レーザ容器内のガス状態を判断する測定手段
とを備えたことを特徴とする高気圧ガスレーザ装置。1. A high-pressure gas laser device comprising a laser container filled with a high-pressure laser gas containing a halogen-based gas, the second container accommodating a pair of discharge electrodes provided separately from the laser container and communicating with the laser container. Container of
A power supply device having a means for applying a voltage to the pair of discharge electrodes; and a measuring means for measuring a discharge voltage and a current between the pair of discharge electrodes to determine a gas state in the laser vessel. Characteristic high pressure gas laser device.
電電極間に照射する紫外線発光ランプを備えたことを特
徴とする高気圧ガスレーザ装置。2. The high pressure gas laser device according to claim 1, further comprising an ultraviolet light emitting lamp for irradiating ultraviolet light between the pair of discharge electrodes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2134804A JPH0756901B2 (en) | 1990-05-24 | 1990-05-24 | High pressure gas laser device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2134804A JPH0756901B2 (en) | 1990-05-24 | 1990-05-24 | High pressure gas laser device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0429385A JPH0429385A (en) | 1992-01-31 |
| JPH0756901B2 true JPH0756901B2 (en) | 1995-06-14 |
Family
ID=15136918
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2134804A Expired - Fee Related JPH0756901B2 (en) | 1990-05-24 | 1990-05-24 | High pressure gas laser device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0756901B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2612659B2 (en) * | 1992-04-14 | 1997-05-21 | 株式会社日立製作所 | Gas deterioration detection device and excimer laser device having gas deterioration detection function |
| US6240117B1 (en) | 1998-01-30 | 2001-05-29 | Cymer, Inc. | Fluorine control system with fluorine monitor |
| US5978406A (en) * | 1998-01-30 | 1999-11-02 | Cymer, Inc. | Fluorine control system for excimer lasers |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0236580A (en) * | 1988-07-27 | 1990-02-06 | Nec Corp | Detecting method for halogen gas concentration |
-
1990
- 1990-05-24 JP JP2134804A patent/JPH0756901B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0429385A (en) | 1992-01-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4398129A (en) | Active lamp pulse driver circuit | |
| JP3359838B2 (en) | Corona generator | |
| US9010179B2 (en) | Device for measuring the ionization current in a radiofrequency ignition system for an internal combustion engine | |
| Miyazaki et al. | Efficiency of a capacitor‐transfer‐type discharge excimer laser with automatic preionization | |
| JPH0756901B2 (en) | High pressure gas laser device | |
| CA2583455C (en) | Electrochemical sensing circuit having high dynamic range | |
| DE50303751D1 (en) | DEVICE FOR DETERMINING THE ENERGY CONDITION OF AN ENERGY STORAGE OF A MOBILE DATA SUPPORT | |
| CA2188448A1 (en) | Microprocessor controlled ring laser gyro power control system | |
| JP2002118309A (en) | Excimer laser device and fluorine molecule laser device, and method of stabilizing its output beam parameter | |
| Marchetti et al. | A new type of corona‐discharge photoionization source for gas lasers | |
| JP2003323990A (en) | Rare gas discharge lamp life prediction method and rare gas discharge lamp life prediction system | |
| JPH0758817B2 (en) | Excimer laser device | |
| JP2612659B2 (en) | Gas deterioration detection device and excimer laser device having gas deterioration detection function | |
| JPH0878185A (en) | Method for detecting replacing time of x-ray tube and device used therefor | |
| US5818858A (en) | Device for producing an electric potential having a difference frequency of a self-mixed signal in a laser resonator | |
| Pike | On the mean lifetime of metastable neon atoms | |
| JPH0236580A (en) | Detecting method for halogen gas concentration | |
| JPH053909B2 (en) | ||
| Tsurubuchi | Emission cross sections of Ar+ measured in a wide range of electron impact energies | |
| SU729496A1 (en) | Method and apparatus for measuring ion concentration in gas | |
| SU655954A1 (en) | Gas content determining method | |
| Ernst et al. | Output characteristics of a corona-preionized XeCl laser | |
| SU1599169A1 (en) | Apparatus for measuring intensity of welding current | |
| JPH0552902B2 (en) | ||
| Logan | Active lamp pulse driver circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313115 |
|
| R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
| LAPS | Cancellation because of no payment of annual fees |