JPH0760976B2 - Signal suppressor - Google Patents
Signal suppressorInfo
- Publication number
- JPH0760976B2 JPH0760976B2 JP60137479A JP13747985A JPH0760976B2 JP H0760976 B2 JPH0760976 B2 JP H0760976B2 JP 60137479 A JP60137479 A JP 60137479A JP 13747985 A JP13747985 A JP 13747985A JP H0760976 B2 JPH0760976 B2 JP H0760976B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- level
- frequency
- phase
- reference signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005259 measurement Methods 0.000 claims description 27
- 230000001360 synchronised effect Effects 0.000 claims description 3
- 230000008878 coupling Effects 0.000 claims description 2
- 238000010168 coupling process Methods 0.000 claims description 2
- 238000005859 coupling reaction Methods 0.000 claims description 2
- 230000010355 oscillation Effects 0.000 description 13
- 238000010586 diagram Methods 0.000 description 6
- 238000001228 spectrum Methods 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000001629 suppression Effects 0.000 description 3
- 238000000605 extraction Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Amplifiers (AREA)
Description
【発明の詳細な説明】 「産業上の利用分野」 この発明は例えば被試験回路、素子等のスプリアス特
性、相互変調歪等を測定する場合に用いることができる
信号抑圧装置に関する。TECHNICAL FIELD The present invention relates to a signal suppressing device that can be used, for example, when measuring spurious characteristics of circuits under test, elements, etc., intermodulation distortion, and the like.
「従来技術」 高周波増幅器或は周波数混合器等の各種の回路における
スプリアス特性或は相互変調歪等を測定するには第7図
に示すように基準信号発振器1から被測定回路2に基準
信号3を与え、被測定回路2の出力信号4を例えばスペ
クトラムアナライザのような測定器5に与え、測定器5
によつて出力信号4の状態を表示させ被測定回路5の応
答状態を判定する。"Prior Art" To measure spurious characteristics or intermodulation distortion in various circuits such as high frequency amplifiers or frequency mixers, as shown in FIG. And the output signal 4 of the circuit under test 2 is applied to a measuring device 5 such as a spectrum analyzer.
Then, the state of the output signal 4 is displayed to determine the response state of the circuit under test 5.
ここで例えば基準信号発振器1から第8図Aに示す周波
数fを持つ信号3を与え、被測定回路2から第8図Bに
示すような周波数成分を持つ応答信号4が出力されたと
する。Here, for example, it is assumed that the reference signal oscillator 1 gives the signal 3 having the frequency f shown in FIG. 8A, and the circuit under test 2 outputs the response signal 4 having the frequency component shown in FIG. 8B.
応答出力信号4は基準発振器1から与えられた基準信号
3と、その高調波3A,3B,3C…と近傍スプリアス信号SP1,
SP2と、信号3の上下に現われる雑音成分Nとが含まれ
る。The response output signal 4 is the reference signal 3 given from the reference oscillator 1, its harmonics 3A, 3B, 3C ... And the nearby spurious signals SP 1 ,
It contains SP 2 and the noise component N appearing above and below the signal 3.
測定器5に与えられる信号4において基準信号3と近傍
スプリアス信号SP1,SP2のレベル比は一般に大きい。ま
た基準信号3と雑音成分Nとのレベル比も大きい。In the signal 4 given to the measuring device 5, the level ratio between the reference signal 3 and the nearby spurious signals SP 1 and SP 2 is generally large. Further, the level ratio between the reference signal 3 and the noise component N is also large.
つまり被測定回路2の応答出力信号4をスペクトラムア
ナライザに表示させると第9図に示すように周波数fの
高レベルの基準信号3と、その第2、第3の高調波信号
3A、3Bは表示画面上に明瞭に表示されるが、高レベルの
基準信号3の近傍に現われる低レベルの近傍スプリアス
信号SP1、SP2及び雑音成分Nは実際には表示画面上に明
瞭には現われない。That is, when the response output signal 4 of the circuit under test 2 is displayed on the spectrum analyzer, the high-level reference signal 3 of the frequency f and its second and third harmonic signals are displayed as shown in FIG.
3A and 3B are clearly displayed on the display screen, but the low-level neighboring spurious signals SP 1 and SP 2 and the noise component N appearing near the high-level reference signal 3 are actually clearly displayed on the display screen. Does not appear.
このため信号3と近傍スプリアス信号SP1,SP2のレベル
の比或は信号3と雑音成分Nとのレベルの比、つまりSN
比を測定することができない。Therefore, the ratio of the levels of the signal 3 and the nearby spurious signals SP 1 and SP 2 or the ratio of the levels of the signal 3 and the noise component N, that is, SN
The ratio cannot be measured.
このため従来は第9図に符号6を付して示すように信号
3の周波数fにおいて急峻に立下る特性のノツチフイル
タ7を第10図に示すように被測定回路2と測定器5との
間に挿入し、このノツチフイルタ7によつて信号3の成
分を除去し、これによりスペクトラムアナライザのダイ
ナミックレンジに影響されずに近傍スプリアス信号SP1,
SP2と雑音成分Nを大きく拡大して表示することができ
るようにし、そのレベル値を測定することが行われてい
る。Therefore, conventionally, a notch filter 7 having a characteristic that sharply falls at the frequency f of the signal 3 as shown by reference numeral 6 in FIG. 9 is provided between the circuit under test 2 and the measuring instrument 5 as shown in FIG. And the component of the signal 3 is removed by this notch filter 7, whereby the nearby spurious signal SP 1 , is not affected by the dynamic range of the spectrum analyzer.
The SP 2 and the noise component N are made to be able to be greatly enlarged and displayed, and the level value thereof is measured.
「発明が解決しようとする問題点」 ノツチフイルタ7は減衰特性が急峻であつてもその帯域
幅は有限であるため希望周波数fの近傍に発生するスプ
リアス信号SP1,SP2のレベルに影響を与え誤差が生じる
不都合がある。"Problems to be solved by the invention" The notch filter 7 has a finite bandwidth even though its attenuation characteristic is steep, and therefore affects the levels of the spurious signals SP 1 and SP 2 generated in the vicinity of the desired frequency f. There is an inconvenience that an error occurs.
また希望周波数f以外の部分において特性に凹凸いわゆ
るリツプル8を有し、このリツプル8の影響により高調
波成分3A,3B等のレベルを変化させてしまいこの点でも
測定誤差が生じる不都合がある。In addition, there is a so-called ripple 8 in the characteristic in a portion other than the desired frequency f, and the influence of the ripple 8 changes the levels of the harmonic components 3A, 3B, etc., which also causes a measurement error.
「問題点を解決するための手段」 この発明では、所望の周波数の基準信号を被測定手段に
与えることにより該被測定手段から出力される、高レベ
ルの前記基準信号及び少なくともこの基準信号の近傍に
発生する近傍スプリアス信号や高調波信号を含む複数の
周波数成分の信号よりなる被測定信号を受信し、分岐す
る信号分岐手段と、この信号分岐手段から供給される前
記被測定信号から前記高レベルの基準信号を取り出す信
号摘出手段と、この信号摘出手段によって摘出した前記
基準信号と同期した周波数の単一周波数成分からなる信
号を発生する発振器と、この発振器から発生される単一
周波数成分の信号の位相を調整し、前記基準信号の位相
と逆位相の信号を得る位相調整手段と、この位相調整手
段からの前記逆位相の単一周波数成分の信号を所定のレ
ベルまで増幅する増幅器と、前記信号分岐手段からの被
測定信号を出力端子に供給するとともに、前記増幅され
た逆位相の単一周波数成分の信号が与えられたときには
この逆位相の単一周波数成分の信号と前記信号分岐手段
からの被測定信号とを結合し、前記被測定信号中の前記
基準信号を、他の周波数成分の信号のレベルを変化させ
ることなく抑圧した信号を出力端子に供給する信号結合
手段とによって信号抑圧装置を構成したものである。"Means for Solving Problems" In the present invention, a high-level reference signal output from the measured means by applying a reference signal of a desired frequency to the measured means and at least the vicinity of the reference signal Signal branching means for receiving and branching a signal under measurement consisting of signals of a plurality of frequency components including near-field spurious signals and harmonic signals generated in, and the high level from the signal under measurement supplied from this signal branching means Signal extracting means for extracting the reference signal, an oscillator for generating a signal composed of a single frequency component of a frequency synchronized with the reference signal extracted by the signal extracting means, and a signal of a single frequency component generated by the oscillator Phase adjusting means for adjusting the phase of the reference signal to obtain a signal having a phase opposite to that of the reference signal, and a single frequency component of the opposite phase from the phase adjusting means. An amplifier for amplifying a signal to a predetermined level and a signal under measurement from the signal branching means are supplied to an output terminal, and when the amplified signal of the opposite phase single frequency component is given, this opposite phase A signal of a single frequency component and a signal under measurement from the signal branching unit are combined to output a signal in which the reference signal in the signal under measurement is suppressed without changing the levels of signals of other frequency components. The signal suppressing device is configured by the signal coupling means supplied to the terminals.
この発明の構成によれば高周波増幅器、周波数混合器等
の各種の回路や半導体素子等の被測定手段に与えた雑音
成分Nを含む希望周波数信号を摘出し、その希望周波数
信号に同期して発振器を発振させることによつて雑音成
分を含まない希望周波数と一致した単一周波数の信号を
得ることができる。According to the structure of the present invention, a desired frequency signal including the noise component N given to various circuits such as a high-frequency amplifier and a frequency mixer and a device to be measured such as a semiconductor device is extracted and an oscillator is synchronized with the desired frequency signal. By oscillating, it is possible to obtain a signal of a single frequency that matches the desired frequency and does not contain noise components.
この単一周波数の信号を増幅器によつて増幅し、位相を
希望周波数信号の位相に対して逆位相の関係に調整し、
更にレベル調整手段によつて希望周波数信号のレベルと
同一レベルに調整し、これらの信号を電力結合器によつ
て結合することにより被測定信号の中から希望周波数の
信号を除去した信号を得ることができる。The signal of this single frequency is amplified by an amplifier, and the phase is adjusted to have an opposite phase relation to the phase of the desired frequency signal,
Further, the level adjusting means adjusts the signal to the same level as the level of the desired frequency signal, and these signals are combined by a power combiner to obtain a signal from which the desired frequency signal is removed from the signal under measurement. You can
よつてこの発明によれば希望周波数信号の近傍に発生す
る近傍スプリアス及び希望周波数信号の高周波のレベル
を変化させることなく希望周波数信号だけを抑圧するこ
とができる。Therefore, according to the present invention, it is possible to suppress only the desired frequency signal without changing the vicinity spurious generated near the desired frequency signal and the high frequency level of the desired frequency signal.
従つてこの発明によれば希望周波数の信号のレベルと、
近傍スプリアス信号のレベル及び雑音成分のレベルをそ
れぞれ正確に測定することができる。よつて測定誤差が
極めて小さい測定結果を得ることができる。Therefore, according to the present invention, the level of the signal of the desired frequency,
It is possible to accurately measure the level of the nearby spurious signal and the level of the noise component. Therefore, a measurement result with a very small measurement error can be obtained.
「実施例」 第1図にこの発明の一実施例を示す。第1図において11
はこの発明による信号抑圧装置を示す。この発明による
信号抑圧装置11は入力端子11Aと出力端子11Bを有し、入
力端子11Aに被測定回路2から出力される被測定信号4
を与える。出力端子11Bには例えばスペクトラムアナラ
イザのような測定器5を接続する。[Embodiment] FIG. 1 shows an embodiment of the present invention. 11 in FIG.
Shows a signal suppressor according to the invention. A signal suppressing device 11 according to the present invention has an input terminal 11A and an output terminal 11B, and a signal under test 4 output from a circuit under test 2 to the input terminal 11A.
give. A measuring device 5 such as a spectrum analyzer is connected to the output terminal 11B.
入力端子11Aに与えられた被測定信号は電力分岐器12に
よつて2分岐される。電力分岐器12の一方の分岐出力端
子12Aに信号摘出手段13を接続し、他方の分岐出力端子1
2Bには電力結合器22の一方の入力端子22Aを接続する。The signal under measurement applied to the input terminal 11A is split into two by the power splitter 12. The signal extracting means 13 is connected to one branch output terminal 12A of the power branching device 12, and the other branch output terminal 1
One input terminal 22A of the power combiner 22 is connected to 2B.
信号摘出手段13は例えば同調増幅器のような可変狭帯域
フイルタ特性を有する回路によつて構成することがで
き、この可変狭帯域フイルタ特性によつて被測定信号4
の中の希望する周波数の信号、例えば第2図に示した周
波数fの信号3を摘出する。The signal extracting means 13 can be constituted by a circuit having a variable narrow band filter characteristic such as a tuning amplifier, and the measured signal 4 can be obtained by the variable narrow band filter characteristic.
Of the desired frequency, for example, the signal 3 of the frequency f shown in FIG. 2 is extracted.
信号摘出手段13によつて摘出した信号3は例えば位相比
較器14に与えられる。この位相比較器14の他方の入力端
子には発振器15の発振信号23が与えられ、この発振信号
23と信号摘出手段13によつて摘出した信号3の位相を比
較し、その位相比較出力24によつて発振器15の発振周波
数を制御する。このため発振器15には電圧制御発振器を
用いるとよい。The signal 3 extracted by the signal extracting means 13 is given to the phase comparator 14, for example. The oscillation signal 23 of the oscillator 15 is applied to the other input terminal of the phase comparator 14,
The phase of the signal 3 extracted by 23 and the signal extraction means 13 is compared, and the oscillation frequency of the oscillator 15 is controlled by the phase comparison output 24. Therefore, a voltage controlled oscillator may be used as the oscillator 15.
このように位相比較出力によつて発振器15の発振周波数
を制御することにより発振器15から希望する周波数の信
号3の周波数と合致した単一周波数の信号23を得ること
ができる。In this way, by controlling the oscillation frequency of the oscillator 15 by the phase comparison output, it is possible to obtain from the oscillator 15 a signal 23 of a single frequency that matches the frequency of the signal 3 of the desired frequency.
発振器15から得られる単一周波数の信号23は位相調整手
段16で位相調整される。つまり電力結合器22において被
測定信号4に含まれる抑圧を希望する信号3の位相に対
して逆位相となるように調整する。The single frequency signal 23 obtained from the oscillator 15 is phase-adjusted by the phase adjusting means 16. That is, in the power combiner 22, the suppression included in the signal under measurement 4 is adjusted so as to be out of phase with the desired phase of the signal 3.
位相調整された信号25は増幅器17によつて所望のレベル
まで増幅し、必要に応じて可変バンドパスフイルタ18を
通じてレベル調整手段19に供給される。The phase-adjusted signal 25 is amplified to a desired level by the amplifier 17, and is supplied to the level adjusting means 19 through the variable bandpass filter 18 as needed.
レベル調整手段19では抑圧を希望する信号3のレベルと
単一周波数の信号23のレベルが一致するようにレベル調
整し、そのレベル調整された信号を電力結合器22の他方
の入力端子22Bに与える。なおスイツチ21は接点Aを選
択すると信号抑圧モードとして動作し、接点Bを選択す
ると通常の測定モードとなる。The level adjusting means 19 adjusts the level so that the level of the signal 3 desired to be suppressed matches the level of the signal 23 of the single frequency, and supplies the level-adjusted signal to the other input terminal 22B of the power combiner 22. . The switch 21 operates in the signal suppression mode when the contact A is selected, and the normal measurement mode when the contact B is selected.
上述の構成において基準信号発生器1から周波数fの基
準信号3を被試験回路2に与えたとき、被試験回路2か
ら第2図Aに示すように基準信号3と、雑音成分N,スプ
リアス信号SP1,SP2及び第2,3高調波3A,3B等を含む出力
信号4が出力されたとする。When the reference signal 3 having the frequency f is given from the reference signal generator 1 to the circuit under test 2 in the above-mentioned configuration, the circuit under test 2 shows the reference signal 3, the noise component N and the spurious signal as shown in FIG. 2A. It is assumed that the output signal 4 including SP 1 and SP 2 and the second and third harmonic waves 3A and 3B is output.
この出力信号4を入力端子11Aに入力すると、出力信号
4は電力分岐器12の二つの出力端子12Aと12Bに分岐され
て出力される。When this output signal 4 is input to the input terminal 11A, the output signal 4 is branched and output to the two output terminals 12A and 12B of the power branching device 12.
信号摘出手段13は応答出力信号4の中の抑圧を希望する
希望周波数信号、この例では信号3を希望周波数信号と
した場合を示し、この信号3の周波数fに同調させ、信
号3を摘出する。ここで希望周波数信号3を摘出するが
希望周波数信号3には雑音成分N及びその近傍にスプリ
アス信号SP1,SP2が存在するため信号摘出手段13から摘
出される希望周波数信号3は完全な単一周波数の信号と
して摘出することはできない。The signal extracting means 13 shows a case where the desired frequency signal in the response output signal 4 desired to be suppressed, in this example, the signal 3 is used as the desired frequency signal, and the signal 3 is extracted by tuning to the frequency f of this signal 3. . Here, the desired frequency signal 3 is extracted. However, since the desired frequency signal 3 has the noise component N and spurious signals SP 1 and SP 2 in the vicinity thereof, the desired frequency signal 3 extracted from the signal extracting means 13 is a complete single signal. It cannot be extracted as a single frequency signal.
よつてこの発明では希望周波数信号3を位相比較器14に
与え、この位相比較器14において発振器15の発振信号と
位相比較し、その位相比較結果によつて発振器15の発振
周波数を制御することにより発振器15の発振周波数を希
望周波数信号3の周波数fと一致した信号23を得る。Therefore, in the present invention, the desired frequency signal 3 is applied to the phase comparator 14, the phase comparator 14 compares the phase with the oscillation signal of the oscillator 15, and the oscillation frequency of the oscillator 15 is controlled according to the result of the phase comparison. A signal 23 in which the oscillation frequency of the oscillator 15 matches the frequency f of the desired frequency signal 3 is obtained.
このようにして発振器15から出力される信号23は希望周
波数fを持つ単一周波数信号となる。つまり雑音成分
N、スプリアス信号SP1,SP2を含まない単一スペクトラ
ム信号が得られる。In this way, the signal 23 output from the oscillator 15 becomes a single frequency signal having the desired frequency f. That is, a single spectrum signal that does not include the noise component N and the spurious signals SP 1 and SP 2 can be obtained.
よつてこの単一周波数信号23を位相調整手段16によつて
希望周波数信号3の位相と逆位相の信号25(第2図B)
に変換し、この逆位相の信号25を増幅器17で増幅し、可
変バンドパスフイルタ18とレベル調整手段19を通じて電
力結合器22の一方の入力端子22Bに与える。Therefore, the single frequency signal 23 is supplied by the phase adjusting means 16 to the signal 25 having the opposite phase to the phase of the desired frequency signal 3 (FIG. 2B).
The signal 25 having the opposite phase is amplified by the amplifier 17, and is supplied to one input terminal 22B of the power combiner 22 through the variable bandpass filter 18 and the level adjusting means 19.
レベル調整手段19により被測定信号4に含まれる希望周
波数信号3のレベルと信号25のレベルを合致するように
調整することにより電力結合器22において希望周波数信
号3と信号25が互に打消され、希望周波数信号は抑圧さ
れる。The level adjuster 19 adjusts the level of the desired frequency signal 3 and the level of the signal 25 included in the signal under test 4 so that they match each other, so that the desired frequency signal 3 and the signal 25 cancel each other in the power combiner 22. The desired frequency signal is suppressed.
従つて被測定信号4の中の信号3を抑圧した信号をスペ
クトラムアナライザのような測定器5に与えることによ
り、測定器5のダイナミツクレンジがレベルの大きい信
号3にじゃまされることがなくなり、この結果信号3と
比較してレベルが小さい信号つまりノイズN,スプリアス
信号SP1,SP2,高調波3A,3B等を第3図に示すように大き
く表示することができ、これらのレベルを正確に測定す
ることができる。Therefore, by giving a signal in which the signal 3 in the signal under measurement 4 is suppressed to the measuring device 5 such as a spectrum analyzer, the dynamic range of the measuring device 5 is not disturbed by the signal 3 having a large level, As a result, a signal whose level is smaller than that of the signal 3, that is, noise N, spurious signals SP 1 and SP 2 , harmonics 3A and 3B, etc., can be displayed large as shown in FIG. Can be measured.
「発明の変形実施例」 第4図はこの発明の他の実施例を示す。この例では希望
周波数信号の周波数が高い場合の例を示す。"Modified Embodiment of the Invention" FIG. 4 shows another embodiment of the present invention. In this example, the case where the frequency of the desired frequency signal is high is shown.
このため第1図の実施例と異なる構成としては信号摘出
手段13が周波数混合器13A,13Bと、バンドパスフイルタ1
3C,13Dとによつて構成された点と、これら周波数混合器
13A,13B及び後述する周波数変換手段28を構成する周波
数混合器28A,28Bに局部発振信号f1,f2を与える二つの局
部発振器26,27を設けた点と、信号25を出力する側に周
波数混合器28A,28Bとバンドパスフイルタ28Cとローパス
フイルタ28Dによつて構成した周波数変換手段28を設け
た点である。Therefore, as a configuration different from that of the embodiment of FIG. 1, the signal extracting means 13 includes the frequency mixers 13A and 13B and the band pass filter 1.
3C and 13D and the frequency mixer
13A, 13B and the point where two local oscillators 26, 27 for giving local oscillation signals f 1 , f 2 to the frequency mixers 28A, 28B constituting the frequency conversion means 28 described later are provided, and on the side that outputs the signal 25. The point is that the frequency conversion means 28 constituted by the frequency mixers 28A and 28B, the bandpass filter 28C and the lowpass filter 28D is provided.
このように信号摘出手段13として周波数混合器13A,13B
とバンドパスフイルタ13C,13Dを用いた構成にしたこと
により希望周波数信号の周波数Fが例えば数10MHz以上
のように高い周波数であつてもその周波数fを局部発振
器26,27の局部発振信号と周波数混合することによつて
周波数変換し、低い周波数の信号として取出すことがで
きる。よつて発振器15は普通の電圧制発振器を用いるこ
とができる。In this way, as the signal extracting means 13, the frequency mixers 13A, 13B
And the bandpass filters 13C and 13D are used, even if the frequency F of the desired frequency signal is a high frequency such as several tens of MHz or more, the frequency f is compared with the local oscillation signals of the local oscillators 26 and 27. By mixing, frequency conversion can be performed and the signal can be taken out as a low frequency signal. Therefore, the oscillator 15 can use an ordinary voltage controlled oscillator.
発振器15の発振信号23は位相調整手段16で位相調整され
希望周波数信号の位相と逆位相の信号25に変換され、こ
の信号25を周波数変換手段28によつて元の周波数fに戻
すことにより被測定信号4に含まれる希望周波数信号と
同じ周波数で位相が逆の信号を得ることができる。The oscillation signal 23 of the oscillator 15 is phase-adjusted by the phase adjusting means 16 and converted into a signal 25 having a phase opposite to the phase of the desired frequency signal. A signal having the same frequency as the desired frequency signal contained in the measurement signal 4 but having the opposite phase can be obtained.
この信号を増幅器17と、可変バンドパスフイルタ18及び
レベル調整手段19を通じて電力結合器22に与えることに
より被測定信号4に含まれる希望周波数信号を抑圧する
ことができ、これによつて第1図の実施例と同様の作用
効果が得られる。By applying this signal to the power combiner 22 through the amplifier 17, the variable band pass filter 18 and the level adjusting means 19, the desired frequency signal contained in the signal under test 4 can be suppressed. The same effect as that of the embodiment can be obtained.
なおこの実施例では第3の局部発振器29を設け、局部発
振器27の局部発振信号の代りにこの第3の局部発振器27
の発振信号をスイツチ31を通じて周波数混合器28Aに与
える構造を付加している。In this embodiment, a third local oscillator 29 is provided, and instead of the local oscillation signal of the local oscillator 27, this third local oscillator 27 is used.
Is added to the frequency mixer 28A via the switch 31.
この構成を付加したことによりスイツチ31を接点Bに転
換すると信号抑圧モードではなく、第5図に示すように
信号3の他に局部発振器29の発振周波数で決まる周波数
の信号32を出力端子11Bに出力することができる。When the switch 31 is switched to the contact B by adding this configuration, the signal 32 is not in the signal suppression mode, and the signal 32 having a frequency determined by the oscillation frequency of the local oscillator 29 is output to the output terminal 11B in addition to the signal 3 as shown in FIG. Can be output.
ここで信号3の周波数をf、局部発振器27の発振周波数
をf2,局部発振器29の発振周波数をf2+△fとした場
合、信号32の周波数はf+f△fとなる。When the frequency of the signal 3 is f, the oscillation frequency of the local oscillator 27 is f 2 and the oscillation frequency of the local oscillator 29 is f 2 + Δf, the frequency of the signal 32 is f + fΔf.
スイツチ31を接点Bに転換して動作させる場合には第6
図に示すように信号抑圧装置11の入力端子11Aに基準発
振器1から基準信号3を与え、出力端子11Bに被測定回
路2を接続し、被測定回路2の出力側に測定器5を接続
する。When switching the switch 31 to the contact B to operate it, the sixth
As shown in the figure, the reference signal 3 is applied from the reference oscillator 1 to the input terminal 11A of the signal suppressor 11, the circuit under test 2 is connected to the output terminal 11B, and the measuring instrument 5 is connected to the output side of the circuit under test 2. .
よつて基準発振器1から周波数fの基準信号3を与えた
場合、被測定回路2には周波数fとf+△fの互に周波
数が近接し、レベルが等しい二つの信号を与えることが
できる。この二つの信号3及び32を与えることにより被
測定回路2として例えば増幅器或は周波数混合器等のよ
うに非直線デイバイスを使用した場合、これらの非直線
デイバイスの3次相互変調歪を測定することができる。Therefore, when the reference signal 3 having the frequency f is supplied from the reference oscillator 1, the circuit under test 2 can be supplied with two signals whose frequencies f and f + Δf are close to each other and whose levels are equal to each other. When non-linear devices such as an amplifier or a frequency mixer are used as the circuit under test 2 by giving these two signals 3 and 32, the third-order intermodulation distortion of these non-linear devices can be measured. You can
「発明の作用効果」 以上説明したようにこの発明によれば、種々の回路、デ
バイス、素子等の被測定手段から出力される、所望の周
波数の高レベルの基準信号及び少なくともこの基準信号
の近傍に発生する近傍スプリアス信号や高調波信号を含
む複数の周波数成分の信号よりなる被測定信号と、この
被測定信号中の前記高レベルの基準信号を、他の周波数
成分の信号のレベルを変化させることなく、抑圧した信
号とを測定装置に選択的に与えることができるから、前
記高レベルの基準信号のレベルのみならず、従来は測定
が困難であった前記高レベルの基準信号の近傍に発生す
る近傍スプリアス信号のレベル、雑音成分のレベル、高
調波信号のレベル等を正確に測定することができ、従っ
て、基準信号と近傍スプリアス信号のレベル比や基準信
号と雑音成分のレベル比、つまりSN比を正確に測定でき
る等の顕著な効果がある。特に信号摘出手段13の摘出周
波数を自由に変えることができるように構成することに
より任意の周波数の信号を抑圧することができる。[Advantageous Effects of the Invention] As described above, according to the present invention, a high-level reference signal having a desired frequency and at least the vicinity of the reference signal, which are output from the measured means such as various circuits, devices, and elements. A signal under measurement composed of signals of a plurality of frequency components including a near spurious signal and a harmonic signal generated in the, and the high-level reference signal in the signal under measurement are changed in level of signals of other frequency components. Since the suppressed signal can be selectively applied to the measuring device without being generated, it is generated not only in the level of the high-level reference signal but also in the vicinity of the high-level reference signal, which was difficult to measure in the past. It is possible to accurately measure the level of nearby spurious signals, the level of noise components, the level of harmonic signals, etc. There is a remarkable effect that the level ratio of the signal and the noise component, that is, the SN ratio can be accurately measured. In particular, by configuring the signal extracting means 13 so that the extraction frequency can be freely changed, it is possible to suppress a signal of an arbitrary frequency.
また第4図で説明した実施例のように第3局部発振器29
を設け、この局部発振器29の信号により基準信号発振器
1の信号に近接した周波数の信号32を発生できる構成を
付加することにより非直線デイバスの3次相互変調歪を
測定することができ便利である。Also, as in the embodiment described in FIG. 4, the third local oscillator 29
It is convenient to measure the third-order intermodulation distortion of the nonlinear device by adding a configuration capable of generating a signal 32 having a frequency close to the signal of the reference signal oscillator 1 by providing the signal of the local oscillator 29. .
第1図はこの発明の一実施例を説明するためのブロツク
図、第2図は第1図の動作を説明するためのグラフ、第
3図はこの発明の信号抑圧装置によつて希望周波数信号
を抑圧した状態を説明するための波形図、第4図はこの
発明の他の実施例を説明するためのブロツク図、第5図
は第4図の実施例の動作を説明するためのグラフ、第6
図は第4図に示した実施例の付加的な機能を利用する状
態を説明するためのブロツク図、第7図は従来の測定方
法を説明するためのブロツク図、第8図は第7図の動作
を説明するためのグラフ、第9図は従来の測定方法の問
題点を改善する方法の一例を説明するためのグラフ、第
10図は第9図で説明した従来の改善方法の構成を説明す
るためのブロツク図である。 1:基準信号発振器、2:被測定回路、3:基準信号、4:被測
定信号、5:測定器、11:信号抑圧装置、12:電力分岐器、
13:信号摘出手段、14:位相比較器、15:発振器、16:位相
調整手段、17:増幅器、18:可変バントパスフイルタ、1
9:レベル調整手段。FIG. 1 is a block diagram for explaining one embodiment of the present invention, FIG. 2 is a graph for explaining the operation of FIG. 1, and FIG. 3 is a desired frequency signal by the signal suppressing device of the present invention. FIG. 4 is a waveform diagram for explaining a state in which the noise is suppressed, FIG. 4 is a block diagram for explaining another embodiment of the present invention, and FIG. 5 is a graph for explaining the operation of the embodiment of FIG. Sixth
FIG. 7 is a block diagram for explaining a state in which the additional function of the embodiment shown in FIG. 4 is used, FIG. 7 is a block diagram for explaining a conventional measuring method, and FIG. 8 is FIG. 9 is a graph for explaining the operation of FIG. 9, and FIG. 9 is a graph for explaining an example of a method for improving the problems of the conventional measurement method.
FIG. 10 is a block diagram for explaining the configuration of the conventional improvement method described in FIG. 1: Reference signal oscillator, 2: Circuit under measurement, 3: Reference signal, 4: Signal under measurement, 5: Measuring instrument, 11: Signal suppressing device, 12: Power splitter,
13: signal extracting means, 14: phase comparator, 15: oscillator, 16: phase adjusting means, 17: amplifier, 18: variable band pass filter, 1
9: Level adjustment means.
Claims (1)
えることにより該被測定手段から出力される、高レベル
の前記基準信号と少なくともこの基準信号の近傍に発生
する近傍スプリアス信号や高調波信号を含む複数の周波
数成分の信号よりなる被測定信号を受信する入力端子
と、 該入力端子に接続され、受信した被測定信号を分岐する
信号分岐手段と、 該信号分岐手段から供給される被測定信号から前記高レ
ベルの基準信号を取り出す信号摘出手段と、 該信号摘出手段によって摘出した前記基準信号と同期し
た周波数の単一周波数成分からなる信号を発生する発振
器と、 該発振器から発生される単一周波数成分の信号の位相を
調整し、前記基準信号の位相と逆位相の信号を得る位相
調整手段と、 該位相調整手段からの前記逆位相の単一周波数成分の信
号を増幅する増幅器と、 前記信号分岐手段からの被測定信号を出力端子に供給す
るとともに、前記増幅された逆位相の単一周波数成分の
信号が与えられたときにはこの逆位相の単一周波数成分
の信号と前記信号分岐手段からの被測定信号とを結合
し、前記被測定信号中の前記基準信号を、他の周波数成
分の信号のレベルを変化させることなく抑圧した信号を
出力端子に供給する信号結合手段 とを具備し、 前記出力端子に接続される測定位置に、前記被測定信号
と前記被測定信号中の前記基準信号を抑圧した信号とを
選択的に与え、前記基準信号のレベルのみならず、前記
基準信号の近傍に発生する近傍スプリアス信号のレベ
ル、高調波信号のレベル、雑音成分のレベル等を正確に
測定できるようにしたことを特徴とする信号抑圧装置。1. A high-level reference signal output from a device under test by applying a reference signal of a desired frequency to the device under test and a near-field spurious signal or a harmonic generated at least in the vicinity of the reference signal. An input terminal for receiving a signal under measurement composed of a plurality of frequency component signals including signals, a signal branching unit connected to the input terminal for branching the received signal under measurement, and a signal branching unit supplied from the signal branching unit. A signal extracting means for extracting the high-level reference signal from the measurement signal, an oscillator for generating a signal having a single frequency component of a frequency synchronized with the reference signal extracted by the signal extracting means, and an oscillator generated by the oscillator. Phase adjusting means for adjusting the phase of a signal of a single frequency component to obtain a signal of a phase opposite to that of the reference signal, and a single phase of the opposite phase from the phase adjusting means. An amplifier that amplifies the signal of the wave number component, and supplies the signal under measurement from the signal branching means to the output terminal, and when the amplified signal of the single frequency component of the opposite phase is given, the single signal of the opposite phase is supplied. An output terminal that combines a signal of one frequency component and a signal under measurement from the signal branching unit and suppresses the reference signal in the signal under measurement without changing the level of the signal of another frequency component And a signal coupling means for supplying the signal under measurement to the measurement position connected to the output terminal, the reference signal in the signal under measurement being selectively given, Signal level, the level of a nearby spurious signal generated near the reference signal, the level of a harmonic signal, the level of a noise component, etc. can be accurately measured. Pressure device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60137479A JPH0760976B2 (en) | 1985-06-24 | 1985-06-24 | Signal suppressor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60137479A JPH0760976B2 (en) | 1985-06-24 | 1985-06-24 | Signal suppressor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61295703A JPS61295703A (en) | 1986-12-26 |
| JPH0760976B2 true JPH0760976B2 (en) | 1995-06-28 |
Family
ID=15199586
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60137479A Expired - Lifetime JPH0760976B2 (en) | 1985-06-24 | 1985-06-24 | Signal suppressor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0760976B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1992022130A1 (en) * | 1991-06-06 | 1992-12-10 | Wiltron Measurements Limited | Improved signal generator and testing apparatus |
| JP2012202764A (en) * | 2011-03-24 | 2012-10-22 | Nippon Telegr & Teleph Corp <Ntt> | Spectrum measurement system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4420815A (en) * | 1981-05-18 | 1983-12-13 | International Business Machines Corporation | Apparatus and method for removal of sinusoidal noise from a sampled signal |
-
1985
- 1985-06-24 JP JP60137479A patent/JPH0760976B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61295703A (en) | 1986-12-26 |
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