JPH0765975B2 - Thermal diffusivity measurement method - Google Patents
Thermal diffusivity measurement methodInfo
- Publication number
- JPH0765975B2 JPH0765975B2 JP21585386A JP21585386A JPH0765975B2 JP H0765975 B2 JPH0765975 B2 JP H0765975B2 JP 21585386 A JP21585386 A JP 21585386A JP 21585386 A JP21585386 A JP 21585386A JP H0765975 B2 JPH0765975 B2 JP H0765975B2
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- Japan
- Prior art keywords
- sample
- time
- thermal diffusivity
- differential value
- equation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、熱拡散率の測定方法に関する。TECHNICAL FIELD The present invention relates to a method for measuring thermal diffusivity.
(従来の技術) 従来、電磁波又は粒子線を厚さ一定の平板試料に照射し
て熱拡散率を測定する方法には2通りある。その1つは
瞬時加熱(フラツシユ法)であり、他の1つは一定加熱
(ステツプ法)である。(Prior Art) Conventionally, there are two methods of irradiating an electromagnetic wave or particle beam on a flat plate sample having a constant thickness to measure the thermal diffusivity. One is instantaneous heating (flash method), and the other is constant heating (step method).
フラツシユ法においては、第3図示のような、パルス状
の電磁波又は粒子線例えばレーザ光を一定の厚さの平板
試料の全面に亘つて均一に照射すると、レーザ光が試料
に吸収され試料に熱損失が無い場合には、該試料の背面
の温度上昇Θ1曲線はよく知られた次のような熱伝導式
に従つて上昇する。In the flash method, when a pulsed electromagnetic wave or particle beam such as laser light is uniformly irradiated over the entire surface of a flat plate sample having a constant thickness as shown in the third drawing, the laser light is absorbed by the sample and heats the sample. In the absence of loss, the temperature rise Θ 1 curve on the backside of the sample rises according to the well known heat conduction equation:
但し、αは試料の熱拡散率 lは試料の厚み tはレーザ光を照射してからの時間 Θmはt→∞のときのΘ1 この関係式によりフリーエ数αt/l2を変数として関数Θ
1/Θmを求めて図示すると第4図のようになる。 Here, α is the thermal diffusivity of the sample l is the thickness of the sample t is the time after the laser irradiation, Θm is Θ 1 when t → ∞, and by this relational expression, the Freeer number αt / l 2 is used as the variable Θ
Fig. 4 shows the figure obtained by finding 1 / Θm.
第4図から、例えば試料温度上昇幅が最高温度上昇幅の
半分に達する時のフリーエ数値αt0.5/l2=0.1388を求
め、また試料の温度上昇幅Θ1が最高温度上昇幅Θmの
半分に達するまでの時間t0.5を測定し、次式から熱拡散
率αを求める。From Fig. 4, for example, obtain the free numerical value αt 0.5 / l 2 = 0.1388 when the sample temperature rise reaches half the maximum temperature rise, and the sample temperature rise Θ 1 becomes half of the maximum temperature rise Θm. The time to reach t 0.5 is measured, and the thermal diffusivity α is calculated from the following equation.
α=0.13883l2/t0.5 …(2) また、比熱cpは試料が吸収した熱量をQ、試料の重さを
mとすると で求められる。α = 0.13883l 2 / t 0.5 (2) In addition, the specific heat c p is the amount of heat absorbed by the sample is Q, and the weight of the sample is m. Required by.
したがつて熱伝導率λは、密度ρが既知であれば、λ=
α・CP・ρから求めることができる。一方、ステツプ法
においては、第5図示のようにt=0からハロゲン光の
ような光をステツプ状に試料の全面に亘って均一に照射
すると、(1)式を求めたときと同一の条件下で試料背
面の温度は、よく知られた次のような熱伝導式に従つて
上昇する。Therefore, if the density ρ is known, the thermal conductivity λ is λ =
It can be calculated from α · C P · ρ. On the other hand, in the step method, when light such as halogen light is uniformly irradiated over the entire surface of the sample in a step-like manner from t = 0 as shown in FIG. Below, the temperature of the back surface of the sample rises according to the following well-known heat conduction equation.
但しqは単位時間、単位面積当りに照射吸収されるエネ
ルギー この熱伝導式によりフーリエ数αt/l2を変数にして関係
Θ2λ/qlを求める図示すると、第6図のようになる。 However, q is the energy absorbed by irradiation per unit time and unit area. The relation Θ 2 λ / ql is calculated by this heat conduction equation using the Fourier number αt / l 2 as a variable.
例えばαt1/l2に対するΘ2をΘ2(t1),2αt1/l2に対
するΘ2をΘ2(2t1)とし、αt1/l2とΘ2(2t1)/Θ2
(t1)の関係を図示すると第7図のようなグラフが得ら
れる。For example [alpha] t 1 / l 2 2 for theta 2 to Θ (t 1), 2αt 1 / l to theta 2 for 2 and Θ 2 (2t 1), αt 1 / l 2 and Θ 2 (2t 1) / Θ 2
When the relationship of (t 1 ) is illustrated, a graph as shown in FIG. 7 is obtained.
t1を指定するとΘ2(2t1)/Θ2(t1)は実験的に求め
られるので、第7図から、その値におけるαt1/l2=k
が得られ、この式から熱拡散率 αがα=kl2/t1 …(4) から求められる。When t 1 is specified, Θ 2 (2t 1 ) / Θ 2 (t 1 ) can be obtained experimentally, so from FIG. 7, α t 1 / l 2 = k at that value is obtained.
From this equation, the thermal diffusivity α can be obtained from α = kl 2 / t 1 (4).
次に(3)式においてt→∞とすると、Σの中は零とな
り、t→∞においては、 となる。Next, when t → ∞ in the equation (3), the value in Σ becomes zero, and at t → ∞, Becomes
従つて(3)式を図示し、その曲線の勾配を求める。試
料の密度ρ、試料の厚みl、単位時間、単位面積当りに
照射吸収されるエネルギqが判れば、これ等と勾配を
(5)式に代入することにより比熱CPが求められる。Therefore, the equation (3) is illustrated and the slope of the curve is obtained. If the density ρ of the sample, the thickness 1 of the sample, the unit time, and the energy q absorbed and irradiated per unit area are known, the specific heat C P can be obtained by substituting these and the gradient into the equation (5).
熱伝導率λはフラツシユ法と同様にして求められる。The thermal conductivity λ is obtained in the same manner as the Flash method.
(発明が解決しようとする問題点) 上述のフラツシユ法によれば、簡便に熱拡散率を求める
ことができるが、光を瞬時に照射して試料を加熱するた
め、熱伝導率が悪い試料では照射面の温度が極端に高く
なる。したがつてプラスチツク等の試料とか、一般の試
料でも融点、転移点の近傍では熱定数を正確に求めるこ
とが困難である。(Problems to be Solved by the Invention) According to the above-mentioned flash method, the thermal diffusivity can be easily obtained, but since the sample is heated by irradiating light instantly, the sample having a poor thermal conductivity can be obtained. The temperature of the irradiated surface becomes extremely high. Therefore, it is difficult to accurately determine the thermal constants in the vicinity of the melting point and the transition point even in samples such as plastics and general samples.
一方、ステツプ法は、試料の照射面を損傷することが少
なく、熱伝導率の悪い試料の測定に適しているが、時間
t1の選び方が不適切であるとかなりの誤差が入る可能性
があり、熱拡散率を求めるにはかなりの熟練を要する。On the other hand, the step method is less likely to damage the irradiated surface of the sample and is suitable for measuring a sample with poor thermal conductivity, but
If t 1 is improperly selected, a considerable error may occur, and it requires considerable skill to find the thermal diffusivity.
本発明は従来の2つの方法のそれぞれの不都合を解消す
ることをその目的とするものである。An object of the present invention is to eliminate the disadvantages of each of the two conventional methods.
(問題点を解決する手段) 本発明は上述の目的を達成するために、一定エネルギの
電磁波又は粒子線を厚さ一定(l)の平板試料の表面に
ある時点より一様に照射しつづけ、該試料の背面の温度
上昇曲線を記録して該曲線を時間について微分し、最大
微分値に対して所定比率の微分値が得られる前記時点か
らの時間(t)を求め、また、ステツプ加熱法の熱伝導
式を時間について微分し、温度の最大微分値に対して前
記所定比率の微分値が得られるフーリエ数値(αt/l2,
但し、α:熱拡散率)を求め、該フーリエ数値、前記時
間(t)及び試料の厚さ(l)から熱拡散率(α)を求
めることを特徴とする。(Means for Solving Problems) In order to achieve the above-mentioned object, the present invention continuously irradiates an electromagnetic wave or particle beam having a constant energy on a surface of a flat plate sample having a constant thickness (l) from a certain point of time, A temperature rise curve on the back surface of the sample is recorded, the curve is differentiated with respect to time, and a time (t) from the time point when a differential value of a predetermined ratio is obtained with respect to a maximum differential value is obtained, and the step heating method is also used. The heat transfer equation of is differentiated with respect to time, and the Fourier value (αt / l 2 ,
However, α: thermal diffusivity) is obtained, and the thermal diffusivity (α) is obtained from the Fourier numerical value, the time (t) and the thickness (l) of the sample.
(作用) ステツプ法を用いると、試料背面の温度上昇曲線は前記
(3)式のような熱伝導式となる。この(3)式を微分
すると この(6)′式を(1)式をΘmで除した式と比較する
と、(6)′式の左辺の(dΘ2/dt)(q/ρCPl)をΘ
/Θmと置き換えると、フラツシユ法と同じとなる。
(6)′式の左辺の分母は、(5)式から明らかなよう
に、tが∞におけるdΘ2/dtであるから、(6)′式の
左辺はある時間における温度の微分値とtが∞における
温度の微分値((6′)式において、αt/=l2=x、左
辺をyと置くと、 であり、、yはxに対して単調増加関数である。したが
って、tが∞では、yは最大値をとるので、tが∞にお
ける温度の微分値dθ2/dtが最大の微分値をとり、最大
微分値となる。)との比を示す。(Operation) When the step method is used, the temperature rise curve on the back surface of the sample is a heat conduction type like the above equation (3). Differentiating this equation (3) Comparing this equation (6) 'with the equation obtained by dividing equation (1) by Θm, (dΘ 2 / dt) (q / ρC P l) on the left side of equation (6) ′ is represented by Θ
If replaced with / Θm, it becomes the same as the Flash method.
Since the denominator on the left side of the equation (6) 'is dΘ 2 / dt when t is ∞ as is apparent from the equation (5), the left side of the equation (6)' is the differential value of temperature at a certain time and t. Is the differential value of the temperature at ∞ (in equation (6 '), if αt / = l 2 = x and the left side is y, And y is a monotonically increasing function with respect to x. Therefore, when t is ∞, y takes the maximum value, and the differential value dθ 2 / dt of the temperature when t is ∞ takes the maximum differential value and becomes the maximum differential value. ) And the ratio.
したがつて、フラツシユ法と同じように、(6)′式を
図示した第1図から例えば試料の温度の微分値が最大微
分値の半分に達する時のフーリエ数値αt0.5/l2=0.13
88を求め、また試料の温度微分値が最大微分値の半分に
達するまでの時間t0.5を測定し、次式 α=0.1388l2/t0.5 …(2) から熱拡散率を求める。Therefore, similar to the Flash method, from Fig. 1 showing the equation (6) ', for example, the Fourier value αt 0.5 / l 2 = 0.13 when the differential value of the temperature of the sample reaches half of the maximum differential value.
88 is calculated, and the time t 0.5 until the temperature differential value of the sample reaches half of the maximum differential value is measured, and the thermal diffusivity is calculated from the following equation α = 0.1388l 2 / t 0.5 (2).
(実施例) 本発明方法の実施例を添付図面につき説明する。(Example) An example of the method of the present invention will be described with reference to the accompanying drawings.
試料として、厚み5mmのステンレス鋼(SUS304)を用
い、ハロゲンランプを加熱源として0.5W/cm2のエネルギ
をある時点より該試料の1面に投入した。As a sample, stainless steel (SUS304) having a thickness of 5 mm was used, and an energy of 0.5 W / cm 2 was applied to one surface of the sample from a certain point using a halogen lamp as a heating source.
そのときの試料の背面の温度上昇曲線の微分光線を第2
図に示す。この微分曲線は、コンピユータによるソフト
処理により求めた。The differential ray of the temperature rise curve on the back surface of the sample at that time
Shown in the figure. This differential curve was obtained by software processing by a computer.
この微分曲線から最大微分値の1/2の微分値における時
間は0.96秒であつた。そこでこの0.96秒と、試料の厚み
0.5cmを(2)式に代入し、熱拡散率αを算出した。From this derivative curve, the time at the derivative value of 1/2 of the maximum derivative value was 0.96 seconds. So this 0.96 seconds and the thickness of the sample
0.5 cm was substituted into the equation (2) to calculate the thermal diffusivity α.
α=(0.1388×0.52)/0.96=0.036cm2/sec (発明の効果) 以上説明したように、低熱伝導率で肉厚な試料をステツ
プ加熱により加熱し、解析はフラツシユ法と同じ方法を
用いることにより該試料の照射面を損傷することなく、
しかも誤差の少ない熱拡散率を比較的簡単に求めること
ができる効果を有する。α = (0.1388 × 0.5 2 ) /0.96=0.036 cm 2 / sec (Effect of the invention) As described above, a thick sample with low thermal conductivity is heated by step heating, and the analysis is performed using the same method as the flash method. By using, without damaging the irradiation surface of the sample,
In addition, the thermal diffusivity with a small error can be obtained relatively easily.
第1図は本発明の方法における温度の微分値変化の理論
曲線図、第2図はステツプ加熱したときの試料の背面の
温度上昇微分値実測曲線を示す図、第3図はフラツシユ
法におけるエネルギー時間の関係を示す図、第4図はス
テツプ法におけるエネルギー時間の関係を示す図、第5
図はフラツシユ法における温度上昇の理論曲線図、第6
図はステツプ法における温度上昇の理論曲線図、第7図
はステツプ法においてデータ解析に用いる曲線を示す図
である。FIG. 1 is a theoretical curve diagram of changes in differential value of temperature in the method of the present invention, FIG. 2 is a diagram showing a temperature rise differential value actual measurement curve of the back surface of the sample when step heating, and FIG. 3 is energy in the flash method. FIG. 4 is a diagram showing a time relationship, FIG. 4 is a diagram showing an energy time relationship in the step method, and FIG.
The figure shows the theoretical curve of temperature rise in the Flash method, No. 6
The figure is a theoretical curve diagram of temperature rise in the step method, and FIG. 7 is a diagram showing a curve used for data analysis in the step method.
Claims (1)
定(l)の平板試料の表面にある時点より一様に照射し
つづけ、該試料の背面の温度上昇曲線を記録して該曲線
を時間について微分し、最大微分値に対して所定比率の
微分値が得られる前記時点からの時間(t)を求め、ま
た、ステップ加熱法の熱伝導式を時間について微分し、
温度の最大微分値に対して前記所定比率の微分値が得ら
れるフーリエ数値(αt/l2,但し、α:熱拡散率)を求
め、該フーリエ数値、前記時間(t)及び試料の厚さ
(l)から熱拡散率(α)を求めることを特徴とする熱
拡散率測定方法。1. An electromagnetic wave or a particle beam having a constant energy is continuously irradiated on a surface of a flat plate sample having a constant thickness (l) from a certain point in time, and a temperature rise curve on the back surface of the sample is recorded to obtain the curve. Differentiating with respect to time, the time (t) from the time point when a differential value of a predetermined ratio is obtained with respect to the maximum differential value is obtained, and the heat conduction equation of the step heating method is differentiated with respect to time
The Fourier numerical value (αt / l 2 , where α is the thermal diffusivity) with which the differential value of the predetermined ratio is obtained with respect to the maximum differential value of temperature is obtained, and the Fourier numerical value, the time (t) and the thickness of the sample are obtained. A method for measuring thermal diffusivity, which comprises obtaining the thermal diffusivity (α) from (l).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21585386A JPH0765975B2 (en) | 1986-09-16 | 1986-09-16 | Thermal diffusivity measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21585386A JPH0765975B2 (en) | 1986-09-16 | 1986-09-16 | Thermal diffusivity measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6371644A JPS6371644A (en) | 1988-04-01 |
| JPH0765975B2 true JPH0765975B2 (en) | 1995-07-19 |
Family
ID=16679359
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21585386A Expired - Fee Related JPH0765975B2 (en) | 1986-09-16 | 1986-09-16 | Thermal diffusivity measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0765975B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2688012B2 (en) * | 1995-05-12 | 1997-12-08 | 工業技術院長 | Thermal diffusivity measurement method |
| JP2011158362A (en) * | 2010-02-01 | 2011-08-18 | Kyushu Electric Power Co Inc | Thermal fatigue evaluation method |
-
1986
- 1986-09-16 JP JP21585386A patent/JPH0765975B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6371644A (en) | 1988-04-01 |
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