JPH076774B2 - Three-dimensional shape measuring device by optical cutting method - Google Patents
Three-dimensional shape measuring device by optical cutting methodInfo
- Publication number
- JPH076774B2 JPH076774B2 JP1043850A JP4385089A JPH076774B2 JP H076774 B2 JPH076774 B2 JP H076774B2 JP 1043850 A JP1043850 A JP 1043850A JP 4385089 A JP4385089 A JP 4385089A JP H076774 B2 JPH076774 B2 JP H076774B2
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- Prior art keywords
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- dimensional shape
- measured
- processing
- shape measuring
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- 238000000034 method Methods 0.000 title claims description 16
- 230000003287 optical effect Effects 0.000 title description 8
- 238000003384 imaging method Methods 0.000 claims description 18
- 230000001678 irradiating effect Effects 0.000 claims description 10
- 238000005259 measurement Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 5
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
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- Length Measuring Devices By Optical Means (AREA)
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Description
【発明の詳細な説明】 <産業上の利用分野> この発明は、光切断法による三次元形状測定装置の改良
に関する。DETAILED DESCRIPTION OF THE INVENTION <Industrial field of application> The present invention relates to an improvement of a three-dimensional shape measuring apparatus by a light section method.
<従来の技術> 第5図は光切断法による三次元形状測定装置の概要を示
したものである。光源11からスリット光12が照射される
と被測定物13の表面に光切断線14が得られ、これをCCD
カメラ等の撮像装置15で撮像する。そして撮像装置15で
得られた光切断像のデータを三角測量法を用いて処理す
ることにより、被測定物13の表面各点の三次元座標上の
位置を求めて三次元形状のデータを得るのである。<Prior Art> FIG. 5 shows an outline of a three-dimensional shape measuring apparatus by a light section method. When the slit light 12 is emitted from the light source 11, a light cutting line 14 is obtained on the surface of the DUT 13, and this is cut by the CCD.
The image is taken by the imaging device 15 such as a camera. Then, by processing the data of the light section image obtained by the image pickup device 15 using the triangulation method, the position of each point on the surface of the object to be measured 13 on three-dimensional coordinates is obtained to obtain three-dimensional shape data. Of.
<発明が解決しようとする課題> このような光切断法による測定では、光源11と撮像装置
15との角度θが90゜に近付くほど被測定物13の表面の凹
凸が検出されやすくなるので測定精度が向上する。しか
しながら、被測定物13が凹凸の大きなものである場合に
は、角度θが大きくなると死角となる部分が生じてデー
タの得られない欠落箇所が多くなるため、角度θを大き
くすることによる測定精度の向上には一定の限度があっ
た。<Problems to be Solved by the Invention> In such measurement by the light section method, the light source 11 and the imaging device are used.
The closer the angle θ with 15 is to 90 °, the easier the irregularities on the surface of the object to be measured 13 are detected, and therefore the measurement accuracy is improved. However, when the object to be measured 13 has a large unevenness, when the angle θ becomes large, a blind spot occurs and there are many missing portions where data cannot be obtained. There was a certain limit to the improvement.
また従来の測定装置では、スリット光以外の光線による
外乱などのノイズを防止するために装置全体と被測定物
を暗室内に入れて測定する等の対策が採られており、装
置の大型化や高価格化の一因となっていた。In addition, in the conventional measuring device, measures such as measurement by putting the entire device and the DUT in a dark room to prevent noise such as disturbance due to light rays other than the slit light are taken, and the device is upsized. It was one of the causes of the high price.
この発明はこのような問題点に着目し、比較的簡単な構
成によって光切断法による測定精度を向上することを目
的としてなされたものである。The present invention has been made in view of these problems, and has been made for the purpose of improving the measurement accuracy by the optical cutting method with a relatively simple structure.
<課題を解決するための手段> 上述の目的を達成するために、この発明の光切断法によ
る三次元形状測定装置は、被測定物の光切断線を得るた
めのスリット光照射手段と、相互に離隔して配置され、
且つ上記スリット光照射手段に対して一定の位置関係を
保ちつつスリット光照射手段と共に被測定物の周囲を周
回する2個の光切断線撮像手段と、各撮像手段で得られ
る2個の光切断像から被測定物の三次元形状の認識処理
を行う処理手段、とを備えている。そしてこの処理手段
は、2個の光切断像の認識結果の差が所定の基準値以内
の場合には両者の平均値を処理結果とし、認識結果の差
が基準値を越える場合にはそれぞれの認識結果の連続性
を判定し、連続性の有る方の認識結果を処理結果として
採用するように構成されている。<Means for Solving the Problems> In order to achieve the above-mentioned object, the three-dimensional shape measuring apparatus according to the light cutting method of the present invention includes a slit light irradiating means for obtaining a light cutting line of an object to be measured, and Placed at a distance from
Further, two light cutting line imaging means that circulate around the object to be measured together with the slit light irradiating means while maintaining a constant positional relationship with the slit light irradiating means, and two light cutting lines obtained by each imaging means. Processing means for recognizing the three-dimensional shape of the object to be measured from the image. When the difference between the recognition results of the two light section images is within a predetermined reference value, this processing means takes the average value of the two as the processing result, and when the difference between the recognition results exceeds the reference value, the respective processing results are calculated. The continuity of the recognition result is determined, and the recognition result having the continuity is adopted as the processing result.
なお、上記において認識結果の差が基準値を越える場合
とは、得られた各データの差が大きい場合のほか、一方
のデータが欠落したような場合も含んでおり、例えば、
外乱によるノイズが一方の撮像手段の出力に重畳された
場合や、一方の撮像手段に死角が生じて光切断像の一部
が欠落したような場合がこれに相当する。In the above, the case where the difference in the recognition result exceeds the reference value includes the case where the difference between the obtained data is large and the case where one of the data is missing.
This corresponds to the case where noise due to disturbance is superimposed on the output of one of the image pickup means, or a case where a blind spot occurs in one of the image pickup means and a part of the light section image is missing.
第1図はこの発明の構成を示す図であり、Aはスリット
光照射手段、B1及びB2は光切断線撮像手段、Cは処理手
段、Dは被測定物、Eは回転装置である。なお、スリッ
ト光照射手段Aと光切断線撮像手段B1及びB2の周回は、
被測定物Dとの間の相対的なものであり、固定された被
測定物Dの回りを光照射手段Aと撮像手段B1,B2を公転
させてもよく、逆に光照射手段Aと撮像手段B1,B2を固
定して被測定物Dをその位置で自転させてもよい。Fは
上記各手段の動作を同期させるための外部同期装置、G
は処理手段Cの出力を記憶する記憶装置、Hは記憶装置
Gに記憶されたデータを必要に応じて出力する出力装置
である。FIG. 1 is a diagram showing a configuration of the present invention, in which A is a slit light irradiating means, B 1 and B 2 are optical cutting line imaging means, C is a processing means, D is an object to be measured, and E is a rotating device. . The orbit of the slit light irradiating means A and the light section line imaging means B 1 and B 2 is
The light irradiating means A and the imaging means B 1 and B 2 may be revolved around the fixed object to be measured D, which is relative to the object to be measured D. The image pickup means B 1 and B 2 may be fixed and the DUT may be rotated at that position. F is an external synchronizer for synchronizing the operations of the above-mentioned means, G
Is a storage device for storing the output of the processing means C, and H is an output device for outputting the data stored in the storage device G as required.
<作用> 各撮像手段はそれぞれ異なる方向から光切断線を撮像し
ており、両方の撮像手段に同時に死角が発生する確率は
撮像手段が1個の場合と比較して非常に小さくなるの
で、前述の角度θをある程度大きくすることが可能とな
り、測定精度の向上が容易となる。また、各撮像手段で
得た光切断像の平均値によって三次元形状が認識され、
認識結果の差が大きい場合には連続性の有る方の認識結
果が採用されるので、一方の撮像手段のデータに異常が
あっても他方の撮像手段によってデータが自動的に補完
される。<Operation> Since each image pickup means images the optical cutting line from different directions, the probability that a blind spot occurs at the same time in both image pickup means is much smaller than in the case where there is one image pickup means. It is possible to increase the angle θ of the to some extent, and it is easy to improve the measurement accuracy. Also, the three-dimensional shape is recognized by the average value of the light section images obtained by each image pickup means,
If the difference between the recognition results is large, the recognition result having the continuity is adopted, so that even if the data of one of the image pickup means is abnormal, the data of the other image pickup means is automatically complemented.
このためノイズの影響を受ける確率が低くなり、欠落箇
所がなく、あるいは欠落箇所の少ないデータが得られ、
特別な暗室などを設けなくても測定が可能になると共
に、測定精度が向上される。Therefore, the probability of being affected by noise is low, and there is no missing part or data with few missing parts is obtained.
The measurement can be performed without providing a special dark room and the measurement accuracy is improved.
<実施例> 次に図示の一実施例について説明する。第2図は装置の
概要を示した平面図、第3図はブロック図、第4図は制
御手段のフローチャートである。<Example> Next, one example shown in the figure will be described. FIG. 2 is a plan view showing the outline of the apparatus, FIG. 3 is a block diagram, and FIG. 4 is a flow chart of the control means.
第2図において、1はスリット光照射手段である光源、
2a及び2bは光切断線撮像手段である撮像カメラ、3は被
測定物である。In FIG. 2, 1 is a light source which is a slit light irradiating means,
Reference numerals 2a and 2b are image pickup cameras which are light section line image pickup means, and 3 is an object to be measured.
光源1は原点Oを中心とした半径rの円周1′上に原点
Oを含む図の紙面に垂直な方向に広がるスリット光4を
照射する姿勢で配置され、且つ常に原点Oに向いた状態
で円周1′上を所定の速度で回転するように設けられて
いる。また撮像カメラ2a及び2bは、光源1を通る円周
1′の接線上の光源1から等距離の位置に光源1との角
度θで配置されており、且つ常に原点Oに向いた状態で
光源1と共に回転するように設けられている。上記のθ
は例えば45゜に選定される。また、被測定物3は原点O
を含む位置に固定されており、 各撮像カメラ2a及び2bは、その視野にスリット光4によ
って被測定物3上に生ずる光切断線5が入るように構成
されている。The light source 1 is arranged on a circumference 1'having a radius r centered on the origin O so as to irradiate the slit light 4 which spreads in a direction perpendicular to the plane of the drawing including the origin O, and is always oriented to the origin O. Is provided so as to rotate on the circumference 1'at a predetermined speed. Further, the image pickup cameras 2a and 2b are arranged at a position equidistant from the light source 1 on a tangent line of the circumference 1'passing through the light source 1 and at an angle θ with respect to the light source 1, and always facing the origin O. It is provided so as to rotate together with 1. Θ above
Is selected at 45 °, for example. Further, the DUT 3 has an origin O
The imaging cameras 2a and 2b are configured so that the light cutting line 5 generated on the DUT 3 by the slit light 4 enters the field of view thereof.
なお光源1としては、従来の光切断報による三次元形状
測定装置で使用されているものと同種の光源を適宜用い
ることができ、また撮像カメラ2a及び2bとしては、従来
の光切断法による三次元形状測定装置で使用されている
もの、例えばCCDカメラ等を適宜用いることができる。The light source 1 may be a light source of the same type as that used in the conventional three-dimensional shape measuring device according to the conventional light-cutting information, and the imaging cameras 2a and 2b may be a third-order light source according to the conventional light-cutting method. What is used in the original shape measuring apparatus, for example, a CCD camera or the like can be appropriately used.
第3図のブロック図において、6は画像処理装置、7は
回転駆動部、8は出力装置である。画像処理装置6の主
要部はコンピュータで構成されており、演算や各種制御
の中心となるCPU61、制御プログラム等を記憶させてあ
るROM62、得られた諸データを記憶するRAM63、同期信号
を発生するクロック回路64のほか、適宜の入出力回路
(図示せず)等を備えている。また回転駆動部7は、画
像処理装置6からの制御信号によって光源1の撮像カメ
ラ2a及び2bを駆動するように適宜構成されている。更に
出力装置8は、画像処理装置6で得られた三次元形状の
認識結果のデータを出力するもので、例えばCRTディス
プレイやプリンタ等で構成されている。In the block diagram of FIG. 3, 6 is an image processing device, 7 is a rotation driving unit, and 8 is an output device. The main part of the image processing device 6 is composed of a computer, and a CPU 61 which is the center of calculation and various controls, a ROM 62 which stores control programs and the like, a RAM 63 which stores various obtained data, and a synchronizing signal are generated. In addition to the clock circuit 64, an appropriate input / output circuit (not shown) and the like are provided. Further, the rotation drive unit 7 is appropriately configured to drive the image pickup cameras 2a and 2b of the light source 1 by a control signal from the image processing device 6. Further, the output device 8 outputs the data of the recognition result of the three-dimensional shape obtained by the image processing device 6, and is composed of, for example, a CRT display or a printer.
この実施例の測定装置は上述のように構成されており、
まず第1の発明の動作を第4図のフローチャートにより
説明する。The measuring device of this example is configured as described above,
First, the operation of the first invention will be described with reference to the flowchart of FIG.
各撮像カメラ2a,2bは同期信号により制御されており、
まずステップS1でそれぞれの画像信号、すなわち光切断
像5a,5bが交互に入力される。この入力の切り換えは例
えば1/30秒ごとに行われる。ステップS2では信号の高速
処理を可能とするために、光切断像5a,5bをコンパレー
タにより2値化し、ステップS3で2値化された各データ
51a,51bを処理して被測定物3の表面の三次元座標上の
位置を演算し、三次元座標の認識結果52a,52bを得る。
なお、光源1と被測定物3との距離や表面の傾斜等によ
って光切断線5の幅が異なるため、演算は線の中心を構
成する画素の座標を検出するように行われる。このステ
ップS3の処理は、原点Oを中心とした半径rとスリット
光4に対する撮像カメラ2a,2bの角度θが既知であるの
で、従来の光切断法で一般に行われている公知の手順に
よって適宜実施することができる。Each imaging camera 2a, 2b is controlled by a synchronization signal,
First, in step S1, the respective image signals, that is, the light section images 5a and 5b are alternately input. This input switching is performed, for example, every 1/30 seconds. In step S2, the light-section images 5a and 5b are binarized by a comparator to enable high-speed signal processing, and each data binarized in step S3
By processing 51a, 51b, the position of the surface of the DUT 3 on the three-dimensional coordinates is calculated, and the recognition results 52a, 52b of the three-dimensional coordinates are obtained.
Since the width of the light cutting line 5 varies depending on the distance between the light source 1 and the DUT 3, the inclination of the surface, and the like, the calculation is performed so as to detect the coordinates of the pixel forming the center of the line. Since the radius r centering on the origin O and the angle θ of the imaging cameras 2a and 2b with respect to the slit light 4 are known, the process of step S3 is appropriately performed by a known procedure generally performed by the conventional light cutting method. It can be carried out.
ステップS4では、上記の認識結果52a,52bとして求めら
れた各点の座標データをその直前の他方のカメラによる
座標データと比較し、両者の差があらかじめ設定されて
いる基準値以内であればステップS5で両者の平均値を求
め、これを処理結果53として出力する。また差が基準値
を越える場合には、ステップS6に移って各認識結果52a,
52bの連続性を判定し、連続性を有する方の認識結果を
採用してこれを処理結果53′として出力するのである。
以上の処理が被測定物3の表面の各点について順次行わ
れ、これらの出力データはステップS7でRAM63に記憶さ
れ、以後の利用に備えられる。この連続性は、例えば対
応する箇所の前後のデータを一定期間順次比較してデー
タの変動が一定の基準値内にあるか否かで判定するので
あり、比較の期間や基準値を被測定物3の形状などに応
じて適切に選定しておくことにより、ノイズや欠落のな
い測定結果を得ることができる。In step S4, the coordinate data of each point obtained as the above recognition results 52a, 52b is compared with the coordinate data of the other camera immediately before that, and if the difference between the two is within a preset reference value, The average value of both is calculated in S5, and this is output as the processing result 53. If the difference exceeds the reference value, the process proceeds to step S6, where each recognition result 52a,
The continuity of 52b is determined, the recognition result having the continuity is adopted, and this is output as the processing result 53 '.
The above processing is sequentially performed for each point on the surface of the DUT 3. These output data are stored in the RAM 63 in step S7 and are ready for future use. This continuity is determined, for example, by sequentially comparing the data before and after the corresponding portion for a certain period of time and determining whether the variation of the data is within a certain reference value. By properly selecting according to the shape of 3 and the like, it is possible to obtain a measurement result without noise or omission.
なお破線で示すように、実施例ではステップS4で認識結
果52a,52bの差が基準値を越えた場合に、それぞれの認
識結果を上記の処理結果53′とは別にそのまま処理結果
53a,53bとして記憶するようにしてある(ステップS
8)。また撮像カメラ2a及び2bを光源1の両側に対称に
配置しているが、この発明はカメラが光源に対して非対
称に、あるいは光源に対して同じ側に配置された場合に
も適用することができる。As shown by the broken line, in the embodiment, when the difference between the recognition results 52a and 52b exceeds the reference value in step S4, the respective recognition results are processed as they are separately from the above processing result 53 ′.
It is stored as 53a and 53b (step S
8). Further, although the imaging cameras 2a and 2b are arranged symmetrically on both sides of the light source 1, the present invention can also be applied to the case where the cameras are arranged asymmetrically with respect to the light source or arranged on the same side with respect to the light source. it can.
<発明の効果> 上述の実施例から明らかなように、この発明の三次元形
状測定装置は、2個の光切断線撮像手段で異なる方向か
ら光切断線を撮像し、各撮像手段で得た光切断像の差が
小さい場合にはその平均値によって、被測定物の三次元
形状を認識するようにしたものである。<Effects of the Invention> As is apparent from the above-described embodiments, the three-dimensional shape measuring apparatus of the present invention images the optical cutting lines from different directions by the two optical cutting line imaging means, and obtains them by each imaging means. When the difference between the light-section images is small, the three-dimensional shape of the measured object is recognized based on the average value.
また、各撮像手段で得た光切断像の差が大きい場合に
は、連続性を考慮して被測定物の三次元形状を認識する
ようにしたものである。Further, when the difference between the light-section images obtained by the respective image pickup means is large, the three-dimensional shape of the object to be measured is recognized in consideration of continuity.
従って、2個の光切断像の平均値が用いられるためノイ
ズの影響を受けにくく、特別な暗室などを設けなくても
高精度な測定が可能となる。また同時に両方の撮像手段
に死角が発生する確率は小さく、一方の撮像手段に死角
が生じても他方の撮像手段でデータを補完することがで
きるので、スリット光源との角度を大きくすることによ
る測定精度の向上が可能となり、ノイズの影響や欠落の
ない測定結果を得ることが容易となる。Therefore, since the average value of the two light section images is used, it is unlikely to be affected by noise, and high-precision measurement is possible without providing a special dark room. At the same time, the probability of blind spots occurring in both image capturing means is small, and even if a blind spot occurs in one of the image capturing means, the data can be complemented by the other image capturing means, so measurement by increasing the angle with the slit light source. The accuracy can be improved, and it becomes easy to obtain the measurement result without the influence of noise or lack.
この発明には以上のような利点があり、光切断法による
高精度な三次元形状測定装置を比較的簡単な構成によっ
て安いコストで実現することができるのである。The present invention has the advantages described above, and a highly accurate three-dimensional shape measuring device by the optical cutting method can be realized at a low cost with a relatively simple structure.
第1図はこの発明の構成を示す図、第2図は一実施例の
概略平面図、第3図はブロック図、第4図は制御手順の
フローチャート、第5図は光切断法による一般的な三次
元形状測定装置の説明図である。 1……光源(スリット光照射手段)、2a,2b……撮像カ
メラ(光切断線撮像手段)、3……被測定物、4……ス
リット光、5……光切断線、6……画像処理装置(処理
手段)、7……回転駆動部、8……出力装置、61……CP
U。FIG. 1 is a diagram showing the structure of the present invention, FIG. 2 is a schematic plan view of an embodiment, FIG. 3 is a block diagram, FIG. 4 is a flow chart of a control procedure, and FIG. 5 is a general optical cutting method. It is an explanatory view of a different three-dimensional shape measuring apparatus. 1 ... Light source (slit light irradiation means), 2a, 2b ... Imaging camera (light cutting line imaging means), 3 ... Object to be measured, 4 ... Slit light, 5 ... Light cutting line, 6 ... Image Processing device (processing means), 7 ... Rotation drive unit, 8 ... Output device, 61 ... CP
U.
Claims (1)
光照射手段と、 相互に離隔して配置され、且つ上記スリット光照射手段
に対して一定の位置関係を保ちつつスリット光照射手段
と共に被測定物の周囲を周回する2個の光切断線撮像手
段と、 上記各撮像手段で得られる2個の光切断像から被測定物
の三次元形状の認識処理をそれぞれ行い、認識結果の差
が所定の基準値以内の場合には両者の平均値を処理結果
とし、認識結果の差が基準値を越える場合にはそれぞれ
の連続性を判定し、連続性の有る認識結果を処理結果と
して採用する処理手段、 とを備えたことを特徴とする光切断法による三次元形状
測定装置。1. A slit light irradiating means for obtaining a light cutting line of an object to be measured and a slit light irradiating means which are arranged apart from each other and maintain a constant positional relationship with respect to the slit light irradiating means. At the same time, two light cutting line imaging means that circulate around the object to be measured, and recognition processing of the three-dimensional shape of the object to be measured are respectively performed from the two light cutting images obtained by each of the imaging means. If the difference is within a predetermined reference value, the average value of both is used as the processing result, and if the difference in recognition result exceeds the reference value, the continuity of each is judged and the recognition result with continuity is used as the processing result. A three-dimensional shape measuring apparatus by a light-section method, which comprises: a processing unit to be used.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1043850A JPH076774B2 (en) | 1989-02-25 | 1989-02-25 | Three-dimensional shape measuring device by optical cutting method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1043850A JPH076774B2 (en) | 1989-02-25 | 1989-02-25 | Three-dimensional shape measuring device by optical cutting method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02223809A JPH02223809A (en) | 1990-09-06 |
| JPH076774B2 true JPH076774B2 (en) | 1995-01-30 |
Family
ID=12675192
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1043850A Expired - Lifetime JPH076774B2 (en) | 1989-02-25 | 1989-02-25 | Three-dimensional shape measuring device by optical cutting method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH076774B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04301708A (en) * | 1991-03-29 | 1992-10-26 | Aisin Seiki Co Ltd | Noncontact type volume measuring device |
| JP2002107311A (en) * | 2000-09-28 | 2002-04-10 | Mitsubishi Heavy Ind Ltd | Printed circuit board inspecting device and method |
| JP6582826B2 (en) * | 2015-09-30 | 2019-10-02 | ブラザー工業株式会社 | 3D shape measuring device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6153643A (en) * | 1984-08-24 | 1986-03-17 | Fuji Photo Film Co Ltd | Silver halide color photosensitive material |
-
1989
- 1989-02-25 JP JP1043850A patent/JPH076774B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02223809A (en) | 1990-09-06 |
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