JPH0769267B2 - Backside inspection mirror - Google Patents
Backside inspection mirrorInfo
- Publication number
- JPH0769267B2 JPH0769267B2 JP14106687A JP14106687A JPH0769267B2 JP H0769267 B2 JPH0769267 B2 JP H0769267B2 JP 14106687 A JP14106687 A JP 14106687A JP 14106687 A JP14106687 A JP 14106687A JP H0769267 B2 JPH0769267 B2 JP H0769267B2
- Authority
- JP
- Japan
- Prior art keywords
- back surface
- mirror
- inspection mirror
- mounted component
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
【発明の詳細な説明】 〔概要〕 本発明の裏面点検鏡は額縁型に構成されているので、部
品実装面にそれを載置するだけで、実装部品の裏面を同
時に点検することができる。DETAILED DESCRIPTION OF THE INVENTION [Outline] Since the back surface inspection mirror of the present invention is configured as a frame type, the back surface of the mounted component can be inspected at the same time simply by mounting it on the component mounting surface.
本発明は、例えば集積回路素子等の実装状態を裏面から
点検する際に使用される裏面点検鏡に関する。The present invention relates to a back surface inspection mirror used when, for example, the mounting state of an integrated circuit element or the like is inspected from the back surface.
集積回路素子等をプリント板（以下基板と呼ぶ）に半田
付け実装する際の最大の問題点は、溶融した半田が飛散
して集積回路素子の裏面に植立されている複数本のリー
ド端子に付着し、端子間の短絡事故を起こすことであ
る。この現象を見つけるための対策として、部品実装後
の点検を行うことは非常に重要であり、さまざまな点検
手段が講じられている。本発明はその一手段を提供する
ものである。The biggest problem when soldering an integrated circuit element etc. to a printed circuit board (hereinafter referred to as a board) is that the molten solder is scattered and the lead terminals are erected on the back surface of the integrated circuit element. It will adhere and cause a short circuit between terminals. As a measure for finding this phenomenon, it is very important to perform an inspection after mounting the components, and various inspection means have been taken. The present invention provides one means thereof.
第２図は従来の裏面点検方法を説明するための要部側断
面図である。FIG. 2 is a side sectional view of an essential part for explaining a conventional back surface inspection method.
第２図に示すように、基板10に実装された実装部品１の
裏面２を点検する場合は、反射鏡3aを図のように実装部
品10の側面と平行に配置し、反射面13aの反射を利用し
て矢印Ｄ方向から裏面２の視認を行い、そこに植立され
ている複数本のリード端子４間に図示されない異物，特
に半田等が付着していないか否かを確かめていた（視認
の精度を向上させるために顕微鏡を用いることもあ
る）。As shown in FIG. 2, when inspecting the back surface 2 of the mounted component 1 mounted on the substrate 10, the reflecting mirror 3a is arranged parallel to the side surface of the mounted component 10 as shown in the figure, and the reflection surface 13a is reflected. Was used to visually confirm the back surface 2 from the direction of the arrow D, and it was confirmed whether or not a foreign substance (not shown), particularly solder or the like, was not attached between the plurality of lead terminals 4 planted there ( Sometimes a microscope is used to improve the accuracy of visual recognition).
しかしながら、上記従来の裏面点検方法は、実装部品１
の各側面（集積回路素子は正方形か長方形に形成されて
いるので、４つの側面を持っている）の点検を行う度毎
に反射鏡３の位置決めと傾斜角θの調整とを行う（この
操作は作業員のマニュアル操作によって実行される）必
要があるため、点検作業の作業効率が悪い。However, the conventional backside inspection method described above uses the mounted component 1
Each time each side (the integrated circuit element is formed in a square or a rectangle has four side surfaces) is inspected, the reflection mirror 3 is positioned and the tilt angle θ is adjusted (this operation is performed). Work is performed manually by workers), so the work efficiency of inspection work is poor.
本発明の裏面点検鏡は、第１図の実施例図に示すよう
に、台形に形成された複数個の反射鏡（３）を順次接合
することによって、これらを額縁型に構成した構造にな
っている。As shown in the embodiment of FIG. 1, the rear surface inspection mirror of the present invention has a structure in which a plurality of trapezoidal reflecting mirrors (3) are sequentially joined to form a frame type. ing.
裏面点検鏡をこのように額縁型に形成することにより、
実装部品１の周囲に該裏面点検鏡を載置するだけで該実
装部品１の各側面を同時に視認することが可能となり、
また反射鏡３の傾斜角θを調整する必要も無いため、実
装部品１の裏面点検作業が著しく容易化される。By forming the backside inspection mirror in a frame shape like this,
Only by mounting the back surface inspection mirror around the mounted component 1, it becomes possible to visually recognize each side surface of the mounted component 1 at the same time.
Further, since it is not necessary to adjust the tilt angle θ of the reflecting mirror 3, the back surface inspection work of the mounted component 1 is significantly facilitated.
以下実施例図に基づいて本発明を詳細に説明する。 The present invention will be described in detail below with reference to the accompanying drawings.
第１図（ａ）と（ｂ）は本発明の一実施例を示す要部側
断面図と斜視図であるが、前記第２図と同一部分には同
一符号を付している。1 (a) and 1 (b) are a side sectional view and a perspective view of an essential part showing an embodiment of the present invention, the same parts as those in FIG. 2 are designated by the same reference numerals.
第１図（ａ）および（ｂ）に示すように、本発明の裏面
点検鏡は、台形に形成された４個の反射鏡３によって構
成され、これらを順次接合することによって額縁型に形
成されている。なお、反射鏡３同志の接合は、例えば溶
接，接着剤による接着，半田付け等の手段を用いて行わ
れる（４個の反射鏡３を連接した形にして、その端部の
みを接合するようにしても良い）。また、該反射鏡３の
材料としては、例えば鏡面研磨を行ったステンレス板，
鍍金を施した黄銅板，等が用いられる。As shown in FIGS. 1 (a) and 1 (b), the back surface inspection mirror of the present invention is composed of four trapezoidal reflecting mirrors 3, and is formed into a frame type by sequentially joining these. ing. The reflecting mirrors 3 are joined together by means such as welding, bonding with an adhesive, soldering, etc. (four reflecting mirrors 3 are connected to each other, and only their ends are joined. But you can) The material of the reflecting mirror 3 is, for example, a stainless steel plate that has been mirror-polished,
A plated brass plate or the like is used.
このように形成された裏面点検鏡によれば、該裏面点検
鏡を第１図（ａ）に示す位置，即ち実装部品１の周囲に
配置するといった簡単な操作を行うことによって、実装
部品１の裏面２を四方から同時に視認することができる
ため効率的である。According to the back surface inspection mirror formed in this manner, the back surface inspection mirror of the mounted component 1 can be removed by performing a simple operation such as arranging the rear surface inspection mirror at the position shown in FIG. This is efficient because the back surface 2 can be viewed from all sides at the same time.
以下の説明から明らかなように本発明の裏面点検鏡は、
反射鏡が額縁型に形成されているので、複数方向から実
装部品の裏面を点検することが可能であり、このため、
実装部品の裏面点検作業が著しく効率化される。As will be apparent from the following description, the rear surface inspection mirror of the present invention,
Since the reflector is frame-shaped, it is possible to inspect the back surface of the mounted component from multiple directions.
The backside inspection work of the mounted parts is remarkably streamlined.
第１図（ａ）と（ｂ）は本発明の一実施例を示す要部側
断面図と要部斜視図、 第２図は従来の裏面点検方法を説明するための要部側断
面図である。 図中、１は実装部品、２は実装部品の裏面、３と3aは反
射鏡、４はリード端子、−10は基板、13と13aは反射
面、θは反射鏡の傾斜角、をそれぞれ示す。1 (a) and 1 (b) are main-part side sectional views and main-part perspective views showing an embodiment of the present invention, and FIG. 2 is a main-part side sectional view for explaining a conventional back surface inspection method. is there. In the figure, 1 is a mounted component, 2 is a back surface of the mounted component, 3 and 3a are reflecting mirrors, 4 is a lead terminal, -10 is a substrate, 13 and 13a are reflecting surfaces, and θ is a tilt angle of the reflecting mirror. .
Claims (1)
めの裏面点検鏡であって、 台形に形成された複数個の反射鏡（３）を順次接合する
ことによって、これらを額縁型に構成してなることを特
徴とする裏面点検鏡。1. A rear surface inspection mirror for inspecting a rear surface (2) of a mounted component (1), wherein a plurality of trapezoidal reflecting mirrors (3) are sequentially joined to form a frame. A backside inspection mirror characterized by being configured in a mold.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14106687A JPH0769267B2 (en) | 1987-06-04 | 1987-06-04 | Backside inspection mirror |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14106687A JPH0769267B2 (en) | 1987-06-04 | 1987-06-04 | Backside inspection mirror |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63304145A JPS63304145A (en) | 1988-12-12 |
| JPH0769267B2 true JPH0769267B2 (en) | 1995-07-26 |
Family
ID=15283450
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14106687A Expired - Fee Related JPH0769267B2 (en) | 1987-06-04 | 1987-06-04 | Backside inspection mirror |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0769267B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001300093A (en) * | 2000-04-25 | 2001-10-30 | Sanyo Product Co Ltd | Game machine |
| JP4812410B2 (en) * | 2005-11-25 | 2011-11-09 | 株式会社平和 | Board case device for gaming machine |
-
1987
- 1987-06-04 JP JP14106687A patent/JPH0769267B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63304145A (en) | 1988-12-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |