JPH0776145B2 - Compound semiconductor single crystal growth equipment - Google Patents
Compound semiconductor single crystal growth equipmentInfo
- Publication number
- JPH0776145B2 JPH0776145B2 JP62252192A JP25219287A JPH0776145B2 JP H0776145 B2 JPH0776145 B2 JP H0776145B2 JP 62252192 A JP62252192 A JP 62252192A JP 25219287 A JP25219287 A JP 25219287A JP H0776145 B2 JPH0776145 B2 JP H0776145B2
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- compound semiconductor
- temperature
- pulling
- seed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、液体封止引上法(LEC法)による化合物半導
体単結晶育成装置に関する。TECHNICAL FIELD The present invention relates to a compound semiconductor single crystal growth apparatus by a liquid sealing pulling method (LEC method).
GaAs等のIII−V族化合物半導体はSiよりも大きな電子
移動度を有し、その性質を利用したICや発光素子の開発
が勧められている。III−V族化合物半導体の単結晶を
成長させる方法としては、工業的に単結晶引上方法の一
種である液体封止引上法(Liguid Encapsulated Czochr
alski(LE)法)が多く用いられている。III−V族化合
物半導体は融点近傍でV族元素が高い解離圧をもつた
め、LEC法は原料融液をB2O3等の液体状封止剤でおお
い、さらに、Ar、N2ガスなどで5〜80kg/cm2に加圧され
た雰囲気下で単結晶を成長させる方法である。III-V group compound semiconductors such as GaAs have a higher electron mobility than Si, and development of ICs and light-emitting devices utilizing their properties is recommended. As a method for growing a single crystal of a III-V group compound semiconductor, a liquid encapsulation pulling method (Liguid Encapsulated Czochr), which is one of the methods for pulling a single crystal industrially, is used.
Alski (LE) method is often used. Since III-V group compound semiconductors have a high dissociation pressure of group V elements near the melting point, the LEC method covers the raw material melt with a liquid sealant such as B 2 O 3 and further Ar, N 2 gas, etc. Is a method for growing a single crystal in an atmosphere pressurized at 5-80 kg / cm 2 .
LEC法は、単結晶引上げの際、種結晶と呼ばれる単結晶
の小片を用いて原料融液から単結晶の引上げを行ってい
る。即ち、第3図に示すように、種結晶(1)を装着し
たシードホルダー(2)をアウターチューブ(3)内を
通るインナーロッド(4)に取付け、下軸(10)と接続
されて圧力容器(5)内に収容されたるつぼ(9)内
の、ヒーター(6)で溶解された原料融液(8)に液体
封止剤(7)を貫いて種結晶(1)を浸し、充分なじま
せた後、融液(8)より種結晶(1)と結晶方位のそろ
った単結晶を引上げている。種結晶(1)を原料融液
(8)に浸しなじませる行為は種付けといわれている。
種付けし、単結晶を引上げるための許容温度巾は10℃以
内程度である。なお、(11)は圧力容器(5)に設けた
観測用窓を示す。In the LEC method, when pulling a single crystal, a single crystal piece called a seed crystal is used to pull the single crystal from the raw material melt. That is, as shown in FIG. 3, a seed holder (2) equipped with a seed crystal (1) is attached to an inner rod (4) passing through the outer tube (3), and is connected to a lower shaft (10) to apply pressure. The crucible (9) contained in the container (5) is soaked with the seed crystal (1) through the liquid sealant (7) in the raw material melt (8) melted by the heater (6), After being soaked, the single crystal having the same crystal orientation as the seed crystal (1) was pulled from the melt (8). The act of immersing the seed crystal (1) in the raw material melt (8) and blending it is said to be seeding.
The allowable temperature range for seeding and pulling the single crystal is within 10 ° C. In addition, (11) shows the observation window provided in the pressure vessel (5).
従来、種付けし、引上げる工程は観測窓より目測により
融液面の状況を観察しながら行われている。この場合、
融液の温度を直接測定することができないため、種付け
作業を繰返して融液の温度の適否を判断する必要があ
り、作業能率が悪く、かつ一定しないという問題が生じ
る。本発明は以上のような点にかんがみてなされたもの
で、その目的とするところは、種付け試行回数を削減し
て種付け作業能率を向上させ、かつ一定にする化合物半
導体単結晶育成装置を提供することにある。Conventionally, the steps of seeding and pulling up are performed while observing the condition of the melt surface by visual observation through an observation window. in this case,
Since the temperature of the melt cannot be directly measured, it is necessary to repeat the seeding work to judge the suitability of the temperature of the melt, which causes a problem that work efficiency is low and it is not constant. The present invention has been made in view of the above points, and an object thereof is to provide a compound semiconductor single crystal growing apparatus that reduces the number of trials of seeding, improves seeding work efficiency, and makes it constant. Especially.
上記目的を達成するために本発明によれば、種結晶を保
持するためのシードホルダーと、シードホルダーを取付
け回転上下動させるためのインナーロッドから構成され
る引上軸を有する、液体封止法により単結晶を引上げる
化合物半導体単結晶育成装置において、測温体が引上軸
下端近傍に埋め込んで装着されていることを特徴とする
化合物半導体単結晶育成装置が提供される。According to the present invention to achieve the above object, a liquid sealing method having a pull-up shaft composed of a seed holder for holding a seed crystal and an inner rod for attaching and rotating the seed holder up and down. In the compound semiconductor single crystal growing device for pulling a single crystal according to the above, there is provided a compound semiconductor single crystal growing device in which a temperature sensing element is embedded and mounted near the lower end of the pulling shaft.
種付けには最適な原料融液温度が存在し、その許容温度
巾はきびしく±5℃程度以内である。従って、原料融液
温度を精度よく短時間に知ることが出来れば、種付け作
業能率は向上する。しかしながら、高温の融液温度を直
接測定することは困難であるため、本発明では、種付け
状態における引上軸の特定部分の温度を測定し、あらか
じめ測定してある前記特定部分の温度と融液温度との相
関関係から、融液温度を知る方法をとる。引上軸の測温
個所は、シードホルダーの内部、インナーロッドのるつ
ぼ側下端の内部が適当であり、また種結晶の温度を直接
測定すれば、原料融液面に近いため、融液温度を精度よ
く知ることが出来る。そこで、熱電対などの測温体は測
温箇所内部に埋め込むとよい。また、LEC法は不活性ガ
ス圧力下で単結晶を育成するため、ガスの対流の影響を
うけないように、測温体を埋め込んで装着すると測定精
度があがる。There is an optimum raw material melt temperature for seeding, and the allowable temperature range is severely within ± 5 ° C. Therefore, if the temperature of the raw material melt can be accurately known in a short time, the seeding work efficiency is improved. However, since it is difficult to directly measure the high melt temperature, in the present invention, the temperature of the specific portion of the pulling shaft in the seeding state is measured, and the temperature and the melt of the specific portion that have been measured in advance. The method of knowing the melt temperature from the correlation with the temperature is used. The temperature measurement point of the pull-up shaft is appropriate inside the seed holder and inside the crucible side lower end of the inner rod.If the temperature of the seed crystal is directly measured, it is close to the melt surface of the raw material, so the melt temperature is You can know it accurately. Therefore, it is advisable to embed a temperature measuring element such as a thermocouple inside the temperature measuring location. In addition, since the LEC method grows a single crystal under an inert gas pressure, the measurement accuracy can be improved by embedding the temperature measuring element so as not to be affected by gas convection.
以下図面に示した実施例に基づいて本発明を説明する。 The present invention will be described below based on the embodiments shown in the drawings.
第1図は本発明の一実施例を示す引上軸の部分断面図で
ある。インナーロッド(4)のシードホルダー(2)側
先端部に側面から斜め下方に中心部に向けて穴をあけ、
この穴に熱電対(12)が埋め込まれている。FIG. 1 is a partial cross-sectional view of a pulling shaft showing an embodiment of the present invention. Make a hole in the tip end of the inner rod (4) on the seed holder (2) side, diagonally downward from the side surface toward the center,
A thermocouple (12) is embedded in this hole.
第2図は本発明の他の実施例を示す引上軸の部分断面図
である。この例では、インナーロッド(4)側面から中
心部に向けて開けられた穴はシードホルダー(2)の中
心を貫通して種結晶(1)の中ほどに達し、この穴に埋
め込まれた熱電対(12)の感温部分は穴の先端、種結晶
(1)の中に位置する。この例では、原料融液に近い部
分の温度を測定するため、正確な融液温度を知ることが
できるが、単結晶引上げことに種結晶に穴をあけ、熱電
対をセットするとともに、引上げは終了後はセットした
熱電対を取り外すという煩雑さが生じる。FIG. 2 is a partial sectional view of a pulling shaft showing another embodiment of the present invention. In this example, the hole formed from the side surface of the inner rod (4) toward the center portion penetrates the center of the seed holder (2) to reach the middle of the seed crystal (1), and the thermoelectric material embedded in the hole is formed. The temperature-sensitive part of the pair (12) is located at the tip of the hole, in the seed crystal (1). In this example, since the temperature of the portion close to the raw material melt is measured, it is possible to know the exact melt temperature, but a hole is formed in the seed crystal for pulling the single crystal, and a thermocouple is set, and pulling is performed. After completion, the complicated operation of removing the set thermocouple occurs.
以上説明したように本発明によれば、測温体が引上軸下
端近傍に埋め込んで装着されているため、原料融液の温
度管理が可能となり、種付け作業能率が向上し、かつ安
定するという優れた効果がある。As described above, according to the present invention, since the temperature sensing element is embedded in the vicinity of the lower end of the pulling shaft and mounted, the temperature of the raw material melt can be controlled, the seeding work efficiency is improved, and the temperature is stable. It has an excellent effect.
第1図は本発明にかかる引上げ軸の部分断面図、第2図
は本発明にかかる他の引上軸の部分断面図、第3図は従
来のLEC法による化合物半導体単結晶育成装置の説明図
である。 1……種結晶、2……シードホルダー、3……アウター
チューブ、4……インナーロッド、5……圧力容器、6
……ヒーター、7……B2O3、8……原料融液、9……る
つぼ、10……下軸、11……観測用窓、12……熱電対。FIG. 1 is a partial sectional view of a pulling shaft according to the present invention, FIG. 2 is a partial sectional view of another pulling shaft according to the present invention, and FIG. 3 is an explanation of a conventional compound semiconductor single crystal growing apparatus by the LEC method. It is a figure. 1 ... Seed crystal, 2 ... Seed holder, 3 ... Outer tube, 4 ... Inner rod, 5 ... Pressure vessel, 6
...... Heater, 7 …… B 2 O 3 , 8 …… Material melt, 9 …… crucible, 10 …… bottom axis, 11 …… observation window, 12 …… thermocouple.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭59−227797(JP,A) 特公 昭52−9437(JP,B2) ─────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-59-227797 (JP, A) JP-B-52-9437 (JP, B2)
Claims (2)
と、シードホルダーを取付け回転上下動させるためのイ
ンナーロッドから構成される引上軸を有する、液体封止
法により単結晶を引上げる化合物半導体単結晶育成装置
において、測温体が引上軸下端近傍に埋め込んで装着さ
れていることを特徴とする化合物半導体単結晶育成装
置。1. A compound semiconductor for pulling a single crystal by a liquid sealing method, which has a pull-up shaft composed of a seed holder for holding a seed crystal and an inner rod for mounting and rotating the seed holder. In the single crystal growing device, a temperature measuring element is embedded and mounted near the lower end of the pulling shaft, and the compound semiconductor single crystal growing device is characterized.
る種結晶に埋め込んで装着されていることを特徴とする
特許請求の範囲第1項記載の化合物半導体単結晶育成装
置。2. The compound semiconductor single crystal growing apparatus according to claim 1, wherein the temperature measuring element is mounted by being embedded in a seed crystal attached to a seed holder.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62252192A JPH0776145B2 (en) | 1987-10-06 | 1987-10-06 | Compound semiconductor single crystal growth equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62252192A JPH0776145B2 (en) | 1987-10-06 | 1987-10-06 | Compound semiconductor single crystal growth equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0196092A JPH0196092A (en) | 1989-04-14 |
| JPH0776145B2 true JPH0776145B2 (en) | 1995-08-16 |
Family
ID=17233781
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62252192A Expired - Fee Related JPH0776145B2 (en) | 1987-10-06 | 1987-10-06 | Compound semiconductor single crystal growth equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0776145B2 (en) |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS529437A (en) * | 1975-07-14 | 1977-01-25 | Fuji Xerox Co Ltd | Method for discharging a charged copy sheet |
| JPS59227797A (en) * | 1983-06-03 | 1984-12-21 | Sumitomo Electric Ind Ltd | Method for pulling up single crystal |
-
1987
- 1987-10-06 JP JP62252192A patent/JPH0776145B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0196092A (en) | 1989-04-14 |
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| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
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