JPH0776418B2 - Sputtering method - Google Patents
Sputtering methodInfo
- Publication number
- JPH0776418B2 JPH0776418B2 JP31331786A JP31331786A JPH0776418B2 JP H0776418 B2 JPH0776418 B2 JP H0776418B2 JP 31331786 A JP31331786 A JP 31331786A JP 31331786 A JP31331786 A JP 31331786A JP H0776418 B2 JPH0776418 B2 JP H0776418B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- target
- sputtering method
- targets
- modulation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004544 sputter deposition Methods 0.000 title claims description 23
- 239000000203 mixture Substances 0.000 claims description 19
- 239000010408 film Substances 0.000 description 33
- 239000010409 thin film Substances 0.000 description 20
- 238000000034 method Methods 0.000 description 16
- 230000001360 synchronised effect Effects 0.000 description 11
- 239000000758 substrate Substances 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 238000005546 reactive sputtering Methods 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 229910052777 Praseodymium Inorganic materials 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 229910000808 amorphous metal alloy Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 238000001988 small-angle X-ray diffraction Methods 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、2種または3種以上の複数の種類の原子から
なる2種あるいは3種以上の複数の薄膜が微細に多数積
層された人口的周期構造を持つ人口格子膜あるいは組成
変調膜等の多元薄膜を作成するスパッタリング法に関す
る。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Use) The present invention is a population in which a plurality of thin films of two or three or more kinds, which are composed of two or more kinds of plural kinds of atoms, are finely laminated. The present invention relates to a sputtering method for producing a multi-component thin film such as an artificial lattice film or a composition modulation film having a periodical structure.
(従来の技術) 複数のターゲットを用いてスパッタリングによる多元薄
膜の作成法として、従来、2種以上のターゲットと基板
の間にシャッターを設けてシャッターの開閉により各々
のターゲットを構成する成分を層状にあるいは一定比組
成で薄膜を作成する方法、基板を回転さして複数のター
ゲットとの位置の連続周期的変更によって複数ターゲッ
トの個々の成分の層状あるいは一定比組成の薄膜を作成
する方法が提案されている。さらに近年、同一領域内に
ある複数個のターゲットの印加電力を独立に制御しター
ゲットからのプラズマ流を同時に間断なく照射し多元薄
膜を得る方法(特開昭59−123768号公報)が提案されて
いる。(Prior Art) As a method of forming a multi-component thin film by sputtering using a plurality of targets, conventionally, a shutter is provided between two or more types of targets and a substrate, and the components constituting each target are layered by opening and closing the shutter. Alternatively, a method for forming a thin film with a constant ratio composition and a method for forming a layered or constant ratio composition thin film of individual components of a plurality of targets by rotating the substrate and continuously changing the positions of the plurality of targets have been proposed. . Further, in recent years, a method has been proposed in which the power applied to a plurality of targets in the same region is independently controlled, and a plasma flow from the targets is simultaneously and continuously irradiated to obtain a multi-component thin film (JP-A-59-123768). There is.
(発明が解決しようとする問題点) 従来提案されているシャッター開閉法においては、シャ
ッター開閉のための作動機構がスパッタリング装置内に
必要となり、装置が複雑になりそのうえシャッター部に
ターゲットからの薄膜形成成分が堆積しそれが落下した
りして薄膜そのものが汚染したり異常スパッタリングが
発生したりして薄膜の均一性が阻害される。また基板回
転法においてはその移動(回転)中に薄膜形成のない空
白の時間が生じて酸化等の膜汚染が発生する等の問題点
を有している。複数ターゲットの印加電力を独立に制御
し同時に間断なくプラズマ流を基板に照射した多元薄膜
を形成する方法においては組成構成が均一な薄膜または
膜厚方向に対して連続的に組成構成が変化する薄膜の作
成しかできない。(Problems to be Solved by the Invention) In the conventionally proposed shutter opening / closing method, an operating mechanism for opening / closing the shutter is required in the sputtering apparatus, which complicates the apparatus and forms a thin film from the target on the shutter section. The components are deposited and fall, which contaminates the thin film itself or causes abnormal sputtering, which hinders the uniformity of the thin film. Further, the substrate rotation method has a problem that a blank time during which the thin film is not formed occurs during the movement (rotation) and film contamination such as oxidation occurs. In a method of forming a multi-component thin film in which the power applied to multiple targets is independently controlled and at the same time the substrate is irradiated with a plasma stream without interruption, a thin film having a uniform compositional composition or a compositional composition continuously changing in the film thickness direction Can only create.
(問題点を解決するための手段) 前記従来技術の問題点を解決し、装置が、特にスパッタ
リングチャンバー内が複雑にならず、かつターゲットを
用いて膜厚方向に200Å以下の組成変調周期を有する人
工格子膜あるいは組成変調膜を作成すべく検討の結果本
発明に到達した。すなわち本発明は、2種または3種以
上の複数の種類の原子からなり、膜厚方向に200Å以下
の組成変調周期を有する人工格子膜あるいは組成変調膜
を作成するスパッタリング方法において、ターゲットに
印加する電圧あるいは電流を周期的に変調させることを
特徴とするスパッタリング方法である。(Means for Solving Problems) The problems of the above-mentioned conventional technology are solved, and the apparatus does not particularly complicate the inside of the sputtering chamber, and has a composition modulation period of 200 Å or less in the film thickness direction using the target. As a result of investigations for producing an artificial lattice film or a composition modulation film, the present invention has been reached. That is, the present invention is applied to a target in a sputtering method for producing an artificial lattice film or a composition modulation film, which is composed of a plurality of kinds of atoms of two or more kinds and has a composition modulation period of 200 Å or less in the film thickness direction. The sputtering method is characterized by periodically modulating a voltage or a current.
本発明で作成せんとする薄膜は2種あるいは3種以上の
複数の原子を数Å〜数百Åの厚みの微細膜として層状に
積み重ねて人工周期構造を持つ薄膜である。ここでの数
Å〜数百Åの厚みの微細膜は単一原子からなるものでよ
いしまた酸化物、非晶合金のように複数原子からなるも
のでもよい、またおたがいに積層される該微細層は少な
くとも相異なる微細層からなるものであり、その積層順
は特に限定されるものではないが、一の微細層をA、他
の微細層をB、さらに他の微細層をC・・・としたと
き、膜厚方向に、ABABABABAB・・・、ACBACBACB・・
・、ABABCABABC・・・のように積層されたものが例示で
きる。このようすは、図−3にも例示してあり、本発明
は前記例示したような微細膜が一定の周期で繰り返し多
層に積層された人工格子膜あるいは組成変調膜をスパッ
タリングにより、比較的簡単な装置により、高速かつ経
済的に、精度よく制御された、多様に制御された状態で
作成することのできる方法である。The thin film to be produced in the present invention is a thin film having an artificial periodic structure in which a plurality of atoms of two or more kinds are stacked in layers as a fine film having a thickness of several Å to several hundred Å. The fine film having a thickness of several Å to several hundred Å may be composed of a single atom, or may be composed of a plurality of atoms such as an oxide or an amorphous alloy. Is composed of at least different fine layers, and the stacking order thereof is not particularly limited, but one fine layer is A, another fine layer is B, and another fine layer is C ... , ABABABABAB ..., ACBACBACB ...
., ABABCABABC ... can be exemplified. This is also illustrated in FIG. 3, and the present invention is a comparatively simple method in which an artificial lattice film or a composition modulation film in which the above-described fine films are repeatedly laminated in a constant cycle in multiple layers is formed by sputtering. It is a method that can be produced in a variety of controlled states that are controlled accurately and accurately by a device at high speed.
本発明における組成変調周期とは図−3に示したABAB・
・・の「AB」の−くりかえし単位をいうものであり、AB
ABCABABC・・・のときは「ABABC」の−くりかえし単位
をいう。本発明は該組成変調周期が200Å以下の人工格
子膜あるいは組成変調膜を作成する方法であり、該組成
変調周期が好ましくは150Å以下、さらに好ましくは100
Å以下の人工格子膜あるいは組成変調膜の作成に有効に
適応される方法である。そのくりかえし数は特に限定さ
れるものではないが10以上、好ましくは20以上である。The composition modulation period in the present invention means ABAB · shown in FIG.
.. "AB" -repeating unit
When ABCABABC ... means the repeating unit of “ABABC”. The present invention is a method for producing an artificial lattice film or a composition modulation film having a composition modulation period of 200 Å or less, and the composition modulation period is preferably 150 Å or less, more preferably 100
Å This method is effectively applied to the production of artificial lattice films or composition-modulated films below. The number of repetitions is not particularly limited, but is 10 or more, preferably 20 or more.
かかる微細膜の積層された状態の多元薄膜の作成におい
ては従来のシャッター開閉法、基板回転法等の機械的制
御による方法による作成は困難であり、本発明の電気的
制御による、高速制御、精密制御によらなければならな
い。In the production of such a multi-layered thin film of fine films, it is difficult to produce it by a mechanical control method such as a conventional shutter opening / closing method, a substrate rotation method, and the like. It must be controlled.
本発明において、複数のターゲットを用いる場合、個々
のターゲットへの電圧あるいは電流の印加の制御は、周
波変調あるいは波形変調による制御印加が好ましく、さ
らには周波同期変調あるいは波形同期変調が好ましい。
これらの制御の具体例としては、方形波同期変調、正弦
波同期変調、三角波同期変調が挙げられ、これらの周期
同期変調の周期は200秒以下であり、好ましくは50秒以
下、さらに好ましくは30秒以下である。前記、同期変調
の意味は、複数個のターゲットへの制御印加が、該複数
個のターゲットの個々のターゲット相互の相関において
制御された条件で、個々のターゲットへの印加電圧ある
いは、印加電流が周波的に、あるいは波形状に制御印加
されていることである。In the present invention, when a plurality of targets are used, the control application of voltage or current to each target is preferably frequency modulation or waveform modulation, more preferably frequency synchronous modulation or waveform synchronous modulation.
Specific examples of these controls include square wave synchronous modulation, sine wave synchronous modulation, triangular wave synchronous modulation, and the cycle of these cycle synchronous modulation is 200 seconds or less, preferably 50 seconds or less, more preferably 30 seconds. It is less than a second. The synchronous modulation means that the control voltage applied to the plurality of targets is controlled by the correlation between the targets of the plurality of targets in relation to each other. Controllably or in a wave shape.
具体例としてこれらの周波同期変調あるいは波形同期変
調の1例を図−2に示した。図−2においては、A、B
の二つのターゲットを用い方形波同期変調による印加電
流の制御を示しており、実線はターゲットAへの、破線
はターゲットBへの印加電流を示し、Aについては最初
に0.03Aの電流を7.5秒間印加し次いで7.5秒間0.8Aの電
流を印加する、Bについては最初の15秒間は0.03Aの電
流しか印加せず、Aへの印加が0.03Aに低下したときの
7.5秒間にBに0.8Aの電流を印加していることを示して
おり、以後、適当な回数、Aへの印加とBへの印加が、
0.03Aと0.8Aの値でたがいちがいになされることを繰り
返すことを示しているものである。本発明の適応される
スパッタリング方法は、従来公知のスパッタリング法の
いずれにも可能であるが、具体例としては、マグネトロ
ンスパッタリング方法、二極スパッタリング方法、多極
スパッタリング方法、直流電極スパッタリング方法、高
周波電極スパッタリング方法、物理的スパッタリング方
法、さらには反応を伴う反応性スパッタリング方法等が
挙げられる。本発明は反応性スパッタリングにおいて
は、単数ターゲットを用いることも可能であるが好まし
くは、物理的スパッタリング方法でかつ2種(2個)以
上のターゲットを用いて、個々のターゲットに周期的に
変調させて電圧あるいは電流を制御して印加する方法に
適応できる。As a specific example, one example of these frequency synchronous modulation or waveform synchronous modulation is shown in FIG. In FIG. 2, A and B
Shows the control of the applied current by the square wave synchronous modulation using two targets, the solid line shows the applied current to the target A, the broken line shows the applied current to the target B. For A, 0.03A current is first applied for 7.5 seconds. Then, apply a current of 0.8A for 7.5 seconds. For B, only a current of 0.03A is applied for the first 15 seconds, and when the voltage applied to A drops to 0.03A.
It shows that a current of 0.8A is applied to B in 7.5 seconds, and thereafter, the application to A and the application to B are performed appropriately times.
The values of 0.03A and 0.8A indicate that the mating is repeated. The sputtering method of the present invention is applicable to any conventionally known sputtering method, and specific examples thereof include a magnetron sputtering method, a bipolar sputtering method, a multipolar sputtering method, a DC electrode sputtering method, and a high frequency electrode. Examples thereof include a sputtering method, a physical sputtering method, and a reactive sputtering method involving reaction. In the present invention, it is possible to use a single target in reactive sputtering, but it is preferable to use a physical sputtering method and to use two (two) or more targets to periodically modulate each target. It can be applied to a method of controlling and applying a voltage or a current.
本発明のスパッタリング方法において用いられるターゲ
ットとしては、種々のターゲットが挙げられるが、無機
系のターゲット、好ましくは金属または金属系合金のタ
ーゲットであり、特に好ましくは、多元積層薄膜として
磁性を有する、Fe、Co、Ni、等の遷移金属、Pr、Nd、G
d、Ce、Dy、Tb、Smなどの希土類元素の1種からなるも
のまたはそれらの2種以上の合金である。Examples of the target used in the sputtering method of the present invention include various targets, an inorganic target, preferably a metal or metal-based alloy target, particularly preferably magnetic as a multi-layered thin film, Fe , Co, Ni, transition metals such as Pr, Nd, G
It is composed of one of rare earth elements such as d, Ce, Dy, Tb and Sm, or an alloy of two or more thereof.
以下に実施例を示すが、本発明はこれらに限定されるも
のではない。Examples will be shown below, but the present invention is not limited thereto.
(実施例) [実施例−1] 図−1に示すような装置を用いて、ターゲットAとして
Coを、ターゲットBとしてCuを用い、雰囲気Arガス圧10
ミリトール、Arガス流量10SCC/M、ターゲットAとター
ゲットBの最短距離170mm、基板とターゲットの垂直距
離133mmで、図−2に示した方形波同期変調制御でAに
は最低0.03A、最高0.8Aの電流を各7.5秒間、ターゲット
Bにも同様に、各々の最低電流と最高電流がたがいちが
いになるように印加した。全印加時間は、25.6分であ
る。基板上にできた多層膜は図−3にの模式図に示した
ような膜でありCoが微細膜一層として15Åの膜厚、Cuが
33.75Åの膜厚で交互に多層均一に積層されたもので全
体の多層膜厚は5000Aであった。小角X線回析を行った
ところCoの一層とCuの一層からなる組成変調周期が確認
できた。(Example) [Example-1] As a target A using an apparatus as shown in FIG.
Using Co as the target B and Cu as the target B, atmosphere Ar gas pressure 10
Millitor, Ar gas flow rate 10SCC / M, minimum distance 170mm between target A and target B, vertical distance 133mm between substrate and target. Square wave synchronous modulation control shown in Fig.2, 0.03A minimum for A and 0.8A maximum. In the same manner, each of the currents was applied to the target B for 7.5 seconds so that the minimum current and the maximum current of each of them became different from each other. The total application time is 25.6 minutes. The multilayer film formed on the substrate is a film as shown in the schematic diagram in Fig. 3, where Co is a fine film layer with a thickness of 15Å and Cu is
The film was alternately laminated with a film thickness of 33.75Å, and the total film thickness was 5000A. Small-angle X-ray diffraction confirmed a compositional modulation period consisting of one layer of Co and one layer of Cu.
さらにX線回析からCoの一層の結晶構造は常温安定相の
hcpではなく、高温安定相のfccであることが確認でき
た。Coの相がfccであるのは、Cuの相とエピタキシャル
成長をしたためと考えられる。Furthermore, from X-ray diffraction, the further crystal structure of Co shows that it is stable at room temperature.
It was confirmed that it was not the hcp but the high temperature stable phase fcc. It is considered that the Co phase is fcc because it was epitaxially grown with the Cu phase.
[実施例−2,3,比較例−1] 実施例1と同様に、ターゲットAとしてTbを、ターゲッ
トBとしてFeを用いて実施した。結果を表−1に示す。
実施例−2、実施例−3、比較例−1とも、全薄膜にお
けるTbの比は20原子%にした。比較例−1は、TbFeの合
金単一ターゲットを用いた。[Examples-2 and 3, Comparative Example-1] Similar to Example 1, Tb was used as the target A and Fe was used as the target B. The results are shown in Table-1.
In Example-2, Example-3, and Comparative Example-1, the ratio of Tb in all thin films was set to 20 atom%. Comparative Example-1 used an alloy single target of TbFe.
本発明による実施例−2、実施例−3ともにTe微細薄膜
とFe微細薄膜が均一に多層積層されたものであることが
確認できた。比較例−1に比べて、共に保磁力Hcが大き
く、一軸磁気異方性Kuが大きく、高密度記録で、垂直磁
化の安定性の大きい磁性膜として優れた特性を有してい
ることがわかった。 It was confirmed that in both Example-2 and Example-3 according to the present invention, the Te fine thin film and the Fe fine thin film were uniformly laminated. Compared with Comparative Example-1, both have large coercive force Hc, large uniaxial magnetic anisotropy Ku, high density recording, and excellent characteristics as a magnetic film with high stability of perpendicular magnetization. It was
(発明の効果) スパッタリング法により複数の原子からなる多元薄膜を
作成するに際して、膜厚方向に組成変調周期を有する人
工格子膜、組成変調膜を作成し新規な機能の付与または
従来機能の増加、拡大するために、本発明のターゲット
の個々のターゲットに対しての電圧あるいは電流を周期
変調さすことがきわめてすぐれており、経済的に装置が
簡単で、均一な品質に優れた人工格子膜あるいは組成変
調膜が得られる。(Effect of the invention) When a multi-element thin film composed of a plurality of atoms is formed by a sputtering method, an artificial lattice film having a composition modulation period in the film thickness direction, a composition modulation film is formed to impart a new function or increase conventional functions, For the purpose of expansion, it is extremely advantageous to periodically modulate the voltage or current with respect to the individual targets of the target of the present invention, which is economically simple in device, and has a uniform quality artificial lattice film or composition. A modulation film is obtained.
図−1は本発明に用いられる装置の1例の図であり、図
−2には複数のターゲットでの個々のターゲットに印加
する電流の周期変調の1例を示したものであり、図−3
は本発明によって得られる膜の模式図である。FIG. 1 is a diagram of an example of an apparatus used in the present invention, and FIG. 2 shows an example of periodic modulation of a current applied to each target among a plurality of targets. Three
FIG. 3 is a schematic view of a film obtained by the present invention.
Claims (3)
らなり、膜厚方向に200Å以下の組成変調周期を有する
人工格子膜あるいは組成変調膜を作成するスパッタリン
グ方法において、ターゲットに印加する電圧あるいは電
流を周期的に変調させることを特徴とするスパッタリン
グ方法。1. A sputtering method for producing an artificial lattice film or composition modulation film, which comprises two or more kinds of atoms of a plurality of kinds and has a composition modulation period of 200 Å or less in the film thickness direction, is applied to a target. A sputtering method characterized by periodically modulating voltage or current.
ある特許請求の範囲第1項記載のスパッタリング方法。2. The sputtering method according to claim 1, wherein the target is a plurality of two or three or more targets.
周期的に変調させるときの周期が200秒以下である特許
請求の範囲第1項記載のスパッタリング方法。3. The sputtering method according to claim 1, wherein the period for periodically modulating the voltage or current applied to the target is 200 seconds or less.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31331786A JPH0776418B2 (en) | 1986-12-29 | 1986-12-29 | Sputtering method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31331786A JPH0776418B2 (en) | 1986-12-29 | 1986-12-29 | Sputtering method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63169375A JPS63169375A (en) | 1988-07-13 |
| JPH0776418B2 true JPH0776418B2 (en) | 1995-08-16 |
Family
ID=18039773
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP31331786A Expired - Lifetime JPH0776418B2 (en) | 1986-12-29 | 1986-12-29 | Sputtering method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0776418B2 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07102974B2 (en) * | 1988-07-28 | 1995-11-08 | 松下電器産業株式会社 | Method of manufacturing thin film superconductor |
| JPH02101435A (en) * | 1988-10-11 | 1990-04-13 | Matsushita Electric Ind Co Ltd | Nonlinear optical material and its manufacturing method |
| JP2502744B2 (en) * | 1989-05-12 | 1996-05-29 | 松下電器産業株式会社 | Method of manufacturing thin film super-electric body |
| JP2502743B2 (en) * | 1989-05-12 | 1996-05-29 | 松下電器産業株式会社 | Method of manufacturing thin film superconductor |
-
1986
- 1986-12-29 JP JP31331786A patent/JPH0776418B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63169375A (en) | 1988-07-13 |
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