JPH0777319B2 - Electronic component mounting device - Google Patents
Electronic component mounting deviceInfo
- Publication number
- JPH0777319B2 JPH0777319B2 JP61186008A JP18600886A JPH0777319B2 JP H0777319 B2 JPH0777319 B2 JP H0777319B2 JP 61186008 A JP61186008 A JP 61186008A JP 18600886 A JP18600886 A JP 18600886A JP H0777319 B2 JPH0777319 B2 JP H0777319B2
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- mounting
- suction
- substrate
- electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 claims description 15
- 238000007689 inspection Methods 0.000 claims description 8
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000003287 optical effect Effects 0.000 description 11
- 238000001179 sorption measurement Methods 0.000 description 3
- 239000006185 dispersion Substances 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Geophysics And Detection Of Objects (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】 産業上の利用分野 本発明は電子部品(リードレス部品)をプリント基板上
の所定位置に装着するための部品検査装着に関するもの
である。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a component inspection mounting for mounting an electronic component (leadless component) at a predetermined position on a printed circuit board.
従来の技術 近年、リードレス電子部品(チップ部品)が普及するに
つれて、これらの電子部品を組合せて電子回路を構成す
る装置の高速化及び信頼性が要望されてきている。2. Description of the Related Art In recent years, as leadless electronic components (chip components) have become widespread, there has been a demand for speeding up and reliability of a device that forms an electronic circuit by combining these electronic components.
以下図面を参照しながら、上述した従来の部品検査装置
の一例について説明する。第5図,第6図,第7図は従
来の電子部品検査装置に関するものである。第5図にお
いて、11は回転テーブルで、主軸7を支点として一定の
角度で回転する。4は吸着ノズルで、ガイド3の中で上
下動作ができるように組込まれている。7は送りテープ
で、部品6を一定のピッチにて送る。1は第1テーブル
で、矢印X方向に1ブロックづつ電子部品6を移動させ
る。9は第2テーブルで、基板8を乗せて、矢印XY方向
に動作させることができる。こうした構成によりまず吸
着ポジションにて電子部品6を吸着ノズル4を動作させ
て吸着し、回転テーブル11にて装着ポジションまで移動
させ、基板上にて吸着ノズル4を動作させて、電子部品
6を装着させる。第6図及び第7図は第5図の、ヘッド
部の断面図である。第6図において、10はスプリング
で、吸着ノズル4を一定の力で上側に押し上げている。
21は回り止めピン、23はストッパで、吸着ノズル4を一
定の高さにてストップさせている。20は押えブロック
で、吸着ポジション及び装着ポジションにて、吸着ノズ
ルを上下動作させる。13は排気空圧径路で、メカバルブ
14に連結している。12は真空空圧径路で、分散継手1に
継ながっている。15,17,19はチューブで、それぞれ空圧
のユニットを継いでいる。18は真空スイッチで、空気圧
の差圧により電気信号を送ることができる。第7図にお
いて、24は切換ピストンで、メカバルブ14の中に組込ま
れ、この切換ピストン24が動作することにより真空空圧
径路12から排気空圧径路13に切換わる。同時に逆動作も
できる。An example of the above-described conventional component inspection apparatus will be described below with reference to the drawings. 5, 6, and 7 relate to a conventional electronic component inspection apparatus. In FIG. 5, 11 is a rotary table, which rotates at a constant angle with the spindle 7 as a fulcrum. A suction nozzle 4 is incorporated in the guide 3 so as to be vertically movable. A feeding tape 7 feeds the parts 6 at a constant pitch. Reference numeral 1 denotes a first table, which moves the electronic components 6 in blocks in the direction of arrow X. Reference numeral 9 denotes a second table, on which the substrate 8 can be placed and operated in the directions of arrows XY. With such a configuration, first, the electronic component 6 is sucked by operating the suction nozzle 4 at the suction position, moved to the mounting position on the rotary table 11, and the suction nozzle 4 is operated on the substrate to mount the electronic component 6. Let 6 and 7 are sectional views of the head portion of FIG. In FIG. 6, 10 is a spring, which pushes the suction nozzle 4 upward with a constant force.
Reference numeral 21 is a rotation stop pin, and 23 is a stopper, which stops the suction nozzle 4 at a constant height. 20 is a presser block which moves the suction nozzle up and down at the suction position and the mounting position. 13 is the exhaust air pressure path, mechanical valve
Connected to 14. Reference numeral 12 is a vacuum pneumatic path, which is connected to the dispersion joint 1. Tubes 15,17 and 19 are connected to pneumatic units. 18 is a vacuum switch, which can send an electric signal by the differential pressure of air pressure. In FIG. 7, reference numeral 24 is a switching piston, which is incorporated in the mechanical valve 14, and by operating this switching piston 24, the vacuum pneumatic pressure path 12 is switched to the exhaust pneumatic pressure path 13. At the same time, the reverse operation is possible.
以上のように構成されていた電子部品検査装置につい
て、以下その動作について説明する。吸着ポジションに
て、メカバルブ145にて空圧径路を真空空圧径路12に切
換え、吸着ノズル4を押えブロック20にて下降させて、
電子部品6を吸着し、回転テーブル11にて装着ポジショ
ンに移動させる。そして、押えブロック20にて下降させ
て、基板8に装着させる直前にメカバルブ14にて空圧径
路を真空空圧径路12から排気空圧径路13に切換えて、電
子部品6を基板8の上に装着させる。その時、電子部品
6が基板8に装着されたかを確認する為に、真空スイッ
チ18にて、真空と排気の空気圧差により検査していた。The operation of the electronic component inspection apparatus configured as described above will be described below. At the suction position, the mechanical valve 145 switches the air pressure path to the vacuum air pressure path 12, and the suction nozzle 4 is lowered by the holding block 20.
The electronic component 6 is sucked and moved to the mounting position on the rotary table 11. Then, the mechanical block 14 switches the pneumatic pressure path from the vacuum pneumatic pressure path 12 to the exhaust pneumatic pressure path 13 immediately before mounting it on the board 8 by lowering it by the presser block 20 and mounting the electronic component 6 on the board 8. Put it on. At that time, in order to confirm whether the electronic component 6 was mounted on the substrate 8, the vacuum switch 18 was inspected by the difference in air pressure between vacuum and exhaust.
発明が解決しようとする問題点 しかしながら上記のような構成では、吸着ポジションで
の吸着ミス及び、回転テーブル11にて装着ポジションま
での移動中の落下、メカバルブの動作不良等が発生した
場合、装着ポジションで設定した場所に電子部品が装着
されていない状態でも、装着された信号が真空スイッチ
18から発信される為、信頼性がなかった。そして、基板
8に装着されたとしても、設定した位置に装着されたか
が確認できない為再度、後工程にて確認する必要がある
欠点があった 本発明上記問題点に鑑み、装着ポジションで基板8に装
着された電子部品自体を検査させて、信頼性を向上させ
るものである。Problems to be Solved by the Invention However, in the above-mentioned configuration, when a suction error at the suction position, a drop during movement to the mounting position on the rotary table 11, a malfunction of the mechanical valve, etc. occur, the mounting position Even if electronic parts are not installed at the location set in step 1, the installed signal will be the vacuum switch.
Since it was sent from 18, it was not reliable. Even if the substrate 8 is mounted on the substrate 8, it cannot be confirmed whether the substrate 8 is mounted at the set position or not, so that there is a drawback that it is necessary to confirm it again in a subsequent step. In view of the above problem of the present invention, the substrate 8 is mounted at the mounting position. The electronic component itself mounted is inspected to improve reliability.
問題点を解決するための手段 上記問題点を解決するために本発明は、回転可能ぱテー
ブルの周辺に、電子部品を吸着可能な吸着ヘッドを複数
個配置してなる電子部品装着装置であって、前記吸着ヘ
ッドにより吸着された電子部品を所定ポジションで基板
上に装着する際、前記所定ポジションにおける基板上の
部品が装着される位置に対して光を照射し、その反射光
を受光する事により装着後の電子部品の有無を検査する
検査手段を、前記吸着ヘッドとは別体に構成したもので
ある。Means for Solving the Problems In order to solve the above problems, the present invention provides an electronic component mounting apparatus in which a plurality of suction heads capable of sucking electronic components are arranged around a rotatable table. When the electronic component sucked by the suction head is mounted on the substrate at a predetermined position, the position where the component on the substrate is mounted at the predetermined position is irradiated with light and the reflected light is received. An inspection means for inspecting the presence or absence of the electronic component after mounting is configured separately from the suction head.
作用 この技術的手段による作用は次のようになる。すなわ
ち、吸着ノズルにて吸着された電子部品を、装着ポジシ
ョンに設けられた複数の光学式検出器により、基板上に
装着された電子部品を直接検出して確認するため、動作
中トラブルによる装着ミスがなくなる。この結果装着に
おいて信頼性が高くなる。Action The action of this technical means is as follows. In other words, the electronic components picked up by the suction nozzle are directly detected by the multiple optical detectors installed at the mounting position to confirm the electronic components mounted on the board. Disappears. As a result, reliability is improved in mounting.
実 施 例 以下、本発明の一実施例を添付図にもとづいて説明す
る。第1〜3図において、30は回転テーブルで、29の主
軸と支点として一定の角度で回転する。31はガイドで、
回転テーブル30に分割して取付いている。37は吸着ノズ
ルで、ガイド31に取付いている。44は回り止めピン、49
はストッパーで、吸着ノズル37を一定の高さでストップ
させている。38はスプリングで、吸着ノズル37を一定の
力で上側に押し上げている。43は押え付けブロックで、
吸着ポジション及び装着ポジションにて、吸着ノズル37
を上下動作させる。28は排気空圧径路で、メカバルブ46
に継がっている。26は真空空圧径路で、分散継手48に継
がっている。47,45はチューブで、それぞれ空圧のユニ
ットを継いでいる。第4図において、メカバルブ46の中
に、第7図の24で示すのと同様の切換ピストンが組み込
まれ、この切換ピストンが動作することにより真空空圧
径路26から排気空圧径路28に切換わる。同時に逆動作も
できる。第1図と第2図において、35は第1光学式検出
器で、ボルト36にて、33のブラケットに取付けられてい
る。32は固定ブロックで、ボルト34にて、ブラケット33
を固定させている。50は、第2光学式検出器で、ボルト
にて、ブラケットに第1光学検出器35と同様に取り付け
られている。41は電子部品で、吸着ポジションから吸着
ノズル37にて吸着され、回転テーブル30にて、装着ポジ
ションまで移行される。42は基板で、この基板42上に吸
着ノズル37にて吸着された電子部品41が上面に装着され
る。39は投光軸で、基板42の上に装着された電子部品に
光を投光させる。39は投光軸にて装着された電子部品に
投光された光は反射して40の受光軸に受光され電子部品
の検出をおこなう。Example Hereinafter, an example of the present invention will be described with reference to the accompanying drawings. In FIGS. 1 to 3, reference numeral 30 denotes a rotary table, which rotates at a constant angle as a fulcrum with 29 spindles. 31 is a guide,
The rotary table 30 is divided and attached. 37 is a suction nozzle, which is attached to the guide 31. 44 is a rotation stop pin, 49
Is a stopper that stops the suction nozzle 37 at a constant height. Reference numeral 38 is a spring, which pushes the suction nozzle 37 upward with a constant force. 43 is a holding block,
In the suction position and the mounting position, the suction nozzle 37
Up and down. 28 is the exhaust air pressure path, mechanical valve 46
Has been succeeded by. 26 is a vacuum pneumatic path, which is connected to the dispersion joint 48. 47 and 45 are tubes, each of which is connected to a pneumatic unit. In FIG. 4, a switching piston similar to that shown at 24 in FIG. 7 is incorporated in the mechanical valve 46, and the vacuum pneumatic path 26 is switched to the exhaust pneumatic path 28 by the operation of this switching piston. . At the same time, the reverse operation is possible. In FIGS. 1 and 2, reference numeral 35 denotes a first optical detector, which is attached to the bracket 33 by bolts 36. 32 is a fixed block, and the bracket 33 with the bolt 34
Is fixed. 50 is a second optical detector, which is attached to the bracket with bolts in the same manner as the first optical detector 35. Reference numeral 41 denotes an electronic component, which is sucked by the suction nozzle 37 from the suction position and is moved to the mounting position by the rotary table 30. Reference numeral 42 denotes a substrate on which the electronic component 41 sucked by the suction nozzle 37 is mounted on the upper surface. A light projecting axis 39 projects light onto an electronic component mounted on the substrate 42. Reference numeral 39 reflects the light projected on the electronic component mounted on the light emitting axis and is received by the light receiving axis of 40 to detect the electronic component.
この電子部品検査装置の構造を第1図〜第4図にもとづ
いて、さらに詳しく説明する。第3図は、電子部品吸着
装置の正面図で、第4図は、第3図の平面図である。こ
れらの図において、吸着ポジションから、吸着ノズル37
にて、吸着された電子部品41を回転テーブル30にて、装
着ポジションに移行させる。そして、装着ポジションに
て、吸着ノズル37を下降させると同時に、メカバルブ46
にて、真空空圧径路26から排気空圧径路28に切換えて、
基板42の上面に電子部品41を装着させる。そして、装着
直後に第1光学式検出器を動作させて、電子部品41の装
着有無確認をし、第2光学検出器も同時に動作させて、
電子部品41の位置検出をおこない、これらの信号を後工
程にフィードバックをする。The structure of the electronic component inspection device will be described in more detail with reference to FIGS. 1 to 4. FIG. 3 is a front view of the electronic component suction device, and FIG. 4 is a plan view of FIG. In these figures, from the suction position, the suction nozzle 37
Then, the sucked electronic component 41 is moved to the mounting position on the rotary table 30. Then, at the mounting position, the suction nozzle 37 is lowered, and at the same time, the mechanical valve 46
, Switch from vacuum air pressure path 26 to exhaust air pressure path 28,
The electronic component 41 is mounted on the upper surface of the substrate 42. Immediately after mounting, the first optical detector is operated to check whether or not the electronic component 41 is mounted, and the second optical detector is also operated at the same time.
The position of the electronic component 41 is detected, and these signals are fed back to the subsequent process.
尚、本実施例では、電子部品ぽ有無を検査したが、部品
の表裏を検査することも可能であり、さらに部品に数点
の光軸を同時にあて、装着後の部品のずれ、有無、表裏
の検査をすることもできる。In this embodiment, the presence / absence of the electronic component is inspected, but it is also possible to inspect the front and back of the component. Furthermore, several optical axes are applied to the component at the same time, and the displacement, presence / absence, and front / back of the component after mounting are confirmed. You can also inspect.
発明の効果 以上、本発明は電子部品装置の一ユニットであって装着
ポジションにて、基板上に装着された電子部品を装着直
後に、光学式検出器にて装着ポイントに光を投下させ
て、電子部品の有無検出及び位置ズレ検出をおこなう光
学式検出器を使用しており基板上に装着された電子部品
の品質が高い装着ができる。As described above, the present invention is one unit of the electronic component device, and at the mounting position, immediately after mounting the electronic component mounted on the substrate, the optical detector causes light to be projected onto the mounting point, An optical detector that detects the presence / absence of an electronic component and detects a positional shift is used, and the electronic component mounted on the board can be mounted with high quality.
第1図は本発明の一実施例における電子部品検出装置の
要部正面図、第2図は同平面図、第3図は電子部品吸着
装置の要部正面断面図、第4図は同平面断面図、第5図
は従来の電子部品吸着装置の斜視図、第6図は電子部品
吸着装置の正面断面図、第7図は同平面断面図である。 30……回転テーブル、35……第1光学式検出器、37……
吸着ノズル、41……電子部品、42……基板、50……第2
光学検出器。FIG. 1 is a front view of essential parts of an electronic component detecting device according to an embodiment of the present invention, FIG. 2 is a plan view of the same, FIG. 3 is a front sectional view of essential parts of an electronic component suction device, and FIG. A sectional view, FIG. 5 is a perspective view of a conventional electronic component adsorption device, FIG. 6 is a front sectional view of the electronic component adsorption device, and FIG. 7 is a plan sectional view of the same. 30 …… Rotary table, 35 …… First optical detector, 37 ……
Adsorption nozzle, 41 ... Electronic parts, 42 ... Substrate, 50 ... Second
Optical detector.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 瀬野 眞透 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (56)参考文献 特開 昭60−175483(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Shintoru Seno 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (56) References JP-A-60-175483 (JP, A)
Claims (2)
吸着可能な吸着ヘッドを複数個配置してなる電子部品装
着装置であって、前記吸着ヘッドにより吸着された電子
部品を所定ポジションで基板上に装着する際、前記所定
ポジションにおける基板上の部品が装着される位置に対
して光を照射し、その反射光を受光する事により装着後
の電子部品の有無を検査する検査手段を、前記吸着ヘッ
ドとは別体に構成してなる電子部品装着装置。1. An electronic component mounting apparatus comprising a plurality of suction heads capable of sucking electronic components around a rotatable table, wherein the electronic components sucked by the suction heads are placed on a substrate at a predetermined position. When mounting on top, an inspection means for inspecting the presence or absence of the electronic component after mounting by irradiating light to the position where the component on the board is mounted at the predetermined position and receiving the reflected light is provided. An electronic component mounting device configured separately from the suction head.
後の電子部品の位置ずれ、有無、裏表の検査を可能に設
けられた特許請求の範囲第1項記載の電子部品装着装
置。2. The electronic component mounting apparatus according to claim 1, wherein the inspection means is provided so as to irradiate several points of light at the same time to inspect the positional deviation, presence / absence, and front / back of the electronic component after mounting. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61186008A JPH0777319B2 (en) | 1986-08-07 | 1986-08-07 | Electronic component mounting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61186008A JPH0777319B2 (en) | 1986-08-07 | 1986-08-07 | Electronic component mounting device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6342200A JPS6342200A (en) | 1988-02-23 |
| JPH0777319B2 true JPH0777319B2 (en) | 1995-08-16 |
Family
ID=16180756
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61186008A Expired - Lifetime JPH0777319B2 (en) | 1986-08-07 | 1986-08-07 | Electronic component mounting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0777319B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7346419B2 (en) | 2001-11-13 | 2008-03-18 | Cyberoptics Corporation | Component feeder exchange diagnostic tool |
| US7545514B2 (en) | 2005-09-14 | 2009-06-09 | Cyberoptics Corporation | Pick and place machine with improved component pick image processing |
| US7559134B2 (en) | 2003-11-04 | 2009-07-14 | Cyberoptics Corporation | Pick and place machine with improved component placement inspection |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60175483A (en) * | 1984-02-20 | 1985-09-09 | 三洋電機株式会社 | Method of detecting displacement of position of chip part |
-
1986
- 1986-08-07 JP JP61186008A patent/JPH0777319B2/en not_active Expired - Lifetime
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7346419B2 (en) | 2001-11-13 | 2008-03-18 | Cyberoptics Corporation | Component feeder exchange diagnostic tool |
| US7346420B2 (en) | 2001-11-13 | 2008-03-18 | Cyberoptics Corporation | Component feeder exchange diagnostic tool |
| US7555831B2 (en) | 2001-11-13 | 2009-07-07 | Cyberoptics Corporation | Method of validating component feeder exchanges |
| US7559134B2 (en) | 2003-11-04 | 2009-07-14 | Cyberoptics Corporation | Pick and place machine with improved component placement inspection |
| US7545514B2 (en) | 2005-09-14 | 2009-06-09 | Cyberoptics Corporation | Pick and place machine with improved component pick image processing |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6342200A (en) | 1988-02-23 |
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