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JPH0779036B2 - High precision plasma energy distribution measuring device - Google Patents
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JPH0779036B2 - High precision plasma energy distribution measuring device - Google Patents

High precision plasma energy distribution measuring device

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Publication number
JPH0779036B2
JPH0779036B2 JP62251199A JP25119987A JPH0779036B2 JP H0779036 B2 JPH0779036 B2 JP H0779036B2 JP 62251199 A JP62251199 A JP 62251199A JP 25119987 A JP25119987 A JP 25119987A JP H0779036 B2 JPH0779036 B2 JP H0779036B2
Authority
JP
Japan
Prior art keywords
circuit
energy distribution
output
staircase
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62251199A
Other languages
Japanese (ja)
Other versions
JPH0195495A (en
Inventor
和男 清水
宏 雨宮
雄一 坂本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
RIKEN
Original Assignee
RIKEN
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by RIKEN filed Critical RIKEN
Priority to JP62251199A priority Critical patent/JPH0779036B2/en
Publication of JPH0195495A publication Critical patent/JPH0195495A/en
Publication of JPH0779036B2 publication Critical patent/JPH0779036B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Plasma Technology (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はエネルギー分布を測定する装置に係わるもので
あり、特に、ガス放電プラズマ中の電子のエネルギー分
布を高精度で測定する装置に関する。
Description: TECHNICAL FIELD The present invention relates to an apparatus for measuring energy distribution, and more particularly to an apparatus for measuring the energy distribution of electrons in a gas discharge plasma with high accuracy.

(従来の技術) プラズマ内の電子が等方分布をなす場合の電子のエネル
ギー分布は、プローブ電圧電流特性の2次微分に比例す
ることがドリベスタインによって証明され、以来、上記
特性の2次微分を求める方法として、主として交流重畳
法が多用されてきた。
(Prior Art) It has been proved by Drivestein that the energy distribution of electrons when the electrons in plasma have an isotropic distribution is proportional to the second derivative of the probe voltage-current characteristic. The alternating current superposition method has been mainly used as a method for obtaining the same.

この交流重畳法は、ある範囲で変化するプローブ電圧に
微少振幅の交流を重畳し、上記特性の2次微分値に比例
する周波数成分を検出してエネルギー分布を求めてい
た。
In this AC superposition method, an AC having a small amplitude is superposed on a probe voltage that changes in a certain range, and a frequency component proportional to the second derivative of the above characteristic is detected to obtain an energy distribution.

第2図は、この交流重量法を実施するための従来装置の
ブロック図である。掃引電圧発生回路13から発生される
掃引電圧に、交流電圧発生源9から発生する周波数fの
信号をプラズマ中に挿入されたプローブPに与える。選
択増幅器10はプローブ電流の各周波数成分の中から、エ
ネルギー分布信号に対応する周波数成分2fのみを増幅す
る。選択増幅器10の出力信号は、参照信号発生回路11の
参照信号を受ける信号検出回路12によって、所定位相で
検波され、エネルギー分布が求められる。
FIG. 2 is a block diagram of a conventional apparatus for carrying out this AC gravimetric method. A signal having a frequency f generated from the AC voltage generation source 9 is applied to the sweep voltage generated from the sweep voltage generation circuit 13 to the probe P inserted in the plasma. The selective amplifier 10 amplifies only the frequency component 2f corresponding to the energy distribution signal from the frequency components of the probe current. The output signal of the selective amplifier 10 is detected in a predetermined phase by the signal detection circuit 12 that receives the reference signal of the reference signal generation circuit 11, and the energy distribution is obtained.

(発明が解決しようとする問題点) 一般に、交流重畳法は測定対象のプラズマにシースを通
して常時交流信号を印加する必要がある。特に、プラズ
マ中の雑音が大きい場合には、エネルギー分布信号の信
号対雑音比を確保するために、おのずと交流信号の振幅
を増大させる必要がある。一方、プラズマ自身はイオン
振動や電子振動に基づく不安定性を有するために上記交
流信号の印加はプラズマの状態を擾乱することになる。
プラズマ中に波動を励起させた場合には実際の分布関数
とは異なった形のものを測定する結果に導かれる。ここ
に交流重畳法の測定法自体の信頼性の限界がある。
(Problems to be Solved by the Invention) Generally, in the AC superposition method, it is necessary to constantly apply an AC signal to plasma to be measured through a sheath. In particular, when the noise in the plasma is large, it is necessary to naturally increase the amplitude of the AC signal in order to secure the signal-to-noise ratio of the energy distribution signal. On the other hand, since the plasma itself has instability due to ion vibration or electron vibration, the application of the AC signal disturbs the plasma state.
When a wave is excited in plasma, it leads to the result of measuring a shape different from the actual distribution function. There is a limit to the reliability of the measurement method itself of the AC superposition method.

(問題点を解決するための手段) 上述した問題点は、階段波電圧発生回路、この階段波出
力に応じて流れるプローブ電流の検出回路、前記階段波
出力をバイアスするための直流安定化電源、バイアス後
の階段波出力に応じて流れるプローブ電流の検出回路、
前記2つの電流検出回路の両出力の減算回路、減算回路
の出力を受け、その大きさに応じた周波数のパルスを発
生する周波数変調回路、周波数変調回路の出力パルスを
受け、所定時間これを計数する計数回路、この計数回路
の計数結果に演算を施す演算回路を備えるプラズマエネ
ルギー分布測定装置によって解決することができる。
(Means for Solving Problems) The above-mentioned problems include a staircase voltage generating circuit, a detection circuit for a probe current flowing according to the staircase output, a DC stabilized power supply for biasing the staircase output, Detection circuit of probe current flowing according to staircase wave output after bias,
A subtraction circuit of both outputs of the two current detection circuits, a frequency modulation circuit that receives the output of the subtraction circuit, generates a pulse of a frequency according to the magnitude, receives an output pulse of the frequency modulation circuit, and counts this for a predetermined time It is possible to solve the problem by a plasma energy distribution measuring device including a counting circuit for performing the calculation, and a calculation circuit for calculating the counting result of the counting circuit.

即ち、本発明は、プローブ電圧を階段状に変化せしめ、
各階段におけるプローブ電流の2次差分を求めるもの
で、交流信号の印加を不必要とせしめ、かつ差分過程に
おいて平滑作用が導入され、高精度でエネルギー分布を
測定することができる。
That is, the present invention changes the probe voltage stepwise,
This is to obtain the second-order difference of the probe current in each staircase, which makes the application of an AC signal unnecessary, and the smoothing action is introduced in the difference process, so that the energy distribution can be measured with high accuracy.

なお、階段波の上昇速度は従来法の掃引掃速度と同程度
とするのが好ましい。
In addition, it is preferable that the rising speed of the staircase wave be approximately the same as the sweeping speed of the conventional method.

(作用および発明の効果) 一般に、プローブ信号には各種の雑音が混在しているた
め、これに差分操作を施すと雑音成分が強調されて信号
対雑音比が著しく低下する。
(Operation and Effect of the Invention) In general, since various noises are mixed in the probe signal, the noise component is emphasized when the differential operation is performed on the probe signal, and the signal-to-noise ratio is significantly lowered.

本発明においては、2つのプローブを用いて雑音の同相
成分を相殺しながら1次差分を求め、更に周波数変調回
路と計数回路を用いて、上記1次差分信号に対し、プロ
ーブ電圧の各階段毎に加算平均処理を施した後、2次差
分処理を行ってエネルギー分布信号を得ている。このた
め、信号対雑音比および分解能が高められ、従って、交
流重畳法において不可避なプラズマへの擾乱効果を伴う
ことがなく、かつ高精度のエネルギー分布測定を可能な
らしめる。
In the present invention, two probes are used to cancel the in-phase component of noise to obtain a first-order difference, and a frequency modulation circuit and a counting circuit are further used for each step of the probe voltage with respect to the first-order difference signal. After the averaging process is performed on, the secondary difference process is performed to obtain the energy distribution signal. For this reason, the signal-to-noise ratio and the resolution are improved, and therefore, it is possible to perform the energy distribution measurement with high accuracy without accompanying the unavoidable disturbance effect on the plasma in the AC superposition method.

(実施例) 以下に、本発明の一実施例である第1図のブロック図を
用いて詳細に説明する。
(Embodiment) A detailed description will be given below with reference to the block diagram of FIG. 1, which is an embodiment of the present invention.

階段波電圧発生回路1は、第3図にV2として示される様
な階段状に変化する電圧を発生する。直流安定化電源2
は階段状の一電圧変化分に等しい電圧を発生し、電圧V1
をバイアスして電圧V2を作り出す。階段状電圧V1、V2
それぞれプラズマ中に設置されたプローブ電極P1、P2
加えられる。プローブ電極P1、P2には印加電圧に応じて
第4図に示される様なプローブ電流ip1、ip2が流れる。
各プローブ電流は、電流検出回路3および4によって、
それぞれ検出され、続く減算回路5においてこれら両プ
ローブ電流ip1、ip2の差(ip1−ip2)が求められる。減
算回路5の出力量はプローブ電圧電流特性の1次差分に
相当するもので、これは周波数変調回路6においてパル
ス数に変換された後、計数回路7において上記階段波電
圧の各階段区間毎に計数される。この電圧一周波数変換
および計数過程において、各区間毎に平滑作用が生じる
ことになる。演算回路8においては前の区間Tn-1と次の
区間Tnにおける計数結果の差が求められる。この結果、
第5図に示される様にプローブ線圧電流特性の2次差分
に比例したエネルギー分布信号Yが得られる。
The staircase voltage generating circuit 1 generates a voltage that changes stepwise as shown as V 2 in FIG. DC stabilized power supply 2
Generates a voltage equal to one step change in voltage, and the voltage V 1
Is biased to generate voltage V 2 . The step voltages V 1 and V 2 are applied to the probe electrodes P 1 and P 2 placed in the plasma, respectively. Probe currents ip 1 and ip 2 as shown in FIG. 4 flow through the probe electrodes P 1 and P 2 depending on the applied voltage.
Each probe current is detected by the current detection circuits 3 and 4.
Each of them is detected, and the difference (ip 1 −ip 2 ) between these probe currents ip 1 and ip 2 is obtained in the subsequent subtraction circuit 5. The output amount of the subtraction circuit 5 corresponds to the first-order difference of the probe voltage-current characteristics. Counted. In this voltage-frequency conversion and counting process, a smoothing action occurs in each section. The arithmetic circuit 8 obtains the difference between the count results in the previous section T n-1 and the next section T n . As a result,
As shown in FIG. 5, an energy distribution signal Y proportional to the second-order difference of the probe linear pressure-current characteristic is obtained.

【図面の簡単な説明】[Brief description of drawings]

第1図は、本発明に基づくプラズマエネルギー分布測定
装置の回路を示すブロック図、 第2図は、交流重畳法による従来の測定回路のブロック
図である。 第3図は、二つのプローブに印加される階段状のプロー
ブ電圧波形図、 第4図は、二つのプローブから得られるプーロブ電圧波
形図、 第5図は本発明により得られるプラズマエネルギー分布
を表す図。 (符号の説明) P1、P2……プローブ電極、Y……エネルギー分布信号、
1……階段波電圧発生回路、2……直流安定化電源、
3、4……電流検出回路、5……減算回路、6……電圧
・周波数変換器、7……計数回路、8……演算回路、9
……交流電圧発生回路、10……選択増幅器、11……参照
信号発生回路、12……信号検出回路、13……掃引電圧発
生回路。
FIG. 1 is a block diagram showing a circuit of a plasma energy distribution measuring device according to the present invention, and FIG. 2 is a block diagram of a conventional measuring circuit by an AC superposition method. FIG. 3 is a stepwise probe voltage waveform diagram applied to two probes, FIG. 4 is a Purob voltage waveform diagram obtained from two probes, and FIG. 5 is a plasma energy distribution obtained by the present invention. Fig. (Explanation of symbols) P 1 , P 2 ... probe electrode, Y ... energy distribution signal,
1 ... Staircase voltage generator, 2 ... DC stabilized power supply,
3, 4 ... Current detection circuit, 5 ... Subtraction circuit, 6 ... Voltage / frequency converter, 7 ... Counting circuit, 8 ... Arithmetic circuit, 9
...... AC voltage generator, 10 …… Selective amplifier, 11 …… Reference signal generator, 12 …… Signal detector, 13 …… Sweep voltage generator.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】階段波電圧発生回路、この階段波出力に応
じて流れるプローブ電流の第1の検出回路、前記階段波
出力をバイアスするための直流安定化電源、バイアス後
の階段波出力に応じて流れるプローブ電流の第2の検出
回路、前記2つの電流検出回路の両出力の減算回路の出
力を受け、その大きさに応じた周波数のパルスを発生す
る周波数変調回路、周波数変調回路の出力パルスを受
け、所定時間これを計数する計数回路、この計数回路の
前の計数結果とその次の計数結果との差を求める演算を
施す演算回路を備える高精度プラズマエネルギー分布測
定装置。
1. A staircase voltage generating circuit, a first detection circuit of a probe current flowing according to the staircase output, a DC stabilized power supply for biasing the staircase output, and a staircase wave output after the bias. Output circuit of the frequency modulation circuit, which receives the outputs of the second detection circuit of the probe current flowing through the output circuit and the subtraction circuit of both outputs of the two current detection circuits, and generates the pulse of the frequency according to the magnitude A high-accuracy plasma energy distribution measuring device comprising a counting circuit for receiving the counting result for a predetermined time, and a computing circuit for computing the difference between the counting result before this counting circuit and the subsequent counting result.
JP62251199A 1987-10-05 1987-10-05 High precision plasma energy distribution measuring device Expired - Fee Related JPH0779036B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62251199A JPH0779036B2 (en) 1987-10-05 1987-10-05 High precision plasma energy distribution measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62251199A JPH0779036B2 (en) 1987-10-05 1987-10-05 High precision plasma energy distribution measuring device

Publications (2)

Publication Number Publication Date
JPH0195495A JPH0195495A (en) 1989-04-13
JPH0779036B2 true JPH0779036B2 (en) 1995-08-23

Family

ID=17219159

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62251199A Expired - Fee Related JPH0779036B2 (en) 1987-10-05 1987-10-05 High precision plasma energy distribution measuring device

Country Status (1)

Country Link
JP (1) JPH0779036B2 (en)

Also Published As

Publication number Publication date
JPH0195495A (en) 1989-04-13

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