JPH0779182B2 - Semiconductor laser device - Google Patents
Semiconductor laser deviceInfo
- Publication number
- JPH0779182B2 JPH0779182B2 JP25535787A JP25535787A JPH0779182B2 JP H0779182 B2 JPH0779182 B2 JP H0779182B2 JP 25535787 A JP25535787 A JP 25535787A JP 25535787 A JP25535787 A JP 25535787A JP H0779182 B2 JPH0779182 B2 JP H0779182B2
- Authority
- JP
- Japan
- Prior art keywords
- laser device
- semiconductor laser
- region
- wavelength
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/0625—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in multi-section lasers
- H01S5/06255—Controlling the frequency of the radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
Landscapes
- Semiconductor Lasers (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、半導体レーザ装置,特に発振波長を変化さ
せ得るようにした半導体レーザ装置に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor laser device, and more particularly to a semiconductor laser device capable of changing an oscillation wavelength.
従来から、一般的な半導体レーザ装置においては、その
光導波路が直線状に形成されているのが普通である。し
かして、この種の半導体レーザ装置の場合、その発振波
長を変化させるための手段としては、温度を変化させる
方法と、光導波路の屈折率を変化させる方法との何れか
ゞ採用されている。Conventionally, in a general semiconductor laser device, its optical waveguide is usually formed in a linear shape. Thus, in the case of this type of semiconductor laser device, either a method of changing the temperature or a method of changing the refractive index of the optical waveguide is adopted as a means for changing the oscillation wavelength.
こゝで、前者の温度を変化させる方法は、例えば、AlGa
As系のいわゆる短波長レーザ装置の場合,ペルチェ素子
などを用いて、活性層の温度を上昇,低下させることに
より、約3Å/度の割合でその発振波長を短波長,長波
長側に変化させるようにするか、あるいは、活性層に流
す注入電流を増減させることにより、同様にこの活性層
の温度を変えて、その発振波長を変化させるようにして
いる。すなわち,この場合には、温度の上昇に伴なつて
活性層の禁制帯幅が狭くなり、発振波長が長波長側へ移
ると共に、併せて、その熱膨張によつて共振器長が僅か
に長く,かつ屈折率も密度の下つた分だけ小さくされ、
これらの競合によつて決まる縦モード上を次々に跳びな
がら、その発振波長が長波長化されるのである。Here, the former method of changing the temperature is, for example, AlGa
In the case of an As-based so-called short-wavelength laser device, the Peltier element or the like is used to raise or lower the temperature of the active layer to change its oscillation wavelength to short-wavelength or long-wavelength side at a rate of about 3Å / degree. Alternatively, or by increasing or decreasing the injection current supplied to the active layer, the temperature of the active layer is similarly changed to change the oscillation wavelength. That is, in this case, the band gap of the active layer becomes narrower as the temperature rises, the oscillation wavelength shifts to the long wavelength side, and at the same time, the resonator length becomes slightly longer due to the thermal expansion. , And the refractive index is also reduced by the lower part of the density,
The oscillation wavelength is lengthened while jumping one after another on the longitudinal modes determined by these competitions.
また、後者の屈折率を変化させる方法の有力な一つであ
るフランツ・ケルデッシュ効果を利用するものは、活性
層への逆バイアスによる高い電界の印加により、その屈
折率がほゞ10-4程度の範囲に亘つて変化するのを利用し
たもので、キャリア濃度とバイアス条件とを最適に選択
することにより、この屈折率を10-3程度まで変化させ得
るのである。The latter method, which utilizes the Franz-Keldesh effect, which is one of the most effective methods of changing the refractive index, has a refractive index of about 10 -4 when a high electric field is applied to the active layer by reverse bias. The refractive index can be changed to about 10 −3 by optimally selecting the carrier concentration and the bias condition.
しかしながら、前記した従来の手段のうち,前者の温度
を変化させる方法の場合には、熱容量によつて速度が制
限されるほか、波長の変化と共にしきい値が変わるため
に、同時にその光出力も変化して、限られた用途にしか
適用できず、また、後者の屈折率を変化させる方法の場
合には、逆バイアスを効果的にかけるのに、活性層と増
幅領域とを電気的に絶縁する必要があり、この電気的絶
縁に主眼点を置くと光学的損失が大きく、かつ反対に光
学的損失を抑制しようとすると絶縁が困難になると云う
問題点があつた。However, in the case of the former method of changing the temperature among the above-mentioned conventional means, the speed is limited by the heat capacity, and the threshold value changes with the change of the wavelength. However, in the latter method of changing the refractive index, the active layer and the amplification region are electrically insulated from each other in order to effectively apply the reverse bias. However, there is a problem that the optical loss is large when the focus is placed on the electrical insulation, and conversely, the insulation becomes difficult when the optical loss is suppressed.
従つて、この発明の目的とするところは、従来例装置で
のこのような問題点に鑑み、温度とか光出力に関係なく
発振波長を独立に変化させ得るようにした,この種の半
導体レーザ装置を提供することである。Accordingly, the object of the present invention is, in view of such a problem in the conventional device, a semiconductor laser device of this kind which can independently change the oscillation wavelength regardless of the temperature or the optical output. Is to provide.
前記目的を達成させるために、この発明では、半導体レ
ーザ装置における光導波路をして、従来例装置でのよう
に直線状とせずに、曲率の異なる少なくとも二つ以上の
彎曲部を有する形状とし、pn接合部におけるキャリアの
空間的分布を注入電流の大小で変化させて光の通る経路
を変え、これによつて発振波長を独立に変化させ得るよ
うにしたものである。In order to achieve the above-mentioned object, in the present invention, the optical waveguide in the semiconductor laser device is formed into a shape having at least two or more curved portions with different curvatures, instead of being linear as in the conventional device, The spatial distribution of carriers in the pn junction is changed depending on the magnitude of the injected current to change the path of light, thereby making it possible to change the oscillation wavelength independently.
こゝで、この発明における作動原理につき、第1図を参
照して述べる。The operating principle of the present invention will be described with reference to FIG.
今,所定の角度(ラジアン)θをもつ一対の反射面間に
半径Rの彎曲部によるpn接合が形成されているものとす
る。Now, it is assumed that a pn junction having a curved portion with a radius R is formed between a pair of reflecting surfaces having a predetermined angle (radian) θ.
しかして、この場合には、順方向電流Iのときに、曲率
半径Rの経路が利得最大線aとなるが、この順方向電流
をΔIだけ増加させることによつて、その電子密度も増
加するため、これに伴なつて、今度は、ΔRだけp側に
寄つた部分が利得最大線bとなる。In this case, however, when the forward current I is applied, the path having the radius of curvature R becomes the maximum gain line a. By increasing the forward current by ΔI, the electron density is also increased. Therefore, in connection with this, this time, the maximum gain line b is the portion that is closer to the p side by ΔR.
従つて、注入電流が一定値Iのときには、これがRθの
長さの光路を辿つて、波長λ Nは実効屈折率,mは共振縦モード次数を表わす整数)で
発振することになるが、この注入電流がΔIだけ増加し
て、その値がI+ΔIになると、これが(R+ΔI)θ
の長さの光路を辿るために、その発振長は、 のように長くなる。Therefore, when the injection current has a constant value I, it follows an optical path having a length of Rθ and a wavelength λ N oscillates with an effective refractive index, and m is an integer representing the resonance longitudinal mode order. However, when this injection current increases by ΔI and the value becomes I + ΔI, this becomes (R + ΔI) θ
In order to follow the optical path of Become longer.
但し、この場合,実際は、注入電流密度を増すことによ
つて、利得のエネルギー分布が高エネルギー側へ移動す
る効果と、また、たとえ僅かであるとはいえ、温度上昇
により禁制帯幅が狭まつて低エネルギー側へ移動する効
果との,各効果の相乗作用で決められる利得最大波長に
最接近した波長の縦モード次数で発振するために、その
発振波長は、第2図(a)に太線で示したように、一般
的に或る範囲内で連続的に変化し、その後,非連続的
(段階状)に別の縦モード次数に移ることになる。However, in this case, in practice, the effect of increasing the injection current density is to move the energy distribution of gain to the high energy side, and even if it is slight, the forbidden band width is narrowed by the temperature rise. In order to oscillate in the longitudinal mode order of the wavelength closest to the gain maximum wavelength determined by the synergistic effect of each effect with the effect of moving to the low energy side, the oscillation wavelength is shown by the thick line in Fig. 2 (a). As shown in (1), it generally changes continuously within a certain range, and then moves to another longitudinal mode order discontinuously (stepwise).
またこゝで、前記曲率半径Rと角度θとを適切に設定す
れば、共振縦モード線を利得最大線に平行にさせ得て、
広い電流範囲で連続的な波長変化を得られる筈である
が、前記したように、最大利得線は、温度とか電流密度
に依存し、かつ個々のレーザ装置でも若干は異なるもの
であるから、この発明では、1つの曲率半径Rの彎曲部
分だけでなく、さらに、−Rによる彎曲部分のように曲
率半径の異なる部分とか、必要に応じ直線部分を設け
て、共振縦モード線の傾きを外部からの注入電流の調整
制御によつて変化させ得るようにしたものである。Further, by appropriately setting the radius of curvature R and the angle θ, the resonance longitudinal mode line can be made parallel to the maximum gain line,
It should be possible to obtain a continuous wavelength change in a wide current range, but as described above, the maximum gain line depends on the temperature and the current density, and is slightly different for each laser device. According to the invention, not only one curved portion having a radius of curvature R, but also a portion having a different radius of curvature such as a curved portion due to -R, or a linear portion if necessary, is provided to make the inclination of the resonance longitudinal mode line from the outside. The injection current can be changed by adjusting the injection current.
すなわち,この発明は、少なくとも一対の反射器,また
は反射面の間に、電流注入によつて光学的利得を得るた
めの光導波路を形成させた半導体レーザ装置において、
前記光導波路に曲率の異なる少なくとも2つの彎曲部を
形成させると共に、これらの各彎曲部に対して、それぞ
れに制御された値の注入電流を流し得るようにしたこと
を特徴とする半導体レーザ装置である。That is, the present invention provides a semiconductor laser device in which an optical waveguide for obtaining an optical gain by current injection is formed between at least a pair of reflectors or reflecting surfaces,
A semiconductor laser device characterized in that at least two curved portions having different curvatures are formed in the optical waveguide, and an injection current having a controlled value can be applied to each of these curved portions. is there.
従つて、この発明においては、光導波路を形成するとこ
ろの,曲率の異なる少なくとも2つの各彎曲部に対し
て、それぞれに制御された値の注入電流を流すことによ
り、その発振波長をして、温度とか光出力に関係なく独
立に変化させ得るのである。Therefore, in the present invention, the oscillation wavelength is controlled by applying an injection current of a controlled value to each of the at least two curved portions having different curvatures that form the optical waveguide. It can be changed independently of temperature and light output.
以下,この発明に係る半導体レーザ装置の実施例につ
き、第3図および第4図を参照して詳細に説明する。An embodiment of a semiconductor laser device according to the present invention will be described in detail below with reference to FIGS. 3 and 4.
第3図(a),(b)はこの発明の一実施例を適用した
半導体レーザ装置の概要構成を模式的に示す斜視図,お
よび同上活性層部分を取出して模式的に示す平面図であ
る。3 (a) and 3 (b) are a perspective view schematically showing a schematic configuration of a semiconductor laser device to which an embodiment of the present invention is applied, and a plan view schematically showing an active layer portion of the same as above. .
すなわち,この第3図(a),(b)に示す構成におい
て、符号1は半絶縁性GaAs基板であり、また、2はn-Al
XGa1-yAs層,3は厚さが約0.1μmのn-AlyGa1-yAs活性
層、4はn-AlxGa1-xAs層、5はn−GaAs層であつて、こ
れらの各層は、液相エピタキシャル成長(LPE)法,分
子線エピタキシャル成長(MBE)法,あるいは、有機金
属熱分解堆積(MO-CVD)法などにより連続的に成長形成
されており、通常,xの値は0.4程度,yの値は0.1程度にそ
れぞれ制御される。That is, in the configuration shown in FIGS. 3 (a) and 3 (b), reference numeral 1 is a semi-insulating GaAs substrate, and 2 is n-Al.
X Ga 1-y As layer, 3 is an n-Al y Ga 1-y As active layer having a thickness of about 0.1 μm, 4 is an n-Al x Ga 1-x As layer, and 5 is an n-GaAs layer. Each of these layers is continuously grown by the liquid phase epitaxial growth (LPE) method, the molecular beam epitaxial growth (MBE) method, or the metalorganic pyrolysis deposition (MO-CVD) method. The value of is controlled to about 0.4 and the value of y is controlled to about 0.1.
そして、この実施例においては、別にSi3M4膜など用
い、前記した各領域部分を曲率の異なつた少なくとも二
つからなる第1,および第2の彎曲部,つまり、第1図
(b)において、正側に曲率半径R1を2000μm(2mm)
として彎曲された彎曲部51a,および負側に曲率半径R2を
−2000μm(−2mm)として彎曲された彎曲部51bにより
パターニングして、第1,および第2の領域に区分させる
と共に、このSi3N4膜などをマスクに不純物,こゝで
は、Znを650℃程度の温度で拡散させ、かつその後,こ
の不純物拡散源のZnを除いて高温で熱処理することによ
り、各領域をそれぞれ部分的にp形に変換させる。こゝ
で、この拡散によつてp+形に交換された第1,第2の領域
を破線で,また、熱処理によつて形成されたpn接合を実
線でそれぞれに示してある。In addition, in this embodiment, a Si 3 M 4 film or the like is separately used, and each of the above-mentioned region portions is composed of at least two first and second curved portions, that is, FIG. 1 (b). At the positive side, the radius of curvature R 1 is 2000 μm (2 mm)
And a curved portion 51b curved with a radius of curvature R 2 on the negative side of −2000 μm (−2 mm) to divide into a first region and a second region. Impurities using a 3 N 4 film as a mask, Zn is diffused here at a temperature of about 650 ° C., and then each of the regions is partially heated by heat treatment at a high temperature except for Zn as the impurity diffusion source. To p-type. Here, the first and second regions exchanged to the p + type by this diffusion are shown by broken lines, and the pn junction formed by the heat treatment is shown by solid lines.
また、図中,21,31,41および51は、前記拡散によつてp+
形に変換されたそれぞれにAlXGa1-xAs層2,AlyGa1-yAs活
性層3,AlxGa1-xAs層4およびGaAs層5の各一部であり、
第1,第2のp+形領域31a,31b間,およびpn接合間に跨る
n−GaAs層5をエッチング除去してある。さらに、6は
n−GaAs層5に対する電極、7および8は第1および第
2の領域31a,31bに対応したp−GaAs層51に対する各電
極である。In the figure, 21, 31, 41 and 51 are p + due to the diffusion.
The Al X Ga 1-x As layer 2, the Al y Ga 1-y As active layer 3, the Al x Ga 1-x As layer 4, and the GaAs layer 5 respectively converted into the shape,
The n-GaAs layer 5 extending between the first and second p + type regions 31a and 31b and the pn junction is removed by etching. Further, 6 is an electrode for the n-GaAs layer 5, and 7 and 8 are respective electrodes for the p-GaAs layer 51 corresponding to the first and second regions 31a and 31b.
しかして、この実施例の場合には、電極6を負に,電極
7,8を正にバイアスすると、pn接合に順方向電流が流
れ、この注入電流は、拡散電位の最も低いn-AlyGa1-yAs
活性層3とp-AlyGa1-yAs活性層31間のpn接合を流れると
共に、自由担体密度とバンドギャップとの関係で、実線
と破線で囲まれた狭い(通常では、約2μm)p+領域32
の屈折率がその両側よりも高くなるため、このp+領域32
に光が導波され、かつ順方向電流により電子がn側から
p+領域32に注入されて発光すると共に、その電流密度を
増すことで反転分布を生じ、光が増幅されて両反射面で
発振するに至る。Therefore, in the case of this embodiment, the electrode 6 is made negative,
When 7 and 8 are positively biased, a forward current flows in the pn junction, and this injection current is n-Al y Ga 1-y As with the lowest diffusion potential.
It flows through the pn junction between the active layer 3 and the p-Al y Ga 1-y As active layer 31, and is narrow (normally about 2 μm) surrounded by a solid line and a broken line due to the relationship between the free carrier density and the band gap. p + region 32
This p + region 32 because the refractive index of
Light is guided to the
The light is injected into the p + region 32 to emit light, and the current density thereof is increased to generate a population inversion, and the light is amplified and oscillates on both reflecting surfaces.
またこゝで、前記したように、p+側での第1の領域31a
を、曲率半径R1,2000μm(2mm)で正側に彎曲させてお
り、かつまた、第2の領域31bを、曲率半径R2,−2000
μm(−2mm)で負側に彎曲させているが、これらの曲
率半径は、光がp+領域32に沿つて導波されるように、そ
の屈折率分布から求めた値であり、これよりも大きくし
ても差支えはない。Also here, as described above, the first region 31a on the p + side
Is curved to the positive side with a radius of curvature R 1 , 2000 μm (2 mm), and the second region 31 b is also curved with a radius of curvature R 2 , −2000.
Although it is curved to the negative side by μm (−2 mm), these radii of curvature are values obtained from its refractive index distribution so that light is guided along the p + region 32. It does not matter if you increase the value.
この実施例構成の場合には、第1の領域31aの彎曲角度
をβ,第2の領域31bの彎曲角度をαとすれば、α=β
=5.625°であつて、その光路長がおゝよそ392.5μmと
なる。そして、今,yの値を0.1程度に設定すると、その
発振波長は、ほゞ850nmとなり、この波長域での実効屈
折率は、約3.4であるから、縦モード次数mは、ほゞ、
3,140であつて、m±1次との波長差は0.27nmとなる。In the case of the configuration of this embodiment, if the bending angle of the first region 31a is β and the bending angle of the second region 31b is α, α = β
= 5.625 °, the optical path length is about 392.5 μm. Then, when the value of y is set to about 0.1, the oscillation wavelength is about 850 nm, and the effective refractive index in this wavelength range is about 3.4. Therefore, the longitudinal mode order m is about
It is 3,140, and the wavelength difference from the m ± 1st order is 0.27 nm.
また、この場合,発振のためのしきい値電流は約70mA
で、3mW程度の光出力を得るのには、注入電流Iを約90m
Aにする必要があり、この電流領域で注入電流Iを約1mA
だけ増すと、その利得最大位置は、約0.1nmだけp+領域
側へ移動する。そして、光導波路が前記第1図に示した
ように、円弧状に彎曲されている場合,ΔR=0.1・θ
であるから、この実施例による第3図に示す構成では、
θがπ/32ラジアン(5.625°)なので、注入電流Iの約
1mAの増加によつて、その光路長が、第1領域31aでは、
約0.0982nmだけ長くなり、第2領域31bでは、約0.0982n
mだけ短くなる。従つて、これらの第1,第2の各領域31
a,31bで注入電流Iを同じ値だけづゝ増加させれば、そ
の光路長が相殺されて何等の変化もないことになるが、
第1領域31aで増加させた分だけの電流値を、第2領域3
1bで減少させることによつて、その光路長をほゞ2倍に
相当する0.1964nmだけ長くし得るのである。In this case, the threshold current for oscillation is about 70mA.
In order to obtain a light output of about 3mW, the injection current I is about 90m.
It is necessary to set A, and the injection current I is about 1mA in this current region.
If it is increased only by, the gain maximum position moves to the p + region side by about 0.1 nm. When the optical waveguide is curved in an arc shape as shown in FIG. 1, ΔR = 0.1 · θ
Therefore, in the configuration shown in FIG. 3 according to this embodiment,
Since θ is π / 32 radians (5.625 °), about the injection current I
Due to the increase of 1 mA, the optical path length of the first region 31a becomes
It becomes about 0.0982nm longer, and about 0.0982n in the second region 31b.
Shortened by m. Therefore, each of these first and second areas 31
If the injection current I is increased by the same value at a and 31b, the optical path length will be canceled and there will be no change.
The current value corresponding to the amount increased in the first area 31a is set to the second area 3
By reducing by 1b, the optical path length can be lengthened by about 0.1964 nm, which is almost double.
しかし、実際上は、注入電流Iの増減によつて単に利得
最大位置が移動するだけではなく、一方で実効屈折率と
かバンドギャップ・エネルギー,ひいては利得最大波長
もまた変位かするから、そこで、第3図に示したこの実
施例構成における第1領域31aと第2領域31bとに流す注
入電流Iを、例えば、差動増幅回路を通すなどの手段に
よつて調整制御させるようにすれば、利得最大波長の変
化と光路長の変化とを共に一致させることができるので
ある。つまり、この実施例構成では、第1領域31aと第
2領域31bとに流す注入電流Iの制御によつて、第2図
(b)に太線で示したように、この半導体レーザ装置の
発振波長を、約10nmの範囲内で連続的に変化させ得るの
である。However, in practice, the change in the injection current I not only moves the gain maximum position, but also changes the effective refractive index, the bandgap energy, and thus the gain maximum wavelength. If the injection current I flowing in the first region 31a and the second region 31b in the configuration of this embodiment shown in FIG. 3 is adjusted and controlled by means such as passing through a differential amplifier circuit, the gain is increased. The change in maximum wavelength and the change in optical path length can be made to coincide with each other. That is, in the structure of this embodiment, the oscillation wavelength of this semiconductor laser device is controlled by controlling the injection current I flowing in the first region 31a and the second region 31b, as shown by the bold line in FIG. 2 (b). Can be continuously changed within a range of about 10 nm.
なお、前記実施例構成では、曲率半径R1,R2の値をそれ
ぞれに、200μm,−2000μmとしているが、この|R1|=|
R2|に必ずしも大きな意味がある訳ではなく、他の値に
してもよい。また、光導波路を2つの彎曲させた曲線部
分によつて形成させているが、第4図(a),(b),
(c)に示すように、この光導波路を2つの彎曲させた
曲線部分101,102に対して、その他の直線部分103を組合
せて形成するのもよく、このように直線部分103を含ま
せた場合には、素子製造時にあつて、劈開位置に若干の
任意性を生じ、その製造が容易になるほか、この直線部
分103にも独立した電極を設けて、注入電流Iを制御し
得るように構成すれば、発振波長と光出力とを独立に制
御できて、その自由度を一層,向上させることができ
る。さらに、共振器を構成させる例として、こゝでは、
結晶の劈開面を利用する場合について述べたが、第4図
(d)に示すように、いわゆるDBR形の反射器を使用す
るようにしてもよい。そしてまた、この実施例において
は、AlGaAs系のレーザ装置について述べたが、InGaAsP
系などの他の半導体材料を用いるレーザ装置にも適用し
て、同様な作用,効果を得られることは勿論である。In the configuration of the embodiment, the values of the radii of curvature R1 and R2 are set to 200 μm and −2000 μm, respectively, but this | R1 | = |
R2 | does not necessarily have a significant meaning, and other values may be used. Further, although the optical waveguide is formed by two curved curved portions, as shown in FIGS. 4 (a), (b),
As shown in (c), this optical waveguide may be formed by combining two curved curved portions 101 and 102 with another linear portion 103. When such a linear portion 103 is included, At the time of manufacturing the element, the cleavage position has some arbitrariness, which facilitates its manufacture. In addition, the linear portion 103 is also provided with an independent electrode so that the injection current I can be controlled. For example, the oscillation wavelength and the optical output can be controlled independently, and the degree of freedom can be further improved. Furthermore, as an example of configuring a resonator,
Although the case where the cleavage plane of the crystal is used has been described, a so-called DBR type reflector may be used as shown in FIG. 4 (d). In addition, in this embodiment, the AlGaAs laser device has been described.
It is needless to say that the same action and effect can be obtained by applying to a laser device using other semiconductor material such as a system.
以上詳述したように、この発明によれば、少なくとも一
対の反射器,または反射面の間に、電流注入によつて光
学的利得を得るための光導波路を形成させた半導体レー
ザ装置において、光導波路に曲率の異なる少なくとも2
つの彎曲部を形成させ、これらの各彎曲部に対して、そ
れぞれに制御された値の注入電流を流し得るようにした
ので、発振波長を連続的に変化させることができ、例え
ば、光通信分野においては、FM変調方式の導入,あるい
は、コヒーレントな送信用の光源,ヘテロダイン検波用
の局部発振光源へのそれぞれの応用が、また、光応用計
測分野においては、分光測定が、固体レーザ励起におい
ては、最適波長での同調励起が可能になり、これらの諸
分野の発展に大きく寄与し得るものである。As described in detail above, according to the present invention, in a semiconductor laser device in which an optical waveguide for obtaining an optical gain by current injection is formed between at least a pair of reflectors or reflecting surfaces, At least 2 with different curvatures in the waveguide
Since two curved portions are formed and an injection current having a controlled value can be applied to each of these curved portions, the oscillation wavelength can be continuously changed. Introducing an FM modulation method, or applying each to a light source for coherent transmission and a local oscillation light source for heterodyne detection. In the optical measurement field, spectroscopic measurement is used in solid-state laser excitation. The tunable excitation at the optimum wavelength becomes possible, which can greatly contribute to the development of these various fields.
第1図、および第2図(a),(b)はこの発明に係る
半導体レーザ装置の作動原理とその効果とを示すそれぞ
れ説明図であり、また、第3図(a),(b)は同上半
導体レーザ装置の一実施例による概要構成を模式的に示
す斜視図,および同上活性層部分を取出して模式的に示
す平面図、第4図(a)ないし(d)は同上半導体レー
ザ装置の他の実施例をそれぞれに示す各平面略図であ
る。 1……半絶縁性GaAs基板、2,21……n-AlxGa1-xAs層,p-
AlxGa1-xAs層、3,31……n-AlyGa1-yAs活性層,p-AlyGa
1-yAs活性層、31a,31b……第1領域,第2領域、4,41…
…n-AlxGa1-xAs層,p-AlxGa1-xAs層、5,51……n−GaAs
層,p−GaAs層、6……n−GaAs層5に対する電極、7,8
……第1,第2の領域31a,31bに対応したp−GaAs層51に
対する各電極。1 and 2 (a) and 2 (b) are explanatory views showing the operating principle and effect of the semiconductor laser device according to the present invention, respectively, and FIGS. 3 (a) and 3 (b). Is a perspective view schematically showing a schematic configuration according to an embodiment of the same semiconductor laser device, and a plan view schematically showing the active layer portion of the same as above. FIGS. 4A to 4D are the same semiconductor laser device. 3 is a schematic plan view showing each of the other embodiments. 1 ... Semi-insulating GaAs substrate, 2,21 ... n-Al x Ga 1-x As layer, p-
Al x Ga 1-x As layer, 3,31 …… n-Al y Ga 1-y As active layer, p-Al y Ga
1-y As active layer, 31a, 31b ... first region, second region, 4,41 ...
… N-Al x Ga 1-x As layer, p-Al x Ga 1-x As layer, 5,51 …… n-GaAs
Layers, p-GaAs layer, 6 ... Electrodes for n-GaAs layer 5, 7, 8
... Each electrode for the p-GaAs layer 51 corresponding to the first and second regions 31a and 31b.
Claims (2)
間に、電流注入によつて光学的利得を得るための光導波
路を形成させた半導体レーザ装置において、前記光導波
路に曲率の異なる少なくとも2つの彎曲部を形成させる
と共に、これらの各彎曲部に対して、それぞれに制御さ
れた値の注入電流を流し得るようにしたことを特徴とす
る半導体レーザ装置。1. A semiconductor laser device in which an optical waveguide for obtaining an optical gain by current injection is formed between at least a pair of reflectors or reflecting surfaces, and the optical waveguide has at least two different curvatures. A semiconductor laser device, wherein two curved portions are formed, and an injection current having a controlled value can be made to flow to each of these curved portions.
とも2つの彎曲部が、任意に直線状部分を含むことを特
徴とする特許請求の範囲第1項に記載の半導体レーザ装
置。2. The semiconductor laser device according to claim 1, wherein the at least two curved portions having different curvatures forming the optical waveguide optionally include a linear portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25535787A JPH0779182B2 (en) | 1987-10-09 | 1987-10-09 | Semiconductor laser device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25535787A JPH0779182B2 (en) | 1987-10-09 | 1987-10-09 | Semiconductor laser device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0196983A JPH0196983A (en) | 1989-04-14 |
| JPH0779182B2 true JPH0779182B2 (en) | 1995-08-23 |
Family
ID=17277657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25535787A Expired - Lifetime JPH0779182B2 (en) | 1987-10-09 | 1987-10-09 | Semiconductor laser device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0779182B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1669799B1 (en) | 2003-10-01 | 2013-06-19 | Mitsubishi Denki Kabushiki Kaisha | Wavelength conversion laser and image display |
-
1987
- 1987-10-09 JP JP25535787A patent/JPH0779182B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0196983A (en) | 1989-04-14 |
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