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JPH0782533B2 - Shape measuring device - Google Patents
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JPH0782533B2 - Shape measuring device - Google Patents

Shape measuring device

Info

Publication number
JPH0782533B2
JPH0782533B2 JP12968885A JP12968885A JPH0782533B2 JP H0782533 B2 JPH0782533 B2 JP H0782533B2 JP 12968885 A JP12968885 A JP 12968885A JP 12968885 A JP12968885 A JP 12968885A JP H0782533 B2 JPH0782533 B2 JP H0782533B2
Authority
JP
Japan
Prior art keywords
light beam
optical element
electromagnetically driven
element group
fourier transform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP12968885A
Other languages
Japanese (ja)
Other versions
JPS61288281A (en
Inventor
宏夫 藤田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Citizen Watch Co Ltd
Original Assignee
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Citizen Watch Co Ltd filed Critical Citizen Watch Co Ltd
Priority to JP12968885A priority Critical patent/JPH0782533B2/en
Publication of JPS61288281A publication Critical patent/JPS61288281A/en
Publication of JPH0782533B2 publication Critical patent/JPH0782533B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Character Input (AREA)
  • Image Input (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は時計の針の如き微小な部材の形状測定を行なう
形状測定装置に関する。
TECHNICAL FIELD The present invention relates to a shape measuring device for measuring the shape of a minute member such as a hand of a timepiece.

〔発明の背景〕[Background of the Invention]

時計の製造組立てにおいて時計体へ針を取り付ける場合
に、針の形状が曲がっていると、針と針あるいは針とガ
ラス等が接触して針の回転がスムーズに行なわれなく、
時計の時刻誤差や止まりといったトラブルが発生するた
め、特に自動組立のために針の曲がり形状等の測定が必
要となっている。
When the hands are attached to the timepiece during the manufacture and assembly of the timepiece, if the hands are bent, the hands will not contact each other or the hands will contact the glass, and the hands will not rotate smoothly.
Since problems such as time error and stoppage of the clock occur, it is necessary to measure the curved shape of the needle, especially for automatic assembly.

〔従来の技術〕[Conventional technology]

従来、微小な部材の形状の測定法としてはTVカメラで被
測定物を写し、2次元画像のビデオ信号を得て、適当な
スレッショールドレベルで2値化して、テレビカメラの
画素数に応じたパターンデータをメモリー素子にストア
し、演算処理して形状認識を行なうのが一般的である。
Conventionally, as a method of measuring the shape of a minute member, a measured object is photographed by a TV camera, a video signal of a two-dimensional image is obtained, binarized at an appropriate threshold level, and it is determined according to the number of pixels of the TV camera. It is general that the pattern data is stored in a memory element and arithmetic processing is performed for shape recognition.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

前述したTVカメラによるパターン認識法は、使用する2
次元のTVカメラの画素数が現在は各辺当りで数100素子
程度しかなく分解能が悪いこと、及び被測定物が微小な
場合にTVカメラの拡大倍率を上げたとき、焦点深度方向
の設定許容範囲が狭くなるために、被測定物の設定位置
の変動が許されない等の測定上の問題点が多い。さらに
は2次元画像としてパターンデータを記憶するとき非常
に多くのメモリー素子を必要とし、また高速演算を行な
う画像処理部が必要になる等の装置のコストが高くなる
問題点を有している。本発明は上述のような従来の問題
点を解消させ、微小部材の形状の認識を安価にしかも簡
単な装置で可能とすることを目的とする。
The pattern recognition method using the TV camera described above is used 2
-Dimensional TV camera currently has only a few hundred pixels on each side and poor resolution, and when the magnification of the TV camera is increased when the DUT is small, setting in the depth of focus direction is allowed. Since the range is narrowed, there are many problems in measurement such that the set position of the object to be measured cannot be changed. Further, there is a problem in that the cost of the apparatus becomes high, for example, when storing pattern data as a two-dimensional image, an extremely large number of memory elements are required, and an image processing unit for performing high-speed calculation is required. SUMMARY OF THE INVENTION It is an object of the present invention to solve the above-mentioned conventional problems and enable the recognition of the shape of a minute member at a low cost with a simple device.

〔問題点を解決するための手段〕[Means for solving problems]

上記の目的を達成するために本発明は次のような構成を
している。
In order to achieve the above object, the present invention has the following configuration.

光源と、該光源からの光ビームの形状及び放射方向を変
換するシリンドリカルレンズと第1の電磁駆動反射ミラ
ーと球面レンズから成る第1の光学素子群と、該第1の
光学素子群からの光ビームが照射される被測定物と、該
被測定物からの光ビームの光学情報及び検出方向を変換
するフーリエ変換レンズと第2の電磁駆動反射ミラーと
フーリエ逆変換レンズから成る第2の光学素子群と、該
第2の光学素子群からの光ビームを受光する光検出部
と、前記第1と第2の電磁駆動反射ミラーの反射回転角
を制御する電流を供給する電流供給源と、前記光検出部
で得られた光学情報を電気信号に変換して形状を算出す
るデータ処理部を設ける。
A light source, a first optical element group including a cylindrical lens for converting the shape and emission direction of a light beam from the light source, a first electromagnetically driven reflecting mirror, and a spherical lens, and light from the first optical element group. Beam to be measured, second optical element including Fourier transform lens for converting optical information and detection direction of light beam from the object, second electromagnetic drive reflection mirror and Fourier inverse transform lens A group, a photodetector for receiving a light beam from the second optical element group, a current supply source for supplying a current for controlling a reflection rotation angle of the first and second electromagnetically driven reflection mirrors, A data processing unit that converts the optical information obtained by the light detection unit into an electric signal to calculate the shape is provided.

このとき第2の電磁駆動反射ミラーをフーリエ変換レン
ズとフーリエ逆変換レンズとの共焦点位置に配置し、か
つローパス型の空間フィルター構成とする。さらに第1
の光学素子群に含まれる球面レンズと前述のフーリエ変
換レンズの焦点距離の比に応じた電流の比で前記の第1
と第2の電磁駆動反射ミラーの回転角を制御する。
At this time, the second electromagnetically driven reflecting mirror is arranged at the confocal position of the Fourier transform lens and the inverse Fourier transform lens, and has a low-pass type spatial filter configuration. Furthermore the first
The ratio of the current corresponding to the ratio of the focal lengths of the spherical lens and the Fourier transform lens included in the optical element group
And controlling the rotation angle of the second electromagnetically driven reflecting mirror.

〔作用〕[Action]

以上の構成によって形状測定を行なうとき、光源からの
光ビームを第1の光学素子群により楕円形状の光ビーム
を作成して被測定物に照射する。この楕円形状の光ビー
ムは、殆ど1次元的な広がりを持つ光ビームであるか
ら、2次元的な広がりを持つ被測定物を測定するとき第
1の電磁駆動反射ミラーで光ビームのスキャンを行な
う。被測定物の光学情報を含んだ光ビームは第2の光学
素子群に含まれるフーリエ変換レンズ及びフーリエ逆変
換レンズの組み合せで被測定物による像の再生を行なう
が、フーリエ変換レンズの焦点位置となるスペクトル面
に光学的な高調波ノイズ(高次の回折光)をカットする
空間フィルターを設けるが、光ビームのスキャンを行な
うときに、第2の光学素子群からの光ビームを受光する
光検出部への入射の位置が常に一定となるように、前述
の空間フィルターと光ビームの反射を制御する反射ミラ
ーの動作を第2の電磁駆動反射ミラーで兼用させる。
When the shape measurement is performed with the above configuration, a light beam from the light source is formed into an elliptical light beam by the first optical element group and is irradiated on the object to be measured. Since this elliptical light beam is a light beam having a substantially one-dimensional spread, the light beam is scanned by the first electromagnetically driven reflection mirror when measuring the object to be measured having a two-dimensional spread. . The light beam containing the optical information of the object to be measured reproduces the image by the object to be measured by the combination of the Fourier transform lens and the inverse Fourier transform lens included in the second optical element group. A spatial filter that cuts optical harmonic noise (higher-order diffracted light) is provided on the spectrum surface, but when the light beam is scanned, the light detection that receives the light beam from the second optical element group is performed. The second electromagnetically driven reflecting mirror also performs the operations of the above-described spatial filter and the reflecting mirror that controls the reflection of the light beam so that the position of incidence on the unit is always constant.

このとき第1の光学素子群に含まれる球面レンズと第2
の光学素子群に含まれるフーリエ変換レンズの焦点距離
の比に応じた電流の比で、第1と第2の電磁駆動反射ミ
ラーを動作させれば、光ビームのスキャンを行なっても
常に一定位置で被測定物の光学情報を検出することが可
能となってくる。
At this time, the spherical lens included in the first optical element group and the second lens
If the first and second electromagnetically driven reflecting mirrors are operated at a current ratio according to the ratio of the focal lengths of the Fourier transform lenses included in the optical element group, the light beam is always scanned at a fixed position. It becomes possible to detect the optical information of the object to be measured.

〔実施例〕〔Example〕

以下に本発明の実施例を図面に基づき説明する。第1図
は本発明の実施例を示す形状測定装置のブロック図であ
る。10は光源である。光強度分布が一様で安定している
こと、平行光線が容易に得られること、及び検出する光
学情報のS/N比が良いこと等から光源としてはレーザー
光を用いるのが有利である。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram of a shape measuring apparatus showing an embodiment of the present invention. 10 is a light source. It is advantageous to use a laser beam as a light source because the light intensity distribution is uniform and stable, parallel rays can be easily obtained, and the S / N ratio of optical information to be detected is good.

11は第1の光学素子群で、110は焦点距離f0のシリンド
リカルレンズ、111は第1の電磁駆動反射ミラー、112は
焦点距離がf1の平凸レンズの如き球面レンズである。12
は時計の針の如き被測定物である。13は第2の光学素子
群で、130は焦点距離がf2のフーリエ変換レンズ、131は
第2の電磁駆動反射ミラー、132は焦点距離がf3のフー
リエ逆変換レンズである。ここでフーリエ変換レンズ13
0及びフーリエ逆変換レンズ132は平凸レンズを用いれば
よい。14はフーリエ逆変換レンズ132からの出射光を検
出する光検出部である。フーリエ逆変換レンズ132から
の出射光は1次元に広がった楕円形状のビーム形状をし
ているから、光検出部14は1次元のCCDラインセンサー
で構成すればよい。15は電流供給源である。電流供給源
15は第1の電磁駆動反射ミラー111及び第2の電磁駆動
反射ミラー131の反射の回転角を制御する電流を供給す
る。16はデータ処理部で、光検出部14で得られた光学情
報を電気信号に変換して、光ビームのスキャンに対応し
た場所の形状の算出及び全体形状の算出を行なうと共
に、電流供給源15の制御を行なう。光学10から放射され
た光ビーム100は円形状を成していて、シリンドリカル
レンズ110と球面レンズ112の組み合せにより楕円形状の
ほぼ1次元に広がった光ビームを作成する。このときシ
リンドシカルレンズ110と球面レンズ112の共焦点位置に
第1の電磁駆動反射ミラー111を配置する。この第1の
電磁駆動反射ミラー111は電流供給源15から第1の電流i
1が印加され、電流i1の大きさに応じて反射の回転角が
変化させられる。被測定物12が微小な部材の場合には被
測定物12からの透過光は回折の影響を受けて、フーリエ
逆変換レンズ130の焦点位置にフラウンホーファー回折
像が結ばれる。この面がスペクトル面に相当するが、フ
ーリエ逆変換レンズ132をスペクトル面の後方の焦点位
置に配置すれば、再び被測定物12の像が再生されること
になる。
Reference numeral 11 is a first optical element group, 110 is a cylindrical lens having a focal length f 0 , 111 is a first electromagnetically driven reflecting mirror, and 112 is a spherical lens such as a plano-convex lens having a focal length of f 1 . 12
Is an object to be measured, such as a clock hand. 13 is a second optical element group, 130 is a Fourier transform lens having a focal length of f 2 , 131 is a second electromagnetically driven reflecting mirror, and 132 is a Fourier inverse transform lens having a focal length of f 3 . Fourier transform lens 13 here
As the 0 and the Fourier inverse transform lens 132, a plano-convex lens may be used. Reference numeral 14 is a photodetection unit that detects the light emitted from the inverse Fourier transform lens 132. Since the light emitted from the inverse Fourier transform lens 132 has an elliptical beam shape that is one-dimensionally spread, the light detection unit 14 may be configured by a one-dimensional CCD line sensor. 15 is a current supply source. Current source
Reference numeral 15 supplies a current for controlling the rotation angle of reflection of the first electromagnetically driven reflective mirror 111 and the second electromagnetically driven reflective mirror 131. A data processing unit 16 converts the optical information obtained by the photodetection unit 14 into an electric signal to calculate the shape of the place corresponding to the scanning of the light beam and the entire shape, and at the same time, to supply the current 15 Control. The light beam 100 emitted from the optics 10 has a circular shape, and the combination of the cylindrical lens 110 and the spherical lens 112 forms an elliptical light beam that spreads in almost one dimension. At this time, the first electromagnetically driven reflection mirror 111 is arranged at the confocal position between the cylindrical lens 110 and the spherical lens 112. The first electromagnetically driven reflection mirror 111 is provided with a first current i from the current supply source 15.
1 is applied, and the rotation angle of reflection is changed according to the magnitude of the current i 1 . When the DUT 12 is a minute member, the transmitted light from the DUT 12 is affected by diffraction, and a Fraunhofer diffraction image is formed at the focal position of the inverse Fourier transform lens 130. This surface corresponds to the spectrum surface, but if the inverse Fourier transform lens 132 is arranged at the focal position behind the spectrum surface, the image of the DUT 12 will be reproduced again.

スペクトル面はフーリエ変換レンズ130によって光ビー
ムが細く集光される位置となるが、前述の回折現象のた
めに高次の回折光がふくまれているため、空間フィルタ
ーによって基本波となる集光された部分の光ビームだけ
を通過させることが必要となってくる。即ちローパス型
の空間フィルターが必要となる。さらにスペクトル面は
後述するように光ビームのスキャンの定点となる位置で
あるから、光ビームの反射と前述のローパス型空間フィ
ルターの動作を兼用させればよい。第2の電磁駆動反射
ミラー131は上記の動作を行なわせるもので、電流供給
源15から第2の電流i2を印加して、電流i2の大きさに依
存した反射の回転角の制御を行なうものである。
The spectrum plane is a position where the light beam is finely focused by the Fourier transform lens 130, but since the higher order diffracted light is included due to the above-mentioned diffraction phenomenon, it is focused as a fundamental wave by the spatial filter. It becomes necessary to pass only the light beam in the part where That is, a low pass type spatial filter is required. Further, since the spectral plane is a position which becomes a fixed point of scanning of the light beam as described later, the reflection of the light beam and the operation of the low pass type spatial filter described above may be combined. The second electromagnetically driven reflection mirror 131 performs the above-mentioned operation, and applies the second current i 2 from the current supply source 15 to control the rotation angle of reflection depending on the magnitude of the current i 2. It is something to do.

第2図に第2の電磁駆動反射ミラーの構成例を示す。20
は正方形の形状の反射ミラー、21はほぼ円形状の光ビー
ムの反射面で前述したフーリエ変換レンズ130によって
集光された光ビームの中心となる面積にほぼ等しい面積
を有する。22の斜線で示した部分は光ビームを反射しな
い部分で例えば黒色のカーボン等でマスクされた部分で
あり中心部以外の高次の回折光を反射させない。反射部
21により前述の光ビームの反射と、ローパス型空間フィ
ルターの動作が兼用できる。
FIG. 2 shows a configuration example of the second electromagnetically driven reflecting mirror. 20
Is a reflection mirror having a square shape, and 21 is a reflection surface of a substantially circular light beam, and has an area substantially equal to the center area of the light beam condensed by the Fourier transform lens 130 described above. A shaded portion of 22 is a portion that does not reflect the light beam and is a portion that is masked with, for example, black carbon or the like, and does not reflect high-order diffracted light other than the central portion. Reflector
21 makes it possible to combine the above-mentioned reflection of the light beam and the operation of the low-pass type spatial filter.

第3図に被測定物12に光ビームを照射したときの模式図
を示す。被測定物12は時計の針と仮定する。30は第1の
光学素子群11から出射される楕円形状光ビーム、31は被
測定物12を設置する固定台である。
FIG. 3 shows a schematic view when the DUT 12 is irradiated with a light beam. The DUT 12 is assumed to be a clock hand. Reference numeral 30 is an elliptical light beam emitted from the first optical element group 11, and 31 is a fixed base on which the object to be measured 12 is installed.

時計の針は前述した如く曲がりがないのが好ましいが、
曲がりがあれば、被測定物12と固定台31の間にすき間が
生じ、光ビーム30が照射されたとき光検出部14でこのす
き間による光の透過を検出すれば、針の形状が測定でき
る。針の各場所毎の多点の測定を行なうため光ビーム30
をA位置からB位置までスキャンする。
It is preferable that the hands of the clock are not bent as described above,
If there is a bend, a gap is created between the object to be measured 12 and the fixed base 31, and when the light beam 30 is irradiated, the light detection unit 14 detects the transmission of light due to this gap, whereby the shape of the needle can be measured. . Light beam 30 for multi-point measurement at each needle location
Scan from position A to position B.

第4図にビームのスキャンを行なうときの前述の光学系
の構成による光路図を示す。線40は直角に反射される場
合、線41は直角以外の反射の場合の光路である。第1の
電磁駆動反射ミラーに電流i1を供給したときの反射角度
がθになったときの被測定物12の位置でのスキャン位
置の変化量l1は線40に対してf1θである。(但しtan
θ≒θ) このスキャンの状態ではフーリエ逆変換レンズ132によ
る光検出部14への入射位置ずれl2は、線40に対して入射
角をθとして f3θ=f1・f3・θ1/f2である。
FIG. 4 shows an optical path diagram of the configuration of the above-described optical system when scanning a beam. Line 40 is the optical path for reflections at right angles and line 41 is the optical path for reflections other than right angles. The change amount l 1 of the scan position at the position of the DUT 12 when the reflection angle when the current i 1 is supplied to the first electromagnetically driven reflection mirror becomes θ 1 is f 1 θ with respect to the line 40 It is 1 . (However, tan
θ 1 ≈θ 1 ) In this scan state, the deviation l 2 of the incident position on the photodetector 14 by the inverse Fourier transform lens 132 is f 3 θ 2 = f 1 · f with the incident angle θ 2 with respect to the line 40. 3 · θ 1 / f 2 .

以上の関係からθ1=f2/f1が得られるから第2の
電磁駆動反射ミラー131はf1・θ1/f2に比例する電流を
電流供給源15により印加してl2=0となるように反射角
度の補正を行なえば、光ビームのスキャンの大きさによ
らないで、光検出部14は常に定点で光ビームの検出を行
なうことができる。
From the above relationship, θ 1 / θ 2 = f 2 / f 1 is obtained, so that the second electromagnetically driven reflecting mirror 131 applies a current proportional to f 1 · θ 1 / f 2 by the current supply source 15. If the reflection angle is corrected so that 2 = 0, the light detection unit 14 can always detect the light beam at a fixed point, regardless of the size of the light beam scan.

第5図に時計の針の曲がり形状による演算波形図の一例
を示す。
FIG. 5 shows an example of a calculation waveform diagram based on the curved shape of the hands of the timepiece.

たて軸は2値化された電圧、横軸はCCDラインセンサー
の画素位置に対応したアドレス番地である。
The vertical axis is the binarized voltage, and the horizontal axis is the address address corresponding to the pixel position of the CCD line sensor.

50は第3図に示した固定台31と被測定物12とのすき間に
よる光透過、51は被測定物12による光不透過部である。
光検出部14にCCDラインセンサーを用いるとき、光電変
換を行なってビデオ信号を出力し、データ処理部16でビ
デオ信号のA/D変換を行ない、スレッショールドレベル
を決めて2値化し、光透過部50及び光不透過部51の各々
の間かくのビット数を求め、寸法に換算して形状の算出
を行なう。
Reference numeral 50 denotes light transmission through the gap between the fixed table 31 and the object 12 to be measured shown in FIG.
When a CCD line sensor is used for the light detection unit 14, photoelectric conversion is performed to output a video signal, and the data processing unit 16 performs A / D conversion of the video signal to determine the threshold level and binarize it. The number of bits between each of the transmissive portion 50 and the light non-transmissive portion 51 is calculated, and converted into dimensions to calculate the shape.

CCDラインセンサーは画素数が4000ビット程度のものが
実用化されており、非常に高分解能である。また測定デ
ータとしてはほぼ4Kワードのメモリーがあれば十分であ
る。光学系からみれば、被測定物の像はフーリエ変換レ
ンズ130とフーリエ逆変換レンズ132の焦点距離の比に応
じた倍率で再生でき、比測定物12の物体位置変動の影響
を受けにくいため位置設定が容易である。
A CCD line sensor with a pixel number of about 4000 bits has been put into practical use, and has a very high resolution. Also, a memory of approximately 4K words is sufficient for measurement data. From the viewpoint of the optical system, the image of the object to be measured can be reproduced at a magnification according to the ratio of the focal lengths of the Fourier transform lens 130 and the inverse Fourier transform lens 132, and the position of the object to be measured is unlikely to be affected by fluctuations in the object position of the object to be measured 12. Easy to set up.

〔発明の効果〕〔The invention's effect〕

以上の実施例から明らかな如く、本発明によれば光ビー
ムのスキャンを行なっても常に定位置でS/N比の良い光
ビームの検出が可能となり、安価で高精度の形状測定装
置の実現が可能となる。
As is clear from the above embodiments, according to the present invention, it is possible to always detect a light beam having a good S / N ratio at a fixed position even when scanning the light beam, and realize an inexpensive and highly accurate shape measuring device. Is possible.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の実施例を示す形状測定装置のブロック
図、第2図は第2の電磁駆動反射ミラーの説明図、第3
図は被測定物に光ビームを照射したときの模式説明図、
第4図は形状測定装置の光学系の光ビームのスキャンを
説明する光路図、第5図は形状測定装置による針の形状
の測定結果の一例を示す波形図である。 10……光源、11……第1の光学素子群、 12……被測定物、13……第2の光学素子群、 14……光検出部、15……電流供給源、 16……データ処理部、 111……第1の電磁駆動反射ミラー、 130……フーリエ変換レンズ、 131……第2の電磁駆動反射ミラー、 132……フーリエ逆変換レンズ。
FIG. 1 is a block diagram of a shape measuring apparatus showing an embodiment of the present invention, FIG. 2 is an explanatory view of a second electromagnetically driven reflecting mirror, and FIG.
The figure is a schematic explanatory diagram when irradiating the measured object with a light beam,
FIG. 4 is an optical path diagram for explaining scanning of the light beam of the optical system of the shape measuring device, and FIG. 5 is a waveform diagram showing an example of the measurement result of the shape of the needle by the shape measuring device. 10 ... Light source, 11 ... First optical element group, 12 ... Object to be measured, 13 ... Second optical element group, 14 ... Photodetection section, 15 ... Current supply source, 16 ... Data Processing unit, 111 ... First electromagnetically driven reflective mirror, 130 ... Fourier transform lens, 131 ... Second electromagnetically driven reflective mirror, 132 ... Fourier inverse transform lens.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】光源と、該光源からの光ビームの形状及び
放射方向を変換する、シリンドリカルレンズと球面レン
ズと該両レンズの共焦点位置に配置された第1の電磁駆
動反射ミラーから成る、第1の光学素子群と、該第1の
光学素子群からの光ビームが照射される被測定物と、該
被測定物からの光ビームの光学情報及び検出方向を変換
するフーリエ変換レンズと第2の電磁駆動反射ミラーと
フーリエ逆変換レンズから成る第2の光学素子群と、該
第2の光学素子群からの光ビームを受光する光検出部
と、前記第1と第2の電磁駆動反射ミラーの反射回転角
を制御する電流を供給する電流供給源と、前記光検出部
で得られた光学情報を電気信号に変換して形状を算出す
るデータ処理部とから構成され、前記の第2の電磁駆動
反射ミラーを前記第2の光学素子群に含まれるフーリエ
変換レンズとフーリエ逆変換レンズとの共焦点位置に配
置して、入射される光ビームのほぼ中心部だけの光を反
射するローパス型空間フィルターとなし、前記の第1の
光学素子群に含まれる球面レンズと前記の第2の光学素
子群に含まれるフーリエ変換レンズとの焦点距離の比に
応じた電流の比で前記第1の電磁駆動反射ミラーと第2
の電磁駆動反射ミラーを制御することを特徴とする形状
測定装置。
1. A light source, a cylindrical lens and a spherical lens for converting the shape and emission direction of a light beam from the light source, and a first electromagnetically driven reflection mirror arranged at a confocal position of both lenses. A first optical element group, an object to be measured irradiated with the light beam from the first optical element group, a Fourier transform lens for converting optical information and a detection direction of the light beam from the object to be measured, Second optical element group including an electromagnetically driven reflection mirror No. 2 and a Fourier inverse transform lens, a photodetector for receiving a light beam from the second optical element group, and the first and second electromagnetically driven reflection elements A current supply source that supplies a current that controls the reflection rotation angle of the mirror, and a data processing unit that converts the optical information obtained by the photodetection unit into an electric signal to calculate the shape, The electromagnetically driven reflective mirror of A low-pass type spatial filter that is arranged at the confocal position of the Fourier transform lens and the inverse Fourier transform lens included in the optical element group, and reflects light only in the central part of the incident light beam. The first electromagnetically driven reflective mirror and the second electromagnetically driven reflection mirror are provided at a current ratio corresponding to a ratio of focal lengths of the spherical lens included in the first optical element group and the Fourier transform lens included in the second optical element group.
2. A shape measuring device characterized by controlling the electromagnetically driven reflection mirror.
JP12968885A 1985-06-14 1985-06-14 Shape measuring device Expired - Lifetime JPH0782533B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12968885A JPH0782533B2 (en) 1985-06-14 1985-06-14 Shape measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12968885A JPH0782533B2 (en) 1985-06-14 1985-06-14 Shape measuring device

Publications (2)

Publication Number Publication Date
JPS61288281A JPS61288281A (en) 1986-12-18
JPH0782533B2 true JPH0782533B2 (en) 1995-09-06

Family

ID=15015726

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12968885A Expired - Lifetime JPH0782533B2 (en) 1985-06-14 1985-06-14 Shape measuring device

Country Status (1)

Country Link
JP (1) JPH0782533B2 (en)

Also Published As

Publication number Publication date
JPS61288281A (en) 1986-12-18

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