JPH0789050B2 - Material testing machine - Google Patents
Material testing machineInfo
- Publication number
- JPH0789050B2 JPH0789050B2 JP60170215A JP17021585A JPH0789050B2 JP H0789050 B2 JPH0789050 B2 JP H0789050B2 JP 60170215 A JP60170215 A JP 60170215A JP 17021585 A JP17021585 A JP 17021585A JP H0789050 B2 JPH0789050 B2 JP H0789050B2
- Authority
- JP
- Japan
- Prior art keywords
- pulse
- test piece
- laser beam
- gauge
- testing machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Description
【発明の詳細な説明】 （産業上の利用分野） 本発明は試験片の標点間変位を測定する装置を備えた材
料試験機に関する。TECHNICAL FIELD The present invention relates to a material testing machine equipped with a device for measuring the displacement between gauge marks of a test piece.
（従来の技術） 引張試験における試験片の標点間伸びの測定は、従来、
伸び計を試験片の標点に直接取りつけて行なっていた。(Prior Art) The elongation between gauge marks of a test piece in a tensile test is conventionally measured by
The extensometer was attached directly to the gauge of the test piece.
（発明が解決しようとする問題点） しかしながら、上記試験片に直接取り付ける形式の伸び
計は、実際に試験片に取り付ける作業がめんどうであ
り、かつ取り付け状態が悪ければ伸び計と試験片の標点
との間にスリップが生じて正確な測定ができなくなると
いう問題点があるほか、試験片の破断時に伸び計が放出
されて破損するという問題点があった。(Problems to be solved by the invention) However, in the extensometer of the type directly attached to the test piece, if the work of actually attaching the extensometer to the test piece is troublesome and the attachment state is bad, the extensometer and the reference point of the test piece are marked. There was a problem that a slip occurred between the test piece and the accurate measurement, and there was a problem that the extensometer was released and damaged when the test piece was broken.
（問題点を解決するための手段） 本発明は、上記問題点を解決するため、次のような構成
とした。(Means for Solving Problems) The present invention has the following configuration in order to solve the above problems.
すなわち、本発明にかかる材料試験機は、所定の同期パ
ルスを発生するパルス発生装置と、所定の発光範囲にお
けるその一端部から他端部にかけて等間隔で整列させた
複数の点光源を備え、これら点光源は順次前記パルス発
生装置のパルスに同期して所定の間隔で試験片に向けて
平行にレーザー光線を発光する発光部と、試験片の反射
テープから反射されてくるレーザー光線を集光する集光
部と、該集光部によって集光されたレーザー光線から、
試験片の両標点によって反射されたレーザー光線がいず
れのパルスに該当するものであるかを読み取るパルス読
取り部と、該パルス読取り部の読取り結果に基づいて両
標点間のパルス数を求め、得られたパルス数と前記点光
源の間隔から試験片の標点間距離を算出して出力する出
力部とをそなえている。That is, the material testing machine according to the present invention includes a pulse generator that generates a predetermined synchronizing pulse and a plurality of point light sources that are aligned at equal intervals from one end to the other end of the predetermined light emission range. The point light source sequentially emits a laser beam parallel to the test piece at a predetermined interval in synchronization with the pulse of the pulse generator, and a condenser for converging the laser beam reflected from the reflective tape of the test piece. Part and the laser beam focused by the focusing part,
A pulse reading unit that reads out which pulse the laser beam reflected by both gauge points of the test piece corresponds to, and the number of pulses between both gauge points is obtained based on the reading result of the pulse reading unit. And an output unit for calculating and outputting the distance between the reference points of the test piece from the number of pulses thus obtained and the distance between the point light sources.
（作用） 同期パルス発生装置からのパルスに同期して、発光部が
所定の発光範囲の一方の端部から他方の端部まで順次試
験片に向けて平行なレーザー光線を発光する。(Operation) The light emitting section sequentially emits parallel laser beams toward the test piece from one end of the predetermined light emitting range to the other end in synchronization with the pulse from the synchronous pulse generator.
このレーザー光線は、試験片を経由して集光部に達し、
試験片の上下の標点に貼られている反射テープから反射
された光線のパルスが読み取られる。そして、両標点に
対応するパルス間に含まれるパルス数と発光間隔から標
点間距離が算出される。This laser beam reaches the focusing part via the test piece,
The pulse of the light beam reflected from the reflective tape attached to the upper and lower marks of the test piece is read. Then, the gauge length is calculated from the number of pulses included in the pulses corresponding to both gauges and the light emission interval.
（実施例） 以下、図面にあらわされた実施例について説明すれば、
第１図は本発明の構成説明図であって、この標点間変位
測定装置１は、材料試験機に取り付けられた試験片２か
ら離れた位置で使用されるもので、同期パルス発生器
３、レーザードライブ部４、発光部５、集光部６、セン
サ７、パルス読取器８、出力部９をそなえてなる。(Example) Hereinafter, an example shown in the drawings will be described.
FIG. 1 is a diagram for explaining the configuration of the present invention. This gauge-to-mark displacement measuring device 1 is used at a position apart from a test piece 2 attached to a material testing machine, and a synchronous pulse generator 3 is used. , A laser drive unit 4, a light emitting unit 5, a condenser unit 6, a sensor 7, a pulse reader 8 and an output unit 9.
同期パルス発生器３は、所定の周期で高周波数（数KNZ
乃至数MHZとするのが適当）のパルスを発生する装置で
あり、このパルスをレーザードライブ部４とパルス読取
器８に供給する。発光部５は上記パルス発生器３からの
パルスに同期して、所定の発光範囲（Ｗ）内で順次レー
ザー光線を平行に発光する部分であり、その発光範囲は
試験片の標点間距離よりも広くなっている。図示例の発
光部５はｎ個の発光ランプを上下に等間隔で整列させて
設けたもので、第２図に示す如く、その一方の端部
（L1）から他方の端部（Ln）に向かって１パルスごとに
発光位置を１個ずつずらしながら発光する。The synchronous pulse generator 3 has a high frequency (several KNZ) at a predetermined cycle.
It is a device for generating a pulse of (to several MHZ is appropriate), and this pulse is supplied to the laser drive unit 4 and the pulse reader 8. The light emitting portion 5 is a portion which sequentially emits laser beams in parallel within a predetermined light emitting range (W) in synchronization with the pulse from the pulse generator 3, and the light emitting range is greater than the gauge length of the test piece. It is getting wider. The light emitting unit 5 in the illustrated example is provided by arranging n light emitting lamps vertically at equal intervals. As shown in FIG. 2, one end (L 1 ) to the other end (L n ), The light emission position is shifted one by one for each pulse, and light is emitted.
試験片２の上下の標点位置A,Bには反射テープ10,10′が
貼着されており、発光部５から発光されたレーザー光線
がこの反射テープ10,10′に当って反射するようになっ
ている。試験片の他の部分は反射テープが貼られていな
いのでレーザー光線を反射しない。Reflecting tapes 10 and 10 'are attached to the upper and lower gauge positions A and B of the test piece 2 so that the laser beam emitted from the light emitting section 5 hits the reflecting tapes 10 and 10' and is reflected. Has become. The other part of the test piece does not reflect the laser beam because the reflective tape is not attached.
集光部６は試験片２の反射テープ10,10′から反射され
てくるレーザー光線を集光する集光レンズ6aをそなえ、
該集光レンズで集められた反射光がセンサ７によっめ検
出される。The condensing unit 6 has a condensing lens 6a for condensing the laser beam reflected from the reflection tapes 10 and 10 'of the test piece 2,
The reflected light collected by the condenser lens is detected by the sensor 7.
パルス読取器８は、センサ７によって検出された反射光
がいずれのパルスに該当するものかを読み取る装置であ
り、上下の標点上に貼着された反射テープ10,10′から
の反射光が、第何番目の発光ランプのものであるかがこ
こで読み取られる。The pulse reader 8 is a device for reading which pulse the reflected light detected by the sensor 7 corresponds to, and the reflected light from the reflection tapes 10 and 10 'affixed to the upper and lower gage marks. , The number of the light emitting lamp is read here.
出力部９は、パルス読取器８によって読み取られたパル
スから、上下の反射テープ10,10′の間に含まれるパル
ス数を求め、得られたパルス数と発光間隔（隣接する平
行な２本のレーザー光線間の距離）とから標点間距離を
求めて出力する部分である。負荷開始前の標点間パルス
数をPk、所定の負荷後の標点間パルス数をPl、発光間隔
をｄとすると、標点間の変位Δｌは、 Δｌ＝（Pl-Pk）×ｄ であらわされる。The output unit 9 obtains the number of pulses contained between the upper and lower reflection tapes 10 and 10 'from the pulse read by the pulse reader 8, and obtains the obtained number of pulses and the light emission interval (two adjacent parallel tapes). The distance between the laser beams) and the distance between the reference points is calculated and output. Letting Pk be the number of pulses between gauges before the start of load, Pl be the number of pulses between gauges after a predetermined load, and d be the light emission interval, the displacement Δl between gauges is Δl = (Pl-Pk) × d Is represented.
なお、発光部５は、各パルス毎に等間隔で位置をずらし
て平行にレーザー光線を発光することができるものであ
ればよく、第１図に図示したもののかわりに、第３図乃
至第５図に示すような装置を採用することもできる。す
なわち、第３図に示すものは、複数の発光ランプを並設
するかわりに、１個の発光体11と回転多面体12および投
光レンズ13をそなえてなるもので、発光体11から発光さ
れたレーザー光線は、回転多面体12によって投光レンズ
13側に反射され、投光レンズ13から試験片２に向けて平
行に投光される。回転多面体12の回転によって反射面の
角度が変わるため、各パルス毎に投光位置が所定の間隔
で規則正しく移動する。It should be noted that the light emitting section 5 may be any one that can emit laser beams in parallel by shifting the positions at regular intervals for each pulse, and instead of the one shown in FIG. 1, FIG. 3 to FIG. It is also possible to employ a device as shown in. That is, what is shown in FIG. 3 is provided with one light emitting body 11, a rotating polyhedron 12 and a light projecting lens 13 instead of arranging a plurality of light emitting lamps in parallel, and the light is emitted from the light emitting body 11. Laser beam is projected by a rotating polyhedron 12
The light is reflected to the side of 13 and is projected in parallel from the projection lens 13 toward the test piece 2. Since the angle of the reflecting surface changes due to the rotation of the rotating polyhedron 12, the projection position moves regularly at a predetermined interval for each pulse.
第４図に示すものは、第３図に示す装置の回転多面体12
のかわりにガルバー14を設けたもので、ガルバー14の微
小角度の回動により投光レンズ13からの投光位置が所定
の間隔で規則正しく移動する。What is shown in FIG. 4 is the rotating polyhedron 12 of the apparatus shown in FIG.
Instead of this, a gull bar 14 is provided, and the projection position from the projection lens 13 is regularly moved at a predetermined interval by the rotation of the gull bar 14 at a small angle.
第５図に示すものは、上記回転多面体12やガルバー14の
かわりに音響格子レンズ15を設けたもので、該音響格子
レンズによる回折角の変化によって、投光レンズ13から
の投光位置を所定の間隔で規則正しく移動させるように
なっている。In FIG. 5, an acoustic grating lens 15 is provided in place of the rotating polyhedron 12 and the galver 14, and the projection position from the projecting lens 13 is set to a predetermined value by changing the diffraction angle by the acoustic grating lens. It is designed to move at regular intervals.
（発明の効果） 以上の説明から明らかなように、本発明にかかる材料試
験機は、レーザー光線を用いて光学的に高精度の測定を
行なうことができるものであり、従来の伸び計のように
試験片にセンサ等を直接取り付ける必要がないので、煩
雑な取付け作業を必要とせず、試験片破損時に損傷を受
けることもなくなった。(Effects of the Invention) As is clear from the above description, the material testing machine according to the present invention is capable of optically highly accurate measurement using a laser beam, and is similar to the conventional extensometer. Since it is not necessary to directly attach a sensor or the like to the test piece, no complicated mounting work is required and the test piece is not damaged.
第１図は本発明にかかる材料試験機における標点間変位
測定装置の１例をあらわす構成説明図、第２図はパルス
をあらわすグラフ、第３図乃至第５図は異なる実施例を
あらわす発光部の構成説明図である。 １……標点間変位測定装置、２……試験片、３……パル
ス発生器、５……発光部、６……集光部、８……パルス
読取器、９……出力部FIG. 1 is a structural explanatory view showing an example of a gauge length displacement measuring device in a material testing machine according to the present invention, FIG. 2 is a graph showing a pulse, and FIGS. 3 to 5 show light emission showing different embodiments. It is a structure explanatory view of a part. 1 ... Gauge displacement measuring device, 2 ... Test piece, 3 ... Pulse generator, 5 ... Light emitting part, 6 ... Focusing part, 8 ... Pulse reader, 9 ... Output part
Claims (1)
た材料試験機において、所定の同期パルスを発生するパ
ルス発生装置と、所定の発光範囲におけるその一端部か
ら他端部にかけて等間隔で整列させた複数の点光源を備
え、これら点光源は順次前記パルス発生装置のパルスに
同期して所定の間隔で試験片に向けて平行にレーザー光
線を発光する発光部と、試験片の反射テープから反射さ
れてくるレーザー光線を集光する集光部と、該集光部に
よって集光されたレーザー光線から、試験片の両標点に
よって反射されたレーザー光線がいずれのパルスに該当
するものであるかを読み取るパルス読取り部と、該パル
ス読取り部の読取り結果に基づいて両標点間のパルス数
を求め、得られたパルス数と前記点光源の間隔から試験
片の標点間距離を算出して出力する出力部とを備えてな
る材料試験機。1. A material testing machine equipped with a device for measuring the displacement between gauge marks of a test piece, a pulse generator for generating a predetermined synchronizing pulse, and one end portion to the other end portion thereof in a predetermined light emission range, etc. Equipped with a plurality of point light sources arranged at intervals, these point light sources sequentially emit a laser beam parallel to the test piece at predetermined intervals in synchronization with the pulse of the pulse generator, and the reflection of the test piece. Which pulse corresponds to the laser beam reflected by both gauge marks of the test piece from the laser beam focused by the laser beam reflected by the tape and the laser beam focused by the laser beam And the pulse number between both gauge points based on the reading result of the pulse reading section, and the distance between the gauge points of the test piece is calculated from the obtained pulse number and the interval between the point light sources. Material testing machine comprising an output unit for issuing output.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60170215A JPH0789050B2 (en) | 1985-07-31 | 1985-07-31 | Material testing machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60170215A JPH0789050B2 (en) | 1985-07-31 | 1985-07-31 | Material testing machine |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6230905A JPS6230905A (en) | 1987-02-09 |
| JPH0789050B2 true JPH0789050B2 (en) | 1995-09-27 |
Family
ID=15900802
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60170215A Expired - Lifetime JPH0789050B2 (en) | 1985-07-31 | 1985-07-31 | Material testing machine |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0789050B2 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4619865B2 (en) * | 2005-05-31 | 2011-01-26 | 富士フイルム株式会社 | Sheet length measuring device, sheet sorting line, sheet cutting line, and sheet length measuring method |
| JP2014077660A (en) * | 2012-10-09 | 2014-05-01 | Fuji Xerox Co Ltd | Detector |
| ES2573353B1 (en) * | 2016-03-28 | 2017-03-23 | Universidad De Murcia | Optical instrument for non-contact length measurement |
| CN107576570A (en) * | 2017-09-27 | 2018-01-12 | 江苏法尔胜特钢制品有限公司 | The cupping machine of steel wire rope |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5390981A (en) * | 1977-01-20 | 1978-08-10 | Yokohama Rubber Co Ltd | Tension testing apparatus |
| JPS58218604A (en) * | 1982-06-14 | 1983-12-19 | Mitsutoyo Mfg Co Ltd | Method and apparatus for photoelectric type measurement |
| JPS59151973A (en) * | 1983-02-17 | 1984-08-30 | 三菱電機株式会社 | Swing measuring device |
-
1985
- 1985-07-31 JP JP60170215A patent/JPH0789050B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6230905A (en) | 1987-02-09 |
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