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JPH0795499B2 - Method of manufacturing film capacitor - Google Patents
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JPH0795499B2 - Method of manufacturing film capacitor - Google Patents

Method of manufacturing film capacitor

Info

Publication number
JPH0795499B2
JPH0795499B2 JP63038119A JP3811988A JPH0795499B2 JP H0795499 B2 JPH0795499 B2 JP H0795499B2 JP 63038119 A JP63038119 A JP 63038119A JP 3811988 A JP3811988 A JP 3811988A JP H0795499 B2 JPH0795499 B2 JP H0795499B2
Authority
JP
Japan
Prior art keywords
capacitor
slit
film
film capacitor
aluminum foil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP63038119A
Other languages
Japanese (ja)
Other versions
JPH01212421A (en
Inventor
長男 木下
健治 山田
彰一 楠野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63038119A priority Critical patent/JPH0795499B2/en
Publication of JPH01212421A publication Critical patent/JPH01212421A/en
Publication of JPH0795499B2 publication Critical patent/JPH0795499B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

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  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、フィルムコンデンサの製造方法に関するもの
である。
TECHNICAL FIELD The present invention relates to a method for manufacturing a film capacitor.

従来の技術 一般に、フィルムコンデンサの電極材料として用いられ
るアルミニウム箔を、第3図に示すように、高速回転す
る刃先角度20゜〜45゜の上刃11と固定されている刃先角
度90゜の下刃12とを用いて、所定の幅で帯状にスリット
して、作製している。そして、この帯状のアルミニウム
箔13を誘電体であるフィルム14と交互に重ねて巻回し、
さらに偏平にして、コンデンサ素子としている。
2. Description of the Related Art Generally, as shown in FIG. 3, an aluminum foil used as an electrode material for a film capacitor has a blade edge angle of 20 ° to 45 ° that rotates at a high speed and a blade edge angle of 90 ° fixed to the upper blade 11. It is manufactured by slitting into a band shape with a predetermined width using the blade 12. Then, the strip-shaped aluminum foil 13 and the film 14 which is a dielectric are alternately laminated and wound,
Further, it is made flat to form a capacitor element.

第4図はこのフィルムコンデンサの要部の構造を示して
いる。図において、A部分がコンデンサ対向部,B部分が
コンデンサマージン部,C部分が電極引出しアルミニウム
箔突出部である。
FIG. 4 shows the structure of the main part of this film capacitor. In the figure, the A portion is a capacitor facing portion, the B portion is a capacitor margin portion, and the C portion is an electrode lead-out aluminum foil protruding portion.

発明が解決しようとする課題 このようなフィルムコンデンサにおいて、素子を巻回し
たままの丸い状態から偏平した状態に成形加工すると、
通常、その耐電圧レベルが20〜30%低下してしまう。
DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention In such a film capacitor, when a molding process is performed from a round state in which an element is wound to a flat state,
Usually, the withstand voltage level is reduced by 20 to 30%.

発明者らは、このような製造過程における耐電圧レベル
低下の要因について種々検討し、電極箔を所定の幅の帯
状にスリットするための片刃の刃先の方向により、スリ
ットばりの生じやすい面とそれが生じにくい面とが存在
しており、このスリットばりがコンデンサ耐電圧レベル
の低下をひき起こしていることをつきとめた。
The inventors examined various factors of the withstand voltage level decrease in such a manufacturing process, the direction of the blade edge of a single blade for slitting the electrode foil into a strip having a predetermined width, and a surface that easily causes a slit burr. It was found that this slit flash caused a decrease in the withstand voltage level of the capacitor.

すなわち、アルミニウム箔13の、上刃11の刃先が垂直に
当たってスリットされた端縁部分15側では、スリットす
る際にその厚み方向に対して亀裂が大きく入りやすく、
その傾斜面側でスリットされた端縁部分16側に比べて数
倍のばり高さとなる。
That is, in the aluminum foil 13, the edge portion 15 side where the blade edge of the upper blade 11 hits vertically is slit, and a large crack easily occurs in the thickness direction when slitting,
The flash height is several times as high as that on the side of the edge portion 16 slit on the inclined surface side.

このような上刃11の刃先の形状によるばり高さに大きな
違いがあるにもかかわらず、これまで、その差異につい
てまったく配慮されておらず、誘電体であるフィルムと
単に交互に重ねて巻回し偏平に成型して、コンデンサ素
子としていた。
Despite the large difference in flash height due to the shape of the cutting edge of the upper blade 11, no consideration has been given to the difference so far. It was formed into a flat shape and used as a capacitor element.

そのため、アルミニウム箔の位置関係が一定せず、品質
がばらついたコンデンサしか得られていなかった。
For this reason, the positional relationship of the aluminum foil was not constant, and only capacitors of varying quality were obtained.

本発明はこような課題を解決するもので、耐電圧レベル
の低下の少ないフィルムコンデンサの製造方法を提供し
ようとするものである。
The present invention solves such a problem, and an object of the present invention is to provide a method of manufacturing a film capacitor in which the withstand voltage level is less likely to decrease.

課題を解決するための手段 本発明のフィルムコンデンサの製造方法は、スリット片
刃を用いて金属箔を所定の幅で帯状にスリットしてか
ら、この帯状金属箔の、スリット片刃垂直面側でスリッ
トした端縁部分を、誘電体フィルムの端部より突出する
よう位置させて、前記誘電体フィルムと重ね合わせて巻
回し、さらに偏平にするものである。
Means for Solving the Problems The method for manufacturing a film capacitor of the present invention is a method of slitting a metal foil into a strip shape with a predetermined width using a slit single blade, and then, of the strip metal foil, slitting on the side of the slit single blade vertical surface. The edge portion is positioned so as to project from the end portion of the dielectric film, and the dielectric film is superposed and wound, and further flattened.

作 用 電極としての金属箔が誘電体フィルムとともに巻回され
る際に、つねに、そのばりの高い方の端縁部分側が電極
引出し突出部に位置し、ばりの低い方の端縁部分側がコ
ンデンサマージン部に位置するので、ばりによって生じ
る偏平加工の際のフィルムへのストレスがいちじるしく
低減される。
When the metal foil as the working electrode is wound together with the dielectric film, the edge part side with the higher flash is always located at the electrode extraction protrusion, and the edge part side with the lower flash is the capacitor margin. Since it is located in the area, the stress on the film during the flattening caused by the flash is remarkably reduced.

実施例 以下、本発明の方法の一実施例について、第1図を参照
しながら説明する。
Example Hereinafter, one example of the method of the present invention will be described with reference to FIG.

電極箔としてアルミニウム箔を使用し、まず、スリット
片刃を用いてアルミニウム箔を所定の幅で帯状にスリッ
トしてから、図に示すように、この帯状アルミニウム箔
1の、スリット片刃傾斜面側でスリットした端縁部分4
側を、コンデンサマージン部側に位置させ、スリット片
刃垂直面側でスリットした端縁部分を誘電体フィルムの
端部より突出するよう位置させてから、誘電体としての
プラスチックフィルム3と重ねて巻回し、さらに偏平状
に成型する。
Using aluminum foil as the electrode foil, first slit the aluminum foil in a strip shape with a predetermined width using a slit single-edged blade, and then, as shown in the figure, slit this aluminum foil 1 on the side of the slit single-edged inclined surface. Edge part 4
Side is located on the side of the capacitor margin, and the edge part slit on the vertical side of the slit single blade is positioned so as to protrude from the end of the dielectric film, and then the film is wound on top of the plastic film 3 as a dielectric. , Further flattening.

このようにして作製されたコンデンサにおいては、A部
分がコンデンサ対向部となり、B部分がコンデンサマー
ジン部,C部分が電極引出しアルミニウム箔突出部となっ
て、アルミニウム箔1の、スリット片刃傾斜面側でスリ
ットされたばり高さの低い端縁部分4側が、コンデンサ
マージン部Bに、スリット片刃垂直面側でスリットされ
たばり高さの大きい端縁部分2が、電極引出しアルミニ
ウム箔突出部Cに位置している。
In the capacitor manufactured in this way, the A part is the capacitor facing part, the B part is the capacitor margin part, and the C part is the electrode drawing aluminum foil projecting part. The slitted edge portion 4 side having a low flash height is located in the capacitor margin portion B, and the edge portion 2 having a large flash height slit on the slit single blade vertical surface side is located in the electrode lead-out aluminum foil projecting portion C. ing.

第2図は、上記実施例によるコンデンサと従来のばり高
さの大きい端縁部分側がマージン部Bに位置する従来品
とについて、丸巻状態から偏平状態に成形加工したとき
のコンデンサ耐電圧レベルの変化を対比させて示してい
る。
FIG. 2 shows the withstand voltage level of the capacitor according to the above-described embodiment and the conventional product in which the edge portion side having a large flash height is located in the margin portion B when the rolled product is molded into the flat condition. The changes are shown in contrast.

これから明らかであるように、偏平状態に成形加工する
前の状態では、本実施例によるフィルムコンデンサと従
来品の耐電圧レベルにあまり大きな差がない。ところ
が、偏平状態に加工すると、従来品では耐電圧レベルが
大幅に低下するのに対して、本実施例によるコンデンサ
ではその耐電圧レベルの変化がきわめて小さい。
As is clear from this, in the state before the flattening process, there is not much difference in the withstand voltage level between the film capacitor according to this embodiment and the conventional product. However, when processed into a flat state, the withstand voltage level of the conventional product is significantly lowered, whereas the withstand voltage level of the capacitor according to the present embodiment changes very little.

このような効果の差異は、誘電体であるフィルムが薄く
なればなるほど、顕著となる。また、上述の効果は、金
属箔としてアルミニウム箔以外を使用した場合について
も、得られるのは言うまでもないことである。
Such a difference in effect becomes more remarkable as the film as the dielectric becomes thinner. Further, it goes without saying that the above-mentioned effects can be obtained even when a metal foil other than an aluminum foil is used.

発明の効果 本発明の方法によれば、フィルムコンデンサの製造過程
における耐電圧特性の低下が効果的に抑制され、従来品
に比べて信頼性の高いフィルムコンデンサを得ることが
できる。
EFFECTS OF THE INVENTION According to the method of the present invention, it is possible to effectively suppress a decrease in withstand voltage characteristics in the manufacturing process of a film capacitor, and to obtain a film capacitor having higher reliability than conventional products.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明にかかるフィルムコンデンサの製造方法
の一実施例を説明するためのコンデンサ要部断面図、第
2図はこの実施例によるコンデンサの耐電圧レベルの変
化を従来品と対比して示す図である。第3図は従来の製
造方法によるコンデンサの要部断面図、第4図はそのア
ルミニウム箔のスリット方法を説明するための図であ
る。 1……帯状アルミニウム箔、2……ばり高さの大きい端
縁部分部、3……誘電体フィルム、4……ばり高さの低
い端縁部分部、A……コンデンサ対向部、B……コンデ
ンサマージン部、C……電極引出しアルミニウム箔突出
部。
FIG. 1 is a sectional view of an essential part of a capacitor for explaining an embodiment of a method for manufacturing a film capacitor according to the present invention, and FIG. 2 shows a change in withstand voltage level of the capacitor according to this embodiment in comparison with a conventional product. FIG. FIG. 3 is a sectional view of an essential part of a capacitor manufactured by a conventional manufacturing method, and FIG. 4 is a view for explaining a slitting method of the aluminum foil. 1 ... band-shaped aluminum foil, 2 ... edge part with large flash height, 3 ... dielectric film, 4 ... edge part with low flash height, A ... capacitor facing part, B ... Capacitor margin part, C ... Aluminum foil protruding part for electrode extraction.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭62−252924(JP,A) 実開 昭52−127240(JP,U) 実開 昭57−121127(JP,U) ─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-62-252924 (JP, A) Actually opened 52-127240 (JP, U) Actually opened 57-121127 (JP, U)

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】スリット片刃を用いて金属箔を所定の幅で
帯状にスリットしてから、帯状の前記金属箔の、前記ス
リット片刃の垂直面側でスリットした端線部分を、誘電
体フィルムの端部より突出するよう位置させて、前記誘
電体フィルムと重ね合わせて巻回し、さらに偏平にする
ことを特徴とするフィルムコンデンサの製造方法。
1. A slit foil is used to slit a metal foil into a strip with a predetermined width, and the end portion of the strip-shaped metal foil, which is slit on the side perpendicular to the slit blade, is cut into a dielectric film. A method of manufacturing a film capacitor, characterized in that the film capacitor is positioned so as to project from the end portion, is wound so as to be superposed on the dielectric film, and is further flattened.
【請求項2】金属箔がアルミニウム箔であることを特徴
とする請求項1に記載のフィルムコンデンサの製造方
法。
2. The method of manufacturing a film capacitor according to claim 1, wherein the metal foil is an aluminum foil.
JP63038119A 1988-02-19 1988-02-19 Method of manufacturing film capacitor Expired - Fee Related JPH0795499B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63038119A JPH0795499B2 (en) 1988-02-19 1988-02-19 Method of manufacturing film capacitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63038119A JPH0795499B2 (en) 1988-02-19 1988-02-19 Method of manufacturing film capacitor

Publications (2)

Publication Number Publication Date
JPH01212421A JPH01212421A (en) 1989-08-25
JPH0795499B2 true JPH0795499B2 (en) 1995-10-11

Family

ID=12516578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63038119A Expired - Fee Related JPH0795499B2 (en) 1988-02-19 1988-02-19 Method of manufacturing film capacitor

Country Status (1)

Country Link
JP (1) JPH0795499B2 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52127240U (en) * 1976-03-24 1977-09-28
JPS57121127U (en) * 1981-01-22 1982-07-28
JPS6225294A (en) * 1985-07-25 1987-02-03 株式会社日立製作所 Periodic inspection method and instrument for nuclear reactor

Also Published As

Publication number Publication date
JPH01212421A (en) 1989-08-25

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