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JPH0799776B2 - Method for manufacturing amorphous silicon solar cell - Google Patents
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JPH0799776B2 - Method for manufacturing amorphous silicon solar cell - Google Patents

Method for manufacturing amorphous silicon solar cell

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Publication number
JPH0799776B2
JPH0799776B2 JP61029050A JP2905086A JPH0799776B2 JP H0799776 B2 JPH0799776 B2 JP H0799776B2 JP 61029050 A JP61029050 A JP 61029050A JP 2905086 A JP2905086 A JP 2905086A JP H0799776 B2 JPH0799776 B2 JP H0799776B2
Authority
JP
Japan
Prior art keywords
amorphous silicon
solar cell
type layer
silicon solar
type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61029050A
Other languages
Japanese (ja)
Other versions
JPS62188381A (en
Inventor
正之 石井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP61029050A priority Critical patent/JPH0799776B2/en
Publication of JPS62188381A publication Critical patent/JPS62188381A/en
Publication of JPH0799776B2 publication Critical patent/JPH0799776B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/548Amorphous silicon PV cells

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  • Photovoltaic Devices (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はアモルフアスシリコン太陽電池の製造方法に関
するもので、更に詳しくは、高効率で量産性に富むアモ
ルフアスシリコン太陽電池の製造方法に係るものであ
る。
TECHNICAL FIELD The present invention relates to a method for manufacturing an amorphous silicon solar cell, and more particularly to a method for manufacturing an amorphous silicon solar cell with high efficiency and high mass productivity. It is a thing.

〔従来の技術〕[Conventional technology]

光起電力効果を利用した電子デバイスの代表的なものと
しては太陽電池を例示できる。この太陽電池は太陽エネ
ルギーあるいはその他の光エネルギーを電気エネルギー
に変換するものであり、クリーンなエネルギー源とし
て、今後のエネルギー対策の一環として注目されてい
る。太陽電池による上記のエネルギー変換は、半導体の
ヘテロ接合、PnまたはPin接合、シヨツトキー接合など
の基本的な特性の1つである光起電力効果を利用したも
のであり、入射光を吸収し、そこで電子・正孔対を生成
し、これが外部に取出される、といつた機構に基くもの
である。
A solar cell can be illustrated as a typical electronic device utilizing the photovoltaic effect. This solar cell converts solar energy or other light energy into electric energy, and is attracting attention as a clean energy source as part of future energy measures. The above-mentioned energy conversion by a solar cell utilizes the photovoltaic effect, which is one of the basic characteristics of semiconductor heterojunctions, Pn or Pin junctions, Schottky junctions, etc. This is based on the mechanism that electron-hole pairs are generated and are taken out.

アモルフアス半導体、例えばアモルフアスシリコンは薄
膜化・大面積化が可能であり、組成の自由度も大きく、
電気的並びに光学的特性を広い範囲で制御できることか
ら、最近各種デバイスの材料として注目されている。特
に、太陽エネルギー分布のピーク近傍の光に対する吸収
係数がSi結晶より大きく、薄膜形成温度が低く、原料か
らグロー放電により直接成膜でき、また接合形成も容易
であるなどの特徴をもつことから太陽電池材料として注
目されている。
Amorphous semiconductors, such as amorphous silicon, can be made thin and have a large area, and have a large degree of freedom in composition.
Since it is possible to control electrical and optical characteristics in a wide range, it has recently attracted attention as a material for various devices. In particular, the absorption coefficient for light near the peak of the solar energy distribution is higher than that of Si crystals, the thin film formation temperature is low, direct film formation from raw materials by glow discharge is possible, and the formation of junctions is easy. It is attracting attention as a battery material.

このような太陽電池を代表とする光起電力素子を設計・
製作する上で重要なことは、高い光電変換効率を達成す
ることのできる材料の選択・組合せ等を十分に検討する
ことであり、また同様に広い波長範囲に亘り吸収効率を
高めるべく工夫することである。これにより、高効率の
実用可能な製品の実現が可能となる。従来、この太陽電
池において使用されていたアモルフアスシリコンは、透
明電極をもつ。
Designing a photovoltaic element typified by such a solar cell
What is important in manufacturing is to thoroughly study the selection and combination of materials that can achieve high photoelectric conversion efficiency, and also devise to improve absorption efficiency over a wide wavelength range. Is. This makes it possible to realize a highly efficient and practicable product. Conventionally, amorphous silicon used in this solar cell has a transparent electrode.

ガラス基板上にシラン(SiH4)ガスあるいはジシラン
(Si2H6)ガスを主原料として、プラズマ分解法により
作製されており、p、i、n型の3層のアモルフアスシ
リコンをそれぞれ50〜300Å、1,000〜7,000Å、100〜50
0Åの厚みとなるように形成し、金属電極を蒸着法によ
り成膜し、太陽電池としていた。
Silane (SiH 4 ) gas or disilane (Si 2 H 6 ) gas is used as the main raw material on the glass substrate, and it is produced by plasma decomposition method. 300Å, 1,000-7,000Å, 100-50
It was formed so as to have a thickness of 0Å, and a metal electrode was formed by a vapor deposition method to obtain a solar cell.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

ところで上記従来法によりアモルフアスシリコンを形成
する際に、変換効率が高い太陽電池を得るためには、厚
膜のi型層を0.5〜2Å/secの比較的ゆつくりとした速
度で成膜しなければならず、生産的でなかつた。また10
Å/sec以上の高速成膜した場合、特に曲線因子、出力電
流の値が低く、高変換効率の太陽電池は得られたなかつ
た。
By the way, in order to obtain a solar cell with high conversion efficiency when forming amorphous silicon by the above-mentioned conventional method, a thick i-type layer is formed at a relatively slow rate of 0.5 to 2Å / sec. It had to be productive and unproductive. Again 10
When the film was deposited at a high speed of Å / sec or more, a solar cell with a high conversion efficiency and a low fill factor and output current was not obtained.

今後の新エネルギー対策の一環として重要視されている
太陽電池においては、低価格化、高性能化が当面の重大
な研究、開発の課題となつている。低価格化を実現する
太陽電池材料としてアモルフアスシリコンが注目されて
いるが、性能的にはかなり高い変換効率のものが得られ
るようになつてはきたが、低価格化では、まだ十分では
ない。この理由として考えられるのに、前記した成膜速
度が遅いことが挙げられる。
For solar cells, which are regarded as important as part of measures for new energy in the future, cost reduction and high performance are important issues for immediate research and development. Amorphous silicon is attracting attention as a solar cell material that achieves low prices, but it has come to be possible to obtain conversion efficiency that is quite high in terms of performance, but low prices are not yet sufficient. . One possible reason for this is that the above-mentioned film formation rate is low.

グロー放電分解法で作製するp−i−nアモルフアス系
太陽電池は、従来、i型層の膜厚方向にそつて一定の成
膜速度、例えば、0.1〜2Å/secの低速で成膜していた
ので厚み4,000Åのi型膜を成膜し終えるのに30分から
2時間近く要していた。又100%SiH4ガスや100%Si2H6
ガスを用いて5〜100Å/secの高速成膜を行なう試みも
なされているが、p型層と接するi型層(p/i界面のi
型層)を高速で成膜すると、前記のようにp/i界面特性
の劣化をもたらし、良好な出力特性を有する太陽電池は
得られていない。
The p-i-n amorphous solar cell manufactured by the glow discharge decomposition method has conventionally been formed at a constant film formation rate in the film thickness direction of the i-type layer, for example, 0.1 to 2Å / sec. Therefore, it took about 30 minutes to 2 hours to complete the formation of the i-type film with a thickness of 4,000Å. Also 100% SiH 4 gas and 100% Si 2 H 6
Attempts have been made to perform high-speed film formation of 5 to 100 Å / sec using gas, but the i-type layer in contact with the p-type layer (i at the p / i interface)
When the mold layer is formed at a high speed, the p / i interface characteristics are deteriorated as described above, and a solar cell having good output characteristics has not been obtained.

又、従来の上記2つの方法によつて作製された太陽電池
は前者の場合、変換効率の高いものが得られる反面、製
造にかかる時間がかかるため、非生産的であつた。又、
低速度で成膜したものは、膜中に不純物、特に酸素原子
の取りこみが多く、光に対する劣化大であつた。
In the former case, the solar cell manufactured by the above-described two conventional methods has a high conversion efficiency, but on the other hand, it takes a long time to manufacture, which is unproductive. or,
The film formed at a low speed had a large amount of impurities, particularly oxygen atoms, incorporated into the film, and was largely deteriorated by light.

本考案はこのような現状に鑑み、高効率で量産性に富む
アモルフアスシリコン太陽電池の製造方法の提供を目的
とするものである。
The present invention has been made in view of the above circumstances, and an object thereof is to provide a method for manufacturing an amorphous silicon solar cell with high efficiency and high mass productivity.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は、p−i−n型アモルフアス系太陽電池のi型
層を成膜する際に、p型層と接するi型層の成膜にはH2
で希釈したSiH4ガスを用い、バルクのi型層の成膜には
100%SiH4ガスを用いることにより、p型層と接するi
型層とバルクのi型層とで成膜速度を変えて成膜するこ
とを特徴とするアモルフアスシリコン太陽電池の製造方
法である。
According to the present invention, when the i-type layer of the p-i-n type amorphous solar cell is formed, H 2 is used for forming the i-type layer in contact with the p-type layer.
SiH 4 gas diluted with is used to form a bulk i-type layer
By using 100% SiH 4 gas, contact with the p-type layer i
A method for manufacturing an amorphous silicon solar cell, characterized in that film formation is performed at different film forming rates for a mold layer and a bulk i-type layer.

本発明の一つの特に好ましい実施態様は、p型層と接す
るi型層の厚みが約30Åから1000Åである上記方法があ
る。また一つの特に好ましい実施態様としては、p型層
と接するi型層の成膜速度が0.1Å/secから2Å/secで
あり、バルクのi膜層の成膜速度が2Å/secから50Å/s
ecである上記方法が挙げられる。
One particularly preferred embodiment of the present invention is the above method wherein the thickness of the i-type layer in contact with the p-type layer is about 30Å to 1000Å. In another particularly preferred embodiment, the film formation rate of the i-type layer in contact with the p-type layer is 0.1Å / sec to 2Å / sec, and the film formation rate of the bulk i-film layer is 2Å / sec to 50Å / s
ec is the above method.

以下図面を参照して本発明を具体的に説明する。第1図
は本発明によるアモルフアスシリコン太陽電池の構造を
示す断面図であつて、1はガラス基板、2は透明導電
膜、3はp型アモルフアスシリコン層、4は低速で成膜
したi型アモルフアスシリコン層(p型層に接するi型
層アモルフアスシリコン)、5は高速で成膜したi型ア
モルフアスシリコン層(バルクのi型層アモルフアスシ
リコン)、6はn型アモルフアスシリコン層、7は金属
電極をあらわし、光はガラス基板1側から入射するp−
i−n構造をしている。
The present invention will be specifically described below with reference to the drawings. FIG. 1 is a cross-sectional view showing the structure of an amorphous silicon solar cell according to the present invention, in which 1 is a glass substrate, 2 is a transparent conductive film, 3 is a p-type amorphous silicon layer, and 4 is a low-speed film forming i. Type amorphous silicon layer (i-type amorphous silicon in contact with p-type layer), 5 is an i-type amorphous silicon layer (bulk i-type amorphous silicon) formed at high speed, and 6 is n-type amorphous silicon The layer 7 represents a metal electrode, and light is incident from the glass substrate 1 side p-
It has an in structure.

p型アモルフアスシリコン層3に続いてi型アモルフア
スシリコン層4及び5を成膜する際に、p−i界面付近
の30〜1000Å望ましくは、100〜500Åのi型層4は、従
来から高い変換効率を得るのに使用されている0.1〜2
Å/secの低い速度で成膜し、i−n界面に向けてのi型
バルク層5は2〜50Å/secの高速で成膜する。特に好ま
しくは低速成膜を0.5〜1.5Å/sec、高速成膜を10〜30Å
/secで行うことが挙げられる。
When forming the i-type amorphous silicon layers 4 and 5 subsequent to the p-type amorphous silicon layer 3, 30 to 1000 Å, preferably 100 to 500 Å of the i-type layer 4 near the p-i interface is conventionally used. 0.1-2 used to get high conversion efficiency
The film is formed at a low rate of Å / sec, and the i-type bulk layer 5 toward the in-n interface is formed at a high rate of 2 to 50 Å / sec. Especially preferred is 0.5-1.5Å / sec for low-speed film formation and 10-30Å for high-speed film formation.
/ sec can be mentioned.

p−i界面付近の低速成膜領域は30Å以下では高い変換
効率を維持するのに十分でなく、又、1000Åでは生産性
向上にはつながらない。本発明では、p型層に接するi
型層の低速成膜にH2で希釈したSiH4ガスを用い、その上
のバルクi型層の高速成膜には100%SiH4ガスを用いて
成膜速度を制御する。
The low-rate film forming region near the pi interface is not sufficient to maintain high conversion efficiency at 30 Å or less, and 1000 Å does not lead to improvement in productivity. In the present invention, i that is in contact with the p-type layer
SiH 4 gas diluted with H 2 is used for low speed film formation of the mold layer, and 100% SiH 4 gas is used for high speed film formation of the bulk i-type layer thereon to control the film formation speed.

〔作用〕 p型層と接するi型層を低速で成膜することによりp−
i界面近傍光生成キヤリア(光が入射することによりi
型層内で生成した電子、正孔対のこと。この量が多い
程、発生電流は多くなる。)がトラツプされなり、再結
合してキヤリアが消滅する割合が少ない、良好な界面状
態を維持でき、太陽電池特性の出力電流や曲線因子は高
い状態を維持することができるため、変換効率の高い太
陽電池が得られ、しかも、i型層のバルクは高速成膜で
形成しているために、従来よりも短時間で成膜が完了す
ることができい、量産を行なうのによい。
[Operation] By forming the i-type layer in contact with the p-type layer at a low speed, p-
Light generation carrier near the interface (i
An electron-hole pair generated in the mold layer. The larger this amount, the larger the generated current. ) Is trapped, the rate of recombination and carrier disappearance is small, a good interface state can be maintained, and the output current and fill factor of the solar cell characteristics can be kept high, resulting in high conversion efficiency. Since a solar cell can be obtained and the bulk of the i-type layer is formed by high-speed film formation, the film formation cannot be completed in a shorter time than in the past, which is suitable for mass production.

〔実施例〕〔Example〕

第1図の構造のアモルフアスシリコン太陽電池を以下の
ように作成した。反射防止膜並びに電極として機能する
透明導電膜2を有するガラス基板1をプラズマ反応室に
セツトし、SiH4とB2H6の混合ガスを用いてプラズマ反応
によりp型アモルフアスシリコン膜3を120Å厚さに堆
積した後、i型アモルフアスシリコン膜4,5をSiH4ガス
のみを用いて形成した。成膜方法としては10%に希釈し
たSiH4ガスを用いて、1Å/secの成膜速度で100Å厚さ
にi型層4を成膜後、さらにガスを切換え、100%SiH4
ガスを用いて20Å/secの成膜速度で4500Å厚さにi型ア
モルフアスシリコン層5を形成した。
An amorphous silicon solar cell having the structure shown in FIG. 1 was prepared as follows. A glass substrate 1 having a transparent conductive film 2 which functions as an antireflection film and an electrode is set in a plasma reaction chamber, and a p-type amorphous silicon film 3 is formed by a plasma reaction using a mixed gas of SiH 4 and B 2 H 6 to 120Å. After being deposited to a thickness, i-type amorphous silicon films 4 and 5 were formed using only SiH 4 gas. As the film forming method, SiH 4 gas diluted to 10% was used to form the i-type layer 4 at a film forming speed of 1 Å / sec to a thickness of 100 Å, and then the gas was changed to 100% SiH 4 gas.
An i-type amorphous silicon layer 5 was formed in a thickness of 4500Å using a gas at a film forming rate of 20Å / sec.

更に、引き続いてSiH4とPH3の混合ガスを用いてn型ア
モルフアスシリコン膜6を500Å厚さ形成後、裏面電極
7としてAgを蒸着法により形成し、第1図に示す本発明
のp−i−n型アモルフアスシリコン太陽電池を完成し
た(実施例)。
Further, subsequently, an n-type amorphous silicon film 6 having a thickness of 500 Å is formed by using a mixed gas of SiH 4 and PH 3 , and then Ag is formed as a back surface electrode 7 by a vapor deposition method. An in-type amorphous silicon solar cell was completed (Example).

比較のために、上記実施例においてi型アモルフアスシ
リコン層をすべて低速の1Å/secの成膜し厚さ4500Åと
した、第2図に示す断面図のアモルフアスシリコン太陽
電池を作成した(比較例A)。また、上記実施例におい
て、i型アモルフアスシリコン層をすべて高速の20Å/s
ecの成膜し厚さ4500Åとして、第3図に示す断面図のも
のを作成し、比較例Bとした。なお第2図、第3図にお
いて符号の意味するところは第1図と同じである。
For comparison, an amorphous silicon solar cell having the cross-sectional view shown in FIG. 2 was prepared in which the i-type amorphous silicon layer was formed at a low speed of 1 Å / sec to a thickness of 4500 Å in the above-mentioned example (comparison). Example A). In addition, in the above-mentioned embodiment, the i-type amorphous silicon layer is formed at a high speed of 20 Å / s.
A comparative example B was prepared by forming a film of ec with a thickness of 4500Å and having a sectional view shown in FIG. The meanings of the reference numerals in FIGS. 2 and 3 are the same as those in FIG.

本発明の実施例および比較例Aならびに比較例Bで得ら
れたp−i−n型アモルフアスシリコン太陽電池の出力
特性は下表のとおりであつた。
The output characteristics of the pin type amorphous silicon solar cells obtained in Examples of the present invention and Comparative Examples A and B are shown in the table below.

表から明らかな如く、本発明により高効率のアモルフア
スシリコン太陽電池が得られる。本実施例と比較例Aと
はほぼ同程度の特性のものが得られるにもかかわらず、
本実施例ではi型層を成膜するに要する時間において比
較例Aの場合の20分の1の成膜時間でi型層全体が形成
できるため、高効率でしかも量産性に富むアモルフアス
シリコン太陽電池が得ることができる。なお、比較例B
のものは明らかにその特性が劣つている。
As is apparent from the table, the present invention provides a highly efficient amorphous silicon solar cell. Although this example and the comparative example A have almost the same characteristics,
In this example, the entire i-type layer can be formed in a time that is 20 times shorter than the time required for forming the i-type layer in the case of Comparative Example A. Therefore, the amorphous silicon having high efficiency and high mass productivity can be formed. Solar cells can be obtained. Comparative example B
Are obviously inferior in their properties.

第4図は、本実施例と比較例Aによるアモルフアスシリ
コン太陽電池の光照射テスト結果を示すもので、AM1.0
(エアマスワン)の光源下で光照射した時の変換効率
(η)の初期値(η)で規格化した変換効率(η/η
%)を示している。第4図中イは本実施例をロは比較
例Aをあらわす。100時間のテストで変換効率が、比較
例Aの場合60%まで低下しているが、本実施例では90%
までの低下に抑えられており、本発明によれば光に対す
る信頼性が高い太陽電池も製造できることがわかる。
FIG. 4 shows the light irradiation test results of the amorphous silicon solar cells according to this example and Comparative example A.
Conversion efficiency (η / η) standardized by the initial value (η 0 ) of conversion efficiency (η) when light is irradiated under the light source of (Air mass one)
0 %). In FIG. 4, "a" represents this embodiment and "b" represents comparative example A. In the 100-hour test, the conversion efficiency was reduced to 60% in Comparative Example A, but 90% in this Example.
It can be seen that a solar cell having high reliability with respect to light can be manufactured according to the present invention.

〔発明の効果〕〔The invention's effect〕

以上説明したように、本発明はアモルフアスシリコン太
陽電池を構成する層の中で最も厚いi型層を成膜する際
に、p型層と接するi型層の成膜速度を、i型層のバル
ク域での成膜速度に比べて低くすることにより、p/i界
面の特性が良好となる為、高い変換効率をもつアモルフ
アスシリコン太陽電池が得られ、又バルク域は高速成膜
するので、量産性ある製造が可能となり、アモルフアス
シリコン太陽電池の低コスト化、信頼性向上を実現する
効果を奏する。
As described above, according to the present invention, when forming the thickest i-type layer among the layers constituting the amorphous silicon solar cell, the film formation rate of the i-type layer in contact with the p-type layer is set to the i-type layer. By making the deposition rate lower than that in the bulk region, the characteristics of the p / i interface are improved, so an amorphous silicon solar cell with high conversion efficiency can be obtained, and high-speed deposition is performed in the bulk region. Therefore, it is possible to perform mass-production, and it is possible to reduce the cost and improve the reliability of the amorphous silicon solar cell.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明のアモルフアスシリコン太陽電池の構造
を示す断面図、 第2図及び第3図は従来のアモルフアスシリコン太陽電
池の構造を示す断面図である。 第4図は本発明品と従来品の光照射テスト結果を示すグ
ラフであつて、光照射時間(hours)に対する変換効率
(η/η%)の関係を示す。
FIG. 1 is a sectional view showing the structure of an amorphous silicon solar cell of the present invention, and FIGS. 2 and 3 are sectional views showing the structure of a conventional amorphous silicon solar cell. FIG. 4 is a graph showing the light irradiation test results of the product of the present invention and the conventional product, showing the relationship of the conversion efficiency (η / η 0 %) with respect to the light irradiation time (hours).

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】p−i−n型アモルフアス系太陽電池のi
型層を成膜する際に、p型層と接するi型層の成膜には
H2で希釈したSiH4ガスを用い、バルクのi型層の成膜に
は100%SiH4ガスを用いることにより、p型層と接する
i型層とバルクのi型層とで成膜速度を変えて成膜する
ことを特徴とするアモルフアスシリコン太陽電池の製造
方法。
1. A p-i-n type amorphous solar cell i
For forming the i-type layer in contact with the p-type layer when forming the mold layer,
SiH 4 gas diluted with H 2 is used, and 100% SiH 4 gas is used for film formation of the bulk i-type layer, so that the film formation rate for the i-type layer in contact with the p-type layer and the bulk i-type layer A method of manufacturing an amorphous silicon solar cell, characterized in that the film is formed by changing the temperature.
【請求項2】前記p型層と接するi型層の厚みが約30Å
から1000Åである特許請求の範囲第1項に記載のアモル
フアスシリコン太陽電池の製造方法。
2. The thickness of the i-type layer in contact with the p-type layer is about 30Å
The method for producing an amorphous silicon solar cell according to claim 1, wherein the amorphous silicon solar cell is from 1000 to 1000Å.
【請求項3】前記p型層と接するi型層の成膜速度が0.
1Å/secから2Å/secであり、バルクのi型層の成膜速
度が2Å/secから50Å/secである特許請求の範囲第1項
又は第2項に記載のアモルフアスシリコン太陽電池の製
造方法。
3. The deposition rate of the i-type layer in contact with the p-type layer is 0.
The production of the amorphous silicon solar cell according to claim 1 or 2, wherein the deposition rate of the bulk i-type layer is from 1 Å / sec to 2 Å / sec and from 2 Å / sec to 50 Å / sec. Method.
JP61029050A 1986-02-14 1986-02-14 Method for manufacturing amorphous silicon solar cell Expired - Lifetime JPH0799776B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61029050A JPH0799776B2 (en) 1986-02-14 1986-02-14 Method for manufacturing amorphous silicon solar cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61029050A JPH0799776B2 (en) 1986-02-14 1986-02-14 Method for manufacturing amorphous silicon solar cell

Publications (2)

Publication Number Publication Date
JPS62188381A JPS62188381A (en) 1987-08-17
JPH0799776B2 true JPH0799776B2 (en) 1995-10-25

Family

ID=12265554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61029050A Expired - Lifetime JPH0799776B2 (en) 1986-02-14 1986-02-14 Method for manufacturing amorphous silicon solar cell

Country Status (1)

Country Link
JP (1) JPH0799776B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR910007465B1 (en) * 1988-10-27 1991-09-26 삼성전관 주식회사 Making method of solar cell of amorphous silicon
US6566594B2 (en) 2000-04-05 2003-05-20 Tdk Corporation Photovoltaic element
KR20090042943A (en) * 2007-02-16 2009-05-04 미츠비시 쥬고교 가부시키가이샤 Photoelectric conversion device and manufacturing method thereof

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59107574A (en) * 1982-12-13 1984-06-21 Agency Of Ind Science & Technol Manufacturing method for amorphous silicon solar cells
JPS60192374A (en) * 1984-03-13 1985-09-30 Sanyo Electric Co Ltd Manufacture of photovoltaic device
JPH0612836B2 (en) * 1984-08-20 1994-02-16 三井東圧化学株式会社 Method for manufacturing photoelectric conversion element
JPH0612835B2 (en) * 1984-08-20 1994-02-16 三井東圧化学株式会社 Manufacturing method of photoelectric conversion element

Also Published As

Publication number Publication date
JPS62188381A (en) 1987-08-17

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