JPH0821711B2 - Charge transfer device - Google Patents
Charge transfer deviceInfo
- Publication number
- JPH0821711B2 JPH0821711B2 JP1090672A JP9067289A JPH0821711B2 JP H0821711 B2 JPH0821711 B2 JP H0821711B2 JP 1090672 A JP1090672 A JP 1090672A JP 9067289 A JP9067289 A JP 9067289A JP H0821711 B2 JPH0821711 B2 JP H0821711B2
- Authority
- JP
- Japan
- Prior art keywords
- transfer
- width
- narrowed
- potential
- channel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Solid State Image Pick-Up Elements (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、例えばビデオカメラ等の固体撮像装置に用
いられる電荷転送装置に関する。TECHNICAL FIELD The present invention relates to a charge transfer device used in a solid-state image pickup device such as a video camera.
(従来の技術) 近年、固体撮像装置を組み込んだビデオカメラが用い
られるようになった。この固体撮像装置の主流となって
いるのがCCD型固体撮像装置である。従来のCCD(電荷移
送素子:Charge Coupled Device)は、第3図の平面図及
びそのB-B′断面図(第4図(a))に例示するような
構造となっている。第3図に示すように転送チャンネル
1は電荷転送方向に沿って、1箇所だけ転送チャンネル
幅Wが狭められる所1aがあり、1層目のポリシリコンで
構成された転送電極2a,2b…両縁を覆うごとく、2層目
のポリシリコンで形成された転送電極3a,3b,3c…が形成
され、前記転送チャンネル幅WがW′に狭められる所1a
上に1層目の転送電極2aが位置するように配線される構
造となっている。また、前記1層目,2層目の転送電極
は、第4図(a)に示すように、夫々二酸化シリコン膜
(SiO2)4で区画(絶縁層で分離)し、P型半導体基板
5上のN型層6に接合している。(Prior Art) In recent years, a video camera incorporating a solid-state imaging device has been used. The CCD type solid-state imaging device is the mainstream of this solid-state imaging device. A conventional CCD (Charge Coupled Device) has a structure as illustrated in the plan view of FIG. 3 and its BB ′ sectional view (FIG. 4A). As shown in FIG. 3, the transfer channel 1 has a place 1a where the transfer channel width W is narrowed only at one position along the charge transfer direction, and the transfer electrodes 2a, 2b ... A portion 1a where transfer electrodes 3a, 3b, 3c formed of second layer polysilicon are formed so as to cover the edges and the transfer channel width W is narrowed to W '.
The structure is such that the transfer electrode 2a of the first layer is located on the upper side. As shown in FIG. 4A, the transfer electrodes of the first layer and the second layer are each partitioned by a silicon dioxide film (SiO 2 ) 4 (separated by an insulating layer), and a P-type semiconductor substrate 5 is formed. It is joined to the upper N-type layer 6.
第4図(b),(c)は第4図(a)と位置的に対応
した電位分布と、転送電荷Cの状態を示してある。
(b)図の7は転送電極2aの中で電位が変化している所
を示し、それは第3図に示す転送チャンネル1が狭めら
れる所1aがあるために狭チャンネル効果を生じ、転送チ
ャンネル幅が狭い方の電位が低くなるからである。図面
上で上が低電位、下が高電位を示す。FIGS. 4 (b) and 4 (c) show the potential distribution and the state of the transfer charge C, which correspond in position to FIG. 4 (a).
(B) in FIG. 7 shows where the potential changes in the transfer electrode 2a. This is because the transfer channel 1 shown in FIG. This is because the narrower one has a lower potential. In the drawing, the upper part shows the low potential and the lower part shows the high potential.
そして、このような状態で(c)図のように転送チャ
ンネル幅の狭い方向に電荷を転送しようとすると、図に
示すように電位障壁8が発生し、転送電荷Cが取り残さ
れるため転送効率は著しく低いものとなる。Then, in such a state, when the charge is transferred in the direction in which the transfer channel width is narrow as shown in (c), the potential barrier 8 is generated as shown in the drawing, and the transfer charge C is left behind, so that the transfer efficiency is improved. It will be extremely low.
(発明が解決しようとする課題) 上述したように従来のCCDは、転送チャンネルの幅を
1箇所で狭め、電荷の転送を行なうので狭チャンネル効
果によって電位障壁が発生し、転送効率を著しく低下す
る欠点があった。(Problems to be Solved by the Invention) As described above, in the conventional CCD, the width of the transfer channel is narrowed at one position to transfer charges, so that a potential barrier is generated due to the narrow channel effect, and the transfer efficiency is significantly reduced. There was a flaw.
本発明はこのような事情に鑑み、狭チャンネル効果に
よって発生する電位障壁の影響を除き、高い転送効率の
電荷転送装置を得ることを目的とする。In view of such circumstances, it is an object of the present invention to obtain a charge transfer device having high transfer efficiency by removing the influence of the potential barrier generated by the narrow channel effect.
(課題を解決するための手段) 本発明は上記目的を達成するため、電荷転送方向に沿
って狭められる転送チャンネル幅を所定長内において、
複数箇所で所定幅に狭め、その転送チャンネル幅の狭め
られた所の上に転送電極の実効的な境界部を形成したこ
とを特徴とする。(Means for Solving the Problems) In order to achieve the above object, the present invention provides a transfer channel width narrowed along the charge transfer direction within a predetermined length,
It is characterized in that it is narrowed to a predetermined width at a plurality of locations, and an effective boundary portion of the transfer electrodes is formed on the location where the transfer channel width is narrowed.
(作用) 本発明は上記手段により、複数箇所で狭めることによ
って、全体として必要なだけの幅を狭め、狭チャンネル
効果による電位障壁は複数箇所で転送電極の境界に発生
し、転送時に複数箇所の転送電極に異なる電圧を印加す
ることによって、狭チャンネル効果の影響を取除くこと
が出来るため、高い伝送効率をうることができる。(Function) According to the present invention, by narrowing a plurality of points by the above means, a necessary width as a whole is narrowed, and a potential barrier due to a narrow channel effect occurs at a boundary of the transfer electrode at a plurality of points, and the potential barrier of the plurality of points is generated at the time of transfer. By applying different voltages to the transfer electrodes, it is possible to remove the influence of the narrow channel effect, so that high transmission efficiency can be obtained.
(実施例) 第1図は本発明の一実施例の平面図、第2図(a)は
第1図のA-A′断面図、第2図(b)及び第2図(c)
は第2図(a)と位置的に対応した電位分布及び転送電
極3b,3cに電圧を印加した時の電位分布を示す。(Embodiment) FIG. 1 is a plan view of an embodiment of the present invention, FIG. 2 (a) is a sectional view taken along the line AA 'of FIG. 1, FIG. 2 (b) and FIG. 2 (c).
Shows a potential distribution corresponding to the position in FIG. 2A and a potential distribution when a voltage is applied to the transfer electrodes 3b and 3c.
上記第1図(a)に示すように転送チャンネル1の幅
Wが、複数箇所で狭められ(1a,1b,1c)、かつ、1箇所
で狭める幅は所定幅以下とし、全体として必要なだけの
所定幅W′としている。そして、狭所1a,1b,1cで転送チ
ャンネル1の幅が狭められところの電位が変化している
ところが、第2図(b)の7a,7b,7cである。こられの電
位変化による合計の電位差は、従来(第4図)と同様で
あるが、1箇所での電位差は従来と比べて非常に小さ
い。そして、転送電極の境界チャンネルに形成されたこ
の小さな電位差は、転送時にその両側の転送電極に異な
る電圧を印加することによって、第2図(c)に示すよ
うにチャンネル内の空乏層が広がり、電位差は吸収され
て電位障壁とならない。このとき、両側の転送電極3b,3
cに印加する電圧差が大きい程、大きな電位障壁を吸収
することが出来る。このことは、1箇所で転送チャンネ
ルを狭める幅を大きくすることができる。As shown in FIG. 1 (a), the width W of the transfer channel 1 is narrowed at a plurality of places (1a, 1b, 1c), and the width narrowed at one place is less than or equal to a predetermined width, and as a whole it is necessary. Of the predetermined width W '. And, the places where the width of the transfer channel 1 is narrowed in the narrow places 1a, 1b, 1c and the potential is changed are 7a, 7b, 7c in FIG. 2 (b). The total potential difference due to these potential changes is the same as that in the conventional case (FIG. 4), but the potential difference at one location is much smaller than that in the conventional case. Then, this small potential difference formed in the boundary channel of the transfer electrodes spreads the depletion layer in the channel as shown in FIG. 2 (c) by applying different voltages to the transfer electrodes on both sides during transfer. The potential difference is absorbed and does not serve as a potential barrier. At this time, the transfer electrodes 3b, 3 on both sides
The larger the voltage difference applied to c, the larger the potential barrier can be absorbed. This can increase the width of narrowing the transfer channel at one location.
ここで、1箇所で許容される狭める幅及び幅が変化す
る部分の転送方向の長さは、転送チャンネル幅、N型層
6の濃度,深さ,二酸化シリコン膜4の厚さ、印加電圧
差等によって異なる。Here, the narrowing width allowed at one location and the length in the transfer direction of the portion where the width changes are as follows: transfer channel width, concentration and depth of N-type layer 6, thickness of silicon dioxide film 4, difference in applied voltage. Etc.
また、本実施例は埋込み型の転送チャンネルについて
説明したが、表面型の転送チャンネルでも同様である。In addition, although the buried transfer channel is described in this embodiment, the same applies to the surface transfer channel.
(発明の効果) 以上説明したように本発明は、電荷転送装置の転送チ
ャンネルの幅が、その狭められる所の上に転送電極の実
効的な境界部を形成し、また、1箇所で狭められる幅を
所定幅以下とし、複数箇所で転送チャンネル幅を狭め
る。これによって狭チャンネル効果による電位障壁を両
転送電極の境界に発生させ、転送時に両転送電極に異な
る電圧が印加されることにより、狭チャンネル効果が取
除かれ、高い転送効率をうることが出来る。(Effect of the Invention) As described above, according to the present invention, the width of the transfer channel of the charge transfer device forms an effective boundary portion of the transfer electrode on the narrowed portion, and is narrowed at one location. The width is set to a predetermined width or less, and the transfer channel width is narrowed at a plurality of points. As a result, a potential barrier due to the narrow channel effect is generated at the boundary between both transfer electrodes, and different voltages are applied to both transfer electrodes during transfer, so that the narrow channel effect is removed and high transfer efficiency can be obtained.
第1図は本発明の一実施例による平面図、第2図(a)
は第1図のA-A′断面図、第2図(b)及び(c)は第
2図(a)と位置対応の電位分布及び転送電荷の転送状
態を示す図、第3図は従来例のCCDの平面図、第4図
(a)は第3図のB-B′断面図、第4図(b)及び
(c)は第4図(a)と位置対応の電位分布及び転送電
荷の転送状態を示す図である。 1……転送チャンネル、1a,1b,1c……狭所、2a,2b,2c,3
a,3b,3c,3d……転送電極、4……二酸化シリコン膜、5
……P型半導体基板、6……N型層、7,7a,7b,7c……電
位変化点、8……電位障壁。FIG. 1 is a plan view according to an embodiment of the present invention, and FIG. 2 (a).
Is a sectional view taken along the line AA 'in FIG. 1, FIGS. 2 (b) and 2 (c) are diagrams showing the potential distribution and the transfer state of the transfer charge corresponding to the position in FIG. 2 (a), and FIG. A plan view of the CCD, FIG. 4 (a) is a sectional view taken along line BB ′ in FIG. 3, and FIGS. 4 (b) and 4 (c) are potential distributions corresponding to FIG. 4 (a) and transfer states of transfer charges. FIG. 1 …… Transfer channel, 1a, 1b, 1c …… Narrow space, 2a, 2b, 2c, 3
a, 3b, 3c, 3d …… Transfer electrode, 4 …… Silicon dioxide film, 5
... P-type semiconductor substrate, 6 ... N-type layer, 7,7a, 7b, 7c ... potential change point, 8 ... potential barrier.
Claims (1)
ンネル幅を所定長内において、複数箇所で所定幅に狭
め、その転送チャンネル幅の狭められた所の上に転送電
極の実効的な境界部を形成したことを特徴とする電荷転
送装置。1. A transfer channel width narrowed along a charge transfer direction is narrowed to a predetermined width at a plurality of points within a predetermined length, and an effective boundary portion of a transfer electrode is provided on a portion where the transfer channel width is narrowed. A charge transfer device comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1090672A JPH0821711B2 (en) | 1989-04-12 | 1989-04-12 | Charge transfer device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1090672A JPH0821711B2 (en) | 1989-04-12 | 1989-04-12 | Charge transfer device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02271541A JPH02271541A (en) | 1990-11-06 |
| JPH0821711B2 true JPH0821711B2 (en) | 1996-03-04 |
Family
ID=14005031
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1090672A Expired - Fee Related JPH0821711B2 (en) | 1989-04-12 | 1989-04-12 | Charge transfer device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0821711B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2704978B1 (en) * | 1993-05-07 | 1995-06-09 | Thomson Csf Semiconducteurs | Load transfer device with drive grid. |
-
1989
- 1989-04-12 JP JP1090672A patent/JPH0821711B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02271541A (en) | 1990-11-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |