JPH083472B2 - Appearance inspection method of solder part - Google Patents
Appearance inspection method of solder partInfo
- Publication number
- JPH083472B2 JPH083472B2 JP63194079A JP19407988A JPH083472B2 JP H083472 B2 JPH083472 B2 JP H083472B2 JP 63194079 A JP63194079 A JP 63194079A JP 19407988 A JP19407988 A JP 19407988A JP H083472 B2 JPH083472 B2 JP H083472B2
- Authority
- JP
- Japan
- Prior art keywords
- solder
- light
- camera
- check area
- bright
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は半田部の外観検査方法に係り、リフロー後の
半田部の光反射特性から、半田部の外観の合否を判断す
るようにしたものである。DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention relates to a method for inspecting the appearance of a solder portion, in which whether the appearance of the solder portion is acceptable or not is determined from the light reflection characteristics of the solder portion after reflow. Is.
(従来の技術) 電子部品実装装置により電子部品が実装された基板
は、半田付装置に送られ、ここでリードの接地部分に塗
布されたクリーム半田の加熱処理が行われる。そしてこ
のリフロー後に、半田部が正常に形成されているかどう
かをチェックする半田部の外観検査を行われ、不良品は
ラインから除外されるが、従来、かかる外観検査は検査
員の目視作業により行われていた。(Prior Art) A substrate on which an electronic component is mounted by an electronic component mounting device is sent to a soldering device, where the cream solder applied to the grounded portion of the lead is heated. After this reflow, a visual inspection of the solder part is performed to check whether the solder part is normally formed, and defective products are excluded from the line.However, conventionally, such visual inspection is performed by visual inspection by an inspector. It was being appreciated.
(発明が解決しようとする課題) しかしながら検査員の目視作業では検査能率があがら
ず、また検査員の個人誤差により検査基準がばらつきや
すく、また錯誤により誤判断をしやすいなどの問題があ
った。(Problems to be Solved by the Invention) However, there are problems that the inspection efficiency is not improved by the visual inspection work of the inspector, the inspection standard is likely to vary due to the individual error of the inspector, and an erroneous judgment is easily caused due to an error.
ところで、加熱処理がなされたリフロー後の半田部の
上面は、一般に光沢のある波形もしくは山形状の凹凸面
となっており、これに上方から光を照射して上方のカメ
ラにより観察すると、凹凸面のうちの水平面もしくは略
水平面は光を上方へ鏡面反射し、カメラにより明るく輝
く輝度の高い部分として検出されるが、傾斜面は殆どの
光は側方へ反射されるため上方のカメラには入射せず、
したがってカメラには輝度の低い黒暗色として観察され
る。またリフロー後の正常な半田部の上面には、上述の
ように輝度の高い部分と低い部分が混在するが、中間の
輝度を有する部分はまったく若しくは殆ど存在しない。By the way, the upper surface of the solder portion after reflow that has been subjected to heat treatment is generally a glossy corrugated or mountain-shaped uneven surface, and when illuminating this from above and observing with an upper camera, the uneven surface A horizontal plane or a substantially horizontal plane among them reflects light upwardly and is detected by the camera as a bright and bright area, but most of the light is reflected sideways on the inclined surface and is incident on the camera above. Without
Therefore, it is observed by the camera as a dark black color with low brightness. Further, on the upper surface of the normal solder portion after the reflow, there are a portion having high luminance and a portion having low luminance as described above, but there is no or almost no portion having intermediate luminance.
そこで本発明は、このようなリフロー後の半田部上面
の光反射特性に着眼してなされたものであって、かかる
光反射特性を利用して、光学的手法により半田部の外観
を正確にかつ作業性よく検査できる方法を提供すること
を目的とする。Therefore, the present invention was made by focusing on the light reflection characteristics of the upper surface of the solder portion after such reflow, and by utilizing such light reflection characteristics, the appearance of the solder portion can be accurately and accurately determined by an optical method. The purpose is to provide a method that can be inspected with good workability.
(課題を解決するための手段) このために本発明は、基板に実装された電子部品から
延出するリードの先方にチェックエリアを設定し、上方
からこのチェックエリアに光を照射して上方のカメラに
よりこのチェックエリアを観察してこのチェックエリア
の輝度のヒストグラムを入手し、輝度のヒストグラムが
明暗に分離しているか否かを検出することにより、リフ
ロー後の半田部の外観の合否を判断するようにしたもの
である。(Means for Solving the Problem) For this purpose, the present invention sets a check area in front of the lead extending from the electronic component mounted on the board, and irradiates the check area with light from above to check the upper area. By observing this check area with a camera, obtaining a histogram of the brightness of this check area, and detecting whether the brightness histogram is bright or dark, it is possible to judge whether the appearance of the solder portion after reflow is acceptable or not. It was done like this.
(作用) 上記構成において、上方からチェックエリアに光を照
射し、上方のカメラによりこのチェックエリアを観察す
ると、正常な半田部は、明るい部分と暗い部分が混在す
る明暗が分離した面として観察され、かかる観察結果か
ら、不良な半田部と区別される。(Operation) In the above configuration, when the check area is irradiated with light from above and the check area is observed by the camera above, the normal solder portion is observed as a surface in which bright and dark portions in which bright and dark portions are mixed are separated. From this observation result, it is distinguished from the defective solder portion.
(実施例1) 次に、図面を参照しながら本発明の実施例を説明す
る。Example 1 Next, an example of the present invention will be described with reference to the drawings.
第1図は半田部の外観検査装置を示すものであって、
1は基板2に実装された電子部品であり、その上方にカ
メラ3とリング状光源4が配設されている。5はカメラ
3に接続されたコンピュータのような制御装置である。
電子部品は実装装置により基板2に実装された後、半田
付装置で加熱処理されている。この電子部品1はリード
付電子部品であって、モールド体6の両側方にリードL
が延出している。モールド体6は黒色合成樹脂などの輝
度の低い素材にて形成されているが、リードLは光沢の
ある金属のような輝度の高い素材にて形成されている。
リードLは水平な基端部aと、下り急勾配の傾斜部b
と、基板2に接地する水平な先端部cを有している。第
2図はリードLの平面を示すものであって、7は基板2
に塗布された半田部であり、リードLの先端部cはこの
半田部7上に接地している。dはリードLの先端部に盛
り上る半田フィレットであり、その上面は基板2からリ
ード先端へ向って上り勾配の傾斜面となっている(第1
図部分拡大図参照)。リード部Lに上方から光を照射
し、上方のカメラ3で観察すると、水平な基端部aや先
端部cは上方へ光を反射し、その反射光はカメラ3に十
分に入射するため、輝度の高い明るい部分として観察さ
れるが、傾斜部bやフィレットdに入射した光は真上へ
は反射せず、大部分は側方へ反射されてカメラ3には殆
ど入射しないので、輝度の低い暗い部分として観察され
る。FIG. 1 shows a visual inspection device for a solder portion,
Reference numeral 1 denotes an electronic component mounted on a substrate 2, on which a camera 3 and a ring-shaped light source 4 are arranged. Reference numeral 5 denotes a control device such as a computer connected to the camera 3.
The electronic component is mounted on the substrate 2 by the mounting device and then heat-treated by the soldering device. The electronic component 1 is an electronic component with leads, and leads L are provided on both sides of the molded body 6.
Is extended. The mold body 6 is made of a material having a low brightness such as black synthetic resin, while the lead L is made of a material having a high brightness such as a glossy metal.
The lead L has a horizontal base end a and a steep downward slope b.
And has a horizontal tip portion c that is grounded to the substrate 2. FIG. 2 shows a plane of the lead L, and 7 is a substrate 2
The tip portion c of the lead L is grounded on the solder portion 7. d is a solder fillet that rises at the tip of the lead L, and the upper surface thereof is an inclined surface having an upward slope from the substrate 2 toward the tip of the lead (first
(See the enlarged view of the figure). When the lead portion L is irradiated with light from above and observed by the camera 3 above, the horizontal base end portion a and the tip end portion c reflect light upward, and the reflected light is sufficiently incident on the camera 3. Although it is observed as a bright part with high brightness, the light incident on the inclined part b and the fillet d is not reflected right above, and most of it is reflected sideways and hardly enters the camera 3, so Observed as low dark areas.
さて、半田付装置により加熱処理されたリフロー後の
半田部7の上面は、第3図に示すように波形もしくは山
形の凹凸面となっており、また光沢のある輝度の高い鏡
面となっている。したがって上方から光を照射して上方
のカメラ3で観察すると、上面や底面などの水平若しく
は略水平な面Mに入射した光は、上方へ強く鏡面反射さ
れて、輝度の高い明るい部分として観察されるが、傾斜
面Nに入射した光は大部分が側方へ反射されるため、カ
メラ3には殆ど入射せず、したがって傾斜面Nは輝度の
低い暗い部分として観察される。図中、破線矢印は光を
示している。すなわち、発明が解決しようとする課題の
項で述べたように、リフロー後の半田部7の表面は輝度
のヒストグラムが明暗に分離して観察され、中間の輝度
を有する部分はまったく若しくはほとんど存在しない。
したがって、リードLの先方にチェックエリアAを設定
し、このチェックエリアAの光反射特性を観察すること
により、以下に述べるように半田部7の外観を検査でき
る。なお第3図は、理解しやすいように、半田部7の形
状や厚さは誇張して描いている。Now, as shown in FIG. 3, the upper surface of the reflowed solder portion 7 which has been subjected to the heat treatment by the soldering device has a corrugated or chevron-shaped uneven surface, and is also a glossy and highly bright mirror surface. . Therefore, when light is emitted from above and observed by the camera 3 above, the light incident on the horizontal or substantially horizontal surface M such as the upper surface or the bottom surface is strongly specularly reflected upward and is observed as a bright portion with high brightness. However, since most of the light incident on the inclined surface N is reflected to the side, it is hardly incident on the camera 3, and therefore the inclined surface N is observed as a dark portion with low brightness. In the figure, the broken line arrow indicates light. That is, as described in the section of the problem to be solved by the invention, the luminance histogram is observed on the surface of the solder portion 7 after the reflow with bright and dark separation, and there is no or almost no portion having an intermediate luminance. .
Therefore, by setting the check area A ahead of the lead L and observing the light reflection characteristics of the check area A, the appearance of the solder portion 7 can be inspected as described below. In FIG. 3, the shape and the thickness of the solder portion 7 are exaggerated for easy understanding.
第4図は、第3図に示すように半田部7の外観が正常
な場合の輝度と画素数のヒストグラムを示すものであっ
て、この場合、チェックエリアA内は、上述のように輝
度の高い部分と低い部分が混在し、中間輝度はまったく
若しくはほとんど存在しない。THは輝度の高低の目安と
なるスレッシュホルド値である。また第5図に示すよう
に、予備半田が露呈している場合や、半田過少の場合
は、カメラ3には光は殆ど入射せず、チェックエリアA
の輝度はかなり低い。なお予備半田とは、基板上の銅箔
との付着性を良くするために、正規の半田塗布の前に塗
布される半田のことである。また第6図は、半田がまっ
たく塗布されずに銅箔が露呈している場合や、半田付装
置における加熱処理が不十分で、半田が生溶けしている
場合であって、この場合、上方から入射した光はこれら
の面で乱反射され、カメラには中間輝度として観察され
る。以上のことから、第4図に示すように輝度のヒスト
グラムが明暗に分離していれば半田部は良品であり、ま
た第5図や第6図に示すように明暗に分離していなけれ
ば半田部は不良品と判定する。FIG. 4 shows a histogram of the luminance and the number of pixels when the appearance of the solder portion 7 is normal as shown in FIG. 3, and in this case, the check area A shows the luminance as described above. High and low parts are mixed, and there is no or almost no intermediate brightness. TH is a threshold value that is a measure of high and low brightness. Further, as shown in FIG. 5, when the preliminary solder is exposed or when the amount of the solder is too small, almost no light is incident on the camera 3, and the check area A
The brightness of is quite low. Preliminary solder is solder that is applied before regular solder application in order to improve adhesion to the copper foil on the substrate. Further, FIG. 6 shows the case where the copper foil is exposed without applying the solder at all, or the heat treatment in the soldering device is insufficient and the solder is melted. Light incident from is diffusely reflected on these surfaces and is observed as intermediate brightness by the camera. From the above, if the luminance histogram is bright and dark separated as shown in FIG. 4, the solder portion is good, and if it is not bright and dark separated as shown in FIG. 5 and FIG. The part is determined to be defective.
以上のように半田部7は、上方から光を照射して上方
のカメラにより観察すると、その形状や状態によりそれ
ぞれ異った光反射特性を有している。したがってその光
反射特性を観察することにより、半田部の合否を判断す
ることができる。合否の判断基準は、要求される半田部
の品質もしくは精度等を勘案して任意に決定されるもの
であるが、例えばTH値以上のものが90%以上あるものは
OK、それ以下のものはNGとされ、あるいはまた、中間輝
度が5%以上あればNGとされる。かかる合否判断等の演
算は、制御装置5により行われる。As described above, the solder portion 7 has different light reflection characteristics depending on its shape and state when irradiated with light from above and observed by a camera above. Therefore, by observing the light reflection characteristic, it is possible to determine whether the solder portion is acceptable or not. The pass / fail judgment criteria are arbitrarily determined in consideration of the required quality or accuracy of the soldered part, but for example, those with a TH value or more of 90% or more are
If it is OK or lower, it is judged as NG, or if the intermediate brightness is 5% or more, it is judged as NG. The calculation such as the pass / fail judgment is performed by the control device 5.
(発明の効果) 以上説明したように本発明は、基板に実装された電子
部品から延出するリードの先方にチェックエリアを設定
し、上方からこのチェックエリアに光を照射して上方の
カメラによりこのチェックエリアを観察してこのチェッ
クエリアの輝度のヒストグラムを入手し、輝度のヒスト
グラムが明暗に分離しているか否かを検出することによ
り、リフロー後の半田部の外観の合否を判断するように
しているので、その光反射特性から半田部の合否を正確
に判断することができる。(Effect of the Invention) As described above, according to the present invention, a check area is set in front of a lead extending from an electronic component mounted on a board, and light is emitted to the check area from above and a camera above is used. By observing this check area, obtaining the brightness histogram of this check area, and detecting whether the brightness histogram is bright or dark, it is possible to judge whether the appearance of the solder part after reflow is acceptable or not. Therefore, the pass / fail of the solder portion can be accurately determined from the light reflection characteristics.
図は本発明の実施例を示すものであって、第1図は半田
部の外観検査装置の側面図、第2図はリード付近の平面
図、第3図は観察中の側面図、第4図,第5図,第6図
はヒストグラム図である。 1……電子部品 2……基板 3……カメラ 7……半田部 A……チェックエリア L……リードFIG. 1 shows an embodiment of the present invention. FIG. 1 is a side view of a solder appearance inspection device, FIG. 2 is a plan view near a lead, FIG. 3 is a side view during observation, and FIG. FIG. 5, FIG. 5 and FIG. 6 are histogram diagrams. 1 ... Electronic parts 2 ... Substrate 3 ... Camera 7 ... Solder A ... Check area L ... Lead
Claims (1)
ードの先方にチェックエリアを設定し、上方からこのチ
ェックエリアに光を照射して上方のカメラによりこのチ
ェックエリアを観察してこのチェックエリアの輝度のヒ
ストグラムを入手し、輝度のヒストグラムが明暗に分離
しているか否かを検出することにより、リフロー後の半
田部の外観の合否を判断するようにしたことを特徴とす
る半田部の外観検査方法。1. A check area is set in front of a lead extending from an electronic component mounted on a board, light is emitted from above to the check area, and this check area is observed by an upper camera to make this check. Obtaining the brightness histogram of the area and detecting whether or not the brightness histogram is separated into bright and dark areas, the pass / fail appearance of the solder part after reflow is judged. Appearance inspection method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63194079A JPH083472B2 (en) | 1988-08-03 | 1988-08-03 | Appearance inspection method of solder part |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63194079A JPH083472B2 (en) | 1988-08-03 | 1988-08-03 | Appearance inspection method of solder part |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0244233A JPH0244233A (en) | 1990-02-14 |
| JPH083472B2 true JPH083472B2 (en) | 1996-01-17 |
Family
ID=16318609
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63194079A Expired - Fee Related JPH083472B2 (en) | 1988-08-03 | 1988-08-03 | Appearance inspection method of solder part |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH083472B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0794972B2 (en) * | 1989-12-13 | 1995-10-11 | 松下電器産業株式会社 | Solder appearance inspection method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63196980A (en) * | 1987-02-10 | 1988-08-15 | Toshiba Corp | Device for inspecting soldering external appearance for printed circuit board |
-
1988
- 1988-08-03 JP JP63194079A patent/JPH083472B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0244233A (en) | 1990-02-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |