JPH088213B2 - Method for manufacturing compound semiconductor - Google Patents
Method for manufacturing compound semiconductorInfo
- Publication number
- JPH088213B2 JPH088213B2 JP14505188A JP14505188A JPH088213B2 JP H088213 B2 JPH088213 B2 JP H088213B2 JP 14505188 A JP14505188 A JP 14505188A JP 14505188 A JP14505188 A JP 14505188A JP H088213 B2 JPH088213 B2 JP H088213B2
- Authority
- JP
- Japan
- Prior art keywords
- mercury vapor
- gas
- vapor
- reaction tube
- mercury
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、水銀を含んだ化合物半導体、例えばCdxHg
(1-x)Te(以下、CMTと云う),ZnxHg(1-x)Te(以
下、ZMTと云う)等の気相成長方法に関する(なお、こ
こでCdはカドミウム,Hgは水銀,Teはテルル,Znは亜鉛,x
は0<x<1を満たす数字を示す)。The present invention relates to a compound semiconductor containing mercury, such as CdxHg.
( 1- x) Te (hereinafter referred to as CMT), ZnxHg ( 1- x) Te (hereinafter referred to as ZMT), and other vapor phase growth methods (where Cd is cadmium, Hg is mercury, Te is Tellurium, Zn is zinc, x
Indicates a number satisfying 0 <x <1).
近時、前記CMT等を有機金属気相成長法(MOCVD法)に
より製造する研究がなされている。Recently, research has been conducted on manufacturing the CMT and the like by a metal organic chemical vapor deposition method (MOCVD method).
以下に第3図に示す従来のCMT製造用MOCVD装置の断面
図により従来技術を説明すると、気相成長を実施する反
応管1は、一端にガス導入部1aを、他端にガス排出部1b
を有し、該ガス導入部1aにはマスフローコントローラ2
を介して管3が連設されている。反応管1内には基板4
の保持と加熱に用いるカーボン製のサセプタ5が、この
上流側には液体水銀を収納する水銀溜6が各々配置され
ている。また、反応管1の外側には該反応管1を囲んで
ヒータ7,RFコイル8が設けられている。The conventional technique will be described below with reference to the cross-sectional view of the conventional MOCVD apparatus for CMT production shown in FIG. 3. The reaction tube 1 for performing vapor phase growth has a gas introduction part 1a at one end and a gas discharge part 1b at the other end.
And a mass flow controller 2 in the gas introduction part 1a.
The pipe 3 is continuously connected via. Substrate 4 in reaction tube 1
A susceptor 5 made of carbon used for holding and heating is provided, and a mercury reservoir 6 for accommodating liquid mercury is arranged on the upstream side thereof. A heater 7 and an RF coil 8 are provided outside the reaction tube 1 so as to surround the reaction tube 1.
次に操作方法をCMTの製造の場合で説明する。 Next, the operating method will be described in the case of manufacturing CMT.
CMTの製造では、水銀のほかCd用としてジメチルカド
ミウム(DMCd),Te用としてジエチルテルル(DETe)を
用いる。これらDMCd,DETeは液状は有機金属で、例えば
水素をキャリアガスとしてバブリングにより各々同伴さ
れ、その後合流されて気相成長ガスとしてマスフローコ
ントローラ2で所定流量に精密に制御され、管3を介し
て反応管1内に導入される。In addition to mercury, dimethylcadmium (DMCd) for Cd and diethyl tellurium (DETe) for Te are used in the production of CMT. These DMCd and DETe are organic metals in a liquid state, for example, hydrogen is used as a carrier gas to be accompanied by bubbling, respectively, and then merged to be a vapor growth gas, which is precisely controlled to a predetermined flow rate by a mass flow controller 2 and is reacted through a tube 3. It is introduced into the tube 1.
反応管1の液体水銀は前記ヒータ7により180℃〜250
℃の所定温度に保持され水銀蒸気が発生しており、ま
た、サセプタ5はRFコイル8で高周波加熱され、該サセ
プタ5上の基板4を400℃程度に保持している。The liquid mercury in the reaction tube 1 is heated to 180 ° C. to 250 by the heater 7.
Mercury vapor is generated by being kept at a predetermined temperature of ° C, and the susceptor 5 is heated at high frequency by the RF coil 8 to keep the substrate 4 on the susceptor 5 at about 400 ° C.
このような状態下で、気相成長ガス導入部1aから反応
管1内に導入された前記気相成長ガスは、水銀溜6上で
水銀蒸気を同伴して基板4上に到達し、DMCd,DETeは加
熱分解作用を受けて反応生成物が基板上に、また、水銀
蒸気は気相成長ガス中の分圧に応じて基板上に各々堆積
し、薄膜が形成されて水銀を含む化合物半導体が製造さ
れる。Under such a condition, the vapor growth gas introduced into the reaction tube 1 from the vapor growth gas introduction section 1a reaches the substrate 4 along with the mercury vapor on the mercury reservoir 6, and the DMCd, DETe undergoes thermal decomposition and reaction products are deposited on the substrate, and mercury vapor is deposited on the substrate according to the partial pressure in the vapor phase growth gas, forming a thin film to form a compound semiconductor containing mercury. Manufactured.
また、他の従来技術として、前記管3内の水素等のキ
ャリアガスを流し、該キャリアガスで反応管1内の水銀
蒸気を同伴すると共に、別途有機金属の気相成長ガスを
反応管1内に導入し、これらを基板4の上流側で混合し
て該基板4に供給し、前記同様の化合物半導体を製造す
る方法もある。Further, as another conventional technique, a carrier gas such as hydrogen in the tube 3 is flown, and mercury vapor in the reaction tube 1 is entrained by the carrier gas, and a vapor phase growth gas of an organic metal is separately supplied in the reaction tube 1. There is also a method of producing a compound semiconductor similar to the above by introducing the same into the substrate 4, mixing them on the upstream side of the substrate 4 and supplying the mixture to the substrate 4.
しかし、前記従来技術では、薄膜中の水銀の組成割合
を変えたい場合に不都合がある。例えば、水銀蒸気を気
相成長ガスで同伴する場合、水銀の組成割合を変えるに
は基板4に供給する基相成長ガス中の水銀蒸気の分圧を
変化させれば良いが、これを気相成長ガスの流量、ひい
ては流速で調節すると迅速に変化できるが、流速が変化
することによって薄膜の均一な成長が阻害される。この
ため、薄膜の均一性を考慮し、気相成長ガスの流速を一
定に保持したまま水銀蒸気の分圧を制御するには、水銀
溜6内の液体水銀の加熱量を増減しなければならない
が、加熱量の調節による方法では迅速,精密な制御がで
きない不都合がある。これは基板に供給される水銀蒸気
の分圧を測定し、該分圧を一定にするために水銀蒸気量
を増減する場合にも生ずる不都合である。However, the above-mentioned conventional technique has a problem when it is desired to change the composition ratio of mercury in the thin film. For example, when mercury vapor is entrained in the vapor phase growth gas, the composition ratio of mercury may be changed by changing the partial pressure of the mercury vapor in the basic phase growth gas supplied to the substrate 4. It can be changed rapidly by adjusting the flow rate of the growth gas, and thus the flow rate, but the change in flow rate hinders uniform growth of the thin film. Therefore, in order to control the partial pressure of mercury vapor while keeping the flow velocity of the vapor growth gas constant, in consideration of the uniformity of the thin film, the heating amount of the liquid mercury in the mercury reservoir 6 must be increased or decreased. However, the method of adjusting the heating amount has a disadvantage that quick and precise control cannot be performed. This is also an inconvenience that occurs when the partial pressure of mercury vapor supplied to the substrate is measured and the amount of mercury vapor is increased or decreased to keep the partial pressure constant.
そこで、水銀溜を反応管の外部に配置して管により水
銀蒸気を反応管内に供給する方法も考えられるが、この
方法では水銀蒸気が管内面に凝着するのを防止するた
め、該管を水銀溜と同等以上の温度に加温保持しなけれ
ばならず、装置製作費,加熱コストが上昇して経済的で
ない。一方、水銀溜を反応管内に配置すると前記経済的
不都合がないだけでなく、気相成長中の反応管内は常温
より高くなっているので、水銀蒸気を発生させるための
加熱量も少なくて済む。このような点で、水銀溜を反応
管の外部に設けることは好ましくない。Therefore, a method of arranging a mercury reservoir outside the reaction tube and supplying mercury vapor into the reaction tube through the tube can be considered. However, in this method, the mercury vapor is prevented from adhering to the inner surface of the tube. It has to be heated and maintained at a temperature equal to or higher than that of the mercury pool, which is not economical because the device manufacturing cost and heating cost increase. On the other hand, if the mercury reservoir is arranged in the reaction tube, not only the above-mentioned economical inconvenience does not occur, but also the inside of the reaction tube during vapor phase growth is higher than room temperature, so the heating amount for generating mercury vapor can be small. From this point of view, it is not preferable to provide the mercury reservoir outside the reaction tube.
本発明は上述の点に鑑みなされたもので、反応管内に
水銀蒸気発生部を設け、該水銀蒸気発生部で発生して基
板に供給される水銀蒸気の分圧を制御して基板上に均一
な薄膜を迅速に形成する化合物半導体の製造方法を提供
するものである。The present invention has been made in view of the above points, and a mercury vapor generating section is provided in a reaction tube, and the partial pressure of mercury vapor generated in the mercury vapor generating section and supplied to the substrate is controlled so that the mercury vapor is uniformly distributed on the substrate. The present invention provides a method for producing a compound semiconductor, which rapidly forms a thin film.
本発明の請求項1に記載の方法は、反応管内で発生さ
せた水銀蒸気を有機金属の気相成長ガスに同伴させて基
板上に供給し、熱分解反応を利用して該水銀蒸気と共に
有機金属の反応生成物を基板上に堆積させて薄膜を形成
する化合物半導体の製造方法において、前記水銀蒸気発
生部近傍の反応管内をガス流れ方向に沿って区画して少
なくとも2つの流路を形成し、該区画された流路の内、
少なくとも1つの流路で水銀蒸気を発生させると共に、
各流路に各々気相成長ガスを導入し、該水銀蒸気を発生
させる流路のガス流量の増減に応じて残りの流路のガス
流量を調整し、反応管内に導入する気相成長ガスの総量
を一定にしたままで基板に供給する水銀蒸気の分圧を制
御することを特徴とするものである。In the method according to claim 1 of the present invention, the mercury vapor generated in the reaction tube is supplied together with the vapor phase growth gas of the organic metal onto the substrate, and the organic vapor is generated together with the mercury vapor by utilizing the thermal decomposition reaction. In a method for producing a compound semiconductor, in which a reaction product of a metal is deposited on a substrate to form a thin film, the inside of the reaction tube near the mercury vapor generating part is partitioned along the gas flow direction to form at least two flow paths. , Among the divided flow paths,
Generate mercury vapor in at least one channel,
Introducing a vapor growth gas into each flow path, adjusting the gas flow rate of the remaining flow path according to the increase or decrease of the gas flow rate of the flow path for generating the mercury vapor, of the vapor growth gas to be introduced into the reaction tube It is characterized in that the partial pressure of mercury vapor supplied to the substrate is controlled while keeping the total amount constant.
また、請求項2に記載の方法は、反応管内で発生させ
た水銀蒸気をキャリアガスに同伴させた後、有機金属の
気相成長ガスに混合して基板上に供給し、熱分解反応を
利用して該水銀蒸気と共に有機金属の反応生成物を基板
上に堆積させて薄膜を形成する化合物半導体の製造方法
において、前記水銀蒸気発生部近傍の反応管内をガス流
れ方向に沿って区画して少なくとも2つの流路を形成
し、該区画された流路の内、少なくとも1つの流路で水
銀蒸気を発生されると共に、各流路に各々キャリアガス
を導入し、該水銀蒸気を発生させる流路のガス流量の増
減に応じて残りの流路のガス流量を調整し、反応管内に
導入するキャリアガスの総量を一定にしたままで基板に
供給する水銀蒸気の分圧を制御することを特徴とするも
のである。Further, in the method according to claim 2, after the mercury vapor generated in the reaction tube is entrained in the carrier gas, it is mixed with the vapor phase growth gas of the organic metal and supplied onto the substrate to utilize the thermal decomposition reaction. In the method for producing a compound semiconductor in which a reaction product of an organic metal is deposited on a substrate together with the mercury vapor to form a thin film, at least the reaction tube in the vicinity of the mercury vapor generating section is partitioned along the gas flow direction. A flow path that forms two flow paths and that generates mercury vapor in at least one flow path of the divided flow paths and that introduces a carrier gas into each flow path to generate the mercury vapor. The gas flow rate of the remaining channels is adjusted according to the increase or decrease of the gas flow rate, and the partial pressure of mercury vapor supplied to the substrate is controlled while keeping the total amount of carrier gas introduced into the reaction tube constant. To do.
〔実施例〕 先ず、第1図により本発明の請求項1に記載の方法の
一実施例を説明する。第1図は本方法を実施する装置の
断面図で、図中前記第3図と同一構成部分には同一符号
を付してある。[Embodiment] First, one embodiment of the method according to claim 1 of the present invention will be described with reference to FIG. FIG. 1 is a sectional view of an apparatus for carrying out the present method, in which the same components as those in FIG. 3 are designated by the same reference numerals.
図において、反応管1内の水銀蒸気発生部である水銀
溜6近傍はガス流れ方向に沿って仕切板10により上下に
区画されて平行な流路11a,11bが形成され、下方の流路1
1b内に、ヒータ7で所定温度に加熱される水銀溜6が配
置されている。管3はマスフローコントローラ2の下流
側で分岐し、各々流量調節弁12a,12bを介して前記流路1
1a,11bに各々連通する。なお、流路11a,11bは気密に区
画される必要はなく、各々に気相成長ガスが流れる程度
に区画されていれば良い。In the figure, in the vicinity of the mercury reservoir 6 which is a mercury vapor generating portion in the reaction tube 1, parallel partitions 11a and 11b are formed along the gas flow direction by a partition plate 10 to form parallel channels 11a and 11b.
A mercury reservoir 6 which is heated to a predetermined temperature by a heater 7 is arranged in 1b. The pipe 3 is branched on the downstream side of the mass flow controller 2, and the flow path 1 is provided via the flow control valves 12a and 12b, respectively.
It communicates with 1a and 11b respectively. The flow paths 11a and 11b do not need to be airtightly partitioned, and may be partitioned so that the vapor growth gas flows through each of them.
上記構成において、気相成長ガスはマスフローコント
ローラ2で所定流量に設定された後、前記流量調節弁12
a,12bを介して平行な流路11a,11bに各々導入され、下方
の流路11bを流れる気相成長ガスは水銀蒸気を同伴し、
他はそのまま上方の流路11aを流れ、仕切板10の端部で
混合され、RFコイル8で高周波加熱されているサセプタ
5上の基板4に供給されて、前記従来例同様に水銀を含
む化合物半導体が製造される。なお、前記仕切板10の端
部を基板4との距離が短いとき等は、該端部にガス混合
手段を設けるのが望ましい。In the above structure, the vapor growth gas is set to a predetermined flow rate by the mass flow controller 2, and then the flow rate control valve 12
a, 12b are respectively introduced into the parallel flow paths 11a, 11b, the vapor growth gas flowing through the lower flow path 11b is accompanied by mercury vapor,
Others flow through the upper flow path 11a as they are, are mixed at the end of the partition plate 10, and are supplied to the substrate 4 on the susceptor 5 which is heated by the RF coil 8 at high frequency. Semiconductors are manufactured. When the distance between the edge of the partition plate 10 and the substrate 4 is short, it is desirable to provide a gas mixing means at the edge.
本実施例において、例えば薄膜中の水銀の組成割合を
増加するには、マスフローコントローラ2での流量を一
定にしたまま流量調節弁12a,12bを制御して流路11b側の
流量を増加させる。これによって該流路11b側の流速が
上昇して水銀発生量が増加し、基板4に供給される水銀
の蒸気量が増加する。一方、マスフローコントローラ2
で気相成長ガスの総量は一定になっているので、該流路
11b側での流量増加に応じて他の流路11aの流量は減少す
る。従って反応管1内に導入する気相成長ガスの総量を
一定にしたままで、基板4に供給する水銀蒸気量を増大
でき、これによって水銀蒸気の分圧を大きくすることが
できる。また、反応管1内に導入される気相成長ガスの
流量は一定なので流速も一定になり、成長条件の均一さ
を保持できる。更に前記水銀蒸気量の変更は気相成長ガ
スの流量制御により行なうので迅速に実施できる。In this embodiment, for example, in order to increase the composition ratio of mercury in the thin film, the flow rate control valves 12a and 12b are controlled while the flow rate in the mass flow controller 2 is kept constant to increase the flow rate on the flow path 11b side. As a result, the flow velocity on the flow path 11b side increases, the amount of mercury generated increases, and the amount of mercury vapor supplied to the substrate 4 increases. On the other hand, the mass flow controller 2
Since the total amount of vapor growth gas is constant,
The flow rate of the other flow path 11a decreases as the flow rate increases on the 11b side. Therefore, it is possible to increase the amount of mercury vapor supplied to the substrate 4 while keeping the total amount of vapor phase growth gas introduced into the reaction tube 1 constant, thereby increasing the partial pressure of mercury vapor. Moreover, since the flow rate of the vapor growth gas introduced into the reaction tube 1 is constant, the flow velocity is also constant, and the uniformity of growth conditions can be maintained. Further, since the change of the mercury vapor amount is performed by controlling the flow rate of the vapor growth gas, it can be carried out quickly.
次に第2図により請求項2に記載の方法の一実施例を
説明する。第2図は本方法を実施する装置の断面図で、
図中前記第1図と同一構成部分には同一符号を付してあ
る。Next, one embodiment of the method according to claim 2 will be described with reference to FIG. FIG. 2 is a sectional view of an apparatus for carrying out the method,
In the figure, the same components as those in FIG. 1 are designated by the same reference numerals.
第2図が第1図と異なるのは、管3内を流れるガスが
キャリアガスであることと、反応管1内に別途マスフロ
ーコントローラ20,管21を介して有機金属の気相成長ガ
スが導入され、該気相成長ガスが基板4の上流側で、水
銀蒸気を同伴したキャリアガスと混合される点である。2 is different from FIG. 1 in that the gas flowing in the tube 3 is a carrier gas, and the vapor phase growth gas of an organic metal is introduced into the reaction tube 1 through the mass flow controller 20 and the tube 21 separately. That is, the vapor growth gas is mixed with the carrier gas accompanied by mercury vapor on the upstream side of the substrate 4.
第2図において、管21を介して反応管1内に導入され
る気相成長ガスの総量、及び管3を介して反応管1内に
導入されるキャリアガスの総量は各々マスフローコント
ローラ20,2によって一定に保持される。そしてキャリア
ガスに同伴される水銀蒸気量は、平行な流路11a,11bを
流れるキャリアガスの流量調節によって制御され、反応
管1内に導入する全ガス量を一定にしたままで水銀蒸気
の分圧を制御することができる。In FIG. 2, the total amount of vapor phase growth gas introduced into the reaction tube 1 via the pipe 21 and the total amount of carrier gas introduced into the reaction pipe 1 via the pipe 3 are respectively the mass flow controllers 20 and 2. Held constant by. The amount of mercury vapor entrained in the carrier gas is controlled by adjusting the flow rate of the carrier gas flowing in the parallel flow paths 11a and 11b, and the amount of mercury vapor is kept constant while keeping the total amount of gas introduced into the reaction tube 1 constant. The pressure can be controlled.
なお、以上の説明では、基板面に水平に気相成長ガス
を流す横型の気相成長の場合で説明したが、基板面に垂
直に気相成長ガスを流す縦型の場合にも応用でき、縦型
の場合は水銀蒸気発生部近傍の反応管内を左右縦方向に
区画して前記両実施例に準じて構成すれば良い。さら
に、反応管内を3流路以上に区画形成し、その内の少な
くとも1流路に水銀蒸気の発生部を設けても同様に実施
することができ、また各流路も平行に形成する必要はな
く、適宜の形状で実施することができる。In the above description, the case of horizontal vapor phase growth in which the vapor phase growth gas is flowed horizontally on the substrate surface is explained, but it is also applicable to the case of vertical type in which the vapor phase growth gas is flowed vertically to the substrate surface, In the case of the vertical type, the inside of the reaction tube in the vicinity of the mercury vapor generating part may be partitioned in the left-right vertical direction and configured according to both the above-mentioned examples. Further, the reaction tube can be divided into three or more flow passages, and at least one of the flow passages can be provided with a mercury vapor generating portion, and the same operation can be performed, and it is not necessary to form each flow passage in parallel. Instead, it can be implemented in an appropriate shape.
前記の如く、本発明は、反応管内に水銀蒸気発生部を
設けたまま、基板に供給する水銀蒸気の分圧を制御する
ものであって、反応管内の水銀蒸気発生部近傍をガス流
れ方向に沿って区画して少なくとも2つの流路を形成
し、その内の少なくとも1つの流路で水銀蒸気を発生さ
せると共に、各流路に各々気相成長ガスあるいはキャリ
アガスを導入し、反応管内に導入する気相成長ガスある
いはキャリアガスの総量を一定としたままで各流路に流
すガスの流量を制御して水銀蒸気の分圧を制御するもの
であるから、これにより、基板に供給するガスの流速を
一定にし、均一な気相成長条件を維持したまま、該ガス
中の水銀蒸気の分圧を制御でき、薄膜中の水銀の組成割
合を容易に調節することができる。As described above, the present invention controls the partial pressure of mercury vapor supplied to the substrate while the mercury vapor generating section is provided in the reaction tube. At least two flow paths are formed by partitioning along them, and mercury vapor is generated in at least one of the flow paths, and vapor phase growth gas or carrier gas is introduced into each flow path and introduced into the reaction tube. The vapor pressure growth gas or the carrier gas is kept constant and the flow rate of the gas flowing through each flow path is controlled to control the partial pressure of the mercury vapor. The partial pressure of mercury vapor in the gas can be controlled while the flow rate is kept constant and uniform vapor phase growth conditions are maintained, and the composition ratio of mercury in the thin film can be easily adjusted.
また、本発明によれば、流路に各々導入する気相成長
ガスあるいはキャリアガスの流量の調節により水銀蒸気
の分圧を調節するので、水銀溜の加熱量を調節するもの
よりも迅速に行なえ、かつ精密な制御が可能であり、極
めて実施効果が大きい。Further, according to the present invention, since the partial pressure of the mercury vapor is adjusted by adjusting the flow rate of the vapor growth gas or the carrier gas introduced into the flow path, the heating speed of the mercury reservoir can be adjusted more quickly than the case of adjusting the heating amount. Moreover, precise control is possible, and the effect of implementation is extremely large.
第1図は本発明方法の一実施例を説明する装置の断面
図、第2図は同じく他の実施例を説明する装置の断面
図、第3図は従来の気相成長法を説明する装置の断面図
である。 1……反応管、1a……ガス導入部、1b……ガス排出部、
2,20……マスフローコントローラ、3,21……管、4……
基板、5……サセプタ、6……水銀溜、7……ヒータ、
8……RFコイル、10……仕切板、11a,11b……流路、12
a,12b……流量調節弁FIG. 1 is a sectional view of an apparatus for explaining an embodiment of the method of the present invention, FIG. 2 is a sectional view of an apparatus for explaining another embodiment, and FIG. 3 is an apparatus for explaining a conventional vapor phase growth method. FIG. 1 ... Reaction tube, 1a ... Gas inlet, 1b ... Gas outlet,
2,20 …… Mass flow controller, 3,21 …… Tube, 4 ……
Substrate, 5 ... Susceptor, 6 ... Mercury reservoir, 7 ... Heater,
8 ... RF coil, 10 ... Partition plate, 11a, 11b ... Flow path, 12
a, 12b ... Flow control valve
Claims (2)
の気相成長ガスに同伴させて基板上に供給し、熱分解反
応を利用して該水銀蒸気と共に有機金属の反応生成物を
基板上に堆積させて薄膜を形成する化合物半導体の製造
方法において、前記水銀蒸気発生部近傍の反応管内をガ
ス流れ方向に沿って区画して少なくとも2つの流路を形
成し、該区画された流路の内、少なくとも1つの流路で
水銀蒸気を発生させると共に、各流路に各々気相成長ガ
スを導入し、該水銀蒸気を発生させる流路のガス流量の
増減に応じて残りの流路のガス流量を調整し、反応管内
に導入する気相成長ガスの総量を一定にしたままで基板
に供給する水銀蒸気の分圧を制御することを特徴とする
化合物半導体の製造方法。1. A mercury vapor generated in a reaction tube is supplied along with an organic metal vapor-phase growth gas onto a substrate, and a reaction product of the organic metal is produced together with the mercury vapor by utilizing a thermal decomposition reaction. In the method for producing a compound semiconductor, wherein a thin film is formed by depositing the same on a reaction tube in the vicinity of the mercury vapor generation section along the gas flow direction to form at least two flow paths, and the divided flow paths are defined. Among these, mercury vapor is generated in at least one flow passage, and a vapor growth gas is introduced into each flow passage, and the remaining flow passages are changed according to the increase or decrease in the gas flow rate of the flow passage for generating the mercury vapor. A method for producing a compound semiconductor, comprising adjusting a gas flow rate and controlling a partial pressure of mercury vapor supplied to a substrate while keeping a total amount of vapor phase growth gas introduced into a reaction tube constant.
ガスに同伴させた後、有機金属の気相成長ガスに混合し
て基板上に供給し、熱分解反応を利用して該水銀蒸気と
共に有機金属の反応生成物を基板上に堆積させて薄膜を
形成する化合物半導体の製造方法において、前記水銀蒸
気発生部近傍の反応管内をガス流れ方向に沿って区画し
て少なくとも2つの流路を形成し、該区画された流路の
内、少なくとも1つの流路で水銀蒸気を発生されると共
に、各流路に各々キャリアガスを導入し、該水銀蒸気を
発生させる流路のガス流量の増減に応じて残りの流路の
ガス流量を調整し、反応管内に導入するキャリアガスの
総量を一定にしたままで基板に供給する水銀蒸気の分圧
を制御することを特徴とする化合物半導体の製造方法。2. A mercury vapor generated in a reaction tube is entrained in a carrier gas, mixed with a vapor phase growth gas of an organic metal and supplied onto a substrate, and a thermal decomposition reaction is used to combine with the mercury vapor. In a method for producing a compound semiconductor in which a reaction product of an organic metal is deposited on a substrate to form a thin film, at least two flow paths are formed by partitioning a reaction tube near the mercury vapor generation section along a gas flow direction. The mercury vapor is generated in at least one of the divided flow passages, and a carrier gas is introduced into each flow passage to increase or decrease the gas flow rate of the flow passage for generating the mercury vapor. A method for producing a compound semiconductor, characterized in that the partial gas pressure of mercury vapor supplied to the substrate is controlled while the total amount of carrier gas introduced into the reaction tube is kept constant by adjusting the gas flow rate of the remaining flow channels according to the method. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14505188A JPH088213B2 (en) | 1988-06-13 | 1988-06-13 | Method for manufacturing compound semiconductor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14505188A JPH088213B2 (en) | 1988-06-13 | 1988-06-13 | Method for manufacturing compound semiconductor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01313945A JPH01313945A (en) | 1989-12-19 |
| JPH088213B2 true JPH088213B2 (en) | 1996-01-29 |
Family
ID=15376247
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14505188A Expired - Fee Related JPH088213B2 (en) | 1988-06-13 | 1988-06-13 | Method for manufacturing compound semiconductor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH088213B2 (en) |
-
1988
- 1988-06-13 JP JP14505188A patent/JPH088213B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01313945A (en) | 1989-12-19 |
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