KR960001189B1 - 광배선식 반도체 집적회로 - Google Patents
광배선식 반도체 집적회로 Download PDFInfo
- Publication number
- KR960001189B1 KR960001189B1 KR1019870010631A KR870010631A KR960001189B1 KR 960001189 B1 KR960001189 B1 KR 960001189B1 KR 1019870010631 A KR1019870010631 A KR 1019870010631A KR 870010631 A KR870010631 A KR 870010631A KR 960001189 B1 KR960001189 B1 KR 960001189B1
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor substrate
- pulse signal
- photoelectric conversion
- optical
- opening
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/103—Integrated devices the at least one element covered by H10F30/00 having potential barriers, e.g. integrated devices comprising photodiodes or phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
- H10F77/331—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors
- H10F77/334—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors for shielding light, e.g. light blocking layers or cold shields for infrared detectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/40—Optical elements or arrangements
- H10F77/413—Optical elements or arrangements directly associated or integrated with the devices, e.g. back reflectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Light Receiving Elements (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
- Optical Communication System (AREA)
- Optical Couplings Of Light Guides (AREA)
Abstract
Description
Claims (7)
- 반도체 기판과 ; 전기펄스신호에 응답하여 광펄스신호를 발생하는 광펄스신호 발생수단과 ; 상기 반도체 기판에 형성되며, 상기 광펄스신호 발생수단으로부터 발생되어 상기 반도체 기판의 표면상에 입사되는 광펄스신호에 응답하여 광신호를 전기신호로 변환시키는 광전변환소자와 ; 상기 광전변환소자 이외의 소자로 상기 반도체 기판에 구성되는 전기회로소자와 ; 상기 반도체 기판의 표면을 피복하도록 배치되며, 상기 광전변환소자위에 개구를 가지고 있는 불투명층과 ; 상기 개구에 제공된 투명층을 포함하는 것을 특징으로 하는 광배선식 반도체 집적회로.
- 반도체 기판과 ; 전기펄스신호에 응답하여 광펄스신호를 발생하는 광펄스신호 발생수단과 ; 상기 반도체 기판에 형성되며, 상기 광펄스신호 발생수단으로부터 발생되어 상기 반도체 기판의 표면상에 입사되는 광펄스신호에 응답하여 광신호를 전기신호로 변환시키는 광전변환소자와 ; 상기 광전변환소자 이외의 소자로 상기 반도체 기판에 구성되는 전기회로소자와 ; 상기 반도체 기판의 표면을 피복하도록 배치되며, 상기 광전변환소자위에 개구를 가지고 있는 불투명층과 ; 상기 개구에 제공되며, 상기 개구를 통한 입사광을 상기 광전변환소자위에 개구를 가지고 있는 불투명층과 ; 상기 개구에 제공되며, 상기 광전변환소자의 동작영역으로 집중시키는 렌즈작용을 가지는 투명층을 포함하는 것을 특징으로 하는 광배선식 반도체 집적회로.
- 제2항에 있어서, 상기 렌즈 작용을 가지는 투명층은 프레즈낼 렌즈인 것을 특징으로 하는 광배선식 반도체 집적회로.
- 제2항에 있어서, 상기 렌즈 작용을 가지는 투명층은 굴절률 분산렌즈인 것을 특징으로 하는 광배선식 반도체 집적회로.
- 제2항에 있어서, 상기 렌즈 작용을 가지는 투명층은 구형렌즈인 것을 특징으로 하는 광배선식 반도체 집적회로.
- 반도체 기판과 ; 전기펄스신호에 응답하여 광펄스신호를 발생하는 광펄스신호 발생수단과 ; 상기 반도체 기판에 형성되며, 상기 광펄스신호 발생수단으로부터 발생되어 상기 반도체 기판의 표면상에 입사되는 광펄스신호에 응답하여 광신호를 전기신호로 변환시키는 광전변환소자와 ; 상기 광전변환소자 이외의 소자로 상기 반도체 기판에 구성되는 전기회로소자와 ; 상기 반도체 기판의 표면을 피복하도록 배치되며, 상기 광전변환소자위에 개구를 가지고 있는 불투명층과 ; 상기 개구에 제공되며, 각각 상기 복수의 세트의 광전변환소자에 대응하는 복수의 세트로 그룹화되어 있는 투명층을 포함하고, 상기 복수의 세트의 투명층은 다른 파장의 광에 대하여 파장 선택성을 가지고 있어 각 관련 세트의 모든 광전변환소자가 대응하는 파장을 갖는 광에 응답하여 동시에 작동되게 하는 것을 특징으로 하는 광배선식 반도체 집적회로.
- 반도체 기판과; 전기펄스신호에 응답하여 광펄스신호를 발생하는 광펄스신호 발생수단과 ; 상기 반도체 기판에 형성되며, 상기 광펄스신호 발생수단으로부터 발생되어 상기 반도체 기판의 표면상에 입사되는 광펄스신호에 응답하여 광신호를 전기신호로 변환시키는 광전변환소자와 ; 상기 광전변환소자 이외의 소자로 상기 반도체 기판에 구성되는 전기회로소자와 ; 상기 반도체 기판의 표면을 피복하도록 배치되며, 상기 광전변환소자위에 개구를 가지고 있는 불투명층과 ; 상기 개구에 제공되며, 상기 개구를 통해 입사된 광을 상기 관련 광전변환소자의 동작영역으로 집중시키는 렌즈 작용을 가지며, 각각 상기 복수의 세트의 광전변환소자에 대응하는 복수의 세트로 그룹화되어 있는 투명층을 포함하고, 상기 복수의 세트의 투명층은 다른 파장의 광에 대하여 파장 선택성을 가지고 있어 각 관련 세트의 모든 광전변환소자가 대응하는 파장을 갖는 광에 응답하여 동시에 작동되게 하는 것을 특징으로 하는 광배선식 반도체 집적회로.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22490786A JPH0815211B2 (ja) | 1986-09-25 | 1986-09-25 | 光配線式半導体集積回路 |
| JP224907 | 1986-09-25 | ||
| JP?86-224907 | 1986-09-25 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR880004584A KR880004584A (ko) | 1988-06-07 |
| KR960001189B1 true KR960001189B1 (ko) | 1996-01-19 |
Family
ID=16821025
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019870010631A Expired - Fee Related KR960001189B1 (ko) | 1986-09-25 | 1987-09-25 | 광배선식 반도체 집적회로 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4835595A (ko) |
| JP (1) | JPH0815211B2 (ko) |
| KR (1) | KR960001189B1 (ko) |
| DE (1) | DE3731865A1 (ko) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4884243A (en) * | 1988-02-19 | 1989-11-28 | California Institute Of Technology | Multi-port, optically addressed RAM |
| JPH088624B2 (ja) * | 1988-03-14 | 1996-01-29 | 株式会社日立製作所 | 完全密着型読取センサ及び読取センサアセンブリ |
| EP0364163A3 (en) * | 1988-10-14 | 1991-11-21 | AT&T Corp. | Electro-optic device including opaque protective regions |
| US5182623A (en) * | 1989-11-13 | 1993-01-26 | Texas Instruments Incorporated | Charge coupled device/charge super sweep image system and method for making |
| JPH0410664A (ja) * | 1990-04-27 | 1992-01-14 | Nec Corp | 受光素子アレイ |
| EP0509820B1 (en) * | 1991-04-19 | 1998-01-07 | Canon Kabushiki Kaisha | Image pickup apparatus |
| GB2326277A (en) * | 1997-06-11 | 1998-12-16 | Lsi Logic Corp | Low skew signal distribution for integrated circuits |
| US6380527B1 (en) * | 1997-06-23 | 2002-04-30 | Frank Davis | Method and apparatus for reading from and writing to a stationary optical storage device |
| US6548878B1 (en) | 1998-02-05 | 2003-04-15 | Integration Associates, Inc. | Method for producing a thin distributed photodiode structure |
| US6458619B1 (en) | 1998-02-05 | 2002-10-01 | Integration Associates, Inc. | Process for producing an isolated planar high speed pin photodiode with improved capacitance |
| US6027956A (en) * | 1998-02-05 | 2000-02-22 | Integration Associates, Inc. | Process for producing planar dielectrically isolated high speed pin photodiode |
| US6303967B1 (en) | 1998-02-05 | 2001-10-16 | Integration Associates, Inc. | Process for producing an isolated planar high speed pin photodiode |
| US6753586B1 (en) | 1998-03-09 | 2004-06-22 | Integration Associates Inc. | Distributed photodiode structure having majority dopant gradient and method for making same |
| KR100394296B1 (ko) * | 1998-04-13 | 2003-08-09 | 인텔 코오퍼레이션 | 집적회로에서의 광 클록 분배 방법 및 장치 |
| GB2340996B (en) * | 1998-08-26 | 2003-07-09 | Lsi Logic Corp | Low skew signal distribution circuits |
| US6690078B1 (en) | 1999-08-05 | 2004-02-10 | Integration Associates, Inc. | Shielded planar dielectrically isolated high speed pin photodiode and method for producing same |
| JP4797221B2 (ja) * | 2000-02-21 | 2011-10-19 | ソニー株式会社 | 光電子集積回路装置 |
| DE102004011548B4 (de) * | 2004-03-08 | 2015-02-12 | Giesecke & Devrient Gmbh | Tragbarer Datenträger mit optischem Sensor und geeigneter Sensor und Verfahren zur Herstellung |
| FR2887369B1 (fr) * | 2005-06-17 | 2007-08-31 | Trixell Sas Sa | Detecteur de rayonnement |
| JP5022795B2 (ja) * | 2007-07-09 | 2012-09-12 | 株式会社東芝 | 半導体受光素子およびその製造方法 |
| US20120019695A1 (en) * | 2010-07-26 | 2012-01-26 | Omnivision Technologies, Inc. | Image sensor having dark sidewalls between color filters to reduce optical crosstalk |
| GB2486000A (en) | 2010-11-30 | 2012-06-06 | St Microelectronics Res & Dev | Optical proximity detectors with arrangements for reducing internal light propagation from emitter to detector |
| GB2485996A (en) | 2010-11-30 | 2012-06-06 | St Microelectronics Res & Dev | A combined proximity and ambient light sensor |
| GB2485998A (en) * | 2010-11-30 | 2012-06-06 | St Microelectronics Res & Dev | A single-package optical proximity detector with an internal light baffle |
| JP2014050037A (ja) * | 2012-09-03 | 2014-03-17 | International Business Maschines Corporation | 大規模ニューラルネットワークシステムのためのハイブリッド相互接続(HybridInterconnectStrategyforLarge−ScaleNeuralNetworkSystems) |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1172887B (it) * | 1978-04-14 | 1987-06-18 | Cselt Centro Studi Lab Telecom | Foto rivelatore a valanga ad alta responsivita' e procedimento per la sua realizzazione |
| US4270135A (en) * | 1979-12-12 | 1981-05-26 | Westinghouse Electric Corp. | High-frequency phototransistor operated with multiple light sources |
| JPS57124485A (en) * | 1981-01-27 | 1982-08-03 | Nec Corp | Solid image pickup element |
| JPS58111444A (ja) * | 1981-12-24 | 1983-07-02 | Hitachi Ltd | デイジタル通信用光受信器 |
| JPS5917286A (ja) * | 1982-07-20 | 1984-01-28 | Fujitsu Ltd | 光導電ポテンシヨメ−タ |
| US4513305A (en) * | 1982-12-06 | 1985-04-23 | Gte Laboratories Incorporated | Multi-wavelength demultiplexer for fiber optical communication |
| JPS59127879A (ja) * | 1983-01-12 | 1984-07-23 | Semiconductor Energy Lab Co Ltd | 光電変換装置およびその作製方法 |
| JPS59134872A (ja) * | 1983-01-23 | 1984-08-02 | Rohm Co Ltd | フオトセンサ−用ic |
| JPS60153184A (ja) * | 1984-01-21 | 1985-08-12 | Sumitomo Electric Ind Ltd | 受光素子 |
| JPS60191548A (ja) * | 1984-03-12 | 1985-09-30 | Hitachi Ltd | イメ−ジセンサ |
-
1986
- 1986-09-25 JP JP22490786A patent/JPH0815211B2/ja not_active Expired - Lifetime
-
1987
- 1987-09-22 DE DE19873731865 patent/DE3731865A1/de active Granted
- 1987-09-24 US US07/100,742 patent/US4835595A/en not_active Expired - Fee Related
- 1987-09-25 KR KR1019870010631A patent/KR960001189B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US4835595A (en) | 1989-05-30 |
| KR880004584A (ko) | 1988-06-07 |
| JPS6381869A (ja) | 1988-04-12 |
| DE3731865C2 (ko) | 1991-05-08 |
| JPH0815211B2 (ja) | 1996-02-14 |
| DE3731865A1 (de) | 1988-04-07 |
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St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 19990120 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
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| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
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| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 19990120 |
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| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |
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| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |