Mulla et al., 2016 - Google Patents
A simple and portable setup for thermopower measurementsMulla et al., 2016
- Document ID
- 1463916354683878766
- Author
- Mulla R
- Rabinal M
- Publication year
- Publication venue
- ACS Combinatorial Science
External Links
Snippet
Thermoelectric energy conversion technology has received significant attention because of its promising applications and environmentally clean nature. The innovative design of efficient thermoelectric materials is assisted by simple and reliable techniques for fast and …
- 238000005259 measurement 0 title abstract description 174
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L35/00—Thermo-electric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermo-electric effects or thermomagnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L35/12—Selection of the material for the legs of the junction
- H01L35/14—Selection of the material for the legs of the junction using inorganic compositions
- H01L35/20—Selection of the material for the legs of the junction using inorganic compositions comprising metals only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material
- G01N27/04—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating the impedance of the material by investigating resistance
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L35/00—Thermo-electric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermo-electric effects or thermomagnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L35/28—Thermo-electric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermo-electric effects or thermomagnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof operating with Peltier or Seebeck effect only
- H01L35/32—Thermo-electric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermo-electric effects or thermomagnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof operating with Peltier or Seebeck effect only characterised by the structure or configuration of the cell or thermo-couple forming the device including details about, e.g., housing, insulation, geometry, module
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements
- G01K7/02—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements using thermoelectric elements, e.g. thermocouples
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K17/00—Measuring quantity of heat
- G01K17/06—Measuring quantity of heat conveyed by flowing mediums, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device
- G01K17/08—Measuring quantity of heat conveyed by flowing mediums, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device based upon measurement of temperature difference or of a temperature
- G01K17/20—Measuring quantity of heat conveyed by flowing mediums, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device based upon measurement of temperature difference or of a temperature across a radiating surface, combined with ascertainment of the heat transmission coefficient
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements using resistive elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means by investigating magnetic variables
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L35/00—Thermo-electric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermo-electric effects or thermomagnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L35/34—Processes or apparatus peculiar to the manufacture or treatment of these devices or of parts thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Mulla et al. | A simple and portable setup for thermopower measurements | |
| Martin et al. | High temperature Seebeck coefficient metrology | |
| Boffoué et al. | Experimental setup for the measurement of the electrical resistivity and thermopower of thin films and bulk materials | |
| Fu et al. | A setup for measuring the Seebeck coefficient and the electrical resistivity of bulk thermoelectric materials | |
| Zakutayev et al. | Development and application of an instrument for spatially resolved Seebeck coefficient measurements | |
| Ziolkowski et al. | Probing thermopower on the microscale | |
| Recatala-Gomez et al. | Direct measurement of the thermoelectric properties of electrochemically deposited Bi2Te3 thin films | |
| Mulla et al. | An easily constructed and inexpensive tool to evaluate the Seebeck coefficient | |
| Singh et al. | Fabrication of simple apparatus for resistivity measurement in high-temperature range 300–620 K | |
| García-Cañadas et al. | Multifunctional probes for high-throughput measurement of Seebeck coefficient and electrical conductivity at room temperature | |
| Amagai et al. | Precise measurement of absolute Seebeck coefficient from Thomson effect using ac-dc technique | |
| Adnane et al. | High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating | |
| Haupt et al. | Van der Pauw device used to investigate the thermoelectric power factor | |
| Kim et al. | Comparison of four-probe thermal and thermoelectric transport measurements of thin films and nanostructures with microfabricated electro-thermal transducers | |
| Rawat et al. | Simple design for Seebeck measurement of bulk sample by 2-probe method concurrently with electrical resistivity by 4-probe method in the temperature range 300–1000 K | |
| Castillo et al. | Thermoelectric characterization by transient Harman method under nonideal contact and boundary conditions | |
| Ling et al. | Thermal conductivity measurement of thermoelectric films using transient Photo-Electro-Thermal technique | |
| Beltrán-Pitarch et al. | Complete characterization of thermoelectric materials by impedance spectroscopy | |
| Beltrán-Pitarch et al. | Temperature coefficient of resistance and thermal boundary conductance determination of ruthenium thin films by micro four-point probe | |
| Guralnik et al. | Determination of thermoelectric properties from micro four-point probe measurements | |
| Ziolkowski et al. | Application of high-throughput seebeck microprobe measurements on thermoelectric half-Heusler thin film combinatorial material libraries | |
| Hahtela et al. | Thermal-Conductivity Measurement of Thermoelectric Materials Using 3 ω Method | |
| Fujiki et al. | Development on measurement method for Thomson coefficient of thin film | |
| Edler et al. | Reference material for Seebeck coefficients | |
| Beltrán-Pitarch et al. | Impedance spectroscopy analysis of thermoelectric modules fabricated with metallic outer external layers |