Ninomiya et al., 2018 - Google Patents
Development of a vacuum electrospray droplet ion gun for secondary ion mass spectrometryNinomiya et al., 2018
View PDF- Document ID
- 7580519642477608361
- Author
- Ninomiya S
- Sakai Y
- Chen L
- Hiraoka K
- Publication year
- Publication venue
- Mass Spectrometry
External Links
Snippet
Atmospheric pressure electrospray had been used in previous studies to generate massive water droplet ion beams, and the beams successfully achieved efficient desorption/ionization of biomolecules, low damage etching of polymers and nonselective …
- 150000002500 ions 0 title abstract description 78
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/165—Electrospray ionisation
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
- H01J2237/0802—Field ionization sources
- H01J2237/0807—Gas field ion sources [GFIS]
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometer or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
- H01J49/0059—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by a photon beam, photo-dissociation
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/08—Ion sources; Ion guns
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
- H01J37/243—Beam current control or regulation circuits
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/31—Processing objects on a macro-scale
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Ninomiya et al. | Development of a vacuum electrospray droplet ion gun for secondary ion mass spectrometry | |
| Mishin et al. | Chemically selective laser ion-source for the CERN-ISOLDE on-line mass separator facility | |
| US8299444B2 (en) | Ion source | |
| US7462824B2 (en) | Combined ambient desorption and ionization source for mass spectrometry | |
| US5838002A (en) | Method and apparatus for improved electrospray analysis | |
| CA2411532C (en) | Atmospheric pressure photoionizer for mass spectrometry | |
| US9372161B2 (en) | Ion source, ion gun, and analysis instrument | |
| JP4331398B2 (en) | An analyzer with a pulsed ion source and a transport device for damping ion motion and method of use thereof | |
| Murray et al. | Aerosol matrix-assisted laser desorption ionization mass spectrometry | |
| Bergen et al. | Multiply charged cluster ion crossed-beam apparatus: Multi-ionization of clusters by ion impact | |
| JP2003502803A (en) | Method and apparatus for determining the molecular weight of a labile molecule | |
| Doria et al. | A study of the parameters of particles ejected from a laser plasma | |
| Charvat et al. | New design for a time-of-flight mass spectrometer with a liquid beam laser desorption ion source for the analysis of biomolecules | |
| JP2004206933A (en) | Mass spectrometer and mass spectrometry method | |
| JP3676298B2 (en) | Chemical substance detection apparatus and chemical substance detection method | |
| CA2582006A1 (en) | Ultra high mass range mass spectrometer systems | |
| US5164592A (en) | Method and apparatus for mass spectrometric analysis | |
| Ninomiya et al. | Relative secondary ion yields produced by vacuum-type electrospray droplet ion beams | |
| Ninomiya et al. | Secondary ion yields for vacuum‐type electrospray droplet beams measured with a triple focus time‐of‐flight analyzer | |
| JPS6353211B2 (en) | ||
| JP4629663B2 (en) | Mass spectrometry and apparatus using supercritical fluid jet method | |
| Yotsombat et al. | Optical emission spectra of a copper plasma produced by a metal vapour vacuum arc plasma source | |
| WO1998007505A1 (en) | Method and apparatus for improved electrospray analysis | |
| US3798447A (en) | Apparatus for directing an energizing beam on a sample to cause secondary ion emission | |
| Ninomiya et al. | Characteristics of charged droplet beams produced from vacuum electrospray |