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Gatan Insight Vol. 24 No. 1
Now available - Gatan Insight!
High-resolution EELS on high-entropy perovskite oxide thin films
Join our upcoming webinar!
Real-space mapping of deuterated polymers using dark-field EELS
Real-space mapping of deuterated polymers using dark-field EELS
Energy filtered 4D STEM reveals short-range ordering motifs in semiconductors
Improve your semiconductor analysis with 4D STEM
High electron energy loss spectroscopy at extended fine structure
Unlock high-quality EXELFS insights

Recent Publications

Phenomenological understanding of the contribution of bulk and grain boundary precipitates on strengthening in prolonged-aged Al-Zn-Mg-Cu aluminium alloys

Materials Today Advances
2025

Tai, C. L.; Chiu, Y. N.; Chen, C. J.; Lin, S. K.; Lin, H. C.; Misra, R. D. K.; Yang, Y. L.; Hsiao, C. N.; Tsao, C. S.; Chung, T. F.

Nondeterministic dynamics in the η-to-θ phase transition of alumina nanoparticles

Science
2025

Sakakibara, M.; Hanaya, M.; Nakamuro, T.; Nakamura, E.

Strain effects in SrHfO3 films grown by hybrid molecular beam epitaxy

ACS Applied Electronic Materials
2025

Gemperline, P. T.; Thind, A. S.; Tang, C.; Sterbinsky, G. E.; Kiefer, B.; Jin, W.; Klie, R. F.; Comes, R. B.

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NEWS

Gatan launches the EDAX Orbis II Micro-XRF system
August 04, 2025
Gatan launches the EDAX Elite T Ultra EDS system
October 29, 2024
Gatan introduces the Monarc Pro T system for cathodoluminescence imaging
July 24, 2023
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EVENTS

Apr
30
2026
High-resolution EELS on high-entropy perovskite oxide thin films
Webinar
United States
May
25
2026
Japanese Society of Microscopy (JSM) 2026
Japan
Aug
02
2026
Microscopy and Microanalysis (M&M) 2026
United States
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