SU758307A1 - METHOD FOR MONITORING THE QUALITY OF ELECTRONIC MICROWAVE DEVICES: - Google Patents

Description

The invention relates to the production of electronic microwave devices, in particular to the production technology of devices with increased reliability 5 and durability.

Known methods of quality control of electronic devices for informative parameters, for example, the level of shot noise [1]. ten

A disadvantage of the known methods is a large number of informative parameters, since for a general assessment of the quality of devices, each parameter is measured separately. ¢ 5

The closest to the invention is the method of quality control of electronic microwave devices, which includes determining the dependence of the intrinsic noise level on the device defects and measuring the intrinsic noise level [2]. This method can measure only fluctuations of currents in the individual electrodes in the microwave devices. Since different defects lead to an increase in current noise in different circuits, in a multielectrode system it is necessary to measure the noise in the circuit of all electrodes, which complicates the measuring equipment and the measurement process. In addition, e

First, the frequency range of measurements is not defined, while the level of “white” or shot noise in the currents of the electrodes of the microwave devices is not very sensitive to latent defects.

The purpose of the invention is to identify unreliable devices, simplify measurements by reducing the number of measured parameters, as well as detect. latent defects by increasing the sensitivity of measurements.

This goal is achieved by using their own modulation noise of devices in the frequency-dependent part of the spectrum as the measured parameter, determining the dependence of durability on the level of this noise, and judging by this dependence on the quality of the devices.

The level of this noise is influenced by all types of low-frequency noise of the electron beam, which increase with the appearance of various defects in the device, as well as by specific ones! for microwave devices undesirable processes. · ‘

The growth of modulation noise causes deterioration of the emission properties of the cathode, an increase in the pressure of residual gases, an increased deposition on

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current-conducting material electrodes

' ^! from other electrodes, the appearance of unreliable electrical contacts, a decrease in the mechanical rigidity of the elements of the “device design” and “enhanced focusing and stability of electronic devices, etc.

In accordance with the proposed method of quality control devices measure their own modulation noise in the frequency-dependent part of the spectrum, which occupies the Hertz unit range - hundreds of kilohertz from the carrier, then establish the connection of the noise level with the durability of the device and judge the quality of the devices by this dependence.

The amplitude and phase noises of instruments are in different degrees sensitive to instabilities and defects of the instrument. Therefore, an assessment of the quality of the devices is carried out only by amplitude or phase (frequency) noise, or both.

To implement this method, it is necessary to measure the noise of instruments that are free from pulsation of power sources, the noise of the master oscillator or the measuring circuit. Therefore, the noise of amplifying instruments should be measured in the autogeneration or saturation mode by the input signal level. In the latter case

The method and technique of measurements is simplified, since the frequency-dependent part of the noise shifts to higher frequencies.

‘Thus, using to assess the quality of the part of the noise spectrum that is most affected by latent defects of the instrument, as well as the use of sensitive measuring equipment, can detect such deviations from the norm in the instrument that are not indicative of others

$ ways. This allows timely detection of unreliable instruments, simplified measurements, and detection of hidden defects in instruments.

Use of the invention is allowed. It improves the reliability and durability of microwave devices, as well as timely identify and replace unreliable devices during operation.

Claims (1)

Claim The method of quality control of electronic microwave devices, including the determination of the dependence of the level of its own 20 noises from the defects of the device, in that, in order to simplify the measurements by reducing the number of measured parameters, as well as detecting hidden defects 25, due to the increase in sensitivity of measurements, their own modulation noise of devices in the frequency-dependent part of the spectrum is used as a measured parameter, the durability of the durability depends on the level of these noises, and the quality of the devices is judged by this efficiency.