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JPS5945935B2 - Vacuum measurement method - Google Patents
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JPS5945935B2 - Vacuum measurement method - Google Patents

Vacuum measurement method

Info

Publication number
JPS5945935B2
JPS5945935B2 JP6449579A JP6449579A JPS5945935B2 JP S5945935 B2 JPS5945935 B2 JP S5945935B2 JP 6449579 A JP6449579 A JP 6449579A JP 6449579 A JP6449579 A JP 6449579A JP S5945935 B2 JPS5945935 B2 JP S5945935B2
Authority
JP
Japan
Prior art keywords
vacuum
current
ion
electron current
degree
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP6449579A
Other languages
Japanese (ja)
Other versions
JPS55156825A (en
Inventor
肇 石丸
成範 平松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHINKU DENSHI KK
Original Assignee
SHINKU DENSHI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHINKU DENSHI KK filed Critical SHINKU DENSHI KK
Priority to JP6449579A priority Critical patent/JPS5945935B2/en
Publication of JPS55156825A publication Critical patent/JPS55156825A/en
Publication of JPS5945935B2 publication Critical patent/JPS5945935B2/en
Expired legal-status Critical Current

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Description

【発明の詳細な説明】 この発明&2S/N比を改善することを目的とした真空
度測定力法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION This invention relates to a force method for measuring the degree of vacuum aimed at improving the S/N ratio.

従来、高真空、超高真空の真空度を測定するには電離真
空計を用いて真空中の残留気体をイオン化し、生成した
イオンをイオンコレクタを介してイオン電流として取り
出し、その電流値を真空度に換算する方法が最も良く採
用されていたのであるが、この方法において測定系の近
くに種々の電磁機器があったり、測定球とその電源(前
記イオン電流の直流増巾器)が離れていると、前記イオ
ン電流中に種々の電気的残音が混入して正確な測定がで
きない問題点があった。
Conventionally, to measure the degree of vacuum in high vacuum or ultra-high vacuum, an ionization vacuum gauge is used to ionize the residual gas in the vacuum, the generated ions are extracted as an ion current through an ion collector, and the current value is measured in the vacuum. The most commonly used method was to convert it into degrees, but in this method there were various electromagnetic devices near the measurement system, or the measurement bulb and its power source (the DC amplifier for the ion current) were separated. However, there is a problem in that various electrical after-sounds are mixed into the ion current, making accurate measurement impossible.

又前記測定球を加速器やプラズマ発生装置等、真空中に
荷電粒子が存在する雰囲気に取付けた場合には、前記イ
オン電流中に荷電粒子に起因する雑音も混入して、正確
な測定を一層困難なものにしていた。
Furthermore, if the measuring ball is installed in an atmosphere where charged particles exist in vacuum, such as in an accelerator or plasma generator, noise caused by the charged particles will be mixed into the ion current, making accurate measurement even more difficult. I was making it into something.

然るにこの発明は前記電離真空計における測定球の電子
電流(残留気体のイオン化の為に流す電流)を変調する
と共に、イオンコレクタより取り出して増巾したイオン
電流を、前記電子電流と同期させて検波し、これを平滑
化することにより前記電気的雑音を除去したので、沖1
定系の周囲に種種の電磁機器があったり、測定球と電源
が離れている場合でも正確な測定を可能にしたものであ
る。
However, the present invention modulates the electron current of the measuring bulb (the current flowing to ionize residual gas) in the ionization vacuum gauge, and detects the amplified ion current extracted from the ion collector in synchronization with the electron current. By smoothing this, the electrical noise was removed, so Oki 1
This enables accurate measurements even when there are various types of electromagnetic equipment around the fixed system or when the measurement bulb and power source are far apart.

又、測定球の電極を通して混入する荷電粒子による雑音
に対しては、上記の方法に加えて電極を覆うように静電
シールドを配置し、該静電シールドにより荷電粒子の混
入を防止したので荷電粒子による雑音も除去することに
成功したのである。
In addition to the above method, an electrostatic shield was placed to cover the electrodes to prevent noise from charged particles entering through the electrodes of the measurement bulb. They also succeeded in removing noise caused by particles.

即ちこの発明を実施例について説明すれば、電離真空計
測定球1とその電源よりなる測定系を第1図のように構
成する。
That is, to explain this invention with reference to an embodiment, a measurement system consisting of an ionization vacuum gauge measurement bulb 1 and its power source is constructed as shown in FIG.

図中2はフィラメント、3はアノード、4はイオンコレ
クタを表わし、フィラメント2に電子電流コントローラ
5を介設しフィラメント加熱電源6を接続すると共に、
該フィラメント2を電池7〔20〜60■)および抵抗
器8を介して接地し、アノード3を電池9(150〜2
00V )を介して接地してフィラメント−アノード間
の電子電流回路を構成する。
In the figure, 2 represents a filament, 3 represents an anode, and 4 represents an ion collector. An electronic current controller 5 is interposed in the filament 2, and a filament heating power source 6 is connected to the filament 2.
The filament 2 is grounded via the battery 7 (20~60cm) and the resistor 8, and the anode 3 is connected to the battery 9 (150~2cm).
00V) to form an electronic current circuit between the filament and the anode.

前記電子電流コントローラ5は、抵抗器8より電子電流
値に対応する情報(電圧)を得て、フィラメント2に流
れる電流を制御し、所望の定電子電流が流れるように働
くものである。
The electronic current controller 5 obtains information (voltage) corresponding to the electronic current value from the resistor 8, controls the current flowing through the filament 2, and functions so that a desired constant electronic current flows.

この電子電流に交流成分が含まれるように変調する為に
、電子電流コントローラ5には発振器10より取り出し
た変調信号11を与える。
In order to modulate this electronic current so that it includes an alternating current component, a modulation signal 11 taken out from an oscillator 10 is given to the electronic current controller 5.

一方イオンコレクタ4には電流、電圧変換器12、増巾
器13をコンデンサ14を介設して直列に接続し、増巾
器13の出力と加算回路150人力をアナログゲート1
6aを介して接続すると共に、波形反転回路17および
アナログゲート16bを介して接続し、前記加算回路1
5の出力には低域沢波器18、電流計19を直列に接続
する。
On the other hand, a current/voltage converter 12 and an amplifier 13 are connected in series to the ion collector 4 through a capacitor 14, and the output of the amplifier 13 and the addition circuit 150 are connected to the analog gate 1.
6a as well as the waveform inversion circuit 17 and the analog gate 16b.
A low frequency wave generator 18 and an ammeter 19 are connected in series to the output of 5.

前記アナログゲー)16a。16bに対するゲート開閉
信号は、前記発振器10の出力な移相器20、矩形波を
出力する波形整形回路21を通してアナログゲート16
aに与えると共に、該開閉信号をインバータ22で反転
してアナログゲーN6bに与える。
Said analog game) 16a. The gate opening/closing signal for the analog gate 16b is passed through the phase shifter 20, which is the output of the oscillator 10, and the waveform shaping circuit 21 that outputs a rectangular wave.
At the same time, the opening/closing signal is inverted by the inverter 22 and applied to the analog game N6b.

上記の測定系においてフィラメント−アノード間に流れ
る電子電流は変調信号11で変調されろ結果交流成分が
含まれる。
In the above measurement system, the electron current flowing between the filament and the anode is modulated by the modulation signal 11, and as a result contains an alternating current component.

従って電子電流により生成し7’Clン電流も交流成分
を含んだ状態で4オンコレクタ4に流れる。
Therefore, the 7'Cl current generated by the electron current also flows to the 4-on collector 4 in a state containing an alternating current component.

このイオンNEW、は電流、電圧変換器12で電圧に変
換された後、その交流成分のみが増巾器13に与えられ
、該増巾器13で増巾作用を受ける。
After this ion NEW is converted into a voltage by a current/voltage converter 12, only its alternating current component is given to an amplifier 13, where it is amplified.

増巾作用を受けたイオン電流は加算回路15に対し正負
対称の波形で与えられる所、その線路にアナログゲート
16at16bを介設して、該アナログゲート16a、
16bは、前記電子電流を変調した信号と同期して七の
移相角度πラジアン毎に交互に開閉するようにしたので
、結局増巾器13の出力に現われたイオン電流は、同期
検波されて加算回路15の出力に現われる。
The amplified ion current is applied to the adder circuit 15 in a waveform with positive and negative symmetry, and an analog gate 16at16b is interposed on the line, and the analog gate 16a,
16b is arranged to open and close alternately at every phase shift angle of 7 radians in synchronization with the signal modulating the electron current, so that the ion current appearing at the output of the amplifier 13 is synchronously detected. appears at the output of the adder circuit 15.

闇、電子電流の変調信号に対して、イオン電流の変化は
通常若干の遅れを併なうから、この不一致は移相器20
で測定時に調整する。
Since changes in the ion current usually have a slight delay with respect to the modulation signal of the electron current, this discrepancy is caused by the phase shifter 20.
Adjust when measuring.

加算回路15の出力の検波出力は低域r波器18で平滑
化されてノイズ成分が除去された直流電流となり、この
電流で動作する電流計19の指示より、測定球1を取り
付けた系の真空度を求めることができる。
The detected output of the adder circuit 15 is smoothed by the low-frequency r wave generator 18 to become a DC current from which noise components have been removed. Based on the indication from the ammeter 19 that operates with this current, the detection output of the system in which the measurement bulb 1 is attached is determined. The degree of vacuum can be determined.

一般には、電碓計19の目盛板に電流値より求められる
真空度を直接目盛り、真空度が直続できるようにする。
Generally, the degree of vacuum determined from the current value is directly calibrated on the scale plate of the electric meter 19 so that the degree of vacuum can be directly connected.

電流計の指示に代えて、ディジタル表示とすることも勿
論可能である。
It is of course possible to use a digital display instead of the ammeter indication.

尚、電子電流を変調する為の発振器10の周波数は、こ
の測定系の周囲で使用される他の電磁機器を考慮すれば
約20ヘルツ程度が好ましい。
Note that the frequency of the oscillator 10 for modulating the electronic current is preferably about 20 hertz, taking into account other electromagnetic equipment used around this measurement system.

第2図には、上記実施例に使用される電離真空計1で、
真空装置内に、フィラメント2、アノード3、イオンコ
レクタ4が露出する。
FIG. 2 shows the ionization vacuum gauge 1 used in the above embodiment,
A filament 2, an anode 3, and an ion collector 4 are exposed within the vacuum device.

いわゆるヌード型測定球を示した。A so-called nude measuring ball is shown.

図中23.23は各電極を支持する導入端子、24はこ
の測定球を真空装置に取付ける為のフランジである。
In the figure, 23 and 23 are introduction terminals that support each electrode, and 24 is a flange for attaching this measurement bulb to a vacuum device.

このようなヌード型測定球を、加速器、プラズマ発生装
置等、真空中に荷電粒子が存在する装置に取付けた場合
には、前記の電気的雑音の他に、荷電粒子が測定球内に
飛来することによって生ずる荷電粒子による雑音がイオ
ン電流に混入する。
When such a nude measuring sphere is installed in a device where charged particles exist in a vacuum, such as an accelerator or a plasma generator, in addition to the electrical noise mentioned above, charged particles may fly into the measuring sphere. Noise from charged particles generated by this is mixed into the ionic current.

このような雑音を除去する為に、真空中に配置される電
極を静電シールドで覆う。
In order to eliminate such noise, the electrodes placed in a vacuum are covered with an electrostatic shield.

第3図は真空度の測定の為に真空中に配置したフィラメ
ント2、アノード3、イオンコレクタ4の電極を、有頂
筒状に成形した金属メツシュ25,25a、25bを三
重とした静電シールド26で覆ったものである。
Figure 3 shows an electrostatic shield in which the electrodes of the filament 2, anode 3, and ion collector 4 placed in a vacuum to measure the degree of vacuum are triple-layered with metal meshes 25, 25a, and 25b formed into a cylindrical shape. It is covered with 26.

前記静電シールド26は内側の金属メツシュ25を接地
すると共に中間の金属メツシュ25aKは負の電位(約
200ボルト)を、外側の金属メツ−1”25 bには
正の電位(約200ボルト)を与える。
The electrostatic shield 26 grounds the inner metal mesh 25, the middle metal mesh 25aK has a negative potential (approximately 200 volts), and the outer metal mesh 25b has a positive potential (approximately 200 volts). give.

この実施例では、真空中を測定球の電極に向って迷走し
て来る荷電粒子が静電シールド26で追い返されてイオ
ン電流中に混入するのを防止できるから、荷電粒子の存
在する真空中でも、正確な測定が可能である。
In this embodiment, the electrostatic shield 26 can repel charged particles straying toward the electrodes of the measurement bulb in vacuum and prevent them from being mixed into the ion current, so even in a vacuum where charged particles are present, Accurate measurements are possible.

電子電流を変調し、イオン電流の交流成分を同期検波す
る点′L′!前記と同様である。
Point 'L' where the electron current is modulated and the alternating current component of the ion current is synchronously detected! Same as above.

即ちこの発明によれば、電子電流を変調すると共に、イ
オン電流中の交流成分を同期検波した後平滑化して真空
度を求めるようにしたので、測定系周囲の電気的雑音を
除去して正確な測定ができ、測定球とその電源を離すこ
とも可能となる等の諸効果がある。
That is, according to this invention, the degree of vacuum is determined by modulating the electron current and synchronously detecting the alternating current component in the ion current and then smoothing it, thereby eliminating electrical noise around the measurement system and obtaining accurate It has various effects such as being able to perform measurements and making it possible to separate the measuring bulb from its power source.

又、測定球の電極を静電シールドで覆ったので、真空中
の荷電粒子による雑音も除去でき、加速器、プラズマ発
生装置等の・軍転中にも正確な真空度測定を可能とする
効果がある。
In addition, since the electrodes of the measurement bulb are covered with an electrostatic shield, noise caused by charged particles in the vacuum can be removed, making it possible to accurately measure the degree of vacuum even during military operations such as accelerators and plasma generators. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明を実施する測定系のブロック図、第2
図は同じ〈実施測定系に使用するヌード型測定球の一部
を破切した斜視図、第3図は静電シールドで覆った状態
の測定球の縦断面図である。 1・・・・・・電離真空計測定球、2・・・・・・フィ
ラメント、3・・・・・・アノード、4・・・・・・イ
オンコレクタ、5・・・・・・電子電流コントローラ、
6・・・・・・フィラメント加熱電源、7,9・・・・
・・電池、8・・・・・・抵抗器、10・・・・・・発
振器、11・・・・・・変調信号、12・・・・・・電
流、電圧変換器、13・・・・・・増巾器、14・・・
・・・コンデンサ、15・・・・・・加算回路、16a
、16b・・・・・・アナログゲート、17・・・・・
・波形反転回路、1801000.低域p波器、19・
・・・・・電流計、20・・・・・・移相器、21・・
・・・・波形成形回路、22・・・・・・インバータ、
23・・・・・・導入端子、24・川・・フランジ、2
5.25a。 25b・・・・・・金属メツシュ、26・・・・・・静
電シールド。
Figure 1 is a block diagram of a measurement system implementing this invention, Figure 2 is a block diagram of a measurement system implementing this invention.
The figure is a partially cutaway perspective view of the same nude-type measuring sphere used in the actual measurement system, and FIG. 3 is a longitudinal cross-sectional view of the measuring sphere covered with an electrostatic shield. 1...Ionization vacuum gauge measurement bulb, 2...Filament, 3...Anode, 4...Ion collector, 5...Electron current controller,
6...Filament heating power supply, 7,9...
... Battery, 8 ... Resistor, 10 ... Oscillator, 11 ... Modulation signal, 12 ... Current, voltage converter, 13 ... ...Amplifier, 14...
... Capacitor, 15 ... Addition circuit, 16a
, 16b...Analog gate, 17...
・Waveform inversion circuit, 1801000. Low-frequency p-wave device, 19.
...Ammeter, 20...Phase shifter, 21...
... Waveform shaping circuit, 22 ... Inverter,
23...Introduction terminal, 24...Flange, 2
5.25a. 25b...Metal mesh, 26...Electrostatic shield.

Claims (1)

【特許請求の範囲】[Claims] 1 真空中に配置した電極間で電子電流を流し、この電
子電流により生成したイオンをイオンコレクタよりイオ
ン電流として取り出すようにした真空度測定方法におい
て、真空中に配置した電極を静電シールドで覆い電極部
分より混入する雑音を除去する一力、前記電子電流を変
調すると共に、イオン電流の変調成分を増巾した後、電
子電流と同期させて検波し、該検波出力を低域P波器で
平滑した後、該平滑出力より真空度を求めることを特徴
とした真空度測定力法。
1 In a vacuum measurement method in which an electron current is passed between electrodes placed in a vacuum, and ions generated by this electron current are extracted from an ion collector as an ion current, the electrodes placed in a vacuum are covered with an electrostatic shield. One way to remove noise mixed in from the electrode part is to modulate the electron current and amplify the modulation component of the ion current, then detect it in synchronization with the electron current, and use the low-frequency P-wave detector to output the detected signal. A force method for measuring the degree of vacuum characterized by determining the degree of vacuum from the smoothed output after smoothing.
JP6449579A 1979-05-24 1979-05-24 Vacuum measurement method Expired JPS5945935B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6449579A JPS5945935B2 (en) 1979-05-24 1979-05-24 Vacuum measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6449579A JPS5945935B2 (en) 1979-05-24 1979-05-24 Vacuum measurement method

Publications (2)

Publication Number Publication Date
JPS55156825A JPS55156825A (en) 1980-12-06
JPS5945935B2 true JPS5945935B2 (en) 1984-11-09

Family

ID=13259833

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6449579A Expired JPS5945935B2 (en) 1979-05-24 1979-05-24 Vacuum measurement method

Country Status (1)

Country Link
JP (1) JPS5945935B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61145901U (en) * 1985-03-01 1986-09-09

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5991330A (en) * 1982-11-17 1984-05-26 Ulvac Corp Insulating type ionization gage
JP2540073B2 (en) * 1989-02-21 1996-10-02 アネルバ株式会社 Vacuum gauge
JP2696479B2 (en) * 1993-12-22 1998-01-14 有限会社小岩工業所 Level support

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61145901U (en) * 1985-03-01 1986-09-09

Also Published As

Publication number Publication date
JPS55156825A (en) 1980-12-06

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