JP2552407B2 - Method and apparatus for reinforcing outer peripheral portion of semiconductor wafer and reinforcing member - Google Patents
Method and apparatus for reinforcing outer peripheral portion of semiconductor wafer and reinforcing memberInfo
- Publication number
- JP2552407B2 JP2552407B2 JP25187591A JP25187591A JP2552407B2 JP 2552407 B2 JP2552407 B2 JP 2552407B2 JP 25187591 A JP25187591 A JP 25187591A JP 25187591 A JP25187591 A JP 25187591A JP 2552407 B2 JP2552407 B2 JP 2552407B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor wafer
- reinforcing member
- wafer
- reinforcing
- holding mechanism
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Mechanical Treatment Of Semiconductor (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は、半導体ウエハの外周部
の補強方法及び補強装置並びに補強部材に関する。さら
に詳しくは、半導体ウエハをその厚み巾の中心から内周
式スライサで2分割に切断する際に、半導体ウエハの外
周部の損傷等を防止するため、半導体ウエハの外周部の
切断終端付近に別個に形成した補強部材を接着剤で接着
取付けする半導体ウエハの外周部の補強方法の改良と、
この方法の実施に好適な補強装置と補強部材とに関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and apparatus for reinforcing an outer peripheral portion of a semiconductor wafer and a reinforcing member. More specifically, when the semiconductor wafer is cut into two parts by the inner peripheral slicer from the center of its thickness and width, in order to prevent the outer peripheral part of the semiconductor wafer from being damaged or the like, a separate part is provided near the cutting end of the outer peripheral part of the semiconductor wafer. Improving the method of reinforcing the outer peripheral portion of the semiconductor wafer by bonding and attaching the reinforcing member formed in the adhesive with an adhesive;
The present invention relates to a reinforcing device and a reinforcing member suitable for performing the method.
【0002】[0002]
【従来の技術】ディスクリート素子用基板を製造する際
に、両面に不純物の拡散層を有し中央に不純物の未拡散
層を有する半導体ウエハをその厚み巾の中心から内周式
スライサで2分割に切断する技術(特開平3−1457
26号等参照)や、この切断される半導体ウエハの外周
部の切断終端付近を補強する技術(特願平1−3222
22号等参照)については、本出願人によって先に多数
提案されている。2. Description of the Related Art When manufacturing a substrate for a discrete device, a semiconductor wafer having an impurity diffusion layer on both sides and an impurity non-diffusion layer in the center is divided into two parts from the center of its thickness with an inner peripheral slicer. Cutting technology (Japanese Patent Laid-Open No. 3-1457)
No. 26, etc.) and a technique for reinforcing the vicinity of the cutting end of the outer peripheral portion of the semiconductor wafer to be cut (Japanese Patent Application No. 1-3222).
No. 22, etc.) have been previously proposed by the present applicant in large numbers.
【0003】従来、半導体ウエハの外周部の切断終端付
近を補強する技術としては、例えば、多数枚の半導体ウ
エハを並設しておき、半導体ウエハとは別個に形成した
半導体ウエハと同数枚の補強部材に熱硬化性樹脂接着剤
を塗布して当接し、そのまま加熱処理して熱硬化性樹脂
接着剤を硬化させ半導体ウエハに補強部材を接着取付け
することが行われている。Conventionally, as a technique for reinforcing the periphery of the cutting edge of the semiconductor wafer, for example, a large number of semiconductor wafers are arranged side by side and the same number of reinforcements as the semiconductor wafers formed separately from the semiconductor wafers. A thermosetting resin adhesive is applied to and abutted on a member, and heat treatment is performed as it is to cure the thermosetting resin adhesive, and a reinforcing member is adhesively attached to a semiconductor wafer.
【0004】このような従来の補強手段では、多数枚の
半導体ウエハ,補強部材を同時的に処理するため、補強
部材の並設等手動で行なわなければならない工程が多く
補強部材の取付けが省力的に行なわれないという問題点
を有している。In such a conventional reinforcing means, since a large number of semiconductor wafers and reinforcing members are processed at the same time, there are many steps that must be carried out manually such as arranging the reinforcing members side by side, and the mounting of the reinforcing members is labor-saving. It has a problem that it is not done.
【0005】[0005]
【発明が解決しようとする課題】本発明は、前述の問題
点を考慮して成されたもので、半導体ウエハ1枚毎に精
密かつ効率的に連続して補強部材を取付けることのでき
る半導体ウエハの外周部の補強方法と、この方法の実施
に好適な補強装置と補強部材とを提供することを課題と
する。SUMMARY OF THE INVENTION The present invention has been made in consideration of the above-mentioned problems, and a semiconductor wafer to which a reinforcing member can be attached precisely and efficiently continuously for each semiconductor wafer. It is an object of the present invention to provide a method of reinforcing the outer peripheral portion of, and a reinforcing device and a reinforcing member suitable for carrying out this method.
【0006】[0006]
【課題を解決するための手段】前述の課題を解決するた
め、本発明に係る半導体ウエハの外周部の補強方法は、
両面に不純物の拡散層を有し中央に不純物の未拡散層を
有する半導体ウエハをその厚み巾の中心から内周式スラ
イサで2分割に切断する際に、半導体ウエハの外周部の
損傷等を防止するため、半導体ウエハの外周部の切断終
端付近に当接すべく別個に形成した補強部材を接着剤で
接着取付けする半導体ウエハの外周部の補強方法におい
て、半導体ウエハの外周の半分未満の弧長を有するよう
に形成され接着剤が塗布された1個の補強部材と1枚の
半導体ウエハとを垂直面内で接着した後、半導体ウエハ
を垂直面の下側に補強部材を垂直面の上側にした状態で
搬送しキャリアに収納する等の後続処理することを特徴
とする手段を採用する。In order to solve the above-mentioned problems, a method for reinforcing an outer peripheral portion of a semiconductor wafer according to the present invention comprises:
Prevents damage to the outer peripheral portion of the semiconductor wafer when a semiconductor wafer having impurity diffusion layers on both sides and an impurity non-diffusion layer in the center is cut into two parts with an inner peripheral slicer from the center of its thickness width. Therefore, in a method of reinforcing an outer peripheral portion of a semiconductor wafer, a separately formed reinforcing member is bonded and attached by an adhesive so as to come into contact with the vicinity of a cutting end of the outer peripheral portion of the semiconductor wafer. After adhering one reinforcing member formed so as to have an adhesive and one semiconductor wafer in a vertical plane, the semiconductor wafer is placed below the vertical plane and the reinforcing member is placed above the vertical plane. A means characterized by carrying out subsequent processing such as carrying in the above state and storing in a carrier is adopted.
【0007】また、本発明に係る半導体ウエハの外周部
の補強装置は、補強部材が取付けられていない未加工の
半導体ウエハを1枚づつ引渡し可能なウエハ供給部と、
補強部材が取付けられた加工済みの半導体ウエハを1枚
づつ引受け可能なウエハ回収部と、1個の補強部材と1
枚の半導体ウエハとを垂直面で夫々吸着し少なくとも1
80度回転可能な回転保持機構と、回転保持機構へ半導
体ウエハの外周の半分未満の弧長を有するように形成し
た補強部材を1個づつ供給する補強部材供給部と、回転
保持機構に吸着され回転する補強部材に対して接着剤を
塗布する塗布機構と、ウエハ供給部,回転保持機構,ウ
エハ回収部と連係して未加工,加工済みの半導体ウエハ
を搬送する搬送機構とからなる手段を採用する。[0007] Further, the apparatus for reinforcing an outer peripheral portion of a semiconductor wafer according to the present invention comprises: a wafer supply unit capable of transferring unprocessed semiconductor wafers to which a reinforcing member is not attached one by one;
A wafer recovery unit that can receive processed semiconductor wafers one by one with the reinforcing member attached, and one reinforcing member.
At least 1 by adsorbing each of the semiconductor wafers on the vertical plane
A rotation holding mechanism that can rotate 80 degrees, a reinforcing member supply unit that supplies to the rotation holding mechanism one by one a reinforcing member formed so as to have an arc length of less than half of the outer circumference of the semiconductor wafer, and the rotation holding mechanism is attracted to the rotation holding mechanism. Adopting a means consisting of a coating mechanism for applying an adhesive to the rotating reinforcing member, and a transfer mechanism for transferring an unprocessed and processed semiconductor wafer in cooperation with the wafer supply unit, the rotation holding mechanism, and the wafer recovery unit To do.
【0008】また、本発明に係る半導体ウエハの外周部
の補強部材は、半導体ウエハの外周の半分未満の弧長を
有して半導体ウエハの切断終端付近に当接可能で、断面
形状がL字形に形成され、弧長の中央部の外側に凸部が
形成されてなる手段を採用する。Further, the reinforcing member on the outer peripheral portion of the semiconductor wafer according to the present invention has an arc length less than half of the outer periphery of the semiconductor wafer and is capable of contacting near the cutting end of the semiconductor wafer, and has an L-shaped cross section. And a convex portion is formed outside the central portion of the arc length.
【0009】[0009]
【作用】前述の手段によると、本発明に係る半導体ウエ
ハの外周部の補強方法では、1枚の半導体ウエハと半導
体ウエハの外周の半分未満の弧長を有するように形成し
た1個の補強部材とを垂直面内で半導体ウエハまたは補
強部材の自重を利用して接着し、その後半導体ウエハを
垂直面の下側に補強部材を垂直面の上側にした状態とし
回転、搬送時に補強部材の脱落,ズレ等を防止して、搬
送キャリアへの回収等の後続処理することから、接着剤
に熱硬化性樹脂接着剤を使用する場合に、その接着剤が
未硬化であっても補強部材の取付け位置がズレたり、熱
硬化性樹脂接着剤が流れたりしないため、機械的手段で
連続的な補強処理が可能で、半導体ウエハ1枚毎に連続
して精密かつ効率的に補強部材を取付けることのできる
半導体ウエハの外周部の補強方法を提供するという課題
が解決される。According to the above-mentioned means, in the method of reinforcing the outer peripheral portion of the semiconductor wafer according to the present invention, one semiconductor wafer and one reinforcing member formed so as to have an arc length less than half of the outer periphery of the semiconductor wafer. Are bonded in the vertical plane by using the weight of the semiconductor wafer or the reinforcing member, and then the semiconductor wafer is rotated on the lower side of the vertical plane and the reinforcing member is on the upper side of the vertical plane. When the thermosetting resin adhesive is used as the adhesive, the position where the reinforcing member is attached is fixed even if the adhesive is uncured because it prevents misalignment and performs subsequent processing such as recovery to the carrier. Since there is no misalignment or the thermosetting resin adhesive does not flow, continuous reinforcement can be performed by mechanical means, and the reinforcement member can be attached accurately and efficiently continuously for each semiconductor wafer. Outside the semiconductor wafer Problems can be solved of providing a section method reinforcement.
【0010】また、本発明に係る半導体ウエハの外周部
の補強装置では、半導体ウエハ,補強部材を回転保持機
構で吸着回転させ、回転保持機構とウエハ供給部,ウエ
ハ回収部とを搬送機構で連係して未加工,加工済みの半
導体ウエハを搬送すると共に、回転保持機構に補強部材
が直接供給される補強部材供給部を備えてあることか
ら、ウエハ供給部の未加工の半導体ウエハを連続的に精
度良く補強処理してウエハ回収部に回収することができ
る。さらに、塗布機構によって、回転保持機構に吸着さ
れた補強部材が回転する間に補強部材に接着剤が塗布さ
れる。このため、前記方法の実施に好適な半導体ウエハ
の外周部の補強装置を提供するという課題が解決され
る。Further, in the reinforcing device for the outer peripheral portion of the semiconductor wafer according to the present invention, the semiconductor wafer and the reinforcing member are sucked and rotated by the rotation holding mechanism, and the rotation holding mechanism and the wafer supply unit and the wafer recovery unit are linked by the transfer mechanism. In addition to transporting the unprocessed and processed semiconductor wafers, the rotation holding mechanism is provided with a reinforcing member supply section to which the reinforcing member is directly supplied. It is possible to carry out the reinforcing process with high accuracy and collect the wafer in the wafer collecting section. Further, the applying mechanism applies the adhesive to the reinforcing member while the reinforcing member attracted to the rotation holding mechanism rotates. This solves the problem of providing an apparatus for reinforcing the outer peripheral portion of a semiconductor wafer suitable for carrying out the method.
【0011】また、本発明に係る半導体ウエハの外周部
の補強部材では、半導体ウエハの外周の半分未満の弧長
を有し断面形状がL字形に形成されていることから、接
着の際に半導体ウエハに当接しやすく自動的に位置決め
され、弧長の中央部の外側に凸部が形成されていること
から、半導体ウエハの2分割の際の回収作業が容易にな
る。このため、前記方法の実施に好適な半導体ウエハの
外周部の補強部材を提供するという課題が解決される。Further, since the reinforcing member on the outer peripheral portion of the semiconductor wafer according to the present invention has an arc length less than half of the outer periphery of the semiconductor wafer and an L-shaped cross-section, the semiconductor member is bonded at the time of bonding. Since it is easy to contact the wafer and is automatically positioned, and the convex portion is formed outside the central portion of the arc length, the recovery operation when the semiconductor wafer is divided into two becomes easy. This solves the problem of providing a reinforcing member for an outer peripheral portion of a semiconductor wafer suitable for performing the above method.
【0012】[0012]
【実施例】以下、本発明に係る半導体ウエハの外周部の
補強方法及び補強装置並びに補強部材の実施例を図面に
基いて説明する。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of a method for reinforcing an outer peripheral portion of a semiconductor wafer, a reinforcing device and a reinforcing member according to the present invention will be described below with reference to the drawings.
【0013】まず、本発明に係る半導体ウエハの外周部
の補強方法の実施例の基本概略を図1に基いて説明す
る。First, a basic outline of an embodiment of a method for reinforcing an outer peripheral portion of a semiconductor wafer according to the present invention will be described with reference to FIG.
【0014】図1(A)に示すように、半導体ウエハW
の外周の半分未満の弧長を有するように半導体ウエハW
とは別個に形成された1個の補強部材Pは、円弧内側面
に接着剤、例えば溶融ワックスあるいは熱硬化性樹脂接
着剤Eが塗布され垂直面の下側に固定される。この補強
部材Pに対して、図1(B)に示すように同一垂直面内
で1枚の半導体ウエハWを降下させると、半導体ウエハ
Wの自重により半導体ウエハW,補強部材Pを加圧接着
することができる。而後、図1(C)に示すように、半
導体ウエハW,補強部材Pを前記垂直面内で180度回
転させ、半導体ウエハW,補強部材Pの上下位置を逆に
すると、接着剤Eが直ちに硬化しないことによる補強部
材Pの脱落,位置ズレ等を防止することができる。即
ち、垂直面内において1枚の半導体ウエハWを1個の補
強部材Pに降下させてから半導体ウエハW,補強部材P
を共に180度回転するという連続的な動作を行なうこ
とで、半導体ウエハWへの補強部材Pの取付けを行なう
ことができる。なお、この後には、半導体ウエハW,補
強部材PをウエハキャリアCに収納して、常温放置また
は加熱処理により接着剤Eを硬化させることも自由であ
る。As shown in FIG. 1A, a semiconductor wafer W
Semiconductor wafer W having an arc length less than half of the outer circumference of
One reinforcing member P, which is formed separately from, is coated with an adhesive, for example, a molten wax or a thermosetting resin adhesive E on the inner surface of the arc, and fixed on the lower side of the vertical surface. When one semiconductor wafer W is lowered on the reinforcing member P in the same vertical plane as shown in FIG. 1B, the semiconductor wafer W and the reinforcing member P are pressure-bonded by the weight of the semiconductor wafer W. can do. Thereafter, as shown in FIG. 1C, when the semiconductor wafer W and the reinforcing member P are rotated 180 degrees in the vertical plane and the upper and lower positions of the semiconductor wafer W and the reinforcing member P are reversed, the adhesive E is immediately removed. It is possible to prevent the reinforcing member P from falling off, being displaced, and the like due to not being cured. That is, one semiconductor wafer W is dropped onto one reinforcing member P in the vertical plane, and then the semiconductor wafer W and the reinforcing member P are
The reinforcing member P can be attached to the semiconductor wafer W by performing a continuous operation in which both are rotated by 180 degrees. After this, the semiconductor wafer W and the reinforcing member P may be housed in the wafer carrier C, and the adhesive E may be cured by being left at room temperature or by heat treatment.
【0015】次に、前述の補強方法に使用されている補
強部材Pの詳細を図2,図3に基いて説明する。Next, details of the reinforcing member P used in the above-described reinforcing method will be described with reference to FIGS.
【0016】補強部材Pは、内周式スライサの切断性を
損なわず、成形加工が容易な合成樹脂、例えばポリスチ
レン樹脂又はエポキシ樹脂等で半導体ウエハWの外周の
半分未満の弧長を有して半導体ウエハWの切断終端付近
に当接可能な形状に形成されている。また、図2,図3
に示すように、弧長方向に直交する方向の断面形状がL
字形に形成され、2つの面Pa,Pbで半導体ウエハW
に当接し半導体ウエハWの位置決めが正確に行なわれる
ようになっている。さらに、図3に示すように、弧長の
中央部の外側に凸部Pcが形成され、内周式スライサに
よる切断の余裕域を確保して半導体ウエハWの2分割の
際の分割離脱片の回収タイミングの調整を可能にして、
回収作業が容易に行なわれるようにしている。The reinforcing member P is made of a synthetic resin, such as polystyrene resin or epoxy resin, which does not impair the cutting property of the inner peripheral type slicer and which is easily molded, and has an arc length less than half the outer periphery of the semiconductor wafer W. The semiconductor wafer W is formed in a shape that can be brought into contact with the vicinity of the cutting end of the wafer. 2 and 3
As shown in, the cross-sectional shape in the direction orthogonal to the arc length direction is L
The semiconductor wafer W is formed in a letter shape and has two surfaces Pa and Pb.
And the semiconductor wafer W is accurately positioned. Further, as shown in FIG. 3, a convex portion Pc is formed outside the central portion of the arc length, and a margin area for cutting by the inner peripheral slicer is ensured, so that the divided separation piece at the time of dividing the semiconductor wafer W into two pieces. Enables adjustment of collection timing,
The collection work is made easy.
【0017】次に、前述の補強方法に使用される補強装
置の実施例を図4〜図6に基いて説明する。Next, an embodiment of the reinforcing device used in the above-described reinforcing method will be described with reference to FIGS.
【0018】この実施例では、図4に示すように、中央
部には1枚の半導体ウエハW,1個の補強部材Pを吸着
して回転させる回転保持機構1が設置され、回転保持機
構1を挟んで両側に補強部材Pが取付けられていない未
加工の半導体ウエハWを1枚づつ引渡し可能なウエハ供
給部2と補強部材Pが取付けられた加工済みの半導体ウ
エハWを1枚づつ引受け可能なウエハ回収部3とが設置
され、これら回転保持機構1,ウエハ供給部2,ウエハ
回収部3の間に未加工,加工済み半導体ウエハWを搬送
する搬送機構4が直線的に配設されている。さらに、回
転保持機構には補強部材Pを1個づつ供給する補強部材
供給部5が搬送機構4と直交する方向に隣接設置され、
補強部材供給部5には接着剤Eを補強部材P塗布する塗
布機構6が上下方向に近接設置されている(図6参
照)。In this embodiment, as shown in FIG. 4, a rotation holding mechanism 1 for adsorbing and rotating one semiconductor wafer W and one reinforcing member P is installed in the central portion. The unprocessed semiconductor wafers W to which the reinforcing members P are not attached on both sides of the wafer sandwiching the wafer supply unit 2 and the processed semiconductor wafers W to which the reinforcing members P are attached can be received one by one. A wafer recovery unit 3 is installed, and a transfer mechanism 4 for transferring an unprocessed and processed semiconductor wafer W is linearly arranged between the rotation holding mechanism 1, the wafer supply unit 2, and the wafer recovery unit 3. There is. Further, the rotation holding mechanism is provided with the reinforcement member supply section 5 for supplying the reinforcement members P one by one, adjacent to each other in the direction orthogonal to the transport mechanism 4,
An application mechanism 6 for applying the adhesive E to the reinforcing member P is installed close to the reinforcing member supply unit 5 in the vertical direction (see FIG. 6).
【0019】回転保持機構1は、図5に詳細に示される
ように、1枚の半導体ウエハW,1個の補強部材Pを垂
直面で吸着するために垂直に設定された吸着盤11を備
えている。この吸着盤11は、ステッピングモータ12
を駆動源として、減速ギア13を介し低速で180度の
正逆往復回転するようになっている。また、この吸着盤
11には、補強部材Pを吸着する真空吸引系14と半導
体ウエハWを吸着する真空吸引系15とが互いに独立し
て設けられ、それらの各接続端をV1 、V2 で図示して
いる。さらに、この吸着盤11の前方の下端寄には、半
導体ウエハWの位置決め台16が設けられている。な
お、以上の各部は、ステッピングモータ(図示せず)に
より回転する送りネジ17でガイドレール18上を移動
する移動台19上に設置されている。As shown in detail in FIG. 5, the rotary holding mechanism 1 includes a suction plate 11 which is vertically set to suck one semiconductor wafer W and one reinforcing member P on a vertical surface. ing. This suction plate 11 is a stepping motor 12
Is used as a drive source and is rotated through the reduction gear 13 at a low speed in a forward / reverse reciprocation of 180 degrees. Further, the suction plate 11 is provided with a vacuum suction system 14 for sucking the reinforcing member P and a vacuum suction system 15 for sucking the semiconductor wafer W independently of each other, and connecting ends thereof are V 1 , V 2 respectively. It is illustrated in. Further, a positioning base 16 for the semiconductor wafer W is provided near the front lower end of the suction plate 11. Each of the above parts is installed on a moving table 19 which moves on a guide rail 18 by a feed screw 17 rotated by a stepping motor (not shown).
【0020】ウエハ供給部2は、未加工の半導体ウエハ
Wを並列させたウエハキャリアCを収納した受台21を
ステッピングモータ22により回転する送りネジ23で
ガイドレール24上を移動させ、各半導体ウエハWを一
定位置に順次位置させることができるようになってい
る。なお、未加工の半導体ウエハWの並列は、回転保持
機構1の吸着盤11と平行になっている。The wafer supply unit 2 moves a pedestal 21 accommodating a wafer carrier C in which unprocessed semiconductor wafers W are arranged side by side on a guide rail 24 by means of a feed screw 23 rotated by a stepping motor 22 to move each semiconductor wafer. The W can be sequentially positioned at a fixed position. The unprocessed semiconductor wafers W are arranged in parallel with the suction plate 11 of the rotation holding mechanism 1.
【0021】ウエハ回収部3は、ウエハ供給部2と同様
に受台31,ステッピングモータ32,送りネジ33,
ガイドレール34からなる構造で、加工済みの半導体ウ
エハWを一定位置で順次引受けウエハキャリアC内に並
列させることができるようになっている。なお、加工済
みの半導体ウエハWの並列は、回転保持機構1の吸着盤
11と平行になっている。The wafer recovery unit 3 is similar to the wafer supply unit 2 in that the pedestal 31, the stepping motor 32, the feed screw 33,
With the structure including the guide rails 34, the processed semiconductor wafers W can be sequentially arranged in parallel in the underwriting wafer carrier C at certain positions. The processed semiconductor wafers W are arranged in parallel with the suction plate 11 of the rotation holding mechanism 1.
【0022】搬送機構4は、ロッドレスシリンダを利用
したもので、ウエハ供給部2,ウエハ回収部3と回転保
持機構1との間隔に対応した間隔を介して一対の吸着パ
ッド41,42を備えている。これ等吸着パッド41,
42には昇降用のエアシリンダ43,44と水平移動用
のエアシリンダ45,46とが設けられ(図4、図7〜
16)、両吸着パッド41,42が搬送機構4のピスト
ンマウント(移動体)47により配設方向へ一体的に水
平移動することができると共に、各吸着パッド41,4
2が夫々独立して配設方向と直交する方向へ水平移動し
また昇降移動することができるようになっている。即
ち、一方の吸着パッド41で未加工の半導体ウエハWを
ウエハ供給部2から取出して回転保持機構1に渡し、他
方の吸着パッド42で加工済みの半導体ウエハWを回転
保持機構1から取出してウエハ回収部3に渡すことがで
きるようになっている。The transfer mechanism 4 uses a rodless cylinder, and is provided with a pair of suction pads 41, 42 with a space corresponding to the space between the wafer supply unit 2, the wafer recovery unit 3 and the rotation holding mechanism 1. ing. These suction pads 41,
42 is provided with air cylinders 43 and 44 for raising and lowering and air cylinders 45 and 46 for horizontally moving (FIGS. 4 and 7 to 7).
16), both suction pads 41, 42 can be horizontally moved integrally in the arrangement direction by the piston mount (moving body) 47 of the transport mechanism 4, and each suction pad 41, 4 can be moved.
Each of the two can independently move horizontally in a direction orthogonal to the arrangement direction and can move up and down. That is, the unprocessed semiconductor wafer W is taken out from the wafer supply unit 2 by one suction pad 41 and transferred to the rotation holding mechanism 1, and the processed semiconductor wafer W is taken out from the rotation holding mechanism 1 by the other suction pad 42 and the wafer is held. It can be handed over to the collection unit 3.
【0023】補強部材供給部5は、図6に詳細に示され
るように、回転保持機構の吸着盤11と対面するように
設けられ、多数個の補強部材Pを凸部Pcを上側にしL
字形の面Pa,Pbの反対側を回転保持機構の吸着盤1
1に向けて収納し、ステッピングモータ51により回転
される送りネジ52に螺着したナット形の移動子53に
よって、補強部材Pを1個づつ回転保持機構の吸着盤1
1の上側に送出すようになっている。As shown in detail in FIG. 6, the reinforcing member supply section 5 is provided so as to face the suction plate 11 of the rotation holding mechanism, and a large number of reinforcing members P are arranged with the convex portion Pc on the upper side.
The suction plate 1 of the rotation holding mechanism is provided on the opposite side of the character-shaped surfaces Pa and Pb.
1 and the nut-shaped moving element 53 screwed to the feed screw 52 which is rotated by the stepping motor 51 to attach the reinforcing members P one by one to the suction plate 1 of the rotation holding mechanism.
It is designed to be sent to the upper side of 1.
【0024】塗布機構6は、図6に詳細に示されるよう
に、補強部材供給部5の下側に設け接着剤Eを吐出する
ノズル61と、ノズル61の位置を調整する調整部62
とを備えている。このノズル61は、回転保持機構1の
吸着盤11の上側に吸着された補強部材Pが下側へ回転
する間に接着剤Eを塗布することができるようになって
いる。なお、ノズル61よりの接着剤Eの吐出タイミン
グに正確を期するため、投光部71,受光部72からな
る光検出装置7が補強部材Pの回転状態を検出できるよ
うに設置されている。As shown in detail in FIG. 6, the coating mechanism 6 has a nozzle 61 provided below the reinforcing member supply section 5 for discharging the adhesive E, and an adjusting section 62 for adjusting the position of the nozzle 61.
It has and. The nozzle 61 can apply the adhesive E while the reinforcing member P attracted to the upper side of the suction plate 11 of the rotation holding mechanism 1 rotates downward. In order to ensure the timing of discharging the adhesive E from the nozzle 61, the photodetector 7 including the light projecting portion 71 and the light receiving portion 72 is installed so as to detect the rotating state of the reinforcing member P.
【0025】以下、図7〜図15に基いた前述の補強装
置の実施例の動作の説明と共に、補強方法の詳細な実施
例を説明する。なお、図7〜図15の(A)は回転保持
機構1の吸着盤11と補強部材供給部5との位置関係を
示すものであり、(B)は補強部材P,半導体ウエハW
と回転保持機構1の吸着盤11との関係を示すものであ
り、(C)は回転保持機構1,ウエハ供給部2,ウエハ
回収部3と搬送機構4との連係関係を示すものである。Hereinafter, a detailed embodiment of the reinforcing method will be described together with the operation of the embodiment of the reinforcing device described above based on FIGS. 7 to 15. 7 to 15 show the positional relationship between the suction plate 11 of the rotation holding mechanism 1 and the reinforcing member supply section 5, and (B) shows the reinforcing member P and the semiconductor wafer W.
And (C) shows the relationship between the rotation holding mechanism 1, the wafer supply unit 2, the wafer collecting unit 3, and the transfer mechanism 4.
【0026】図7では、回転保持機構1による半導体ウ
エハWへの補強部材Pの取付けが完了し、搬送機構4の
一方の吸着パッド41によって未加工の一枚の半導体ウ
エハWがウエハ供給部2から取出されて回転保持機構1
上で待機し、搬送機構4の他方の吸着パッド42によっ
て加工済みの1枚の半導体ウエハWが回転保持機構1か
ら取出されてウエハ回収部3で待機している状態が示さ
れている。In FIG. 7, the mounting of the reinforcing member P on the semiconductor wafer W by the rotation holding mechanism 1 is completed, and one unprocessed semiconductor wafer W is transferred to the wafer supply unit 2 by one suction pad 41 of the transfer mechanism 4. Rotation holding mechanism 1 taken out from
A state is shown in which the semiconductor wafer W that is on standby above and processed by the other suction pad 42 of the transfer mechanism 4 is taken out from the rotation holding mechanism 1 and is on standby in the wafer recovery unit 3.
【0027】この図7の状態から、前記待機を保持し
て、まず図8に示すように回転保持機構1の吸着盤11
を補強部材供給部5に近接させ1個の補強部材Pを受取
り吸着し、次に図9〜図11に示すように吸着盤11を
180度回転させながら塗布機構6により補強部材Pに
接着剤Eを塗布する。From the state of FIG. 7, the standby is held, and first, as shown in FIG. 8, the suction plate 11 of the rotation holding mechanism 1 is held.
To the reinforcing member supply section 5 to receive and adsorb one reinforcing member P, and then, as shown in FIGS. Apply E.
【0028】而後、図12に示すように、前記待機を解
除して、搬送機構4の他方の吸着パッド42によって吸
着されている加工済みの半導体ウエハWをウエハ回収部
3に引渡すと共に、搬送機構4の一方の吸着パッド41
によって吸着されている未加工の半導体ウエハWを一端
回転保持機構1の位置決め台16に微小落下させてか
ら、水平移動用のエアシリンダ45で半導体ウエハWを
補強部材Pに嵌合するようにする。この結果、半導体ウ
エハWの自重により半導体ウエハWは,真空保持されて
いる補強部材Pに加圧接着される状態になる。After that, as shown in FIG. 12, the standby is released, and the processed semiconductor wafer W attracted by the other suction pad 42 of the transfer mechanism 4 is delivered to the wafer recovery unit 3 and the transfer mechanism is transferred. 4 one suction pad 41
The unprocessed semiconductor wafer W adsorbed by is slightly dropped onto the positioning table 16 of the one-time rotation holding mechanism 1, and then the semiconductor wafer W is fitted to the reinforcing member P by the air cylinder 45 for horizontal movement. . As a result, the weight of the semiconductor wafer W causes the semiconductor wafer W to be pressure-bonded to the reinforcing member P held in vacuum.
【0029】このように半導体ウエハWへ補強部材Pを
一応取付けた後には、図13に示すように一般的には接
着剤Eが未だ硬化していないため補強部材P及び半導体
ウエハWを真空保持したまま直ちに回転保持機構1の吸
着盤11を180度逆回転させ、半導体ウエハW,補強
部材Pの上下位置を逆転させて、図14に示すように加
工済みウエハ及び未加工ウエハを吸着し、図15に示す
ように上昇した後、図中左方へ移動して再び図7の状態
に戻る。After the reinforcing member P is once attached to the semiconductor wafer W in this manner, the reinforcing member P and the semiconductor wafer W are held in vacuum because the adhesive E is generally not yet cured as shown in FIG. Then, the suction plate 11 of the rotary holding mechanism 1 is immediately rotated in the reverse direction by 180 degrees to reverse the upper and lower positions of the semiconductor wafer W and the reinforcing member P to suck the processed wafer and the unprocessed wafer as shown in FIG. After rising as shown in FIG. 15, it moves to the left in the figure and returns to the state of FIG. 7 again.
【0030】[0030]
【発明の効果】以上のように本発明に係る半導体ウエハ
の外周部の補強方法は、1枚の半導体ウエハと1個の補
強部材とを垂直面内で接着し、垂直面内で半導体ウエハ
を下側に補強部材を上側にする位置設定を行なうことか
ら、接着剤に熱硬化性樹脂接着剤を使用する場合でも、
その接着剤の硬化時間を待たずして連続的な動作が可能
で、補強部材の位置ズレ等が防止され取付け精度が良好
になるため、半導体ウエハ1枚毎に連続して精密かつ効
率的に補強部材を取付けることができる効果がある。As described above, in the method of reinforcing the outer peripheral portion of the semiconductor wafer according to the present invention, one semiconductor wafer and one reinforcing member are bonded in the vertical plane, and the semiconductor wafer is bonded in the vertical plane. Since the position is set so that the reinforcing member is on the lower side, even if a thermosetting resin adhesive is used as the adhesive,
Continuous operation is possible without waiting for the curing time of the adhesive, and displacement of the reinforcing member is prevented, and mounting accuracy is improved. Therefore, each semiconductor wafer can be continuously and accurately and efficiently. There is an effect that a reinforcing member can be attached.
【0031】さらに、本発明に係る半導体ウエハの外周
部の補強装置は、前記方法を実施する各部機構を備えて
前記効果の達成に寄与すると共に、半導体ウエハ,補強
部材を吸着回転する回転保持機構を中心として各部機構
が配置されているため全体がコンパクト化され、また補
強部材の回転を利用して接着剤を塗布するため補強部材
の取付け効率が非常に良好となる効果がある。Further, the apparatus for reinforcing the outer peripheral portion of the semiconductor wafer according to the present invention is provided with each part mechanism for carrying out the method to contribute to the achievement of the above-mentioned effect, and at the same time, the rotation holding mechanism for sucking and rotating the semiconductor wafer and the reinforcing member. Since the respective mechanisms are arranged centering around, the whole is made compact, and since the adhesive is applied by utilizing the rotation of the reinforcing member, there is an effect that the mounting efficiency of the reinforcing member becomes very good.
【0032】さらに、本発明に係る半導体ウエハの外周
部の補強部材は、断面L字形の構造により前記方法を実
施するに半導体ウエハへの当接性を高め前記効果の達成
に寄与すると共に、内周式スライサによる2分割の際の
回収作業を容易にする効果がある。Further, the reinforcing member on the outer peripheral portion of the semiconductor wafer according to the present invention has a structure having an L-shaped cross section to enhance the contact property with the semiconductor wafer when the method is carried out and contribute to the achievement of the above-mentioned effect. This has the effect of facilitating the recovery work when dividing into two by the circumferential slicer.
【図1】 本発明に係る半導体ウエハの外周部の補強方
法の実施例を示す簡略図で、(A)〜(C)の順に工程
を示すものである。FIG. 1 is a simplified diagram showing an embodiment of a method for reinforcing an outer peripheral portion of a semiconductor wafer according to the present invention, showing steps in the order of (A) to (C).
【図2】 本発明に係る半導体ウエハの外周部の補強部
材の実施例を示すもので、図1(A)のX−X線断面図
である。FIG. 2 is a sectional view taken along line XX of FIG. 1A, showing an embodiment of a reinforcing member on the outer peripheral portion of a semiconductor wafer according to the present invention.
【図3】 図2と同様に、図1(A)のY−Y線断面図
である。FIG. 3 is a sectional view taken along line YY of FIG. 1A, like FIG.
【図4】 本発明に係る半導体ウエハの外周部の補強装
置の実施例を示す平面図である。FIG. 4 is a plan view showing an embodiment of a reinforcing device for an outer peripheral portion of a semiconductor wafer according to the present invention.
【図5】 図4の要部の断面図である。5 is a cross-sectional view of a main part of FIG.
【図6】 図4の他の要部の断面図である。6 is a cross-sectional view of another main part of FIG.
【図7】 本発明に係る半導体ウエハの外周部の補強装
置の実施例の動作を示す下略図である。FIG. 7 is a schematic bottom view showing the operation of the embodiment of the reinforcing device for the outer peripheral portion of the semiconductor wafer according to the present invention.
【図8】 図7に続く動作の簡略図である。8 is a simplified diagram of the operation following FIG. 7. FIG.
【図9】 図8に続く動作の簡略図である。9 is a simplified diagram of the operation following FIG. 8. FIG.
【図10】 図9に続く動作の簡略図である。FIG. 10 is a simplified diagram of the operation following FIG. 9.
【図11】 図10に続く動作の簡略図である。FIG. 11 is a simplified diagram of the operation following FIG. 10.
【図12】 図11に続く動作の簡略図である。FIG. 12 is a simplified diagram of the operation following FIG. 11.
【図13】 図12に続く動作の簡略図である。FIG. 13 is a simplified diagram of the operation following FIG. 12.
【図14】 図13に続く動作の簡略図である。14 is a simplified diagram of the operation following FIG. 13. FIG.
【図15】 図14に続く動作の簡略図である。15 is a simplified diagram of the operation following FIG. 14. FIG.
1 回転保持機構 2 ウエハ供給部 3 ウエハ回収部 4 搬送機構 5 補強部材供給部 6 塗布機構 P 補強部材 W 半導体ウエハ DESCRIPTION OF SYMBOLS 1 Rotation holding mechanism 2 Wafer supply part 3 Wafer collection part 4 Transfer mechanism 5 Reinforcement member supply part 6 Coating mechanism P Reinforcement member W Semiconductor wafer
Claims (3)
物の未拡散層を有する半導体ウエハをその厚み巾の中心
から内周式スライサで2分割に切断する際に、半導体ウ
エハの外周部の損傷等を防止するため、半導体ウエハの
外周部の切断終端付近に当接すべく別個に形成した補強
部材を接着剤で接着取付けする半導体ウエハの外周部の
補強方法において、半導体ウエハの外周の半分未満の弧
長を有するように形成され接着剤が塗布された1個の補
強部材と1枚の半導体ウエハとを垂直面内で接着した
後、半導体ウエハを垂直面の下側に補強部材を垂直面の
上側にした状態で後続処理することを特徴とする半導体
ウエハの外周部の補強方法。1. An outer peripheral portion of a semiconductor wafer when a semiconductor wafer having an impurity diffusion layer on both sides and an impurity non-diffusion layer in the center is cut into two parts with an inner peripheral slicer from the center of its thickness width. In order to prevent damage to the outer periphery of the semiconductor wafer, a method of reinforcing the outer periphery of the semiconductor wafer is described. After adhering one semiconductor wafer and a single reinforcing member formed to have an arc length of less than half and coated with an adhesive in a vertical plane, the semiconductor wafer is attached to the lower side of the vertical plane. A method of reinforcing the outer peripheral portion of a semiconductor wafer, characterized in that the subsequent processing is performed in a state of being on the upper side of the vertical surface.
半導体ウエハを1枚づつ引渡し可能なウエハ供給部と、
補強部材が取付けられた加工済みの半導体ウエハを1枚
づつ引受け可能なウエハ回収部と、1個の補強部材と1
枚の半導体ウエハとを垂直面で夫々吸着し少なくとも1
80度回転可能な回転保持機構と、回転保持機構へ半導
体ウエハの外周の半分未満の弧長を有するように形成し
た補強部材を1個づつ供給する補強部材供給部と、回転
保持機構に吸着され回転する補強部材に対して接着剤を
塗布する塗布機構と、ウエハ供給部,回転保持機構,ウ
エハ回収部と連係して未加工,加工済みの半導体ウエハ
を搬送する搬送機構とからなる半導体ウエハの外周部の
補強装置。2. A wafer supply unit capable of delivering unprocessed semiconductor wafers to which no reinforcing member is attached one by one,
A wafer recovery unit that can receive processed semiconductor wafers one by one with the reinforcing member attached, and one reinforcing member.
At least 1 by adsorbing each of the semiconductor wafers on the vertical plane
A rotation holding mechanism that can rotate by 80 degrees, a reinforcement member supply unit that supplies to the rotation holding mechanism one by one a reinforcement member formed so as to have an arc length of less than half of the outer circumference of the semiconductor wafer, and the rotation holding mechanism is attracted to the rotation holding mechanism. A semiconductor wafer including a coating mechanism that applies an adhesive to a rotating reinforcing member, and a transfer mechanism that transfers an unprocessed and processed semiconductor wafer in cooperation with a wafer supply unit, a rotation holding mechanism, and a wafer recovery unit. Reinforcement device on the outer periphery.
有して半導体ウエハの切断終端付近に当接可能で、断面
形状がL字形に形成され、弧長の中央部の外側に凸部が
形成されてなる半導体ウエハの外周部の補強部材。3. A semiconductor wafer having an arc length less than half of the outer circumference, capable of abutting near the cutting end of the semiconductor wafer, having an L-shaped cross section, and having a convex portion outside the center of the arc length. Reinforcing member for the outer peripheral portion of the semiconductor wafer formed with.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25187591A JP2552407B2 (en) | 1991-09-30 | 1991-09-30 | Method and apparatus for reinforcing outer peripheral portion of semiconductor wafer and reinforcing member |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25187591A JP2552407B2 (en) | 1991-09-30 | 1991-09-30 | Method and apparatus for reinforcing outer peripheral portion of semiconductor wafer and reinforcing member |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0590233A JPH0590233A (en) | 1993-04-09 |
| JP2552407B2 true JP2552407B2 (en) | 1996-11-13 |
Family
ID=17229236
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25187591A Expired - Fee Related JP2552407B2 (en) | 1991-09-30 | 1991-09-30 | Method and apparatus for reinforcing outer peripheral portion of semiconductor wafer and reinforcing member |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2552407B2 (en) |
-
1991
- 1991-09-30 JP JP25187591A patent/JP2552407B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0590233A (en) | 1993-04-09 |
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