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JP2595536B2 - Electrophotographic photoreceptor - Google Patents
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JP2595536B2 - Electrophotographic photoreceptor - Google Patents

Electrophotographic photoreceptor

Info

Publication number
JP2595536B2
JP2595536B2 JP62110214A JP11021487A JP2595536B2 JP 2595536 B2 JP2595536 B2 JP 2595536B2 JP 62110214 A JP62110214 A JP 62110214A JP 11021487 A JP11021487 A JP 11021487A JP 2595536 B2 JP2595536 B2 JP 2595536B2
Authority
JP
Japan
Prior art keywords
layer
charge transfer
electrophotographic photoreceptor
transfer layer
photoconductive layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62110214A
Other languages
Japanese (ja)
Other versions
JPS63274959A (en
Inventor
京子 尾道
栄一郎 田中
昭雄 滝本
浩二 秋山
正則 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62110214A priority Critical patent/JP2595536B2/en
Publication of JPS63274959A publication Critical patent/JPS63274959A/en
Application granted granted Critical
Publication of JP2595536B2 publication Critical patent/JP2595536B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/06Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being organic
    • G03G5/07Polymeric photoconductive materials
    • G03G5/075Polymeric photoconductive materials obtained otherwise than by reactions only involving carbon-to-carbon unsaturated bonds

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photoreceptors In Electrophotography (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、電子写真方式の複写機,光プリンタ等に用
いられる電子写真感光体に関するものである。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electrophotographic photosensitive member used for an electrophotographic copying machine, an optical printer and the like.

従来の技術 電子写真感光体における光導電体として、10〜40atm
%の水素を局在化状態密度を減少せしめる修飾物質とし
て含む非晶質シリコン(以下a−Si:Hと記す)が高い光
感度、無公害性、及び高い硬度を有することにより注目
され利用されている。
Conventional technology 10 to 40 atm as photoconductor in electrophotographic photoreceptor
% Of hydrogen as a modifier to reduce the localized state density (hereinafter referred to as a-Si: H) has been noticed and used because of its high photosensitivity, pollution-free properties, and high hardness. ing.

しかしながら、上記のa−Si:Hで構成される電子写真
感光体ではまだまだ解決すべき問題も多い。
However, there are still many problems to be solved in the electrophotographic photosensitive member composed of a-Si: H.

例えば、第1の問題としてa−Si:Hは、他の感光体材
料である有機光半導体(以下OPCと記す)、あるいはセ
レン(Se)に比較して誘電率が約11と大きく(OPC:約
3、Se:約6)静電容量が大きいため、表面への帯電処
理を行う際には非常に大きな帯電電流を必要とする。
For example, as a first problem, a-Si: H has a dielectric constant as large as about 11 as compared with other photoconductor materials such as organic optical semiconductor (hereinafter referred to as OPC) or selenium (Se) (OPC: (Approximately 3, Se: approximately 6) Since the capacitance is large, a very large charging current is required when the surface is charged.

また、実用表面電位(〜400V)を得るには表面電荷の
電荷密度も高く、この電荷を光除電するためには多くの
光エネルギーを必要とするため、実際の光感度は十分高
いとは言えない。
In addition, to obtain a practical surface potential (up to 400 V), the charge density of the surface charge is high, and a large amount of light energy is required to remove the charge with light. Therefore, it can be said that the actual light sensitivity is sufficiently high. Absent.

さらに、第2の問題としてa−Si:H膜の製膜に際して
最も良く用いられるシラン(SiH4と記す)ガスを原料ガ
スとしたプラズマCVD法では、堆積速度も10μm/h以下と
遅く、シランガスも高価であることから、製造コストの
低減は困難である。
Further, as a second problem, in a plasma CVD method using a silane (hereinafter referred to as SiH 4 ) gas as a source gas, which is most often used in forming an a-Si: H film, a deposition rate is as low as 10 μm / h or less, and a silane gas is used. Is also expensive, so it is difficult to reduce the manufacturing cost.

また、第3の問題は、膜厚においても30μm以下で使
用されることが多く帯電電界強度も30V/μm程度から、
実用の表面電位はSe感光体の800Vに比べ500V以下と低い
電位で使用されるため、通常の2成分現像剤では十分な
画像濃度のコピーが得られないと言った問題がある。
The third problem is that the film thickness is often less than 30 μm, and the charging electric field strength is about 30 V / μm.
Since a practical surface potential is used at a lower potential of 500 V or less than 800 V of the Se photoreceptor, there is a problem that a copy with a sufficient image density cannot be obtained with a normal two-component developer.

このような諸問題を解決する手段として、特開昭54−
143645号公報には有機半導体材料を用いた機能分離型の
感光体の構成が開示されている。
As means for solving such problems, Japanese Patent Laid-Open No.
No. 143645 discloses a configuration of a function-separated type photoconductor using an organic semiconductor material.

発明が解決しようとする問題点 この有機半導体材料を用いた光導電層を像形成物とし
て用いた場合、誘電率の減少による帯電電位の向上が望
めるものの有機半導体材料は硬度が小さいため、Siを含
む非晶質光導電膜の持つ高い硬度の長寿命感光体として
の特長が生かせない。また、従来の有機半導体上に温度
150℃以上で良質なa−Si:H膜を形成するには耐熱性に
乏しいため良好な電子写真感光体が得られない。あるい
は、耐熱性を有するポリアクリロニトリル(PAN)を加
熱処理を行うことも提案されているが、十分はキャリア
の移動度、キャリア寿命のものが得られていないため、
残留電位が高く、感度も十分とは言えないという問題が
あった。
Problems to be Solved by the Invention When a photoconductive layer using this organic semiconductor material is used as an image forming material, an improvement in the charging potential due to a decrease in the dielectric constant can be expected, but since the organic semiconductor material has a small hardness, Si is used. The feature as a long-life photoreceptor having high hardness possessed by an amorphous photoconductive film containing the same cannot be utilized. In addition, temperature on conventional organic semiconductors
In order to form a high-quality a-Si: H film at 150 ° C. or higher, a good electrophotographic photosensitive member cannot be obtained because of poor heat resistance. Alternatively, heat treatment of polyacrylonitrile (PAN) having heat resistance has also been proposed, but since sufficient carrier mobility and carrier lifetime have not been obtained,
There was a problem that the residual potential was high and the sensitivity was not sufficient.

本発明は上記従来の問題点を解決するもので、残留電
位が高く、かつ十分な感度を得られる写真感光体を提供
することを目的とするものである。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned conventional problems, and an object of the present invention is to provide a photographic photoreceptor having a high residual potential and sufficient sensitivity.

問題点を解決するための手段 上記目的を達成するために、本発明の写真感光体は、
光励起によって移動可能なキャリアを発生する光導電層
と、結晶化度10〜70%のポリ(P−フェニレンビニレ
ン)もしくはポリフェニレンサルファイドにより形成し
た電荷移動層を有するものである。
Means for Solving the Problems In order to achieve the above object, the photographic photoreceptor of the present invention comprises:
It has a photoconductive layer that generates carriers that can move by photoexcitation, and a charge transfer layer formed of poly (P-phenylenevinylene) or polyphenylene sulfide having a crystallinity of 10 to 70%.

作 用 ポリ(P−フェニレンビニレン)もしくはポリフェニ
レンサルファイドにより電荷移動層を形成する際、その
結晶化度が高すぎる場合、すなわち70%を超える場合、
その抵抗値が低くなり電子写真感光体として要求される
暗時の帯電保持能が低くなるとともに、機械的強度が低
下し製膜性が著しく低下する。また結晶化度が10%より
低いものに関しては、十分な抵抗値を有するが、トラッ
プ密度が増加し、注入された電荷が効率よく輸送されな
い。そしてポリ(P−フェニレンビニレン)もしくはポ
リフェニレンサルファイドにより電荷移動層を形成する
際、その結晶化度を10〜70%とすることにより、残留電
位の小さな、高感度で帯電電位の大きな電子写真感光体
が得られる。
When the charge transfer layer is formed of poly (P-phenylene vinylene) or polyphenylene sulfide, if the crystallinity is too high, that is, if it exceeds 70%,
The resistance value is lowered, the charge retention ability in the dark required for an electrophotographic photoreceptor is lowered, and the mechanical strength is reduced, so that the film forming property is remarkably reduced. Further, those having a crystallinity lower than 10% have a sufficient resistance value, but the trap density increases, and the injected charge is not efficiently transported. When the charge transfer layer is formed of poly (P-phenylenevinylene) or polyphenylene sulfide, the crystallinity of the charge transfer layer is set to 10 to 70%, so that the electrophotographic photoreceptor having a small residual potential, a high sensitivity and a large charge potential. Is obtained.

実施例 第1図は、本発明における最も基本的な電子写真感光
体の一実施例の断面を模式的に示したものである。
Embodiment FIG. 1 schematically shows a cross section of an embodiment of the most basic electrophotographic photosensitive member according to the present invention.

第1図に示す電子写真感光体は、支持体1上に、環構
造を有する高分子層からなる電荷移動層2と光導電層3
とを有し、前記光導電層3は一方で自由表面4を有して
いる。
The electrophotographic photoreceptor shown in FIG. 1 has a charge transfer layer 2 composed of a polymer layer having a ring structure and a photoconductive layer 3 on a support 1.
The photoconductive layer 3 has a free surface 4 on the one hand.

本発明において、光導電層3として硬度の高いシリコ
ンを含有する非晶質層を用い、光導電層3は、a−S
i(:H:X),a−Si1-yCy(:H:X)(O<y<1),a−Si
1-yOy(:H:X)(O<y<1),a−Si1-yNy(:H:X)(O
<y<1),a−Si1-zGez(:H:X)(O<z<1),a−
(Si1-zGez1-yNy(:H:X)(O<y,z<1),a−(Si
1-zGez1-yOy(:H:X)(O<y,z<1),またはa−
(Si1-zGez1-yCy(:H:X)(O<y,z<1)の単層、あ
るいはこれらの積層からなる。また、yを連続的に変化
させた場合も使用できる。
In the present invention, an amorphous layer containing silicon having high hardness is used as the photoconductive layer 3, and the photoconductive layer 3 is made of a-S
i (: H: X), a-Si 1-y C y (: H: X) (O <y <1), a-Si
1-y O y (: H: X) (O <y <1), a-Si 1-y N y (: H: X) (O
<Y <1), a-Si 1-z Ge z (: H: X) (O <z <1), a-
(Si 1-z Ge z ) 1-y N y (: H: X) (O <y, z <1), a− (Si
1-z Ge z ) 1-y O y (: H: X) (O <y, z <1) or a-
It consists of a single layer of (Si 1-z Ge z ) 1-y C y (: H: X) (O <y, z <1) or a laminate of these. Further, it is also possible to use a case where y is continuously changed.

この時の膜厚は、電荷移動層は5〜50μm好適には10
〜25μm、また光導電層の膜厚は0.5〜10μm好適には
1〜5μmとすれば良い。
At this time, the thickness of the charge transfer layer is 5 to 50 μm, preferably 10 μm.
The thickness of the photoconductive layer may be 0.5-10 μm, preferably 1-5 μm.

本発明において、更に電子写真特性を向上させるため
に、第1図において、支持体1と電荷移動層2との間
に、支持体1から電荷移動層2に注入するキャリアを効
果的に阻止するため障壁層を設けてもよい。
In the present invention, in order to further improve the electrophotographic characteristics, in FIG. 1, between the support 1 and the charge transfer layer 2, carriers injected from the support 1 into the charge transfer layer 2 are effectively blocked. Therefore, a barrier layer may be provided.

障壁層を形成する材料としては、Al2O3,BaO,BaO2,Be
O,Bi2O3,CaO,CeO2,Ce2O3,La2O3,Dy2O3,Lu2O3,Cr2O3,Cu
O,Cu2O,FeO,PbO,MgO,SrO,Ta2O3,ThO2,ZrO2,HfO2,TiO2,T
iO,SiO2,GeO2,SiO,GeO等の金属酸化物、またはTiN,AlN,
SnN,NbN,TaN,GaN等の金属窒化物、またはWC,SnC,TiC等
の金属炭化物またはSiC,SiN,GeC,GeN,BC,BN等の絶縁
物、ポリイミド,ポリアミドイミド,ポリアクリルニト
リル等の有機化合物が使用される。
As a material for forming the barrier layer, Al 2 O 3 , BaO, BaO 2 , Be
O, Bi 2 O 3 , CaO, CeO 2 , Ce 2 O 3 , La 2 O 3 , Dy 2 O 3 , Lu 2 O 3 , Cr 2 O 3 , Cu
O, Cu 2 O, FeO, PbO, MgO, SrO, Ta 2 O 3 , ThO 2 , ZrO 2 , HfO 2 , TiO 2 , T
Metal oxides such as iO, SiO 2 , GeO 2 , SiO, GeO, or TiN, AlN,
Metal nitrides such as SnN, NbN, TaN, and GaN; metal carbides such as WC, SnC, and TiC; insulators such as SiC, SiN, GeC, GeN, BC, and BN; polyimide, polyamideimide, and polyacrylonitrile Organic compounds are used.

また、クリーニング性あるいは耐摩耗性あるいは耐コ
ロナ性を向上させるため、自由表面4上に表面被覆層を
形成してもよい。表面被覆層として好適な材料として
は、SixO1-x,SixC1-x,SixN1-x,GexO1-x,GexC1-x,GexN
1-x,BxN1-x,BxC1-x,AlxN1-x(O<<1)、およびこ
れらに水素あるいはハロゲンを含有する層等の無機物な
どが上げられる。
Further, a surface coating layer may be formed on the free surface 4 in order to improve the cleaning property, the wear resistance or the corona resistance. Materials suitable for the surface coating layer include Si x O 1-x , Si x C 1-x , Si x N 1-x , Ge x O 1-x , Ge x C 1-x , Ge x N
1-x , B x N 1-x , B x C 1-x , Al x N 1-x (O < x <1), and inorganic substances such as a layer containing hydrogen or halogen therein.

シリコンを含有する光導電層であるa−Si(:H:X)の
作成には、SiH4,Si2H6,Si3H8,SiF4,SiCl4,SiHF3,SiH
2F2,SiH3F,SiHCl3,SiH2Cl2,SiH3Cl等のSi原子の原料ガ
スを用いたプラズマCVD法、または多結晶シリコンをタ
ーゲットとし、ArとH2(さらにF2又はCl2を混合しても
良い)の混合ガス中での反応性スパッタ法が用いられ
る。また、a−Si1-yCy(:H:X)(O<y<1),a−Si
1-yOy(:H:X)(O<y<1),a−Si1-yNy(:H:X)(O
<y<1)の作成には、更に炭素源として、CH4,C2H6,C
3H8,C4H18,C2H4,C3H6,C4H8,C2H2,C3H4,C4H6,C6H6等の炭
化水素、CH3F,CH3Cl,CH3I,C2H5Cl,C2H5Br等のハロゲン
化アリル、CClF3,CF4,CHF3,C2F6,C3F8等のフロンガス、
C6H6-mFm(m=1〜6)の弗化ベンゼン等のC原子の原
料ガスをプラズマCVD法に用いるシリコン原料ガスと混
合して、あるいは、反応性スパッタ法にはAr等のスパッ
タガスと混合して用いる。また、酸素源としてはO2,CO,
CO2,NO,NO2等、また、窒素源としてはN2,NH3,NO等を混
合して用いる。
For producing a-Si (: H: X), which is a photoconductive layer containing silicon, SiH 4 , Si 2 H 6 , Si 3 H 8 , SiF 4 , SiCl 4 , SiHF 3 , SiH
2 F 2, SiH 3 F, SiHCl 3, SiH 2 Cl 2, SiH 3 plasma CVD method using a source gas of Si atoms, such as Cl, or polycrystalline silicon as a target, Ar and H 2 (more F 2 or A reactive sputtering method in a mixed gas of (Cl 2 may be mixed) is used. Also, a-Si 1-y C y (: H: X) (O <y <1), a-Si
1-y O y (: H: X) (O <y <1), a-Si 1-y N y (: H: X) (O
In preparing <y <1), CH 4 , C 2 H 6 , C
3 H 8, C 4 H 18 , C 2 H 4, C 3 H 6, C 4 H 8, C 2 H 2, C 3 H 4, C 4 H 6, C 6 H 6 or the like hydrocarbons, CH 3 Allyl halides such as F, CH 3 Cl, CH 3 I, C 2 H 5 Cl, C 2 H 5 Br, and CFC gases such as CClF 3 , CF 4 , CHF 3 , C 2 F 6 , and C 3 F 8 ;
C 6 H 6-m F m (m = 1 to 6) C atom source gas such as benzene fluoride is mixed with silicon source gas used for plasma CVD, or Ar etc. is used for reactive sputtering. Used in combination with the sputtering gas. O 2 , CO,
CO 2 , NO, NO 2 and the like are used, and N 2 , NH 3 , NO and the like are mixed and used as a nitrogen source.

また、a−Si(:H:X)にGeを添加する場合もGeH4,Ge2
H6,Ge3H8,GeF4,GeCl4,GeHF3,GeH2F2,GeH3F,GeHCl3,GeH2
Cl2,GeH3Cl等のガスを上記Si原子の原料ガスと混合しプ
ラズマCVD法によって形成することも出来る。
Also, when Ge is added to a-Si (: H: X), GeH 4 , Ge 2
H 6 , Ge 3 H 8 , GeF 4 , GeCl 4 , GeHF 3 , GeH 2 F 2 , GeH 3 F, GeHCl 3 , GeH 2
A gas such as Cl 2 , GeH 3 Cl or the like can be mixed with the above-mentioned source gas of the Si atom to form by a plasma CVD method.

さらに、本発明において、上記のa−Si(:H:X),a−
Si1-yCy(:H:X)(O<y<1),a−Si1-yOy(:H:X)
(O<y<1),a−Si1-yNy(:H:X)(O<y<1)、
あるいはこれらにGe添加のこれらの膜中に、不純物を添
加することにより伝導性を制御し、所望の電子写真特性
を得ることができる。p型伝導性を与えるp型不純物と
しては、周期律表第III族bに属するB,Al,Ga,In等があ
り、好適にはB,Al,Gaが用いられ、n型伝導性を与える
n型不純物としては、周期律表第V族bに属するN,P,A
s,Sb等が有り、好適にはP,Asが用いられる。
Further, in the present invention, the above-mentioned a-Si (: H: X), a-
Si 1-y C y (: H: X) (O <y <1), a-Si 1-y O y (: H: X)
(O <y <1), a-Si 1-y N y (: H: X) (O <y <1),
Alternatively, conductivity can be controlled by adding impurities to these films to which Ge is added, and desired electrophotographic characteristics can be obtained. Examples of the p-type impurity imparting p-type conductivity include B, Al, Ga, In and the like belonging to Group III b of the periodic table, and B, Al, Ga is preferably used to impart n-type conductivity. As n-type impurities, N, P, A belonging to Group V b of the periodic table
There are s, Sb and the like, and P and As are preferably used.

また、これらの不純物を添加する方法として、p型不
純物の場居合、B2H6,B4H10,B5H9,B5H11,B6H12,B6H14,BF
3,BCl3,BBr3,AlCl3,(CH33Al,(C2H53Al,(i−C4H
93Al,(CH33Ga,(C2H53Ga,InCl3,(C2H53In
を、n型不純物の場合、N2,NH3,NO,N2O,NO2,PH3,P2H4,P
H4I,PF3,PF5,PCl3,PCl5,PBr3,PBr5,PI3,AsH3,AsF3,AsCl
3,AsBr3,SbH3,SbF3,SbF5,SbCl3,SbCl5等のガスを、ある
いはこれらのガスをH2,He,Arで希釈したガスを、プラズ
マCVD法では、それぞれの膜形成時において、使用する
上記のC原子,Si原子等の原料ガスと混合して用いれば
良く、反応性スパッタ法では、ArまたはH2あるいはF2,C
l2に混合して用いれば良い。
Further, as a method for adding these impurities, field of the p-type impurity Iaido, B 2 H 6, B 4 H 10, B 5 H 9, B 5 H 11, B 6 H 12, B 6 H 14, BF
3, BCl 3, BBr 3, AlCl 3, (CH 3) 3 Al, (C 2 H 5) 3 Al, (i-C 4 H
9 ) 3 Al, (CH 3 ) 3 Ga, (C 2 H 5 ) 3 Ga, InCl 3 , (C 2 H 5 ) 3 In
In the case of an n-type impurity, N 2 , NH 3 , NO, N 2 O, NO 2 , PH 3 , P 2 H 4 , P
H 4 I, PF 3 , PF 5 , PCl 3 , PCl 5 , PBr 3 , PBr 5 , PI 3 , AsH 3 , AsF 3 , AsCl
3 , AsBr 3 , SbH 3 , SbF 3 , SbF 5 , SbCl 3 , SbCl 5 , or a gas obtained by diluting these gases with H 2 , He, Ar In some cases, it may be used by mixing with the above-mentioned raw material gas such as C atom and Si atom to be used. In the reactive sputtering method, Ar or H 2 or F 2 , C
l 2 may be mixed and used.

高分子物質により形成される電荷移動層2としては、
ポリ(P−フェニレンビニレン)もしくはポリフェニレ
ンサルファイドを用いる。これらの結晶化度、もしくは
加熱処理後の結晶化度は10〜70%のものとする。
As the charge transfer layer 2 formed of a polymer substance,
Poly (P-phenylene vinylene) or polyphenylene sulfide is used. These crystallinities or the crystallinity after the heat treatment are 10 to 70%.

以下本発明について実際に行なった実施例について述
べる。
Hereinafter, embodiments of the present invention will be described.

実施例1 鏡面研磨したアルミニウム基板上に高分子スルホニウ
ム塩の1つであるポリ(キシリレン−α−ジエチルスル
ホリウムブロマイド)を塗布し減圧下30℃でフィルム化
を行い高分子層を得た。この高分子層を窒素ガス中に20
0〜400℃にて1〜15時間の加熱処理を行った。これによ
り、ポリ(キシリレン−α−ジエチルスルホニウムブロ
マイド)のBr、あるいは(C2H52Sが解離すると同時に
これらの高分子間の重合度が進み共役鎖の長さが増加す
る。また、光学的禁止帯幅は減少し、当初可視領域に吸
収もなく透明(2.7eV)であったものが、〜430nm付近に
吸収ピークが現れ黄色く着色(2.1〜2.4eV)したポリ
(P−フェニレンビニレン)が得られる。
Example 1 Poly (xylylene-α-diethylsulfolium bromide), one of polymer sulfonium salts, was coated on a mirror-polished aluminum substrate and formed into a film at 30 ° C. under reduced pressure to obtain a polymer layer. This polymer layer is placed in nitrogen gas for 20 minutes.
Heat treatment was performed at 0 to 400 ° C. for 1 to 15 hours. Thereby, at the same time as Br or (C 2 H 5 ) 2 S of poly (xylylene-α-diethylsulfonium bromide) is dissociated, the degree of polymerization between these polymers is advanced and the length of the conjugated chain is increased. In addition, the optical bandgap was reduced and was initially transparent (2.7 eV) without absorption in the visible region, but an absorption peak appeared at about 430 nm and yellow (2.1 to 2.4 eV) poly (P- Phenylene vinylene) is obtained.

このポリ(P−フェニレンビニレン)は以下の構造を
有する。
This poly (P-phenylenevinylene) has the following structure.

このポリ(P−フェニレンビニレン)の結晶化度を測
定すると約10〜70%であった。
The measured crystallinity of this poly (P-phenylenevinylene) was about 10-70%.

上記の高分子層を電荷移動層として加熱処理後の膜厚
で25μm形成した基板を6インチの放電電極を有する平
行平板型の容量結合方式プラズマCVD装置内に配置し、
反応容器内を5×10-6Torr以下に排気後、基板を150〜2
00℃に加熱した。つぎにSiH4を10〜40sccm導入し、圧力
0.2〜1.0Torr、高周波電力20〜100Wでノンドープ(non
−doped)a−Si:H層を光導電層として0.5〜5μm形成
し、更に、SiH4を10〜30sccm,C2H4を20〜40sccm導入
し、圧力0.2〜10Torr、高周波電力50〜150WでSi1-xCx:H
(O<x<1)を表面被覆層として0.08〜0.3μm形成
して電子写真感光体を作成した。
A substrate formed with the above polymer layer as a charge transfer layer and having a thickness of 25 μm after heat treatment is arranged in a parallel plate type capacitively coupled plasma CVD apparatus having a 6-inch discharge electrode,
After evacuating the reaction vessel to 5 × 10 -6 Torr or less, the substrate is
Heated to 00 ° C. Next, 10-40 sccm of SiH 4 was introduced, and the pressure was increased.
0.2 to 1.0 Torr, high frequency power 20 to 100 W, non-doped (non
-Doped) An a-Si: H layer is formed as a photoconductive layer in a thickness of 0.5 to 5 μm, SiH 4 is introduced in an amount of 10 to 30 sccm, C 2 H 4 is introduced in an amount of 20 to 40 sccm, a pressure of 0.2 to 10 Torr, and a high frequency power of 50 to 150 W With Si 1-x C x : H
(O <x <1) was formed as a surface coating layer in an amount of 0.08 to 0.3 μm to prepare an electrophotographic photosensitive member.

このようにして得られた電子写真感光体を+6.0KVで
コロナ帯電させたところ、+2200Vの表面電位を得るこ
とが出来、白色光で露光したところ、残留電位+50V以
下で半減電位露光量は1lux・sec以下と非常に高い感度
が得られた。また、この感光体を+900Vに帯電させ同じ
く白色光にて露光したところ、半減電位露光量は0.2lux
sec以下と感度は非常に高い。これを、従来のa−Si:
Hの20μmからなる感光体を+400Vに帯電させ白色光で
露光した場合と比較すれば3倍の感度があり、可視光の
みに限り露光を再度行い比較したところ、4倍以上の感
度が確認された。また、同じコロナ電位での帯電ではa
−Si:Hのみに比べ、帯電電位も4倍以上と少ない帯電電
流で高い感度の感光体が得られる事を示した。
The electrophotographic photosensitive member thus obtained was corona-charged at +6.0 KV, and a surface potential of +2200 V was obtained. When exposed with white light, the residual potential was less than +50 V and the half-reduction potential exposure amount was 1 lux. -Very high sensitivity of less than sec was obtained. When the photoreceptor was charged to +900 V and exposed to white light, the half-reduction potential exposure was 0.2 lux.
・ Sensitivity is very high at less than sec . This is called conventional a-Si:
The sensitivity is 3 times higher than when the photoreceptor composed of 20 μm of H is charged to + 400V and exposed with white light. When only visible light is re-exposed and compared, the sensitivity is 4 times or more. Was. Also, in charging at the same corona potential, a
This shows that a photosensitive member having high sensitivity can be obtained with a charging current that is as small as 4 times or more the charging potential as compared with -Si: H alone.

また、0.2〜2μmのa−Si:H光導電層に酸素を200〜
3000ppm添加した場合も、Bを0.5〜5ppm添加した場合も
上記と同様な特性を示す電子写真感光体を形成できた。
Further, oxygen is added to the a-Si: H photoconductive layer of 0.2 to 2 μm for 200 to 200 μm.
An electrophotographic photoreceptor having the same characteristics as described above was formed both when 3,000 ppm was added and when B was added in an amount of 0.5 to 5 ppm.

一方、結晶化度10%未満の電荷移動層は、残留電位が
増加し十分な画像濃度が得られなかった。また、結晶化
度70%を越えると、膜審体の機械的強度が低下し、加熱
時の膜剥離が多発し、製膜性が著しく低下する。
On the other hand, in the charge transfer layer having a crystallinity of less than 10%, the residual potential was increased and a sufficient image density was not obtained. On the other hand, when the crystallinity exceeds 70%, the mechanical strength of the film sample is reduced, the film is frequently peeled off during heating, and the film forming property is significantly reduced.

実施例2 表面研磨したアルミニウムドラムにポリフェニレンサ
ルファイド(以下PPSと記す)の粉末を〜300℃で不活性
ガス中にホットプレスにより〜20μm形成後表面に鏡面
にわずかに研磨し電荷移動層とする。この状態でのPPS
はわずかに黄色を帯びた透明に近い膜である。
Example 2 A powder of polyphenylene sulfide (hereinafter referred to as PPS) was formed on an aluminum drum whose surface was polished by hot pressing at 300300 ° C. in an inert gas at 2020 μm, and then the surface was slightly polished to a mirror surface to form a charge transfer layer. PPS in this state
Is a slightly yellowish and nearly transparent film.

PPSは、以下の構造においてX:S、n=10〜30の高分子
であった。
PPS was a polymer having X: S and n = 10 to 30 in the following structure.

このドラムを更に空気中にて150〜250℃にて0.1〜5
時間加熱処理を行う。このようにして得られたドラムは
褐色を帯びたものとなり光学的禁止帯幅で〜2.4eVであ
った。
The drum is further dried in air at 150-250 ° C for 0.1-5
Heat treatment is performed for a time. The resulting drum was brownish and had an optical bandgap of ~ 2.4 eV.

上記と同様の方法で、X線測定用に作製したサンプル
を用い、結晶化度を測定したところ、加熱処理後のPPS
の結晶化度は約10〜40%であった。
Using a sample prepared for X-ray measurement in the same manner as above, the crystallinity was measured.
Has a crystallinity of about 10-40%.

これを、長さ45cm,内径16cmφの円筒型の放電電極を
有する容量結合方式プラズマCVD装置内に配置し、反応
容器内を5×10-6Torr以下に排気後、アルミニウムドラ
ムを150〜200℃に加熱した。SiH4を50〜150sccm、C2H2
を2〜10sccm、B2H6をSiH4に対し5〜100ppm、圧力0.2
〜1.0Torr、高周波電力100〜250Wでa−Si1-xCx:H層を
1〜5μm形成し、続いて、SiH4に加えてC2H2を20〜50
sccmと増加し、a−Si1-xCx層0.05〜0.5μmを形成し電
子写真感光体とした。この時のa−Si1-xCx:H層の光学
的禁止帯幅が1.7〜1.9eVであり、この感光体を670nmのL
EDを光源とする光プリンタに実装し、正帯電において+
500〜800Vの表面電位で鮮明な印字を確認した。
This was placed in a capacitively coupled plasma CVD apparatus having a cylindrical discharge electrode having a length of 45 cm and an inner diameter of 16 cmφ. After evacuation of the reaction vessel to 5 × 10 −6 Torr or less, the aluminum drum was heated to 150 to 200 ° C. Heated. The SiH 4 50~150sccm, C 2 H 2
5~100ppm the 2~10Sccm, the B 2 H 6 to SiH 4, the pressure 0.2
A-Si 1-x C x : H layer is formed at 1 to 5 μm at 1.01.0 Torr and high frequency power of 100 to 250 W, and then C 2 H 2 is added to SiH 4 for 20 to 50 μm.
The thickness increased to sccm, and an a-Si 1-x C x layer of 0.05 to 0.5 μm was formed to obtain an electrophotographic photosensitive member. At this time, the optical band gap of the a-Si 1-x C x : H layer is 1.7 to 1.9 eV, and the photoconductor is 670 nm L.
Mounted on an optical printer using ED as a light source, and +
Clear printing was confirmed at a surface potential of 500 to 800 V.

また、a−Si1-xCx:HにGeを添加したa−(Si1-zG
ez1-xCx:Hを用いれば更に感度の向上が計られた。
Also, a- (Si 1-z G G) obtained by adding Ge to a-Si 1-x C x : H
e z ) The sensitivity was further improved by using 1-x C x : H.

また、電荷移動層として硫化高分子層を用いたが、S
e、あるいはTe化高分子でも同様な特性が得られる。
In addition, although a sulfide polymer layer was used as the charge transfer layer,
Similar characteristics can be obtained with e or Te-modified polymers.

表面被覆層としてa−Si1-xCx層に代わる材料として
0.1〜0.5μmのa−Ge1-xCx:H(O<x<1)をプラズ
マCVD法で形成し、同様に光プリンタに実装したとこ
ろ、この構成の電子写真感光体が耐熱性、耐湿性に優
れ、50万枚の耐刷性を有することを解認した。
As a material to replace the a-Si 1-x C x layer as a surface coating layer
When a-Ge 1-x C x : H (O <x <1) of 0.1 to 0.5 μm was formed by a plasma CVD method and mounted on an optical printer in the same manner, the electrophotographic photosensitive member having this configuration showed heat resistance, It was found that it has excellent moisture resistance and has a printing durability of 500,000 sheets.

電荷移動層の結晶化度10%未満では、実施例1と同じ
く残留電位の増加が見られ、移動度の低下になるもので
ある。
When the crystallinity of the charge transfer layer is less than 10%, the residual potential increases as in Example 1, and the mobility decreases.

発明の効果 本発明による電子写真感光体は、光励起によって移動
可能なキャリアを発生する光導電層と、結晶化度10〜70
%のポリ(P−フェニレンビニレン)もしくはポリフェ
ニレンサルファイドにより形成された電荷移動層を備え
た構成としたために、暗時の抵抗値が大きく、かつキャ
リア移動度の大きな電荷移動層を形成することが可能と
なる。
Effect of the Invention The electrophotographic photoreceptor according to the present invention has a photoconductive layer that generates a movable carrier by photoexcitation, and a crystallinity of 10 to 70.
% Of poly (P-phenylenevinylene) or polyphenylene sulfide, so that a charge transport layer having a large resistance value in the dark and a large carrier mobility can be formed. Becomes

以上の相乗効果により、残留電位の小さな、高感度で
帯電電位の大きな電子写真感光体が得られる。
By the above synergistic effect, an electrophotographic photosensitive member having a small residual potential, a high sensitivity and a large charging potential can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

図は本発明の一実施例における電子写真感光体の断面図
である。 1……支持体、2……電荷移動層、3……光導電層、4
……自由表面。
FIG. 1 is a sectional view of an electrophotographic photosensitive member according to one embodiment of the present invention. DESCRIPTION OF SYMBOLS 1 ... Support, 2 ... Charge transfer layer, 3 ... Photoconductive layer, 4
…… free surface.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 秋山 浩二 門真市大字門真1006番地 松下電器産業 株式会社内 (72)発明者 渡辺 正則 門真市大字門真1006番地 松下電器産業 株式会社内 (56)参考文献 特開 昭62−187353(JP,A) ──────────────────────────────────────────────────の Continued on the front page (72) Inventor Koji Akiyama 1006 Kadoma Kadoma Matsushita Electric Industrial Co., Ltd. JP-A-62-187353 (JP, A)

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】光励起によって移動可能なキャリアを発生
する光導電層と、前記キャリアを輸送する電荷移動層と
を有し、前記電荷移動層は結晶化度10〜70%のポリ(P
−フェニレンビニレン)もしくはポリフェニレンサルフ
ァイドからなる電子写真感光体。
1. A photoconductive layer that generates carriers that can move by photoexcitation, and a charge transfer layer that transports the carriers, wherein the charge transfer layer has a crystallinity of 10 to 70%.
An electrophotographic photoreceptor made of (phenylene vinylene) or polyphenylene sulfide.
【請求項2】光導電層は、局在化状態密度を減少させる
修飾物質を含む非晶質層であることを特徴とする特許請
求の範囲第1項記載の電子写真感光体。
2. The electrophotographic photoreceptor according to claim 1, wherein the photoconductive layer is an amorphous layer containing a modifying substance for reducing the density of localized states.
【請求項3】電荷移動層は、電子受容体として弗化砒素
(AsF5)、酸化イオウ(SO3)、弗化アンチモン(Sb
F5)、臭素(Br2)、ヨウ素(I2)、もしくは7,7,8,8−
テトラシアノキシノジメタン(TCNQ)の少なくとも1つ
を0.01〜0.4wt%を含むことを特徴とする特許請求の範
囲第1項記載の電子写真感光体。
3. The charge transfer layer comprises arsenic fluoride (AsF 5 ), sulfur oxide (SO 3 ), antimony fluoride (Sb) as an electron acceptor.
F 5 ), bromine (Br 2 ), iodine (I 2 ), or 7,7,8,8-
2. The electrophotographic photoreceptor according to claim 1, wherein said electrophotographic photoreceptor contains at least one of tetracyanoxinodimethane (TCNQ) in an amount of 0.01 to 0.4% by weight.
【請求項4】光導電層は、少なくとも水素もしくはハロ
ゲン元素のいずれか一方を含むことを特徴とする特許請
求の範囲第1項記載の電子写真感光体。
4. The electrophotographic photosensitive member according to claim 1, wherein the photoconductive layer contains at least one of hydrogen and a halogen element.
JP62110214A 1987-05-06 1987-05-06 Electrophotographic photoreceptor Expired - Fee Related JP2595536B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62110214A JP2595536B2 (en) 1987-05-06 1987-05-06 Electrophotographic photoreceptor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62110214A JP2595536B2 (en) 1987-05-06 1987-05-06 Electrophotographic photoreceptor

Publications (2)

Publication Number Publication Date
JPS63274959A JPS63274959A (en) 1988-11-11
JP2595536B2 true JP2595536B2 (en) 1997-04-02

Family

ID=14529958

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62110214A Expired - Fee Related JP2595536B2 (en) 1987-05-06 1987-05-06 Electrophotographic photoreceptor

Country Status (1)

Country Link
JP (1) JP2595536B2 (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62187353A (en) * 1986-02-14 1987-08-15 Fuji Xerox Co Ltd Electrophotographic sensitive body

Also Published As

Publication number Publication date
JPS63274959A (en) 1988-11-11

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