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JPH0823706B2 - Method for manufacturing electrophotographic photoreceptor - Google Patents
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JPH0823706B2 - Method for manufacturing electrophotographic photoreceptor - Google Patents

Method for manufacturing electrophotographic photoreceptor

Info

Publication number
JPH0823706B2
JPH0823706B2 JP62158221A JP15822187A JPH0823706B2 JP H0823706 B2 JPH0823706 B2 JP H0823706B2 JP 62158221 A JP62158221 A JP 62158221A JP 15822187 A JP15822187 A JP 15822187A JP H0823706 B2 JPH0823706 B2 JP H0823706B2
Authority
JP
Japan
Prior art keywords
layer
charge transfer
photosensitive member
transfer layer
electrophotographic photosensitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62158221A
Other languages
Japanese (ja)
Other versions
JPS642062A (en
JPH012062A (en
Inventor
栄一郎 田中
昭雄 滝本
京子 尾道
浩二 秋山
千里 阪原
正則 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62158221A priority Critical patent/JPH0823706B2/en
Priority to US07/190,093 priority patent/US4886719A/en
Priority to DE3855975T priority patent/DE3855975T2/en
Priority to EP88304123A priority patent/EP0290270B1/en
Publication of JPS642062A publication Critical patent/JPS642062A/en
Publication of JPH012062A publication Critical patent/JPH012062A/en
Publication of JPH0823706B2 publication Critical patent/JPH0823706B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/06Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being organic
    • G03G5/07Polymeric photoconductive materials
    • G03G5/075Polymeric photoconductive materials obtained otherwise than by reactions only involving carbon-to-carbon unsaturated bonds
    • G03G5/076Polymeric photoconductive materials obtained otherwise than by reactions only involving carbon-to-carbon unsaturated bonds having a photoconductive moiety in the polymer backbone
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/05Organic bonding materials; Methods for coating a substrate with a photoconductive layer; Inert supplements for use in photoconductive layers
    • G03G5/0528Macromolecular bonding materials
    • G03G5/0557Macromolecular bonding materials obtained otherwise than by reactions only involving carbon-to-carbon unsatured bonds
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/05Organic bonding materials; Methods for coating a substrate with a photoconductive layer; Inert supplements for use in photoconductive layers
    • G03G5/0528Macromolecular bonding materials
    • G03G5/0557Macromolecular bonding materials obtained otherwise than by reactions only involving carbon-to-carbon unsatured bonds
    • G03G5/0582Polycondensates comprising sulfur atoms in the main chain
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/06Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being organic
    • G03G5/07Polymeric photoconductive materials
    • G03G5/075Polymeric photoconductive materials obtained otherwise than by reactions only involving carbon-to-carbon unsaturated bonds

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Photoreceptors In Electrophotography (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、電子写真方式の複写機、光プリンタ等に用
いられる電子写真感光体の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing an electrophotographic photosensitive member used in an electrophotographic copying machine, an optical printer or the like.

従来の技術 電子写真感光体における光導電体として、10〜40atm
%の水素を局在化状態密度を減少せしめる修飾物質とし
て含む非晶質シリコン(以下a−Si:Hと記す)が、高い
光感度、無公害性、及び高い硬度を有することにより注
目され利用されている。
Conventional technology 10 to 40 atm as photoconductor in electrophotographic photoreceptor
Amorphous silicon (hereinafter referred to as a-Si: H) containing% hydrogen as a modifier that reduces the localized density of states has attracted attention due to its high photosensitivity, pollution-free property, and high hardness. Has been done.

しかしながら、上記のa−Si:Hで構成される電子写真
感光体ではまだまだ解決すべき問題も多い。
However, there are still many problems to be solved in the electrophotographic photosensitive member composed of a-Si: H.

例えば、第1の問題としてa−Si:Hは、他の感光体材
料である有機光半導体(以下OPCと記す)、あるいはSe
に比較して誘電率が約11と大きく(OPC:約3、Se:約
6)静電容量が大きいため、表面への帯電処理を行う際
には非常に大きな帯電電流を必要とする。
For example, as a first problem, a-Si: H is an organic photo-semiconductor (hereinafter referred to as OPC) which is another photosensitive material, or Se.
Compared with the above, the dielectric constant is as large as about 11 (OPC: about 3, Se: about 6), and the electrostatic capacity is large, so a very large charging current is required when the surface is charged.

また、実用表面電位(〜400V)を得るには表面電荷の
電荷密度も高く、この電荷を光除電するためには多くの
光エネルギーを必要とするため、実際の光感度は十分高
いとは言えない。
Further, the surface charge has a high charge density to obtain a practical surface potential (up to 400 V), and a large amount of light energy is required to photo-eliminate this charge, so it can be said that the actual photosensitivity is sufficiently high. Absent.

さらに、第2の問題としてa−Si:H膜の製膜に際して
最も良く用いられるシラン(SiH4と記す)ガスを原料ガ
スとしたプラズマCVD法では、堆積速度も10μm/H以下と
遅く、シランガスも高価であることから、製造コストの
低減は困難である。
Further, as the second problem, in the plasma CVD method using a silane (referred to as SiH 4 ) gas, which is most often used for forming an a-Si: H film, as a source gas, the deposition rate is slow at 10 μm / H or less, and the silane gas Since it is expensive, it is difficult to reduce the manufacturing cost.

また、第3の問題は、膜厚においても30μm以下で使
用されることが多く帯電電界強度も30V/μm程度から、
実用の表面電位はSe感光体の800Vに比べ500V以下と低い
電位で使用されるため、通常の2成分現像剤では十分な
画像濃度のコピーが得られないと言った問題がある。
The third problem is that the film thickness is often less than 30 μm, and the charging electric field strength is about 30 V / μm.
Since the surface potential for practical use is as low as 500 V or less as compared with 800 V of the Se photoconductor, there is a problem that a usual two-component developer cannot obtain a copy having a sufficient image density.

一方、OPCにおいても機能分離型が主流となり感度、
寿命においてもSe感光体を追い越しつつある。
On the other hand, also in OPC, the function-separated type becomes the mainstream and the sensitivity,
It is also surpassing the Se photoconductor in its life.

OPC感光体は電荷発生層、電荷移動層、表面層あるい
は支持体と電荷発生層との界面に下引き層等を使用しそ
の多くは製造法によって形成される。
The OPC photoreceptor uses a charge generation layer, a charge transfer layer, a surface layer or an undercoat layer at the interface between the support and the charge generation layer, and most of them are formed by a manufacturing method.

また、a−Si:Hの欠点を克服するため、OPCを電荷移
動層としa−Si:Hを光導電層として積層した特開昭54-1
43645号公報には、有機半導体材料とa−Si:Hを用いた
機能分離型の感光体が開示されているが、この場合にお
ても塗布法が主に用いられている。
Further, in order to overcome the drawbacks of a-Si: H, OPC is used as a charge transfer layer and a-Si: H is used as a photoconductive layer.
Japanese Patent No. 43645 discloses a function-separated type photoreceptor using an organic semiconductor material and a-Si: H, but even in this case, a coating method is mainly used.

発明が解決しようとする問題点 塗布法は大面積を均一な膜厚に種々な形状を有する基
板に塗布することは困難であり、また20μm以上の厚膜
を得ることも難しい。また、塗布のための設備も高額で
設備負担のため、感光体も高価となる。
Problems to be Solved by the Invention It is difficult for the coating method to coat a large area on a substrate having various shapes with a uniform film thickness, and it is also difficult to obtain a thick film of 20 μm or more. In addition, since the equipment for coating is expensive and the equipment burden is imposed, the photoreceptor is also expensive.

本発明の主たる目的は、塗布装置も不用な、安価な感
光体を提供することを目的としている。
A main object of the present invention is to provide an inexpensive photoconductor that does not require a coating device.

問題点を解決するための手段 光導電層、高分子フィルムを主成分とした電荷移動層
が積層された電子写真感光体において、前記電荷移動層
をポリ(p−フェニレン)スルフィドを主成分とした高
分子フィルムとし、加熱処理による融着により形成する 作用 ポリ(p−フェニレン)スルフィドを主成分とした高
分子フィルムは主鎖に環構造(フェニレン)とVIb族元
素であるSをパラ位に持つ直鎖状につながった構造を有
し〜280℃に融点をもつ。
Means for Solving the Problems In an electrophotographic photoreceptor in which a photoconductive layer and a charge transfer layer containing a polymer film as a main component are laminated, the charge transfer layer contains poly (p-phenylene) sulfide as a main component. Action to be formed by fusion with heat treatment as polymer film Polymer film mainly composed of poly (p-phenylene) sulfide has ring structure (phenylene) and VIb group element S in para position in main chain It has a linear chain structure and has a melting point at ~ 280 ° C.

また、キャリア移動度も10-4〜10-7cm2/V・secと大き
い反面、キャリア寿命が小さく、従来、電子写真感光体
の電荷移動層としては十分な特性が得られなかった。
In addition, although the carrier mobility is as large as 10 −4 to 10 −7 cm 2 / V · sec, the carrier life is short, and conventionally, sufficient characteristics cannot be obtained as a charge transfer layer of an electrophotographic photoreceptor.

また、a−Si:Hのようなイオン化ポテンシアルの小さ
く光学的禁止帯幅の小さな光導電層に対しても、正孔あ
るいは電子の注入効率が悪く、残留電位も大きいもので
あった。
Further, even for a photoconductive layer having a small ionization potential and a small optical bandgap such as a-Si: H, the injection efficiency of holes or electrons was poor and the residual potential was large.

また、これらは種々の溶剤にも溶けにくく任意の基板
上に形成するのは困難であった。
Further, these are difficult to dissolve in various solvents, and it is difficult to form them on any substrate.

しかし、これらのフィルムを導電性基板上に直接ある
いはシランカップリング剤を介して密着し、融点付近の
200〜350℃にて0.1〜15時間、空気中あるいは酸化性の
活性ガス中て加熱処理を行うことによって高分子フィル
ムを軟化し融着することにより、均一な電荷移動層を容
易に形成することができた。
However, these films are adhered to the conductive substrate directly or via a silane coupling agent, and
To easily form a uniform charge transfer layer by softening and fusing the polymer film by heat treatment in air or oxidizing active gas for 0.1 to 15 hours at 200 to 350 ° C. I was able to.

また、同時にこれらの高分子層に酸化反応を誘起し、
電荷移動層の正孔の飛程(μτ積)が向上し、高感度な
残留電位の小さい電子写真感光体特性を得ることができ
た。
At the same time, an oxidation reaction is induced in these polymer layers,
The range of holes (μτ product) in the charge transfer layer was improved, and high-sensitivity electrophotographic photoreceptor characteristics with a small residual potential could be obtained.

以上の相乗効果により、残留電位の小さな、高感度で
帯電電位の大きな電子写真感光体が、塗布装置も必要と
することなく容易に、安価に得られる。
Due to the above synergistic effect, an electrophotographic photosensitive member having a small residual potential, a high sensitivity, and a large charging potential can be easily obtained at low cost without using a coating device.

実施例 図は、本発明における基本的な電子写真感光体の一実
施例の断面を模式的に示したものである。
Example FIG. 1 schematically shows a cross section of an example of a basic electrophotographic photosensitive member according to the present invention.

図に示す電子写真感光体は、電子写真感光体としての
支持体1上に、高分子フィルムからなる電荷移動層2と
光導電層3とを有し、前記光導電層3は一方で自由表面
4を有している。
The electrophotographic photosensitive member shown in the figure has a charge transfer layer 2 made of a polymer film and a photoconductive layer 3 on a support 1 as the electrophotographic photosensitive member, and the photoconductive layer 3 is a free surface on the one hand. Have four.

本発明において、光導電層としては、硬度の高いシリ
コンを含有する非晶質層を用い、a−Si(:H:X)、a−
Si1-yy(:H:X)(0<y<1)、a−Si1-yy(:H:
X)(0<y<1)、a−Si1-yy(:H:X)(0<y<
1)、a−Si1-zGez(:H:X)(0<z<1)、a−(Si
1-zGez1-yy(:H:X)(0<y,z<1)、a−(Si1-z
Gez1-yy(:H:X)(0<y,z<1)、またはa−(Si
1-zGez1-yy(:H:X)(0<y,z<1)の単層、ある
いはこれらの積層を用いる事ができる。また、yを連続
的に変化させた場合も使用できる。
In the present invention, an amorphous layer containing silicon having high hardness is used as the photoconductive layer, and a-Si (: H: X), a-
Si 1-y C y (: H: X) (0 <y <1), a-Si 1-y O y (: H:
X) (0 <y <1), a-Si 1-y N y (: H: X) (0 <y <
1), a-Si 1-z Ge z (: H: X) (0 <z <1), a- (Si
1-z Ge z ) 1-y N y (: H: X) (0 <y, z <1), a- (Si 1-z
Ge z ) 1-y O y (: H: X) (0 <y, z <1), or a- (Si
A single layer of 1-z Ge z ) 1-y C y (: H: X) (0 <y, z <1) or a stacked layer of these can be used. Further, it is also possible to use a case where y is continuously changed.

この時の膜厚は、電荷移動層は5〜50μm、好適には
10〜25μm、また光導電層の膜厚は0.5〜10μm好適に
は1〜5μmとすれば良い。
At this time, the thickness of the charge transfer layer is 5 to 50 μm, preferably
The thickness of the photoconductive layer may be 0.5 to 10 μm, preferably 1 to 5 μm.

本発明において、更に電子写真特性を向上させるため
に、図において、支持体1と電荷移動層2との間に、支
持体1から電荷移動層2に注入するキャリアを効果的に
阻止するため障壁層を設けてもよい。
In the present invention, in order to further improve the electrophotographic characteristics, in the figure, a barrier between the support 1 and the charge transfer layer 2 is provided to effectively block carriers injected from the support 1 into the charge transfer layer 2. Layers may be provided.

障壁層を形成する材料としては、Al23、BaO、Ba
O2、BeO、Bi23、CaO、CeO2、Ce23、La23、Dy
23、Lu23、Cr23、CuO、Cu2O、FeO、PbO、MgO、S
rO、Ta23、ThO2、ZrO2、HfO2、TiO2、TiO、SiO2、GeO
2,SiO、GeO等の金属酸化物またはTiN、AlN、SnN、NbN、
TaN、GaN等の金属窒化物、またはWC、SnC、TiC、等の金
属炭化物またはSiC,SiN、GeC、GeN、BC、BN等の絶縁
物、ポリイミド、ポリアミドイミド、ポリアクリルニト
リル等の耐熱性を有する有機化合物が使用される。
As the material for forming the barrier layer, Al 2 O 3 , BaO, Ba
O 2, BeO, Bi 2 O 3, CaO, CeO 2, Ce 2 O 3, La 2 O 3, Dy
2 O 3 , Lu 2 O 3 , Cr 2 O 3 , CuO, Cu 2 O, FeO, PbO, MgO, S
rO, Ta 2 O 3 , ThO 2 , ZrO 2 , HfO 2 , TiO 2 , TiO, SiO 2 , GeO
2 , metal oxides such as SiO, GeO or TiN, AlN, SnN, NbN,
Metal nitride such as TaN, GaN, metal carbide such as WC, SnC, TiC, or insulator such as SiC, SiN, GeC, GeN, BC, BN, heat resistance of polyimide, polyamide imide, polyacrylonitrile, etc. An organic compound having is used.

また、クリーニング性あるいは耐摩耗性あるいは耐コ
ロナ性を向上させるため、図における、自由表面4上に
表面被覆層を形成する。表面被覆層として好適な材料と
しては、Six1-x、Six1-x、Six1-x、Gex1-x、Ge
x1-x、Gex1-x、Bx1-x、Bx1-x、Alx1-x(0
<x<1)、カーボンおよびこれらに水素あるいはハロ
ゲンを含有する層等の無機物などが挙げられる。
In addition, a surface coating layer is formed on the free surface 4 in the figure in order to improve cleaning property, abrasion resistance, or corona resistance. Suitable materials for the surface coating layer include Si x O 1-x , Si x C 1-x , Si x N 1-x , Ge x O 1-x , Ge
x C 1-x , Ge x N 1-x , B x N 1-x , B x C 1-x , Al x N 1-x (0
<X <1), and inorganic materials such as carbon and layers containing hydrogen or halogen therein.

シリコンを含有する光導電層であるa−Si(:H:X)の
作成には、SiH4、Si26、Si38、SiF4、SiCl4、SiH
F3、SiH22、SiH3F、SiHCl3、SiH2Cl2、SiH3Cl等のSi
原子の原料ガスを用いたプラズマCVD法、または多結晶
シリコンをターゲットとし、ArとH2(さらにF2又はCl
2を混合しても良い)の混合ガス中での反応性スパッタ
法が用いられる。また、a−Si1-yy(:H:X)(0<y
<1)、a−Si1-yy(:H:X)(0<y<1)、a−Si
1-y(:H:X)(0<y<1)の作成には、更に炭素
源として、CH4、C26、C38、C410、C24、C
36、C48、C22,C34、C46、C66等の炭化
水素、CH3F、CH3Cl、CH3I、C25Cl、C25Br、等
のハロゲン化アリル、CClF3、CF4、CHF3、C26、C3
8等のフロンガス、C66-mm(m=1〜6)の弗化
ベンゼン等のC原子の原料ガスをプラズマCVD法に用い
るシリコン原料ガスと混合して、あるいは、反応性スパ
ッタ法にはAr等のスパッタガスと混合して用いる。ま
た、酸素源としてはO2、CO、CO2、NO、NO2等、また、
窒素源としてはN2、NH3、NO等を混合して用いる。
For forming a-Si (: H: X), which is a photoconductive layer containing silicon, SiH 4 , Si 2 H 6 , Si 3 H 8 , SiF 4 , SiCl 4 , SiH
Si such as F 3 , SiH 2 F 2 , SiH 3 F, SiHCl 3 , SiH 2 Cl 2 and SiH 3 Cl
Plasma CVD method using atomic source gas, or targeting polycrystalline silicon, Ar and H 2 (further F 2 or Cl
Reactive sputtering in a mixed gas of 2 may be used) is used. In addition, a-Si 1-y C y (: H: X) (0 <y
<1), a-Si 1-y O y (: H: X) (0 <y <1), a-Si
To prepare 1-y N y (: H: X) (0 <y <1), CH 4 , C 2 H 6 , C 3 H 8 , C 4 H 10 and C 2 H 4 were further added as carbon sources. , C
Hydrocarbons such as 3 H 6 , C 4 H 8 , C 2 H 2 , C 3 H 4 , C 4 H 6 and C 6 H 6 , CH 3 F, CH 3 Cl, CH 3 I, C 2 H 5 Cl , C 2 H 5 Br, etc., allyl halides, CClF 3 , CF 4 , CHF 3 , C 2 F 6 , C 3
Fluorocarbon gas such as F 8 or C 6 H 6-m F m (m = 1 to 6) source gas of C atom such as fluorinated benzene is mixed with a silicon source gas used in the plasma CVD method or is reactive. The sputtering method is used by mixing with a sputtering gas such as Ar. Further, as an oxygen source, O 2 , CO, CO 2 , NO, NO 2, etc.,
As the nitrogen source, N 2 , NH 3 , NO or the like is mixed and used.

また、a−Si(:H:X)にGeを添加する場合もGeH4、Ge
26、Ge38、GeF4、GeCl4、GeHF3、GeH22、GeH
3F、GeHCl3、GeH2Cl2、GeH3Cl等のガスを上記Si原子の
原料ガスと混合し、プラズマCVD法によって形成するこ
とも出来る。さらに、本発明において、上記のa−S
i(:H:X),a−Si1-yy(:H:X)(0<y<1)、a−S
i1-yy(:H:X)(0<y<1)、a−Si1-yy(:H:
X)(0<y<1)、あるいはこれらにGe添加のこれら
の膜中に、不純物を添加することにより伝導性を制御
し、所望の電子写真特性を得ることができる。p型伝導
性を与えるp型不純物としては、周期律表第III族bに
属する、B、Al、Ga、In等があり、好適にはB、Al、Ga
が用いられ、n型伝導性を与えるn型不純物としては、
周期律表第V族bに属するN、P、As、Sb等が有り、好
適にはP、Asが用いられる。
Also, when Ge is added to a-Si (: H: X), GeH 4 , Ge
2 H 6 , Ge 3 H 8 , GeF 4 , GeCl 4 , GeHF 3 , GeH 2 F 2 , GeH
A gas such as 3 F, GeHCl 3 , GeH 2 Cl 2 or GeH 3 Cl may be mixed with the above Si atom source gas to form the plasma CVD method. Furthermore, in the present invention, the above aS
i (: H: X), a-Si 1-y C y (: H: X) (0 <y <1), a-S
i 1-y O y (: H: X) (0 <y <1), a-Si 1-y N y (: H:
X) (0 <y <1) or by adding impurities to these films with Ge added thereto, conductivity can be controlled and desired electrophotographic characteristics can be obtained. Examples of p-type impurities that impart p-type conductivity include B, Al, Ga, In, and the like belonging to Group IIIb of the periodic table, and preferably B, Al, Ga.
Is used as an n-type impurity that imparts n-type conductivity,
There are N, P, As, Sb, etc. belonging to Group V b of the periodic table, and P and As are preferably used.

また、これらの不純物を添加する方法として、p型不
純物の場合、B26、B410、B59、B511、B6
12、B614、BF3、BCl3、BBr3、AlCl3、(CH33A
l、(C253Al、(i−C493Al、(CH33Ga、
(C253Ga、InCl3、(C253Inを、n型不純物
の場合は、N2、NH3、NO、N2O、NO2、PH3、P24、P
H4I、PF3、PF5、PCl3、PCl5、PBr3,PBr5、PI3、AsH3
AsF3、AsCl3、AsBr3、SbH3、SbF3、SbF5、SbCl3、SbCl5
等のガスを、あるいはこれらのガスをH2、He、Arで希釈
したガスを、プラズマCVD法では、それぞれの膜形成時
において、使用する上記のC原子、Si原子等の原料ガス
と混合して用いれば良く、反応性スパッタ法では、Arま
たはH2、あるいはF2、Cl2に混合して用いれば良い。
以下実施例について述べる。
Further, as a method of adding these impurities, in the case of p-type impurities, B 2 H 6 , B 4 H 10 , B 5 H 9 , B 5 H 11 , B 6
H 12 , B 6 H 14 , BF 3 , BCl 3 , BBr 3 , AlCl 3 , (CH 3 ) 3 A
l, (C 2 H 5) 3 Al, (i-C 4 H 9) 3 Al, (CH 3) 3 Ga,
(C 2 H 5) 3 Ga , InCl 3, a (C 2 H 5) 3 In , the case of n-type impurity, N 2, NH 3, NO , N 2 O, NO 2, PH 3, P 2 H 4 , P
H 4 I, PF 3, PF 5, PCl 3, PCl 5, PBr 3, PBr 5, PI 3, AsH 3,
AsF 3, AsCl 3, AsBr 3 , SbH 3, SbF 3, SbF 5, SbCl 3, SbCl 5
Etc., or a gas obtained by diluting these gases with H2, He, and Ar, in the plasma CVD method, is mixed with the above-mentioned raw material gas such as C atom and Si atom to be used in forming each film. It may be used, and in the reactive sputtering method, it may be used by mixing with Ar or H 2 , or F 2 and Cl 2 .
Examples will be described below.

実施例1 鏡面研磨した15cm角アルミニウム基板上に、15μmの
ポリ(p−フェニレン)スルフィド高分子フィルムを密
着させ端部を固定し、空気中にて、280〜360℃の温度で
0.1〜0.5時間加熱し、電荷移動層として形成した。この
基板を、6インチの放電電極を有する平行平板型の容量
結合方式プラズマCVD装置内に配置し、反応容器内を5
×10-6Torr以下に排気後、基板を150〜200℃に加熱し
た。つぎにSiH4を10〜40sccm導入し、圧力0.2〜1.0Tor
r、高周波電力20〜100WでBを0.5〜5ppm添加したa−S
i:H層を光導電層として0.5〜5μm形成し、更に、SiH4
を10〜30sccm、C24を20〜40sccm導入し、圧力0.2〜
1.0Torr、高周波電力50〜150WでSi1-xx:H(0<x<
1)を表面被覆層として0.08〜0.3μm形成して電子写
真感光体を作成した。
Example 1 On a mirror-polished 15 cm square aluminum substrate, a 15 μm poly (p-phenylene) sulfide polymer film was adhered and the end was fixed, and in air, at a temperature of 280 to 360 ° C.
It was heated for 0.1 to 0.5 hours to form a charge transfer layer. This substrate was placed in a parallel plate type capacitively coupled plasma CVD apparatus having a 6-inch discharge electrode, and the inside of the reaction vessel was set to 5
After evacuating to × 10 -6 Torr or less, the substrate was heated to 150 to 200 ° C. Next, SiH 4 was introduced at 10 to 40 sccm and the pressure was 0.2 to 1.0 Torr.
r, high frequency power of 20 to 100 W, and 0.5 to 5 ppm of B added aS
The i: H layer is formed as a photoconductive layer in a thickness of 0.5 to 5 μm, and SiH 4
Of 10 to 30 sccm and C 2 H 4 of 20 to 40 sccm, and pressure of 0.2 to
Si 1-x C x : H (0 <x <at 1.0 Torr and high frequency power 50-150W
1) was formed as a surface coating layer to 0.08 to 0.3 μm to prepare an electrophotographic photosensitive member.

このようにして得られた電子写真感光体を+6.0kVで
コロナ帯電させたところ、+1200Vの表面電位を得るこ
とが出来、白色光で露光したところ、残留電位+450V以
下で半減電位露光量は10lux・sec以下と高い感度が得ら
れた。
When the electrophotographic photoreceptor thus obtained was corona charged at +6.0 kV, a surface potential of +1200 V was obtained, and when exposed to white light, the residual potential was +450 V or less and the half-potential exposure was 10 lux.・ High sensitivity of less than sec was obtained.

次に、電子受容体としてTCNQ(7,7,8,8,テトラシアノ
キノジメタン)を0.04〜0.1重量%添加したフィルムを2
0μmの膜厚に形成した高分子フィルムとした。これ
を、上記と同様に250〜280℃にて0.5〜5時間の加熱処
理をおこない基板に融着し電荷移動層とした。
Next, a film containing 0.04 to 0.1% by weight of TCNQ (7,7,8,8, tetracyanoquinodimethane) as an electron acceptor was added.
The polymer film was formed to a film thickness of 0 μm. This was subjected to heat treatment at 250 to 280 ° C. for 0.5 to 5 hours in the same manner as above, and was fused to the substrate to form a charge transfer layer.

さらに、光導電層として上記と同様に0.5〜5μmの
a−Si:H層を形成し、Si1-xx:H(0<x<1)を表面
被覆層として0.08〜0.3μm形成して電子写真感光体を
作成した。
Further, an a-Si: H layer having a thickness of 0.5 to 5 μm is formed as a photoconductive layer, and Si 1-x C x : H (0 <x <1) is formed as a surface coating layer to have a thickness of 0.08 to 0.3 μm. To produce an electrophotographic photoreceptor.

この感光体を+900Vに帯電させ同じく白色光にて露光
したところ、半減電位露光量を1.0lux・sec以下と感度
は非常に向上した。これを、従来のa−Si:Hの20μmか
らなる感光体を+400Vに帯電させ白色光で露光した場合
と比較すれば同程度の感度が確認された。また、同じコ
ロナ電位での帯電ではa−Si:Hのみに比べ、帯電電位も
4倍以上と少ない帯電電流で高い感度の感光体が得られ
る事を示した。
When this photoreceptor was charged to +900 V and exposed to white light as well, the half-potential exposure amount was 1.0 lux · sec or less, and the sensitivity was greatly improved. Comparing this with the conventional case where a photoreceptor of 20 μm of a-Si: H was charged to +400 V and exposed with white light, the same level of sensitivity was confirmed. It was also shown that charging with the same corona potential can provide a highly sensitive photoreceptor with a charging current that is four times or more smaller than that of a-Si: H alone.

また、0.2〜2μmのa−Si:H層に炭素を2〜30atm%
添加し、Si1-xx:Hを水素あるいはHeガスに5%以下と
十分に希釈した原料ガスを用いて形成し光導電層とし
た。この場合、残留電位が50V以下と小さな電子写真感
光体を形成することができた。
Also, carbon is 2 to 30 atm% in the a to Si: H layer of 0.2 to 2 μm.
A photoconductive layer was formed by using a source gas in which Si 1-x C x : H was added and hydrogen or He gas was sufficiently diluted to 5% or less. In this case, an electrophotographic photosensitive member having a small residual potential of 50 V or less could be formed.

実施例2 表面研磨したアルミニウムドラム基板に、そのドラム
外径より僅かに小さい円筒状の〜20μm厚のポリ(p−
フェニレン)スルフィドフィルムの内面にシランカップ
リング剤を塗布して装着する。
Example 2 A surface-polished aluminum drum substrate was covered with a cylindrical poly (p-
The silane coupling agent is applied to the inner surface of the phenylene) sulfide film and attached.

本発明で使用されるシランカップリング剤の代表的な
化合物は一般式RnSi4-nで表される有機シラン化合物で
ある。ただしR:有機置換基、X:加水分解性の置換基、n:
1〜3の整数を示す。
A typical compound of the silane coupling agent used in the present invention is an organic silane compound represented by the general formula R n Si 4-n . However, R: organic substituent, X: hydrolyzable substituent, n:
Indicates an integer of 1 to 3.

置換基Rは、脂肪族、芳香族、環状脂肪族、ヘテロ芳
香族等の任意の置換基であるが、この内少なくとも1つ
は活性は基例えばアルキル基が、オレフィン性基、グリ
シジル基、メルカプト基、アミノ基、エポキシ基を有す
るアルキル基もしくはアルカリール基である。
The substituent R is an arbitrary substituent such as aliphatic, aromatic, cycloaliphatic, and heteroaromatic, and at least one of them has an active group such as an alkyl group, an olefinic group, a glycidyl group, and a mercapto group. A group, an amino group, an alkyl group having an epoxy group, or an alkaryl group.

一方、Xは加水分解性を示し。例えばハロゲン、アミ
ノ基、ヒドロキシ基、炭素数1〜4のアルコキシ基であ
る。
On the other hand, X indicates hydrolyzability. For example, halogen, an amino group, a hydroxy group, and an alkoxy group having 1 to 4 carbon atoms.

ドラム基板を乾燥雰囲気中で冷却し熱収縮によって小
さくなった外径のドラムをPPS内に挿入し、常温まで上
昇させるとシランカップリング剤を塗布した面と基板と
が密着し、ドラム状の基板においても電荷移動層を初期
の均一な膜厚で覆うことができる。
When the drum substrate is cooled in a dry atmosphere and the outer diameter of the drum, which has been reduced by heat shrinkage, is inserted into PPS and the temperature is raised to room temperature, the surface coated with the silane coupling agent makes close contact with the substrate, and the drum-shaped substrate Also in the above, the charge transfer layer can be covered with an initial uniform film thickness.

このようなドラム基板を酸素中にて200〜260℃にて0.
5〜10時間加熱し融着した。この状態でのPPSは褐色を帯
びものとなり光学的禁止帯幅で〜2.4eVであった。
Such a drum substrate in oxygen at 200 ~ 260 ℃ 0.
It was heated and fused for 5 to 10 hours. The PPS in this state became brownish and the optical band gap was ~ 2.4 eV.

これを、長さ45cm、内径16cmΦの円筒型の放電電極を
有する容量結合方式プラズマCVD装置内に配置し、反応
容器内を5×10-6Torr以下に排気後、アルミニウムドラ
ムを150〜200℃に加熱した。SiH4を50〜150sccm、C2
2を2〜10sccm、B26をSiH4に対し5〜100ppm、H2
1000〜1500sccm、圧力0.2〜1.0Torr、高周波電力100〜2
50Wで光導電層としてa−Si1-xx:H層を1〜5μm形
成し、続いてSiH4に対しC22を20〜50sccmと増加し、
2を100sccm、として表面被覆層であるa−Si1-xx
を0.05〜0.5μm形成し電子写真感光体とした。この時
のa−Si1-xx:H層の光学的禁止帯幅が1.7〜1.9eVであ
った。
This was placed in a capacitively coupled plasma CVD apparatus having a cylindrical discharge electrode with a length of 45 cm and an inner diameter of 16 cmΦ, and after evacuation of the reaction vessel to 5 × 10 −6 Torr or less, the aluminum drum was heated to 150 to 200 ° C. Heated to. SiH 4 50-150sccm, C 2 H
2 to 2-10 sccm, B 2 H 6 to SiH 4 5 to 100 ppm, H 2
1000-1500sccm, pressure 0.2-1.0Torr, high frequency power 100-2
An a-Si 1-x C x : H layer is formed as a photoconductive layer at 50 W for 1 to 5 μm, and then C 2 H 2 is increased to 20 to 50 sccm for SiH 4 ,
With H 2 at 100 sccm, an a-Si 1-x C x layer as a surface coating layer was formed in an amount of 0.05 to 0.5 μm to obtain an electrophotographic photoreceptor. At this time, the optical bandgap of the a-Si 1-x C x : H layer was 1.7 to 1.9 eV.

この感光体を670nmのLEDを光源とする光プリンタに実
装し、正帯電において+500〜800Vの表面電位で鮮明な
印字を確認した。このドラムの残留電位は+100〜200V
であった。
This photoconductor was mounted on an optical printer using a 670 nm LED as a light source, and clear printing was confirmed at a surface potential of +500 to 800 V when positively charged. The residual potential of this drum is + 100-200V
Met.

また、a−Si1-xx:HにGeを添加したa−(Si1-zG
ez1-xx:Hを用いれば更に感度の向上が計られた。
In addition, a- (Si 1-z G obtained by adding Ge to a-Si 1-x C x : H
The sensitivity was further improved by using e z ) 1-x C x : H.

表面被覆層としてa−Si1-xx層に代わる材料として
0.1〜0.5μmのa−Ge1-xx:H(0<x<1)をプラズ
マCVD法で形成し、同様に光プリンタに実装したとこ
ろ、この構成の電子写真感光体が耐熱性、耐湿性に優
れ、50万枚の耐刷性を有することを確認した。
As a material to replace the a-Si 1-x C x layer as a surface coating layer
When 0.1 to 0.5 μm of a-Ge 1-x C x : H (0 <x <1) was formed by the plasma CVD method and mounted on an optical printer in the same manner, the electrophotographic photosensitive member of this structure showed heat resistance, It was confirmed that it has excellent moisture resistance and has a printing durability of 500,000 sheets.

また、PPS高分子層にTCNQを電子受容体として0.02〜
0.1wt%添加することによって、更に残留電位が50〜90V
と小さな電子写真感光体を得ることができた。
In addition, TCNQ as an electron acceptor in the PPS polymer layer is 0.02-
By adding 0.1wt%, the residual potential becomes 50 ~ 90V.
And a small electrophotographic photoreceptor was obtained.

発明の効果 本発明によれば、光励起によって移動可能なキャリア
を発生する光導電層を、電荷移動層上に積層する際、前
記電荷移動層を加熱処理による融着により形成すること
により、耐熱性に優れたキャリアのμτ積の大きな電荷
移動層を、均一な膜厚に、また塗布装置を使用しないで
形成することが可能となる。
EFFECTS OF THE INVENTION According to the present invention, when a photoconductive layer that generates movable carriers by photoexcitation is laminated on a charge transfer layer, the charge transfer layer is formed by fusion by heat treatment, so that heat resistance is improved. It is possible to form a charge transfer layer having an excellent carrier and a large μτ product with a uniform film thickness and without using a coating apparatus.

以上の相乗効果により、残留電位の小さな、高感度で
帯電電位の大きな電子写真感光体が安価に得られる。
Due to the above synergistic effect, an electrophotographic photosensitive member having a small residual potential, high sensitivity and a large charging potential can be obtained at low cost.

【図面の簡単な説明】[Brief description of drawings]

図は、本発明の実施例により製造される電子写真感光体
の断面図である。 1……支持体、2……電荷移動層、3……光導電層、4
……自由表面、
FIG. 1 is a sectional view of an electrophotographic photosensitive member manufactured according to an example of the present invention. DESCRIPTION OF SYMBOLS 1 ... Support, 2 ... Charge transfer layer, 3 ... Photoconductive layer, 4
...... Free surface,

フロントページの続き (72)発明者 秋山 浩二 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 阪原 千里 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (72)発明者 渡辺 正則 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 (56)参考文献 特開 昭60−59353(JP,A) 特開 昭55−90954(JP,A) 特開 昭58−98735(JP,A) 特開 昭58−80646(JP,A) 特公 昭45−10273(JP,B1)Front page continuation (72) Inventor Koji Akiyama 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (72) Inventor Chisato Sakahara Osaka, Kadoma City, Osaka Prefecture Person Masanori Watanabe 1006 Kadoma, Kadoma-shi, Osaka Prefecture Matsushita Electric Industrial Co., Ltd. (56) Reference JP-A-60-59353 (JP, A) JP-A-55-90954 (JP, A) JP-A-58-98735 (JP, A) JP 58-80646 (JP, A) JP 45-10273 (JP, B1)

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】導電性支持体上に、光導電層、高分子フィ
ルムを主成分とした電荷移動層が積層された電子写真感
光体において、前記電荷移動層をポリ(p−フェニレ
ン)スルフィドを主成分とした高分子フィルムとし、加
熱処理による融着により形成する工程を有する電子写真
感光体の製造方法。
1. An electrophotographic photoreceptor comprising a photoconductive layer and a charge transfer layer comprising a polymer film as a main component, which is laminated on a conductive support, wherein the charge transfer layer comprises poly (p-phenylene) sulfide. A method for producing an electrophotographic photosensitive member, comprising a step of forming a polymer film as a main component by fusion by heat treatment.
【請求項2】電荷移動層である高分子フィルムに電子受
容体を添加することを特徴とした特許請求の範囲第1項
記載の電子写真感光体の製造方法。
2. The method for producing an electrophotographic photosensitive member according to claim 1, wherein an electron acceptor is added to the polymer film which is the charge transfer layer.
【請求項3】光導電層が局在化状態密度を減少せしめる
修飾物質を含む非晶質層を形成する工程を有する特許請
求の範囲第1項記載の電子写真感光体の製造方法。
3. The method for producing an electrophotographic photoreceptor according to claim 1, further comprising the step of forming an amorphous layer containing a modifying substance in which the photoconductive layer reduces the density of localized states.
【請求項4】自由表面に表面被服層を形成する工程を有
する特許請求の範囲第1項記載の電子写真感光体の製造
方法。
4. The method for producing an electrophotographic photosensitive member according to claim 1, further comprising the step of forming a surface coating layer on the free surface.
JP62158221A 1987-05-07 1987-06-25 Method for manufacturing electrophotographic photoreceptor Expired - Lifetime JPH0823706B2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP62158221A JPH0823706B2 (en) 1987-06-25 1987-06-25 Method for manufacturing electrophotographic photoreceptor
US07/190,093 US4886719A (en) 1987-05-07 1988-05-04 Electrophotography photosensitive member and a method for fabricating same
DE3855975T DE3855975T2 (en) 1987-05-07 1988-05-06 Photosensitive, electrophotographic element and process for its manufacture
EP88304123A EP0290270B1 (en) 1987-05-07 1988-05-06 Electrophotography photosensitive member and a method for fabricating same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62158221A JPH0823706B2 (en) 1987-06-25 1987-06-25 Method for manufacturing electrophotographic photoreceptor

Publications (3)

Publication Number Publication Date
JPS642062A JPS642062A (en) 1989-01-06
JPH012062A JPH012062A (en) 1989-01-06
JPH0823706B2 true JPH0823706B2 (en) 1996-03-06

Family

ID=15666930

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62158221A Expired - Lifetime JPH0823706B2 (en) 1987-05-07 1987-06-25 Method for manufacturing electrophotographic photoreceptor

Country Status (1)

Country Link
JP (1) JPH0823706B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1340037C (en) * 1985-06-17 1998-09-08 Stanley Lustig Puncture resistant, heat-shrinkable films containing very low density polyethylene copolymer
US5256351A (en) * 1985-06-17 1993-10-26 Viskase Corporation Process for making biaxially stretched, heat shrinkable VLDPE films

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5590954A (en) * 1978-12-29 1980-07-10 Toray Ind Inc Photoconductor
JPS57105744A (en) * 1980-12-23 1982-07-01 Canon Inc Photoconductive member
JPS57165846A (en) * 1981-04-07 1982-10-13 Canon Inc Support for use in image bearing material
JPS5880646A (en) * 1981-11-09 1983-05-14 Canon Inc electrophotographic photoreceptor
JPS5898735A (en) * 1981-12-08 1983-06-11 Canon Inc Recording body for electrophotography
JPS6059353A (en) * 1983-09-13 1985-04-05 Toshiba Corp Electrophotographic sensitive body
JPH0721644B2 (en) * 1985-05-31 1995-03-08 富士ゼロックス株式会社 Photoconductive member

Also Published As

Publication number Publication date
JPS642062A (en) 1989-01-06

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