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JP2722785B2 - High purity silica powder - Google Patents
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JP2722785B2 - High purity silica powder - Google Patents

High purity silica powder

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Publication number
JP2722785B2
JP2722785B2 JP15863990A JP15863990A JP2722785B2 JP 2722785 B2 JP2722785 B2 JP 2722785B2 JP 15863990 A JP15863990 A JP 15863990A JP 15863990 A JP15863990 A JP 15863990A JP 2722785 B2 JP2722785 B2 JP 2722785B2
Authority
JP
Japan
Prior art keywords
silica powder
ppm
purity
silicon
crucible
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP15863990A
Other languages
Japanese (ja)
Other versions
JPH0450113A (en
Inventor
滋 斎藤
勝実 小木
信幸 曽山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP15863990A priority Critical patent/JP2722785B2/en
Publication of JPH0450113A publication Critical patent/JPH0450113A/en
Application granted granted Critical
Publication of JP2722785B2 publication Critical patent/JP2722785B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は高純度シリカ粉に関する。詳しくは、OH基の
含有量が少なく、シリコン単結晶引上げ用ルツボの原料
としては好適な四塩化ケイ素の加水分解で合成された高
純度シリカ粉に関する。
The present invention relates to high-purity silica powder. More specifically, the present invention relates to a high-purity silica powder synthesized by hydrolysis of silicon tetrachloride, which has a low OH group content and is suitable as a raw material for a silicon single crystal pulling crucible.

〔従来技術と問題点〕[Conventional technology and problems]

シリコン単結晶引上げ用の石英ルツボは、従来天然石
英を粉砕、生成した石英粉を用いてアーク溶融成形して
製造されている。しかし最近の超LSIの実用化などに伴
い、高純度の各種電子材料が要望されるに至り、シリコ
ン自体の不純物ばかりでなく、単結晶引上げに使用され
る石英ルツボから単結晶中への不純物混入が問題となっ
て、単結晶引上げ用ルツボも高純度のものが要望されて
いるのが現状である。
BACKGROUND ART A quartz crucible for pulling a silicon single crystal has conventionally been manufactured by pulverizing natural quartz and arc-melting using quartz powder produced. However, with the recent commercialization of VLSI, various kinds of high-purity electronic materials have been demanded. Not only impurities in silicon itself, but also impurities in single crystals from quartz crucibles used for pulling single crystals At present, there is a demand for a single crystal pulling crucible having high purity.

従来シリコン単結晶引上げ用ルツボの製造に用いられ
ている精製天然石英の特性としては、 粒 度 +48メッシュ 1.0%未満 +80メッシュ 50.0%以上 +200メッシュ 99.0%以上 嵩密度 1.35〜1.45 OH基 70〜100ppm 結晶性 クォーツ であり、これらの特性についてはルツボ製造上問題はな
いが、天然石英中には、例えば、アルミニウム(8.0pp
m)、鉄(0.5ppm)、ナトリウム(0.8ppm)、ホウ素
(<0.1ppm)、リチウム(0.2ppm)、カリウム(0.2pp
m)、チタン(1.3ppm)等の不純物含有量が多く、その
除去には限度があり、前記以上の高純度品を得ることは
困難である。
The characteristics of refined natural quartz that has been conventionally used in the production of crucibles for pulling silicon single crystals are as follows: Granularity +48 mesh less than 1.0% +80 mesh 50.0% or more +200 mesh 99.0% or more bulk density 1.35 to 1.45 OH group 70 to 100 ppm crystal It has no problem in the production of crucibles for these properties, but natural quartz contains, for example, aluminum (8.0 pp).
m), iron (0.5 ppm), sodium (0.8 ppm), boron (<0.1 ppm), lithium (0.2 ppm), potassium (0.2 pp)
m), the content of impurities such as titanium (1.3 ppm) is large, and there is a limit in the removal thereof, and it is difficult to obtain a high-purity product having a purity higher than the above.

そこで天然石英にかわるものとして、合成石英の高純
度品の開発研究が行なわれ、四塩化ケイ素の加水分解法
が取り上げられるに至った。四塩化ケイ素の加水分解に
より合成シリカ粉を製造する方法は、従来いろいろ提案
されているが、高純度ルツボ製造用合成シリカ粉につい
ては、不純物含有量、粒度、嵩密度、OH基含有量、結晶
性等について厳密な制約があり、これらの規制範囲をは
ずれると、ルツボの成形が難しいことが知られている。
Therefore, as a substitute for natural quartz, research and development of high-purity synthetic quartz has been conducted, and the hydrolysis method of silicon tetrachloride has been taken up. Various methods for producing synthetic silica powder by hydrolysis of silicon tetrachloride have been proposed in the past.For synthetic silica powder for producing high-purity crucibles, however, impurities content, particle size, bulk density, OH group content, crystal It is known that there are strict restrictions on the properties and the like, and if these restrictions are not met, crucible molding is difficult.

合成石英は純度は互いが、OH基の含有量が多く、通常
300〜1200ppm含有している。OH基が多いと高温での粘性
が低くなるため、1500℃以上でシリコン単結晶を引上げ
るときルツボの形状を保持することが困難となる。また
OH基はシリコン融液との反応性に富み、ルツボ本体から
溶出して、シリコン単結晶中の酸素濃度を増加し、欠陥
を誘起するので非常に好ましくない。
Synthetic quartz has a high purity of each other and a large content of OH groups.
Contains 300 to 1200 ppm. If there are many OH groups, the viscosity at high temperatures will be low, and it will be difficult to maintain the shape of the crucible when pulling a silicon single crystal at 1500 ° C. or higher. Also
OH groups are very undesirable because they are highly reactive with the silicon melt, elute from the crucible body, increase the oxygen concentration in the silicon single crystal, and induce defects.

このような事情から、ルツボ製造用合成石英のOH基を
少なくする工夫が提案されている。たとえば、ゾル−ゲ
ル法で合成したゲル状シリカを加熱してα−クリストバ
ライトに結晶化させる方法(特開平2−9783号公報)が
開示されている。しかし、この方法は金属アルコキシド
を出発原料としており、原料合成にコストと手数を要す
る問題がある。四塩化ケイ素を加水分解して得られた合
成シリカ粉のOH基を少くする試みはまだなされていな
い。
Under such circumstances, a device for reducing the number of OH groups in synthetic quartz for crucible production has been proposed. For example, a method has been disclosed in which a gel-like silica synthesized by a sol-gel method is heated to crystallize into α-cristobalite (Japanese Patent Application Laid-Open No. 2-9783). However, this method uses a metal alkoxide as a starting material, and has a problem that the synthesis of the starting material requires cost and trouble. No attempt has been made to reduce the number of OH groups in the synthetic silica powder obtained by hydrolyzing silicon tetrachloride.

本発明は前記の事情からなされたもので、四塩化ケイ
素の加水分解によって得られる合成シリカ粉のOH基含有
量が100ppm以下に抑制された高純度シリカ粉を提供する
ことを目的とする。
The present invention has been made in view of the above circumstances, and has as its object to provide a high-purity silica powder in which the OH group content of a synthetic silica powder obtained by hydrolysis of silicon tetrachloride is suppressed to 100 ppm or less.

〔問題を解決するための手段・発明の構成〕[Means for Solving the Problem / Configuration of the Invention]

すなわち本発明は、四塩化ケイ素を加水分解して製造
された合成シリカ粉を1,400℃以上の温度で焼成してな
ることを特徴とするOH基濃度が100ppm以下である高純度
シリカ粉を提供する。
That is, the present invention provides a high-purity silica powder having an OH group concentration of 100 ppm or less, wherein the synthetic silica powder produced by hydrolyzing silicon tetrachloride is calcined at a temperature of 1,400 ° C. or more. .

本発明の高純度シリカ粉末は、四塩化ケイ素を加水分
解して合成された二酸化ケイ素を乾燥、焼成して得られ
る合成シリカ粉末である。さらに本発明において、前記
焼成温度は1400℃以上の温度である。従来四塩化ケイ素
の加水分解法によって製造された合成シリカ粉末は1400
℃未満で焼成され、OH基含有量が300〜1200ppmであっ
て、シリコン単結晶引上げ用の石英ルツボの製造原料と
しては適したものではない。その理由は前述のように、
OH基が多いシリカは、高温における粘性が低いため、15
00℃以上においてシリコン単結晶の引上げ用ルツボとし
て用いる場合、ルツボの変形を生じてその形状を保持す
ることが困難となること、およびOH基はシリコン融液と
反応してシリコン中の酸素濃度を増加するため、得られ
るシリコン単結晶の欠陥を融起すること、が挙げられ
る。
The high-purity silica powder of the present invention is a synthetic silica powder obtained by drying and calcining silicon dioxide synthesized by hydrolyzing silicon tetrachloride. Further, in the present invention, the firing temperature is a temperature of 1400 ° C. or more. Conventionally, synthetic silica powder produced by the hydrolysis method of silicon tetrachloride is 1400
It is baked at less than ℃ and has an OH group content of 300 to 1200 ppm, which is not suitable as a raw material for producing a quartz crucible for pulling a silicon single crystal. As mentioned above,
Silica with many OH groups has low viscosity at high temperature,
When used as a crucible for pulling a silicon single crystal at a temperature of 00 ° C. or higher, it is difficult to maintain the shape due to deformation of the crucible, and OH groups react with the silicon melt to reduce the oxygen concentration in the silicon. Melting the defects in the obtained silicon single crystal.

本発明のシリカ粉末のOH基含有量は100ppm以下であ
る。その特性は、 嵩密度 1.2〜1.27 OH基 30〜55ppm 結晶性 クリストバライト 不純物含有量 Al、Fe、Ne、B、Li、K、Ti、Zr、いず
れも0.1ppm以下 粒度分布 +48メッシュ 1.0%未満 +80メッシュ 50%以上 +200メッシュ 99%以上 であり、シリコン単結晶引上げ用石英ルツボの原料とし
て好適なシリカ粉末である。
The OH group content of the silica powder of the present invention is 100 ppm or less. Its characteristics are: Bulk density 1.2-1.27 OH group 30-55ppm Crystalline cristobalite Impurity content Al, Fe, Ne, B, Li, K, Ti, Zr, 0.1ppm or less for all Particle size distribution +48 mesh Less than 1.0% +80 mesh 50% or more +200 mesh 99% or more, which is a silica powder suitable as a raw material of a quartz crucible for pulling a silicon single crystal.

本発明において、四塩化ケイ素の加水分解生成物を焼
成するときの温度は1,400℃を越える温度である。1,400
℃以下で焼成したものはOH基が100ppm以下とならないの
で、欠陥の少ないシリコン単結晶引上げ用石英ルツボの
原料として適当でない。
In the present invention, the temperature at which the hydrolysis product of silicon tetrachloride is fired is a temperature exceeding 1,400 ° C. 1,400
Since those baked at a temperature of not more than 100 ° C. do not have OH groups of not more than 100 ppm, they are not suitable as raw materials for a quartz crucible for pulling a silicon single crystal having few defects.

〔発明の具体的開示〕[Specific disclosure of the invention]

以下、実施例および比較例により本発明を具体的に説
明する。
Hereinafter, the present invention will be specifically described with reference to Examples and Comparative Examples.

実施例1、2 四塩化ケイ素加水分解法で得られた合成シリカをそれ
ぞれ1,420℃および1,450℃で50時間焼成してシリカ粉と
した。このシリカ粉の含有不純物(第1表)、嵩密度
(第2表)、OH基濃度(第3表)を測定した。
Examples 1 and 2 Synthetic silica obtained by the silicon tetrachloride hydrolysis method was calcined at 1,420 ° C. and 1,450 ° C. for 50 hours to obtain silica powder. The impurities contained in the silica powder (Table 1), the bulk density (Table 2), and the OH group concentration (Table 3) were measured.

比較例1、2 実施例で用いた合成シリカを1,300℃および1,200℃で
それぞれ50時間焼成して得たシリカ粉について実施例に
準じて測定を行なった。結果を第1〜4表に併記した。
Comparative Examples 1 and 2 The silica powder obtained by calcining the synthetic silica used in the examples at 1,300 ° C. and 1,200 ° C. for 50 hours was measured according to the examples. The results are shown in Tables 1 to 4.

比較例3、4 天然石英を精製して得たシリカ粉(比較例3)および
市販のシリカ粉(比較例4)について、実施例に準じて
測定を行ない、結果を第1〜4表に併記した。
Comparative Examples 3 and 4 The silica powder obtained by purifying natural quartz (Comparative Example 3) and a commercially available silica powder (Comparative Example 4) were measured in accordance with the examples, and the results are shown in Tables 1 to 4. did.

第1図は、四塩化ケイ素加水分解法生成物を乾燥後の
合成シリカ粉10mgを天然秤で測定した結果を示す。この
図に見られるように1200℃を越える温度で顕著な重量減
少が認められる。第2図(A)、(B)、(C)は、そ
れぞれ1200℃、1300℃、1420℃で50時間焼成した合成シ
リカのX線回折図である。1400℃以上の温度で焼成した
シリカは完全にクリストバライトの結晶化ピークを示
す。これらの結果は、1200℃あたりから起り始めた変化
が1400℃に到って、完了し、この温度で完全なクリスト
バライト結晶になったことを意味する。
FIG. 1 shows the result of measurement of 10 mg of a synthetic silica powder after drying the product of the hydrolysis of silicon tetrachloride using a natural balance. As can be seen in this figure, a significant weight loss is observed at temperatures above 1200 ° C. FIGS. 2 (A), (B) and (C) are X-ray diffraction diagrams of synthetic silica calcined at 1200 ° C., 1300 ° C. and 1420 ° C. for 50 hours, respectively. Silica calcined at a temperature of 1400 ° C. or more completely shows cristobalite crystallization peak. These results indicate that the change starting at around 1200 ° C. reaches 1400 ° C. and is complete and at this temperature complete cristobalite crystals.

〔発明の効果〕〔The invention's effect〕

本発明の合成シリカ粉を使用した作製したルツボは従
来の天然石英ルツボに比較し、OH基含有量が100ppm以下
の高純度シリカであるため、引上げられたシリコン単結
晶も高純度を維持できる。本発明の高純度シリカはCCD
用、パワートランジスター用などに需要が増大すること
が期待される。
The crucible produced using the synthetic silica powder of the present invention is a high-purity silica having an OH group content of 100 ppm or less as compared with a conventional natural quartz crucible, so that a pulled silicon single crystal can maintain high purity. The high-purity silica of the present invention is a CCD
Demand is expected to increase for power transistors and power transistors.

【図面の簡単な説明】[Brief description of the drawings]

第1図は四塩化ケイ素加水分解法で得られた合成シリカ
粉の熱天秤測定結果のチャート、第2図の(A)は前記
合成シリカ粉を1,200℃で、(B)は1,300℃で、(C)
は1420℃で、それぞれ50時間焼成したもののX線回折図
である。
FIG. 1 is a chart of the results of thermobalance measurement of the synthetic silica powder obtained by the silicon tetrachloride hydrolysis method, FIG. 2 (A) shows the synthetic silica powder at 1,200 ° C., and FIG. (C)
FIG. 3 is an X-ray diffraction diagram of a sample fired at 1420 ° C. for 50 hours.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】四塩化ケイ素を加水分解して製造された合
成シリカ粉を1,400℃以上の温度で焼成してなることを
特徴とするOH基濃度が100ppm以下である高純度シリカ
粉。
1. A high-purity silica powder having an OH group concentration of 100 ppm or less, characterized in that a synthetic silica powder produced by hydrolyzing silicon tetrachloride is calcined at a temperature of 1,400 ° C. or more.
JP15863990A 1990-06-19 1990-06-19 High purity silica powder Expired - Fee Related JP2722785B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15863990A JP2722785B2 (en) 1990-06-19 1990-06-19 High purity silica powder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15863990A JP2722785B2 (en) 1990-06-19 1990-06-19 High purity silica powder

Publications (2)

Publication Number Publication Date
JPH0450113A JPH0450113A (en) 1992-02-19
JP2722785B2 true JP2722785B2 (en) 1998-03-09

Family

ID=15676109

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15863990A Expired - Fee Related JP2722785B2 (en) 1990-06-19 1990-06-19 High purity silica powder

Country Status (1)

Country Link
JP (1) JP2722785B2 (en)

Also Published As

Publication number Publication date
JPH0450113A (en) 1992-02-19

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