JP2805865B2 - Vapor phase growth method of phosphorus compound semiconductor crystal - Google Patents
Vapor phase growth method of phosphorus compound semiconductor crystalInfo
- Publication number
- JP2805865B2 JP2805865B2 JP1182614A JP18261489A JP2805865B2 JP 2805865 B2 JP2805865 B2 JP 2805865B2 JP 1182614 A JP1182614 A JP 1182614A JP 18261489 A JP18261489 A JP 18261489A JP 2805865 B2 JP2805865 B2 JP 2805865B2
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- growth
- substrate
- phosphorus compound
- compound semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title claims description 26
- 238000000034 method Methods 0.000 title claims description 14
- 239000013078 crystal Substances 0.000 title claims description 13
- 229910052698 phosphorus Inorganic materials 0.000 title claims description 9
- 239000011574 phosphorus Substances 0.000 title claims description 9
- -1 phosphorus compound Chemical class 0.000 title claims description 6
- 238000001947 vapour-phase growth Methods 0.000 title description 3
- 239000000758 substrate Substances 0.000 claims description 32
- 239000007789 gas Substances 0.000 claims description 11
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 7
- 239000011261 inert gas Substances 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 5
- 239000012808 vapor phase Substances 0.000 claims description 4
- 238000009792 diffusion process Methods 0.000 description 6
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000002109 crystal growth method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、有機金属原料ガスを用いて半導体基板上に
リン化合物半導体結晶を気相成長させる方法に関する。Description: TECHNICAL FIELD The present invention relates to a method for vapor-phase growing a phosphorus compound semiconductor crystal on a semiconductor substrate using an organic metal source gas.
(従来の技術) 従来の有機金属気相成長方法は、半導体基板を準備室
や搬送室を介して成長室に移し、有機金属原料ガスを該
基板上で熱分解させ、結晶成長させる方法である。成長
室の半導体基板の交換は、成長室及び搬送室を個々に
真空に引いてから両者の仕切りを開けて交換する方法、
両者を大気圧にしてから仕切りを開けて交換する方
法、成長室より搬送室にガスを流しながら交換する方
法などが採用されている。(Prior Art) A conventional metal organic chemical vapor deposition method is a method in which a semiconductor substrate is transferred to a growth chamber via a preparation chamber or a transfer chamber, and an organic metal source gas is thermally decomposed on the substrate to grow a crystal. . The method of exchanging the semiconductor substrate in the growth chamber is to individually evacuate the growth chamber and the transfer chamber, and then open the two partitions to exchange them.
A method of exchanging both by opening the partition after setting both at atmospheric pressure, and a method of exchanging while flowing gas from the growth chamber to the transfer chamber are adopted.
(発明が解決しようとする課題) 有機金属気相成長方法では、蒸気圧の高い物質、例え
ば、リンなどが結晶超過程で成長室内に堆積しており、
上記の半導体基板の交換方法では、搬送室と成長室の仕
切りを開けると、上記堆積物が搬送室に拡散して半導体
基板を汚染するという問題があった。(Problems to be Solved by the Invention) In the metalorganic vapor phase epitaxy method, a substance having a high vapor pressure, for example, phosphorus, is deposited in a growth chamber during a crystal super process,
In the above-described method of exchanging semiconductor substrates, there is a problem that when the partition between the transfer chamber and the growth chamber is opened, the deposits diffuse into the transfer chamber and contaminate the semiconductor substrate.
本発明は、上記の問題点を解消し、上記堆積物による
半導体基板の汚染を回避して、半導体基板の交換を可能
とするリン化合物半導体結晶の気相成長方法を提供しよ
うとするものである。An object of the present invention is to solve the above-mentioned problems and to provide a method for vapor-phase growth of a phosphorus compound semiconductor crystal, which makes it possible to replace a semiconductor substrate while avoiding contamination of the semiconductor substrate by the deposits. .
(課題を解決するための手段) 本発明は、半導体基板を搬送室中のサセプタに装着
し、前記基板を前記サセプタとともに成長室内に移送し
た後、少なくとも有機金属を含有する原料ガスを前記基
板上に導入してリン化合物半導体結晶を気相成長する方
法において、前記搬送室と前記成長室の間で前記基板を
移送する間、一定流量の不活性ガス又は水素ガスを前記
搬送室から前記成長室に向けて流すことを特徴とするリ
ン化合物半導体結晶の気相成長方法である。(Means for Solving the Problems) According to the present invention, after a semiconductor substrate is mounted on a susceptor in a transfer chamber and the substrate is transferred into a growth chamber together with the susceptor, a source gas containing at least an organic metal is deposited on the substrate. And introducing a constant flow rate of an inert gas or hydrogen gas from the transfer chamber to the growth chamber while transferring the substrate between the transfer chamber and the growth chamber. A method for vapor-phase growth of a phosphorus compound semiconductor crystal characterized by flowing toward
(作用) 第1図は本発明の気相結晶成長方法を説明するための
説明図である。同図(a)は結晶成長中か、待機中の状
態を示し、同図(b)は半導体基板の搬送時の状態を示
したものである。この結晶成長装置は、同図(a)のよ
うに、主に反応室1、搬送室8及び準備室11からなり、
反応室1には軸4に支持されたサセプタ2が配置され、
半導体基板3を反応室1の中央に保持している。原料ガ
スは反応室1頂部の導入口5より導入され、半導体基板
3の表面で熱分解して結晶成長を行うとともに、下部の
排気口6より排気される。その間、成長室1の開閉底7
は閉鎖されている。結晶成長を終了した後、原料ガスの
供給を停止し、成長室1内の残留ガスを排気してから、
同図(b)のように、上記開閉底7を下げてガス導入口
9より不活性ガス又は水素ガスを導入し、点線矢印のよ
うに搬送室8から反応室1を経て排気口6より排気す
る。その間に、サセプタ2上の半導体基板3を搬送用ア
ーム13によりカセット12の新しいものと交換する。この
不活性ガス又は水素ガスの流れにより、成長時に堆積し
た汚染物質が成長室から搬送室に拡散することを抑止
し、搬送室の汚染、ひいては新しい半導体基板の汚染を
防止することができる。なお、不活性ガスとしては、窒
素ガス等を用いることができ、不活性ガスの供給量は、
汚染物質の拡散速度に見合うもの以上に設定する必要が
ある。半導体基板を交換した後は、サセプタ2は、再び
成長室1に戻し、開閉底7を閉じて結晶成長を開始する
とともに、所定のエピタキシャル層を形成した半導体基
板は、搬送室8から準備室11の基板用カセット12に戻
し、ゲートバルブ10を閉じてから、装置の外に取り出
す。(Operation) FIG. 1 is an explanatory diagram for explaining the vapor phase crystal growth method of the present invention. FIG. 3A shows a state during crystal growth or standby, and FIG. 3B shows a state during transfer of the semiconductor substrate. This crystal growth apparatus mainly comprises a reaction chamber 1, a transfer chamber 8 and a preparation chamber 11, as shown in FIG.
A susceptor 2 supported on a shaft 4 is arranged in the reaction chamber 1,
The semiconductor substrate 3 is held at the center of the reaction chamber 1. The source gas is introduced from an inlet 5 at the top of the reaction chamber 1, thermally decomposes on the surface of the semiconductor substrate 3 to grow crystals, and is exhausted from an exhaust port 6 below. Meanwhile, the opening and closing bottom 7 of the growth chamber 1
Is closed. After the crystal growth is completed, the supply of the raw material gas is stopped, and the residual gas in the growth chamber 1 is exhausted.
As shown in FIG. 2B, the opening / closing bottom 7 is lowered, an inert gas or hydrogen gas is introduced from the gas inlet 9, and exhausted from the transfer chamber 8 through the reaction chamber 1 through the exhaust chamber 6 as indicated by a dotted arrow. I do. In the meantime, the semiconductor substrate 3 on the susceptor 2 is exchanged with a new cassette 12 by the transfer arm 13. By the flow of the inert gas or the hydrogen gas, it is possible to prevent the contaminants deposited during the growth from diffusing from the growth chamber to the transfer chamber, and to prevent the transfer chamber from being contaminated, and consequently a new semiconductor substrate from being contaminated. In addition, as the inert gas, nitrogen gas or the like can be used, and the supply amount of the inert gas is
It must be set to a value that is higher than the diffusion rate of contaminants. After replacing the semiconductor substrate, the susceptor 2 is returned to the growth chamber 1 again, the opening and closing bottom 7 is closed to start crystal growth, and the semiconductor substrate on which a predetermined epitaxial layer is formed is transferred from the transfer chamber 8 to the preparation chamber 11. The substrate is returned to the substrate cassette 12, and the gate valve 10 is closed, and then taken out of the apparatus.
(実施例) 第1図の装置を用い、内径200mmの反応室内で半導体
基板上にInPエピタキシャル層を気相成長させた。半導
体基板を交換するため、成長室の開閉底20mm開口し、水
素ガスを3/minで搬送室のガス導入口より導入し、反
応室に流したところ、搬送室内にはリンの堆積を見いだ
すことはできなかった。Example An InP epitaxial layer was vapor-phase grown on a semiconductor substrate in a reaction chamber having an inner diameter of 200 mm using the apparatus shown in FIG. To replace the semiconductor substrate, open and close the bottom of the growth chamber 20 mm, introduce hydrogen gas at 3 / min from the gas inlet of the transfer chamber, and let hydrogen flow into the reaction chamber. Could not.
なお、水素ガスの供給量は、次のように決定した。上
記開閉底の開口面積は約125.6cm2(2πrh=20×3.14×
2)となり、リンの拡散係数は正確に調べられていない
ので、リンより分子量が大きく、拡散係数も大き炭酸ガ
スの空気中の拡散係数D=0.135cm2/secを仮にリンの拡
散係数として拡散距離L及び拡散速度Sを求めると、 L=2(Dt)1/2=0.73cm S=L/t=0.73cm/sec となり、この拡散速度に見合う不活性ガスの供給量Vを
求めると、 V≒92cm/sec=5.5/min となったので、上記の6/minで供給した。The supply amount of the hydrogen gas was determined as follows. The opening area of the opening and closing bottom is about 125.6cm 2 (2πrh = 20 × 3.14 ×
2) Since the diffusion coefficient of phosphorus has not been accurately determined, the diffusion coefficient of carbon dioxide gas in air is larger than that of phosphorus, and the diffusion coefficient is 0.135 cm 2 / sec. When the distance L and the diffusion speed S are obtained, L = 2 (Dt) 1/2 = 0.73 cm S = L / t = 0.73 cm / sec. When the supply amount V of the inert gas corresponding to the diffusion speed is obtained, Since V ≒ 92 cm / sec = 5.5 / min, it was supplied at the above 6 / min.
(発明の効果) 本発明は、上記の構成を採用することにより、半導体
基板を成長室に移送するときに、基板表面を堆積物で汚
染することを防止することができ、清浄な基板表面にエ
ピタキシャル成長を行うことができるようになった。(Effect of the Invention) According to the present invention, by adopting the above configuration, it is possible to prevent the substrate surface from being contaminated with deposits when transferring the semiconductor substrate to the growth chamber, and to provide a clean substrate surface. Epitaxial growth can now be performed.
第1図(a)及び(b)は本発明の半導体基板の交換操
作を説明するための図である。FIGS. 1 (a) and 1 (b) are views for explaining a semiconductor substrate exchange operation of the present invention.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭63−99524(JP,A) 特開 昭58−210843(JP,A) (58)調査した分野(Int.Cl.6,DB名) C30B 1/00 - 35/00 H01L 21/205────────────────────────────────────────────────── (5) References JP-A-63-99524 (JP, A) JP-A-58-210843 (JP, A) (58) Fields investigated (Int. Cl. 6 , DB name) C30B 1/00-35/00 H01L 21/205
Claims (1)
し、前記基板を前記サセプタとともに成長室内に移送し
た後、少なくとも有機金属を含有する原料ガスを前記基
板上に導入してリン化合物半導体結晶を気相成長する方
法において、前記搬送室と前記成長室の間で前記基板を
移送する間、一定流量の不活性ガス又は水素ガスを前記
搬送室から前記成長室に向けて流すことを特徴とするリ
ン化合物半導体結晶の気相成長方法。A semiconductor substrate is mounted on a susceptor in a transfer chamber, and the substrate is transferred together with the susceptor into a growth chamber. Then, a source gas containing at least an organic metal is introduced onto the substrate to form a phosphorus compound semiconductor crystal. In the method of vapor-phase growing a substrate, a constant flow rate of an inert gas or a hydrogen gas is flowed from the transfer chamber toward the growth chamber while the substrate is transferred between the transfer chamber and the growth chamber. Vapor growth method of phosphorus compound semiconductor crystal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1182614A JP2805865B2 (en) | 1989-07-17 | 1989-07-17 | Vapor phase growth method of phosphorus compound semiconductor crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1182614A JP2805865B2 (en) | 1989-07-17 | 1989-07-17 | Vapor phase growth method of phosphorus compound semiconductor crystal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0350184A JPH0350184A (en) | 1991-03-04 |
| JP2805865B2 true JP2805865B2 (en) | 1998-09-30 |
Family
ID=16121371
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1182614A Expired - Fee Related JP2805865B2 (en) | 1989-07-17 | 1989-07-17 | Vapor phase growth method of phosphorus compound semiconductor crystal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2805865B2 (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58210843A (en) * | 1982-06-02 | 1983-12-08 | Hitachi Ltd | Vapor deposition device |
-
1989
- 1989-07-17 JP JP1182614A patent/JP2805865B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0350184A (en) | 1991-03-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |