JP2872799B2 - Semiconductor sealing method - Google Patents
Semiconductor sealing methodInfo
- Publication number
- JP2872799B2 JP2872799B2 JP2292996A JP29299690A JP2872799B2 JP 2872799 B2 JP2872799 B2 JP 2872799B2 JP 2292996 A JP2292996 A JP 2292996A JP 29299690 A JP29299690 A JP 29299690A JP 2872799 B2 JP2872799 B2 JP 2872799B2
- Authority
- JP
- Japan
- Prior art keywords
- sealing resin
- guard ring
- hot air
- circuit board
- resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5449—Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Description
この発明は、回路基板上に実装すべき半導体素子の回
路基板上での封止に用いられる半導体封止方法に関す
る。The present invention relates to a semiconductor sealing method used for sealing a semiconductor element to be mounted on a circuit board on the circuit board.
混成集積回路では、回路基板に導体パターンが形成さ
れた後、抵抗等の受動素子とともに、半導体装置として
ベアチップが実装される。回路基板には、ベアチップの
周辺部にベアチップの端子と接続すべき導体パターンが
形成されており、ベアチップの各端子と導体パターンと
はワイヤボンディングにより導体ワイヤによって電気的
な接続が行われる。 このような電気的な接続が行われた後、導体ワイヤ及
びベアチップを包囲する範囲に封止樹脂を堰き止める堰
止め枠としてのガードリングが封止樹脂で形成され、こ
のガードリングの固化を持って、その内側に封止樹脂を
充填し、その封止樹脂でベアチップ、導体ワイヤ及びそ
の周辺部の導体パターンが封止される。In a hybrid integrated circuit, after a conductor pattern is formed on a circuit board, a bare chip is mounted as a semiconductor device together with passive elements such as resistors. A conductor pattern to be connected to a terminal of the bare chip is formed on a peripheral portion of the bare chip on the circuit board, and each terminal of the bare chip and the conductor pattern are electrically connected by conductor wires by wire bonding. After such an electrical connection is made, a guard ring as a damping frame for damping the sealing resin is formed of the sealing resin in a range surrounding the conductor wire and the bare chip, and the guard ring is solidified. Then, the inside is filled with a sealing resin, and the bare chip, the conductor wire and the conductor pattern of the peripheral portion are sealed with the sealing resin.
ところで、このような半導体素子の樹脂封止に用いる
ガードリングは、封止樹脂を堰き止めるためのものであ
り、理想的には封止樹脂より流動性の低い樹脂が用いら
れる。作業性からみれば、ガードリングは即座に硬化す
ることが望ましく、狭い範囲で十分な高さを設定できる
樹脂が望まれている。 従来、ガードリングには、封止樹脂とは異なるチクソ
性の樹脂が用いられ、その調整が非常に面倒であった。 ガードリング用の樹脂を用いても、僅かに流動性が異
なる程度であって、ガードリングに最適な樹脂はなく、
十分な高さを取るためには単位面積当たりの滴下量が増
え、固化の途上でその流動性故に拡がり、これが回路基
板に対する部品の実装効率を低下させる原因になってい
る。 そこで、この発明は、ガードリングを形成する封止樹
脂を加熱して硬化を早め、最適なガードリングを形成し
て効率的な樹脂封止を実現するとともに、ガードリング
を形成するための加熱処理の悪影響を気流によって回避
した半導体封止方法の提供を目的とする。Incidentally, the guard ring used for resin sealing of such a semiconductor element is for damping the sealing resin, and ideally, a resin having lower fluidity than the sealing resin is used. From the viewpoint of workability, it is desirable that the guard ring be cured immediately, and a resin capable of setting a sufficient height in a narrow range is desired. Conventionally, a thixotropic resin different from the sealing resin is used for the guard ring, and its adjustment is very troublesome. Even if the resin for guard ring is used, the fluidity is slightly different, and there is no optimal resin for guard ring,
In order to obtain a sufficient height, the amount of dripping per unit area increases, and the solidification spreads due to its fluidity during solidification, which causes a reduction in mounting efficiency of components on a circuit board. Therefore, the present invention is to heat the sealing resin forming the guard ring to accelerate the curing, to form an optimal guard ring to realize efficient resin sealing, and to perform a heat treatment for forming the guard ring. It is an object of the present invention to provide a semiconductor encapsulation method in which the adverse effects of the above are avoided by airflow.
即ち、この発明の半導体封止方法は、半導体素子(ベ
アチップ4)が設置された回路基板(2)の前記半導体
の周囲部にガードリング(18)を形成し、その内部に封
止樹脂(16)を充填させて前記半導体素子を前記回路基
板上で封止する半導体封止方法において、前記回路基板
の前記ガードリングを形成すべき部分に封止樹脂供給手
段(シリンジ20及びニードル22)から前記封止樹脂を供
給しながら、前記回路基板に供給された前記封止樹脂を
熱風供給手段(熱風発生源24及び熱風供給管26)から熱
風(28)を吹きつけて熱硬化させるとともに、前記封止
樹脂供給手段側への前記熱風の移動を気流(噴射空気3
4)によって遮断したことを特徴とする。That is, according to the semiconductor sealing method of the present invention, a guard ring (18) is formed around the semiconductor on a circuit board (2) on which a semiconductor element (bare chip 4) is installed, and a sealing resin (16) is formed inside the guard ring (18). ) To seal the semiconductor element on the circuit board in a semiconductor sealing method, wherein a sealing resin supply means (syringe 20 and needle 22) is provided on a portion of the circuit board where the guard ring is to be formed. While supplying the sealing resin, the sealing resin supplied to the circuit board is blown with hot air (28) from hot air supply means (a hot air generating source 24 and a hot air supply pipe 26) to be thermally cured, and The movement of the hot air to the resin stop means
It is characterized by being blocked by 4).
ガードリングを形成する封止樹脂を回路基板上で迅速
に加熱によって硬化させることができるので、その硬化
によって十分な高さを持つガードリングが少ない樹脂量
で形成される。ガードリングの硬化が迅速化され、しか
も十分な強度が短時間で得られるので、ガードリングの
形成後、すぐに封止樹脂の充填を行うことができる。 そして、ガードリングを形成すべき封止樹脂に吹きつ
けられた熱風は、気流によって吹き飛ばされて封止樹脂
供給手段側の封止樹脂への加熱が防止され、回路基板へ
供給前の封止樹脂の劣化を防止できる。Since the sealing resin forming the guard ring can be rapidly cured by heating on the circuit board, the curing allows the guard ring having a sufficient height to be formed with a small amount of resin. Since the hardening of the guard ring is accelerated and sufficient strength can be obtained in a short time, the sealing resin can be filled immediately after the formation of the guard ring. Then, the hot air blown to the sealing resin for forming the guard ring is blown off by an air current to prevent heating of the sealing resin on the side of the sealing resin supply means, and the sealing resin before being supplied to the circuit board. Degradation can be prevented.
以下、この発明を図面に示した実施例を参照して詳細
に説明する。 第1図及び第2図は、この発明の半導体封止方法の一
実施例を示す。 第1図及び第2図の(A)に示すように、アルミナや
セラミック等の絶縁性材料で回路基板2が形成され、そ
の回路基板2の表面には半導体素子としてのベアチップ
4{第2図の(B)}を実装すべき部分に導体6が印刷
によって形成されているとともに、この導体6に一定の
間隔を設けて導体パターン8が形成されている。導体パ
ターン8は、図示しない回路部品や他の機能回路との回
路パターンを形成するものである。 導体6の上面には、第2図の(B)に示すように、ベ
アチップ4が導電性接着剤10を以て固着されるととも
に、ベアチップ4の半導体基板が導体6と電気的に接続
されている。ベアチップ4の縁部に形成されている電極
12と対応する導体パターン8との間にはワイヤボンディ
ングによって導体ワイヤ14が接続され、電気的に接続さ
れている。 そして、このベアチップ4並びに導体ワイヤ14が接続
された導体パターン8を包囲する範囲に封止樹脂16を以
てガードリング18が形成される。即ち、第1図に示すよ
うに、封止樹脂供給手段としてのシリンジ20が設置され
ており、その先端部には封止樹脂16をシリンジ20側の加
圧によって所定量だけ連続的に封止樹脂16を滴下するた
めのニードル22が取り付けられている。したがって、こ
のニードル22から回路基板2の上面に一筆書きの形態で
封止樹脂16が連続的に供給され、形成すべきガードリン
グ形状にニードル22を移動させると、その軌跡としてガ
ードリング18が封止樹脂16によって形成される。 このシリンジ20の近傍には、熱風供給手段として設置
された熱風発生源24に接続された熱風供給管26が臨ませ
られ、その先端部はニードル22の近傍、即ち、ニードル
22から滴下直後の封止樹脂16上に向けられている。した
がって、回路基板2上に滴下された封止樹脂16は、熱風
供給管26から噴射された熱風28によって加熱されて熱硬
化する。 また、シリンジ20の近傍には、熱風28からシリンジ20
及びニードル22を遮断するための遮断手段として気流、
即ち、エアカーテンを形成するためのエアカーテン形成
手段として空気源30に接続された空気供給管32が設置さ
れている。この空気供給管32は、シリンジ20及びニード
ル22を挟んで熱風供給管26に対向して設置されており、
その空気噴射ノズルを成す先端部はニードル22側にL字
型に曲げられ、噴射空気34からシリンジ20及びニードル
22を防護するエアカーテンを形成するように配置されて
いる。即ち、噴射空気34によって形成されるエアカーテ
ンにより熱風28は、その噴射空気34の方向に押しやら
れ、シリンジ20及びニードル22内の封止樹脂16が防護さ
れて熱風28による熱的劣化が防止される。したがって、
ニードル22からの封止樹脂16の供給が妨げられることな
く、必要な流動性を以て回路基板2上に滴下される。 そして、熱風28を受けた封止樹脂16は、熱風28からの
熱エネルギで加熱され、その加熱により熱硬化するの
で、封止樹脂16の流動が阻止され、第2図の(C)に示
すように、狭い範囲で十分な高さ及び強度を持つガード
リング18に形成される。 次に、このガードリング18の内部には、第2図の
(D)に示すように、シリンジ20を以てニードル22から
封止樹脂16が充填され、第2図の(E)に示すように、
ベアチップ4上に十分な厚みを持つ樹脂膜が形成されて
樹脂封止を完了する。 このような樹脂封止では、封止樹脂16の熱硬化を利用
して少ない封止樹脂16で十分な強度と高さを持つガード
リング18が形成され、その内部にガードリング18と同様
の封止樹脂16を以て封止が行われる。特に、熱硬化によ
って、ガードリング18を形成すべき封止樹脂16の流れ出
しが阻止できるので、シリンジ20の操作が容易でしか
も、精度の高いガードリング18が形成される。 この熱硬化に用いられる熱風28は、噴射空気34のエア
カーテンによって遮断されるので、封止樹脂供給手段側
のシリンジ20やニードル22の供給前の封止樹脂16に当た
ることがなく、供給前の封止樹脂16の劣化が防止され
る。したがって、ガードリング18の信頼性が高められる
ことになる。 実験によれば、封止樹脂16にエポキシ樹脂を用いた場
合、熱風発生源24からの熱風28によって封止樹脂16の表
面温度を150℃ないし200℃に上昇させることができ、こ
れによって封止樹脂16を熱硬化させ、ベアチップ4を覆
う封止樹脂16の充填に十分な強度と高さを設定すること
ができた。Hereinafter, the present invention will be described in detail with reference to embodiments shown in the drawings. 1 and 2 show an embodiment of the semiconductor sealing method of the present invention. As shown in FIGS. 1 and 2A, a circuit board 2 is formed of an insulating material such as alumina or ceramic, and a bare chip 4 as a semiconductor element is formed on the surface of the circuit board 2. (B) The conductor 6 is formed by printing on the portion where the {circle around (1)} is to be mounted, and the conductor pattern 8 is formed at regular intervals on the conductor 6. The conductor pattern 8 forms a circuit pattern with circuit components (not shown) and other functional circuits. As shown in FIG. 2B, the bare chip 4 is fixed to the upper surface of the conductor 6 with a conductive adhesive 10 and the semiconductor substrate of the bare chip 4 is electrically connected to the conductor 6. Electrodes formed on the edge of bare chip 4
A conductor wire 14 is connected between the conductor pattern 12 and the corresponding conductor pattern 8 by wire bonding, and is electrically connected. Then, a guard ring 18 is formed with a sealing resin 16 in an area surrounding the bare chip 4 and the conductor pattern 8 to which the conductor wires 14 are connected. That is, as shown in FIG. 1, a syringe 20 is provided as a sealing resin supply means, and the sealing resin 16 is continuously sealed at a tip end thereof by a predetermined amount by pressing the syringe 20 side. A needle 22 for dropping the resin 16 is attached. Therefore, the sealing resin 16 is continuously supplied from the needles 22 to the upper surface of the circuit board 2 in a one-stroke form. It is formed by the stopper resin 16. In the vicinity of the syringe 20, a hot air supply pipe 26 connected to a hot air generation source 24 installed as a hot air supply means is exposed, and its tip is in the vicinity of the needle 22, that is, the needle.
It is directed from 22 onto the sealing resin 16 immediately after dropping. Therefore, the sealing resin 16 dropped on the circuit board 2 is heated by the hot air 28 injected from the hot air supply pipe 26 and is thermally cured. In addition, near the syringe 20, hot air 28
And airflow as a blocking means for blocking the needle 22,
That is, an air supply pipe 32 connected to the air source 30 is provided as air curtain forming means for forming an air curtain. The air supply pipe 32 is installed to face the hot air supply pipe 26 with the syringe 20 and the needle 22 interposed therebetween.
The tip of the air injection nozzle is bent into an L-shape toward the needle 22, and the injection air 34 is
It is arranged to form an air curtain that protects 22. In other words, the hot air 28 is pushed in the direction of the jet air 34 by the air curtain formed by the jet air 34, and the sealing resin 16 in the syringe 20 and the needle 22 is protected, thereby preventing thermal deterioration due to the hot air 28. You. Therefore,
The supply of the sealing resin 16 from the needle 22 is dropped onto the circuit board 2 with necessary fluidity without being obstructed. Then, the sealing resin 16 that has received the hot air 28 is heated by the heat energy from the hot air 28 and is thermally cured by the heating, so that the flow of the sealing resin 16 is prevented, and the sealing resin 16 is shown in FIG. 2C. Thus, the guard ring 18 has a sufficient height and strength in a narrow range. Next, the inside of the guard ring 18 is filled with the sealing resin 16 from the needle 22 using the syringe 20 as shown in FIG. 2D, and as shown in FIG.
A resin film having a sufficient thickness is formed on the bare chip 4 to complete the resin sealing. In such resin sealing, a guard ring 18 having sufficient strength and height is formed with a small amount of the sealing resin 16 by utilizing the thermosetting of the sealing resin 16, and a sealing ring similar to the guard ring 18 is formed therein. Sealing is performed with the sealing resin 16. In particular, since the sealing resin 16 on which the guard ring 18 is to be formed can be prevented from flowing out by thermosetting, the operation of the syringe 20 is easy and the guard ring 18 with high accuracy is formed. Since the hot air 28 used for this thermosetting is blocked by the air curtain of the blast air 34, the hot air 28 does not hit the sealing resin 16 before the supply of the syringe 20 or the needle 22 on the sealing resin supply means side. The deterioration of the sealing resin 16 is prevented. Therefore, the reliability of the guard ring 18 is improved. According to experiments, when epoxy resin is used as the sealing resin 16, the surface temperature of the sealing resin 16 can be raised to 150 ° C. to 200 ° C. by the hot air 28 from the hot air generating source 24, thereby The resin 16 was thermally cured, and the strength and height sufficient to fill the sealing resin 16 covering the bare chip 4 could be set.
以上説明したように、この発明によれば、次の効果が
得られる。 (a) 封止樹脂に熱風を吹きつけ、その熱風により封
止樹脂を熱硬化させてガードリングを形成するので、ガ
ードリングの形成時間が短く、しかもガードリングを即
座に封止樹脂を充填できる程度の強度に硬化させること
ができ、ガードリングの形成及びその内部への封止樹脂
の充填を同一工程で行うことができ、製造時間を短縮で
き、製造コストの低減を図ることができる。 (b) ガードリングを形成すべき封止樹脂を熱硬化に
より硬化速度を速めることができ、理想的なガードリン
グが形成できるとともに、ガードリングを形成する封止
樹脂とガードリングの内部に充填すべき封止樹脂に同一
のものを使用でき、特別な封止樹脂を用いる必要がない
ため、材料面からも製造コストの低減を図ることができ
る。 (c) ガードリングを形成すべき封止樹脂の流動性に
よる回路基板面への必要以上の拡がりを防止でき、回路
基板の高密度実装に寄与することができる。 (d) ガードリングを形成すべき封止樹脂に当てられ
た熱風を遮断して封止樹脂供給手段側の封止樹脂への加
熱が防止でき、回路基板に供給される前の封止樹脂を熱
風による熱的劣化から防護でき、ガードリングの品質、
信頼性を高めることができる。As described above, according to the present invention, the following effects can be obtained. (A) Hot air is blown onto the sealing resin, and the sealing resin is thermally cured by the hot air to form the guard ring. Therefore, the time for forming the guard ring is short, and the guard ring can be filled with the sealing resin immediately. The hardening can be performed to a sufficient degree, the formation of the guard ring and the filling of the inside thereof with the sealing resin can be performed in the same step, so that the manufacturing time can be reduced and the manufacturing cost can be reduced. (B) The curing speed of the sealing resin for forming the guard ring can be increased by thermosetting, so that an ideal guard ring can be formed, and the sealing resin forming the guard ring and the inside of the guard ring are filled. The same sealing resin to be used can be used, and it is not necessary to use a special sealing resin. Therefore, the manufacturing cost can be reduced from the viewpoint of materials. (C) Unnecessary spreading to the circuit board surface due to the fluidity of the sealing resin for forming the guard ring can be prevented, which can contribute to high-density mounting of the circuit board. (D) It is possible to block the hot air applied to the sealing resin on which the guard ring is to be formed, thereby preventing the heating of the sealing resin on the side of the sealing resin supply means, and removing the sealing resin before being supplied to the circuit board. It can protect against thermal deterioration due to hot air, the quality of guard ring,
Reliability can be improved.
第1図はこの発明の半導体封止方法の一実施例を示す
図、 第2図はこの発明の半導体封止方法の一実施例を示す断
面図である。 2……回路基板 4……ベアチップ(半導体素子) 16……封止樹脂 18……ガードリング 20……シリンジ(封止樹脂供給手段) 22……ニードル(封止樹脂供給手段) 24……熱風発生源(熱風供給手段) 26……熱風供給管(熱風供給手段) 28……熱風 34……噴射空気(気流)FIG. 1 is a view showing one embodiment of the semiconductor sealing method of the present invention, and FIG. 2 is a sectional view showing one embodiment of the semiconductor sealing method of the present invention. 2 ... circuit board 4 ... bare chip (semiconductor element) 16 ... sealing resin 18 ... guard ring 20 ... syringe (sealing resin supply means) 22 ... needle (sealing resin supply means) 24 ... hot air Source (hot air supply means) 26 Hot air supply pipe (hot air supply means) 28 Hot air 34 Air jet (air flow)
Claims (1)
導体の周囲部にガードリングを形成し、その内部に封止
樹脂を充填させて前記半導体素子を前記回路基板上で封
止する半導体封止方法において、 前記回路基板の前記ガードリングを形成すべき部分に封
止樹脂供給手段から前記封止樹脂を供給しながら、前記
回路基板に供給された前記封止樹脂を熱風供給手段から
熱風を吹きつけて熱硬化させるとともに、前記封止樹脂
供給手段側への前記熱風の移動を気流によって遮断した
ことを特徴とする半導体封止方法。A semiconductor ring for forming a guard ring around a semiconductor on a circuit board on which a semiconductor element is installed, and filling the inside with a sealing resin to seal the semiconductor element on the circuit board. In the stopping method, while supplying the sealing resin from a sealing resin supply unit to a portion of the circuit board where the guard ring is to be formed, the sealing resin supplied to the circuit board is supplied with hot air from a hot air supply unit. A semiconductor encapsulation method, wherein the semiconductor device is blown and thermally cured, and the movement of the hot air toward the encapsulation resin supply unit is blocked by an air current.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2292996A JP2872799B2 (en) | 1990-10-30 | 1990-10-30 | Semiconductor sealing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2292996A JP2872799B2 (en) | 1990-10-30 | 1990-10-30 | Semiconductor sealing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH04165633A JPH04165633A (en) | 1992-06-11 |
| JP2872799B2 true JP2872799B2 (en) | 1999-03-24 |
Family
ID=17789128
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2292996A Expired - Fee Related JP2872799B2 (en) | 1990-10-30 | 1990-10-30 | Semiconductor sealing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2872799B2 (en) |
-
1990
- 1990-10-30 JP JP2292996A patent/JP2872799B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH04165633A (en) | 1992-06-11 |
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| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |