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JP2901576B2 - Supply mechanism for semiconductor manufacturing equipment - Google Patents
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JP2901576B2 - Supply mechanism for semiconductor manufacturing equipment - Google Patents

Supply mechanism for semiconductor manufacturing equipment

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Publication number
JP2901576B2
JP2901576B2 JP15508797A JP15508797A JP2901576B2 JP 2901576 B2 JP2901576 B2 JP 2901576B2 JP 15508797 A JP15508797 A JP 15508797A JP 15508797 A JP15508797 A JP 15508797A JP 2901576 B2 JP2901576 B2 JP 2901576B2
Authority
JP
Japan
Prior art keywords
suction
semiconductor device
supply mechanism
resin sealing
resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP15508797A
Other languages
Japanese (ja)
Other versions
JPH113898A (en
Inventor
政人 本間
泰敏 白田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP15508797A priority Critical patent/JP2901576B2/en
Publication of JPH113898A publication Critical patent/JPH113898A/en
Application granted granted Critical
Publication of JP2901576B2 publication Critical patent/JP2901576B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Sheets, Magazines, And Separation Thereof (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体製造装置の供
給機構(以下、供給機構と記す)に関し、特に半導体製
造装置に於て積み重ねられた帯状半製品を1枚ずつ確実
に供給する供給機構に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a supply mechanism for a semiconductor manufacturing apparatus (hereinafter, referred to as a supply mechanism), and more particularly to a supply mechanism for surely supplying a stacked semi-finished product one by one in a semiconductor manufacturing apparatus. .

【0002】[0002]

【従来の技術】半導体装置の製造工程の中で樹脂封止
後、リード切断(あるいはリードフォーミングする)工
程があるが、リード切断装置に樹脂封止済の半導体装置
を積み重ねられた状態から1枚ずつ吸着し供給する。こ
の時、樹脂封止工程で何らかの理由により不良となった
樹脂封止部を除去する為に図5に示す様に歯抜けした半
導体装置4となる。
2. Description of the Related Art In a semiconductor device manufacturing process, there is a lead cutting (or lead forming) step after resin encapsulation. However, one semiconductor device already sealed with resin is stacked on a lead cutting device. Suction and supply each time. At this time, as shown in FIG. 5, the semiconductor device 4 has a missing tooth in order to remove a resin sealing portion which has become defective for some reason in the resin sealing process.

【0003】この歯抜けした半導体装置4を吸着パッド
2で吸い上げようとすると吸着パッド2がその下の樹脂
封止部を吸着してしまい製品を2枚持ち上げてしまうと
いう問題が発生する。2枚供給の弊害としてリード切断
装置でのMTBA悪化やリード切断金型の破損等が上げ
られる。又、取り残しミス,取り出しミスを解決する技
術として公知例1(特開平7−136965号公報)が
あり、これは物体高さセンサを有するハンドが下降し物
体高さセンサが物体を検出すると吸着パッドにより物体
を吸着し、所定の供給先に移送する制御を行う制御手段
とを備えたものである。さらに、吸着したワークが1枚
か否かを検出するという公知例2(特開平7−2416
38号公報)があり、これは吸着パッドで吸着し持ち上
げたシート材を重量センサにて重量を検出し吸着したシ
ート材が1枚か否かを検出するものである。
[0003] If the semiconductor device 4 with the missing tooth is to be sucked up by the suction pad 2, there is a problem that the suction pad 2 sucks the resin sealing portion thereunder and lifts up two products. As an adverse effect of supplying two sheets, deterioration of MTBA in a lead cutting device, breakage of a lead cutting die, and the like are raised. Further, as a technique for solving a left-back mistake and a take-out mistake, there is a well-known example 1 (Japanese Patent Application Laid-Open No. Hei 7-136965), which discloses a suction pad when a hand having an object height sensor descends and the object height sensor detects an object. And a control means for performing control of sucking an object and transferring the object to a predetermined supply destination. Furthermore, a known example 2 (Japanese Patent Laid-Open No. 7-2416) of detecting whether or not one work is attracted is detected.
No. 38), which detects the weight of a sheet material sucked and lifted by a suction pad with a weight sensor and detects whether the sucked sheet material is one or not.

【0004】[0004]

【発明が解決しようとする課題】第1の問題点は、従来
の技術において1枚ずつ吸着したか否かを判断する為
に、重量検出センサ,検出した値を記憶する記憶手段,
放出した値を比較する比較手段,比較した結果を判定す
る判定手段が必要であることである。その理由は、機構
が複雑であるばかりでなく、高い精度のセンサが必要と
なり、制御回路も必要となることから供給装置そのもの
が高価となってしまうからである。
A first problem is that, in the prior art, a weight detecting sensor, a storage means for storing a detected value,
A comparison means for comparing the released values and a judgment means for judging the comparison result are required. The reason is that not only the mechanism is complicated, but also a sensor with high accuracy is required, and a control circuit is also required, so that the supply device itself becomes expensive.

【0005】第2の問題点は、従来の技術において取り
出しミス,取り残しミスを検出するには物体高さセンサ
が必要となることである。その理由は、高い精度のセン
サが必要であり、又センサが移動することによる誤検出
が懸念されるからである。
[0005] The second problem is that an object height sensor is required to detect a take-out mistake or a left-back mistake in the prior art. The reason for this is that a high-accuracy sensor is required, and erroneous detection due to movement of the sensor is a concern.

【0006】本発明の第一の目的はハンド部に簡単な機
構を設けることにより、複雑な制御を行うことなく積み
重ねられた半導体装置を確実に1枚ずつ所定の供給先に
移送することができる供給機構を提供することである。
A first object of the present invention is to provide a simple mechanism in a hand unit so that stacked semiconductor devices can be reliably transferred one by one to a predetermined supply destination without performing complicated control. It is to provide a supply mechanism.

【0007】本発明の第二の目的は取り出しミス,取り
残しミスすることなく確実に半導体装置を所定の供給先
に移送することができる供給機構を提供することであ
る。
A second object of the present invention is to provide a supply mechanism capable of surely transferring a semiconductor device to a predetermined supply destination without taking out mistakes or leaving mistakes.

【0008】本発明の第三の目的は積み重ねられた半導
体装置を破損させることなく確実に所定の供給先に移送
することができる供給機構を提供することである。
A third object of the present invention is to provide a supply mechanism capable of reliably transferring a stacked semiconductor device to a predetermined supply destination without damaging the semiconductor device.

【0009】[0009]

【課題を解決するための手段】本発明の半導体装置の供
給機構は、樹脂封止されたリードフレームを積み重ねた
状態から1枚ずつ分離供給する半導体装置の供給機構に
おいて、複数の樹脂封止部とこれら樹脂封止部のそれぞ
れを吸着する吸着ノズルと、これらの吸着ノズルが前記
樹脂封止部に押し下げるか又は押し上げられたときに所
定押付量をこえぬ様緩衝する緩衝手段と、前記吸着ノズ
ルの先端に取り付けられ前記樹脂封止されたリードフレ
ームを吸着する吸着パッドと、前記吸着ノズルに固定さ
れ少くとも前記複数の樹脂封止部の隣接するそれぞれの
樹脂封止部に接触する長さでこれら樹脂封止部の厚さの
1/2前記吸着ノズルの吸着面より後退したジャマ板を
有することを特徴とする。
According to the present invention, there is provided a semiconductor device supply mechanism comprising: a plurality of resin-sealed portions which are separately supplied one by one from a stacked state of resin-sealed lead frames; A suction nozzle for sucking each of these resin sealing portions; a buffer means for buffering the suction nozzles so as not to exceed a predetermined pressing amount when pushed down or pushed up by the resin sealing portion; and A suction pad attached to the tip of the resin-sealed lead frame and sucking the resin-sealed lead frame; and a length fixed to the suction nozzle and at least in contact with each of the plurality of resin sealing portions adjacent to the resin sealing portion. The thickness of the resin sealing portion is half the thickness of the suction nozzle.

【0010】本発明によれば、葉抜けした半導体装置の
隣の樹脂封止部により吸着ノズルの上下動差を規制する
ジャマ板により、吸着パッドが歯抜けした半導体装置の
下の半導体装置を吸い上げることが出来なくなり、2枚
吸着することを防止することができる。又この機構は構
造が簡単であり、高精度なセンサ等を使用せずに1枚ず
つ半導体装置を吸い上げることができる。
According to the present invention, the suction pad sucks up the semiconductor device below the semiconductor device from which the tooth has fallen out, by means of the jammer plate for restricting the vertical movement of the suction nozzle by the resin sealing portion adjacent to the semiconductor device from which the leaf has fallen. This makes it impossible to prevent two sheets from being attracted. Further, this mechanism has a simple structure, and can pick up semiconductor devices one by one without using a high-precision sensor or the like.

【0011】[0011]

【発明の実施の形態】次に本発明の実施の形態について
図面を参照して説明する。
Embodiments of the present invention will now be described with reference to the drawings.

【0012】図1は本発明の一実施の形態の供給機構の
正面図、図2は図1の供給機構部の側面図である。図
1、図2を参照にすると、本発明の最良の一実施の形態
の供給機構は、吸着パッド2の吸着面より樹脂封止部の
厚さの約半分の上方位置に、長さが少なくとも隣の樹脂
封止部に接触する程度のジャマ板1を設ける。又、この
ジャマ板1は吸着ノズル12に固定されており、吸着ノ
ズル12は、緩衝スプリング3により、押し下げられた
時に所定押付量以上にならぬ様にしてある。尚、ハンド
上下エアーシリンダ7が下限に来た時、バキュームがO
Nし吸着パッド2より半導体装置の樹脂封止部を吸着し
持ち上げることにより1枚ずつ分離できる。歯抜けした
半導体装置4を吸着する場合はジャマ板1によりその下
の半導体装置の樹脂封止部分に吸着パッド2が当たらな
い為に持ち上げることができない。このことにより、歯
抜けがあっても2枚同時に吸着し持ち上げることを防止
することが可能となる。
FIG. 1 is a front view of a supply mechanism according to an embodiment of the present invention, and FIG. 2 is a side view of the supply mechanism of FIG. Referring to FIG. 1 and FIG. 2, the supply mechanism according to the best embodiment of the present invention has a length at least about half the thickness of the resin sealing portion above the suction surface of the suction pad 2. The jammer plate 1 is provided so as to be in contact with the adjacent resin sealing portion. Further, the jammer plate 1 is fixed to a suction nozzle 12, and the suction nozzle 12 is configured so as not to exceed a predetermined pressing amount when pressed down by a buffer spring 3. When the hand vertical air cylinder 7 reaches the lower limit, the vacuum
N can be separated one by one by sucking and lifting the resin sealing portion of the semiconductor device from the suction pad 2. In the case of sucking the missing semiconductor device 4, the suction pad 2 cannot be lifted because the suction pad 2 does not hit the resin sealing portion of the semiconductor device below the jammer plate 1. This makes it possible to prevent two sheets from being sucked and lifted at the same time even if there is a missing tooth.

【0013】次に本発明の実施の形態の動作について説
明する。
Next, the operation of the embodiment of the present invention will be described.

【0014】図3(a)〜(f)は本発明の一実施の形
態の供給機構の吸着動作を説明する工程順に示した側面
図である。本発明の一実施の形態の供給機構の吸着動作
は、まず吸着ハンド2が待機位置(a)から半導体装置
が積み重ねられている位置(b)まで移動する。その位
置から吸着ハンドが下降し(c)吸着パッド2が半導体
装置の樹脂封止部に接触し吸着ノズル12が約5mm程
度浮くまでハンドが下降する。吸着ハンドが下限まで下
降するとバキュームがONし吸着パッド2が歯抜けのな
い半導体装置5を吸着する。次に吸着ハンド2が上限ま
で上昇する(d)。その後最初の待機位置に(e)に吸
着ハンドが移動する。さらにその位置で吸着ハンドが下
降し、下限まで達するとバキュームをOFFし吸着を開
放し歯抜けのない半導体装置5を離す(f)。その後吸
着ハンドは上昇し最初の待機位置まで戻る。以上の動作
を繰り返す。
FIGS. 3A to 3F are side views showing the order of steps for explaining the suction operation of the supply mechanism according to one embodiment of the present invention. In the suction operation of the supply mechanism according to the embodiment of the present invention, first, the suction hand 2 moves from the standby position (a) to the position (b) where the semiconductor devices are stacked. The suction hand descends from that position (c) The hand descends until the suction pad 2 contacts the resin sealing portion of the semiconductor device and the suction nozzle 12 floats by about 5 mm. When the suction hand lowers to the lower limit, the vacuum is turned on, and the suction pad 2 sucks the semiconductor device 5 with no missing teeth. Next, the suction hand 2 rises to the upper limit (d). Thereafter, the suction hand moves to the first standby position in (e). Further, the suction hand is lowered at that position, and when it reaches the lower limit, the vacuum is turned off, suction is released, and the semiconductor device 5 without tooth loss is released (f). Thereafter, the suction hand rises and returns to the first standby position. The above operation is repeated.

【0015】次に本発明の実施例について図面を参照し
て説明する。
Next, an embodiment of the present invention will be described with reference to the drawings.

【0016】図4は本発明の一実施例の供給機構のジャ
マ板部の拡大側面図である。図4を参照すると、本発明
の一実施例の供給機構のジャマ板部は、ジャマ板1のg
の寸法を半導体装置の品種にかかわらず、樹脂封止部の
長さの1/3以上とし、又h寸法は樹脂封止部の厚さの
以内にして構成される。尚吸着ノズル12を円筒状のも
のとした場合は、ジャマ板1が回転しない様に回り止め
を設置する。
FIG. 4 is an enlarged side view of the jammer plate portion of the supply mechanism according to one embodiment of the present invention. Referring to FIG. 4, the jammer plate portion of the supply mechanism according to the embodiment of the present invention has the g
Is set to be at least 1/3 of the length of the resin-sealed portion regardless of the type of the semiconductor device, and the dimension h is set within the thickness of the resin-sealed portion. When the suction nozzle 12 has a cylindrical shape, a detent is provided so that the jammer plate 1 does not rotate.

【0017】次に本発明の実施例の動作について説明す
る。
Next, the operation of the embodiment of the present invention will be described.

【0018】図4を参照すると、この状態は、吸着パッ
ド2が下限にあり、吸着パッド2が半導体装置の樹脂封
止部に当たり、さらに、吸着ノズル12が緩衝スプリン
グ3により逃げている状態である。歯抜けした半導体装
置4はジャマ板1が両隣の樹脂封止部分に当たり吸着パ
ッド2が下の半導体装置の樹脂封止部に接触できない
為、吸着して持ち上げることができない。よって、2枚
吸着を防止し、歯抜けの無い半導体装置5を1枚ずつ吸
着して持ち上げることが出来る。
Referring to FIG. 4, this state is a state in which the suction pad 2 is at the lower limit, the suction pad 2 hits the resin sealing portion of the semiconductor device, and the suction nozzle 12 escapes by the buffer spring 3. . The missing semiconductor device 4 cannot be sucked and lifted because the suction pad 2 cannot contact the resin sealing portion of the lower semiconductor device because the jammer plate 1 hits the resin sealing portion on both sides and the suction pad 2 cannot contact the resin sealing portion of the lower semiconductor device. Therefore, it is possible to prevent two wafers from being sucked, and to suck and lift the semiconductor devices 5 without missing teeth one by one.

【0019】[0019]

【発明の効果】第1の効果は、2枚吸着が無くなること
により、半導体製造装置の供給機構の稼働率が向上す
る。その理由は、2枚吸着すると供給先で異常と判断し
装置が停止するためチョコ停となり、稼働率が悪化する
からである。
The first effect is that the operation rate of the supply mechanism of the semiconductor manufacturing apparatus is improved by eliminating the suction of two sheets. The reason for this is that if two sheets are adsorbed, the supply destination is determined to be abnormal, and the apparatus stops, resulting in a short stop and a deterioration in the operation rate.

【0020】第2の効果は、2枚吸着が無くなることに
よりリード切断金型の破損が減少する。その理由は、2
枚吸着したにもかかわらず供給先で異常と判断できなか
った場合、リード切断金型まで2枚流れてしまいパンチ
すると切断ダイポンチが破損するからである。
The second effect is that the breakage of the lead cutting die is reduced by eliminating the suction of two sheets. The reason is 2
This is because, if the supply destination cannot be determined to be abnormal even though the sheets are adsorbed, two sheets flow to the lead cutting die and the cutting die punch is damaged when punched.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態の供給機構の正面図であ
る。
FIG. 1 is a front view of a supply mechanism according to an embodiment of the present invention.

【図2】図1の供給機構部の側面図である。FIG. 2 is a side view of the supply mechanism of FIG.

【図3】(a)〜(f)は本発明の一実施の形態の供給
機構の吸着動作を説明する工程順に示した側面図であ
る。
3 (a) to 3 (f) are side views showing the order of steps for explaining the suction operation of the supply mechanism according to the embodiment of the present invention.

【図4】本発明の一実施例の供給機能のジャマ板部の拡
大側面図である。
FIG. 4 is an enlarged side view of a jamming plate portion having a supply function according to an embodiment of the present invention.

【図5】(a),(b)は歯抜け状態の半導体装置の平
面図及び側面図である。
FIGS. 5A and 5B are a plan view and a side view of a semiconductor device in a toothless state.

【符号の説明】[Explanation of symbols]

1 ジャマ板 2 吸着パッド 3 緩衝スプリング 4 歯抜けした半導体装置 5 歯抜けのない半導体装置 6 ストップリング 7 ハンド上下エアシリンダ 8 移送用ガイドシャフト 9 移送用エアシリンダ 10 移送先レール 11 ホース 12 吸着ノズル 21 リードフレーム 22 樹脂封止部 DESCRIPTION OF SYMBOLS 1 Jammer plate 2 Suction pad 3 Buffer spring 4 Toothed semiconductor device 5 Toothless semiconductor device 6 Stop ring 7 Hand vertical air cylinder 8 Transfer guide shaft 9 Transfer air cylinder 10 Transfer rail 11 Hose 12 Suction nozzle 21 Lead frame 22 Resin sealing

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 樹脂封止されたリードフレームを積み重
ねた状態から1枚ずつ分離供給する半導体装置の供給機
構において、複数の樹脂封止部とこれら樹脂封止部のそ
れぞれを吸着する吸着ノズルと、これらの吸着ノズルが
前記樹脂封止部に押し下げるか又は押し上げられたとき
に所定押付量をこえぬ様緩衝する緩衝手段と、前記吸着
ノズルの先端に取り付けられ前記樹脂封止されたリード
フレームを吸着する吸着パッドと、前記吸着ノズルに固
定され少くとも前記複数の樹脂封止部の隣接するそれぞ
れの樹脂封止部に接触する長さでこれら樹脂封止部の厚
さの1/2前記吸着ノズルの吸着面より後退したジャマ
板を有することを特徴とするん半導体装置の供給機構。
1. A supply mechanism of a semiconductor device for separately supplying a resin-sealed lead frame one by one from a stacked state, comprising: a plurality of resin sealing portions; and a suction nozzle for sucking each of the resin sealing portions. Buffer means for buffering these suction nozzles so as not to exceed a predetermined pressing amount when pushed down or pushed up to the resin sealing portion, and the resin-sealed lead frame attached to the tip of the suction nozzle. A suction pad fixed to the suction nozzle and at least half of the thickness of the resin sealing portions, the length being in contact with the respective resin sealing portions adjacent to the plurality of resin sealing portions; A supply mechanism for a semiconductor device, comprising a jammer plate receded from a suction surface of a nozzle.
【請求項2】 前記吸着面が、バキュームを介して吸引
する吸着パッドの吸着面であることを特徴とする請求項
1記載の半導体装置の供給機構。
2. The supply mechanism of a semiconductor device according to claim 1, wherein the suction surface is a suction surface of a suction pad that suctions through a vacuum.
【請求項3】 前記緩衝手段が、緩衝スプリングである
ことを特徴とする請求項1記載の半導体装置の供給機
構。
3. The semiconductor device supply mechanism according to claim 1, wherein said buffer means is a buffer spring.
JP15508797A 1997-06-12 1997-06-12 Supply mechanism for semiconductor manufacturing equipment Expired - Fee Related JP2901576B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15508797A JP2901576B2 (en) 1997-06-12 1997-06-12 Supply mechanism for semiconductor manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15508797A JP2901576B2 (en) 1997-06-12 1997-06-12 Supply mechanism for semiconductor manufacturing equipment

Publications (2)

Publication Number Publication Date
JPH113898A JPH113898A (en) 1999-01-06
JP2901576B2 true JP2901576B2 (en) 1999-06-07

Family

ID=15598374

Family Applications (1)

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KR100448980B1 (en) * 2001-04-27 2004-09-30 이흥탁 BGA Semiconductor Package Adsorbing Head for transfering BGA SemiconductorPackage
CN120055967B (en) * 2025-04-25 2025-07-15 四川明泰微电子科技股份有限公司 A device for removing glue overflow from the surface of a patch semiconductor

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