JP2935384B2 - Jig for visual inspection of chip-shaped circuit components - Google Patents
Jig for visual inspection of chip-shaped circuit componentsInfo
- Publication number
- JP2935384B2 JP2935384B2 JP34240791A JP34240791A JP2935384B2 JP 2935384 B2 JP2935384 B2 JP 2935384B2 JP 34240791 A JP34240791 A JP 34240791A JP 34240791 A JP34240791 A JP 34240791A JP 2935384 B2 JP2935384 B2 JP 2935384B2
- Authority
- JP
- Japan
- Prior art keywords
- chip
- shaped circuit
- circuit component
- jig
- groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000011179 visual inspection Methods 0.000 title description 3
- 239000002390 adhesive tape Substances 0.000 claims description 18
- 230000002093 peripheral effect Effects 0.000 description 23
- 238000007689 inspection Methods 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は粘着テープ上に並べて貼
り付けられたチップ状回路部品を回転させて、顕微鏡等
で外観検査するのに用いる治具に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a jig used for rotating a chip-like circuit component arranged and adhered on an adhesive tape and inspecting the appearance with a microscope or the like.
【0002】[0002]
【従来の技術】回路基板上に実装される小型のチップ部
品は大量に生産された後、個別に検査がされることが有
る。上記検査の項目は、例えばチップ部品の外観、或い
は端子の形状などであり、これらを顕微鏡や拡大鏡など
を用いて検査する。従来、このようなチップ状回路部品
の外観検査を行なうときは、チップ状回路部品をピンセ
ットで1つずつ摘んで、これを顕微鏡の対物レンズの先
に移動させ、ピンセットの先でチップ状回路部品を回転
させながら、複数の方向から顕微鏡で拡大観察するとい
う方法により行なわれていた。2. Description of the Related Art Small chip components mounted on a circuit board may be individually tested after being mass-produced. The items of the inspection are, for example, the appearance of the chip component or the shape of the terminal, and these are inspected using a microscope, a magnifying glass, or the like. Conventionally, when inspecting the appearance of such a chip-shaped circuit component, the chip-shaped circuit component is picked up one by one with tweezers, moved to the end of the objective lens of the microscope, and moved to the tip of the tweezers. The method has been performed by observing with a microscope a plurality of directions while rotating.
【0003】[0003]
【発明が解決しようとしている課題】しかしながら、ピ
ンセットで小さいチップ状回路部品を一つずつ摘んで観
察する作業は、細かい作業であり、極めて面倒である。
また、顕微鏡の被写体深度は浅いため、ピンセットの先
でチップ状回路部品を回転するとき、チップ状回路部品
の位置が動いて、顕微鏡の焦点から簡単にずれてしま
い、その都度ピンセットの先を焦点に合わせたり或は顕
微鏡の焦点を調整しなければならない。このため、検査
の能率が頗る悪かった。本発明は、このような従来の課
題を解消し、多数のチップ状回路部品を能率よくあらゆ
る方向から観察することができる外観検査治具を提供す
ることを目的とする。However, the operation of picking up small chip-shaped circuit components one by one with tweezers and observing them one by one is a fine operation and extremely troublesome.
In addition, since the depth of field of the microscope is shallow, when rotating the chip-shaped circuit component beyond the tweezers, the position of the chip-shaped circuit component moves and easily shifts from the focus of the microscope. Or adjust the focus of the microscope. For this reason, the efficiency of the inspection was very poor. An object of the present invention is to solve such a conventional problem and to provide a visual inspection jig capable of efficiently observing a large number of chip-shaped circuit components from all directions.
【0004】[0004]
【課題を解決するための手段】すなわち、本発明では、
前記目的を達成するため、チップ状回路部品を一列に並
べて貼り付けた長尺な粘着テープを通す溝が形成された
面を有する回転部材と、該回転部材を前記溝の中央を回
転中心軸として回転自在に保持する回転支持部材とを有
してなることを特徴とするチップ状回路部品外観検査用
治具を提供する。That is, in the present invention,
In order to achieve the above object, a rotating member having a surface formed with a groove through which a long adhesive tape in which chip-shaped circuit components are arranged and pasted, and the rotating member having the center of the groove as a rotation center axis. A jig for inspecting the appearance of a chip-shaped circuit component, comprising: a rotation support member rotatably held.
【0005】[0005]
【作用】前記本発明による治具では、長尺なテープ上に
チップ状回路部品を一列に並べて固定し、このテープを
回転部材の溝に通し、その溝を通るチップ状回路部品に
顕微鏡の焦点を合わせてそれらを順次観察する。このと
き、回転支持部材に支持された回転部材を回転すると、
回転部材は、前記チップ状回路部品が通る溝の中央を回
転中心として回転するため、テープ上のチップ状回路部
品は、一定の位置に有りながら回転する。このため、顕
微鏡の焦点からずれずにチップ状回路部品をあらゆる方
向から観察することができる。そして、前記溝に沿って
テープを順次送りながら、この回転部材を回転すると共
に、顕微鏡で観察することにより、複数のチップ状回路
部品について順次外観検査が可能である。In the jig according to the present invention, the chip-shaped circuit components are arranged in a line on a long tape and fixed, and the tape is passed through the groove of the rotating member. And observe them sequentially. At this time, when rotating the rotating member supported by the rotating support member,
Since the rotating member rotates around the center of the groove through which the chip-shaped circuit component passes, the chip-shaped circuit component on the tape rotates while being at a fixed position. Therefore, the chip-shaped circuit component can be observed from any direction without deviating from the focus of the microscope. By rotating the rotating member while sequentially feeding the tape along the groove and observing with a microscope, it is possible to sequentially inspect the appearance of a plurality of chip-shaped circuit components.
【0006】[0006]
【実施例】次に、図面を参照しながら、本発明の実施例
について詳細に説明する。図1〜図3に示されたよう
に、本発明の治具は、回転支持部材2と回転部材4とを
主たる構成部材としている。回転支持部材2は、例え
ば、鋼、ステンレス鋼或はアルミニウム等の金属からな
り、内外周面が中心軸を共通とする同心円筒面となって
おり、特に内周面は表面が平滑に仕上げられている。そ
の上半分弱の部分は無く、上方に開口している。さら
に、この支持部材2の周壁の中央部は、約180°にわ
たって長円状のガイド孔3が設けられている。Next, an embodiment of the present invention will be described in detail with reference to the drawings. As shown in FIGS. 1 to 3, the jig of the present invention mainly includes the rotation support member 2 and the rotation member 4. The rotation support member 2 is made of, for example, a metal such as steel, stainless steel, or aluminum, and has a concentric cylindrical surface with a common central axis on the inner and outer peripheral surfaces. In particular, the inner peripheral surface has a smooth surface. ing. There is no lower half, and it is open upward. Further, a center portion of the peripheral wall of the support member 2 is provided with an oblong guide hole 3 over about 180 °.
【0007】回転部材4は、外面が半円筒面と平面とで
形成された蒲鉾形のもので、この回転部材4は、前記回
転支持部材2の内周側に嵌合されている。この状態で
は、回転部材4と回転支持部材2との中心軸は一致して
いと共に、この回転部材4は、その半円筒面が回転支持
部材2の内周面に摺動するよう密に接触し、これらの面
の摺動によって、前記回転支持部材2の中心軸の周りに
回転自在に支持されている。図示の回転部材4は、内側
の中心部材5と外側の外周部材6とを組み立て、全体が
蒲鉾形になるよう作られている。これら中心部材5と円
周部材6との平面側には、その両端部に棒状の連結部材
7が当てられ、この連結部材7の両端がボルトで外周部
材6に固定され、これによって中心部材5と外周部材6
とが互いに動かないように固定されている。The rotating member 4 has a semicylindrical surface and a flat surface having an outer surface formed by a semi-cylindrical surface and a flat surface. The rotating member 4 is fitted on the inner peripheral side of the rotation supporting member 2. In this state, the center axes of the rotation member 4 and the rotation support member 2 are aligned with each other, and the rotation member 4 comes into close contact so that the semi-cylindrical surface slides on the inner peripheral surface of the rotation support member 2. By the sliding of these surfaces, the rotary support member 2 is rotatably supported around the central axis. The illustrated rotating member 4 is formed by assembling an inner central member 5 and an outer peripheral member 6 so that the whole is in a semi-cylindrical shape. On the plane side of the center member 5 and the circumferential member 6, rod-shaped connecting members 7 are applied to both ends thereof, and both ends of the connecting member 7 are fixed to the outer peripheral member 6 with bolts. And outer member 6
And are fixed so that they do not move with each other.
【0008】中心部材5は、例えば弗素系樹脂等からな
り、その平面中央であって、回転部材4の中心軸に沿っ
て後述する粘着テープTを通すための溝8を有する。こ
の溝8は、端面矩形の横に広い溝であり、その深さは、
後述する外観検査すべきチップ状回路部品aの高さの約
半分程となっている。また、前記外周部材を跨いでこの
溝8の上を通過するよう固定された前記連結部材7に
は、この溝8の部分に対応して切欠部9が設けられてい
る。The center member 5 is made of, for example, a fluorine-based resin, and has a groove 8 for passing an adhesive tape T, which will be described later, along the center axis of the rotating member 4 at the center of the plane. This groove 8 is a wide groove on the side of the rectangular end face, and its depth is
The height is about half of the height of the chip-shaped circuit component a to be inspected later. The connecting member 7 fixed so as to pass over the groove 8 across the outer peripheral member is provided with a notch 9 corresponding to the portion of the groove 8.
【0009】他方、外周部材6は、例えば、前記回転支
持部材3と同様の金属材料からなり、その外周面は、回
転支持部材3の内周面に対して摺動可能な嵌め合い寸法
を有し、かつ平滑に仕上げられており、回転支持部材3
に対して径方向の余裕が無く、しかも円滑に回転するよ
う支持されている。さらに、この外周部材6からは、そ
の周面中央から径方向にアーム11が突設され、このア
ーム11は、回転支持部材2のガイド孔3に貫通し、そ
の先端が回転支持部材2の外側に突出している。さら
に、回転支持部材2の外側に突出したアーム11の先端
の両側にローラ12が回転自在に軸着され、これらロー
ラ12が回転支持部材2の外周面に回転自在に当接して
いる。このローラ12は、回転支持部材2の外周面に転
がり接触することで、回転部材4の回転を円滑にすると
共に、回転支持部材4と回転支持部材2との径方向の余
裕を抑制し、それらにガタが生じないようにしている。
また、ガイド孔3は、回転支持部材2の周壁の約180
°の部分について設けられているため、回転部材4はそ
の範囲で回転可能である。図3において、左右両側に二
点鎖線でローラ12を示したが、ローラ12がこの位置
にあるとき、回転部材4の平面は縦に垂直になってお
り、回転部材4はその範囲で回転可能である。On the other hand, the outer peripheral member 6 is made of, for example, the same metal material as that of the rotary support member 3, and its outer peripheral surface has a fitting dimension slidable with respect to the inner peripheral surface of the rotary support member 3. And smooth finish, the rotation support member 3
Are supported in such a manner that there is no allowance in the radial direction and that they rotate smoothly. Further, an arm 11 projects radially from the center of the peripheral surface of the outer peripheral member 6, and the arm 11 penetrates the guide hole 3 of the rotation support member 2, and has a tip outside the rotation support member 2. It protrudes. Further, rollers 12 are rotatably mounted on both sides of the tip of an arm 11 protruding outside the rotation supporting member 2, and these rollers 12 rotatably abut on the outer peripheral surface of the rotation supporting member 2. The roller 12 comes into rolling contact with the outer peripheral surface of the rotation support member 2, thereby smoothing the rotation of the rotation member 4 and suppressing a radial margin between the rotation support member 4 and the rotation support member 2. To prevent backlash.
In addition, the guide hole 3 is formed at about 180 of the peripheral wall of the rotation support member 2.
The rotation member 4 is rotatable in that range because the rotation member 4 is provided for the part of the angle. In FIG. 3, the rollers 12 are indicated by two-dot chain lines on both the left and right sides. When the rollers 12 are in this position, the plane of the rotating member 4 is vertically vertical, and the rotating member 4 can rotate within that range. It is.
【0010】図1及び図2で明かな通り、前記回転部材
4の外周部材6の一方の端面には、レバー10が取り付
けられている。このレバー10は、円筒形の部材であ
り、その中心軸が回転部材4の中心軸の延長上に位置す
るように、外周部材6の一方の端面に固着されている。
レバー10の外周壁の一部であって、回転部材4の溝8
が真上を向いた状態で、上を向く部分が縦にスリット状
に開口している。このレバー10を図1において矢印R
で示すように回転すると、同図において矢印rで示すよ
うに、回転部材4がその中心軸の周りに回転する。前記
回転支持部材2は、一対の並行な側面L形の側板1、1
の間に端面側から挟まれ、さらに同支持部材2の端面に
前記側板1、1がボルトで止められている。そしてこの
側板1、1は、回転部材4の外周部材6の端面外周側の
部分にも当接し、同外周部材6を両端面側から挟んでい
る。これによって、回転部材4は、回転支持部材2の端
面から抜けないよう回転自在に挟持されている。この側
板1、1は、後述するように、図示の観察治具をフレー
ム等に設置するのに使用する部材であり、両側板は、完
全に並行であって、しかもその下面は、互いに延長平面
上にある。As is clear from FIGS. 1 and 2, a lever 10 is attached to one end surface of the outer peripheral member 6 of the rotating member 4. The lever 10 is a cylindrical member, and is fixed to one end surface of the outer peripheral member 6 so that the center axis thereof is located on the extension of the center axis of the rotating member 4.
A part of the outer peripheral wall of the lever 10,
Is facing upward, and the upward facing portion is vertically opened like a slit. This lever 10 is shown by an arrow R in FIG.
When rotated as shown by the arrow, the rotating member 4 rotates around its central axis as shown by the arrow r in FIG. The rotation support member 2 includes a pair of parallel side L-shaped side plates 1, 1.
Further, the side plates 1, 1 are bolted to the end surface of the support member 2 between the end surfaces. The side plates 1 and 1 also come into contact with the outer peripheral portion of the outer peripheral member 6 of the rotating member 4 and sandwich the outer peripheral member 6 from both end surfaces. Thereby, the rotating member 4 is rotatably held so as not to come off from the end face of the rotation supporting member 2. As will be described later, the side plates 1 and 1 are members used for installing the illustrated observation jig on a frame or the like, and both side plates are completely parallel, and the lower surfaces thereof are mutually extended flat surfaces. It's above.
【0011】このような治具を用いて、例えば図7で示
すようなチップ状回路部品aを顕微鏡で外観検査する場
合について次に説明する。図7に示されたチップ状回路
部品aは、立方体形の外形を有し、その両端面から底面
にわたって一対の電極b、bを有する。このチップ状回
路部品aは、前記治具を用いて外観検査をするに当り、
予め粘着テープTの粘着面に電極を有してない上面側を
貼り付け、一列に並べて固定する。粘着テープTは、前
記回転部材4の溝8よりやや狭い幅のものを用い、チッ
プ状回路部品aは、その中央に貼り付ける。粘着テープ
Tは、出来れば透明なテープであることが望ましい。A case where the appearance of a chip-shaped circuit component a as shown in FIG. 7 is inspected with a microscope using such a jig will be described below. The chip-shaped circuit component a shown in FIG. 7 has a cubic outer shape, and has a pair of electrodes b, b from both end surfaces to the bottom surface. This chip-shaped circuit component a is used for visual inspection using the jig.
An upper surface side having no electrode is pasted on the adhesive surface of the adhesive tape T in advance, and is fixed in a line. The adhesive tape T has a width slightly smaller than the groove 8 of the rotating member 4, and the chip-shaped circuit component a is attached to the center thereof. The adhesive tape T is preferably a transparent tape if possible.
【0012】一方、前記治具は例えば図4で示すように
設置する。すなわち、ベース48上に前記側板1、1を
用いて立設することで、その溝8の中央部分に顕微鏡4
1の観察エリアが位置し、且つ顕微鏡41の光軸と回転
部材4の回転軸が直交するよう、顕微鏡41の対物レン
ズの真下に設置する。さらに、ベース48上の前記溝8
の一方の延長上に、前記のようにしてチップ状回路部品
aを並べて接着した粘着テープTを巻き出す巻出しロー
ル44と、同粘着テープTをガイドするガイドローラ4
2、43とを配置する。また、前記溝8の他方の延長上
には、前記粘着テープTを巻き取る巻取りロール47と
ガイドローラ45、46とを配置する。そして、前記巻
出しロール44から巻出した粘着テープTは、ガイドロ
ーラ42、43を通した後、治具の部分で前記回転部材
4の溝8の中を通し、さらに、ガイドローラ45、46
を通した後、巻取りロール47で巻き取る。この場合、
図1と図3から明かなように、粘着テープTの粘着面に
並べて接着されたチップ状回路部品a側を上にして溝8
を通す。既に述べた通り、溝8の深さは、チップ状回路
部品aの高さの半分程であるため、溝8を通るチップ状
回路部品aのほぼ中心が回転部材4の中心軸を通る。On the other hand, the jig is set, for example, as shown in FIG. That is, by standing upright on the base 48 using the side plates 1, 1, the microscope 4 is placed at the center of the groove 8.
The microscope 41 is installed immediately below the objective lens of the microscope 41 so that the observation area 1 is located and the optical axis of the microscope 41 is orthogonal to the rotation axis of the rotating member 4. Further, the groove 8 on the base 48
And an unwinding roll 44 for unwinding the adhesive tape T on which the chip-shaped circuit components a are arranged and adhered as described above, and a guide roller 4 for guiding the adhesive tape T.
2, 43 are arranged. On the other extension of the groove 8, a take-up roll 47 for winding the adhesive tape T and guide rollers 45 and 46 are arranged. Then, the adhesive tape T unwound from the unwinding roll 44 passes through the guide rollers 42 and 43, and then passes through the groove 8 of the rotating member 4 at the jig portion, and further passes through the guide rollers 45 and 46.
Then, the film is wound up by a winding roll 47. in this case,
As is clear from FIGS. 1 and 3, the grooves 8 are arranged with the chip-shaped circuit component a side facing up and adhered to the adhesive surface of the adhesive tape T.
Pass through. As described above, since the depth of the groove 8 is about half the height of the chip-shaped circuit component a, the approximate center of the chip-shaped circuit component a passing through the groove 8 passes through the central axis of the rotating member 4.
【0013】このようにして、回転部材4の溝8に粘着
テープTを通し、粘着テープTを巻出しロール44から
巻取りロール47へ送りながら、その上のチップ状回路
部品aに顕微鏡41の焦点を合わせ、チップ状回路部品
aを順次観察する。そして、レバー10を手動等で回転
させることにより、回転部材4がチップ状回路部品aの
中心の周りに回転する。これにより、粘着テープTは、
溝8の前後で捩れるが、顕微鏡41での観察位置では、
チップ状回路部品aが溝8の中に保持された状態で回転
し、顕微鏡41に対するその向きが変えられる。回転部
材4は、チップ状回路部品aの中心の周りに回転するた
め、顕微鏡41の対物レンズとチップ状回路部品aとの
距離は回転中変わらず、従ってチップ状回路部品aが顕
微鏡の焦点からずれることがない。これによって、チッ
プ状回路部品aの向きを180°変えながら、顕微鏡4
1で観察し、外観検査することが可能となる。In this manner, the adhesive tape T is passed through the groove 8 of the rotating member 4, and the adhesive tape T is sent from the unwinding roll 44 to the winding roll 47, and the chip-shaped circuit component a thereon is placed on the microscope 41 by the microscope 41. Focusing is performed, and the chip-shaped circuit components a are sequentially observed. Then, by rotating the lever 10 manually or the like, the rotating member 4 rotates around the center of the chip-shaped circuit component a. Thereby, the adhesive tape T
Although it is twisted before and after the groove 8, at the observation position with the microscope 41,
The chip-shaped circuit component a rotates while being held in the groove 8, and its orientation with respect to the microscope 41 is changed. Since the rotating member 4 rotates around the center of the chip-shaped circuit component a, the distance between the objective lens of the microscope 41 and the chip-shaped circuit component a does not change during the rotation, so that the chip-shaped circuit component a is moved from the focal point of the microscope. There is no shift. Thus, while changing the direction of the chip-shaped circuit component a by 180 °, the microscope 4
It is possible to observe and inspect the appearance in step 1.
【0014】前記の実施例では、回転支持部材2が回転
部材4の外周側を支持する円筒形のものであるが、これ
は例えば、回転部材4の中心を回転自在に支持する軸状
のものであってもよい。すなわち、図5と図6とに各々
示した実施例では、回転支持部材4は、その中心軸上の
両端面に取り付けられた回転支持部材である軸ピン2、
2’を側板1、1に回転自在に支持することにより、中
心軸の周りに回転自在に支持されている。そして、一方
の軸ピン2’は、レバー10の中心に固着されている。
但しこの場合に、前記溝8は、軸ピン2’、2’を避け
て設けなければならないため、回転部材4の溝8は、顕
微鏡41での観察位置となる回転部材4の中央部におい
て回転部材4の回転中心軸に沿って形成されているが、
その前後では溝8に勾配を設けてある。すなわち、図5
では、回転部材4の中央部の手前で溝8に粘着テープT
が進む方向に対して負の勾配が与えられており、回転部
材4の中央部より先で溝8に正の勾配が与えられてい
る。また、図6では、この逆となっている。さらに、前
記実施例では、回転部材4をレバー10で手動回転する
ようになっているが、回転部材4を別の往復回転機構に
連結し、粘着テープTの自動送り手段と合わせて回転部
材4を自動回転するようにしてもよい。In the above-described embodiment, the rotation supporting member 2 is a cylindrical member that supports the outer peripheral side of the rotating member 4. For example, the rotation supporting member 2 is a shaft member that rotatably supports the center of the rotating member 4. It may be. That is, in the embodiments shown in FIGS. 5 and 6, the rotation support member 4 is a shaft pin 2 which is a rotation support member attached to both end surfaces on the center axis thereof.
2 'is rotatably supported by the side plates 1 and 1 so as to be rotatable about a central axis. One shaft pin 2 ′ is fixed to the center of the lever 10.
However, in this case, since the groove 8 must be provided so as to avoid the shaft pins 2 ′ and 2 ′, the groove 8 of the rotating member 4 is rotated at the central portion of the rotating member 4 where the microscope 41 is to observe. Although formed along the rotation center axis of the member 4,
Before and after that, the groove 8 is provided with a gradient. That is, FIG.
Then, the adhesive tape T is inserted into the groove 8 just before the center of the rotating member 4.
Has a negative gradient with respect to the direction of travel, and the groove 8 has a positive gradient before the center of the rotating member 4. In FIG. 6, the opposite is true. Further, in the above-described embodiment, the rotating member 4 is manually rotated by the lever 10. However, the rotating member 4 is connected to another reciprocating rotating mechanism, and the rotating member 4 is automatically combined with the automatic feeding means of the adhesive tape T. May be automatically rotated.
【0015】[0015]
【発明の効果】以上説明した通り、本発明によるチップ
状回路部品外観検査用治具を用いれば、多数のチップ状
回路部品を順次送りながら、それを回転してあらゆる方
向から観察することができる。しかも、顕微鏡の対物レ
ンズからの距離を変えずにチップ状回路部品の向きを変
えながら観察できるため、能率のよい外観検査が可能と
なる。As described above, by using the jig for inspecting the appearance of chip-shaped circuit components according to the present invention, it is possible to rotate a plurality of chip-shaped circuit components while sequentially feeding them, and observe them from all directions. . In addition, since observation can be performed while changing the direction of the chip-shaped circuit component without changing the distance from the objective lens of the microscope, efficient appearance inspection can be performed.
【図1】本発明の実施例を示すチップ状回路部品外観検
査用治具の斜視図である。FIG. 1 is a perspective view of a jig for inspecting the appearance of a chip-shaped circuit component according to an embodiment of the present invention.
【図2】同実施例を示すチップ状回路部品外観検査用治
具の側面図である。FIG. 2 is a side view of a jig for inspecting appearance of a chip-shaped circuit component according to the embodiment.
【図3】図2のA−A線断面図である。FIG. 3 is a sectional view taken along line AA of FIG. 2;
【図4】前記チップ状回路部品外観検査用治具の使用例
を示す側面図である。FIG. 4 is a side view showing an example of use of the jig for inspecting the appearance of chip-shaped circuit components.
【図5】本発明の他の実施例を示すチップ状回路部品外
観検査用治具の側面図である。FIG. 5 is a side view of a jig for inspecting the appearance of a chip-shaped circuit component according to another embodiment of the present invention.
【図6】本発明のさらに他の実施例を示すチップ状回路
部品外観検査用治具の側面図である。FIG. 6 is a side view of a jig for inspecting appearance of a chip-shaped circuit component according to still another embodiment of the present invention.
【図7】本発明の実施例によるチップ状回路部品外観検
査用治具を用いてチップ状回路部品を外観検査するとき
のチップ状回路部品の状態の例を示す斜視図である。FIG. 7 is a perspective view showing an example of the state of the chip-shaped circuit component when the appearance of the chip-shaped circuit component is inspected using the jig for inspecting the appearance of the chip-shaped circuit component according to the embodiment of the present invention.
2 回転支持部材 4 回転部材 8 溝 a チップ状回路部品 T 粘着テープ 2 Rotation support member 4 Rotation member 8 Groove a Chip-shaped circuit component T Adhesive tape
Claims (1)
であって、チップ状回路部品を一列に並べて貼り付けた
長尺な粘着テープを通す溝が形成された面を有する回転
部材と、該回転部材を前記溝の中央を回転中心軸として
回転自在に保持する回転支持部材とを有してなることを
特徴とするチップ状回路部品外観検査用治具。1. A jig for inspecting the appearance of a chip-shaped circuit component, comprising: a rotating member having a surface formed with a groove through which a long adhesive tape in which the chip-shaped circuit components are arranged and adhered; A jig for inspecting the appearance of a chip-shaped circuit component, comprising: a rotation support member for rotatably holding the rotation member around a center of the groove as a rotation center axis.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP34240791A JP2935384B2 (en) | 1991-11-30 | 1991-11-30 | Jig for visual inspection of chip-shaped circuit components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP34240791A JP2935384B2 (en) | 1991-11-30 | 1991-11-30 | Jig for visual inspection of chip-shaped circuit components |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH05152394A JPH05152394A (en) | 1993-06-18 |
| JP2935384B2 true JP2935384B2 (en) | 1999-08-16 |
Family
ID=18353493
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP34240791A Expired - Lifetime JP2935384B2 (en) | 1991-11-30 | 1991-11-30 | Jig for visual inspection of chip-shaped circuit components |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2935384B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7387466B2 (en) * | 2020-01-29 | 2023-11-28 | 株式会社ディスコ | Observation jig |
-
1991
- 1991-11-30 JP JP34240791A patent/JP2935384B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH05152394A (en) | 1993-06-18 |
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Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 19990420 |