JP3079255B2 - Online interference component removal device - Google Patents
Online interference component removal deviceInfo
- Publication number
- JP3079255B2 JP3079255B2 JP18004897A JP18004897A JP3079255B2 JP 3079255 B2 JP3079255 B2 JP 3079255B2 JP 18004897 A JP18004897 A JP 18004897A JP 18004897 A JP18004897 A JP 18004897A JP 3079255 B2 JP3079255 B2 JP 3079255B2
- Authority
- JP
- Japan
- Prior art keywords
- analysis sample
- ion
- analysis
- flow path
- cation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004458 analytical method Methods 0.000 claims description 69
- 150000001768 cations Chemical class 0.000 claims description 43
- 230000002452 interceptive effect Effects 0.000 claims description 39
- 150000001450 anions Chemical class 0.000 claims description 38
- 239000000523 sample Substances 0.000 claims description 38
- 150000002500 ions Chemical class 0.000 claims description 36
- 239000012488 sample solution Substances 0.000 claims description 33
- 239000003153 chemical reaction reagent Substances 0.000 claims description 30
- 238000005341 cation exchange Methods 0.000 claims description 26
- 239000012528 membrane Substances 0.000 claims description 25
- 239000003011 anion exchange membrane Substances 0.000 claims description 20
- 238000005342 ion exchange Methods 0.000 claims description 17
- 230000007935 neutral effect Effects 0.000 claims description 17
- 239000007788 liquid Substances 0.000 claims description 11
- 238000006243 chemical reaction Methods 0.000 claims description 10
- 238000005349 anion exchange Methods 0.000 claims description 2
- 230000032258 transport Effects 0.000 claims 1
- 239000000243 solution Substances 0.000 description 24
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 21
- 239000011734 sodium Substances 0.000 description 17
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 16
- 239000013535 sea water Substances 0.000 description 15
- 150000003839 salts Chemical class 0.000 description 14
- 238000002354 inductively-coupled plasma atomic emission spectroscopy Methods 0.000 description 12
- 238000001095 inductively coupled plasma mass spectrometry Methods 0.000 description 11
- 239000012491 analyte Substances 0.000 description 8
- 239000010949 copper Substances 0.000 description 8
- 239000011777 magnesium Substances 0.000 description 8
- 238000005070 sampling Methods 0.000 description 8
- 229910001385 heavy metal Inorganic materials 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 6
- 229910052785 arsenic Inorganic materials 0.000 description 5
- 230000007423 decrease Effects 0.000 description 5
- 239000003792 electrolyte Substances 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 4
- MDDIUTVUBYEEEM-UHFFFAOYSA-N azane;pyrrolidine-1-carbodithioic acid Chemical compound N.SC(=S)N1CCCC1 MDDIUTVUBYEEEM-UHFFFAOYSA-N 0.000 description 4
- 238000004895 liquid chromatography mass spectrometry Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 3
- 239000002253 acid Substances 0.000 description 3
- 125000000129 anionic group Chemical group 0.000 description 3
- 150000001793 charged compounds Chemical class 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 229910017604 nitric acid Inorganic materials 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 2
- AQLMHYSWFMLWBS-UHFFFAOYSA-N arsenite(1-) Chemical compound O[As](O)[O-] AQLMHYSWFMLWBS-UHFFFAOYSA-N 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 2
- 229910052793 cadmium Inorganic materials 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000003480 eluent Substances 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 1
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 239000013543 active substance Substances 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 150000001449 anionic compounds Chemical class 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 150000001767 cationic compounds Chemical class 0.000 description 1
- 239000002738 chelating agent Substances 0.000 description 1
- 238000004587 chromatography analysis Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010612 desalination reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- MOTZDAYCYVMXPC-UHFFFAOYSA-N dodecyl hydrogen sulfate Chemical compound CCCCCCCCCCCCOS(O)(=O)=O MOTZDAYCYVMXPC-UHFFFAOYSA-N 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- QWPPOHNGKGFGJK-UHFFFAOYSA-N hypochlorous acid Chemical compound ClO QWPPOHNGKGFGJK-UHFFFAOYSA-N 0.000 description 1
- 239000003014 ion exchange membrane Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000000155 isotopic effect Effects 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 239000006199 nebulizer Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- MCJGNVYPOGVAJF-UHFFFAOYSA-N quinolin-8-ol Chemical compound C1=CN=C2C(O)=CC=CC2=C1 MCJGNVYPOGVAJF-UHFFFAOYSA-N 0.000 description 1
- 239000012266 salt solution Substances 0.000 description 1
- 230000001235 sensitizing effect Effects 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- -1 sodium and magnesium Chemical class 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 239000012086 standard solution Substances 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は、誘導結合プラズマ
質量分析法(ICP-MS)、誘導結合プラズマ発光分析法
(ICP-ES)、液体クロマトグラフ質量分析法(LC-MS)
等の方法で、海水やアルカリ融解試料液などの高塩濃度
試料中の微量成分を分析するときに、干渉や感度低下の
原因となる高塩濃度成分を妨害とならない成分にオンラ
インで変換する装置に関する。The present invention relates to inductively coupled plasma mass spectrometry (ICP-MS), inductively coupled plasma atomic emission spectrometry (ICP-ES), and liquid chromatography mass spectrometry (LC-MS).
When analyzing trace components in high salt concentration samples such as seawater and alkali-melted sample liquids by such methods as above, this device converts on-line high salt concentration components that cause interference and lowers sensitivity to non-interfering components. About.
【0002】[0002]
【従来の技術】従来、ICP-MSやICP-ESで高塩濃度の試料
を分析する場合には、前処理することなく試料をプラズ
マに導入するか、試料を水で希釈して導入していた。
又、主な高塩濃度成分であるナトリウムやマグネシウム
等のアルカリ金属及びアルカリ土類金属は吸着せず、分
析対象である鉛、カドミウム、銅、亜鉛等の重金属のみ
を選択的に吸着するカラムに、試料を流して重金属を吸
着させた後、酸をカラムに流して重金属を溶出しプラズ
マに導入する方法が採られている。LC-MSでは溶離液に
高塩濃度の電解質を用いた場合でも、分析対象成分と高
濃度の電解質が一緒に質量分析計に導入されている。2. Description of the Related Art Conventionally, when analyzing a sample having a high salt concentration by ICP-MS or ICP-ES, the sample is introduced into plasma without pretreatment, or the sample is introduced after being diluted with water. Was.
In addition, alkali and alkaline earth metals such as sodium and magnesium, which are the main components with high salt concentration, are not adsorbed, and the column selectively adsorbs only heavy metals such as lead, cadmium, copper, and zinc to be analyzed. After flowing a sample to adsorb heavy metals, a method is adopted in which an acid is passed through a column to elute the heavy metals and introduce them into plasma. In LC-MS, even when an electrolyte with a high salt concentration is used as the eluent, the analyte and the high-concentration electrolyte are introduced into the mass spectrometer together.
【0003】なお従来、オンライン脱塩装置としては、
イオンクロマトグラフのサプレッサーがあるが、これは
分析対象陽イオンから妨害陰イオンを陰イオン交換膜を
介して除くと同時に、分析対象陽イオンの対イオンを交
換することにより電気伝導度の大きい成分に変換して感
度を上げる(又は分析対象陰イオンから妨害陽イオンを
陽イオン交換膜を介して除くと同時に、分析対象陰イオ
ンの対イオンを交換することにより電気伝導度の大きい
成分に変換して感度を上げる)機能を有している。すな
わち、機能的には増感効果はあるが、分析対象イオンと
は反対の電荷の妨害イオンを除く機能しかなく、そのた
めに使用するイオン交換膜も分析対象が陽イオンの場合
には陰イオン交換膜であり、分析対象が陰イオンの場合
には陽イオン交換膜である。このため、分析対象イオン
と妨害イオンの電荷が同じ場合には使用することができ
ない。[0003] Conventionally, as an online desalination apparatus,
There is an ion chromatograph suppressor, which removes interfering anions from the cations to be analyzed through an anion exchange membrane and, at the same time, exchanges the counterions of the cations to be analyzed to produce components with high electrical conductivity. Convert to increase sensitivity (or remove interfering cations from the anion to be analyzed through a cation exchange membrane, and at the same time, convert to a component with higher electrical conductivity by exchanging the counter ion of the anion to be analyzed) Function to increase the sensitivity). In other words, although it has a sensitizing effect functionally, it has only the function of removing interfering ions having the opposite charge to the ion to be analyzed. The membrane is a cation exchange membrane when the object to be analyzed is an anion. For this reason, it cannot be used when the charges of the ion to be analyzed and the interfering ion are the same.
【0004】[0004]
【発明が解決しようとする課題】ICP-MSやICP-ESで前処
理することなく試料をプラズマに導入した場合には、高
塩濃度成分が導入されることによるイオン化効率の変化
(イオン化干渉と呼ばれる)や高塩濃度成分由来の分子
イオンの干渉、又ネブライザーやサンプリングコーン、
スキマーコーンの目詰まり、イオンレンズ系の汚れなど
による感度の低下が著しい。試料を水で希釈した場合に
は、高塩濃度成分による妨害は少なくなるが、分析対象
成分も希釈されるため低濃度の成分は検出限界以下とな
って分析できない。カラムによる分離法を前処理法とし
て用いた場合は、操作が煩雑で時間がかかる。LC-MSで
溶離液に電解質を用いた場合には、質量分析計のイオン
化効率が低下するために感度も低下する。サプレッサー
を用いた場合には反対の電荷を有する妨害イオンしか除
けないため、例えば海水中のPb2+やCd2+を分析するのに
妨害となるNa+を除けないという問題があった。本発明
は、高塩濃度試料を分析装置に導入する際に、妨害とな
る高塩濃度成分をオンラインで連続的に除去することに
より上記の課題を解決する装置を得ることを目的として
いる。When a sample is introduced into a plasma without pretreatment by ICP-MS or ICP-ES, a change in ionization efficiency due to the introduction of a high salt concentration component (ionization interference and ) And interference of molecular ions derived from high salt concentration components, nebulizers and sampling cones,
Significant decrease in sensitivity due to clogging of skimmer cones and contamination of ion lens system. When the sample is diluted with water, the interference caused by the high salt concentration component is reduced, but the analysis target component is also diluted, so that the low concentration component is below the detection limit and cannot be analyzed. When a separation method using a column is used as a pretreatment method, the operation is complicated and time-consuming. When an electrolyte is used as the eluent in LC-MS, the sensitivity also decreases because the ionization efficiency of the mass spectrometer decreases. When a suppressor is used, only the interfering ions having the opposite charge can be removed, so that there is a problem that, for example, Na + that interferes with the analysis of Pb 2+ and Cd 2+ in seawater cannot be removed. An object of the present invention is to provide an apparatus that solves the above-mentioned problem by continuously removing a high-salt-concentration component that interferes when a high-salt concentration sample is introduced into an analyzer.
【0005】[0005]
【課題を解決するための手段】上記目的を達成するため
に、本発明においては、分析対象が陽イオンで高塩濃度
妨害成分も陽イオンの場合には、分析対象陽イオンのみ
をキレート試薬やイオン対形成試薬により電気的に中性
又は陰イオンの形に変換した後、陽イオン交換膜を介し
て試料溶液中の陽イオン妨害成分と除去液中の陽イオン
非妨害成分を交換することにより、分析試料溶液の主成
分組成を妨害がないように変換する。また、分析対象が
陰イオンで高塩濃度妨害成分も陰イオンの場合には、分
析対象陰イオンのみをキレート試薬やイオン対形成試薬
により電気的に中性又は陽イオンの形に変換した後、陰
イオン交換膜を介して試料溶液中の陰イオン妨害成分と
除去液中の陰イオン非妨害成分を交換することにより、
分析試料溶液の主成分組成を変換する。更に、高濃度の
陽イオンと陰イオンがともに妨害成分となる場合には、
分析対象イオン(陽イオン又は陰イオンどちらでもよ
い)のみをキレート試薬やイオン対形成試薬により電気
的に中性の形に変換した後、陽イオン交換膜を介して試
料溶液中の陽イオン妨害成分と除去液中の陽イオン非妨
害成分を交換するとともに、陰イオン交換膜を介して試
料溶液中の陰イオン妨害成分と除去液中の陰イオン非妨
害成分を交換することにより、分析試料溶液の主成分組
成を変換する。なお、分析対象成分が元々非イオン性の
ものである場合には、キレート試薬やイオン対形成試薬
を加える必要はない。In order to achieve the above object, according to the present invention, when the analyte is a cation and the high salt concentration interfering component is also a cation, only the cation to be analyzed is replaced with a chelating reagent or a cation. After conversion into an electrically neutral or anionic form by an ion-pairing reagent, the cation-interfering component in the sample solution and the cation-non-interfering component in the removing solution are exchanged through a cation exchange membrane. The main component composition of the analysis sample solution is converted so as not to interfere. When the analyte is an anion and the high salt concentration interfering component is also an anion, after only the anion to be analyzed is electrically converted to a neutral or cation form by a chelating reagent or an ion pairing reagent, By exchanging the anion interfering component in the sample solution and the anion non-interfering component in the removing solution through the anion exchange membrane,
The main component composition of the analysis sample solution is converted. Furthermore, when both high concentrations of cations and anions are interfering components,
After converting only the ions to be analyzed (either cations or anions) into an electrically neutral form using a chelating reagent or an ion pairing reagent, the cation interfering component in the sample solution is passed through a cation exchange membrane. By exchanging the cation non-interfering components in the removing solution with the anion exchange component, and exchanging the anion interfering components in the sample solution and the anion non-interfering components in the removing solution through the anion exchange membrane, Convert the main component composition. When the component to be analyzed is originally nonionic, it is not necessary to add a chelating reagent or an ion pair forming reagent.
【0006】陽イオン妨害成分の除去液としては、希硫
酸溶液やドデシル硫酸溶液がよく用いられるが他の酸を
用いてもよい。例えば、希硫酸を用いた場合には、陽イ
オンの妨害成分(例えばNa+)と希硫酸のH+が陽イオン
交換膜を介して交換する。陰イオン妨害成分の除去液と
しては、水酸化ナトリウム溶液がよく用いられるが、IC
P-MSやICP-ESで分析する場合には、NO3 ーやHCO3 -も妨害
が少ないので、NaNO3やHNO3、NaHCO3溶液などを用いて
もよい。例えば、水酸化ナトリウムを用いた場合には、
陰イオンの妨害成分(例えばCl-)と水酸化ナトリウム
のOH-が陰イオン交換膜を介して交換する。又、例え
ば、希硫酸と水酸化ナトリウムを各々の除去液として用
いた場合には、H+とOH-が各々妨害成分と交換して、試
料溶液中に入ってくるが、これらは反応してH2Oとなる
ため測定の妨害とならない。希硫酸とNaNO3溶液を用い
た場合には、H+とNO3 -が試料溶液に入ってくることにな
るが、ICP-MSやICP-ESではHNO3は殆ど妨害しない。A dilute sulfuric acid solution or a dodecyl sulfuric acid solution is often used as a cation-interfering component removing solution, but another acid may be used. For example, when dilute sulfuric acid is used, a cation interfering component (eg, Na + ) and H + of the dilute sulfuric acid are exchanged via the cation exchange membrane. Sodium hydroxide solution is often used as a solution for removing anion-interfering components.
In the case of analysis by P-MS or ICP-ES, since NO 3 - and HCO 3 - also have little interference, a NaNO 3 , HNO 3 , NaHCO 3 solution or the like may be used. For example, when using sodium hydroxide,
Anionic interfering components (eg, Cl − ) and OH − of sodium hydroxide exchange via the anion exchange membrane. Also, for example, when dilute sulfuric acid and sodium hydroxide are used as the respective removing solutions, H + and OH − exchange with the interfering components, respectively, and enter into the sample solution. Because it is H 2 O, it does not disturb the measurement. When dilute sulfuric acid and NaNO 3 solution are used, H + and NO 3 − enter the sample solution, but HNO 3 hardly interferes with ICP-MS or ICP-ES.
【0007】[0007]
【作用】上記のように構成された装置において、陽イオ
ン交換膜は試料溶液中の陽イオン妨害成分と除去液中の
陽イオン非妨害成分を交換する働きをする。除去液は陽
イオン交換膜に分析の妨害とならない陽イオンを常に供
給すると同時に陽イオン交換膜を通過してきた陽イオン
妨害成分を系外に除去する働きをする。陰イオン交換膜
は試料溶液中の陰イオン妨害成分と除去液中の陰イオン
非妨害成分を交換する働きをする。除去液は陰イオン交
換膜に測定の妨害とならない陰イオンを常に供給すると
同時に陰イオン交換膜を通過してきた陰イオン妨害成分
を系外に除去する働きをする。In the apparatus constructed as described above, the cation exchange membrane functions to exchange the cation interfering component in the sample solution with the cation non-interfering component in the removing solution. The removing solution constantly supplies cations which do not disturb the analysis to the cation exchange membrane, and at the same time functions to remove the cation interfering components which have passed through the cation exchange membrane out of the system. The anion exchange membrane functions to exchange anion blocking components in the sample solution and non-blocking components in the removing solution. The removing solution constantly supplies anions which do not disturb the measurement to the anion exchange membrane, and at the same time, functions to remove the anion interfering components which have passed through the anion exchange membrane to the outside of the system.
【0008】キレート試薬やイオン対形成試薬は、分析
対象成分と錯体やイオン対を形成することにより、妨害
成分が陽イオンの場合には、分析対象成分を電気的に中
性又は陰イオンの化合物に交換し、妨害成分が陰イオン
の場合には、分析対象成分を電気的に中性又は陽イオン
の化合物に交換し、妨害成分が陽イオンと陰イオンの両
方の場合には、分析対象成分を電気的に中性の化合物に
変換する働きをする。分析対象成分が元々中性である場
合には添加する必要はない。The chelating reagent and the ion-pair forming reagent form a complex or an ion pair with the analyte, and when the interfering component is a cation, convert the analyte into an electrically neutral or anionic compound. If the interfering component is an anion, the analyte is exchanged for an electrically neutral or cationic compound.If the interfering component is both a cation and an anion, the analyte is To an electrically neutral compound. If the component to be analyzed is originally neutral, it need not be added.
【0009】[0009]
【発明の実施の形態】本発明の実施の形態を実施例に基
づいて図面とともに説明する。図1は、本発明のオンラ
イン干渉成分除去装置の構成図である。本発明のオンラ
イン干渉成分除去装置は、希硝酸溶液の流れの中に分析
試料(例えば、海水)を分取するサンプリングバルブ1
と、キレート試薬を希硝酸溶液の流れ中に分取しするサ
ンプリングバルブ2と、これらの分析試料及びキレート
試薬を流す送液ポンプ3と、分析試料とキレート試薬を
流す分析試料流路4と、この分析試料流路4の途中に順
次設けられた反応コイル5及びイオン交換部6とから主
に構成される。反応コイル5は、上記サンプリングバル
ブ1、2で夫々分取された分析試料とキレート試薬を混
合、反応させ、分析試料溶液中の分析対象イオンを電気
的に中性の形とする。イオン交換部6は、分析試料流路
4を両側から挟み込むように分析流路に面して配設され
た陽イオン交換膜7及び陰イオン交換膜8とを備えてお
り、両イオン交換膜7、8の間に分析試料溶液が送り込
まれる。又イオン交換部6に連通するように、陽イオン
除去液供給流路9及び陰イオン除去液供給流路10が配
設されている。陽イオン除去液供給流路9及び陰イオン
除去液供給流路10は、陽イオン交換膜7及び陰イオン
交換膜8を夫々透過した試料溶液中の陽イオン妨害成分
及び陰イオン妨害成分を運び去ると同時に、分析の妨害
とならない別の陽イオン及び陰イオンを夫々陽イオン交
換膜7及び陰イオン交換膜8を介して分析試料溶液に供
給する。DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described with reference to the drawings based on embodiments. FIG. 1 is a configuration diagram of the online interference component removing apparatus of the present invention. The on-line interference component removing apparatus according to the present invention includes a sampling valve 1 for collecting an analysis sample (for example, seawater) in a flow of a dilute nitric acid solution.
A sampling valve 2 for separating the chelating reagent into the flow of the dilute nitric acid solution, a liquid sending pump 3 for flowing the analysis sample and the chelating reagent, an analysis sample flow path 4 for flowing the analysis sample and the chelating reagent, It is mainly composed of a reaction coil 5 and an ion exchange section 6 provided sequentially in the middle of the analysis sample flow path 4. The reaction coil 5 mixes and reacts the analysis sample and the chelating reagent fractionated by the sampling valves 1 and 2 to make the ions to be analyzed in the analysis sample solution electrically neutral. The ion exchange section 6 includes a cation exchange membrane 7 and an anion exchange membrane 8 disposed facing the analysis flow channel so as to sandwich the analysis sample flow channel 4 from both sides. , 8 the sample solution is pumped. A cation removing liquid supply flow path 9 and an anion removing liquid supply flow path 10 are provided so as to communicate with the ion exchange unit 6. The cation-removing liquid supply flow path 9 and the anion-removing liquid supply flow path 10 carry cation-disturbing components and anion-disturbing components in the sample solution that have passed through the cation exchange membrane 7 and the anion exchange membrane 8, respectively. At the same time, other cations and anions that do not disturb the analysis are supplied to the analysis sample solution via the cation exchange membrane 7 and the anion exchange membrane 8, respectively.
【0010】図2は、試料として分析対象成分であるCu
2+、陽イオン妨害成分Na+、陰イオン妨害成分Clーがサン
プリングされ、キレート試薬HLと混合反応した溶液が
イオン交換部6に導入された場合のイオン交換の状態を
示している。 陽イオン妨害成分の除去液として、例え
ば、希硫酸H2SO4を用いた場合には、陽イオンの妨害成
分Na+と希硫酸のH+が陽イオン交換膜を介して交換す
る。陰イオン妨害成分の除去液として、例えば、水酸化
ナトリウムNaOHを用いた場合には、陰イオンの妨害成分
Cl-と水酸化ナトリウムのOH-が陰イオン交換膜を介して
交換し、H+とOH-が各々妨害成分と交換して、試料溶液
中に入ってくるが、これらは反応してH2Oとなるため測
定の妨害とならない。FIG. 2 shows a sample, Cu, which is a component to be analyzed.
2+, + cations interfering components Na, anionic interfering components Cl chromatography is sampled, the chelating reagent HL mixed reaction solution indicates a state of the ion exchange when it is introduced into the ion exchange unit 6. When, for example, dilute sulfuric acid H 2 SO 4 is used as the cation interfering component removing solution, the cation interfering component Na + and the dilute sulfuric acid H + are exchanged via the cation exchange membrane. For example, when sodium hydroxide NaOH is used as a liquid for removing anion interference components, anion interference components are removed.
Cl - and OH Sodium hydroxide - is exchanged via the anion exchange membrane, H + and OH - by replacing with each interference component, but enters the sample solution, it reacts H 2 Since it becomes O, it does not disturb the measurement.
【0011】図1及び図2では、分析試料溶液から分析
の妨害となる高濃度の陽イオンと陰イオンを透過・除去
するためのオンライン干渉成分除去装置を説明したが、
分析試料溶液から分析の妨害となる高濃度の陽イオンの
みをを透過・除去するための陽イオンオンライン干渉成
分除去装置では、図1において陰イオン交換膜及び陰イ
オン供給除去ラインは不要であり、逆に分析試料溶液か
ら分析の妨害となる高濃度の陰イオンのみをを透過・除
去するための陰イオンオンライン干渉成分除去装置で
は、図1において陽イオン交換膜及び陽イオン供給除去
ラインは不要である。又、分析試料溶液から分析の妨害
となる高濃度の陽イオンと陰イオンを透過・除去するた
めには、図1において、陽イオン交換膜及び陰イオン交
換膜を分析試料流路の両側に設けるイオン交換部の替わ
りに、陽イオン除去供給流路に連通し陽イオン交換膜の
みを備えた陽イオン交換部と陰イオン供給流路に連通し
陰イオン交換膜のみを備えたイオン交換部とを、分析試
料流路に沿って直列に配列してもよい。In FIGS. 1 and 2, an on-line interference component removing apparatus for transmitting and removing high concentrations of cations and anions which interfere with the analysis from the analysis sample solution has been described.
In the cation on-line interference component removal apparatus for permeating and removing only high-concentration cations that interfere with analysis from the analysis sample solution, the anion exchange membrane and the anion supply / removal line are unnecessary in FIG. Conversely, in the anion on-line interference component removal apparatus for permeating and removing only high-concentration anions that interfere with analysis from the analysis sample solution, the cation exchange membrane and the cation supply / removal line are unnecessary in FIG. is there. In addition, in order to transmit and remove high concentrations of cations and anions that interfere with analysis from the analysis sample solution, cation exchange membranes and anion exchange membranes are provided on both sides of the analysis sample flow path in FIG. Instead of the ion exchange section, a cation exchange section having only a cation exchange membrane communicating with the cation removal supply flow path and an ion exchange section having only an anion exchange membrane communicating with the anion supply flow path are provided. And may be arranged in series along the analysis sample flow path.
【0012】さらに、図1のオンライン干渉成分除去装
置を海水中の重金属類をICPーMS又はICPーESで測定する場
合に適用した装置について説明する。試料としてのpH2
で保存された海水とAPDC 0.1%溶液を各々適当量(例え
ば0.1 ml)サンプリングバルブ1及び2に分取した後、
サンプリングバルブを切り換えて海水試料とキレート試
薬を各々希硝酸(例えば5 mM HNO3)の流れの流路中に
導入する。反応コイル5にて海水試料とキレート試薬を
混合、反応させた後、イオン交換部6に送り込む。イオ
ン交換部6から出てくる試料溶液をICP-MS又はICP-ESに
導入して分析する。本発明のオンライン干渉成分除去装
置を用いた場合(表1の列番号No.4)と用いない場合
(表1の列番号No.1)にICP-MSで分析した結果を表1に
示す。なお、表の列番号No.2とNo.3はキレート試薬を添
加せずに分析した結果である。列番号No.1とNo.2の結果
は天然の海水を分析した値であり、列番号No.3とNo.4の
結果は表に示した濃度になるように天然の海水に各重金
属のスタンダード溶液を添加した試料を分析したときの
値である。ここでは一例として海水中の主要な陽イオン
妨害成分であるNa+とMg2+並びに分析対象成分であるCu
2+, Cd2+, Pb2+のシグナル強度を示した。この表からは
イオン交換作用により妨害成分であるNa+とMg2 +が99.99
%以上除かれていることが分かる(シグナル強度が23Na+
の場合、2×109から1×105に低下、25Mg2+の場合、2×1
08から5×103に低下)。また、分析対象成分であるC
u2+, Cd2+, Pb2+はキレート試薬による錯形成を受けな
いとNa+やMg2 +と同様除かれてしまうが(列番号No.3の
結果)、錯形成により電気的に中性の化合物に変換され
ることにより、試料溶液から除かれることなくプラズマ
に導入されていることが分かる(列番号No.4の結果)。
妨害成分、例えばNa+が大量に存在すると、Na+とプラズ
マガスであるArの分子イオン(40Ar23Na+)が生じ、こ
れが63Cu+の質量数63と一致するためシグナルが重なっ
て大きな干渉となる(列番号No.1の63Cu+が1×105)。C
uの天然の同位体比(63Cu/65Cu)は7:3となるはずであ
るが、Na+が除去されないと、この比から大きく外れた
値となる。一方、妨害成分を除去した場合には、ほぼ天
然の同位体比に近い値が得られており、分子イオンによ
る干渉が除去されていることを示している。Further, a description will be given of an apparatus in which the on-line interference component removing apparatus of FIG. 1 is applied to a case where heavy metals in seawater are measured by ICP-MS or ICP-ES. PH2 as sample
After dispensing appropriate amounts (eg, 0.1 ml) of the seawater and the APDC 0.1% solution respectively stored in the sampling valves 1 and 2,
By switching the sampling valve, the seawater sample and the chelating reagent are respectively introduced into the flow path of dilute nitric acid (for example, 5 mM HNO 3 ). After the seawater sample and the chelating reagent are mixed and reacted in the reaction coil 5, the mixture is sent to the ion exchange unit 6. The sample solution coming out of the ion exchange section 6 is introduced into ICP-MS or ICP-ES for analysis. Table 1 shows the results of analysis by ICP-MS when the on-line interference component removing apparatus of the present invention was used (column No. 4 in Table 1) and when it was not used (column No. 1 in Table 1). The column numbers No. 2 and No. 3 in the table are the results of analysis without adding a chelating reagent. The results of column numbers No. 1 and No. 2 are values obtained by analyzing natural seawater, and the results of column numbers No. 3 and No. 4 show that the concentrations of each heavy metal This is the value when the sample to which the standard solution was added was analyzed. Here, as an example, the main cation interfering components in seawater, Na + and Mg2 + , and the analyte, Cu
The signal intensities of 2+ , Cd 2+ and Pb 2+ were shown. From this table, 99.99% of Na + and Mg 2 + which are interfering components due to ion exchange
% Or more (signal intensity is 23 Na +
In case of, reduced from 2 × 10 9 to 1 × 10 5 , In case of 25 Mg 2+ , 2 × 1
0 8 to 5 × 10 3 ). In addition, the analysis target component C
If u 2+ , Cd 2+ , and Pb 2+ are not complexed by the chelating agent, they will be removed in the same manner as Na + and Mg 2 + (result of column No. 3). It can be seen that by being converted to a neutral compound, it was introduced into the plasma without being removed from the sample solution (result of column No. 4).
Large interfering components, for example, Na + is present in large amounts, Na + and Ar molecular ions (40 Ar 23 Na +) is generated a plasma gas, which overlaps a signal to match the 63 Cu + a mass number of 63 Interference ( 63 Cu + in column No. 1 is 1 × 10 5 ). C
natural isotopic ratio of u (63 Cu / 65 Cu) is 7: should be 3, the Na + is not removed, a large outlier from this ratio. On the other hand, when the interfering component was removed, a value almost close to the natural isotope ratio was obtained, indicating that interference by molecular ions was removed.
【表1】 [Table 1]
【0013】海水中のヒ素をICP-MSで分析する場合、海
水中の塩化物イオン(Cl-)とプラズマガスであるArの
二原子イオン(40Ar35Cl+)がヒ素の質量数75(75As+)
と重なって大きな妨害を与える。海水中ではヒ素は亜ヒ
酸やヒ酸など陰イオンの形で存在しているが、キレート
試薬と反応してやはり中性の化合物に変換されている。
上記と同様にICP-MSで分析したときの結果を表2に示
す。表2からは海水中の主要な妨害陰イオン成分である
Cl-やBr-が95%以上除かれていること(シグナル強度が
35Cl-の場合1×107から4×105に低下、79Br-の場合4×1
05から2×103に低下)、並びにヒ素はAPDCにより電気的
に中性の錯体に変換されて、試料溶液から除かれること
なくプラズマに導入されていることが分かる(列番号N
o.4)。Cl-が大量に存在するとAsが存在しなくても1.4
×103の値(列番号No.1)となっており、Cl-がAsの分析
に大きく干渉していることが分かる。上記の方法では、
APDCと錯体を形成して電気的に中性となる元素、例え
ば、As、Cd、Cu、Co、Ni、Fe、Cr、Mn、Mo、Sb、Pb、Zn
等の元素を、海水中の主要な塩分であるNa+, Mg2+,Cl-,
Br-等の干渉を受けることなく、オンラインで分析する
ことが可能となる。又、APDCの代わりにオキシンなどの
他のキレート試薬を用いれば分析可能となる元素の種類
を変えることも可能である。When arsenic in seawater is analyzed by ICP-MS, chloride ions (Cl − ) in seawater and diatomic ions of Ar ( 40 Ar 35 Cl + ), which is a plasma gas, have a mass number of arsenic of 75 ( 75 As + )
Overlap with and cause great interference. In seawater, arsenic exists in the form of anions such as arsenite and arsenite, but is also converted to a neutral compound by reacting with a chelating reagent.
Table 2 shows the results of analysis by ICP-MS in the same manner as described above. Table 2 shows the major interfering anion components in seawater
95% or more of Cl - or Br - is removed (signal intensity
35 Cl - decreases when the 1 × 10 7 to 4 × 10 5 of, 79 Br - in the case 4 × 1
0 drops 5 from 2 × 10 3), and arsenic is converted into electrical complex neutral by APDC, you can see that this is introduced into the plasma without being removed from the sample solution (column number N
o.4). If Cl - is present in large quantities, even if As is not present, 1.4
The value was × 10 3 (column number No. 1), indicating that Cl − significantly interfered with the analysis of As. In the above method,
Elements that form a complex with APDC and become electrically neutral, for example, As, Cd, Cu, Co, Ni, Fe, Cr, Mn, Mo, Sb, Pb, Zn
Elements etc., Na + is the major salt in seawater, Mg 2+, Cl -,
Analysis can be performed online without interference from Br- and the like. Further, if another chelating reagent such as oxine is used instead of APDC, the kind of element that can be analyzed can be changed.
【0014】ソーダ工業で使われている高濃度塩水中の
極微量のMg2+やCa2+をICP-ESで測定する例。高塩濃度塩
水をキレート試薬であるEDTA溶液(例えば0.1%)と混
合、反応させると、Mg2+とCa2+は各々MgEDTA2-とCaEDTA
2-の陰イオンの形態に変換される。ICP-ESでは高濃度の
Cl-が導入されても干渉しないため、除去する必要があ
るのは陽イオンのNa+のみである。従って、この場合に
は、分析試料溶液から分析の妨害となる高濃度の陽イオ
ンのみを透過・除去するための前記陽イオンオンライン
干渉成分除去装置に記載された装置を用いてNa+を除去
する。除去液として希硫酸を流しておけばH+が陽イオン
交換膜を介してNa+と交換する。この結果、Cl-、S
O4 2-、ClO2 -(電解副産物として塩水中に含まれる)は
各々HCl、H2SO4、HClO2の酸として導入されるために、
ネブライザーやプラズマトーチ先端部を詰まらせること
もなく、又、ICP-ESではMgやCaの測定の妨害とならな
い。An example of measuring trace amounts of Mg 2+ and Ca 2+ in high concentration salt water used in the soda industry by ICP-ES. When high salt solution is mixed and reacted with an EDTA solution (eg, 0.1%) as a chelating reagent, Mg 2+ and Ca 2+ become MgEDTA 2- and CaEDTA, respectively.
It is converted to the 2- anion form. In ICP-ES, high concentration
Cl - because no interference is introduced, there needs to be removed is only cations Na +. Therefore, in this case, Na + is removed from the analysis sample solution using the apparatus described in the cation on-line interference component removal apparatus for transmitting and removing only high-concentration cations that hinder analysis. . If dilute sulfuric acid is allowed to flow as a removing solution, H + exchanges with Na + via a cation exchange membrane. As a result, Cl -, S
O 4 2-, ClO 2 - to (included in saline as an electrolyte by-products) are each HCl, is introduced as the acid of H 2 SO 4, HClO 2,
It does not clog the nebulizer or the tip of the plasma torch, and does not interfere with the measurement of Mg and Ca in ICP-ES.
【0015】[0015]
【発明の効果】以上説明したように、本発明の干渉成分
除去装置は、分析対象イオンを電気的に中性又は妨害イ
オンと反対の電荷のイオンの形に変換後、分析の妨害と
なるイオンをイオン交換膜によりオンラインで除去する
ことにより、海水やアルカリ融解溶液等の高塩濃度試料
中の微量重金属をICP-MSやICP-ESで分析することを可能
とする。又、LC-MSにおいてもイオン化効率低下の原因
となる電解質(塩類)をオンラインで除去することによ
り、生理活性物質や環境汚染物質などを高い効率でイオ
ン化することが可能となり、分析感度を向上する効果が
ある。又、本発明はオンラインで測定の妨害となる成分
の除去を可能とすることから、分析時間の大幅な短縮や
複雑な前処理や分離操作を省力化する効果がある。As described above, the interference component removing apparatus of the present invention converts an ion to be analyzed into an ion having a charge opposite to that of an electrically neutral or interfering ion, and then disturbs the ion which interferes with the analysis. Removal of on-line by an ion exchange membrane makes it possible to analyze trace heavy metals in high salt concentration samples such as seawater and alkali melting solutions by ICP-MS and ICP-ES. Also, in LC-MS, by removing the electrolytes (salts) that cause the decrease in ionization efficiency on-line, it is possible to ionize physiologically active substances and environmental pollutants with high efficiency, improving the analysis sensitivity. effective. Further, the present invention enables the removal of components that interfere with the measurement on-line, so that the analysis time is significantly reduced and the complicated pretreatment and separation operations are saved.
【表2】 [Table 2]
【図1】本発明のオンライン干渉成分除去装置の構成図
である。FIG. 1 is a configuration diagram of an on-line interference component removing apparatus of the present invention.
【図2】本発明のオンライン干渉成分除去装置内で起こ
っている反応の説明図である。FIG. 2 is an explanatory diagram of a reaction occurring in the on-line interference component removing apparatus of the present invention.
1 サンプリングバルブ(試料用) 2 サンプリングバルブ(キレート試薬用) 3 送液ポンプ 4 分析試料流路 5 反応コイル 6 イオン交換部 7 陽イオン交換膜 8 陰イオン交換膜 9 陽イオン除去液供給流路 10 陰イオン除去液供給流路 DESCRIPTION OF SYMBOLS 1 Sampling valve (for sample) 2 Sampling valve (for chelating reagent) 3 Liquid sending pump 4 Analysis sample flow path 5 Reaction coil 6 Ion exchange part 7 Cation exchange membrane 8 Anion exchange membrane 9 Cation removal liquid supply flow path 10 Anion removal liquid supply channel
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭53−149182(JP,A) 特開 平3−144356(JP,A) 特開 昭57−74660(JP,A) 特開 平2−66450(JP,A) 実開 昭60−179850(JP,U) 特公 平2−25146(JP,B2) 環境化学、第5巻、第2号、第360− 361頁(1995年) (58)調査した分野(Int.Cl.7,DB名) G01N 1/00 - 1/34 G01N 21/62 - 21/74 G01N 30/00 - 30/96 ──────────────────────────────────────────────────続 き Continuation of front page (56) References JP-A-53-149182 (JP, A) JP-A-3-144356 (JP, A) JP-A-57-74660 (JP, A) JP-A-2- 66450 (JP, A) Japanese Utility Model Showa 60-179850 (JP, U) Japanese Patent Publication No. 2-25146 (JP, B2) Environmental Chemistry, Vol. 5, No. 2, pp. 360-361 (1995) (58) ) Surveyed field (Int.Cl. 7 , DB name) G01N 1/00-1/34 G01N 21/62-21/74 G01N 30/00-30/96
Claims (4)
と、この分析試料流路の途中に配設され分析対象イオン
をキレート試薬又はイオン対形成試薬と反応させて電気
的に中性の形に変換するための反応コイルと、上記分析
試料流路の途中に配設されたイオン交換部と、このイオ
ン交換部に設けられ、上記分析試料溶液から分析の妨害
となる高濃度の陽イオン及び陰イオンを夫々透過・除去
するための陽イオン交換膜及び陰イオン交換膜と、上記
陽イオン交換膜及び陰イオン交換膜を夫々透過した妨害
イオンを上記イオン交換器外に運び去ると同時に、分析
の妨害とならない夫々別の陽イオン及び陰イオンを上記
陽イオン交換膜及び陰イオン交換膜を介して上記分析試
料溶液に供給するための陽イオン除去液供給流路及び陰
イオン除去液供給流路とを備えたことを特徴とするオン
ライン干渉成分除去装置。An analysis sample flow path through which an analysis sample solution flows, and an ion to be analyzed, which is provided in the middle of the analysis sample flow path, reacts with a chelating reagent or an ion pair forming reagent to be electrically neutralized. A reaction coil for converting into a form, an ion exchange section provided in the middle of the analysis sample flow path, and a high concentration of cations provided in the ion exchange section and obstructing analysis from the analysis sample solution. And a cation exchange membrane and an anion exchange membrane for permeating and removing anions, respectively, and simultaneously transporting the interfering ions permeating the cation exchange membrane and the anion exchange membrane out of the ion exchanger, A cation removing solution supply flow path and an anion removing solution supply flow for supplying different cations and anions that do not disturb the analysis to the analysis sample solution through the cation exchange membrane and the anion exchange membrane, respectively. And an on-line interference component removing device.
と、この分析試料流路の途中に配設され分析対象イオン
をキレート試薬又はイオン対形成試薬と反応させて電気
的に中性又は陰イオンの形に変換するための反応コイル
と、上記分析試料流路の途中に配設されたイオン交換部
と、このイオン交換部に設けられ分析試料溶液から分析
の妨害となる高濃度の陽イオンを透過・除去するための
陽イオン交換膜と、この陽イオン交換膜を透過した妨害
イオンを上記イオン交換器外に運び去ると同時に、分析
の妨害とならない別の陽イオンを陽イオン交換膜を介し
て上記分析試料溶液に供給するための陽イオンを流すた
めの陽イオン除去液供給流路とを備えたことを特徴とす
るオンライン干渉成分除去装置。2. An analysis sample flow path for flowing an analysis sample solution, and an ion to be analyzed, which is provided in the middle of the analysis sample flow path, reacts with a chelating reagent or an ion pair forming reagent to be electrically neutral or neutral. A reaction coil for converting to an anion form, an ion exchange section provided in the middle of the analysis sample flow path, and a high-concentration positive electrode provided in the ion exchange section and obstructing analysis from the analysis sample solution. A cation exchange membrane for permeating and removing ions, and a cation exchange membrane that transports interfering ions that have passed through the cation exchange membrane to the outside of the ion exchanger and simultaneously removes another cation that does not interfere with analysis. And a cation removal liquid supply channel for flowing cations to be supplied to the analysis sample solution through the sample.
と、この分析試料流路の途中に配設され分析対象イオン
をキレート試薬又はイオン対形成試薬と反応させて電気
的に中性又は陽イオンの形に変換するための反応コイル
と、上記分析試料流路の途中に配設されたイオン交換部
と、このイオン交換部に設けられ分析試料溶液から分析
の妨害となる高濃度の陰イオンを透過・除去するための
陰イオン交換膜と、上記陰イオン交換膜を透過した妨害
イオンを上記イオン交換器外に運び去ると同時に、分析
の妨害とならない別の陰イオンを上記陰イオン交換膜を
介して分析試料溶液に供給するための陰イオンを流すた
めの陰イオン除去液供給流路とを備えたことを特徴とす
るオンライン干渉成分除去装置。3. An analysis sample flow path through which an analysis sample solution flows, and an ion to be analyzed, which is provided in the middle of the analysis sample flow path, reacts with a chelating reagent or an ion pair forming reagent to be electrically neutral or neutral. A reaction coil for converting to a cation form, an ion exchange section provided in the middle of the analysis sample flow path, and a high-concentration shade which is provided in the ion exchange section and interferes with analysis from the analysis sample solution. An anion exchange membrane for permeating / removing ions, and transporting interfering ions permeating the anion exchange membrane out of the ion exchanger, and simultaneously exchanging another anion that does not interfere with the analysis. An on-line interference component removing device, comprising: an anion removing solution supply flow path for flowing an anion to be supplied to an analysis sample solution through a membrane.
と、この分析試料流路の途中に配設された分析対象イオ
ンをキレート試薬又はイオン対形成試薬と反応させて電
気的に中性の形に変換するための反応コイルと、上記分
析試料流路の途中に配設された請求項2の陽イオン交換
部及び陽イオン除去供給流路と、請求項3の陰イオン交
換部及び陰イオン供給流路とを備え、上記陽イオン交換
部と上記陰イオン交換部とは分析試料流路に沿って直列
に配設したことを特徴とするオンライン干渉成分除去装
置。4. An analysis sample channel through which an analysis sample solution flows, and an ion to be analyzed disposed in the middle of the analysis sample channel reacting with a chelating reagent or an ion pair forming reagent to be electrically neutralized. A cation exchange section and a cation removal supply flow path according to claim 2, which are disposed in the middle of the analysis sample flow path; An on-line interference component removing device comprising an ion supply channel, wherein the cation exchange section and the anion exchange section are arranged in series along the analysis sample channel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18004897A JP3079255B2 (en) | 1997-07-04 | 1997-07-04 | Online interference component removal device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18004897A JP3079255B2 (en) | 1997-07-04 | 1997-07-04 | Online interference component removal device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1123465A JPH1123465A (en) | 1999-01-29 |
| JP3079255B2 true JP3079255B2 (en) | 2000-08-21 |
Family
ID=16076582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18004897A Expired - Lifetime JP3079255B2 (en) | 1997-07-04 | 1997-07-04 | Online interference component removal device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3079255B2 (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4600228B2 (en) * | 2005-09-16 | 2010-12-15 | 株式会社島津製作所 | ICP emission spectroscopic analysis method and ICP emission spectroscopic analysis apparatus |
| KR101233295B1 (en) * | 2010-08-13 | 2013-02-14 | 한국에너지기술연구원 | Flow-electrode device |
| JP6578863B2 (en) * | 2015-09-30 | 2019-09-25 | 東ソー株式会社 | Ion conversion method and ion conversion apparatus for ionic compounds |
| JP6631131B2 (en) * | 2015-09-30 | 2020-01-15 | 東ソー株式会社 | Ion conversion method and ion conversion device for ionic compound |
| JP6597138B2 (en) * | 2015-09-30 | 2019-10-30 | 東ソー株式会社 | Ion conversion method and ion conversion apparatus for ionic compounds |
| WO2025047764A1 (en) * | 2023-08-31 | 2025-03-06 | 国立大学法人 熊本大学 | Particle analysis system, particle analysis method, particle purification device, and method for producing purified particle-containing solution |
| CN117309795A (en) * | 2023-09-22 | 2023-12-29 | 浙江大学 | A total nitrogen ultraviolet photometric detection method and electrodialysis device combined with electrodialysis |
| CN118899214B (en) * | 2024-07-25 | 2025-09-16 | 西南民族大学 | Electrodialysis single particle inductive coupling plasma mass spectrum sampling device |
-
1997
- 1997-07-04 JP JP18004897A patent/JP3079255B2/en not_active Expired - Lifetime
Non-Patent Citations (1)
| Title |
|---|
| 環境化学、第5巻、第2号、第360−361頁(1995年) |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH1123465A (en) | 1999-01-29 |
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