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JP3115161B2 - Temperature measuring device - Google Patents
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JP3115161B2 - Temperature measuring device - Google Patents

Temperature measuring device

Info

Publication number
JP3115161B2
JP3115161B2 JP05183873A JP18387393A JP3115161B2 JP 3115161 B2 JP3115161 B2 JP 3115161B2 JP 05183873 A JP05183873 A JP 05183873A JP 18387393 A JP18387393 A JP 18387393A JP 3115161 B2 JP3115161 B2 JP 3115161B2
Authority
JP
Japan
Prior art keywords
temperature
mold
resin sealing
measuring device
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP05183873A
Other languages
Japanese (ja)
Other versions
JPH0745650A (en
Inventor
英信 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP05183873A priority Critical patent/JP3115161B2/en
Publication of JPH0745650A publication Critical patent/JPH0745650A/en
Application granted granted Critical
Publication of JP3115161B2 publication Critical patent/JP3115161B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Injection Moulding Of Plastics Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は半導体樹脂封止金型の温
度を測定する温度測定装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a temperature measuring device for measuring the temperature of a semiconductor resin-sealed mold.

【0002】[0002]

【従来の技術】樹脂封止半導体装置は、ボンディング工
程後のリ−ドフレ−ムを金型の中に並べ、そこへモ−ル
ド樹脂を流し込み樹脂封止されて形成されている。金型
は上型と下型とから構成され、特に下型は樹脂を供給す
るポットと、リ−ドフレ−ムが載置され樹脂が注入され
るキャビティと、ポットからキャビティに樹脂を流し入
れるランナ−とを有している。このような金型は樹脂封
止の際に所定の温度に設定されている。通常、作業開始
前や品種の切替え時に金型の温度測定を行い、上記所定
の温度になるように加熱されている。
2. Description of the Related Art A resin-encapsulated semiconductor device is formed by arranging a lead frame after a bonding step in a mold, pouring a mold resin into the mold, and sealing the resin. The mold is composed of an upper mold and a lower mold. Particularly, the lower mold has a pot for supplying the resin, a cavity in which the lead frame is placed and the resin is injected, and a runner for pouring the resin from the pot into the cavity. And Such a mold is set at a predetermined temperature during resin sealing. Usually, the temperature of the mold is measured before starting the work or at the time of changing the type, and the mold is heated to the predetermined temperature.

【0003】従来、金型の温度は上型と下型とを開いて
樹脂封止面を開放した状態で表面温度計を用いて数箇所
測定していた。樹脂封止面は外気にさらされるため、そ
の表面温度は周囲の環境(温度や風の流れ等)に影響さ
れていた。表面温度は降下し続け安定までにかなりの時
間が必要となり、測定を開始するまでに時間がかかって
いた。また、測定は数箇所なされるため、最初の測定箇
所と最後の測定箇所との測定温度には大きな差が生じて
いた。
Conventionally, the temperature of a mold has been measured at several points using a surface thermometer with the upper and lower molds opened and the resin sealing surface opened. Since the resin sealing surface is exposed to the outside air, the surface temperature is affected by the surrounding environment (temperature, wind flow, etc.). The surface temperature continued to drop and required a considerable amount of time to stabilize, and it took time to start the measurement. In addition, since the measurement is performed at several points, a large difference occurs in the measurement temperature between the first measurement point and the last measurement point.

【0004】[0004]

【発明が解決しようとする課題】上述のように、金型の
上型と下型とを開いて樹脂封止面の温度を測定している
ため、測定温度は金型が設置された環境に大きく影響さ
れる。しかし、本来管理すべき樹脂封止時の温度は、金
型の上型と下型とを閉じた状態のものである。つまり、
表面温度計を用いて測定し得られた温度は、樹脂封止時
に必要な温度と異なる温度となる。従って、表面温度計
による温度は金型を所定の温度に設定する際のおおよそ
の目安にしかならず、金型を加熱するには環境を考慮し
なければならない。それ故に、本発明は半導体樹脂封止
金型の樹脂封止面の温度を精度よく測定できる温度測定
装置を提供することが目的である。
As described above, since the upper mold and the lower mold of the mold are opened to measure the temperature of the resin sealing surface, the measured temperature depends on the environment in which the mold is installed. Greatly affected. However, the temperature at the time of resin sealing, which should be originally managed, is a state in which the upper mold and the lower mold are closed. That is,
The temperature measured using the surface thermometer is different from the temperature required at the time of resin sealing. Therefore, the temperature measured by the surface thermometer is only a rough guide when the mold is set at a predetermined temperature, and the environment must be considered in order to heat the mold. Therefore, an object of the present invention is to provide a temperature measuring device that can accurately measure the temperature of a resin sealing surface of a semiconductor resin sealing mold.

【0005】[0005]

【課題を解決するための手段】本発明による温度測定装
置は、半導体樹脂封止金型の下型の樹脂封止面に載置さ
れると共に上型の樹脂封止面に接触する複数のブロック
と、上記複数のブロックを保持しかつ上記各ブロックの
位置を任意に設定できるレ−ルと、上記各ブロックに挿
入され温度を検知する複数の熱電対と、上記熱電対によ
り測定温度を表示する温度表示器とから構成される。上
記複数のブロックは熱伝導がよいAl等からなり、上記
各ブロックは測定点に接触するように設置される。
A temperature measuring device according to the present invention comprises a plurality of blocks mounted on a lower resin sealing surface of a semiconductor resin sealing mold and in contact with the upper resin sealing surface. A rail for holding the plurality of blocks and arbitrarily setting the positions of the respective blocks, a plurality of thermocouples inserted into the respective blocks to detect the temperature, and displaying the measured temperature by the thermocouples. And a temperature indicator. The plurality of blocks are made of Al or the like having good thermal conductivity, and each of the blocks is set so as to be in contact with a measurement point.

【0006】[0006]

【作用】上記温度測定装置によれば、上記各ブロックの
上下面は上記上型及び下型の樹脂封止面に接触してお
り、それら上型及び下型の熱が上記各ブロックに伝導
し、上記各熱電対が上記ブロックの温度を検知すること
により、樹脂封止面の温度を測定している。また、上記
上型及び下型を閉じた状態で樹脂封止面の温度を測定し
ており、精度よく樹脂封止面の温度を測定できる。更
に、測定点の個数及び位置は任意に設定できるため、よ
り精度よく測定できる。
According to the temperature measuring device, the upper and lower surfaces of each block are in contact with the resin sealing surfaces of the upper and lower dies, and the heat of the upper and lower dies is conducted to the respective blocks. The temperature of the resin sealing surface is measured by each of the thermocouples detecting the temperature of the block. Further, the temperature of the resin sealing surface is measured with the upper mold and the lower mold closed, so that the temperature of the resin sealing surface can be accurately measured. Furthermore, since the number and positions of the measurement points can be set arbitrarily, measurement can be performed with higher accuracy.

【0007】[0007]

【実施例】以下、本発明による一実施例を図面を参照し
て説明する。図1は、半導体樹脂封止用金型のランナ−
部を3箇所を測定する場合を示し、温度測定装置を明示
するため上記金型を開いた状態とし下型部分のみを示し
ている。但し、図示しない上型は下型に対応しているこ
とはいうまでもない。
An embodiment according to the present invention will be described below with reference to the drawings. FIG. 1 shows a semiconductor resin sealing mold runner.
The figure shows a case where three parts are measured, and only the lower mold part is shown with the mold opened to clearly show the temperature measuring device. However, it goes without saying that the upper die (not shown) corresponds to the lower die.

【0008】本発明による温度測定装置は、キャビティ
部11が左右に設けれたランナ−部12に載置された3
つのブロック13と、各ブロック13を保持するレ−ル
14と、各ブロック13の内部に挿入された熱電対15
と、各熱電対15により測定された温度を表示する図示
しない温度表示器とから構成される。熱電対15はブロ
ック13のほぼ中心に位置するように挿入されており、
熱電対15と上記温度表示器とは熱電対ケ−ブル16を
介して接続されている。レ−ル14は各ブロック13の
側面に設けられた溝部を保持している。ブロック13は
熱伝導率の高い例えばアルミニウムから形成されてお
り、またブロック13の高さはランナ−部12の深さと
熱電対ケ−ブル16の線径とを合わせた高さにである。
In the temperature measuring device according to the present invention, a cavity 11 is mounted on a runner 12 provided on the left and right sides.
Block 13, a rail 14 for holding each block 13, and a thermocouple 15 inserted inside each block 13.
And a temperature indicator (not shown) for displaying the temperature measured by each thermocouple 15. The thermocouple 15 is inserted so as to be located substantially at the center of the block 13.
The thermocouple 15 and the temperature indicator are connected via a thermocouple cable 16. The rail 14 holds a groove provided on the side surface of each block 13. The block 13 is made of, for example, aluminum having a high thermal conductivity, and the height of the block 13 is the height of the combination of the depth of the runner portion 12 and the wire diameter of the thermocouple cable 16.

【0009】次に、上記温度測定装置の使用方法を説明
する。金型の加熱開始前に、同図のように金型の下型に
上記温度測定装置を設置し、その後下型と上型とを閉じ
る。但し、下型と上型との間には、熱電対ケ−ブル16
の切断を防止するため熱電対ケ−ブル16の線径程度隙
間がある。つまり、各ブロック13は上型に接触すると
同時に下型に完全に密着しないように上型を支持してい
る。上記温度表示器に表示される温度をみながら所定の
温度にまで金型を加熱した後、金型から温度測定装置を
取り出し、樹脂封止工程を行う。又、金型を加熱後でも
品種の切り替え等により所定の温度を変更する場合でも
上記同様の方法で行うことができる。
Next, a method of using the above temperature measuring device will be described. Before starting the heating of the mold, the temperature measuring device is installed in the lower mold of the mold as shown in the figure, and then the lower mold and the upper mold are closed. However, a thermocouple cable 16 is provided between the lower mold and the upper mold.
In order to prevent disconnection, there is a gap about the diameter of the thermocouple cable 16. In other words, each block 13 supports the upper die so as to come into contact with the upper die and not completely adhere to the lower die. After heating the mold to a predetermined temperature while watching the temperature displayed on the temperature indicator, the temperature measuring device is taken out of the mold and a resin sealing step is performed. Further, even after the mold is heated, the same method as described above can be used even when the predetermined temperature is changed by changing the type or the like.

【0010】各ブロック13の下面は下型にまた上面は
上型にそれぞれ直接接触している。各ブロック13は上
面及び下面から伝導された熱により、上型及び下型の温
度と同じ温度になっており、各ブロック13の温度を測
定することは金型の温度を測定することと同じことであ
る。
The lower surface of each block 13 is in direct contact with the lower die, and the upper surface is in direct contact with the upper die. The temperature of each block 13 is the same as the temperature of the upper and lower molds due to the heat conducted from the upper and lower surfaces. Measuring the temperature of each block 13 is the same as measuring the temperature of the mold. It is.

【0011】図2は、本発明による測定と、従来の樹脂
封止面を開いた状態で表面温度計による測定の測定結果
を比較したものである。縦軸は測定温度(℃)、横軸は
測定方法を示している。金型の設定温度は190℃であ
る。本装置を用いた場合、190℃を中心に約6.5℃
の範囲で測定され、表面温度計を用いた場合は、最低1
76℃から約11℃の範囲で測定される。このように、
表面温度計を用いた場合より本装置を用いた場合のほう
が、複数の測定点を同時に測定するため、測定の順番や
時間差による誤差がなく大幅に精度よく測定できる。
FIG. 2 shows a comparison between the measurement result of the present invention and the measurement result obtained by a conventional surface thermometer with the resin sealing surface opened. The vertical axis indicates the measurement temperature (° C.), and the horizontal axis indicates the measurement method. The set temperature of the mold is 190 ° C. When using this device, about 6.5 ° C around 190 ° C
If the surface thermometer is used, at least 1
It is measured in the range from 76 ° C to about 11 ° C. in this way,
Since a plurality of measurement points are measured at the same time when this apparatus is used than when a surface thermometer is used, measurement can be performed with great accuracy without errors due to measurement order and time difference.

【0012】尚、各ブロックはレ−ルの長手方向に任意
の位置に設定が可能であり、ブロックの個数は3つに限
定するものではなく、また測定する場所もランナ部に限
定するものではない。仮に樹脂封止工程において、キャ
ビティ部を例えば、図示しないポット側から半分の領域
のみを用いるときには、各ブロックを上記半分の領域の
ランナ−部に設置することが可能であり、より効率的に
温度を測定することができる。
Each block can be set at an arbitrary position in the longitudinal direction of the rail. The number of blocks is not limited to three, and the location for measurement is not limited to the runner part. Absent. In the resin sealing step, for example, when using only a half region from the pot side (not shown) in the cavity portion, each block can be installed in the runner portion in the half region, and the temperature can be more efficiently increased. Can be measured.

【0013】[0013]

【発明の効果】本発明によれば、半導体樹脂封止金型の
樹脂封止面を閉じた状態で、その樹脂封止面の温度を測
定することができる。従って、環境に影響されずに精度
よく温度を測定することができる。更に、本装置を設置
した状態で金型を設定温度まで加熱した後、本装置を取
り出して樹脂封止を行うため、温度測定に要する時間は
金型を加熱する時間にほぼ等しく従来より大幅に時間が
短縮される。
According to the present invention, it is possible to measure the temperature of a resin sealing surface of a semiconductor resin sealing mold while the resin sealing surface is closed. Therefore, the temperature can be accurately measured without being affected by the environment. Furthermore, after the mold is heated to the set temperature with the device installed, the device is taken out and sealed with resin, so the time required for temperature measurement is almost equal to the time required to heat the mold, and it is much larger than before. Time is reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明による温度測定装置の構成を示す概略図
である。
FIG. 1 is a schematic diagram showing a configuration of a temperature measuring device according to the present invention.

【図2】本発明による温度測定装置による測定温度と従
来法による測定温度との比較を示すグラフ図である。
FIG. 2 is a graph showing a comparison between a temperature measured by a temperature measuring device according to the present invention and a temperature measured by a conventional method.

【符号の説明】[Explanation of symbols]

11…キャビティ部、12…ランナ−部 13…ブロック、14…レ−ル、15…熱電対、16…
熱電対ケ−ブル
11: cavity, 12: runner 13: block, 14: rail, 15: thermocouple, 16:
Thermocouple cable

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平4−189120(JP,A) 特開 平5−138706(JP,A) 特開 平5−318549(JP,A) 実開 昭59−75023(JP,U) (58)調査した分野(Int.Cl.7,DB名) H01L 21/56 B29C 45/78 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-4-189120 (JP, A) JP-A-5-138706 (JP, A) JP-A-5-318549 (JP, A) 75023 (JP, U) (58) Field surveyed (Int. Cl. 7 , DB name) H01L 21/56 B29C 45/78

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 半導体樹脂封止金型の樹脂封止面の温度
を測定する温度測定装置において、上記半導体樹脂封止
金型の下型に載置されると共に上型の樹脂封止面に接触
する複数のブロックと、上記複数のブロックを保持しか
つ上記各ブロックの位置を任意に設定できるレ−ルと、
上記各ブロックに挿入され温度を検知する複数の熱電対
と、上記各熱電対の測定温度を表示する温度表示器とか
らなることを特徴とする温度測定装置。
1. A temperature measuring device for measuring a temperature of a resin sealing surface of a semiconductor resin sealing mold, wherein the temperature measuring device is mounted on a lower mold of the semiconductor resin sealing mold and is mounted on a resin sealing surface of an upper mold. A plurality of blocks in contact with each other, and a rail holding the plurality of blocks and arbitrarily setting the positions of the respective blocks;
A temperature measuring device, comprising: a plurality of thermocouples inserted into each of the blocks to detect a temperature; and a temperature indicator for displaying a measured temperature of each of the thermocouples.
JP05183873A 1993-07-26 1993-07-26 Temperature measuring device Expired - Fee Related JP3115161B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05183873A JP3115161B2 (en) 1993-07-26 1993-07-26 Temperature measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05183873A JP3115161B2 (en) 1993-07-26 1993-07-26 Temperature measuring device

Publications (2)

Publication Number Publication Date
JPH0745650A JPH0745650A (en) 1995-02-14
JP3115161B2 true JP3115161B2 (en) 2000-12-04

Family

ID=16143325

Family Applications (1)

Application Number Title Priority Date Filing Date
JP05183873A Expired - Fee Related JP3115161B2 (en) 1993-07-26 1993-07-26 Temperature measuring device

Country Status (1)

Country Link
JP (1) JP3115161B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020129728A1 (en) * 2018-12-21 2020-06-25 第一精工株式会社 Resin molding mold and resin molding method
JP7205261B2 (en) * 2018-12-21 2023-01-17 I-Pex株式会社 Resin sealing method and resin sealing apparatus

Also Published As

Publication number Publication date
JPH0745650A (en) 1995-02-14

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