JP3229913B2 - Tip moving mechanism of scanning tunneling microscope - Google Patents
Tip moving mechanism of scanning tunneling microscopeInfo
- Publication number
- JP3229913B2 JP3229913B2 JP25209194A JP25209194A JP3229913B2 JP 3229913 B2 JP3229913 B2 JP 3229913B2 JP 25209194 A JP25209194 A JP 25209194A JP 25209194 A JP25209194 A JP 25209194A JP 3229913 B2 JP3229913 B2 JP 3229913B2
- Authority
- JP
- Japan
- Prior art keywords
- holder
- probe
- moving mechanism
- scanning
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Measuring Leads Or Probes (AREA)
Description
【0001】[0001]
【産業上の利用分野】本発明は走査トンネル顕微鏡(以
下、STMと言う)探針の試料へのアプローチを改良し
た探針移動機構に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe moving mechanism in which a scanning tunnel microscope (hereinafter, referred to as STM) probe has an improved approach to a sample.
【0002】[0002]
【従来の技術】図2、図3により従来のSTM探針アプ
ローチ法について説明する。図2において、探針2が取
り付けられた探針ホルダ3はPZT4に固定されてお
り、PZT4は、ネジシャフト等を用いてベース5に固
定されている。ベース5には図示しないモータ駆動機構
が設けられ、図の矢印A方向に移動して試料に接近でき
るようになっている。探針2と試料間にはバイアス電圧
がかけられ、この状態でモータ駆動機構により探針2を
トンネル電流が検出されるまで試料1に近づいていき、
トンネル電流が検出されたところでモータは停止し、代
わってPZT4による探針2の走査駆動制御になる。P
ZT4の移動範囲は、数百nmであるため、モータ駆動
による探針2の試料1への接近は、動作精度(例えば振
動等)が十分でないと、試料1の表面には凹凸があるた
め探針2は試料にぶつかってしまう。2. Description of the Related Art A conventional STM probe approach will be described with reference to FIGS. In FIG. 2, a probe holder 3 to which a probe 2 is attached is fixed to a PZT 4, and the PZT 4 is fixed to a base 5 using a screw shaft or the like. A motor drive mechanism (not shown) is provided on the base 5 so that the base 5 can move in the direction of arrow A in the figure and approach the sample. A bias voltage is applied between the probe 2 and the sample. In this state, the probe 2 approaches the sample 1 until a tunnel current is detected by the motor driving mechanism.
When the tunnel current is detected, the motor stops, and instead, the scanning drive of the probe 2 by the PZT 4 is controlled. P
Since the moving range of the ZT 4 is several hundreds of nm, the approach of the probe 2 to the sample 1 by the motor drive is not sufficient if the operation accuracy (for example, vibration) is not sufficient because the surface of the sample 1 has irregularities. The needle 2 hits the sample.
【0003】このような従来の探針移動機構を図3によ
り詳細に説明する。なお、図3(a)は側面図、図3
(b)は横断面図である。探針2を保持する探針ホルダ
3はPZT4に、PZT4はホルダ6にそれぞれネジ止
めされている。ホルダ6は図示しないモータ駆動機構に
より矢印A方向に移動可能になっており、またホルダ6
はその後端部で両側に設けられ、ベース8に取り付けら
れた2つのバネ10によって試料から離れる方向に絶え
ず引っ張られ、モータ駆動機構と相まってホルダ6の矢
印A方向、即ちアプローチ方向、反アプローチ方向での
均衡を保っている。探針2が試料方向にアプローチする
際、ホルダ6はベース8に両端がベアリング13によっ
て回転可能に支持された2つのローラ12,12上を転
がり移動する。なお、ホルダ6の上面はサポート9で支
持されたローラホルダ7に取り付けられた2つのローラ
11,11と接触しており、上面側も転がり移動する。
この時矢印B方向(横方向)のがたつきはホルダ6の円
筒部とローラ12の両端テーパ面で規制され、矢印C方
向(上下方向)のがたつきはローラホルダ7及びサポー
ト9によって保持された2つのローラ7によって規制さ
れる。[0003] Such a conventional probe moving mechanism will be described in detail with reference to FIG. FIG. 3A is a side view, and FIG.
(B) is a cross-sectional view. The probe holder 3 holding the probe 2 is screwed to the PZT 4, and the PZT 4 is screwed to the holder 6. The holder 6 is movable in the direction of arrow A by a motor drive mechanism (not shown).
Are provided on both sides at the rear end thereof, are constantly pulled away from the sample by two springs 10 attached to the base 8, and are coupled with the motor drive mechanism in the direction of arrow A of the holder 6, ie, in the approach direction, the anti-approach direction. Is balanced. When the probe 2 approaches the sample direction, the holder 6 rolls on two rollers 12, both ends of which are rotatably supported by bearings 13 on the base 8. The upper surface of the holder 6 is in contact with the two rollers 11, 11 attached to the roller holder 7 supported by the support 9, and the upper surface also rolls.
At this time, the play in the direction of arrow B (lateral direction) is restricted by the cylindrical portion of the holder 6 and the tapered surfaces at both ends of the roller 12, and the play in the direction of arrow C (vertical direction) is held by the roller holder 7 and the support 9. Is regulated by the two rollers 7.
【0004】[0004]
【発明が解決しようとする課題】しかし、図3に示すよ
うなローラ上を転がす方式では、ローラのベアリングが
振動源となって探針が振動し、試料面にぶつかるおそれ
があり、また、ホルダの円筒部とローラのテーパ面の接
触部の寸法精度が十分でなく、矢印B方向のがたつきが
大きいために探針が試料面にぶつかってしまう。また、
ローラによる転がりは動きが滑らかでなく、ベアリング
やローラ保持のための機構やスペースが必要となり、部
品点数も増加してしまう。本発明は上記課題を解決する
ためのもので、アプローチ時の振動によって探針が試料
にぶつかるのを防止するとともに、動きを滑らかにし、
また、部品点数を削減してコストダウン、コンパクト
化、軽量化を図ることができる走査トンネル顕微鏡の探
針移動機構を提供することを目的とする。However, in the method of rolling on a roller as shown in FIG. 3, the bearing of the roller may act as a vibration source, causing the probe to vibrate and hit the sample surface. Since the dimensional accuracy of the contact portion between the cylindrical portion and the tapered surface of the roller is not sufficient, and the backlash in the direction of arrow B is large, the probe hits the sample surface. Also,
Rolling by rollers does not move smoothly, requires a mechanism and space for bearings and rollers, and increases the number of parts. The present invention is to solve the above problems, while preventing the probe from hitting the sample due to vibration at the time of approach, smoothing the movement,
It is another object of the present invention to provide a probe moving mechanism of a scanning tunneling microscope capable of reducing the number of parts and reducing cost, size, and weight.
【0005】[0005]
【課題を解決するための手段】本発明は、探針を走査駆
動する走査駆動機構と、走査駆動機構が取り付けられた
ホルダをベース上で移動させ、探針を試料に接近、離間
させる移動機構とを備えた走査トンネル顕微鏡の探針移
動機構において、ホルダ下面にホルダ軸方向に平行な三
角溝を形成し、該三角溝をベース上に設けたレールと係
合させてホルダをベース上ですべり移動させ、三角溝と
レールとの係合によりホルダの横方向の動きを規制する
ようにしたことを特徴とする。また、本発明は、ホルダ
下面にホルダ軸方向に平行な三角溝と平面溝とを形成
し、各溝をベース上に設けたレールと係合させてホルダ
をベース上ですべり移動させ、三角溝とレールとの係合
によりホルダの横方向の動きを規制するようにしたこと
を特徴とする。また、本発明は、レールが断面半月状で
あることを特徴とする。SUMMARY OF THE INVENTION The present invention provides a scanning drive mechanism for scanning and driving a probe, and a moving mechanism for moving a holder on which the scanning drive mechanism is mounted on a base to move the probe toward and away from the sample. In the probe moving mechanism of the scanning tunnel microscope equipped with the above, a triangular groove parallel to the holder axis direction is formed on the lower surface of the holder, and the triangular groove is engaged with a rail provided on the base to slide the holder on the base. The holder is moved, and the lateral movement of the holder is regulated by engagement of the triangular groove with the rail. The present invention also provides a triangular groove and a planar groove formed on a lower surface of a holder, the triangular groove being parallel to the holder axial direction, and each groove being engaged with a rail provided on the base to slide the holder on the base. Characterized in that the horizontal movement of the holder is restricted by the engagement between the holder and the rail. Further, the present invention is characterized in that the rail has a half-moon cross section.
【0006】[0006]
【作用】本発明は、STM装置において探針の試料への
アプローチ動作を転がり移動からすべり移動とすること
により、振動を大幅に減少させて探針が試料にぶつかる
のを防止し、また、ベアリングやローラ保持のための機
構やスペースを不要にしてコストダウン、コンパクト
化、軽量化を図ることが可能となる。According to the present invention, in the STM apparatus, the approach operation of the probe to the sample is changed from rolling movement to sliding movement, so that the vibration is greatly reduced, and the probe is prevented from hitting the sample. By eliminating the need for a mechanism or space for holding the rollers and rollers, it is possible to achieve cost reduction, downsizing, and weight reduction.
【0007】[0007]
【実施例】以下、本発明の実施例を図1により説明す
る。なお、図1において、図2と同じ参照数字は同じ内
容であるので詳細な説明は省略する。探針2は探針ホル
ダ3に保持され、探針ホルダ3はPZT4に、PZT4
はホルダ6にそれぞれ固定されている。ホルダ6は図示
しないモータ駆動機構により矢印A方向に移動可能であ
り、ホルダ6はバネ10によって試料から離れる方向に
絶えず引張り込まれ、モータ駆動機構による移動と相ま
ってアプローチ方向、反アプロチ方向での均衡を保って
いるのは図3の場合と同様である。An embodiment of the present invention will be described below with reference to FIG. In FIG. 1, the same reference numerals as those in FIG. 2 have the same contents, and a detailed description thereof will be omitted. The probe 2 is held by a probe holder 3, and the probe holder 3 is attached to a PZT 4,
Are fixed to the holder 6, respectively. The holder 6 can be moved in the direction of arrow A by a motor drive mechanism (not shown), and the holder 6 is constantly pulled in the direction away from the sample by the spring 10, and is balanced in the approach direction and the anti-approach direction together with the movement by the motor drive mechanism. Is the same as in the case of FIG.
【0008】本発明においては、PZT4が取り付けら
れたホルダ6の下面に、ホルダ軸方向に平行に三角溝6
a、平面溝6bが形成され、ベース8に固定された断面
半月状のレール20、21がそれぞれの溝に係合し、ホ
ルダ6はレール上をすべり移動するようになっている。
レールを断面半月状としているのは加工を容易にするた
めであるが、もちろん、半月状以外の形状であってもよ
い。また、一方のみ三角溝とし、他方を平面溝としたの
は、三角溝でホルダの横移動を規制し、平面溝の方は位
置合わせを容易にするためであるが、両方とも三角溝と
してもよく、また、必ずしも三角溝でなく、ホルダの横
移動が規制できるような形状であれば任意の形状でよ
い。また、上側ローラ11とローラホルダ7との係合に
よりホルダ6の回転が抑えられれば、1本の溝とレール
との係合によるすべり移動も可能である。このような移
動機構において試料にアプローチする際は、ホルダ6は
ベースに固定されている半月状のレール20,21上を
すべり移動する。すべりの際の摩擦低減のために、ホル
ダ6にはレールとの接触面を鏡面研摩し、レール20,
21にはテフロンコーティング或いはテフロン粒子を含
んだカニゼンメッキを施している。この移動機構では、
矢印B方向のがたつきは、レール20が係合する三角溝
6aでホルダ6が合わせ込み規制され、矢印C方向のが
たつきは、図3の場合と同様に、ローラホルダ7、サポ
ート9によって保持された2つのローラ11によって規
制される。このようにすべり移動を用いているので、動
きが極めて滑らかになり、振動による探針の試料への衝
突が防止される。In the present invention, a triangular groove 6 is provided on the lower surface of the holder 6 on which the PZT 4 is mounted in parallel with the holder axial direction.
a, a flat groove 6b is formed, and rails 20 and 21 having a semicircular cross section fixed to the base 8 are engaged with the respective grooves, so that the holder 6 slides on the rail.
The rail has a half-moon shape in order to facilitate processing, but it is needless to say that the rail may have a shape other than the half-moon shape. The reason why only one is a triangular groove and the other is a planar groove is to restrict the lateral movement of the holder with the triangular groove and to facilitate the alignment of the planar groove, but both are triangular grooves. Also, the shape is not necessarily a triangular groove, and may be any shape as long as the shape can restrict lateral movement of the holder. If the rotation of the holder 6 is suppressed by the engagement between the upper roller 11 and the roller holder 7, the sliding movement by the engagement between one groove and the rail is also possible. When approaching the sample with such a moving mechanism, the holder 6 slides on the semi-moon-shaped rails 20 and 21 fixed to the base. In order to reduce friction during sliding, the holder 6 is mirror-polished at the contact surface with the rail, and
21 is subjected to Teflon coating or Kanigen plating containing Teflon particles. In this moving mechanism,
The rattling in the direction of the arrow B is regulated by the triangular groove 6a with which the rail 20 is engaged, and the rattling in the direction of the arrow C is similar to the case of FIG. Is regulated by the two rollers 11 held by the rollers. Since the sliding movement is used in this manner, the movement becomes extremely smooth, and collision of the probe with the sample due to vibration is prevented.
【0009】[0009]
【発明の効果】以上のように本発明は、ベアリングに保
持されたローラ上をころがり移動によるアプローチを、
低摩擦処理を施したレール上をすべり移動によるアプロ
ーチに変えたことにより、アプローチの動きが滑らかに
なり、アプローチ時の振動による探針の試料への衝突が
なくなり、部品点数が大幅に削減されてコストダウンを
図ることができ、また、ベアリングやローラ保持のため
のスペースがいらなくなり、コンパクト化、軽量化を図
ることができる。As described above, according to the present invention, an approach by rolling on a roller held by a bearing is described.
By changing the approach to sliding movement on a rail with low friction treatment, the movement of the approach becomes smoother, the collision of the probe with the sample due to vibration during the approach is eliminated, and the number of parts is greatly reduced. The cost can be reduced, and the space for holding the bearings and the rollers is not required, so that the size and weight can be reduced.
【図1】 本発明の試料移動機構を説明する図である。FIG. 1 is a diagram illustrating a sample moving mechanism of the present invention.
【図2】 探針の試料へのアプローチを説明する図であ
る。FIG. 2 is a diagram illustrating an approach of a probe to a sample.
【図3】 従来の試料移動機構を説明する図である。FIG. 3 is a diagram illustrating a conventional sample moving mechanism.
1…試料、2…探針、3…探針ホルダ、4…PZT、6
…ホルダ、6a…三角溝、6b…平面溝、7…ローラホ
ルダ、8…ベース、9…サポート、10…バネ、11…
ローラ、20,21…レール。DESCRIPTION OF SYMBOLS 1 ... sample, 2 ... probe, 3 ... probe holder, 4 ... PZT, 6
... Holder, 6a Triangular groove, 6b Plane groove, 7 Roller holder, 8 Base, 9 Support, 10 Spring, 11
Rollers, 20, 21, ... rails.
フロントページの続き (58)調査した分野(Int.Cl.7,DB名) G01N 13/10 - 13/24 G12B 21/00 - 21/24 G01B 7/34 G01R 1/06 H01J 37/28 G01B 21/30 Continued on the front page (58) Fields surveyed (Int.Cl. 7 , DB name) G01N 13/10-13/24 G12B 21/00-21/24 G01B 7/34 G01R 1/06 H01J 37/28 G01B 21 / 30
Claims (3)
査駆動機構が取り付けられたホルダをベース上で移動さ
せ、探針を試料に接近、離間させる移動機構とを備えた
走査トンネル顕微鏡の探針移動機構において、 ホルダ下面にホルダ軸方向に平行な三角溝を形成し、該
三角溝をベース上に設けたレールと係合させてホルダを
ベース上ですべり移動させ、三角溝とレールとの係合に
よりホルダの横方向の動きを規制するようにしたことを
特徴とする走査トンネル顕微鏡の探針移動機構。1. A scanning tunnel microscope comprising: a scanning drive mechanism for scanning and driving a probe; and a moving mechanism for moving a holder on which the scanning drive mechanism is mounted on a base and moving the probe toward and away from the sample. In the probe moving mechanism, a triangular groove parallel to the holder axis is formed on the lower surface of the holder.
Scanning characterized in that the triangular groove is engaged with a rail provided on the base to move the holder on the base, and the horizontal movement of the holder is regulated by engagement of the triangular groove with the rail. Tip moving mechanism of tunnel microscope.
査駆動機構が取り付けられたホルダをベース上で移動さ
せ、探針を試料に接近、離間させる移動機構とを備えた
走査トンネル顕微鏡の探針移動機構において、 ホルダ下面にホルダ軸方向に平行な三角溝と平面溝とを
形成し、各溝をベース上に設けたレールと係合させてホ
ルダをベース上ですべり移動させ、三角溝とレールとの
係合によりホルダの横方向の動きを規制するようにした
ことを特徴とする走査トンネル顕微鏡の探針移動機構。 A scanning drive mechanism for scanning and driving the probe;
Move the holder with the inspection drive mechanism on the base
And a moving mechanism to move the probe close to and away from the sample.
In the probe moving mechanism of the scanning tunneling microscope, a triangular groove and a plane groove parallel to the holder axis direction are formed on the lower surface of the holder.
Each groove with a rail provided on the base.
Slide the rudder on the base,
Engagement restricts lateral movement of holder
A probe moving mechanism for a scanning tunnel microscope.
する請求項1または2記載の探針移動機構。 3. A rail having a half-moon shape in cross section.
The probe moving mechanism according to claim 1 or 2, wherein
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25209194A JP3229913B2 (en) | 1994-10-18 | 1994-10-18 | Tip moving mechanism of scanning tunneling microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25209194A JP3229913B2 (en) | 1994-10-18 | 1994-10-18 | Tip moving mechanism of scanning tunneling microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH08114608A JPH08114608A (en) | 1996-05-07 |
| JP3229913B2 true JP3229913B2 (en) | 2001-11-19 |
Family
ID=17232421
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25209194A Expired - Fee Related JP3229913B2 (en) | 1994-10-18 | 1994-10-18 | Tip moving mechanism of scanning tunneling microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3229913B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102426065A (en) * | 2011-09-01 | 2012-04-25 | 天津大学 | Thermistor sensor self-locking protection device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104155479B (en) * | 2014-07-15 | 2016-08-17 | 大连理工大学 | Probe Holder for Modular Scanning Probe Microscopes |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4343993A (en) | 1979-09-20 | 1982-08-10 | International Business Machines Corporation | Scanning tunneling microscope |
-
1994
- 1994-10-18 JP JP25209194A patent/JP3229913B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4343993A (en) | 1979-09-20 | 1982-08-10 | International Business Machines Corporation | Scanning tunneling microscope |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102426065A (en) * | 2011-09-01 | 2012-04-25 | 天津大学 | Thermistor sensor self-locking protection device |
| CN102426065B (en) * | 2011-09-01 | 2013-01-30 | 天津大学 | Thermistor sensor self-locking protection device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH08114608A (en) | 1996-05-07 |
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