JP3274366B2 - Method for producing transparent electrode thin film - Google Patents
Method for producing transparent electrode thin filmInfo
- Publication number
- JP3274366B2 JP3274366B2 JP24733096A JP24733096A JP3274366B2 JP 3274366 B2 JP3274366 B2 JP 3274366B2 JP 24733096 A JP24733096 A JP 24733096A JP 24733096 A JP24733096 A JP 24733096A JP 3274366 B2 JP3274366 B2 JP 3274366B2
- Authority
- JP
- Japan
- Prior art keywords
- roll
- film
- forming apparatus
- transparent electrode
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- 239000010409 thin film Substances 0.000 title claims description 9
- 239000010408 film Substances 0.000 claims description 39
- 238000000034 method Methods 0.000 claims description 10
- 238000004544 sputter deposition Methods 0.000 claims description 6
- 238000007733 ion plating Methods 0.000 claims description 3
- 238000001771 vacuum deposition Methods 0.000 claims description 2
- 238000004804 winding Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 229920002799 BoPET Polymers 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 239000004695 Polyether sulfone Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012806 monitoring device Methods 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000005477 sputtering target Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
Description
【0001】[0001]
【発明の属する技術分野】本発明は透明電極材料の製造
方法に関し、特にポリエーテルサルホン、ポリエステル
等に設ける透明電極薄膜の製造方法に関する。The present invention relates to a method for producing a transparent electrode material, and more particularly to a method for producing a transparent electrode thin film provided on polyethersulfone, polyester or the like.
【0002】[0002]
【従来の技術】従来、液晶表示、エレクトロルミネッセ
ンス等の透明電極として用いられる透明導電性フィルム
はインジウム酸化スズ(ITO)等の透明導電膜形成材
料をスパッタリング法等を用いて真空プロセス中でロー
ルトゥロールによって製造されている。2. Description of the Related Art Conventionally, a transparent conductive film used as a transparent electrode for liquid crystal display, electroluminescence and the like is made by rolling a transparent conductive film forming material such as indium tin oxide (ITO) in a vacuum process using a sputtering method or the like. Manufactured by rolls.
【0003】このようにして製造される透明導電性フィ
ルムはその使用される用途に応じてITOを形成する基
材の種類や厚みが異っており、この種類や厚みの違いに
よりそれぞれに応じたフィルムの最適搬送条件がある。
近年、反射防止や易滑性コートを施した基材もあり最適
搬送条件の設定が困難なものが存在する。薄膜形成プロ
セスにおいて、特に問題となるのがフィルムと駆動ロー
ルの滑りであり、ひとたび大きな滑りが発生すると設定
速度と実際のフィルム速度が異なる為、形成される透明
導電膜の厚みが設計値と異なるようになり、目的のシー
ト抵抗値が得られなくなる。形成されたシート抵抗を測
定する抵抗モニタリング装置と薄膜形成プロセス室は一
般的に離れており、滑ったときのシート抵抗値がモニタ
ーに現れるまでにはタイムラグがあるため、滑りの発生
に気が付くのが遅れてしまうのが現状であった。[0003] The transparent conductive film manufactured in this manner has different types and thicknesses of the base material on which ITO is formed depending on the intended use. There are optimal transport conditions for the film.
In recent years, there is a substrate on which anti-reflection or slippery coating has been applied, and it is difficult to set optimum transport conditions. In the thin film forming process, a particular problem is slippage between the film and the driving roll. Once a large slip occurs, the set speed and the actual film speed are different, so the thickness of the formed transparent conductive film is different from the designed value. As a result, the desired sheet resistance cannot be obtained. Since the resistance monitoring device that measures the formed sheet resistance and the thin film formation process chamber are generally separated, there is a time lag before the sheet resistance value when slipping appears on the monitor, so you should be aware of the occurrence of slippage. The current situation was to be late.
【0004】しかし、滑り現象はそのほとんどが初期段
階の滑りの小さいうち(速度差1%以内)にテンション
調整等の搬送系の再設定を行えば滑りを完全に止めるこ
とができる。このタイミングを逃すとプロセスを全て停
止させてからフィルム搬送系の再設定を行わなければな
らなくなる可能性が高くなる。特に真空装置では搬送系
の再設定時に行わなければならない大気解放、再設定後
の真空引きに多大な時間がかかり工数の無駄が大きくな
る。そこで初期段階での滑りの検出が重要となってく
る。However, most of the slip phenomenon can be completely stopped by resetting the transport system such as tension adjustment while the slip in the initial stage is small (within a speed difference of 1%). If this timing is missed, there is a high possibility that all processes must be stopped before resetting the film transport system. In particular, in the case of a vacuum apparatus, it takes a lot of time to release air to the atmosphere, which must be performed when the transfer system is reset, and to evacuate after resetting, and wasteful man-hours increase. Therefore, it is important to detect slippage at an early stage.
【0005】[0005]
【発明が解決しようとする課題】透明電極薄膜をロール
トゥロールの真空成膜装置を用いて製造する際、特に問
題となるフィルムと駆動ロールの滑りを、低コストで容
易に検出できる方法により制御する製造方法を提供す
る。When a transparent electrode thin film is manufactured by using a roll-to-roll vacuum film forming apparatus, slippage between a film and a driving roll, which is particularly problematic, is controlled by a method which can be easily detected at low cost. A manufacturing method is provided.
【0006】[0006]
【課題を解決するための手段】本発明では、ロールトゥ
ロールの真空成膜装置において、2つの回転速度検出機
を用い、1つは駆動ロールに接触させて駆動ロールの回
転速度を、もう1つはフィルムに接触させてフィルムの
速度を測定し、これらを比較してフィルムの搬送を制御
する透明電極薄膜の製造方法であり、更に好ましい態様
は、ロールトゥロールの真空成膜装置がスパッタリング
真空成膜装置であり、ロールトゥロールの真空成膜装置
がイオンプレーティング真空成膜装置である透明電極薄
膜の製造方法である。The [Summary of the present invention, in the vacuum deposition apparatus of roll-to-roll, using two rotational speed detector, one of the rotational speed of the drive rolls in contact with the drive roll, other One is a method of manufacturing a transparent electrode thin film in which the speed of the film is measured by bringing the film into contact with the film, and the film speed is compared to control the transport of the film. This is a method for producing a transparent electrode thin film, which is a film forming apparatus and a roll-to-roll vacuum film forming apparatus is an ion plating vacuum film forming apparatus.
【0007】[0007]
【発明の実施の形態】図1に本発明を取り入れたスパッ
タリング装置を示す。駆動ロール上に設置された回転速
度検出器(1)から発生した単位時間当たりのパルス数
と搬送フィルム上に設置された回転速度検出器(2)か
ら発生した単位時間当たりのパルス数を計算機(3)で
比較する。比較したパルス数に差があった場合は計算機
(3)が、滑りの状況に応じてテンション設定を調整す
るようになっている。DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows a sputtering apparatus incorporating the present invention. The computer calculates the number of pulses per unit time generated from the rotation speed detector (1) installed on the driving roll and the number of pulses per unit time generated from the rotation speed detector (2) installed on the transport film. Compare in 3). If there is a difference between the compared pulse numbers, the computer (3) adjusts the tension setting according to the slip condition.
【0008】回転速度検出器(1)のパルス数が回転速
度検出器(2)のパルス数を上回ったときは巻き出しロ
ールのテンションを1〜10%の範囲で下げ、巻き取り
ロールのテンションを1〜10%の範囲で上げるように
計算機(3)から指示が出る。逆に、回転速度検出器
(1)のパルス数が回転速度検出器(2)のパルス数を
下回ったときは巻き出しロールのテンションを1〜10
%の範囲で上げ、巻き取りロールのテンションを1〜1
0%の範囲で下げるように計算機(3)から指示が出
る。回転速度検出器(1)、(2)のパルス数の差がな
くなるまで繰り返せば巻き出し、巻き取りのテンション
のバランスが取れ滑り現象は止まる。この方式の利点は
低コストでいかなる種類の滑りやすいフィルムでも安定
した搬送が可能になるという点である。またこの方式は
真空状態で薄膜を形成する方法なら全てに適応できる
が、スパッタリング真空成膜装置、イオンプレーティン
グ真空成膜装置に好ましい。When the number of pulses of the rotation speed detector (1) exceeds the number of pulses of the rotation speed detector (2), the tension of the unwinding roll is reduced in the range of 1 to 10%, and the tension of the winding roll is reduced. The computer (3) issues an instruction to increase the value in the range of 1 to 10%. Conversely, when the number of pulses of the rotation speed detector (1) becomes smaller than the number of pulses of the rotation speed detector (2), the tension of the unwinding roll is set to 1 to 10.
% And the tension of the take-up roll is 1 to 1
Calculator (3) issues an instruction to lower it within the range of 0%. If the rotation speed detectors (1) and (2) are repeated until there is no difference in the number of pulses, unwinding and winding are balanced, and the slipping phenomenon stops. The advantage of this method is that it enables stable transport of any kind of slippery film at low cost. Although this method can be applied to any method for forming a thin film in a vacuum state, it is preferable for a sputtering vacuum film forming apparatus and an ion plating vacuum film forming apparatus.
【0009】[0009]
《実施例1》本発明におけるシステムを塔載した真空成
膜装置で幅650mm、厚さ125μmのPETフィル
ムにITOスパッタリングを行った。フィルム搬送速度
は1m/分、テンションは巻き出し巻き取りともに1N
/cmで滑り現象が現れるまで行った。図2の縦軸はシ
ート抵抗値を横軸は滑り始めた位置を0mとしてフィル
ム流れ方向の位置を表している。初期段階で滑り制御が
行われたことにより製造品質をあらわすシート抵抗値に
まったく影響が現れていないことがわかる。Example 1 ITO sputtering was performed on a PET film having a width of 650 mm and a thickness of 125 μm using a vacuum film forming apparatus equipped with a system according to the present invention. Film transport speed is 1m / min, tension is 1N for both unwinding and winding
/ Cm until the sliding phenomenon appeared. In FIG. 2, the vertical axis represents the sheet resistance value, and the horizontal axis represents the position in the film flow direction with the position at which slipping starts as 0 m. It can be seen that the slip control performed in the initial stage has no effect on the sheet resistance value, which indicates the production quality.
【0010】《比較例1》従来の真空成膜装置で幅65
0mm、厚さ125μmのPETフィルムにITOスパ
ッタリングを行った。フィルム搬送速度は1m/分、テ
ンションは巻き出し巻き取りともに1N/cmで滑り現
象が現れるまで行った。図3の縦軸はシート抵抗値を横
軸は滑り始めた位置を0mとしてフィルム流れ方向の位
置を表している。滑りが発生した時点で製造品質をあら
わすシート抵抗値が上昇していることがわかる。Comparative Example 1 A conventional vacuum film forming apparatus has a width of 65
ITO sputtering was performed on a PET film having a thickness of 0 mm and a thickness of 125 μm. The film was conveyed at a speed of 1 m / min. The tension was 1 N / cm for both unwinding and winding until the sliding phenomenon appeared. The vertical axis in FIG. 3 represents the sheet resistance value, and the horizontal axis represents the position in the film flow direction with the position at which slipping starts as 0 m. It can be seen that the sheet resistance, which indicates the production quality, has increased at the time when slippage occurs.
【0011】[0011]
【発明の効果】本発明のフィルム搬送の制御方法を用い
ることにより安価にしかも高い精度でフィルムの滑りを
検出、防止することが可能となり再設定等に要する工数
の大幅削減、歩留まり向上が期待できる。By using the method for controlling the conveyance of a film according to the present invention, it is possible to detect and prevent slippage of the film at low cost and with high accuracy, and it is possible to greatly reduce the number of steps required for resetting and to improve the yield. .
【図1】本発明の装置概略図。FIG. 1 is a schematic view of an apparatus of the present invention.
【図2】実施例1のシート抵抗値。FIG. 2 is a sheet resistance value of Example 1.
【図3】比較例1のシート抵抗値。FIG. 3 is a sheet resistance value of Comparative Example 1.
1 回転速度検出器(1) 2 回転速度検出器(2) 3 計算機 4 巻き出しロール 5 巻き取りロール 6 駆動ロール 7 巻き出しテンション制御器 8 巻き取りテンション制御器 9 フィルム基材 10 真空漕 11 スパッタリングターゲット DESCRIPTION OF SYMBOLS 1 Rotation speed detector (1) 2 Rotation speed detector (2) 3 Computer 4 Unwind roll 5 Take-up roll 6 Drive roll 7 Unwind tension controller 8 Take-up tension controller 9 Film base material 10 Vacuum tank 11 Sputtering target
Claims (3)
て、2つの回転速度検出機を用い、1つは駆動ロールに
接触させて駆動ロールの回転速度を、もう1つはフィル
ムに接触させてフィルムの速度を測定し、これらを比較
してフィルムの搬送を制御することを特徴とする透明電
極薄膜の製造方法。1. A roll-to-roll vacuum deposition apparatus, using a two speed detector, one is rotational speed of the contacted by drive roll to the drive roll and one in contact with the film Film And measuring the speeds of the films and comparing the measured speeds to control the transport of the film.
ッタリング真空成膜装置であることを特徴とする請求項
1記載の透明電極薄膜の製造方法。2. The method for producing a transparent electrode thin film according to claim 1, wherein the roll-to-roll vacuum film forming apparatus is a sputtering vacuum film forming apparatus.
ンプレーティング真空成膜装置であることを特徴とする
請求項1記載の透明電極薄膜の製造方法。3. The method according to claim 1, wherein the roll-to-roll vacuum film forming apparatus is an ion plating vacuum film forming apparatus.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24733096A JP3274366B2 (en) | 1996-09-19 | 1996-09-19 | Method for producing transparent electrode thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24733096A JP3274366B2 (en) | 1996-09-19 | 1996-09-19 | Method for producing transparent electrode thin film |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1088347A JPH1088347A (en) | 1998-04-07 |
| JP3274366B2 true JP3274366B2 (en) | 2002-04-15 |
Family
ID=17161806
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24733096A Expired - Fee Related JP3274366B2 (en) | 1996-09-19 | 1996-09-19 | Method for producing transparent electrode thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3274366B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5794151B2 (en) * | 2012-01-19 | 2015-10-14 | 住友金属鉱山株式会社 | Method for controlling conveyance of long strip and surface treatment method for long strip |
| JP6371591B2 (en) * | 2014-06-10 | 2018-08-08 | 日東電工株式会社 | Sputtering apparatus and manufacturing method of long film with ITO film |
-
1996
- 1996-09-19 JP JP24733096A patent/JP3274366B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH1088347A (en) | 1998-04-07 |
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