JP3305284B2 - Inspection table for mounting QFP signal measurement probe - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test table for mounting a signal measuring probe for a QFP (Quad Flat Package in this document).
In particular, the present invention relates to an inspection table for mounting a QFP signal measurement probe for performing an electrical characteristic test, a function test, and the like of a QFP installed on a printed circuit board.

[0002]

2. Description of the Related Art FIG. 7 is an exploded perspective view showing a conventional measuring socket and an integrated circuit to be measured.

Conventionally, electronic circuit packages have been evaluated,
In order to perform a failure analysis, a pin observation of a QFP is frequently performed. In that case, it is necessary to connect the probe to the pin to be the observation target, but the pins of the QFP are narrow and the pins themselves are thin, so connecting the probe to the pin you want to observe is a time-consuming task. there were.
In addition, there were many mistakes in counting, and it was troublesome to check whether the wrong pin was connected.

In the example of Japanese Patent Application Laid-Open No. 5-55320 shown in FIG.
5 to allow a large number of probes to be in contact with each other at the same time and to perform measurement while maintaining a stable contact resistance.
The plurality of measuring pins 52 that come into contact with the
A fixing hook 53 for fixing the socket upper plate 51 to the integrated circuit 54 when the socket upper plate is mounted on the integrated circuit 54 is implanted at a position corresponding to the terminal 55 of the integrated circuit 54. In the four corners.

[0005]

However, the above example cannot be applied to any other than a QFP type integrated circuit having a specific size and a specific number of terminals.

Therefore, an object of the present invention is to quickly and accurately observe a target pin without depending on the size and the number of terminals as long as there is no need to perform troublesome pin counting and the terminal intervals are the same. An object of the present invention is to provide a test table for mounting the probe , assuming a QFP signal measurement probe having a structure in which probes are arranged in parallel.

[0007]

An inspection table for mounting a signal measurement probe for a QFP according to the present invention is a QFP for performing an electrical characteristic test, a function test, and the like of a QFP installed on a printed circuit board. Place the signal measurement probe
An inspection table for testing , wherein the probe is a QF
Of the many signal pins to be measured, which are arranged at equal intervals in parallel on each side of P, respectively, to simultaneously connect with the tips of the many signal pins arranged on one side facing each other. A wire fixing plate in which a large number of wires having hooks arranged at equal intervals are fixed in parallel , a hook is advanced toward the opposing signal pin, a wire fixing plate driving mechanism for retreating, and a wire fixing plate. A probe box-shaped main body that incorporates an action portion of the lead wire fixing plate driving mechanism, a lever for operating the lead wire fixing plate driving mechanism, and a projection protrudingly installed on the side opposite to the hook of the probe box-shaped main body, for each of the passing wires. It has a number display part indicating the number and a pin detection part for guiding each conductor toward the front from the number display part and performing electrical observation of each signal pin, and is provided outside the bottom surface of the probe box-shaped main body.
It is to advance and retract predetermined lateral position on the table, or One hook
Downward projection to stop at a predetermined stop position before and after connection
Are provided at the front and rear of each end in total of four or more.
Inspection table for mounting signal measurement probe for P
At a predetermined position on the back surface of the table.
It is installed so that it can rotate by 90 degrees
In addition, a rotary disk for mounting the IC of the QFP and the QFP of the table
The probe box on the front surface of the IC mounting rotary disk
To guide the projections provided on the outside of the bottom of the main body.
Two rows of projection guides set at the same spacing as the left and right spacing of the projections
Probe box before and after hook connection
Make sure that the guides
A recess is provided at a predetermined position in the groove for fitting with each projection.
Is characterized by the fact that

The number n of connection hooks is determined by the Q of each side.
It is also preferable that the number be equal to or larger than the maximum value of the numbers j, k, l, and m of the FP signal pins.

The conductor fixing plate is made of two upper and lower materials, and each conductor is longitudinally inserted into each groove on the lower plate surface where n parallel grooves having substantially the same diameter as the conductor are engraved. It is even more preferable that the upper plate is arranged and fixed, adhered and fixed, and the upper plate is pressed from above.

[0010] The lead fixing plate driving mechanism in the probe box-shaped main body includes a lead fixing plate having a rack groove formed in a lower surface of the lead fixing plate in a direction perpendicular to a moving direction of the fixing plate.
It is preferable to include a grooved cylinder or a grooved semi-cylinder provided with a driving tooth portion that fits into the rack groove.

The driving teeth fitted into the rack grooves are
It may be a fitting portion formed in the peripheral surface in the axial direction and between both ends in the axial direction, or a driving gear attached to each of the two ends in the axial direction.

As described above, by arranging IC probes in parallel, when observing a specific pin of the QFP, it is possible to accurately measure the target pin without counting it finely. Therefore, it is not necessary to count the target pins by eye measurement and connect the IC probes, and the plurality of pins and the plurality of IC probes are simultaneously connected, so that the target pins can be reliably observed.

[0013]

Next, embodiments of the present invention will be described with reference to the drawings.

FIG. 1 is a schematic view of an inspection table according to the present invention.
FIG. 2 is a schematic top view of an embodiment of a QFP signal measurement probe to be measured and an unconnected state of an IC of a measurement target QFP.
(A) is a plan view showing the state of the present embodiment when the QFP is not connected to an IC pin, (b) is a side view of (a),
FIG. 3C is a plan view showing the state of the present embodiment when connected to the IC pin of the QFP, FIG. 3D is a side view of FIG.
2A is a side sectional view showing the inside of the probe box-shaped main body in FIG. 2A, and FIG. 2B is a side sectional view showing the inside of the probe box-shaped main body in FIG. 2B. FIG. 4 (a)
FIG. 3B is a top view of the grooved semi-cylinder for driving the wire fixing plate in FIG. 3B, and FIG.
The transition until one hook is engaged with one signal pin is shown by a plan view and a side view, where (a) shows a probe mounted, (b) shows a hook head contact, and (c) shows a state. , Immediately before passing through the rear end of the hook, (d) immediately after passing through the rear end of the hook, (e).
Is a state at the time of hook stable engagement , and FIG.
FIG. 2 is a schematic top view of an IC and an inspection table of the present invention .

As shown in FIGS. 1 to 4A, the QFP signal measurement probe 1 of the present embodiment is used for performing an electrical characteristic test, a function test, and the like of a QFP installed on a printed circuit board. a QFP signal measuring probe 1, of a number of signal pins 11 ₁ to 14 _m to be measured is projected arranged in parallel to the four sides of the QFP, it is arranged on one side which is currently facing a number of signal pins 11 ₁ to 11 _j of the tip and the respective lead wire fixing plate 8 with a fixed number of conductors 4 ₁ to 4 _n having a hook 3 ₁ to 3 _n to connect at the same time in parallel, the hook 3 ₁ forward toward the to 3 _n to the opposite signal pins 11 ₁ to 11 _j, wire fixing plate drive mechanism for retracting the conductive wire fixing plate 8 and the lead fixing plate drive mechanism probe box-like body 2 which incorporates a working portion of the
And a lever 7 for operating the wire fixing plate driving mechanism;
Is projected installed on the opposite side of the hook 3 ₁ to 3 _n of the probe box-like body 2, number display unit 5 ₁ indicating the number of each conductor that passes through
And to 5 _n, induce each conductor 4 ₁ to 4 _n to the front from the number display section 5, a pin detector 6 ₁ to 6 _n for electrical monitoring of the signal pins 11 ₁ to 11 _j, the Have.

The arrangement interval of the QFP signal pins 11 ₁ to 14 _m array pitch and pin connection hook 3 ₁ to 3 _n of are set equal.

Then, the number j of QFP signal pins on each side,
k, l, and m do not necessarily have to be the same. The number n of connection hooks is set to be equal to or larger than the maximum value among the numbers j, k, l, and m of QFP signal pins on each side so as to be able to correspond to any side.

The conductor fixing plate is made of two upper and lower materials, and each conductor 4 is inserted into each groove 8a on the lower plate surface where n parallel grooves 8a having substantially the same diameter as the conductor 4 are engraved. Align the hook 3 at the tip in its length direction, fix it with adhesive,
It is formed by pressing the upper plate from above.

The driving mechanism of the wire fixing plate in the probe box-shaped main body 2 comprises a wire fixing plate 8 having a rack groove 8a formed on the lower surface of the wire fixing plate 8 in a direction perpendicular to the moving direction of the fixing plate 8. And a grooved semi-cylinder 9 having a driving tooth 9a fitted into the rack groove 8a. The semi-cylinder may be a cylinder. However, in the case of a cylinder, the height of the cylindrical portion 9 and the box-shaped main body 2 increases, and the cost increases accordingly.

The driving teeth 9a to be fitted into the rack grooves 8a are fitting portions formed on the peripheral surface in the axial direction and between both ends in the axial direction.

On the outside of the bottom surface of the probe box-shaped main body 2, a predetermined left and right position on a table 21 to be described later advances and retreats.
And the downward projection 17a to stop at a predetermined stop position before and after connecting the hook 3 to the signal pins 11 ₁ to 11 _j,
A total of four 17b are provided at the front and rear portions at both outer ends of the bottom surface.

Next, the operation of this embodiment will be described.

FIGS. 2 (a) to 2 (d), 3 (a),
As shown in (b), FIG. 4 (a) and FIGS. 5 (a) to 5 (e), when the lever 7 is first turned upward, the driving tooth portion of the grooved semi-cylinder 9 is driven by the wire fixing plate driving mechanism. 9a and the rack groove 8a of the conductive wire fixing plate 8 mesh with each other, and the rotational movement of the former is converted to the linear movement of the latter, and the tip of each probe 1 extends to form a gap. Hook the pin 11 of the QFP there. Next, when the lever 7 is tilted to the front, the tip of each probe 1 is pulled to the front and the pin 11 is fixed in reverse.

The operation will be described in more detail with reference to FIG. When the hook head is further advanced after contacting the signal pin (b), the hook head bends upward along the slope of the signal pin and turns left until just before the hook rear end passes (c). As a result of the progress of these bends, the rear end of the hook is displaced to the lower left of the signal pin and passes (d). In this state, since the hook and the signal pin are not in contact with each other, the hook is retracted to stably engage the hook with the signal pin.

In this way, signals can be observed at the pin detectors 6 _{1 to} 6 _n which are observation terminals on the opposite side of the probe connected to each pin 1. Observation and are numbered in point or number display unit 5 ₁ to 5 _n, by taking the free movement structure, respectively, not only can be observed quickly accurately the target pins 11 ₁ to 11 _j, corresponding to the environment Observation becomes possible.

Next, a second embodiment will be described.

FIG. 4 (b) is a top view of a semi-cylinder with both end teeth for driving the conductive wire fixing plate according to the second embodiment. The difference between the present embodiment and the first embodiment is that, in the case of the first embodiment, the driving teeth 9a are formed from one axial end to the other end of the surface of the half cylinder 9 in the axial direction. On the other hand, in the case of the present embodiment, the driving teeth, that is, the gears 15a, are formed only on both axial ends of the surface of the half cylinder 15. The type of the gear is not particularly limited, and the purpose may be achieved. For example, the gear is formed by fitting a thin ring gear to a boss having a relatively large diameter at both ends.

Next, the IC of the QFP and the inspection table will be described.

FIG. 6 is a schematic top view of the IC of the QFP and the inspection table of the present invention .

An inspection table 21 for mounting the signal measurement probe for QFP is mounted on an inner surface of the table 21 so as to be able to rotate at a predetermined position by a unit of 90 degrees at an IC mounting position. Placement rotary disk 20
And two front and rear projections 17a, 17b provided at both ends on the outer surface of the bottom surface of the probe box-shaped main body 2 on the front surface of the rotary disk 20 for mounting the IC of the QFP of the table 21.
The projections 17a and 17b are arranged at the same intervals as the right and left intervals to guide the projections 17a and 17b in the front and rear directions, and at the optimum stopping position of the probe box-shaped main body 2 before and after the hook 3 is connected. At predetermined positions in both the guide grooves 22, concave portions 23a, 23b, 24a, 24b to be fitted with the respective projections are provided so as to surely stop.

The recess 23a is formed by the front projection 17a shown in FIG.
The concave portions 23b corresponding to (c) and (d) and the concave portions 23b correspond to the rear projections 17b corresponding to FIGS.
4a corresponds to FIGS. 5 (b) and (e) of the front projection 17a, and 24b corresponds to FIGS. 5 (b) and (e) of the rear projection 17b.

[0032]

As described above, according to the present invention, of a large number of signal pins to be measured, which are protrudingly arranged in parallel on each side of a QFP, among a plurality of signal pins arranged on one opposite side, A wire fixing plate in which a number of wires each having a hook for simultaneously connecting with the tip of the pin are fixed in parallel, and the hook is advanced toward the opposing signal pin,
By limiting the wire fixing plate drive mechanism for retreating, etc., there is no need to perform troublesome pin counting, and if the terminal spacing is the same, the target can be quickly and accurately independent of the size and the number of terminals. There is an effect that it is possible to provide an inspection table for mounting a signal measurement probe for QFP having a structure in which probes are arranged in parallel so that a pin can be observed.

[Brief description of the drawings]

FIG. 1 is a schematic top view of an embodiment of a signal measurement probe for QFP mounted on an inspection table of the present invention and a state where an IC of a measurement target QFP is not connected.

2A is a plan view showing a state of the present embodiment when the QFP is not connected to an IC pin, FIG. 2B is a side view of FIG. 2A, and FIG. 2C is a side view of the present embodiment; 5D is a plan view showing a state of connection with the IC pins of the QFP, and FIG. 6D is a side view of FIG.

3A is a side sectional view showing the inside of the probe box-shaped main body in FIG. 2A, and FIG. 3B is a side sectional view showing the inside of the probe box-shaped main body in FIG. 2B. is there.

4 (a) is a top view of a semi-cylinder with a groove for driving a wire fixing plate in FIG. 3 (b), and FIG. 4 (b) is a second embodiment of the present invention with both ends for driving a wire fixing plate. It is a top view of a half cylinder.

5A and 5B are a plan view and a side view showing a transition until one hook is engaged with one signal pin by the forward and backward movements of the probe. FIG. )
Shows a state at the time of hook head contact, (c) shows a state immediately before passing the hook rear end, (d) shows a state immediately after passing the hook rear end, and (e) shows a state at the time of hook stable engagement.

FIG. 6 is a schematic top view of a QFP IC and an inspection table of the present invention .

FIG. 7 is an exploded perspective view showing a conventional measuring socket and an integrated circuit to be measured.

[Explanation of symbols]

1 QFP signal measurement probe 2 Probe box-shaped main body 2a Main body side plate 3, 3 ₁ , 3 ₂ , 3 ₃ ,..., 3 _n Pin connection hooks 4, 4 ₁ , 4 ₂ , 4 _{3 ,.} conductors _{5,5 1, 5 2, 5 3} , ......, 5 n the pin number display unit _{6,6 1, 6 2, 6 3} , ......, 6 n pin detector 7 lever 8 wire fixing plate 8a parallel grooves 9 Half-cylinder with groove for driving wire fixing plate 9a Driving tooth portion 10 IC of QFP 11, 11 ₁ , 11 ₂ , 11 ₃ ,..., 11 _j , 12,
12 ₁ , 12 ₂ , 12 ₃ ,..., 12 _k , 13, 1
3 ₁ , 13 ₂ , 13 ₃ ,..., 13 _l , 14, 14 ₁ ,
14 ₂ , 14 ₃ ,..., 14 _m QFP signal pin 15 Half-cylinder with both-end teeth for driving fixed wire 15a Driving tooth 16 Guide for fixed wire 17a, 17b Projection 20 Rotating disk for mounting IC of QFP 21 Inspection Table 22 Probe Body Lower Protrusions 17a, 17b Guide Grooves 23a (When Passing the Rear End of Hook 3) Projection 17a Fitting Recess 23b (When Passing the Rear End of Hook 3) Projection 17b Fitting Recess 24a (for Hook 3 At the time of stable engagement) projection 17a fitting recess 24b (at stable engagement of hook 3) projection 17b fitting recess 51 socket upper plate 52 measuring pin 53 fixing hook 54 integrated circuit 55 terminal

Claims (1)

(57) [Claims] An inspection table for mounting a QFP signal measurement probe for performing an electrical characteristic test, a function test, and the like of a QFP installed on a printed circuit board.
Te, wherein the probe is one of a number of signal pins to be measured is projected evenly spaced in parallel to each side of the QFP, tip of the number of signal pins disposed on one of opposite sides And a wire fixing plate for fixing a plurality of wires in parallel with hooks arranged at equal intervals for simultaneous connection with each other, and a wire fixing plate for moving the hook forward and backward toward the opposing signal pin. A drive mechanism, a probe box-shaped main body including the conductor fixing plate and an action part of the conductor fixing plate driving mechanism, a lever for operating the conductor fixing plate driving mechanism, and the hook of the probe box-shaped main body A number display unit that is installed protruding on the opposite side and indicates the number of each conductor passing therethrough, and a pin detection unit that guides each conductor toward the front from the number display unit and performs electrical observation of each signal pin, Contact a
Ri, on the bottom surface outside of the probe box-like body, the predetermined on the table
Move back and forth between the left and right positions, and a predetermined stop position before and after hook connection
Downward projections at the front and rear of each end
An inspection table provided with four or more QFP signal measurement probes for mounting the QFP signal measurement probe , the surface being located at a predetermined position on the back surface of the table at a predetermined angle of 90 degrees.
QFP installed so that it can rotate
The rotating disk for mounting an IC and the rotating disk for mounting the IC of the QFP on the table.
On the surface, provided outside the bottom surface of the probe box-shaped body
The same distance as the left and right spacing of the projections to guide the projections
Two rows of protrusion guide grooves set at an interval, and the probe box body is optimal before and after hook connection
In each guide groove, make sure to stop at the stop position .
At a predetermined position, a concave portion fitted with each of the protrusions is provided.
Signal measuring probe for QFP
Inspection table for placing the .