JP3321089B2 - Test head for circuit board inspection equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

[0001] The present invention relates to a liquid crystal panel and an IC.
The present invention relates to a test head of a circuit board inspection apparatus for inspecting a circuit board, and more particularly to a test head of a circuit board inspection apparatus having a contact pin which is urged toward an object to be inspected by a coil spring.

[0002]

2. Description of the Related Art Conventionally, a test head of a circuit board inspection apparatus provided with a contact pin urged toward an object to be inspected by a coil spring has a structure of a contact pin portion as shown in FIG. 9 or FIG. Is known (Japanese Patent Laid-Open No. 6-2)
01725, Japanese Utility Model Laid-Open No. 6-56779, etc.).

The test head of the circuit board inspection apparatus shown in FIG. 9 includes a pair of upper and lower conductive contact pins 91 and 92, a conductive coil spring 93, and an insulating body 94 holding these at the contact pin portion. Have. This body 94
Is composed of an intermediate insulator 97, an upper insulator 98 and a lower insulator 99 which are stacked and fastened on the intermediate insulator 97 so as to be separable up and down. Of these, the intermediate insulator 97
Support holes 97 a are formed in the upper and lower insulators 9.
Openings 98a, 99a each having a diameter slightly smaller than that of the support hole 97a are formed in the holes 8, 99, respectively.

[0004] Each of the contact pins 91 and 92 has a needle-like body 91a and 92a penetrating through an opening 98a and 99a, respectively.
And a body part 91 having a diameter larger than that of the needle-shaped bodies 91a and 92a.
b, 92b, and spring receiving portions 91c, 92c protruding inward from the body portions 91b, 92b. In this case, the body portions 91b and 92b of the contact pins 91 and 92 are
It is slidably supported in the support hole 97a in the axial direction, and is prevented from falling off by upper and lower insulators 98, 99.

[0005] In the support hole 97a, a conductive coil spring 93 for urging the both 91 and 92 outward in the axial direction is interposed between the two contact pins 91 and 92.
That is, the contact pins 91 and 92 are electrically connected to each other via the coil spring 93 in series.

In the test head of this circuit board inspection apparatus, both contact pins 91 and 92 are resiliently connected to an electrical connection portion (flexible printed circuit board or the like) to a predetermined inspection means and an object to be inspected, respectively. In a state of spontaneous contact,
It is configured to perform circuit inspection.

In the test head of the circuit board inspection apparatus shown in FIG. 10, an opening 98a of an upper insulator 98 is formed from above a coil spring 93 in the contact pin portion instead of the upper contact pin 91 shown in FIG. It has a pin-like extension 95 extending therethrough, and the other configuration is the same as that shown in FIG.

[0008]

The test head of the above-mentioned conventional circuit board inspection apparatus has the following problems. That is, in each of the test heads, a coil spring 93 is interposed in series between a contact pin 92 that comes into contact with an object to be inspected and an electrical connection portion to a predetermined inspection means, and all currents are supplied by the coil spring 93. It is configured to flow through 93. For this reason, the magnitude of the resistance (for example, about 3Ω) of the coil spring 93 as the electric resistor cannot be ignored. Further, the effect of the inductance of the coil spring 93 cannot be neglected in terms of high frequency characteristics.

SUMMARY OF THE INVENTION The present invention has been made in view of the above points, and is directed to a test head of a circuit board inspection apparatus having a contact pin which is urged toward an object to be inspected by a coil spring. An object of the present invention is to be able to avoid the influence of electric resistance and inductance.

[0010]

A first means is a conductive contact pin for contacting a tip portion with an object to be inspected, and a contact pin which is in contact with a base end portion of the contact pin. Connecting means for electrically connecting to the inspection means, a coil spring for urging the contact pin together with the connection means in the axial direction toward the object to be inspected, and the contact pin and the connection means. An insulating block portion that is housed movably in the axial direction and is relatively detachable in the axial direction of the contact pin with respect to the inspection object, the contact pin having a large diameter portion and A large-diameter portion extending from both ends of the large-diameter portion, the distal-side small-diameter portion and the proximal-side small-diameter portion having a smaller diameter than the large-diameter portion; Receiving pin wire having a receiving portion and a wire portion connected to the receiving portion The coil spring surrounds the wire portion of the receiving pin wire and has one end in contact with the rear side of the receiving portion of the receiving pin wire. A pin holding hole that slidably holds the contact pin in the axial direction; and a spring storage hole that stores the receiving pin wire and the coil spring. Has,
The back block has a wire through-hole through which only the wire portion of the receiving pin wire passes, and the pin holding hole has a holding hole having an inner diameter corresponding to a small-diameter portion on the distal end side of the contact pin, and a large diameter of the contact pin. And a holding hole having an inner diameter corresponding to the portion, the contact pin is held so that it can be inserted and removed only from the side corresponding to the spring block, and in the spring block,
A pin penetration hole formed on a side of the spring storage hole corresponding to the pin block has a size not passing through the large diameter portion of the contact pin and the receiving portion of the receiving pin wire through the small diameter portion on the base end side of the contact pin. The inner diameter of the spring receiving hole, the spring receiving hole, the receiving pin wire and the coil spring is housed so that it can be inserted and removed only from the side corresponding to the back block, the test head of the circuit board inspection device, is there.

[0011] According to this test head, since the contact pin is directly electrically connected to the predetermined inspection means without interposing the coil spring in series by the connection means, the electric resistance and the inductance of the coil spring are changed. Can be avoided.

By separating only the pin block from the block portion, the contact pin is inserted into and removed from the pin holding hole on the side of the pin block corresponding to the spring block while holding the receiving pin wire and the coil spring in the block portion. can do. Further, by separating the back block from the block portion, the receiving pin wire and the coil spring can be inserted and removed from the spring storage hole on the side of the spring block corresponding to the back block.

Further, even if the rear block is separated from the block portion, the contact pins do not come out through the spring receiving holes of the spring block due to the presence of the pin penetration holes.
By separating only the rear block from the block portion, it is possible to insert and remove the receiving pin wire and the coil spring from the spring storage hole on the side corresponding to the rear block of the spring block while completely holding the contact pin in the block portion. it can.

The second means is the first means, wherein the contact pin has a solid structure.

[0015]

Next, an embodiment of the present invention will be described with reference to the drawings. 1 to 8 are views showing an embodiment of a test head of a circuit board inspection apparatus according to the present invention.

In FIG. 1, a test head H of a circuit board inspection apparatus has a plurality of conductive contact pins 1 (see FIG. 2) for contacting the tip with an object A to be inspected, and holds these contact pins 1. And a block section 4 including a pin block 5. The block 4 together with the holding block B mounted on the upper part thereof can be relatively moved toward and away from the inspection object A in the axial direction of the contact pin 1.

FIG. 2 shows an example of a circuit board inspection apparatus to which such a test head H is applied. FIG.
In the inspection apparatus, the support table 80 and the support table 80
A plurality of guide posts 82 erected above, and a moving table 84 attached to these guide posts 82 so as to be vertically movable are provided. The inspection object A is placed on the support table 80, and the test head H is mounted on the lower surface of the movable table 84. Further, a predetermined inspection means T is connected to the test head H via a wiring 86.

In this circuit board inspection apparatus, the moving table 84 is lowered toward the support table 80, and each contact pin 1 is resiliently brought into contact with the inspection object A, whereby the inspection means T The circuit inspection of the inspection object A is performed. In this case, each contact pin 1 is configured to withdraw into the test head H with a predetermined stroke at the time of contact, but an auxiliary spring for preventing damage to the contact pin 1 when this stroke is excessive. Is shown at 40 in FIG.

Next, FIG. 3 shows another example of a circuit board inspection apparatus to which the test head H is applied. The device shown in FIG. 3 is opposite to the device shown in FIG.
The test head H is mounted upward on the
The inspection object A is held by suction or the like on the lower surface side of the device, and the other configuration is substantially the same as that of the circuit board inspection device shown in FIG. Reference numeral 88 denotes an inspection window for visually inspecting the state of the inspection object A (for example, the display state of the liquid crystal panel).

In this case as well, the moving table 84 is lowered toward the support table 80, and each contact pin 1 is resiliently brought into contact with the inspection object A, whereby the object to be inspected is similar to that shown in FIG. The circuit inspection of the inspection object A can be performed. However, in FIGS. 1, 4 to 8, the vertical direction is shown corresponding to the device shown in FIG.

Next, the structure of the test head H of this embodiment will be described in detail. First, as shown in FIG. 1, the block unit 4 includes a pin block 5, a spring block 6, and a back block 7, which are sequentially stacked and fastened by a plurality of small screws S so as to be separable. Each of these blocks 5, 6, 7 is made of an insulating material.
Reference numeral P denotes pins for positioning the blocks 5, 6, and 7 in the block section 4.

Next, as shown in FIG. 4, the test head further includes a receiving pin wire 3 serving as connecting means for electrically connecting each contact pin 1 to the inspection means T, and a contact pin. 1 includes a coil spring 2 for urging the member 1 together with the receiving pin wire 3 in the axial direction toward the object to be inspected (here, downward).

Here, as shown in FIG.
Has a solid structure as a whole, a large-diameter portion 10,
The large diameter portion 10 has a distal small diameter portion 12 and a proximal small diameter portion 14 extending from both ends. A distal end portion 16 and a proximal end portion 18 each having a substantially conical shape are formed at the extended end portions of the small diameter portions 12 and 14, respectively. Here, the size of each contact pin 1 is, for example, 3.6 mm in total length, and a large diameter portion 1.
0 diameter 80 μm, diameter of both small diameter parts 12, 14 50 μm
It is about.

Next, as shown in FIG. 4, the pin block 5 has a U-shape at a portion corresponding to the contact pin 1 and holds the contact pin 1 slidably in the axial direction. It has holes 50, 52, 54. Of these, the pin holding holes 50 and 52 are provided with the large diameter portion 10 of the contact pin 1.
And the pin holding hole 54 has an inner diameter corresponding to the tip-side small-diameter portion 12 of the contact pin 1.

As a result, these pin holding holes 5
0, 52, and 54 hold the contact pin 1 so as to be able to be inserted and removed only from the side corresponding to the spring block 6, and connect the contact pin 1 between the small-diameter portion 12 and the large-diameter portion 10 on the distal end side of the contact pin 1 shown in FIG. The step portion 10a abuts on the step portion 56 between the pin holding holes 50 and 54 shown in FIG. 4 to prevent the contact pin 1 from coming out of the pin block 5.

Next, as shown in FIGS. 6 and 7, each receiving pin wire 3 is connected to a disk-shaped receiving portion 30 that contacts the base end portion 18 of the corresponding contact pin 1 and the receiving portion 30. And a wire portion 32.
Has an outer diameter smaller than the outer diameter of the receiving portion 30.

Here, a spring housing hole 60 is formed in the spring block 6. And the above-mentioned coil spring 2
The spring accommodating hole 6 surrounds the wire portion 32 of the receiving pin wire 3 and has one end 20 abutting on the rear side of the receiving portion 30 of the receiving pin wire 3.
It is stored in 0.

The spring receiving hole 60 has an inner diameter corresponding to the receiving portion 30 of the receiving pin wire 3 and the coil spring 2 and is opened on the side corresponding to the back block 7. It can be inserted and removed only from the side corresponding to. Also, the spring storage hole 6
On the side corresponding to the 0 pin block 5, a pin having an inner diameter that is large enough to allow the large diameter portion 10 of the contact pin 1 and the receiving portion 30 of the receiving pin wire 3 not to pass through the small diameter portion 14 on the proximal end side of the contact pin 1. A penetration hole 62 is formed.

The back block 7 has a wire through hole 70 through which only the wire portion 32 of each receiving pin wire 3 passes. Each receiving pin wire 3 is slidably held in the axial direction by the spring receiving hole 60 of the spring block 6 and the wire through hole 70 of the back block 7.
The other end 22 of the coil spring 2 comes into contact with the periphery of the wire through hole 70 of the back block 7.

FIG. 8 shows that the receiving pin wire 3 and the coil spring 2 are inserted through the spring receiving hole 60 from the side of the spring block 6 corresponding to the rear block 7 by separating the rear block 7 from the spring block 6. It shows a state in which it can be removed.

Next, the operation and effect of this embodiment having the above configuration will be described. According to the present embodiment, the contact pin 1 is provided by the receiving pin wire 3 as the connecting means.
However, since it is directly electrically connected to the predetermined inspection means T without interposing the coil spring 2 in series, the influence of the electric resistance and inductance of the coil spring 2 can be avoided. For this reason, it is possible to provide a test head of a high-performance circuit board inspection device having small electric resistance and good high-frequency characteristics.

Also, as shown in FIG. 7, by separating only the pin block 5 from the block section 4, the block section 4
With the coil spring 2 held therein, the pin holding hole 50,
The contact pin 1 can be inserted into and removed from 52 and 54.

Further, even if the rear block 7 is separated from the block portion 4, the contact pins 1 do not come out through the spring receiving holes 60 of the spring block 6 due to the presence of the pin penetration holes 62 shown in FIG. By separating only the back block 7 from the portion 4, the coil spring together with the receiving pin wire 3 is received from the spring storage hole 60 on the side of the spring block 6 corresponding to the back block 7 while holding the contact pin 1 in the block portion 4. 2 can be inserted and removed (see FIG. 8).

Accordingly, while one of the contact pin 1, the receiving pin wire 3, and the coil spring 2 is held inside the block portion 4, the other can be easily inspected and replaced.

Further, from the spring block 6 to the back block 7
Is separated and the receiving pin wire 3 is inserted and removed from the side of the rear block 7 corresponding to the spring block 6 through the wire through hole 70, so that the receiving pin wire 3 as a connecting means can be easily inspected and replaced. . In addition, since each receiving pin wire 3 can be individually inserted and removed, inspection and replacement can be performed as necessary for each connection means 3 corresponding to a specific contact pin 1.

[0036]

According to the present invention, since the contact pin is directly electrically connected to the predetermined inspection means by the connecting means without interposing the coil spring in series, the electric resistance of the coil spring and the resistance of the contact pin can be reduced. The influence of inductance can be avoided. For this reason, it is possible to provide a test head of a high-performance circuit board inspection device having small electric resistance and good high-frequency characteristics.

By separating only the pin block from the block portion, the contact pin is inserted and removed from the pin holding hole on the side of the pin block corresponding to the spring block while holding the receiving pin wire and the coil spring in the block portion. can do. Further, by separating the back block from the block portion, the receiving pin wire and the coil spring can be inserted and removed from the spring storage hole on the side of the spring block corresponding to the back block.

Further, even if the rear block is separated from the block portion, the contact pins do not come out through the spring housing holes of the spring block due to the presence of the pin penetration holes.
By separating only the back block from the block portion, it is possible to insert and remove the receiving pin wire and the coil spring from the spring storage hole on the side corresponding to the back block of the spring block while completely holding the contact pin in the block portion. it can.

[Brief description of the drawings]

FIG. 1 is a side view showing one embodiment of a test head of a circuit board inspection device according to the present invention.

FIG. 2 is a front view showing an example of a circuit board inspection apparatus to which the test head of the present invention is applied.

FIG. 3 is a front view showing another example of the circuit board inspection apparatus to which the test head of the present invention is applied.

FIG. 4 is a longitudinal sectional view of a main part of the test head shown in FIG. 1;

FIG. 5 is an enlarged side view of a contact pin of the test head shown in FIG. 1;

6 is an enlarged view showing a contact portion between a contact pin and a receiving pin wire in the test head shown in FIG. 4;

FIG. 7 is a view showing a state in which a pin block and a spring block are separated from each other in a portion of the test head shown in FIG. 6;

FIG. 8 is an enlarged view showing a state in which a receiving pin wire and a coil spring are extracted from a spring block in the test head shown in FIG. 4;

FIG. 9 is a longitudinal sectional view showing an example of a contact pin portion in a test head of a conventional circuit board inspection device.

FIG. 10 is a longitudinal sectional view showing a modification of the contact pin portion shown in FIG. 9;

[Explanation of symbols]

 Reference Signs List A inspection object H test head 1 contact pin 10 large diameter portion 12 distal small diameter portion 14 proximal small diameter portion 16 distal end 18 proximal end 2 coil spring 20 one end 22 other end 3 receiving pin wire (connection means) 30 receiving portion 32 Wire part 4 Block part 5 Pin block 50,52,54 Pin holding hole 6 Spring block 60 Spring storage hole 62 Pin penetration hole 7 Back block 70 Wire penetration hole

Claims (2)

(57) [Claims] 1. A conductive contact pin for contacting a tip portion with an object to be inspected, a contact pin contacting a base end portion of the contact pin, and electrically connecting the contact pin to a predetermined inspection means. A connection spring for urging the contact pin together with the connection means in the axial direction toward the object to be inspected; and housing the contact pin and the connection means movably in the axial direction; An insulating block portion which is relatively detachable from the object to be inspected in the axial direction of the contact pin, wherein the contact pin extends from a large diameter portion and both ends of the large diameter portion; A distal end-side small-diameter portion and a proximal-side small-diameter portion each having a diameter smaller than the large-diameter portion; and the connecting means includes: a receiving portion that contacts the proximal end portion of the contact pin; And a receiving pin wire having a portion, wherein the coil spring is One end of the block portion surrounds the wire portion of the receiving pin wire and abuts on the rear side of the receiving portion of the receiving pin wire. The pin block has a pin holding hole that slidably holds the contact pin in the axial direction, the spring block has a spring storage hole that stores the receiving pin wire and the coil spring, and the back block. Has a wire through-hole through which only the wire portion of the receiving pin wire passes, and the pin holding hole has a holding hole with an inner diameter corresponding to a tip-side small-diameter portion of the contact pin, and a large-diameter portion of the contact pin. And a holding hole having an inner diameter to hold the contact pin so that it can be inserted and removed only from the side corresponding to the spring block. A pin penetration hole formed on the side of the storage hole corresponding to the pin block has a size that does not allow the large diameter portion of the contact pin and the receiving portion of the receiving pin wire to pass through the proximal small diameter portion of the contact pin. A test head for a circuit board inspection device, having an inner diameter, wherein the spring storage hole stores the receiving pin wire and the coil spring so that it can be inserted and removed only from a side corresponding to the back block. 2. The test head according to claim 1, wherein the contact pins have a solid structure.