JP3399037B2 - Color cathode ray tube color selection device mounting position measuring method and device - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a panel for forming a color cathode ray tube (hereinafter simply referred to as "CRT") so that a color selecting device can be accurately attached to a predetermined position on the inner surface of the panel. The present invention relates to a CRT color selection device attachment position measuring method and a device thereof for maintaining a constant distance from the device.

[0002]

2. Description of the Related Art Currently, mass production CRTs include a trinitron system and a shadow mask system. An aperture grill is used for the CRT of the former method and a shadow mask is used for the latter method as a color selecting device. In the following description, a Trinitron type CRT will be exemplified, and therefore, an aperture grill (hereinafter simply referred to as “AG”) will be taken as a color selection device for description.

First, a conventional method for measuring the AG mounting position of a CRT and its apparatus will be described with reference to FIGS. 12 to 17. FIG. 12 shows an example of AG, FIG. A is a front view thereof, FIG. 12B is a side view thereof as seen from an arrow X in FIG. A, and FIG. 13 is a panel constituting an ordinary Trinitron type CRT. 14 is a plan view of FIG. 14, FIG. 14 is a cross-sectional view taken along line L-L of FIG. 13, FIG. 15 is a cross-sectional view showing a state in which an AG is attached to the inner surfaces of the panels of FIGS. 13 and 14, and FIG. FIG. 18 is a cross-sectional view for explaining a conventional CRT AG attachment position measuring method and apparatus, and FIG. 17 is an explanatory diagram for explaining AG positioning on the inner surface of the panel.

First, the main structure of the AG 10 will be described with reference to FIG. The AG10 has a rectangular metal frame 11 as a whole, a grill 12 which is tensioned by the upper and lower members 11A and 11D, and a plurality of pin-holding springs (hereinafter, referred to as "pin-holding springs") for attaching and fixing the AG10 to a CRT panel 20. (Hereinafter simply referred to as “spring”) 30.

The frame 11 has an integrated structure in which the upper and lower members 11A and 11D each having a central portion curved forward and the retracted upper and lower ends thereof are supported by the left and right vertical members 11B and 11C. Has been formed. The grill 12 is tensioned in parallel with the upper and lower members 11A and 11D of the frame 11 at equal intervals. As shown in FIG. 12B, the spring 30 has a structure in which a leaf spring body 31 whose one end is slightly bent, a welding portion 32 at one end of the leaf spring body 31, and a pin insertion hole 33 formed at the other end. So that each pin insertion hole 33 is located at the center of each member 11A, 11B, 11C, 11D of the frame 11, and above all, the surface of this AG10 is to the inner surface of the panel 20 described later. Are welded to each other so as to be held at a predetermined distance.

On the other hand, the panel 20 constituting the CRT.
Is composed of a panel portion 21 and a skirt portion 22 thereof as shown in FIGS. 13 and 14, and the inner surface 23 of the panel portion 21 is coated and formed with a striped fluorescent paint of three primary colors (as shown in the figure). No.), AG mounting pins (hereinafter simply referred to as “panel pins”) 25A, 25B, 25C, 25D for supporting and fixing the AG 10 at the central portions of the respective sides of the inner peripheral surface 24 of the skirt portion 22. Have been planted.

In the manufacturing process of the CRT, as shown in FIG. 15, there is a process of attaching the AG 10 to the inner peripheral surface 24 of the panel 20. In this step, the AG 10 must be attached to the inner peripheral surface 24 of the panel 20 at a predetermined position. That is, each panel pin 25A, 25 of the panel 20
B, 25C, 25D, the frame 11
The AG 10 is fixed to the inner peripheral surface 24 of the panel 20 by inserting the pin insertion hole 33 of each spring 30 welded in a predetermined direction into each member 11A, 11B, 11C, 11D.

As described above, when mounting the AG 10 on the inner peripheral surface 24 of the panel 20, the surface 1 of the AG 10 is mounted.
3 and the inner surface 23 of the panel 20 GH (this distance GH
It is important to attach such that the value of is constant on any surface.

However, each panel pin 25A, 25
B, 25C, 25D mounting positions (Xa, Y
a, Za), (Xb, Yb, Zb), (Xc, Yc, Z
c), X-axis component of (Xd, Yd, Zd), Y-axis component, Z
In many cases, the axial components are slightly different, as shown in FIG.
4, the heights Za, Zb, Zc, and Zd of the frit seal surfaces (hereinafter simply referred to as “SE surfaces”) 26 of the panels 20 that are planted on the inner peripheral surface 24 are defined. Often crazy from the height of. When the AG 10 is attached to the inner peripheral surface 24 of the panel 20 without performing any position adjustment with respect to these, as shown in FIG.
A tilt Θx about the axis, a tilt Θy about the Y axis,
The surface 13 of the AG 10 is deformed due to the height Z of the Z axis and the positional relationship in which these are naturally integrated, and the GH value is not constant.

In order to manage the GH value so as to be constant, an AG mounting position measuring device [hereinafter simply referred to as "PPH measuring device (PPH is an abbreviation for Panel Pin Height)"]
There is. To manage the GH value, 1. 1. Height (Z) positional relationship (PPH value) of the inner surface 23 of the panel 20 based on each panel pin and 2. It is necessary to keep the surface 13 of the AG 10 and the positional relationship of the spring 30 in the XYZ directions constant.

The PPH value data is sent to a spring welder (not shown) to correct the positional relationship between the surface 13 of the AG 10 and each spring 30, and this spring welder transfers each of these springs 30 to that of the AG 10. Each member 1
By welding to 1A, 11B, 11C, 11D,
The GH value is managed.

The PPH value is measured by the PPH measuring machine 40 shown in principle in FIG. This PPH
The measuring machine 40 has a slide mechanism 42 provided on a base 41.
The pin chuck device 43A (not shown), 43B, 43 that can slide back and forth facing the panel pins 25A (not shown in FIG. 16), 25B, 25C by
Equipped with C. These pin chuck devices 43A, 43
B and 43C have panel pins 25A, 25B and 2 respectively.
Chucks 44A, 44B, 4 of the same height for receiving 5C
4C is equipped so that it is always higher than the height of the bottom of any of the panel pins 25A, 25B, 25C. And again, the measurement point 80a is shown in FIG.
Only one point of (X ₁ , Y ₁ , Z ₁ ) is shown, but
For example, a stylus for measuring the height from the surface of the base 41 to the inner surface 23 of the panel 20 at nine measuring points is also provided (not shown).

The PPH measuring device 40 is used to
In order to measure the value, first, it is necessary to determine the reference pin plane, and therefore, the pin chuck device 43 is used.
A, 43B and 43C are the panel pins 25A and 25A, respectively.
Slide toward B and 25C, chuck part 4 at the same height
4A, 44B, 44C to each panel pin 25A, 25B,
25C is mounted so as to follow, and the panel pins 25A, 25B, 2 are supported by floating the panel 20 from the pedestal 45 by these pin chuck devices 43A, 43B, 43C.
Position 3 pins of 5C at the same height. In this state, the reference pin plane becomes horizontal on the PPH measuring machine 40.

Therefore, as described above, the data of the PPH value and the data of the deviation amount of the panel pin 25D with respect to the pin plane are sent to a spring welder (not shown), and the surface 13 of the AG 10 and the panel 20 are sent. The position of each spring 30 with respect to each member 11A, 11B, 11C, 11D of the frame 11 is corrected so that the distance (GH value) to the inner surface 23 is constant at any point, and these springs are welded by these spring welders. Each spring 30 is connected to each member 1
It welds to 1A, 11B, 11C and 11D.

[0015]

However, if the embedded position of each panel pin is, for example, in the example shown in FIG. 14, the panel pin 25D is embedded at the correct height position, the panel pin 25B is located at a slightly higher position. As the panel pin 25C is embedded in a slightly lower position, it varies depending on the panel 20. This error increases as the panel becomes larger, and the pin chuck device tends to make a mounting error. become. Further, in this conventional PPH measuring machine, since the panel is supported only by the panel pin, when the panel becomes large, there is a problem that cracks easily occur in the embedded portion of the panel pin.

[0016]

Therefore, the CR of the present invention
The method for measuring the AG attachment position of T is to measure the inner surface of the panel with reference to the pin plane formed by 3 pins of the plurality of panel pins formed on the inner peripheral surface of the panel,
Copy the pin chuck to the panel pin that determines the pin plane, and measure the pin chuck that follows these panel pins.
The height from the reference plane of the device and the horizontal direction from the reference position
The position of the pin chuck is measured by measuring the distance, and the pin plane is calculated by calculating based on the measured data, while the heights of the inner surface of the panel at a plurality of predetermined positions from the reference plane of the measuring device are calculated. Is measured, and the height of the panel inner surface based on the pin plane is calculated by calculating based on the data.

Further, the measuring device is formed on the inner peripheral surface of the panel and a plurality of pedestals configured to receive the sealing surface of the panel to be measured with respect to the funnel and to be slidable within one plane. A pin chuck device configured to follow the panel pins, a first measuring element for measuring the position of each panel pin, and a second measuring element for measuring the positions of a plurality of positions on the inner surface of the panel are provided. And each of the above
The first probe that measures the position of the panel pin is the panel pin.
Probe to measure the horizontal position of the
Measures the height from the reference plane that serves as a reference for the position of the panel
And a measuring element for The above-mentioned problems are solved by using the method for measuring the AG mounting position of the CRT and the measuring apparatus therefor.

[0018]

Since each pin chuck device has a structure that follows each panel pin and the panel is supported by the sealing surface of the panel, even if the panel pin embedding error increases with the increase in size of the panel, the pin chuck device Does not cause a mounting error, and does not support the panel pin even if its weight increases due to the increase in size of the panel, so that the embedded portion of the panel pin does not crack.

[0019]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the method for measuring the AG mounting position of a CRT and the apparatus therefor according to the present invention will be described below with reference to FIGS. FIG. 1 is a conceptual diagram for explaining a method for measuring an AG mounting position of a CRT according to the present invention. FIG. 1A is a plan view of a panel, and FIG. 1B is a PPH measuring device according to the present invention.
FIG. 3 is a cross-sectional view of a state in which the panel is attached to the cross-section of the panel along line L, FIG. 2 is a plan view of the AG mounting position measuring device of the CRT of the present invention, and FIG. 3 is an SE of the panel shown in FIG.
2A is a top view, FIG. B is a side view seen from its long axis, FIG. C is a side view seen from its short axis, and FIG. Pin chuck device 60B
6 is a side view showing the first probe 70B, FIG. 5 is a front view of the pin chuck device and the like viewed from the arrow A in FIG. 4, and FIG. 6 is a side view viewed from the arrow A in FIG. 7 is a top view showing the pin chuck device 60A and the first probe 70A in FIG. 2, and FIG. 8 is a pin chuck device 60A and the first probe 7 shown in FIG.
FIG. 9 is a side view showing 0A, and FIG.
10 is a front view seen from above, FIG. 10 shows an example of the chuck portion, FIG. A is a front view thereof, FIG. 10B is a side view thereof, FIG. 10C is a top view thereof, and FIG. 5 is a side view showing a second probe for measuring the height in the Z-axis direction on the inner surface 23 of the panel 20 shown in FIG. In addition, the same reference numerals are given to the same parts as those of various devices of the related art,
The description of those parts is omitted.

First, the AG mounting position of the CRT of the present invention
The configuration of the measuring device (PPH measuring machine) 50 will be described. this
The PPH measuring machine 50 of the invention is as shown in plan view in FIG.
In addition, mainly, the surface of the base 51 (FIG. 4) that has been exposed
It is provided on the sub-surface 52 and receives the SE surface 26 of the panel 20.
Three pedestals 53A, 53B, 53C and each panel pin 2
4 pin chucks that imitate 5A, 25B, 25C and 25D
Panel device 60A, 60B, 60C, 60D and each panel
Position 25A, 25B, 25C, 25D 4
First stylus heads 70A, 70B, 70C, 70D of the table,
Nine measuring points 80a (X₁, Y₁, Z₁), 8
0b (X₂, Y₂, Z₂), 80c (X₃, Y₃，
Z ₃), 80d (X_Four, Y_Four, Z_Four), 80e (X_Five，
Y_Five, Z_Five), 80f (X ₆, Y₆, Z₆), 80g
(X₇, Y₇, Z₇), 80h (X₈, Y₈, Z₈),
80k (X₉, Y₉, Z₉) From SE side 26
Nine second measurement for measuring the height up to the inner surface 23 of the flannel 20
Determinants 80A, 80B, 80C, 80D, 80E, 80
F, 80G, 80H, 80K and the panel to be measured
Depending on the size of the rule 20, these pin chuck devices 6
0, the first probe 70, the position of the second probe 80
Switching devices 90A, 90B, 90C, 90D to be replaced,
Depending on the size of the panel 20, place the mounted panel 20 on the P
A group of positioning devices for positioning and fixing to the PH measuring machine 50
The units 100A, 100B, 100C, 100D, etc.
Is made.

Each of the pedestals 53A, 53B and 53C is as shown in FIG. 3 (only one pedestal 53A is shown).
It is composed of a slide mechanism 54 formed in association with the reference surface 52 and a slide mechanism 56 formed above the slide mechanism 54 on a first reference surface 55 parallel to the reference surface 52 and orthogonal to the slide mechanism 54. The surface of each pedestal 53A, 53B, 53C can be horizontally moved on the XY plane by these two slide mechanisms. Therefore, the panel 20 is placed on these pedestals 53A, 53B, 53C, and it is possible to cope with the amount of panel movement when the panel 20 is positioned. This positioning is performed by centering the pin chuck devices 60B and 60C having a degree of freedom on the Z axis, which will be described later, on the X axis. As a result, centering and rotation of the panel 20 are restricted, and the position of the panel 20 is determined.

Next, referring to FIGS. 4 to 10, the pin chuck devices 60A, 60B, 60C, 60D and the first
The tracing stylus 70A, 70B, 70C, and 70D will be described.
First, of the four pin chuck devices and the first probe, the pin chuck devices 60B and 60C and the first probe 70B and 70C will be described with reference to FIGS. 4 to 6. In these figures, only the pin chuck device 60B and the probe 70B are shown as representatives.

In FIGS. 4 and 5, a slide mechanism 61 is constructed in relation to the reference surface 52 of the base 51, and a pin chuck device 60B is mounted above the reference mechanism 62 parallel to the reference surface 52. ing. This pin chuck device 6
0B is configured to be slidable in the X-axis direction by the slide mechanism 61, and the pin chuck device 60B
Is provided with two types of chuck portions 63A and 63B, and their positions can be switched corresponding to a plurality of panels 20 having different tube diameters. This switching is performed by the air cylinder 64. Furthermore, the pin chuck device 60B is configured with a degree of freedom on the Z-axis so that it can be moved in the Z-axis direction by a spring 65 attached to the lower portion thereof (FIG. 4).

The first probe 70B is, for example, a magnescale, and is a probe 70B for measuring the axial position of each of the chuck portions 63A and 63B in the XZ direction.
x, 70Bz, and as shown in FIG. 4, the probe 70Bx therein is attached to the slide mechanism 72 on the reference surface 52 of the base 51, and the plurality of panels 20 having different pipe diameters are attached. It is constructed so as to be slidable in the X-axis direction. This probe 70Bx has its tip 71A
To the reference position 71B is measured in the X-axis direction.
Reference numeral 73 is an air cylinder for sliding the tracing stylus 70Bx in the X-axis direction.

As shown in FIGS. 4 and 6, the probe 70Bz is fixed to the reference surface 62, and the distance from the tip 74A to the reference position 74B in the Z-axis direction is measured to determine the chuck portion. Measure the height position of 63A, 63B. The pair of pin chuck devices 60C are similarly configured.

Next, referring to FIGS. 7 to 9, another pair of pin chuck devices 60A and 60D and the first probe 7 are provided.
0A and 70D will be described. In these figures, only the pin chuck device 60D and the probe 70D are shown as representatives.

In FIGS. 8 and 9, a slide mechanism 66 is constructed in relation to the reference surface 52 of the base 51, and a pin chuck device 60D is mounted on a reference surface 67 parallel to the reference surface 52 above the slide mechanism 66. ing. This pin chuck device 6
OD is configured to be slidable in the Y-axis direction by the slide mechanism 66, and the pin chuck device 60D
Is provided with two types of chuck portions 63A and 63B, similar to the pin chuck device 60B, and has a plurality of panels 20 having different tube diameters.
The position is switched according to. This switching is performed by the air cylinder 68. Furthermore, the pin chuck device 60D is configured with a degree of freedom on the XZ axis so that the pin chuck device 60D can be moved in the Z axis direction by the spring 69A attached to the lower part thereof and in the X axis direction by the spring 69B (FIG. 9).

The first probe 70D is composed of probes 70Dx, 70Dy, 70Dz for measuring the XYZ axial positions of the chuck portions 63A, 63B, respectively, and as shown in FIG. Measuring element 70Dy
Is attached to a bracket 75 on the reference surface 52 of the base 51, and is configured to be able to handle a plurality of panels 20 having different pipe diameters by a long measurement stroke. The tracing stylus 70Dy measures the distance in the Y-axis direction from the tip 71A to the reference position 71B. Reference numeral 76 is an air cylinder for sliding the pin chuck device 60D in the Y-axis direction.

Further, the tracing stylus 70Dz is fixed to the reference surface 62, the distance in the Z-axis direction from the tip 74A to the reference position 74B is measured, and the chuck portions 63A, 63 are formed.
Measure the height position of B. Furthermore, the reference plane 62
The tracing stylus 70Dx is fixed to the X-axis, and the distance in the X-axis direction from the tip 75A to the reference position 75B is measured to measure the positions of the chuck portions 63A and 63B in the X-axis direction. The pair of pin chuck devices 60A are similarly configured.

FIG. 10 shows the pin chuck devices 60A and 6A.
A 3-axis slide mechanism of 0D (collectively referred to as a pin chuck device 60) is shown. As described above, this slide mechanism includes a slide mechanism 61 (66) capable of sliding the pin chuck device 60 in the X-axis direction, a slide mechanism 61Y capable of sliding in the Y-axis direction, and a slide mechanism capable of further sliding in the Z-axis direction. The mechanism 61Z can be used. Therefore, the pin chuck device 60 can freely slide not only on the plane but also in the vertical direction.

4 to 9, in addition to the return springs 65, 69A and 69B, the other tube type chuck portions 63A and 63B and the air cylinder 6 are added to the triaxial slide mechanism.
8, 76, tracing stylus 70Bx, 70Bz, 70Dx, 70
Dy, 70Dz, a fall prevention plate (not shown), etc. are attached.

Next, FIG. 11 shows the second measuring elements 80A and 80A.
B, 80C, 80D, 80E, 80F, 80G, 80
H and 80K (collectively referred to as a tracing stylus 80) are shown. The tracing stylus 80 is also composed of a magnescale, which is fixed by a bracket 81 perpendicularly to the mounting surface of the base 51, and its tip 80A faces and is arranged so as to face the inner surface 23 of the panel 20 substantially vertically. Has been done. Then, it can slide in the vertical direction by a slide mechanism (not shown) formed in the second probe 80. This sliding is performed by the air cylinder 82 when measuring the height of the inner surface 23 of the panel 20. FIG. 11 shows a state at the time of standby, and returns to the standby position at the time of non-measurement. Such a tracing stylus 80 is provided at the nine measurement points, and the height up to the inner surface 23 of the panel 20 is measured at each of the measurement points.

The PPH measuring machine 50 of the present invention comprises various main mechanisms as described above. Next, a method for measuring the positional relationship (PPH value) between the inner surface of the panel and the panel pin using this PPH measuring machine 50 will be described with reference to FIG. The positions of the panel pins 25A, 25B, 25C, 25D of the panel 20 to be measured are (Xa, Ya, Za), (X
b, Yb, Zb) (Xc, Yc, Zc), (Xd, Y
d, Zd).

In the PPH value measuring method of the present invention, as described above, the SE surface 26 of the panel 20 is fixed to the three pedestals 53.
The height of the inner surface 23 of the panel 20 is measured by calculating the height of the inner surface 23 of the panel 20 and the embedding position of each panel pin, and the height of the inner surface 23 of the panel 20 with respect to the plane formed by the panel pins 25A, 25B, 25C is calculated. Is the way to do it.

That is, first, the switching devices 90A, 90B,
The positioning devices 100A, 100B, 100C, 100D, the pin chuck devices 60A, 60B, 60C, 60D are operated according to the size of the panel 20 of the tube type for which the PPH measuring machine 50 is to be operated by operating the 90C, 90D. First
70A, 70B, 70C, 70D, second probes 80A, 80B, 80C, 80D, 80E, 80F,
Hold 80G, 80H, 80K, etc.

In this state, the panel 2 to be measured
First, with the SE surface 26 facing down, the pedestal 53A,
53B, 53C, the pulse motor (not shown) is operated to move the positioning devices 100A, 100C among the positioning devices toward the panel 20,
The panel 20 is positioned by pressing the periphery of the panel 20 with the positioning devices 100B and 100D.

Next, the chuck portions 63A or 6 of the pin chuck devices 60B and 60C having a degree of freedom in the Z-axis direction.
3B (hereinafter, referred to as "chuck portion 63" for simplification of description) is attached so as to follow the panel pins 25B and 25C, respectively, and center distribution is performed on the X axis. As a result, the centering and rotation restriction of the panel 20 are performed, and the position of the panel 20 is determined.

Next, the pin chuck devices 60A and 60 having the degrees of freedom in the X and Z axis directions, following the panel pins 25A and 25D of the positioned panel 20.
The D chuck part 63 is attached.

In this state, each panel pin 25A, 25B,
25C, 25D Z-axis heights Za, Zb, Zc, Z
d and each panel pin 25A, 25 from the panel center
The distances Ya, Xb, and Yd to B and 25D, and the displacement amounts Xa and Xd of the panel pins 25A and 25D from the Y-axis, are measured by the first measurement attached to the respective pin chuck devices 60A, 60B, 60C, and 60D. Child 70A, 70B, 70
C, 70D.

Also, in this state, the inner surface of the panel 20
23 above-mentioned 9 measurement points 80a (X₁, Y₁，
Z₁), 80b (X₂, Y₂, Z₂), 80c (X₃，
Y₃, Z₃), 80d (X_Four, Y_Four, Z_Four), 80e
(X_Five, Y_Five, Z_Five), 80f (X₆, Y₆, Z₆),
80 g (X₇, Y₇, Z₇), 80h (X₈, Y₈, Z
₈), 80k (X₉, Y₉, Z₉) In the Z-axis direction
Height, that is, from the SE surface 26 to the inner surface 23 of the panel 20
The height of each of the two second probes 80A, 80B,
80C, 80D, 80E, 80F, 80G, 80H, 8
Measure at 0K. The measurement point 80a (X₁，
Y₁, Z₁) And the second probe 80A are shown. This
Data acquisition is completed in this way, and a computing device not shown
Calculate with.

Referring to FIG. 17, the inclination θx of panel 20 in the X-axis direction is given by [Equation 1].

[0042]

[Equation 1]

The inclination θy of the panel 20 in the Y-axis direction is given by [Equation 2].

[0044]

[Equation 2]

Measuring point 80a (X ₁ , Y ₁ , Z ₁ )
The height Z ₁ on the panel pin plane of is given by [Equation 3].

[0046]

[Equation 3]

The amount of displacement Z _D of the pin-holding spring 30 fitted in the panel pin 25D in the Z-axis direction is given by [Equation 4].

[0048]

[Equation 4]

Data transmission of the calculation result to the spring welder in the subsequent step completes one cycle by the PPH measuring machine 50 of the present invention. This data is transmitted to the AG10 by the spring welder.
The pin hold spring 30 is welded to the
By fitting the measured data into the panel 20 and fixing it, a GH value controlled panel can be obtained.

[0050]

As is apparent from the above description, the method and apparatus for measuring the AG mounting position of the CRT according to the present invention are:
Since each pin chuck device has a structure that follows each panel pin, and the panel is supported by the sealing surface of the panel, even if the panel pin embedding error increases with the increase in size of the panel, the pin chuck device will not be installed correctly. Also, even if the weight of the panel increases due to the increase in size of the panel, it does not support the panel pin, so there is no crack in the embedded part of the panel pin. .

[Brief description of drawings]

FIG. 1 is a conceptual diagram for explaining a method for measuring an AG mounting position of a CRT according to the present invention, FIG. 1A is a plan view of a panel,
FIG. 2B is a sectional view showing a state in which the PPH measuring apparatus of the present invention is mounted on the section of the panel on the line LL in FIG.

FIG. 2 is a plan view of the AG mounting position measuring device of the CRT of the present invention.

3 is a pedestal for the SE surface of the panel shown in FIG. 2, where FIG. 3A is a top view thereof, FIG. 3B is a side view seen from its major axis, and FIG. 3C is seen from its minor axis. FIG.

FIG. 4 is a side view showing a pin chuck device 60B and a first tracing stylus 70B in FIG.

5 is a front view of the pin chuck device and the like viewed from the direction of arrow A in FIG.

FIG. 6 is a side view seen from an arrow A in FIG.

7 is a top view showing a pin chuck device 60D and a first tracing stylus 70D in FIG. 2. FIG.

8 is a side view showing a pin chuck device 60D and a first probe 70D shown in FIG. 7. FIG.

9 is a front view seen from an arrow A in FIG.

FIG. 10 shows an example of a chuck portion, FIG. A is a front view thereof, FIG. B is a side view thereof, and FIG. C is a top view thereof.

11 is a side view showing a second probe for measuring the height of the inner surface 23 of the panel 20 shown in FIG. 2 in the Z-axis direction.

12A and 12B show an example of an aperture grill, FIG. 12A is a front view thereof, and FIG. 12B is a side view seen from an arrow X of FIG.

FIG. 13 is a plan view of a panel constituting a normal Trinitron color cathode ray tube.

14 is a cross-sectional view of the panel taken along the line LL in FIG.

FIG. 15 is a cross-sectional view showing a state in which an aperture grill is attached to the inner surface of the panel of FIGS. 13 and 14.

FIG. 16 is a cross-sectional view for explaining an aperture grill attachment position measuring method for a color cathode ray tube and a device therefor according to the prior art.

FIG. 17 is an explanatory diagram for explaining positioning of the aperture grille on the inner surface of the panel.

[Explanation of symbols]

10 Aperture Grill (AG) 11 Frame 12 Grill 13 Surface 20 Panel 21 Panel Part 22 Skirt Part 23 Inner Surface 24 Inner Surface 25A Panel Pin 25B Panel Pin 25C Panel Pin 25D Panel Pin 30 Pin Holding Spring 50 Aperture Grill Installation Position Measuring Device (PPH)
(Measuring machine) 51 Base 52 Reference surface 53A Pedestal 53B Pedestal 53C Pedestal 60A Pin chuck device 60B Pin chuck device 60C Pin chuck device 60D Pin chuck device 63A Chuck portion 63B Chuck portion 70A First probe 70B First probe 70C First measuring element 70D First measuring element 80A Second measuring element 80B Second measuring element 80C Second measuring element 80D Second measuring element 90A Switching device 90B Switching device 90C Switching device 90D Switching device 100A Positioning device 100B Positioning device 100C Positioning device 100D Positioning device

─────────────────────────────────────────────────── ─── Continuation of the front page (56) Bibliographic references Shoji 16-16692 (JP, Y1) (58) Fields investigated (Int.Cl. ⁷ , DB name) H01J 9/42

Claims (3)

(57) [Claims] 1. Three of a plurality of color selection device mounting pins formed on the inner peripheral surface of a panel constituting a color cathode ray tube.
When measuring the inner surface of the panel with reference to the pin plane formed by the pins, the positioning pin chuck is made to follow the pins that determine the pin plane, and the reference of the measuring device for the positioning pin chuck that follows these pins Height from surface
And by measuring the horizontal distance from the reference position.
The position of the positioning pin chuck is measured, and the pin plane is calculated by operating on the basis of the measured data, while the heights of the inner surface of the panel are measured from the reference plane of the measuring device. A method for measuring a color cathode ray tube mounting position of a color cathode ray tube, wherein the panel inner surface height based on the pin plane is calculated by calculating based on the data. 2. A plurality of pedestals configured to receive a sealing surface of a panel on a funnel and slidable in one plane, and a plurality of color selection device mounting pins formed on an inner peripheral surface of the panel. a pin chuck device configured to follow, the a measuring element for measuring the position of each color selecting device mounting pin, and a measuring element for measuring the inner surface heights of a plurality of locations of the inner surface of the panel, each color selection device Stylus for measuring the position of mounting pins
Measure the horizontal position of the color selection device mounting pin.
The position of the measuring element and the panel of the color selection device mounting pin.
With a probe that measures the height from the reference surface
A color cathode ray tube color selection device mounting position measuring device characterized by having . 3. A panel seal surface for receiving a funnel is received.
A plurality of pedestals configured to be slidable in one plane
And a plurality of color selection devices formed on the inner peripheral surface of the panel
Pin chuck device configured to follow mounting pins
And measuring the position of the pin for mounting each color selection device.
Measure the height of the inner surface at multiple points on the inner surface of the panel with the sill
That a measuring element, the are composed of each pin chuck device has a plurality of different pin chuck position, and a switching device for switching between a stroke position and the respective measuring element of these pin chuck, this depending on the size of the panel to be measured by switching device configured to be switched position and the stroke of the gauge head of the plurality of pin chuck
A color cathode ray tube color selection device mounting position measuring device characterized in that