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JP3566618B2 - Welding wire - Google Patents
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JP3566618B2 - Welding wire - Google Patents

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Publication number
JP3566618B2
JP3566618B2 JP2000050349A JP2000050349A JP3566618B2 JP 3566618 B2 JP3566618 B2 JP 3566618B2 JP 2000050349 A JP2000050349 A JP 2000050349A JP 2000050349 A JP2000050349 A JP 2000050349A JP 3566618 B2 JP3566618 B2 JP 3566618B2
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wire
graphite
amount
mos
present
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JP2001239393A (en
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節 西澤
雅夫 水野
弘之 清水
法廣 浅井
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Kobe Steel Ltd
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Kobe Steel Ltd
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Description

【0001】
【発明の属する技術分野】
本発明は、鋼等のアーク溶接に使用され、且つワイヤの表面に銅メッキ等が施されていない溶接用ワイヤに関し、特に、スパッタ発生量の低減を図った溶接用ワイヤに関する。
【0002】
【従来の技術】
従来、アーク溶接用ワイヤのなかでも、特に、ソリッドワイヤ及びシームレスフラックス入りワイヤは伸線途中で銅メッキを施している。この銅メッキは、最終製品において送給性及び防錆性等を向上させる役割を担っている。また、銅メッキは、それ自体が優れた固体潤滑剤として作用し、伸線性の向上にも寄与している。
【0003】
しかしながら、銅メッキをワイヤの表面に施すためには、メッキ処理前に電解酸洗等の方法でワイヤの表面(鋼地表面)を活性化し、銅メッキが付着しやすい表面を準備する必要がある。この銅メッキを行う方法としては、置換メッキ方法又は電気メッキ方法等がある。しかし、銅メッキ工程においては、メッキ液の濃度管理並びに銅及び対電極の管理等の煩雑なライン管理が必要である。このため、銅メッキ工程はワイヤの製造コストを考慮すると、極めてコストの負担がかかる重荷な工程である。更に、作業雰囲気中に酸ミストを撒き散らし廃液処理及び産業廃棄物処理を伴う銅メッキ工程は、環境への配慮からも除きたい工程である。
【0004】
一方、従来、アーク溶接用ワイヤの送給性を向上又は安定させることを目的として、ワイヤの表面に塗布する潤滑剤としては、MoS、WS、PTFE、C、フッ化黒鉛又は金属石鹸が提案されている(特開平6−285678号公報、特開平9−70684号公報)。
【0005】
【発明が解決しようとする課題】
しかしながら、銅メッキ工程はワイヤの製造において負担になる工程であるが、単純に銅メッキ工程を除去してアーク溶接用のソリッドワイヤ又はフラックス入りワイヤを生産しようとすると、ワイヤの伸線時の生産性及び製品としてのワイヤの品質に問題点がある。
【0006】
ワイヤの伸線時の生産性に関しては、近時、上述の如く、良好な伸線潤滑剤が開発され、伸線時の生産性の問題点は解決されつつある。一方、製品としてのワイヤの品質の問題点としては、スパッタが発生することである。即ち、ワイヤの表面に銅メッキが施されていないと、溶滴の揺動が大きなり、スパッタ発生量が増加するという問題点がある。
【0007】
本発明はかかる問題点に鑑みてなされたものであって、銅メッキが施されていないワイヤであっても、スパッタの発生を抑制できる溶接用ワイヤを提供することを目的とする。
【0008】
【課題を解決するための手段】
本発明に係る溶接用ワイヤは、(002)回折線のピーク位置から求めた面間隔d002が0.3353nm乃至0.3372nmである黒鉛がワイヤの表面上又は表面直下にワイヤ10kg当たり0.05乃至5g存在し、ワイヤ表面にメッキが施されていないことを特徴とする。
【0009】
この場合、粒径が0.1乃至30μmであるMoSが前記ワイヤの表面上又は表面直下にワイヤ10kg当たり0.01乃至2g存在することが好ましい。
【0010】
また、植物油、動物油、鉱物油及び合成油からなる群から選択された少なくとも1種以上の油が総量で前記ワイヤの表面にワイヤ10kg当たり0.2乃至3g存在することが好ましい。
【0011】
願発明者等は銅メッキを施していないワイヤのスパッタの発生状況を観察するために、アーク溶接時に溶滴移行の安定性を観察した結果、ワイヤの表面に(002)回折線のピーク位置から求めた面間隔d002が0.3353nm乃至0.3372nmである結晶性が良好な黒鉛が一定量存在すると、スパッタ発生量を極めて低減できることを見出した。
【0012】
また、ワイヤの表面にMoSが一定量存在すると共に、油が存在すると、より一層スパッタ発生量が低減する。更に、スパッタ発生量を低減するには適正な油量が存在し、これがワイヤ10kg当たり0.2乃至0.3gである。
【0013】
【発明の実施の形態】
以下、本発明の実施例に係る溶接用ワイヤについて詳細に説明する。溶接用ワイヤの組成物、組成物の粒径及び組成物の量の限定理由について説明する。
【0014】
黒鉛
本願発明者等はスパッタ発生量を低減することを目的として、ワイヤの表面近傍の付着物の作用効果を検討すると共に、付着物の量、付着状態、組成及び粒径の適正化を行った。この結果、ワイヤの表面近傍に存在し、効果的にスパッタ発生量を低減することができる物質としては、天然に産出する結晶性が高い鱗状若しくは鱗片状黒鉛又は人造黒鉛のなかでも結晶性が高い黒鉛であることを明らかにした。また、黒鉛の炭素の純度が97質量%以上であるとき、スパッタ発生量を低減する効果が良好である。更に、黒鉛は灰分等の不純物を20質量%程度含んでいても、スパッタの発生を効果的に防止することができる。更にまた、面間隔d002が0.3353nm乃至0.3372nmである結晶性が良好な黒鉛がワイヤ10kg当たり0.05乃至5gワイヤの表面近傍に存在していれば、スパッタの発生を防止することができる。
【0015】
なお、結晶性が高い黒鉛を含有していることについては、ワイヤの表面を有機溶媒等で洗浄し、洗浄液をろ紙で濾過し、このろ紙上に存在する黒鉛の粉末の回折ピークをX線回折法により測定する。この結果、回折角2θが約26.5°の位置に明確なピークが存在するかにより黒鉛の結晶性の高さを区別することができる。
【0016】
ワイヤ表面に2θ=26.5°の近傍に明確な回折ピークを有する黒鉛以外の物質が存在する場合には、2θ=26.5°よりも高角度側に存在する回折ピークの有無で、黒鉛以外の物質と黒鉛とを区別することができる。即ち、26.5°よりも高角度側の回折角2θを有する回折ピークがあれば、黒鉛以外の物質が存在する。
【0017】
また、2θ=26.5°に回折ピークを有する黒鉛以外の物質と黒鉛とがワイヤ表面に存在する場合には、ワイヤ表面の付着物を捕集した後、酸又はアルカリ等の水溶液を使用して、黒鉛以外の付着物を溶解し、フィルタによりろ過して黒鉛のみを捕集することができる。このようにして黒鉛のみを捕集して黒鉛のX線回折ピークを得ることができる。
【0018】
黒鉛の量:ワイヤ10kg当たり0.05乃至5g
結晶性が高い黒鉛がワイヤ10kg当たり0.05乃至5gワイヤの表面近傍に存在していれば、スパッタの発生を防止することができる。この黒鉛の量がワイヤ10kg当たり0.05g未満では、スパッタ発生量を低減する効果がない。一方、この黒鉛の量がワイヤ10kg当たり5gを超えると、溶滴の離脱が阻害され、アークが不安定になり、逆にスパッタ発生量が増加する。また、黒鉛の量がワイヤ10kg当たり5gを超えて、ワイヤの表面に塗布されて存在すると、溶接金属中のCの含有量が0.05質量%程度増加し、溶接金属の強度の設計値からずれるという問題が生じる。従って、黒鉛の量はワイヤ10kg当たり0.05乃至5gとする。
【0019】
また、黒鉛のワイヤへの付着状態については、黒鉛がワイヤの表面近傍に存在していればよいことが分かった。即ち、伸線潤滑剤として、黒鉛又は黒鉛と他の潤滑剤とを混合して使用することができる。この他の潤滑剤としては、例えば金属石鹸、ワックス、油脂、グリース及び水等である。この伸線潤滑剤を使用して、伸線工程でワイヤの表面の凹部に黒鉛を埋め込んだ場合でも、また、ワイヤの表面直下に更に黒鉛を埋め込んで、その後、伸線工程で表面が薄い鋼皮で覆われた場合であっても、スパッタ発生量を低減する効果に差異は見られない。具体的には、黒鉛はワイヤの表面からその中心方向に向かって100μmよりもその表面に近い位置に存在していれば、スパッタ発生量を低減することができる。
【0020】
伸線工程においては、穴ダイス、ローラダイス又はマイクロミルを使用することができる。いずれの装置を使用した場合においても、黒鉛がワイヤの表面近傍に残留すれば、スパッタ発生量を低減することができる。黒鉛は伸線工程又はワイヤを最終製品径にする直前のスキンパス工程において、ワイヤの表面に塗布してもよい。また、最終製品径のワイヤの表面に黒鉛を粉体として塗布するか、又は、その表面に水分散液又は油分散液として塗布してもスパッタ発生量は低減される。更に、必要に応じて、黒鉛は、ワイヤの表面に黒鉛を固着させるためのノリ剤と一緒に使用し、ワイヤの表面に塗布してもよい。この場合においても、スパッタ発生量を低減することができる。
【0021】
(002)回折線のピーク位置から求めた面間隔d 002 :0.3353nm乃至0.3372nm
スパッタの発生を効果的に低減するには黒鉛の量と共に、黒鉛の結晶性が重要である。黒鉛のうち、特に、天然の鱗状又は鱗片状の黒鉛粒子の形状は扁平のものが多い。本願発明者等は鋭意研究の結果、黒鉛粒子の結晶性が重要であることを明らかにした。結晶性が悪い、例えば石油系の人造黒鉛又は石炭系の人造黒鉛等をのみを使用してワイヤを試作したが、この人造黒鉛では天然黒鉛である鱗状若しくは鱗片状黒鉛又は人造黒鉛の中でも結晶性が高い黒鉛のようなスパッタの低減効果は認められなかった。一方、スパッタの低減効果が認められたのは、X線回折の結果、回折角2θが約26.5°の位置に明確なX線回折ピークが認められる程度に結晶性が高い黒鉛が、結晶性が低い黒鉛に含まれている場合、又は結晶性が高い黒鉛がワイヤの表面に存在する場合である。
【0022】
粒径が0.1乃至30μmであるMoS の量:ワイヤ10kg当たり0.01乃至2g
上述の黒鉛の場合と同様にして、銅メッキを施していないワイヤのスパッタ発生量とMoSの粒径及び付着量との関係について調査した。この結果、MoSの存在位置は黒鉛と同様にワイヤの表面近傍であればスパッタ発生を抑制できることがわかった。そして、黒鉛とMoSとがワイヤの表面に同時に存在する場合に、スパッタ発生量を低減する効果は黒鉛が単独でワイヤの表面に存在する場合と比較して、著しく向上する。MoSの粒径が0.1乃至30μmであると、MoSのワイヤの表面への付着性が良好になる。また、MoSの粒径が0.1μm未満又は30μmを超えると、MoSのワイヤ表面への付着性が悪くなり、スパッタ発生量の低減効果が小さくなる。また、粒径が0.1乃至30μmであるMoSの量がワイヤ10kg当たり0.01乃至2g存在すると、スパッタ発生量の低減効果が顕著であった。従って、粒径が0.1乃至30μmであるMoSの量はワイヤ10kg当たり0.01乃至2gであることが好ましい。
【0023】
油の含有量:総量でワイヤ10kg当たり0.2乃至3g
上述の黒鉛の場合と同様にして、銅メッキを施していないワイヤのスパッタ発生量と油の粒径及び付着量との関係について調査した。この結果、黒鉛とMoSとが適正量存在するワイヤの表面に油がワイヤ10kg当たり0.2g乃至3g存在すると、スパッタ発生量がより一層低減することがわかった。この油としては、植物油、動物油、鉱物油及び合成油からなる群から選択された少なくとも1種以上の油を含有していればよい。従って、植物油、動物油、鉱物油及び合成油からなる群から選択された少なくとも1種以上の油を総量でワイヤ10kg当たり0.2乃至3gが存在することが好ましい。
【0024】
以下、本発明におけるワイヤの表面に存在する黒鉛の結晶性の分析方法並びに黒鉛、MoS及び油の量の測定方法について説明する。
【0025】
黒鉛の量の測定方法について説明する。先ず、ワイヤを有機溶媒(エタノール、アセトン又は石油エーテル等)で洗浄する。洗浄液をガラスフィルタで濾過した後、このガラスフィルタを乾燥させる。そして、ガラスフィルタごと黒鉛の炭素量を測定する。この測定量を(a)とする。この黒鉛の炭素量の測定には、堀場社製のEMIA−520FA等の高周波燃焼赤外線吸収法を使用した。
【0026】
一方、ワイヤをエタノールで洗浄した後、このワイヤを硝酸溶液(濃硝酸が1、水が2の割合で混合した水溶液)に120秒間浸漬し、ワイヤの表面のみを溶解し、溶液をガラスフィルタで濾過する。その後、このガラスフィルタを乾燥させる。そして、ガラスフィルタをそのままの状態で捕集された黒鉛の炭素量を測定する。この測定量を(b)とする。
【0027】
上述の各工程で使用される各ガラスフィルタについて、測定前に炭素量を測定し、これをブランク値(c1、c2)とし、各測定値から差し引く。これにより、ワイヤの表面に存在していた黒鉛だけの量が測定される。なお、ワイヤ中に固溶している炭素はフィルタに捕集されず、濾液に溶解している。即ち、ワイヤの表面に付着又はワイヤの表面直下に埋め込まれた遊離黒鉛のみがフィルタに捕集される。従って、ワイヤの表面に付着又は表面直下に埋め込まれた黒鉛の総量(D)は下記数式1により算出することができる。
【0028】
【数1】
(D)=((a)+(b))−((c1)+(c2))
【0029】
この黒鉛の総量(D)をワイヤの質量で除することにより、ワイヤ10kg当たりの黒鉛の量を算出することができる。
【0030】
次に、黒鉛の結晶性の分析方法について説明する。先ず、CuKα線を使用し、走査速度を0.25°/分として粉末X線回折を行う。回折角度の補正は高純度のシリコンをメノウ製の乳鉢にて325標準篩以下に粉砕し、この粉末を黒鉛に10乃至20質量%添加し、シリコンの(111)回折ピークを使用して補正した。回折角2θが約26.5°のピーク位置はバックグランドから図形高さの2/3の位置でバックグランドに平行線を引き、その図形により区切られた線分の中点とする。なお、バックグランドは2θ=29°付近を基準として、ベースラインに対して接線を引く。この(002)回折線のピーク位置から黒鉛の面間隔d002を求める。また、測定に際しては、無反射試料板を使用する。試料が少ない場合、試料の信号がベースライン上に乗ってくるので、無反射試料板を使用すると、試料が少ない場合であっても、黒鉛の面間隔を測定することができるので好ましい。
【0031】
X線回折の測定には、黒鉛が0.05乃至0.1g程度必要である。この黒鉛はワイヤを10kg程度上記方法で洗浄し、洗浄液で濾過することにより、捕集できる。また、下記に示す方法によりワイヤ表面から黒鉛を捕集することもできる。先ず、溶接で使用するスプリングライナを3m程度準備し、このライナをアセトン等の有機溶媒で脱脂洗浄する。次に、このライナを8字に曲げ、ワイヤを連続的にこのライナ内を通過させる。このとき、スプリングライナ内部にはワイヤ表面から黒鉛が剥離し、堆積する。次に、この堆積物及びスプリングライナを有機溶媒で超音波洗浄し、洗浄液を濾過する。そして、ろ紙に残留した黒鉛を捕集すれば容易に0.1g程度のワイヤ付着物を得ることができ、これをX線回折に供することができる。
【0032】
図1は横軸に回折角度をとり、縦軸に回折強度をとって、捕集された黒鉛の測定結果を示す回折図、図2は横軸に回折角度をとり、縦軸に回折強度をとって、捕集された他の黒鉛の測定結果を示す回折図である。なお、図1及び図2において、縦軸は任意単位である。
【0033】
図1に示す黒鉛の測定は、理学電機製RINT−1500を使用して、ターゲットをCu、強度を40kV−200mA、スリット発散の幅を1/2°、散乱スリットの幅を1/2°、受光スリットの幅を0.15mm、モノクロメータの受光スリット幅を0.6mm、走査速度を0.25°/分及びサンプリング幅を0.01°とした測定条件で測定した。なお、黒鉛の量は0.1gである。図1に示すように、回折角が28.5°における回折ピークはSiの(111)のピークである。この場合、黒鉛の面間隔d002は0.335538nmであった。
【0034】
また、図2は、図1に示す黒鉛と同じ測定条件により測定した他の黒鉛のX線回折結果である。図2に示すように、図2に示す黒鉛は結晶が悪い黒鉛を含んでいるのものの、ピーク位置を特定することができる。この場合、この黒鉛の面間隔面間隔d002は0.335414nmであった。一部に、このような結晶性が悪い黒鉛が存在しても、明らかに黒鉛のピーク位置を同定することができる程度の結晶性を有する黒鉛が含まれていれば、スパッタを低減する効果は、結晶性が高い黒鉛と同程度であった。
【0035】
次に、MoSの量の測定方法について説明する。先ず、ワイヤを有機溶媒(エタノール、アセトン及び石油エーテル等)で洗浄し、洗浄液をろ紙で濾過した後、ろ紙を乾燥させる。このろ紙を混合水溶液(硫酸(濃硫酸:水が1:1)が1、濃過塩素酸が1、濃硝酸が1の割合で混合した水溶液)によりろ紙とMoSとを分解(白煙処理)し、MoSを溶解する。そして、原子吸光法によりMoを定量化する。この測定量を(e)とする。
【0036】
また、ワイヤを有機溶媒(エタノール、アセトン及び石油エーテル等)で洗浄し、その後、ワイヤを塩酸溶液(濃度が35質量%の塩酸10ミリリットルが1、水が1の割合で混合した水溶液)に浸漬して溶解し、ワイヤからMoSを遊離させる。そして、濾液をろ紙で濾過した後、ろ紙を乾燥させる。このろ紙を混合水溶液(硫酸(濃硫酸:水が1:1)が1、濃過塩素酸が1、濃硝酸が1の割合で混合した水溶液)によりろ紙とMoSとを分解し、MoSを溶解させる。その後、原子吸光法によりMoの量を測定し、Moの量を定量化する。この測定量を(f)とする。従って、ワイヤの表面に付着又は表面直下に埋め込まれたMoの総量(G)は下記数式2により算出することができる。
【0037】
【数2】
(G)=(e)+(f)
【0038】
次に、Moの総量(G)を、MoSに換算し、ワイヤの質量で除することにより、ワイヤ10kg当たりのMoSの量を算出することができる。
【0039】
次に、MoSの粒径の測定方法について説明する。MoSの粒径については、上述の如く、ワイヤを有機溶媒で洗浄し、洗浄液をろ紙で濾過した後、ろ紙を乾燥させる。この後、走査型電子顕微鏡でMoSの結晶粒を観察し、その粒径を測定する。
【0040】
一方、ワイヤの表面直下に埋め込まれたMoSの粒径については、上述の如く、ワイヤを有機溶媒(エタノール、アセトン及び石油エーテル等)で洗浄し、その後、ワイヤを塩酸溶液(塩酸が1、水が1の割合で混合した水溶液)に浸漬して溶解し、ワイヤからMoSを遊離させる。そして、濾液をろ紙で濾過した後、ろ紙を乾燥させる。この後、走査型電子顕微鏡でMoSの結晶粒を観察し、その粒径を測定する。
【0041】
次に、油量の測定方法について説明する。油量の測定方法については、ワイヤの表面を四塩化炭素で洗浄した後、赤外線吸収法により油量を定量測定する。
【0042】
【実施例】
本発明の範囲に入る溶接用ワイヤの実施例について、その特性を比較例と比較した結果について具体的に説明する。
【0043】
第1実施例
JIS Z3312のYGW11に相当する銅メッキ無しソリッドワイヤを使用し、このワイヤの伸線工程で使用する潤滑剤の中に黒鉛及びMoSを混入させ、ワイヤの表面に積極的に黒鉛及びMoSを埋め込んだ。更に、直径が最終製品径であるワイヤの表面に黒鉛及びMoSを油に分散させて塗布し、実施例及び比較例のワイヤを試作した。
【0044】
このワイヤの表面又は表面直下に存在する黒鉛の面間隔、黒鉛の量(黒鉛塗布量)、MoSの粒径、MoSの量(MoS塗布量)及び油量を上述の測定方法により測定した。そして、溶接電流が300A、溶接電圧が37V、ワイヤの突き出し長さが25mm、溶接速度が30cm/分の溶接条件でビードオンプレート溶接を行った。溶接の際に、溶接ビードの左右に飛散する全てのスパッタを銅製の容器で捕集し、1分間当たりに発生したスパッタ質量を測定した。ここで、銅メッキ無しソリッドワイヤの直径は1.2mmである。これらの結果を下記表1及び表2に示す。なお、表1及び表2に示す「Tr.」は、その量が微量であることを示す。但し、カーボンブラックの場合、通常入手できる黒鉛の面間隔は0.344nm程度であり、石油系、石炭系コークスの面間隔は0.344〜0.343nmである。これを2000乃至3000℃の温度で熱処理することにより、その面間隔を種々変えることができ、表2に示す比較例No.21乃至27のワイヤに塗布された黒鉛はこのようにして面間隔を調整したものである。
【0045】
【表1】

Figure 0003566618
【0046】
【表2】
Figure 0003566618
【0047】
上記表1及び表2に示すように、実施例No.1乃至13は、スパッタ発生量が少なかった。
【0048】
一方、上記表2に示すように、比較例No.27は、黒鉛の面間隔が本発明の上限値を超え、黒鉛塗布量が本発明の下限値未満であるので、スパッタ発生量が多かった。
【0049】
比較例No.28は、黒鉛の面間隔が本発明の上限値を超えているので、スパッタ発生量が多かった。
【0050】
比較例No.29は、黒鉛の面間隔及び黒鉛塗布量が本発明の上限値を超えているので、スパッタ発生量が多かった。
【0051】
比較例No.30は、黒鉛の面間隔が本発明の上限値を超え、黒鉛塗布量が本発明の下限値未満であるので、スパッタ発生量が多かった。
【0052】
比較例No.31は、黒鉛の面間隔が本発明の上限値を超えているので、スパッタ発生量が多かった。
【0053】
比較例No.32は、黒鉛の面間隔が本発明の上限値を超えているので、スパッタ発生量が多かった。
【0054】
比較例No.33は、黒鉛の面間隔が本発明の上限値を超えているので、スパッタ発生量が多かった。
【0055】
第2実施例
JIS Z3313のYFW−C50DMに相当する銅メッキ無しフラックス入りワイヤを使用し、このワイヤの伸線工程で使用する潤滑剤の中に黒鉛及びMoSを混入させ、ワイヤの表面に積極的に黒鉛及びMoSを埋め込んだ。更に、直径が最終製品径であるワイヤの表面に黒鉛及びMoSを油に分散させて塗布し、実施例及び比較例のワイヤを試作した。
【0056】
このワイヤの表面及び表面直下に存在する黒鉛の面間隔、黒鉛の量(黒鉛塗布量)、MoSの粒径、MoSの量(MoS塗布量)及び油量を上述の測定方法により測定した。そして、溶接電流が300A、溶接電圧が37V、ワイヤの突き出し長さが25mm、溶接速度が30cm/分の溶接条件でビードオンプレート溶接を行った。溶接の際に、溶接ビードの左右に飛散する全てのスパッタを銅製の容器で捕集し、1分間当たりに発生したスパッタ質量を測定した。ここで、銅メッキ無しフラックス入りワイヤの直径は1.2mmであり、そのフラックス率は13.5%である。これらの結果を下記表3及び表4に示す。なお、表3及び表4に示す「Tr.」は、その量が微量であることを示す。
【0057】
【表3】
Figure 0003566618
【0058】
【表4】
Figure 0003566618
【0059】
上記表3及び表4に示すように、実施例No.14乃至26は、スパッタ発生量が少なかった。
【0060】
一方、上記表4に示すように、比較例No.34は、黒鉛の面間隔が本発明の上限値を超えているので、スパッタの発生量が多かった。
【0061】
比較例No.35は、黒鉛の面間隔が本発明の上限値を超えているので、スパッタの発生量が多かった。
【0062】
比較例No.36は、黒鉛の面間隔及び黒鉛塗布量が本発明の上限値を超えているので、スパッタの発生量が多かった。
【0063】
比較例No.37は、黒鉛の面間隔が本発明の上限値を超え、黒鉛塗布量が本発明の下限値未満であるので、スパッタの発生量が多かった。
【0064】
比較例No.38は、黒鉛の面間隔が本発明の上限値を超えているので、スパッタの発生量が多かった。
【0065】
比較例No.39は、黒鉛の面間隔が本発明の上限値を超えているので、スパッタの発生量が多かった。
【0066】
【発明の効果】
以上詳述したように本発明によれば、ワイヤの表面上又は表面直下に存在する黒鉛の面間隔及びその量を適切に規定したので、銅メッキが表面に施されていないワイヤであっても、スパッタ発生量を低減することができる。
【図面の簡単な説明】
【図1】横軸に回折角度をとり、縦軸に回折強度をとって、捕集された黒鉛の測定結果を示す回折図である。
【図2】横軸に回折角度をとり、縦軸に回折強度をとって、捕集された他の黒鉛の測定結果を示す回折図である。[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a welding wire used for arc welding of steel or the like and having no copper plating or the like on the surface of the wire, and more particularly to a welding wire for reducing the amount of spatter.
[0002]
[Prior art]
Conventionally, among the wires for arc welding, particularly, solid wires and seamless flux-cored wires have been subjected to copper plating during drawing. The copper plating plays a role in improving the feedability and rust prevention in the final product. In addition, copper plating itself acts as an excellent solid lubricant, and also contributes to improvement in drawability.
[0003]
However, in order to apply copper plating to the surface of the wire, it is necessary to activate the surface of the wire (steel ground surface) by a method such as electrolytic pickling before the plating treatment, and to prepare a surface to which the copper plating easily adheres. . As a method of performing the copper plating, there are a displacement plating method, an electroplating method, and the like. However, in the copper plating process, complicated line management such as management of the concentration of a plating solution and management of copper and a counter electrode is required. For this reason, the copper plating process is a burdensome process in which the cost is extremely high considering the manufacturing cost of the wire. Further, the copper plating process involving the dispersion of acid mist in the working atmosphere and the treatment of waste liquid and the treatment of industrial waste is a process to be excluded from consideration for the environment.
[0004]
On the other hand, conventionally, MoS 2 , WS 2 , PTFE, C, fluorinated graphite or metal soap is used as a lubricant applied to the surface of the wire for the purpose of improving or stabilizing the feedability of the wire for arc welding. It has been proposed (JP-A-6-285678, JP-A-9-70684).
[0005]
[Problems to be solved by the invention]
However, the copper plating process is a burdensome process in the production of wires, but if the copper plating process is simply removed to produce a solid wire or a flux-cored wire for arc welding, the production at the time of wire drawing is performed. There are problems with the properties and the quality of the wire as a product.
[0006]
Regarding productivity during wire drawing, recently, as described above, a good wire drawing lubricant has been developed, and the problem of productivity during wire drawing is being solved. On the other hand, a problem with the quality of the wire as a product is that spatter occurs. That is, if the surface of the wire is not plated with copper, there is a problem that the swing of the droplet is large and the amount of spatter generated is increased.
[0007]
The present invention has been made in view of such a problem, and an object of the present invention is to provide a welding wire that can suppress generation of spatter even if the wire is not plated with copper.
[0008]
[Means for Solving the Problems]
In the welding wire according to the present invention, graphite having a plane distance d 002 of 0.3353 nm to 0.3372 nm obtained from the peak position of the (002) diffraction line is 0.05% per 10 kg of the wire on or immediately below the surface of the wire. To 5 g, and the surface of the wire is not plated .
[0009]
In this case, it is preferable that MoS 2 having a particle size of 0.1 to 30 μm is present on or immediately below the surface of the wire in an amount of 0.01 to 2 g per 10 kg of the wire.
[0010]
Further, it is preferable that at least one or more oils selected from the group consisting of vegetable oils, animal oils, mineral oils and synthetic oils are present on the surface of the wire in a total amount of 0.2 to 3 g per 10 kg of the wire.
[0011]
For this gun inventors have to observe the occurrence of sputtering of wire that is not plated with copper, the results of observation of the stability of the droplet transfer during arc welding, the peak position of the surface of the wire (002) diffraction line When crystallinity is good black lead plane spacing d 002 is 0.3353nm to 0.3372nm obtained from there a certain amount has been found to be able to significantly reduce spatter.
[0012]
Further, when a certain amount of MoS 2 is present on the surface of the wire and oil is present, the amount of spatter generated is further reduced. Furthermore, there is an appropriate amount of oil to reduce the amount of spatter generated, which is 0.2 to 0.3 g per 10 kg of wire.
[0013]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, a welding wire according to an embodiment of the present invention will be described in detail. The reasons for limiting the composition of the welding wire, the particle size of the composition, and the amount of the composition will be described.
[0014]
Graphite In order to reduce the amount of spatter generated, the inventors of the present application study the effects of the deposits near the surface of the wire, and determine the appropriate amount, deposition state, composition, and particle size of the deposits. Was performed. As a result, as a substance that is present near the surface of the wire and that can effectively reduce the amount of spatter, the crystallinity that is produced naturally has high crystallinity among scaly or flaky graphite or artificial graphite. Clarified that it is graphite. Further, when the purity of the carbon of the graphite is 97% by mass or more, the effect of reducing the amount of spatter generated is good. Furthermore, even if graphite contains impurities such as ash content of about 20% by mass, generation of spatter can be effectively prevented. Furthermore, if graphite having good crystallinity with a plane distance d 002 of 0.3353 nm to 0.3372 nm is present in the vicinity of 0.05 to 5 g of wire per 10 kg of wire, the occurrence of spatter can be prevented. Can be.
[0015]
Regarding the fact that graphite having high crystallinity is contained, the surface of the wire is washed with an organic solvent or the like, the washing solution is filtered with filter paper, and the diffraction peak of the graphite powder present on the filter paper is determined by X-ray diffraction. It is measured by the method. As a result, the degree of crystallinity of graphite can be distinguished depending on whether a clear peak exists at a position where the diffraction angle 2θ is about 26.5 °.
[0016]
When there is a substance other than graphite having a clear diffraction peak near 2θ = 26.5 ° on the wire surface, the presence or absence of a diffraction peak existing at an angle higher than 2θ = 26.5 ° indicates the presence of graphite. Other materials and graphite can be distinguished. That is, if there is a diffraction peak having a diffraction angle 2θ higher than 26.5 °, a substance other than graphite exists.
[0017]
When a substance other than graphite having a diffraction peak at 2θ = 26.5 ° and graphite are present on the wire surface, after adhering substances on the wire surface, an aqueous solution of acid or alkali is used. Thus, the deposits other than graphite can be dissolved and filtered with a filter to collect only graphite. In this way, it is possible to collect only graphite and obtain an X-ray diffraction peak of graphite.
[0018]
Amount of graphite: 0.05 to 5 g per 10 kg of wire
If graphite having high crystallinity is present in the vicinity of the surface of 0.05 to 5 g of wire per 10 kg of wire, the occurrence of spatter can be prevented. If the amount of graphite is less than 0.05 g per 10 kg of wire, there is no effect of reducing the amount of spatter generated. On the other hand, if the amount of the graphite exceeds 5 g per 10 kg of the wire, the detachment of the droplet is hindered, the arc becomes unstable, and the amount of spatter generated increases. Further, when the amount of graphite exceeds 5 g per 10 kg of the wire and is applied to the surface of the wire, the content of C in the weld metal increases by about 0.05% by mass, and the strength of the weld metal is reduced from a design value. The problem of deviation occurs. Therefore, the amount of graphite is set to 0.05 to 5 g per 10 kg of wire.
[0019]
In addition, as for the state of adhesion of the graphite to the wire, it was found that the graphite only needs to be present near the surface of the wire. That is, graphite or a mixture of graphite and another lubricant can be used as a drawing lubricant. Other lubricants include, for example, metal soaps, waxes, fats, oils, greases, and water. Even if graphite is buried in the recesses on the surface of the wire in the drawing process using this wire drawing lubricant, graphite is further buried just below the surface of the wire, and then the steel with a thin surface is drawn in the drawing process. Even when covered with leather, there is no difference in the effect of reducing the amount of spatter generation. Specifically, if the graphite is present at a position closer to the surface than 100 μm from the surface of the wire toward the center thereof, the amount of spatter generated can be reduced.
[0020]
In the wire drawing step, a hole die, a roller die or a micromill can be used. In any case, if the graphite remains near the surface of the wire, the amount of spatter generated can be reduced. Graphite may be applied to the surface of the wire in a wire drawing process or a skin pass process immediately before the wire is reduced to a final product diameter. Further, even if graphite is applied as a powder on the surface of a wire having a final product diameter, or is applied as an aqueous dispersion or an oil dispersion on the surface, the amount of spatter generated is reduced. Furthermore, if necessary, the graphite may be used together with a glue for fixing the graphite to the surface of the wire, and may be applied to the surface of the wire. Also in this case, the amount of spatter generated can be reduced.
[0021]
(002) Interplanar spacing d 002 determined from the peak position of the diffraction line : 0.3353 nm to 0.3372 nm
In order to effectively reduce the occurrence of spatter, the crystallinity of graphite is important together with the amount of graphite. Of the graphites, in particular, the shape of natural scale-like or flake-like graphite particles is often flat. As a result of intensive studies, the present inventors have found that the crystallinity of graphite particles is important. Poor crystallinity, for example, a wire was prototyped using only petroleum-based artificial graphite or coal-based artificial graphite, etc.In this artificial graphite, natural graphite is flaky or scaly graphite or artificial graphite The effect of reducing the spatter like graphite with high content was not recognized. On the other hand, the effect of reducing the spatter was observed because, as a result of X-ray diffraction, graphite having a high degree of crystallinity such that a clear X-ray diffraction peak was observed at a position where the diffraction angle 2θ was about 26.5 °, This is the case when the graphite is included in low-crystalline graphite, or when graphite with high crystallinity exists on the surface of the wire.
[0022]
Amount of MoS 2 having a particle size of 0.1 to 30 μm : 0.01 to 2 g per 10 kg of wire
In the same manner as in the case of graphite described above, the relationship between the amount of spatter generated on the wire not subjected to copper plating and the particle size and the amount of adhesion of MoS 2 was investigated. As a result, it was found that the generation of sputter can be suppressed if MoS 2 is present near the surface of the wire as in the case of graphite. When graphite and MoS 2 are present on the surface of the wire at the same time, the effect of reducing the amount of spatter is significantly improved as compared with the case where graphite is present alone on the surface of the wire. When the particle size of MoS 2 is 0.1 to 30 μm, the adhesion of MoS 2 to the surface of the wire becomes good. On the other hand, if the particle size of MoS 2 is less than 0.1 μm or exceeds 30 μm, the adhesion of MoS 2 to the wire surface will be poor, and the effect of reducing the amount of spatter generated will be reduced. When the amount of MoS 2 having a particle size of 0.1 to 30 μm was 0.01 to 2 g per 10 kg of the wire, the effect of reducing the amount of spatter was remarkable. Therefore, the amount of MoS 2 having a particle size of 0.1 to 30 μm is preferably 0.01 to 2 g per 10 kg of the wire.
[0023]
Oil content: 0.2 to 3 g per 10 kg of wire in total
In the same manner as in the case of the graphite described above, the relationship between the spatter generation amount of the wire not subjected to copper plating, the particle size of the oil, and the adhesion amount was investigated. As a result, it was found that when oil was present in an amount of 0.2 g to 3 g per 10 kg of wire on the surface of the wire where graphite and MoS 2 were present in appropriate amounts, the amount of spatter generated was further reduced. The oil only needs to contain at least one or more oils selected from the group consisting of vegetable oils, animal oils, mineral oils and synthetic oils. Therefore, it is preferable that the total amount of at least one oil selected from the group consisting of vegetable oil, animal oil, mineral oil and synthetic oil is 0.2 to 3 g per 10 kg of wire.
[0024]
Hereinafter, a method for analyzing the crystallinity of graphite present on the surface of a wire and a method for measuring the amounts of graphite, MoS 2 and oil in the present invention will be described.
[0025]
A method for measuring the amount of graphite will be described. First, the wire is washed with an organic solvent (such as ethanol, acetone or petroleum ether). After the washing solution is filtered through a glass filter, the glass filter is dried. Then, the carbon content of the graphite is measured for each glass filter. This measured amount is defined as (a). For measuring the carbon content of the graphite, a high-frequency combustion infrared absorption method such as EMIA-520FA manufactured by Horiba was used.
[0026]
On the other hand, after washing the wire with ethanol, the wire is immersed in a nitric acid solution (an aqueous solution in which concentrated nitric acid is mixed with water at a ratio of 1) for 120 seconds, only the surface of the wire is dissolved, and the solution is filtered with a glass filter. Filter. Thereafter, the glass filter is dried. Then, the amount of carbon of the collected graphite is measured while keeping the glass filter as it is. This measured amount is defined as (b).
[0027]
For each glass filter used in each of the above-described steps, the carbon amount is measured before measurement, and this is set as a blank value (c1, c2) and subtracted from each measured value. Thereby, the amount of only the graphite existing on the surface of the wire is measured. The carbon dissolved in the wire is not collected by the filter but is dissolved in the filtrate. That is, only the free graphite adhered to the surface of the wire or embedded immediately below the surface of the wire is collected by the filter. Therefore, the total amount (D) of the graphite adhered to the surface of the wire or embedded immediately below the surface can be calculated by the following equation (1).
[0028]
(Equation 1)
(D) = ((a) + (b))-((c1) + (c2))
[0029]
By dividing the total amount (D) of the graphite by the mass of the wire, the amount of graphite per 10 kg of the wire can be calculated.
[0030]
Next, a method for analyzing the crystallinity of graphite will be described. First, powder X-ray diffraction is performed using CuKα radiation at a scanning speed of 0.25 ° / min. The diffraction angle was corrected by pulverizing high-purity silicon in an agate mortar to 325 standard sieve or less, adding this powder to graphite in an amount of 10 to 20% by mass, and correcting using the (111) diffraction peak of silicon. . At the peak position where the diffraction angle 2θ is about 26.5 °, a parallel line is drawn on the background at a position which is の of the figure height from the background, and is set as the midpoint of the line segment divided by the figure. Note that the background is drawn tangent to the baseline with reference to around 2θ = 29 °. From the peak position of the (002) diffraction line, the plane distance d 002 of graphite is obtained. In measurement, a non-reflective sample plate is used. When the sample is small, the signal of the sample is on the base line. Therefore, it is preferable to use the non-reflection sample plate because even if the sample is small, the surface interval of graphite can be measured.
[0031]
X-ray diffraction requires about 0.05 to 0.1 g of graphite. This graphite can be collected by washing the wire by about 10 kg by the above-described method and filtering with a washing liquid. Also, graphite can be collected from the wire surface by the method described below. First, a spring liner used for welding is prepared for about 3 m, and the liner is degreased and washed with an organic solvent such as acetone. Next, the liner is bent into a figure eight and the wire is passed continuously through the liner. At this time, graphite separates from the wire surface and accumulates inside the spring liner. Next, the deposit and the spring liner are ultrasonically cleaned with an organic solvent, and the cleaning liquid is filtered. Then, if the graphite remaining on the filter paper is collected, about 0.1 g of the wire deposit can be easily obtained, and this can be subjected to X-ray diffraction.
[0032]
FIG. 1 is a diffraction diagram showing the measurement results of the collected graphite by taking the diffraction angle on the horizontal axis and the diffraction intensity on the vertical axis, and FIG. 2 is the diffraction angle on the horizontal axis and the diffraction intensity on the vertical axis. FIG. 4 is a diffraction diagram showing measurement results of other collected graphite. 1 and 2, the vertical axis is an arbitrary unit.
[0033]
The measurement of graphite shown in FIG. 1 was performed using RINT-1500 manufactured by Rigaku Denki Co., using a target of Cu, an intensity of 40 kV-200 mA, a slit divergence width of 1/2 °, and a scattering slit width of 1/2 °. The measurement was performed under the conditions that the width of the light receiving slit was 0.15 mm, the width of the light receiving slit of the monochromator was 0.6 mm, the scanning speed was 0.25 ° / min, and the sampling width was 0.01 °. The amount of graphite was 0.1 g. As shown in FIG. 1, the diffraction peak at a diffraction angle of 28.5 ° is a (111) peak of Si. In this case, the interplanar spacing d 002 of graphite was 0.335538 nm.
[0034]
FIG. 2 shows an X-ray diffraction result of another graphite measured under the same measurement conditions as the graphite shown in FIG. As shown in FIG. 2, although the graphite shown in FIG. 2 includes graphite having bad crystal, the peak position can be specified. In this case, surface separation spacing d 002 of the graphite was 0.335414Nm. Even if such poorly crystalline graphite is present, the effect of reducing spatter can be reduced if graphite having enough crystallinity to clearly identify the graphite peak position is included. , About the same as graphite having high crystallinity.
[0035]
Next, a method for measuring the amount of MoS 2 will be described. First, the wire is washed with an organic solvent (ethanol, acetone, petroleum ether, or the like), and the washing liquid is filtered with filter paper, and then the filter paper is dried. The filter paper and MoS 2 are decomposed (white smoke treatment) by a mixed aqueous solution (an aqueous solution in which sulfuric acid (concentrated sulfuric acid: water 1: 1), concentrated perchloric acid is mixed in a ratio of 1 and concentrated nitric acid are mixed in a ratio of 1). ), and dissolve MoS 2. Then, Mo is quantified by an atomic absorption method. This measured amount is defined as (e).
[0036]
Further, the wire is washed with an organic solvent (ethanol, acetone, petroleum ether, etc.), and then the wire is immersed in a hydrochloric acid solution (an aqueous solution in which 10 ml of hydrochloric acid having a concentration of 35% by mass and 1 are mixed with water). To dissolve and release MoS 2 from the wire. Then, after the filtrate is filtered with filter paper, the filter paper is dried. The filter paper mixed aqueous solution (sulfuric acid (concentrated sulfuric acid: water 1: 1) is 1, 1 is concentrated perchloric acid, aqueous solution of concentrated nitric acid are mixed at a ratio of 1) to decompose the filter paper and MoS 2 by, MoS 2 Is dissolved. Then, the amount of Mo is measured by an atomic absorption method, and the amount of Mo is quantified. This measured amount is defined as (f). Therefore, the total amount (G) of Mo attached to the surface of the wire or embedded immediately below the surface can be calculated by the following equation (2).
[0037]
(Equation 2)
(G) = (e) + (f)
[0038]
Next, the amount of MoS 2 per 10 kg of wire can be calculated by converting the total amount (G) of Mo into MoS 2 and dividing by the mass of the wire.
[0039]
Next, a method for measuring the particle size of MoS 2 will be described. The particle diameter of MoS 2, as described above, washing the wire with an organic solvent, after filtration of the washing liquid with a filter paper, drying the filter paper. Thereafter, the crystal grains of MoS 2 are observed with a scanning electron microscope, and the grain size is measured.
[0040]
On the other hand, as for the particle size of MoS 2 embedded immediately below the surface of the wire, as described above, the wire is washed with an organic solvent (ethanol, acetone, petroleum ether, or the like), and then the wire is washed with a hydrochloric acid solution (hydrochloric acid is 1 or less). Dipping into an aqueous solution (water mixed at a ratio of 1) to dissolve and release MoS 2 from the wire. Then, after the filtrate is filtered with filter paper, the filter paper is dried. Thereafter, the crystal grains of MoS 2 are observed with a scanning electron microscope, and the grain size is measured.
[0041]
Next, a method for measuring the amount of oil will be described. Regarding the method for measuring the oil amount, after the surface of the wire is washed with carbon tetrachloride, the oil amount is quantitatively measured by an infrared absorption method.
[0042]
【Example】
With respect to Examples of the welding wire falling within the scope of the present invention, the results of comparing the characteristics with those of Comparative Examples will be specifically described.
[0043]
First Embodiment A solid wire without copper plating corresponding to YGW11 of JIS Z3312 is used, and graphite and MoS 2 are mixed in a lubricant used in a wire drawing process of the wire, and graphite is positively applied to the surface of the wire. and embedded MoS 2. Further, graphite and MoS 2 were dispersed in oil and applied to the surface of the wire having a diameter of the final product to produce wires of Examples and Comparative Examples.
[0044]
Spacing of graphite present in the subsurface or surface of the wire, the amount of graphite (graphite coating amount), MoS 2 having a particle size, the amount of MoS 2 (MoS 2 coating amount) and the oil amount determined by the measuring method described above did. Then, bead-on-plate welding was performed under the welding conditions of a welding current of 300 A, a welding voltage of 37 V, a protruding length of the wire of 25 mm, and a welding speed of 30 cm / min. At the time of welding, all spatters scattered to the left and right of the weld bead were collected by a copper container, and the spatter mass generated per minute was measured. Here, the diameter of the solid wire without copper plating is 1.2 mm. The results are shown in Tables 1 and 2 below. “Tr.” Shown in Tables 1 and 2 indicates that the amount is very small. However, in the case of carbon black, the plane spacing of normally available graphite is about 0.344 nm, and the plane spacing of petroleum-based or coal-based coke is 0.344 to 0.343 nm. By subjecting this to a heat treatment at a temperature of 2000 to 3000 ° C., the surface spacing can be changed variously. The graphite applied to the wires 21 to 27 has the surface spacing adjusted in this manner.
[0045]
[Table 1]
Figure 0003566618
[0046]
[Table 2]
Figure 0003566618
[0047]
As shown in Tables 1 and 2 above, Example No. In Nos. 1 to 13, the amount of generated spatter was small.
[0048]
On the other hand, as shown in Table 2 above, Comparative Example No. In No. 27, the amount of spatter generated was large because the surface spacing of graphite exceeded the upper limit of the present invention and the amount of graphite applied was less than the lower limit of the present invention.
[0049]
Comparative Example No. In No. 28, the amount of spatter generated was large because the plane spacing of graphite exceeded the upper limit of the present invention.
[0050]
Comparative Example No. Sample No. 29 had a large amount of spatter generation because the surface spacing of graphite and the amount of graphite applied exceeded the upper limits of the present invention.
[0051]
Comparative Example No. In No. 30, the spatter generation amount was large because the graphite plane spacing exceeded the upper limit of the present invention and the graphite coating amount was less than the lower limit of the present invention.
[0052]
Comparative Example No. Sample No. 31 had a large amount of spatter generation because the surface spacing of graphite exceeded the upper limit of the present invention.
[0053]
Comparative Example No. In No. 32, the amount of spatter was large because the plane spacing of graphite exceeded the upper limit of the present invention.
[0054]
Comparative Example No. No. 33 had a large amount of spatter since the surface spacing of graphite exceeded the upper limit of the present invention.
[0055]
Second Example A flux-cored wire without copper plating corresponding to YFW-C50DM of JIS Z3313 is used, and graphite and MoS 2 are mixed in a lubricant used in a wire drawing process of the wire, and the surface of the wire is positively treated. Graphite and MoS 2 were embedded. Further, diameter graphite and MoS 2 coating is dispersed in the oil to the surface of the wire as a final product diameter was fabricated wires of Examples and Comparative Examples.
[0056]
Spacing of graphite present in the subsurface and surface of the wire, the amount of graphite (graphite coating amount), MoS 2 having a particle size, the amount of MoS 2 (MoS 2 coating amount) and the oil amount determined by the measuring method described above did. Then, bead-on-plate welding was performed under the welding conditions of a welding current of 300 A, a welding voltage of 37 V, a protruding length of the wire of 25 mm, and a welding speed of 30 cm / min. At the time of welding, all spatters scattered to the left and right of the weld bead were collected by a copper container, and the spatter mass generated per minute was measured. Here, the diameter of the flux-cored wire without copper plating is 1.2 mm, and its flux rate is 13.5%. The results are shown in Tables 3 and 4 below. “Tr.” Shown in Tables 3 and 4 indicates that the amount is very small.
[0057]
[Table 3]
Figure 0003566618
[0058]
[Table 4]
Figure 0003566618
[0059]
As shown in Tables 3 and 4 above, Example No. In Nos. 14 to 26, the amount of generated spatter was small.
[0060]
On the other hand, as shown in Table 4 above, Comparative Example No. In No. 34, the amount of spatter was large because the plane spacing of graphite exceeded the upper limit of the present invention.
[0061]
Comparative Example No. In No. 35, the amount of spatter was large because the surface spacing of graphite exceeded the upper limit of the present invention.
[0062]
Comparative Example No. In No. 36, the amount of spatter generated was large because the surface spacing of graphite and the amount of graphite applied exceeded the upper limits of the present invention.
[0063]
Comparative Example No. In No. 37, the amount of spatter generated was large because the surface spacing of graphite exceeded the upper limit of the present invention and the amount of graphite applied was less than the lower limit of the present invention.
[0064]
Comparative Example No. In No. 38, the amount of spatters generated was large because the plane spacing of graphite exceeded the upper limit of the present invention.
[0065]
Comparative Example No. In No. 39, the amount of spatter was large because the plane spacing of graphite exceeded the upper limit of the present invention.
[0066]
【The invention's effect】
As described in detail above, according to the present invention, since the surface spacing and the amount of graphite existing on or immediately below the surface of the wire are appropriately defined, even a wire whose surface is not plated with copper is used. In addition, the amount of spatter generated can be reduced.
[Brief description of the drawings]
FIG. 1 is a diffraction diagram showing the measurement results of collected graphite, with the horizontal axis representing the diffraction angle and the vertical axis representing the diffraction intensity.
FIG. 2 is a diffraction diagram showing a measurement result of another collected graphite, with a horizontal axis representing a diffraction angle and a vertical axis representing a diffraction intensity.

Claims (3)

(002)回折線のピーク位置から求めた面間隔d002が0.3353nm乃至0.3372nmである黒鉛がワイヤの表面上又は表面直下にワイヤ10kg当たり0.05乃至5g存在し、ワイヤ表面にメッキが施されていないことを特徴とする溶接用ワイヤ。(002) plane spacing d 002 obtained from the peak position of the diffraction lines are graphite present 5 g 0.05 to per wire 10kg just below the surface or on the surface of the wire is 0.3353nm to 0.3372Nm, plated wire surface A welding wire, characterized in that it is not subjected to welding. 粒径が0.1乃至30μmであるMoSが前記ワイヤの表面上又は表面直下にワイヤ10kg当たり0.01乃至2g存在することを特徴とする請求項1に記載の溶接用ワイヤ。 2. The welding wire according to claim 1, wherein MoS 2 having a particle size of 0.1 to 30 μm is present on or immediately below the surface of the wire in an amount of 0.01 to 2 g per 10 kg of the wire. 植物油、動物油、鉱物油及び合成油からなる群から選択された少なくとも1種以上の油が総量で前記ワイヤの表面にワイヤ10kg当たり0.2乃至3g存在することを特徴とする請求項2に記載の溶接用ワイヤ。3. The wire according to claim 2, wherein at least one or more oils selected from the group consisting of vegetable oils, animal oils, mineral oils and synthetic oils are present on the surface of the wire in a total amount of 0.2 to 3 g per 10 kg of the wire. Welding wire.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103537819A (en) * 2013-09-23 2014-01-29 中冶焊接科技有限公司 Non-copper-plated solid welding wire for gas shielded welding and manufacturing method thereof

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI295606B (en) * 2005-05-13 2008-04-11 Kobe Steel Ltd Non-copper-plated welding wire
US8901455B2 (en) 2008-06-18 2014-12-02 Lincoln Global, Inc. Welding wire for submerged arc welding
US8952295B2 (en) 2008-06-18 2015-02-10 Lincoln Global, Inc. Welding wire with perovskite coating

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103537819A (en) * 2013-09-23 2014-01-29 中冶焊接科技有限公司 Non-copper-plated solid welding wire for gas shielded welding and manufacturing method thereof
CN103537819B (en) * 2013-09-23 2016-06-15 中冶焊接科技有限公司 A kind of non-copper plating solid core welding wire used for gas shield welding and preparation method thereof

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